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WO2021118017A1 - Broche d'essai creuse - Google Patents

Broche d'essai creuse Download PDF

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Publication number
WO2021118017A1
WO2021118017A1 PCT/KR2020/012220 KR2020012220W WO2021118017A1 WO 2021118017 A1 WO2021118017 A1 WO 2021118017A1 KR 2020012220 W KR2020012220 W KR 2020012220W WO 2021118017 A1 WO2021118017 A1 WO 2021118017A1
Authority
WO
WIPO (PCT)
Prior art keywords
elastic member
hollow
plunger
diameter portion
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/KR2020/012220
Other languages
English (en)
Korean (ko)
Inventor
전진국
차상훈
정창모
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Okins Electronics Co Ltd
Original Assignee
Okins Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Okins Electronics Co Ltd filed Critical Okins Electronics Co Ltd
Publication of WO2021118017A1 publication Critical patent/WO2021118017A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Definitions

  • the present invention relates to a hollow test pin, and more particularly, to a hollow test pin suitable for testing of high voltage and high current.
  • a semiconductor product completed through a semiconductor manufacturing process undergoes various types of tests to evaluate the presence or absence of normal operation and reliability.
  • an electrical characteristic test to check normal operation and disconnection by connecting all input/output terminals of a semiconductor product to a test signal generating circuit, and some input/output terminals such as a power input terminal of a semiconductor product to connect to a test signal generating circuit to reduce stress
  • a burn-in test is performed to check the lifespan of the semiconductor product and whether defects occur.
  • an electrical connection between the semiconductor device and the test equipment In general, in order to inspect the electrical characteristics of a semiconductor device, an electrical connection between the semiconductor device and the test equipment must be made smoothly.
  • an inspection device for connecting the semiconductor device and the test equipment there are a socket board, a probe card, a connector, and the like.
  • the socket board is used when the semiconductor product is in the form of a semiconductor package
  • the probe card is used when the semiconductor product is in the form of a semiconductor chip.
  • connectors are also used as inspection devices that connect semiconductor devices and test equipment.
  • This inspection device serves to connect the semiconductor device side and the test equipment side to each other so that electrical signals can be exchanged in both directions.
  • the inspection device is equipped with a probe pin as a means for contacting the semiconductor device side. have.
  • the test is carried out in a state in which a test board or semiconductor package such as a PCB board is mounted on a separate test socket, and the shape of the test socket is basically determined according to the shape of the test board or semiconductor package and the test socket is tested.
  • the pad on the substrate side or the semiconductor package side and the connection terminal on the test socket side it serves to connect the test substrate or the semiconductor package to the test equipment.
  • test socket is connected to the test board or the semiconductor package and at the same time connected to the test equipment and connected to each other, so that the signal of the test equipment is transmitted to the test substrate or the semiconductor package to perform the test.
  • a probe pin is used as a means for electrically connecting a plurality of connection terminals of an IC embedded in a test socket and a plurality of pads of a test board or a semiconductor package one-to-one.
  • a probe pin is a combination of two contact pins and a spring between them. This type of probe pin facilitates the connection between semiconductor devices and test equipment, and has the advantage of cushioning the mechanical shock generated during connection. For this reason, it is a trend that is widely used in most socket boards.
  • test pin has a very diverse structure depending on needs, such as a structure in which a spring is located outside or inside.
  • Republic of Korea Patent No. 10-1509200 registered on March 31, 2015, probe pin with enhanced signal characteristics of the applicant of the present invention describes a test pin having a structure in which an elastic member is inserted inside.
  • a more specific configuration of the probe pin proposed in the above registered patent includes a barrel in which an upper plunger and a lower plunger are separately provided, and the upper plunger and the lower plunger and the elastic member are accommodated therein.
  • an object of the present invention is to provide a hollow test pin suitable for detecting high voltage and high current characteristics.
  • Another object of the present invention is to provide a hollow test pin that is easy to assemble.
  • the hollow test pin of the present invention for achieving the object as described above includes a hollow body with a contact apex located at the bottom, an elastic member accommodated in the body, and a part inserted into the body to contact the elastic member and a plunger, the body being provided integrally with a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and the large-diameter portion and the shoulder portion interposed therebetween. It consists of a small-diameter part where the contact point is located.
  • one end of the elastic member may be in contact with the inner surface of the shoulder portion while being inserted into the large diameter portion.
  • the plunger is provided integrally with the insertion portion inserted into the large-diameter portion and upward with the insertion portion and the plunger shoulder interposed between the large-diameter portion and exposed to the outside of the large-diameter portion, and has a diameter smaller than that of the insertion portion It can be achieved with a smaller exposed portion.
  • the insertion portion is hollow, and an upper portion of the elastic member may be inserted into the hollow portion of the insertion portion.
  • the upper end of the elastic member may be in contact with the inner surface of the plunger shoulder.
  • the length of the insertion part may be 50% of the length of the large diameter part.
  • the present invention integrates the lower plunger and the body and minimizes the resistance component by increasing the contact area between the upper plunger and the body, thereby easily detecting high voltage and large current characteristics.
  • the present invention can complete the assembly by inserting the upper plunger into the lower plunger-integrated hollow body and caulking the upper periphery of the hollow body, thereby providing a structure that is very easy to assemble.
  • the present invention can omit the overlapping portion for coupling the conventional lower plunger and the body and the overlapping portion for coupling the upper plunger and the body, so that a longer elastic member can be used compared to the conventional same-length test pin, The cushioning action can be made more smoothly, and there is an effect that the adjustment of the contact force is easy.
  • FIG. 1 is an exploded perspective view of a hollow test pin according to a preferred embodiment of the present invention.
  • Figure 2 is a cross-sectional view of the coupled state of Figure 1;
  • FIG. 3 is a view showing the state in which the elastic member is compressed by the contact of the lower plunger in FIG. 2 .
  • FIG. 4 is a cross-sectional view of a hollow test pin according to another embodiment of the present invention.
  • Embodiments described herein will be described with reference to plan and cross-sectional views, which are ideal schematic views of the present invention. Accordingly, the shape of the illustrative drawing may be modified due to manufacturing technology and/or tolerance. Accordingly, the embodiments of the present invention are not limited to the specific form shown, but also include changes in the form generated according to the manufacturing process. Accordingly, the regions illustrated in the drawings have schematic properties, and the shapes of the illustrated regions in the drawings are intended to illustrate specific shapes of regions of the device, and not to limit the scope of the invention.
  • FIG. 1 is an exploded perspective view of a hollow test pin of the present invention
  • FIG. 2 is a cross-sectional configuration view of the combined state of FIG. 1 .
  • the hollow test pin of the present invention includes a hollow body 10 having a contact apex 13 at a lower portion, an elastic member 20 accommodated inside the body 10, and , is inserted inward from the upper side of the body 10 and is configured to include a plunger 30 in contact with the elastic member 20 .
  • the body 10 includes a cylindrical large-diameter portion 11 and a small-diameter portion 12 integrally formed at the lower end of the large-diameter portion 11 .
  • a structure in which the cross-section of the large-diameter portion 11 and the small-diameter portion 12 is circular is illustrated and described, but the cross-section may have a polygonal structure such as a triangle or a square, and in this case, the cross-sectional shape of the plunger is also that of the large diameter portion 11 It shall be the same as the cross-sectional shape.
  • the end of the small diameter portion 12 has a closed structure, and the central portion protrudes downward to form the contact point portion 13 .
  • a shoulder portion 14 is formed between the large-diameter portion 11 and the small-diameter portion 12 so that the large-diameter portion 11 and the small-diameter portion 12 having different diameters are integrally formed.
  • the small diameter portion 12 serves as a conventional lower plunger, but in the present invention, the resistance component can be reduced by integrating the structure of the conventional lower plunger and the barrel.
  • the large diameter portion 11 is hollow and provides an accommodation space portion 15 in which the elastic member 20 is accommodated.
  • the inner side of the shoulder 14 acts as a seating surface on which one end of the elastic member 20 is seated.
  • the elastic member 20 may be a coil-type spring, and the diameter of the elastic member 20 is larger than the inner diameter of the small diameter portion 12 and smaller than the inner diameter of the large diameter portion 11 .
  • the length of the elastic member 20 is slightly smaller than the length of the large-diameter portion 11 .
  • a part of the plunger 30 is inserted into one end of the large-diameter portion 11 opposite the small-diameter portion 12 .
  • the plunger 30 includes an insertion portion 32 inserted into the large-diameter portion 11 , and an exposed portion 31 positioned outside the large-diameter portion 11 in the inserted state of the insertion portion 32 .
  • At least the insertion part 32 is hollow, and for the convenience of manufacturing, the exposed part 31 may also be hollow.
  • the diameter of the insertion part 32 is larger than the diameter of the exposed part 31 .
  • the insertion part 32 comes into contact with the inner surface of the large diameter part 11 while being inserted into the large diameter part 11 of the body 10 and accommodates the upper end of the elastic member 20 inside.
  • the insertion part 32 located on the lower side of the plunger 30 is hollow, and a portion of the upper end of the elastic member 20 is inserted inwardly.
  • This structure increases the contact area between the plunger 30 and the body 10 to provide a structure suitable for detecting high voltage and high current characteristics, as well as maximize the length of the elastic member 20 .
  • the length of the elastic member 20 is longer in the pin of the same length, it is possible to facilitate the buffering action, and the adjustment of the contact force becomes very easy.
  • variable length of the body 10 and the plunger 30 it can be used for testing in various environments, thereby increasing versatility.
  • a plunger shoulder 33 is formed between the insertion portion 32 and the exposed portion 31 of the plunger 30, and the upper end of the elastic member 20 is in contact with the plunger shoulder portion 33, When the contact point 13 is in contact with the test target and an upward pressure is applied, the elastic member 20 can be compressed.
  • the upper end of the body 10 includes a caulking portion 16 bent toward the plunger 30 .
  • the caulking process is performed by inserting the elastic member 20 inside the large-diameter portion 11 of the body 10, and inserting the insertion portion 32 of the plunger 30 into the large-diameter portion 11. 16), so that it can be easily assembled.
  • the plunger shoulder 33 is in contact with the inside of the caulking part 16 , the plunger 30 is not separated from the body 10 .
  • the insertion portion 32 of the plunger 30 may have a sufficient length to minimize the resistance component at the boundary with the body 10 .
  • the length of the insertion part 32 may have a maximum length of 50% of the length of the large diameter part 11 .
  • the length of the insertion portion 32 is assumed to be 50% of the length of the large diameter portion 11 .
  • the present invention can improve assembly and reduce resistance components by providing one body 10 by changing the conventional lower plunger into an integrated structure with the barrel.
  • FIG. 4 is a cross-sectional configuration view of a hollow test pin according to another embodiment of the present invention.
  • the structure of the body 10 may be the same as that of the embodiment of FIG. 2 , and the plunger 30 may be used as a non-hollow one.
  • the present invention relates to a test pin capable of detecting high voltage and high current characteristics using a physical structure using a natural law, and has potential for industrial application.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

La présente invention concerne une broche d'essai creuse comprenant : un corps creux ayant une cuspide de contact placée au bas de celle-ci ; un élément élastique reçu dans le corps ; et un piston partiellement inséré dans le corps et amené en contact avec l'élément élastique, le corps comprenant : une partie de grand diamètre fournissant un espace de réception dans lequel l'élément élastique est reçu ; et une partie de petit diamètre ménagée de manière solidaire avec la partie de grand diamètre avec une partie d'épaulement interposée entre celles-ci, ayant une structure avec un diamètre plus petit que celui de la partie de grand diamètre, et ayant la cuspide de contact placée au bas de celle-ci.
PCT/KR2020/012220 2019-12-12 2020-09-10 Broche d'essai creuse Ceased WO2021118017A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020190165409A KR102158027B1 (ko) 2019-12-12 2019-12-12 중공형 테스트 핀
KR10-2019-0165409 2019-12-12

Publications (1)

Publication Number Publication Date
WO2021118017A1 true WO2021118017A1 (fr) 2021-06-17

Family

ID=72707861

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2020/012220 Ceased WO2021118017A1 (fr) 2019-12-12 2020-09-10 Broche d'essai creuse

Country Status (2)

Country Link
KR (1) KR102158027B1 (fr)
WO (1) WO2021118017A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102651304B1 (ko) * 2023-08-08 2024-03-26 주식회사 오킨스전자 저항이 안정적인 포고 핀

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120065050A (ko) * 2010-12-10 2012-06-20 이재학 검사용 탐침장치 및 그 검사용 탐침장치의 제조방법
KR20160096968A (ko) * 2015-02-06 2016-08-17 리노공업주식회사 검사장치용 프로브
JP2017037021A (ja) * 2015-08-11 2017-02-16 山一電機株式会社 検査用コンタクト端子、および、それを備える電気接続装置
KR20170122538A (ko) * 2016-04-27 2017-11-06 주식회사 아이에스시 양분형 탐침 장치
KR20190009233A (ko) * 2017-07-18 2019-01-28 송유선 포고 핀 및 포고 핀의 배열을 구현하는 검사용 소켓

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5323621B2 (ja) * 2009-09-09 2013-10-23 日置電機株式会社 コンタクトプローブのプロービング方法およびプロービング装置
JP2011158454A (ja) * 2010-02-01 2011-08-18 Internet Kk コンタクトプローブ
JP5433486B2 (ja) * 2010-04-12 2014-03-05 日本航空電子工業株式会社 コンタクトプローブ
KR101696240B1 (ko) * 2011-01-14 2017-01-13 리노공업주식회사 프로브
KR101489318B1 (ko) * 2013-07-26 2015-02-04 (주)마이크로컨텍솔루션 프로브 핀
JP2018173381A (ja) * 2017-03-31 2018-11-08 株式会社ヨコオ ケルビン検査用治具

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120065050A (ko) * 2010-12-10 2012-06-20 이재학 검사용 탐침장치 및 그 검사용 탐침장치의 제조방법
KR20160096968A (ko) * 2015-02-06 2016-08-17 리노공업주식회사 검사장치용 프로브
JP2017037021A (ja) * 2015-08-11 2017-02-16 山一電機株式会社 検査用コンタクト端子、および、それを備える電気接続装置
KR20170122538A (ko) * 2016-04-27 2017-11-06 주식회사 아이에스시 양분형 탐침 장치
KR20190009233A (ko) * 2017-07-18 2019-01-28 송유선 포고 핀 및 포고 핀의 배열을 구현하는 검사용 소켓

Also Published As

Publication number Publication date
KR102158027B1 (ko) 2020-09-21

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