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USD332616S - Electronic microscope - Google Patents

Electronic microscope Download PDF

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Publication number
USD332616S
USD332616S US07/556,576 US55657690F USD332616S US D332616 S USD332616 S US D332616S US 55657690 F US55657690 F US 55657690F US D332616 S USD332616 S US D332616S
Authority
US
United States
Prior art keywords
electronic microscope
electronic
microscope
view
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US07/556,576
Inventor
Kazunori Hashimoto
Tadashi Otaka
Minoru Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Assigned to HITACHI, LTD reassignment HITACHI, LTD ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: HASHIMOTO, KAZUNORI, OTAKA, TADASHI, SHIMIZU, MINORU
Application granted granted Critical
Publication of USD332616S publication Critical patent/USD332616S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and left side perspective view of an electronic microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is an enlarged view of the indicating plate.

Claims (1)

  1. The ornamental design for an electronic microscope, as shown.
US07/556,576 1990-01-26 1990-07-24 Electronic microscope Expired - Lifetime USD332616S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2-1898 1990-01-26
JP189890 1990-01-26

Publications (1)

Publication Number Publication Date
USD332616S true USD332616S (en) 1993-01-19

Family

ID=70769166

Family Applications (1)

Application Number Title Priority Date Filing Date
US07/556,576 Expired - Lifetime USD332616S (en) 1990-01-26 1990-07-24 Electronic microscope

Country Status (1)

Country Link
US (1) USD332616S (en)

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD360599S (en) 1994-04-15 1995-07-25 Hitachi, Ltd. Measurement scanner for semi-conductor
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD575809S1 (en) * 2006-10-16 2008-08-26 Olympus Corporation Image pickup microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US2655601A (en) 1949-04-09 1953-10-13 Hartford Nat Bank & Trust Co Electron microscope
USD298854S (en) 1986-04-30 1988-12-06 Olympus Optical Company, Inc. Automatic enzyme immunological analyzer
USD303267S (en) 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
US4961003A (en) 1988-11-05 1990-10-02 Seiko Instruments, Inc. Scanning electron beam apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US2655601A (en) 1949-04-09 1953-10-13 Hartford Nat Bank & Trust Co Electron microscope
USD298854S (en) 1986-04-30 1988-12-06 Olympus Optical Company, Inc. Automatic enzyme immunological analyzer
USD303267S (en) 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
US4961003A (en) 1988-11-05 1990-10-02 Seiko Instruments, Inc. Scanning electron beam apparatus

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD360599S (en) 1994-04-15 1995-07-25 Hitachi, Ltd. Measurement scanner for semi-conductor
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
USD575809S1 (en) * 2006-10-16 2008-08-26 Olympus Corporation Image pickup microscope
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer

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