| Reliability-aware design to suppress aging H Amrouch, B Khaleghi, A Gerstlauer, J Henkel Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016 | 134 | 2016 |
| MLCAD: A survey of research in machine learning for CAD keynote paper M Rapp, H Amrouch, Y Lin, B Yu, DZ Pan, M Wolf, J Henkel IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 123 | 2021 |
| Weight-oriented approximation for energy-efficient neural network inference accelerators ZG Tasoulas, G Zervakis, I Anagnostopoulos, H Amrouch, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4670-4683, 2020 | 116 | 2020 |
| Improving mobile gaming performance through cooperative CPU-GPU thermal management A Prakash, H Amrouch, M Shafique, T Mitra, J Henkel Proceedings of the 53rd annual design automation conference, 1-6, 2016 | 109 | 2016 |
| Towards interdependencies of aging mechanisms H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014 | 107 | 2014 |
| First demonstration of in-memory computing crossbar using multi-level Cell FeFET HA Taha Soliman, Swetaki Chatterjee, Nellie Laleni, Franz Müller, Tobias ... Nature Communications 14 (6348), 2023 | 105 | 2023 |
| Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance H Amrouch, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan IEEE Access 6, 52754-52765, 2018 | 97 | 2018 |
| Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies) J Henkel, S Pagani, H Amrouch, L Bauer, F Samie Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 87 | 2017 |
| Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 81 | 2020 |
| A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ... IEEE Transactions on Electron Devices 66 (1), 271-278, 2018 | 66 | 2018 |
| Impact of extrinsic variation sources on the device-to-device variation in ferroelectric FET K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 65 | 2020 |
| Recent advances in EM and BTI induced reliability modeling, analysis and optimization SXD Tan, H Amrouch, T Kim, Z Sun, C Cook, J Henkel Integration 60, 132-152, 2018 | 64 | 2018 |
| Approximate computing for ML: State-of-the-art, challenges and visions G Zervakis, H Saadat, H Amrouch, A Gerstlauer, S Parameswaran, ... Proceedings of the 26th Asia and South Pacific Design Automation Conference …, 2021 | 62 | 2021 |
| NPU thermal management H Amrouch, G Zervakis, S Salamin, H Kattan, I Anagnostopoulos, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 61 | 2020 |
| Design automation of approximate circuits with runtime reconfigurable accuracy G Zervakis, H Amrouch, J Henkel IEEE access 8, 53522-53538, 2020 | 55 | 2020 |
| Towards aging-induced approximations H Amrouch, B Khaleghi, A Gerstlauer, J Henkel Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017 | 55 | 2017 |
| Energy efficient edge computing enabled by satisfaction games and approximate computing N Irtija, I Anagnostopoulos, G Zervakis, EE Tsiropoulou, H Amrouch, ... IEEE Transactions on Green Communications and Networking 6 (1), 281-294, 2021 | 53 | 2021 |
| Aging-aware voltage scaling VM Van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016 | 53 | 2016 |
| Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017 | 52 | 2017 |
| Brain-inspired computing for wafer map defect pattern classification PR Genssler, H Amrouch 2021 IEEE International Test Conference (ITC), 123-132, 2021 | 50 | 2021 |
Jörg HenkelProfessor of Computer Science, Karlsruhe Institute of TechnologyVerified email at kit.edu
