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WO2008132976A1 - 顕微鏡装置 - Google Patents

顕微鏡装置 Download PDF

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Publication number
WO2008132976A1
WO2008132976A1 PCT/JP2008/056883 JP2008056883W WO2008132976A1 WO 2008132976 A1 WO2008132976 A1 WO 2008132976A1 JP 2008056883 W JP2008056883 W JP 2008056883W WO 2008132976 A1 WO2008132976 A1 WO 2008132976A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample
objective lens
passes
diffraction grating
forms
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/056883
Other languages
English (en)
French (fr)
Inventor
Yumiko Ouchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP2009511746A priority Critical patent/JP4835750B2/ja
Priority to EP08739986.1A priority patent/EP2136233B1/en
Publication of WO2008132976A1 publication Critical patent/WO2008132976A1/ja
Priority to US12/461,006 priority patent/US7808701B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

　回折格子８により発生した回折光は、第２対物レンズ９を通り、反射ミラー２０５で偏向されて第１対物レンズ１０により、標本１１の表面に縞模様の照明光を形成する。これにより、標本１１から発生した蛍光は、第１対物レンズ１０、反射ミラー２０５、第２対物レンズ９を通り、回折格子８に、標本１１の像を結像する。回折格子８を光学系から取り外し、反射ミラー２０５の代わりにダイクロイックミラーを配置すれば、標本１１からの蛍光は、ダイクロイックミラーを透過して結像レンズ５２により、撮像装置５３の撮像面に、標本１１の像を結像する。これにより、通常の蛍光顕微鏡と切り換えて使用することが可能な、回折光を利用した顕微鏡装置を提供することができる。
PCT/JP2008/056883 2007-04-12 2008-04-07 顕微鏡装置 Ceased WO2008132976A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009511746A JP4835750B2 (ja) 2007-04-12 2008-04-07 顕微鏡装置
EP08739986.1A EP2136233B1 (en) 2007-04-12 2008-04-07 Microscope device
US12/461,006 US7808701B2 (en) 2007-04-12 2009-07-29 Microscope apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-104725 2007-04-12
JP2007104725 2007-04-12

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/461,006 Continuation US7808701B2 (en) 2007-04-12 2009-07-29 Microscope apparatus

Publications (1)

Publication Number Publication Date
WO2008132976A1 true WO2008132976A1 (ja) 2008-11-06

Family

ID=39925435

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056883 Ceased WO2008132976A1 (ja) 2007-04-12 2008-04-07 顕微鏡装置

Country Status (4)

Country Link
US (1) US7808701B2 (ja)
EP (1) EP2136233B1 (ja)
JP (1) JP4835750B2 (ja)
WO (1) WO2008132976A1 (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013539074A (ja) * 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム
WO2014084007A1 (ja) * 2012-11-29 2014-06-05 シチズンホールディングス株式会社 光変調素子
JP2015064438A (ja) * 2013-09-24 2015-04-09 株式会社ニコン 構造化照明顕微鏡装置
WO2015087960A1 (ja) * 2013-12-12 2015-06-18 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JP2017083473A (ja) * 2017-01-11 2017-05-18 アストロデザイン株式会社 光学的分解能向上装置
WO2019053768A1 (ja) * 2017-09-12 2019-03-21 株式会社ニコン 顕微鏡および観察方法
JP2019086562A (ja) * 2017-11-02 2019-06-06 オリンパス株式会社 観察装置

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9005115B2 (en) 2005-04-04 2015-04-14 Invuity, Inc. Illuminated telescoping cannula
CA2768058A1 (en) * 2009-08-10 2011-02-17 Chroma Technology Corporation Microscope cube
EP3667391A1 (de) * 2009-10-28 2020-06-17 Carl Zeiss Microscopy GmbH Mikroskopisches verfahren und mikroskop mit gesteigerter auflösung
TWI436098B (zh) * 2010-12-16 2014-05-01 Ind Tech Res Inst 建構高解析度影像之系統及方法
WO2012159205A1 (en) * 2011-05-25 2012-11-29 Huron Technologies International Inc. 3d pathology slide scanner
JP5751328B2 (ja) 2011-06-29 2015-07-22 株式会社ニコン 構造化照明光学系および構造化照明顕微鏡装置
EP2788820B1 (en) * 2011-12-07 2022-10-12 Celloptic, Inc. Apparatus for producing a hologram
DE102012106584B4 (de) * 2012-07-20 2021-01-07 Carl Zeiss Ag Verfahren und Vorrichtung zur Bildrekonstruktion
DE102012017920B4 (de) * 2012-09-11 2023-11-30 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
DE102013001238B4 (de) * 2013-01-25 2020-06-10 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Mikroskopieverfahren
DE102013218231A1 (de) * 2013-09-11 2015-03-12 Sirona Dental Systems Gmbh Optisches System zur Erzeugung eines sich zeitlich ändernden Musters für ein Konfokalmikroskop
WO2015052936A1 (ja) * 2013-10-09 2015-04-16 株式会社ニコン 構造化照明顕微鏡装置
JP6253395B2 (ja) * 2013-12-19 2017-12-27 オリンパス株式会社 画像生成システム
JP6635052B2 (ja) * 2015-02-05 2020-01-22 株式会社ニコン 構造化照明顕微鏡、及び観察方法
US10519842B2 (en) * 2016-05-17 2019-12-31 Ford Global Technologies, Llc Exhaust sensor module shield
JP2019537067A (ja) 2016-12-01 2019-12-19 バークレー ライツ，インコーポレイテッド 微小物体を撮像する装置、システム、及び方法
US11619586B2 (en) 2021-07-08 2023-04-04 X Development Llc System for imaging and selective illumination of targets within a sample

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US38307A (en) 1863-04-28 Improved washing-machine
JPH11242189A (ja) 1997-12-25 1999-09-07 Olympus Optical Co Ltd 像形成法、像形成装置
JP2002196253A (ja) * 2000-12-26 2002-07-12 Nikon Corp 干渉縞投影光学系及びこの光学系を用いた顕微鏡
JP2006334211A (ja) 2005-06-03 2006-12-14 Kita Idea:Kk 組み立て式洗髪装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2968080B2 (ja) * 1991-04-30 1999-10-25 ジェイエスアール株式会社 高分解能光学顕微鏡および照射スポット光作成用マスク
US5671085A (en) * 1995-02-03 1997-09-23 The Regents Of The University Of California Method and apparatus for three-dimensional microscopy with enhanced depth resolution
JP2001021810A (ja) * 1999-07-07 2001-01-26 Nikon Corp 干渉顕微鏡
DE10155002A1 (de) * 2001-11-08 2003-05-22 Zeiss Carl Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
JP4563811B2 (ja) * 2002-09-09 2010-10-13 ザイゴ コーポレーション 薄膜構造の特性評価を含む、偏光解析、反射光測定および散乱光測定のための干渉計法および走査式干渉計
US7139081B2 (en) * 2002-09-09 2006-11-21 Zygo Corporation Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
WO2007043314A1 (ja) * 2005-10-13 2007-04-19 Nikon Corporation 顕微鏡装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US38307A (en) 1863-04-28 Improved washing-machine
JPH11242189A (ja) 1997-12-25 1999-09-07 Olympus Optical Co Ltd 像形成法、像形成装置
JP2002196253A (ja) * 2000-12-26 2002-07-12 Nikon Corp 干渉縞投影光学系及びこの光学系を用いた顕微鏡
JP2006334211A (ja) 2005-06-03 2006-12-14 Kita Idea:Kk 組み立て式洗髪装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
W. LUKOSZ: "Optical systems with resolving powers exceeding the classical limit. II", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, vol. 37, 1967, pages 932
W. LUKOSZ; M. MARCHAND, OPT. ACTA., vol. 10, 1963, pages 241

Cited By (20)

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US10571674B2 (en) 2010-09-24 2020-02-25 Carl Zeiss Microscopy Gmbh 3D localization microscopy and 4D localization microscopy and tracking methods and systems
US9523846B2 (en) 2010-09-24 2016-12-20 Carl Zeiss Microscopy Gmbh 3D localisation microscopy and 4D localisation microscopy and tracking methods and systems
JP2013539074A (ja) * 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング ３ｄ局在顕微鏡法並びに４ｄ局在顕微鏡法及び追跡方法並びに追跡システム
US10007103B2 (en) 2010-09-24 2018-06-26 Carl Zeiss Microscopy Gmbh 3D localization microscopy and 4D localization microscopy and tracking methods and systems
WO2014084007A1 (ja) * 2012-11-29 2014-06-05 シチズンホールディングス株式会社 光変調素子
US9772484B2 (en) 2012-11-29 2017-09-26 Citizen Watch Co., Ltd. Light modulating device
JPWO2014084007A1 (ja) * 2012-11-29 2017-01-05 シチズンホールディングス株式会社 光変調素子
JP2015064438A (ja) * 2013-09-24 2015-04-09 株式会社ニコン 構造化照明顕微鏡装置
JP2019168716A (ja) * 2013-12-12 2019-10-03 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JP2017219857A (ja) * 2013-12-12 2017-12-14 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
US10302927B2 (en) 2013-12-12 2019-05-28 Nikon Corporation Structured illumination microscope, structured illumination method, and program
WO2015087960A1 (ja) * 2013-12-12 2015-06-18 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JPWO2015087960A1 (ja) * 2013-12-12 2017-03-16 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
US10725276B2 (en) 2013-12-12 2020-07-28 Nikon Corporation Structured illumination microscope, structured illumination method, and program
US11009692B2 (en) 2013-12-12 2021-05-18 Nikon Corporation Structured illumination microscope, structured illumination method, and program
JP2017083473A (ja) * 2017-01-11 2017-05-18 アストロデザイン株式会社 光学的分解能向上装置
WO2019053768A1 (ja) * 2017-09-12 2019-03-21 株式会社ニコン 顕微鏡および観察方法
JPWO2019053768A1 (ja) * 2017-09-12 2020-10-29 株式会社ニコン 顕微鏡および観察方法
JP7063337B2 (ja) 2017-09-12 2022-05-09 株式会社ニコン 顕微鏡および観察方法
JP2019086562A (ja) * 2017-11-02 2019-06-06 オリンパス株式会社 観察装置

Also Published As

Publication number Publication date
US20090296205A1 (en) 2009-12-03
JP4835750B2 (ja) 2011-12-14
EP2136233A4 (en) 2012-03-07
EP2136233B1 (en) 2013-06-12
JPWO2008132976A1 (ja) 2010-07-22
US7808701B2 (en) 2010-10-05
EP2136233A1 (en) 2009-12-23

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