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Garima Gill
Garima Gill
Verified email at iitj.ac.in
Title
Cited by
Cited by
Year
Robust compact model of high-voltage MOSFET’s drift region
G Pahwa, A Sharma, R Goel, G Gill, H Agarwal, YS Chauhan, C Hu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022
162022
Compact modeling of impact ionization in high-voltage devices
G Gill, A Singhal, G Pahwa, C Hu, H Agarwal
IEEE Transactions on Electron Devices 70 (5), 2389-2394, 2023
122023
Compact modeling of ldmos transistors over a wide temperature range including cryogenics
Y Machhiwar, G Gill, KN Kaushal, NR Mohapatra, H Agarwal
IEEE Transactions on Electron Devices 71 (1), 77-83, 2023
72023
Comprehensive high-voltage parameter extraction strategy for BSIM-BULK HV model
G Gill, Y Machhiwar, G Pahwa, C Hu, H Agarwal
IEEE Transactions on Electron Devices 71 (1), 70-76, 2023
62023
An improved robust infinitely differentiable drift resistance model for BSIM high voltage compact model
A Singhal, G Gill, G Pahwa, C Hu, H Agarwal
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
22023
Demonstration of On-Chip Test Decompression for EDT using Binary Encoded Neural Autoencoders
P Daniel, S Singh, G Gill, A Gangwar, B Ganesh, K Chakrabarti
2019 IEEE International Test Conference India (ITC India), 1-7, 2019
22019
Improved Compact Modeling of Snapback Behaviour in ESD MOSFETs
A Singhal, G Gill, A Lahgere, G Pahwa, H Agarwal
2024 International Conference on Simulation of Semiconductor Processes and …, 2024
12024
Improved ESDFET Compact Model Incorporating Transient, Temperature, and Body Bias Effects
A Singhal, G Gill, G Pahwa, H Agarwal
IEEE Transactions on Electron Devices, 2025
2025
A Comprehensive Analysis of Safe Operating Area Limits in Ferroelectric-Based DEMOS
G Gill, A Singhal, G Pahwa, A Lahgere, H Agarwal
IEEE Transactions on Electron Devices, 2024
2024
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Articles 1–9