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USD381031S - Electron microscope - Google Patents

Electron microscope Download PDF

Info

Publication number
USD381031S
USD381031S US29/041,935 US4193595F USD381031S US D381031 S USD381031 S US D381031S US 4193595 F US4193595 F US 4193595F US D381031 S USD381031 S US D381031S
Authority
US
United States
Prior art keywords
electron microscope
view
therof
ornamental design
side perspective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/041,935
Inventor
Tomoyuki Miyata
Atsushi Katayama
Daiji Tsuboi
Hiroyuki Kobayashi
Hisashi Sato
Sadao Terakado
Peter Hohmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Assigned to HITACHI, LTD. reassignment HITACHI, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HOHMANN, PETER, KATAYAMA, ATSUSHI, KOBAYASHI, HIROYUKI, MIYATA, TOMOYUKI, SATO, HISASHI, TERAKADO, SADAO, TSUBOI, DAIJI
Application granted granted Critical
Publication of USD381031S publication Critical patent/USD381031S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and right side perspective view of an Electron Microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view therof;
FIG. 6 is a left side view therof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side perspective view of an Electron Microscope in condition of usage, it being understood that the broken line showing of environment is for illustrative purposes only and forms no part of the claimed design.

Claims (1)

  1. The ornamental design for an electron microscope, as shown and described.
US29/041,935 1995-07-03 1995-07-27 Electron microscope Expired - Lifetime USD381031S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1883395 1995-07-03
JP7-18833 1995-07-03

Publications (1)

Publication Number Publication Date
USD381031S true USD381031S (en) 1997-07-15

Family

ID=71462366

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/041,935 Expired - Lifetime USD381031S (en) 1995-07-03 1995-07-27 Electron microscope

Country Status (1)

Country Link
US (1) USD381031S (en)

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD654596S1 (en) * 2010-10-13 2012-02-21 Optimedica Corporation Medical system device
USD671654S1 (en) * 2009-02-20 2012-11-27 Sii Nano Technology Inc. Compound charged particle beam device
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD706847S1 (en) * 2013-01-09 2014-06-10 Mitutoyo Corporation Microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD893691S1 (en) * 2017-11-08 2020-08-18 Parker Hannifin Emea S.A.R.L. Compressed air dryer
USD1085195S1 (en) * 2024-11-30 2025-07-22 Shenzhen Chuangshi Optical Technology Co., Ltd. Electron microscope

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD671654S1 (en) * 2009-02-20 2012-11-27 Sii Nano Technology Inc. Compound charged particle beam device
USD679026S1 (en) * 2009-02-20 2013-03-26 Sii Nano Technology Inc. Compound charged particle beam device
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD654596S1 (en) * 2010-10-13 2012-02-21 Optimedica Corporation Medical system device
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD706847S1 (en) * 2013-01-09 2014-06-10 Mitutoyo Corporation Microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD893691S1 (en) * 2017-11-08 2020-08-18 Parker Hannifin Emea S.A.R.L. Compressed air dryer
USD1085195S1 (en) * 2024-11-30 2025-07-22 Shenzhen Chuangshi Optical Technology Co., Ltd. Electron microscope

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