[go: up one dir, main page]

WO2017038702A8 - 蛍光ｘ線分析装置 - Google Patents

蛍光ｘ線分析装置 Download PDF

Info

Publication number
WO2017038702A8
WO2017038702A8 PCT/JP2016/075034 JP2016075034W WO2017038702A8 WO 2017038702 A8 WO2017038702 A8 WO 2017038702A8 JP 2016075034 W JP2016075034 W JP 2016075034W WO 2017038702 A8 WO2017038702 A8 WO 2017038702A8
Authority
WO
WIPO (PCT)
Prior art keywords
profile
ray fluorescence
quantitative analysis
fluorescence spectrometer
peak
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2016/075034
Other languages
English (en)
French (fr)
Other versions
WO2017038702A1 (ja
Inventor
真也 原
松尾　尚
山田　康治郎
寿 本間
片岡　由行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Priority to CN201680049794.8A priority Critical patent/CN107923859B/zh
Priority to EP16841734.3A priority patent/EP3343211B1/en
Priority to JP2017537854A priority patent/JP6340604B2/ja
Publication of WO2017038702A1 publication Critical patent/WO2017038702A1/ja
Publication of WO2017038702A8 publication Critical patent/WO2017038702A8/ja
Priority to US15/901,244 priority patent/US10161889B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

本発明の走査型の蛍光Ｘ線分析装置が備える定量分析条件設定手段（１３）は、複数の標準試料（１４）について定性分析を行い、その結果に基づいて、定量分析条件において分析対象試料（１）における測定線のピーク測定角度を設定するとともに、定性分析された複数の標準試料（１４）のピークプロファイルを合成して単一の仮想プロファイルを求め、仮想プロファイルおよびあらかじめ設定されたピークプロファイルの半値幅に基づいて、定量分析条件において分析対象試料（１）における測定線のバックグラウンド測定角度を設定する。
PCT/JP2016/075034 2015-08-28 2016-08-26 蛍光ｘ線分析装置 Ceased WO2017038702A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN201680049794.8A CN107923859B (zh) 2015-08-28 2016-08-26 荧光x射线分析装置
EP16841734.3A EP3343211B1 (en) 2015-08-28 2016-08-26 X-ray fluorescence spectrometer
JP2017537854A JP6340604B2 (ja) 2015-08-28 2016-08-26 蛍光ｘ線分析装置
US15/901,244 US10161889B2 (en) 2015-08-28 2018-02-21 X-ray fluorescence spectrometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-169543 2015-08-28
JP2015169543 2015-08-28

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/901,244 Continuation US10161889B2 (en) 2015-08-28 2018-02-21 X-ray fluorescence spectrometer

Publications (2)

Publication Number Publication Date
WO2017038702A1 WO2017038702A1 (ja) 2017-03-09
WO2017038702A8 true WO2017038702A8 (ja) 2018-02-01

Family

ID=58187491

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/JP2016/075034 Ceased WO2017038702A1 (ja) 2015-08-28 2016-08-26 蛍光ｘ線分析装置
PCT/JP2016/075033 Ceased WO2017038701A1 (ja) 2015-08-28 2016-08-26 蛍光ｘ線分析装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/JP2016/075033 Ceased WO2017038701A1 (ja) 2015-08-28 2016-08-26 蛍光ｘ線分析装置

Country Status (5)

Country Link
US (2) US10082475B2 (ja)
EP (2) EP3343211B1 (ja)
JP (2) JP6340604B2 (ja)
CN (2) CN107209132B (ja)
WO (2) WO2017038702A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018168939A1 (ja) * 2017-03-15 2018-09-20 株式会社リガク 蛍光ｘ線分析方法、蛍光ｘ線分析プログラムおよび蛍光ｘ線分析装置
JP6797421B2 (ja) * 2018-08-09 2020-12-09 株式会社リガク 蛍光ｘ線分析装置
JP6998608B2 (ja) * 2019-09-20 2022-01-18 株式会社リガク 定量分析方法、定量分析プログラム、及び、蛍光ｘ線分析装置
JP6838754B1 (ja) * 2019-09-26 2021-03-03 株式会社リガク 蛍光ｘ線分析装置
JP7190749B2 (ja) * 2020-05-18 2022-12-16 株式会社リガク 蛍光ｘ線分析装置
JP7190751B2 (ja) * 2020-10-30 2022-12-16 株式会社リガク 蛍光ｘ線分析装置
RU2756666C1 (ru) * 2021-02-01 2021-10-04 Акционерное общество "Чепецкий механический завод" Способ определения содержания гафния в металлическом цирконии и сплавах на его основе
JP7325849B2 (ja) * 2021-10-28 2023-08-15 株式会社リガク ピーク同定解析プログラム及び蛍光ｘ線分析装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US6041096A (en) * 1995-08-09 2000-03-21 Asahi Kasei Kogyo Kabushiki Kaisha Method and apparatus for total reflection X-ray fluorescence spectroscopy
JP2000310602A (ja) 1999-02-23 2000-11-07 Rigaku Industrial Co 蛍光ｘ線分析装置およびこれに使用する記録媒体
JP2004212406A (ja) 1999-02-23 2004-07-29 Rigaku Industrial Co 蛍光ｘ線分析装置およびこれに使用する記録媒体
JP3567177B2 (ja) * 2000-04-11 2004-09-22 理学電機工業株式会社 蛍光ｘ線分析装置
JP2002340822A (ja) * 2001-05-16 2002-11-27 Rigaku Industrial Co 蛍光ｘ線分析装置
DE10159828B4 (de) 2001-12-06 2007-09-20 Rigaku Industrial Corporation, Takatsuki Röntgenfluoreszenzspektrometer
US6845147B2 (en) 2002-06-17 2005-01-18 Edax Inc. Scatter spectra method for x-ray fluorescent analysis with optical components
JP4908119B2 (ja) 2005-10-19 2012-04-04 株式会社リガク 蛍光ｘ線分析装置
WO2011027613A1 (ja) 2009-09-07 2011-03-10 株式会社リガク 蛍光ｘ線分析方法
JP5874108B2 (ja) * 2012-03-27 2016-03-02 株式会社リガク 蛍光ｘ線分析装置
JP6002890B2 (ja) * 2014-09-18 2016-10-05 株式会社リガク Ｘ線分析装置
US9784699B2 (en) 2015-03-03 2017-10-10 Panalytical B.V. Quantitative X-ray analysis—matrix thickness correction

Also Published As

Publication number Publication date
JP6340604B2 (ja) 2018-06-13
US10161889B2 (en) 2018-12-25
CN107209132B (zh) 2019-06-21
WO2017038702A1 (ja) 2017-03-09
CN107209132A (zh) 2017-09-26
WO2017038701A1 (ja) 2017-03-09
JPWO2017038701A1 (ja) 2017-10-12
EP3239702A1 (en) 2017-11-01
EP3239702B1 (en) 2019-03-27
US10082475B2 (en) 2018-09-25
CN107923859A (zh) 2018-04-17
EP3343211A4 (en) 2019-08-07
CN107923859B (zh) 2018-12-21
US20180106736A1 (en) 2018-04-19
EP3239702A4 (en) 2018-01-03
WO2017038701A8 (ja) 2017-06-15
EP3343211A1 (en) 2018-07-04
JPWO2017038702A1 (ja) 2018-06-07
EP3343211B1 (en) 2020-07-29
US20180180563A1 (en) 2018-06-28
JP6232568B2 (ja) 2017-11-22

Similar Documents

Publication Publication Date Title
WO2017038702A8 (ja) 蛍光ｘ線分析装置
EP2797104A3 (en) Imaging mass analysis data processing method and imaging mass spectrometer
WO2018072862A8 (de) Verfahren zum auswerten von daten einer massenspektrometrie und massenspektrometrisches verfahren sowie ein maldi tof massenspektrometer
EP3598116A4 (en) X-RAY FLUORESCENCE ANALYSIS METHOD, X-RAY FLUORESCENCE ANALYSIS PROGRAM AND X-RAY FLUORESCENCE ANALYSIS DEVICE
WO2015094995A3 (en) Gene signature biomarkers of tumor response to pd-1 antagonists
IL253666A0 (en) Hyperspectral testing device for testing different types of samples
GB201316221D0 (en) Concealed dangerous articles detection method and device
WO2012148497A3 (en) Identification of polynucleotides associated with a sample
WO2015094996A3 (en) Pd-l1 gene signature biomarkers of tumor response to pd-1 antagonists
WO2016127077A8 (en) Systems and methods for detection and analysis of biological species
EP2477206A3 (en) Particle beam device and method for processing and/or analyzing a sample
HK1258233A1 (zh) 包括根据每个细胞产生的光谱对细胞识别或分类的用於分析样本的方法、计算机程序和系统
CY1122239T1 (el) Μεθοδος για την ανιχνευση ανωμαλιων στην αιμοσφαιρινη
BR112017002622A2 (pt) métodos e sistemas para quantificação seletiva e detecção de alergênicos
EP3428612B8 (en) Rapid sample preparation for analytical analysis using dispersive energized extraction
WO2018097614A3 (ko) 유방암 환자의 화학치료 유용성 예측 방법
MX361122B (es) Aparato de difracción de rayos x y método de medición de difracción de rayos x.
EP3438277A4 (en) PROCESS FOR DETERMINING WHETHER A TEST PROCEDURE CONTAINS PHYTOPATHOGENIC MUSHROOMS OR NOT
WO2013166444A3 (en) Biomarker analysis using scodaphoresis
WO2018045208A8 (en) Collection probe and methods for the use thereof
EP2660573A3 (en) Systems and methods for identifying a plurality of compounds in a mixture
WO2013177121A3 (en) Identification and quantification of intact glycopeptides in complex samples
CN107076822A (zh) 利用引入器件判断射频器件去嵌入精度的测试结构及方法
BR112016000231A8 (pt) métodos para identificações de condições de separação com cromatografia de troca de íons e para análises de composições de polipeptídeos
WO2016172179A3 (en) Metagenomic compositions and methods for the detection of breast cancer

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 16841734

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2017537854

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 2016841734

Country of ref document: EP