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USD687475S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD687475S1
USD687475S1 US29/431,888 US201229431888F USD687475S US D687475 S1 USD687475 S1 US D687475S1 US 201229431888 F US201229431888 F US 201229431888F US D687475 S USD687475 S US D687475S
Authority
US
United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/431,888
Inventor
Mitsuru Oonuma
Akira Omachi
Junichi Katane
Mitsuo Akatsu
Hiroyuki Komuro
Tomoyasu Hirashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AKATSU, MITSUO, HIRASHIMA, TOMOYASU, KOMURO, HIROYUKI, KATANE, JUNICHI, OMACHI, AKIRA, OONUMA, MITSURU
Application granted granted Critical
Publication of USD687475S1 publication Critical patent/USD687475S1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines shown are for illustrative purpose and form no part of the claimed design.

Claims (1)

    CLAIM
  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/431,888 2012-05-10 2012-09-12 Electron microscope Active USD687475S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012-010805 2012-05-10
JP2012010805 2012-05-10

Publications (1)

Publication Number Publication Date
USD687475S1 true USD687475S1 (en) 2013-08-06

Family

ID=48876814

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/431,888 Active USD687475S1 (en) 2012-05-10 2012-09-12 Electron microscope

Country Status (1)

Country Link
US (1) USD687475S1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD841069S1 (en) * 2016-02-02 2019-02-19 Shimadzu Corporation Infrared microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer
USD1085195S1 (en) 2024-11-30 2025-07-22 Shenzhen Chuangshi Optical Technology Co., Ltd. Electron microscope

Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3297284A (en) * 1964-11-06 1967-01-10 Pellerin Corp Milnor Suspension system for machines
US3814356A (en) * 1970-10-02 1974-06-04 J Coleman Electron microscope
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5864138A (en) * 1995-09-14 1999-01-26 Hitachi, Ltd. Electron Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope

Patent Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3297284A (en) * 1964-11-06 1967-01-10 Pellerin Corp Milnor Suspension system for machines
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
US3814356A (en) * 1970-10-02 1974-06-04 J Coleman Electron microscope
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5864138A (en) * 1995-09-14 1999-01-26 Hitachi, Ltd. Electron Microscope
US6084239A (en) * 1995-09-14 2000-07-04 Hitachi, Ltd. Electron microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD841069S1 (en) * 2016-02-02 2019-02-19 Shimadzu Corporation Infrared microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer
USD1085195S1 (en) 2024-11-30 2025-07-22 Shenzhen Chuangshi Optical Technology Co., Ltd. Electron microscope

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