WO2022013165A1 - Fabrication de cellules solaires - Google Patents
Fabrication de cellules solaires Download PDFInfo
- Publication number
- WO2022013165A1 WO2022013165A1 PCT/EP2021/069368 EP2021069368W WO2022013165A1 WO 2022013165 A1 WO2022013165 A1 WO 2022013165A1 EP 2021069368 W EP2021069368 W EP 2021069368W WO 2022013165 A1 WO2022013165 A1 WO 2022013165A1
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- WIPO (PCT)
- Prior art keywords
- layer
- solar cell
- tunnel oxide
- illustrates another
- doped
- Prior art date
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S40/00—Components or accessories in combination with PV modules, not provided for in groups H02S10/00 - H02S30/00
- H02S40/20—Optical components
- H02S40/22—Light-reflecting or light-concentrating means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
- H10F10/164—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells
- H10F10/165—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells the heterojunctions being Group IV-IV heterojunctions, e.g. Si/Ge, SiGe/Si or Si/SiC photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
- H10F10/164—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells
- H10F10/165—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells the heterojunctions being Group IV-IV heterojunctions, e.g. Si/Ge, SiGe/Si or Si/SiC photovoltaic cells
- H10F10/166—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells the heterojunctions being Group IV-IV heterojunctions, e.g. Si/Ge, SiGe/Si or Si/SiC photovoltaic cells the Group IV-IV heterojunctions being heterojunctions of crystalline and amorphous materials, e.g. silicon heterojunction [SHJ] photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/147—Shapes of bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
- H10F77/219—Arrangements for electrodes of back-contact photovoltaic cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present description generally relates to solar cells and, more particularly, to the structures of solar cells with contacts via the rear face and their method of manufacture.
- Solar cells are devices intended to convert sunlight into electrical energy.
- a solar cell structure is based on the presence of a p-type region and an n-type region on the same semiconductor substrate.
- each region is coupled to metal contacts on the back side of the solar cells to allow an external electrical circuit or device to be coupled to and powered by the solar cell as is described in US2016/0351737 and in US7468485.
- One embodiment provides a method of fabricating a solar cell, the method comprising, in order: forming a tunnel oxide on at least one surface of a semiconductor substrate; forming a layer doped with a dopant of a first conductivity type on the tunnel oxide; forming a mask on the doped layer; and carrying out, in a gaseous atmosphere containing a dopant of a second conductivity type, doping of at least a first region of the doped layer using a laser.
- the method comprises the formation of trenches extending in the mask, in the tunnel oxide and in the doped layer, after the formation of the mask.
- trenches separate the first regions of the doped layer from the second regions of the doped layer.
- the gas comprises phosphoryl chloride.
- the method comprises texturing the semiconductor substrate on another surface.
- the method comprises the formation of a passivation film on the doped layer, the passivation layer covering the inside of the trenches.
- One embodiment provides a solar cell with interdigitated rear contacts or IBC obtained by the method described above. [0012] One embodiment provides a solar panel comprising solar cells with interdigitated rear contacts.
- Figure 1 illustrates a sectional view illustrating an example of a solar cell
- FIG. 2 illustrates a sectional view illustrating a step of an exemplary method of manufacturing the solar cell illustrated in FIG. 1;
- Figure 3 illustrates another step of the manufacturing process of Figure 2
- Figure 4 illustrates another step of the manufacturing process of Figure 2
- Figure 5 illustrates another step of the manufacturing process of Figure 2
- Figure 6 illustrates another step of the manufacturing process of Figure 2
- Figure 7 illustrates another step of the manufacturing process of Figure 2
- Figure 8 illustrates another step of the manufacturing process of Figure 2
- Figure 9 illustrates another step of the manufacturing process of Figure 2
- Figure 10 illustrates another step of the manufacturing process of Figure 2
- Figure 11 illustrates another step of the manufacturing process of Figure 2;
- Figure 12 illustrates another step of the manufacturing process of Figure 2
- Figure 13 illustrates another step of the manufacturing process of Figure 2
- Figure 14 illustrates another step of the manufacturing process of Figure 2
- Figure 15 illustrates another step of the manufacturing process of Figure 2
- Figure 16 illustrates another step of the manufacturing process of Figure 2
- FIG. 17 illustrates a sectional view illustrating a solar cell according to an embodiment of the present description
- FIG. 18 illustrates a sectional view illustrating a step of a method for manufacturing a solar cell according to the embodiment of the present description
- Figure 19 illustrates another step of the manufacturing process of Figure 18
- Figure 20 illustrates another step of the manufacturing process of Figure 18
- Figure 21 illustrates another step of the manufacturing process of Figure 18
- Figure 22 illustrates another step of the manufacturing process of Figure 18
- Figure 23 illustrates another step of the manufacturing process of Figure 18
- Figure 24 illustrates another step of the manufacturing process of Figure 18
- Figure 25 illustrates another step of the manufacturing process of Figure 18
- Figure 26 illustrates another step of the manufacturing process of Figure 18
- Figure 27 illustrates another step of the manufacturing process of Figure 18
- Figure 28 illustrates another step of the manufacturing process of Figure 18
- Figure 29 illustrates another step of the manufacturing process of Figure 18.
- Figure 30 illustrates another step in the manufacturing process of Figure 18
- the expressions “about”, “approximately”, “substantially”, and “of the order of” mean to within 10%, preferably within 5%.
- Figure 1 is a sectional view illustrating an example of a solar cell.
- the solar cell shown in Figure 1 consists of a semiconductor substrate 10 having a front face portion intended to receive solar radiation during normal operation and a rear face portion where metal contacts of the solar cell are formed .
- the solar cell has a textured front face covered with a doped layer 37.
- the solar cell of FIG. 1 comprises first regions 32 of a first type of conductivity, such as p-type regions, and second regions 36 of a second type of conductivity, such as p-type regions. n, formed in an undoped layer 30B on the rear face of the substrate 10.
- a tunnel oxide layer 20B can be formed on the rear face of the substrate 10, more precisely, between the substrate 10 and the undoped layer 30B.
- Layer 37 is of the second type of conductivity.
- Metallic contacts 41 are connected to regions 32 and 36 to allow external circuits and devices to receive electrical power from the solar cell.
- the solar cell of Figure 1 may include passivation layers 38, 39 and 40 to protect the structure from external electrical damage.
- Figures 2 to 16 are sectional views illustrating steps of an example of a method of manufacturing the solar cell illustrated in Figure 1.
- the process for manufacturing the contact of the solar cell represented in FIG. 1 may comprise:
- FIG. 3 the formation (FIG. 3) of a tunnel oxide layer 20F on a front face 101 of the substrate 10 and of another tunnel oxide layer 20B on a rear face 103 of the substrate 10;
- the doped layer comprises a dopant of a first type of conductivity (p or n);
- FIG. 6 the formation (FIG. 6) of areas 32 in layer 30B by the thermal diffusion of dopants from layer 31 into layer 30B using a laser; - the deposition (FIG. 7) of a masking layer 33 all around the structure;
- FIG. 16 is a sectional view illustrating a solar cell according to an embodiment of the present description.
- the solar cell illustrated in Figure 17 consists of a semiconductor substrate 50 having a front face portion intended to receive solar radiation during normal operation and a rear face portion where metal contacts with the solar cell are formed. .
- the solar cell has a textured front face covered with a doped layer 64.
- the solar cell of FIG. 17 comprises one or more regions 541 of a first type of conductivity, such as p-type regions, and one or more regions 66 of a second type of conductivity, such as regions n-type, formed on the rear face of the substrate 50.
- a tunnel oxide layer 52 can be formed on the rear face of the substrate 50, more precisely, between the substrate 50 and the regions 541, 66.
- Metallic contacts 76 and 78 are connected to regions 541 and 66, respectively, to allow external circuits and devices to receive electrical power from the solar cell.
- the solar cell of Figure 17 may include passivation layers 70, 72, 74 to protect the structure from external electrical damage.
- FIG. 18 illustrates a manufacturing step of a contact solar cell according to the embodiment of the present description.
- the substrate 50 is a semiconductor substrate, for example a silicon wafer, preferably doped with an n-type dopant such as phosphorus (P), or with a p-type dopant such as as gallium (Ga) or boron (B).
- an n-type dopant such as phosphorus (P)
- a p-type dopant such as gallium (Ga) or boron (B).
- the substrate 50 has a front face 501 and a rear face 503.
- the front face 501 is the face of the solar cell intended to receive solar radiation.
- Substrate 50 is thinned to a thickness of, for example, about 240 ⁇ m using a process that also etches away damage to the wafer surfaces (saw etch - SDE).
- FIG. 19 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- a tunnel oxide layer 52 is formed on the rear face 503 and, for example, on the front face of the substrate.
- Tunnel oxide layer 52 is formed to be thin enough to increase the likelihood of direct electron tunneling through tunnel oxide layer 52.
- Tunnel oxide layer 52 may have a thickness of 'about 7 Angstroms to about 20 Angstroms. According to one embodiment, the tunnel oxide layer 52 has a thickness of approximately 10 Angstroms.
- Tunnel oxide layer 52 may be formed, for example, by thermal growth or by chemical deposition (eg, plasma-enhanced chemical vapor deposition (PECVD) or low-pressure chemical vapor deposition (LPCVD)).
- PECVD plasma-enhanced chemical vapor deposition
- LPCVD low-pressure chemical vapor deposition
- Tunnel oxide layer 52 may be formed using an ozone oxidation process, which involves digging substrate 50 into a bath comprising ozone suspended in deionized water. For example, substrate 50 may undergo first a wet etch using potassium hydroxide to thin substrate 50, then a rinse-clean cycle, then the ozone oxidation process to form a layer of tunnel oxide 52 entirely in the same equipment. During the ozone oxidation process, a tunnel oxide layer grows on both sides of the substrate 50.
- a tunnel oxide layer 52 may also be formed using other methods without diminishing the benefits of this disclosure.
- FIG. 20 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- a doped layer 54 for example a p-doped polycrystalline silicon layer, is formed on the tunnel oxide layer 52.
- the polycrystalline silicon layer 54 can have a thickness of approximately 2000 Angstroms.
- the polycrystalline silicon layer can be deposited on tunnel oxide 52 by PECVD or LPCVD using boron trichloride (BCI3) or diborane (B2H6) with silane (S1H4).
- FIG. 21 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- a masking layer 56 is formed on layer 54, on the front side and on the back side, in order to completely envelop the structure of FIG. 20.
- the masking layer 56 can be used in a subsequent laser etching process (FIGS. 23 and 24) exposing portions of layer 54.
- Masking layer 56 may be formed, for example, by thermal growth or by chemical deposition (PECVD or LPCVD). However, various other methods can be applied to form the masking layer 56.
- the masking layer 56 can be made of a material chosen to be an undoped material having no conductive dopant and for its ability to prevent the diffusion of the n-conductivity dopant.
- mask layer 56 may be a single layer comprising silicon oxide (SiO ) , silicon nitride (SiH ) , silicon oxynitride (SiO 2 Ny), intrinsic amorphous silicon, or silicon carbide. silicon (SiC).
- SiO silicon oxide
- SiH silicon nitride
- SiO 2 Ny silicon oxynitride
- SiC silicon
- the masking layer 56 can effectively prevent the diffusion of the dopant.
- FIG. 22 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- the masking layer 56 is removed from the front face (on the side of the front face 501 of the substrate 50) and, for example, from part of the lateral sides of the structure.
- Figure 23 illustrates another manufacturing step of a solar cell according to the embodiment of the present description.
- masking layer 56 is removed from the backside (of the backside of substrate 50) in certain areas to create openings 58 through masking layer 56 and layer 54.
- two openings 58 are made in the masking layer 56, however, the number of openings can be different from two.
- Each opening has a width between 30 nm and 200 mpi and a depth approximately equal to the thickness of the masking layer 56.
- the openings 58 are, for example, made using a laser.
- FIG. 24 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- the front face 501 of the substrate 50 is textured.
- the faceplate 501 can be textured using a wet etching process or another chemical etching process including, for example, potassium hydroxide and isopropyl alcohol or TMAH (tetramethylammonium hydroxide) solution.
- TMAH tetramethylammonium hydroxide
- masking layer 56 is used during etching of p-type dopant layer 54 and tunnel oxide layer 52.
- layer 54, layer 52 and substrate 50 are patterned using a wet etch process comprising buffered hydrofluoric acid, potassium hydroxide with isopropyl alcohol or TMAH (tetramethylammonium hydroxide) solution.
- TMAH tetramethylammonium hydroxide
- the wet etch process etches portions of layer 54, tunnel oxide layer 52, and substrate 50 not covered by masking layer 56.
- the wet etch process etches to create trenches 60 that extend from openings 58 in layer 54, tunnel oxide layer 52 and substrate 50.
- Trenches 60 separate regions of layer 54 to form regions 541 and 542 which are formed in layer 54.
- the front face 501 of the semiconductor substrate 50 is textured before the trenches 60 are formed
- the embodiment is not limited to this.
- the front face 501 of the semiconductor substrate 50 can be textured after the trenches 60 are formed or in a separate process.
- FIG. 25 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- the structure represented in FIG. 24 is, in FIG. 25, placed in a gaseous atmosphere 62 containing an n-type conductivity dopant.
- the gas atmosphere 62 can be created using various gases containing the n-type conductivity dopant.
- the gas atmosphere 62 may include phosphoryl trichloride (POCI3).
- the front face 501 of the semiconductor substrate 50 can be doped with the n-type conductivity dopant.
- a front surface field region 64 may also be formed during the doping process.
- an anti-diffusion film can be formed on the front surface 501 of the semiconductor substrate 50 so that no front surface field 64 is formed during the doping process.
- the front surface field region 64 may be formed by a separate method selected from various methods including, for example, ion implantation, thermal diffusion, or laser illumination doping.
- FIG. 26 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- Figure 26 illustrates the doping of regions 542 to create regions 66.
- the process of doping regions 66 is performed using a laser.
- Regions 68 are formed during this doping process. Field areas 64 can also be made during the present doping step, both under POCI3.
- the laser can have a wavelength of 1064 nm or less. This is because it is difficult to produce a laser having a wavelength exceeding 1064 nm. In other words, any wavelength among infra ⁇ red light, ultraviolet light and visible light can be used as a laser. To date, in one example, the laser may be a laser having a wavelength in the range of 500 nm to 650 nm, i.e. a green laser.
- FIG. 27 illustrates another manufacturing step of a contact solar cell according to the embodiment of the present description.
- the substrate 50 is doped using the laser mentioned in FIG. 26.
- the substrate 50 is doped at the same time as the doping of the region 542.
- the mask 56 is removed and the structure is removed from the gas atmosphere 62.
- FIG. 28 illustrates another step in the manufacture of a contact solar cell according to the embodiment of the present description.
- an insulating film 70 is formed on the front surface of the semiconductor substrate 50.
- the insulating film 70 includes a front surface passivation film and a anti-reflective film which are formed on the front surface of the layer 64.
- the front surface passivation film and the anti-reflective film are formed on the entire front surface of the layer 64.
- the surface passivation film front and anti-reflective film can be formed using various methods such as, for example, vacuum deposition, chemical vapor deposition, spin coating, screen printing, or spray coating. The formation sequence of the front passivation film and the anti-reflective film is not defined.
- FIG. 29 illustrates another manufacturing step of a contact solar cell according to the embodiment of the present description.
- insulating films 72 and 74 are formed respectively on the rear surface and on the side surface of the structure.
- the rear surface passivation film 72 is formed over the entire rear surface of the structure.
- Back surface passivation film 72 can be formed using various methods such as, for example, vacuum deposition, chemical vapor deposition, spin coating, screen printing, or spray coating.
- FIG. 30 illustrates another manufacturing step of a contact solar cell according to the embodiment of the present description.
- Figure 30 illustrates the formation of first and second electrodes 76 and 78, which are connected to conductive regions 541 and 66 respectively.
- the first and second electrodes 76 and 78 can be formed by applying a paste, on the rear surface, for example, by screen printing, then by making, for example, a contact by thermal diffusion or by laser illumination.
- the rear surface is etched, for example the passivation film 72 is etched, before the deposition of a metal, in order to create metallizations.
- An advantage of the second embodiments is that the deposition of the tunnel oxide, of the doped layer and of the mask is carried out in a single step, unlike the first embodiment.
- An advantage of the second embodiments is that the solar cell manufacturing process is shorter and less expensive than the first embodiment.
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Abstract
Description
Claims
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18/003,044 US20230253521A1 (en) | 2020-07-13 | 2021-07-12 | Solar cell manufacture |
| JP2023503071A JP2023534500A (ja) | 2020-07-13 | 2021-07-12 | 太陽電池の製造 |
| CN202180049703.1A CN115836398A (zh) | 2020-07-13 | 2021-07-12 | 太阳能电池的制造 |
| CA3188777A CA3188777A1 (fr) | 2020-07-13 | 2021-07-12 | Fabrication de cellules solaires |
| PH1/2023/550042A PH12023550042A1 (en) | 2020-07-13 | 2021-07-12 | Solar cell manufacture |
| EP21743469.5A EP4179579A1 (fr) | 2020-07-13 | 2021-07-12 | Fabrication de cellules solaires |
| KR1020237004709A KR20230048041A (ko) | 2020-07-13 | 2021-07-12 | 태양 전지 제조 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2007380A FR3112427A1 (fr) | 2020-07-13 | 2020-07-13 | Formation de contacts passivés pour cellules solaires IBC |
| FR2007380 | 2020-07-13 | ||
| FR2011025A FR3112429B1 (fr) | 2020-07-13 | 2020-10-28 | Fabrication de cellules solaires |
| FR2011025 | 2020-10-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2022013165A1 true WO2022013165A1 (fr) | 2022-01-20 |
Family
ID=74045811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2021/069368 Ceased WO2022013165A1 (fr) | 2020-07-13 | 2021-07-12 | Fabrication de cellules solaires |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US20230253521A1 (fr) |
| EP (1) | EP4179579A1 (fr) |
| JP (1) | JP2023534500A (fr) |
| KR (1) | KR20230048041A (fr) |
| CN (1) | CN115836398A (fr) |
| CA (1) | CA3188777A1 (fr) |
| FR (2) | FR3112427A1 (fr) |
| PH (1) | PH12023550042A1 (fr) |
| TW (1) | TW202218176A (fr) |
| WO (1) | WO2022013165A1 (fr) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024228665A1 (fr) * | 2023-04-30 | 2024-11-07 | Maxeon Solar Pte. Ltd. | Cellule solaire à architecture cellulaire conçue pour une recombinaison de porteuse réduite |
| CN117276356A (zh) * | 2023-06-02 | 2023-12-22 | 天合光能股份有限公司 | 太阳能电池及其制作方法、光伏组件及光伏系统 |
| CN117954509B (zh) * | 2024-03-27 | 2024-06-28 | 天合光能股份有限公司 | 背接触太阳能电池的制备方法、太阳能电池及电池组件 |
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| FR2007380A1 (fr) | 1968-04-03 | 1970-01-09 | Bayer Ag | |
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| US20110284986A1 (en) * | 2010-12-14 | 2011-11-24 | Seung Bum Rim | Bypass diode for a solar cell |
| US20160268455A1 (en) * | 2015-03-13 | 2016-09-15 | Natcore Technology, Inc. | Laser processed back contact heterojunction solar cells |
| US20160351737A1 (en) | 2015-05-28 | 2016-12-01 | Lg Electronics Inc. | Solar cell and method of manufacturing the same |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7737357B2 (en) * | 2006-05-04 | 2010-06-15 | Sunpower Corporation | Solar cell having doped semiconductor heterojunction contacts |
| US8222516B2 (en) * | 2008-02-20 | 2012-07-17 | Sunpower Corporation | Front contact solar cell with formed emitter |
| US8790957B2 (en) * | 2010-03-04 | 2014-07-29 | Sunpower Corporation | Method of fabricating a back-contact solar cell and device thereof |
| US8802486B2 (en) * | 2011-04-25 | 2014-08-12 | Sunpower Corporation | Method of forming emitters for a back-contact solar cell |
| CN102856328B (zh) * | 2012-10-10 | 2015-06-10 | 友达光电股份有限公司 | 太阳能电池及其制作方法 |
| SG11201504937VA (en) * | 2012-12-28 | 2015-07-30 | Merck Patent Gmbh | Doping media for the local doping of silicon wafers |
| KR20140135881A (ko) * | 2013-05-16 | 2014-11-27 | 엘지전자 주식회사 | 태양 전지 및 이의 제조 방법 |
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| KR101613846B1 (ko) * | 2014-06-10 | 2016-04-20 | 엘지전자 주식회사 | 태양 전지 및 이의 제조 방법 |
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2020
- 2020-07-13 FR FR2007380A patent/FR3112427A1/fr active Pending
- 2020-10-28 FR FR2011025A patent/FR3112429B1/fr active Active
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2021
- 2021-07-12 KR KR1020237004709A patent/KR20230048041A/ko not_active Withdrawn
- 2021-07-12 CN CN202180049703.1A patent/CN115836398A/zh active Pending
- 2021-07-12 CA CA3188777A patent/CA3188777A1/fr active Pending
- 2021-07-12 JP JP2023503071A patent/JP2023534500A/ja active Pending
- 2021-07-12 PH PH1/2023/550042A patent/PH12023550042A1/en unknown
- 2021-07-12 EP EP21743469.5A patent/EP4179579A1/fr active Pending
- 2021-07-12 US US18/003,044 patent/US20230253521A1/en not_active Abandoned
- 2021-07-12 WO PCT/EP2021/069368 patent/WO2022013165A1/fr not_active Ceased
- 2021-07-13 TW TW110125591A patent/TW202218176A/zh unknown
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Also Published As
| Publication number | Publication date |
|---|---|
| FR3112427A1 (fr) | 2022-01-14 |
| JP2023534500A (ja) | 2023-08-09 |
| FR3112429B1 (fr) | 2025-04-11 |
| FR3112429A1 (fr) | 2022-01-14 |
| CA3188777A1 (fr) | 2022-01-20 |
| TW202218176A (zh) | 2022-05-01 |
| CN115836398A (zh) | 2023-03-21 |
| KR20230048041A (ko) | 2023-04-10 |
| PH12023550042A1 (en) | 2024-03-18 |
| US20230253521A1 (en) | 2023-08-10 |
| EP4179579A1 (fr) | 2023-05-17 |
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