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USD636005S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD636005S1
USD636005S1 US29/363,415 US36341510F USD636005S US D636005 S1 USD636005 S1 US D636005S1 US 36341510 F US36341510 F US 36341510F US D636005 S USD636005 S US D636005S
Authority
US
United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/363,415
Inventor
Mitsuru Oonuma
Akira Omachi
Yoshifumi Taniguchi
Isao Nagaoki
Hiroshi Aoyagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AOYAGI, HIROSHI, NAGAOKI, ISAO, TANIGUCHI, YOSHIFUMI, OMACHI, AKIRA, OONUMA, MITSURU
Application granted granted Critical
Publication of USD636005S1 publication Critical patent/USD636005S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
The broken lines shown are for illustrative purpose and form no part of the claimed design.

Claims (1)

  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/363,415 2010-01-08 2010-06-09 Electron microscope Expired - Lifetime USD636005S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010000418 2010-01-08
JP2010-000418 2010-01-08

Publications (1)

Publication Number Publication Date
USD636005S1 true USD636005S1 (en) 2011-04-12

Family

ID=43837589

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/363,415 Expired - Lifetime USD636005S1 (en) 2010-01-08 2010-06-09 Electron microscope

Country Status (1)

Country Link
US (1) USD636005S1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD657407S1 (en) * 2009-12-15 2012-04-10 Sanyo Electric Co., Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD958215S1 (en) * 2019-01-29 2022-07-19 Hitachi High-Tech Corporation Electron microscope

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
USD282683S (en) * 1983-07-18 1986-02-18 Syntex (U.S.A.) Inc. Operatory module system for a health treatment facility
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
USD282683S (en) * 1983-07-18 1986-02-18 Syntex (U.S.A.) Inc. Operatory module system for a health treatment facility
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD657407S1 (en) * 2009-12-15 2012-04-10 Sanyo Electric Co., Ltd. Microscope
USD663338S1 (en) 2009-12-15 2012-07-10 Panasonic Healthcare Co., Ltd. Microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD958215S1 (en) * 2019-01-29 2022-07-19 Hitachi High-Tech Corporation Electron microscope

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