USD381031S - Electron microscope - Google Patents
Electron microscope Download PDFInfo
- Publication number
- USD381031S USD381031S US29/041,935 US4193595F USD381031S US D381031 S USD381031 S US D381031S US 4193595 F US4193595 F US 4193595F US D381031 S USD381031 S US D381031S
- Authority
- US
- United States
- Prior art keywords
- electron microscope
- view
- therof
- ornamental design
- side perspective
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front, top and right side perspective view of an Electron Microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view therof;
FIG. 6 is a left side view therof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side perspective view of an Electron Microscope in condition of usage, it being understood that the broken line showing of environment is for illustrative purposes only and forms no part of the claimed design.
Claims (1)
- The ornamental design for an electron microscope, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1883395 | 1995-07-03 | ||
| JP7-18833 | 1995-07-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD381031S true USD381031S (en) | 1997-07-15 |
Family
ID=71462366
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/041,935 Expired - Lifetime USD381031S (en) | 1995-07-03 | 1995-07-27 | Electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD381031S (en) |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD571385S1 (en) * | 2006-06-19 | 2008-06-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD608810S1 (en) * | 2008-07-15 | 2010-01-26 | NT-MDT Service & Logistics Ltd. | Microscope |
| USD636005S1 (en) * | 2010-01-08 | 2011-04-12 | Hitachi High-Technologies Corporation | Electron microscope |
| USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
| USD654596S1 (en) * | 2010-10-13 | 2012-02-21 | Optimedica Corporation | Medical system device |
| USD671654S1 (en) * | 2009-02-20 | 2012-11-27 | Sii Nano Technology Inc. | Compound charged particle beam device |
| USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
| USD706847S1 (en) * | 2013-01-09 | 2014-06-10 | Mitutoyo Corporation | Microscope |
| USD708245S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Cover for an electron microscope |
| USD708244S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Electron microscope |
| USD711950S1 (en) * | 2012-11-30 | 2014-08-26 | Hitachi High-Technologies Corporation | Portion of a cover for an electron microscope |
| USD851151S1 (en) * | 2017-07-25 | 2019-06-11 | Hitachi High-Tech Science Corporation | Microscope |
| USD893691S1 (en) * | 2017-11-08 | 2020-08-18 | Parker Hannifin Emea S.A.R.L. | Compressed air dryer |
| USD1085195S1 (en) * | 2024-11-30 | 2025-07-22 | Shenzhen Chuangshi Optical Technology Co., Ltd. | Electron microscope |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
| US4523094A (en) * | 1981-02-27 | 1985-06-11 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Evaluation device for electron-optical images |
| USD332616S (en) * | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| US5350921A (en) * | 1992-07-29 | 1994-09-27 | Hitachi, Ltd. | Analytical electron microscope and a method of operating such an electron microscope |
-
1995
- 1995-07-27 US US29/041,935 patent/USD381031S/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
| US4523094A (en) * | 1981-02-27 | 1985-06-11 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Evaluation device for electron-optical images |
| USD332616S (en) * | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| US5350921A (en) * | 1992-07-29 | 1994-09-27 | Hitachi, Ltd. | Analytical electron microscope and a method of operating such an electron microscope |
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD571385S1 (en) * | 2006-06-19 | 2008-06-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD608810S1 (en) * | 2008-07-15 | 2010-01-26 | NT-MDT Service & Logistics Ltd. | Microscope |
| USD671654S1 (en) * | 2009-02-20 | 2012-11-27 | Sii Nano Technology Inc. | Compound charged particle beam device |
| USD679026S1 (en) * | 2009-02-20 | 2013-03-26 | Sii Nano Technology Inc. | Compound charged particle beam device |
| USD636005S1 (en) * | 2010-01-08 | 2011-04-12 | Hitachi High-Technologies Corporation | Electron microscope |
| USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
| USD654596S1 (en) * | 2010-10-13 | 2012-02-21 | Optimedica Corporation | Medical system device |
| USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
| USD708245S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Cover for an electron microscope |
| USD708244S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Electron microscope |
| USD711950S1 (en) * | 2012-11-30 | 2014-08-26 | Hitachi High-Technologies Corporation | Portion of a cover for an electron microscope |
| USD706847S1 (en) * | 2013-01-09 | 2014-06-10 | Mitutoyo Corporation | Microscope |
| USD851151S1 (en) * | 2017-07-25 | 2019-06-11 | Hitachi High-Tech Science Corporation | Microscope |
| USD893691S1 (en) * | 2017-11-08 | 2020-08-18 | Parker Hannifin Emea S.A.R.L. | Compressed air dryer |
| USD1085195S1 (en) * | 2024-11-30 | 2025-07-22 | Shenzhen Chuangshi Optical Technology Co., Ltd. | Electron microscope |
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