| Analysis and compact modeling of negative capacitance transistor with high ON-current and negative output differential resistance—Part II: Model validation G Pahwa, T Dutta, A Agarwal, S Khandelwal, S Salahuddin, C Hu, ... IEEE Transactions on Electron Devices 63 (12), 4986-4992, 2016 | 238 | 2016 |
| Analysis and Compact Modeling of Negative Capacitance Transistor with High ON-Current and Negative Output Differential Resistance-Part I: Model Description G Pahwa, T Dutta, A Agarwal, S Khandelwal, S Salahuddin, C Hu, ... IEEE Transactions on Electron Devices 63 (12), 4981 - 4985, 2016 | 238 | 2016 |
| Numerical Investigation of Short-Channel Effects in Negative Capacitance MFIS and MFMIS Transistors: Subthreshold Behavior G Pahwa, A Agarwal, YS Chauhan IEEE Transactions on Electron Devices 65 (11), 5130 - 5136, 2018 | 162 | 2018 |
| Physical insights on negative capacitance transistors in nonhysteresis and hysteresis regimes: MFMIS versus MFIS structures G Pahwa, T Dutta, A Agarwal, YS Chauhan IEEE Transactions on Electron Devices 65 (3), 867-873, 2018 | 151 | 2018 |
| Compact model for ferroelectric negative capacitance transistor with MFIS structure G Pahwa, T Dutta, A Agarwal, YS Chauhan IEEE Transactions on Electron Devices 64 (3), 1366-1374, 2017 | 129 | 2017 |
| Compact modeling of temperature effects in FDSOI and FinFET devices down to cryogenic temperatures G Pahwa, P Kushwaha, A Dasgupta, S Salahuddin, C Hu IEEE Transactions on Electron Devices 68 (9), 4223-4230, 2021 | 112 | 2021 |
| Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance H Amrouch, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan IEEE Access 6, 52754-52765, 2018 | 97 | 2018 |
| Performance evaluation of 7-nm node negative capacitance FinFET-based SRAM T Dutta, G Pahwa, AR Trivedi, S Sinha, A Agarwal, YS Chauhan IEEE Electron Device Letters 38 (8), 1161-1164, 2017 | 95 | 2017 |
| Designing energy efficient and hysteresis free negative capacitance FinFET with negative DIBL and 3.5X ION using compact modeling approach G Pahwa, T Dutta, A Agarwal, YS Chauhan European Solid-State Circuits Conference, 49-54, 2016 | 88 | 2016 |
| Compact modeling of drain current, charges, and capacitances in long-channel gate-all-around negative capacitance MFIS transistor AD Gaidhane, G Pahwa, A Verma, YS Chauhan IEEE Transactions on Electron Devices 65 (5), 2024-2032, 2018 | 84 | 2018 |
| Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 81 | 2020 |
| Impact of process variations on negative capacitance FinFET devices and circuits T Dutta, G Pahwa, A Agarwal, YS Chauhan IEEE Electron Device Letters 39 (1), 147-150, 2017 | 62 | 2017 |
| Numerical investigation of short-channel effects in negative capacitance MFIS and MFMIS transistors: Above-threshold behavior G Pahwa, A Agarwal, YS Chauhan IEEE Transactions on Electron Devices 66 (3), 1591-1598, 2019 | 55 | 2019 |
| Cryogenic CMOS for quantum processing: 5-nm FinFET-based SRAM arrays at 10 K SS Parihar, VM Van Santen, S Thomann, G Pahwa, YS Chauhan, ... IEEE Transactions on Circuits and Systems I: Regular Papers 70 (8), 3089-3102, 2023 | 44 | 2023 |
| Impact of interface traps on negative capacitance transistor: Device and circuit reliability O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch IEEE Journal of the Electron Devices Society 8, 1193-1201, 2020 | 44 | 2020 |
| A compact model of polycrystalline ferroelectric capacitor CT Tung, G Pahwa, S Salahuddin, C Hu IEEE Transactions on Electron Devices 68 (10), 5311-5314, 2021 | 34 | 2021 |
| Unveiling the impact of IR-drop on performance gain in NCFET-based processors H Amrouch, S Salamin, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan IEEE Transactions on Electron Devices 66 (7), 3215-3223, 2019 | 33 | 2019 |
| Gate-induced drain leakage in negative capacitance FinFETs AD Gaidhane, G Pahwa, A Verma, YS Chauhan IEEE Transactions on Electron Devices 67 (3), 802-809, 2020 | 31 | 2020 |
| Impact of self-heating on negative-capacitance FinFET: Device-circuit interaction O Prakash, G Pahwa, CK Dabhi, YS Chauhan, H Amrouch IEEE Transactions on Electron Devices 68 (4), 1420-1424, 2021 | 29 | 2021 |
| Performance, power and cooling trade-offs with NCFET-based many-cores M Rapp, S Salamin, H Amrouch, G Pahwa, Y Chauhan, J Henkel Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 29 | 2019 |
Yogesh S. ChauhanFellow IEEE & INAE, Professor-IIT KanpurVerified email at iitk.ac.in
