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USD626579S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD626579S1
USD626579S1 US29/356,738 US35673810F USD626579S US D626579 S1 USD626579 S1 US D626579S1 US 35673810 F US35673810 F US 35673810F US D626579 S USD626579 S US D626579S
Authority
US
United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/356,738
Inventor
Mitsuru Oonuma
Akira Omachi
Masahiko Ajima
Tomohisa Ohtaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AJIMA, MASAHIKO, OHTAKI, TOMOHISA, OMACHI, AKIRA, OONUMA, MITSURU
Application granted granted Critical
Publication of USD626579S1 publication Critical patent/USD626579S1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.

Claims (1)

  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/356,738 2009-09-30 2010-03-02 Electron microscope Expired - Lifetime USD626579S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009022637 2009-09-30
JP2009-022637 2009-09-30

Publications (1)

Publication Number Publication Date
USD626579S1 true USD626579S1 (en) 2010-11-02

Family

ID=43016393

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/356,738 Expired - Lifetime USD626579S1 (en) 2009-09-30 2010-03-02 Electron microscope

Country Status (1)

Country Link
US (1) USD626579S1 (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD647535S1 (en) * 2010-05-13 2011-10-25 Zf Do Brasil Ltda. Flange
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US3202047A (en) * 1961-06-21 1965-08-24 Bausch & Lomb Inverted microscope with u-shaped optical path and tubular mounts for objective and relay lens systems
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US4210384A (en) * 1976-09-11 1980-07-01 Carl Zeiss-Stiftung Inverted-design optical microscope
USD299861S (en) * 1986-11-19 1989-02-14 Spacelabs, Inc. Medical monitor
US4812029A (en) * 1987-02-19 1989-03-14 Onanhian Richard A Microscope system
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
USD491272S1 (en) * 2002-12-13 2004-06-08 Immunivest Corporation Autoprep instrument
USD516121S1 (en) * 2004-02-04 2006-02-28 Seiko Epson Corporation Printer
USD527464S1 (en) * 2004-01-28 2006-08-29 Fuji Photo Film Co., Ltd. Component extractor
US7321462B2 (en) * 2004-12-03 2008-01-22 Keyence Corporation Fluorescence microscope
USD574280S1 (en) * 2007-01-23 2008-08-05 Nihon Dempa Kogyo Co., Ltd. Temperature controlled oven for bio-sensor
USD591864S1 (en) * 2007-12-10 2009-05-05 Dako Denmark A/S Housing for a biological sample processing apparatus
USD607569S1 (en) * 2008-11-18 2010-01-05 Panasonic Corporation Biochemical analyzer

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US3202047A (en) * 1961-06-21 1965-08-24 Bausch & Lomb Inverted microscope with u-shaped optical path and tubular mounts for objective and relay lens systems
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US4210384A (en) * 1976-09-11 1980-07-01 Carl Zeiss-Stiftung Inverted-design optical microscope
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD299861S (en) * 1986-11-19 1989-02-14 Spacelabs, Inc. Medical monitor
US4812029A (en) * 1987-02-19 1989-03-14 Onanhian Richard A Microscope system
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
USD491272S1 (en) * 2002-12-13 2004-06-08 Immunivest Corporation Autoprep instrument
USD527464S1 (en) * 2004-01-28 2006-08-29 Fuji Photo Film Co., Ltd. Component extractor
USD516121S1 (en) * 2004-02-04 2006-02-28 Seiko Epson Corporation Printer
US7321462B2 (en) * 2004-12-03 2008-01-22 Keyence Corporation Fluorescence microscope
USD574280S1 (en) * 2007-01-23 2008-08-05 Nihon Dempa Kogyo Co., Ltd. Temperature controlled oven for bio-sensor
USD591864S1 (en) * 2007-12-10 2009-05-05 Dako Denmark A/S Housing for a biological sample processing apparatus
USD607569S1 (en) * 2008-11-18 2010-01-05 Panasonic Corporation Biochemical analyzer

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD647535S1 (en) * 2010-05-13 2011-10-25 Zf Do Brasil Ltda. Flange
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope

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