[go: up one dir, main page]

TW201408676A - 鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法及太陽電池 - Google Patents

鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法及太陽電池 Download PDF

Info

Publication number
TW201408676A
TW201408676A TW102126034A TW102126034A TW201408676A TW 201408676 A TW201408676 A TW 201408676A TW 102126034 A TW102126034 A TW 102126034A TW 102126034 A TW102126034 A TW 102126034A TW 201408676 A TW201408676 A TW 201408676A
Authority
TW
Taiwan
Prior art keywords
passivation
passivation layer
group
composition
layer
Prior art date
Application number
TW102126034A
Other languages
English (en)
Chinese (zh)
Inventor
Tsuyoshi Hayasaka
Masato Yoshida
Takeshi Nojiri
Yasushi Kurata
Tooru Tanaka
Akihiro Orita
Shuichiro Adachi
Takashi Hattori
Mieko Matsumura
Keiji Watanabe
Masatoshi Morishita
Hirotaka Hamamura
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Publication of TW201408676A publication Critical patent/TW201408676A/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • H10F77/306Coatings for devices having potential barriers
    • H10F77/311Coatings for devices having potential barriers for photovoltaic cells
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/14Photovoltaic cells having only PN homojunction potential barriers
    • H10F10/146Back-junction photovoltaic cells, e.g. having interdigitated base-emitter regions on the back side
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Photovoltaic Devices (AREA)
  • Formation Of Insulating Films (AREA)
TW102126034A 2012-07-19 2013-07-19 鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法及太陽電池 TW201408676A (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2012160336 2012-07-19
JP2012218389 2012-09-28
JP2013011934 2013-01-25
JP2013040153 2013-02-28
JP2013103571 2013-05-15

Publications (1)

Publication Number Publication Date
TW201408676A true TW201408676A (zh) 2014-03-01

Family

ID=49948934

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102126034A TW201408676A (zh) 2012-07-19 2013-07-19 鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法及太陽電池

Country Status (4)

Country Link
JP (1) JP6269484B2 (ja)
CN (1) CN104508830A (ja)
TW (1) TW201408676A (ja)
WO (1) WO2014014114A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6525583B2 (ja) * 2014-12-25 2019-06-05 京セラ株式会社 太陽電池素子および太陽電池モジュール
KR101810892B1 (ko) * 2016-09-13 2017-12-20 동우 화인켐 주식회사 터치 센서 및 이를 포함하는 터치 스크린 패널
WO2019117809A1 (en) * 2017-12-11 2019-06-20 National University Of Singapore A method of manufacturing a photovoltaic device
JP7483245B2 (ja) * 2020-04-09 2024-05-15 国立研究開発法人産業技術総合研究所 太陽電池およびその製造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS625293A (ja) * 1985-07-01 1987-01-12 カシオ計算機株式会社 ウインドウ表示制御装置
JPS6252936A (ja) * 1985-08-31 1987-03-07 Nitto Electric Ind Co Ltd 半導体素子被覆用ペ−スト組成物
JP3658962B2 (ja) * 1998-01-13 2005-06-15 三菱化学株式会社 プラスチック積層体
JP2000294817A (ja) * 1999-04-09 2000-10-20 Dainippon Printing Co Ltd 太陽電池モジュ−ル用表面保護シ−トおよびそれを使用した太陽電池モジュ−ル
KR101528382B1 (ko) * 2007-10-17 2015-06-12 헤레우스 프레셔스 메탈즈 노스 아메리카 콘쇼호켄 엘엘씨 단면 후면 컨택 태양 전지용 유전성 코팅물
KR20120037364A (ko) * 2009-07-01 2012-04-19 세키스이가가쿠 고교가부시키가이샤 도전성 페이스트용 바인더 수지, 도전성 페이스트 및 태양 전지 소자
JP5633346B2 (ja) * 2009-12-25 2014-12-03 株式会社リコー 電界効果型トランジスタ、半導体メモリ、表示素子、画像表示装置及びシステム
JP5899615B2 (ja) * 2010-03-18 2016-04-06 株式会社リコー 絶縁膜の製造方法及び半導体装置の製造方法

Also Published As

Publication number Publication date
WO2014014114A1 (ja) 2014-01-23
JPWO2014014114A1 (ja) 2016-07-07
CN104508830A (zh) 2015-04-08
JP6269484B2 (ja) 2018-01-31
WO2014014114A9 (ja) 2014-07-10

Similar Documents

Publication Publication Date Title
TWI569461B (zh) 太陽電池元件及其製造方法及太陽電池模組
TW201412758A (zh) 鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法以及太陽電池
US20160211389A1 (en) Composition for forming passivation layer, semiconductor substrate having passivation layer, method of producing semiconductor substrate having passivation layer, photov oltaic cell element, method of producing photovoltaic cell element, and photovoltaic cell
TWI615395B (zh) 鈍化層形成用組成物、帶有鈍化層的半導體基板及其製造方法、太陽電池元件及其製造方法、以及太陽電池
TWI609838B (zh) 太陽電池元件、太陽電池元件的製造方法以及太陽電池模組
TWI608007B (zh) 太陽電池用鈍化層形成用組成物、帶有太陽電池用鈍化層的半導體基板、帶有太陽電池用鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法、太陽電池以及用途
TW201408676A (zh) 鈍化層形成用組成物、帶有鈍化層的半導體基板、帶有鈍化層的半導體基板的製造方法、太陽電池元件、太陽電池元件的製造方法及太陽電池
TWI621623B (zh) 鈍化層形成用組成物、帶有鈍化層的半導體基板及其製造方法、以及太陽電池元件及其製造方法
TWI619261B (zh) 太陽能電池元件及其製造方法及太陽能電池模組
JP6176249B2 (ja) パッシベーション層付半導体基板及びその製造方法