WO2009031477A1 - オートフォーカス装置および顕微鏡 - Google Patents
オートフォーカス装置および顕微鏡 Download PDFInfo
- Publication number
- WO2009031477A1 WO2009031477A1 PCT/JP2008/065585 JP2008065585W WO2009031477A1 WO 2009031477 A1 WO2009031477 A1 WO 2009031477A1 JP 2008065585 W JP2008065585 W JP 2008065585W WO 2009031477 A1 WO2009031477 A1 WO 2009031477A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- incident
- microscope
- reference light
- automatic focusing
- dichroic mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
- G02B21/245—Devices for focusing using auxiliary sources, detectors
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Automatic Focus Adjustment (AREA)
Abstract
本発明は、顕微鏡における観察環境を向上させることができるオートフォーカス装置および顕微鏡に関する。
オートフォーカス用のLED61から射出された参照光は、ハーフミラー134乃至対物レンズ23を介して標本が接着されたガラスカバーに入射する。ガラスカバーに入射した参照光は、その境界面Sにおいて反射して反射光となり、対物レンズ23を介してダイクロイックミラー63に入射する。反射光の一部は、ダイクロイックミラー63において透過されてフィルタ65に入射し、フィルタ65は反射光を透過させてダイクロイックミラー191乃至レンズ69を介してカメラ27に入射させる。ユーザは、カメラ27により撮像された参照光の像を見ながら電動操作ミラー135を回動させ、境界面S上における参照光の像の位置を移動させる。本発明は、顕微鏡に適用することができる。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009531214A JP5621259B2 (ja) | 2007-09-03 | 2008-08-29 | 顕微鏡装置 |
| EP16153962.2A EP3067729B1 (en) | 2007-09-03 | 2008-08-29 | Automatic focusing device and microscope |
| EP08829327.9A EP2196836B1 (en) | 2007-09-03 | 2008-08-29 | Automatic focusing device and microscope |
| US12/676,095 US8629382B2 (en) | 2007-09-03 | 2008-08-29 | Auto focus apparatus for detecting a focal point with a setting section for shifting an irradiation position outside an observation field of an imaging section |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007-227651 | 2007-09-03 | ||
| JP2007227651 | 2007-09-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2009031477A1 true WO2009031477A1 (ja) | 2009-03-12 |
Family
ID=40428796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/065585 Ceased WO2009031477A1 (ja) | 2007-09-03 | 2008-08-29 | オートフォーカス装置および顕微鏡 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8629382B2 (ja) |
| EP (2) | EP3067729B1 (ja) |
| JP (1) | JP5621259B2 (ja) |
| WO (1) | WO2009031477A1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013533513A (ja) * | 2010-07-28 | 2013-08-22 | ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー | 試料構造の顕微鏡像を取得する方法及び装置 |
| EP2491452A4 (en) * | 2009-10-19 | 2015-03-11 | Ventana Med Syst Inc | IMAGING SYSTEM AND TECHNIQUES |
| EP2495592A4 (en) * | 2009-07-13 | 2018-04-18 | Nikon Corporation | Three-dimensional directional drift control device and microscope device |
| CN119270491A (zh) * | 2024-11-22 | 2025-01-07 | 南京波长光电科技股份有限公司 | 一种适用于荧光显微镜的快速自动对焦模组及方法 |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| HU0800686D0 (en) * | 2008-11-17 | 2009-01-28 | Femtonics Kft | Laser scanning microscope |
| US9229207B2 (en) * | 2008-11-17 | 2016-01-05 | Femtonics Kft | Laser scanning microscope with focus-detecting unit |
| EP2498113B1 (de) * | 2011-03-10 | 2013-03-06 | Sick AG | Fokusverstellvorrichtung für einen Codeleser |
| GB201113071D0 (en) * | 2011-07-29 | 2011-09-14 | Ffei Ltd | Method and apparatus for image scanning |
| US9594230B2 (en) | 2011-12-23 | 2017-03-14 | Rudolph Technologies, Inc. | On-axis focus sensor and method |
| WO2015181951A1 (ja) | 2014-05-30 | 2015-12-03 | 株式会社ニコン | 焦点調節装置、顕微鏡装置、焦点調節方法、及び制御プログラム |
| JP6590366B2 (ja) * | 2015-09-25 | 2019-10-16 | オリンパス株式会社 | 顕微鏡装置、オートフォーカス装置、及び、オートフォーカス方法 |
| US10496156B2 (en) * | 2016-05-17 | 2019-12-03 | Google Llc | Techniques to change location of objects in a virtual/augmented reality system |
| EP3287829A1 (en) * | 2016-08-25 | 2018-02-28 | Deutsches Krebsforschungszentrum | Method of and microscope with installation for focus stabilization |
| JP6680653B2 (ja) * | 2016-09-12 | 2020-04-15 | シスメックス株式会社 | 顕微鏡装置、顕微鏡システムおよび撮像方法 |
| GB201704770D0 (en) * | 2017-01-05 | 2017-05-10 | Illumina Inc | Predictive focus tracking apparatus and methods |
| US10165170B2 (en) * | 2017-03-06 | 2018-12-25 | Semiconductor Components Industries, Llc | Methods and apparatus for autofocus |
| CN107656364B (zh) * | 2017-11-16 | 2020-10-23 | 宁波舜宇仪器有限公司 | 一种显微成像系统及其实时对焦方法 |
| CN108195804A (zh) * | 2017-12-12 | 2018-06-22 | 濮阳光电产业技术研究院 | 一种荧光探测器 |
| US11567293B2 (en) * | 2018-02-14 | 2023-01-31 | Riken | Autofocus device, and optical apparatus and microscope including the same |
| DE102019113975B4 (de) * | 2019-05-24 | 2023-10-19 | Abberior Instruments Gmbh | Verfahren und Vorrichtung zum Überwachen des Fokuszustands eines Mikroskops sowie Mikroskop |
| CN110691153B (zh) * | 2019-08-27 | 2020-09-22 | 珠海格力电器股份有限公司 | 一种显示模组及终端 |
| CN114415325B (zh) * | 2022-02-22 | 2023-11-03 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 调焦光学成像系统 |
| KR20230139684A (ko) * | 2022-03-28 | 2023-10-05 | 주식회사 스타노스 | 광학현미경을 위한 자동 초점 장치 및 자동 초점 유지 방법 |
| WO2024208601A1 (en) * | 2023-04-03 | 2024-10-10 | Nanolive Sa | Microscope with autofocus system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JPH10133117A (ja) * | 1996-10-31 | 1998-05-22 | Nikon Corp | 焦点検出装置を備えた顕微鏡 |
| JP2002328297A (ja) * | 2001-05-01 | 2002-11-15 | Olympus Optical Co Ltd | 焦点検出装置及びそれを備えた光学顕微鏡又は光学検査装置 |
| JP2004070276A (ja) * | 2002-06-14 | 2004-03-04 | Nikon Corp | オートフォーカス装置 |
| JP2005316070A (ja) * | 2004-04-28 | 2005-11-10 | Olympus Corp | レーザ集光光学系 |
| JP2008116900A (ja) * | 2006-10-11 | 2008-05-22 | Olympus Corp | 干渉対物レンズと、その干渉対物レンズを備える干渉顕微鏡装置 |
Family Cites Families (13)
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| US5589936A (en) * | 1992-09-14 | 1996-12-31 | Nikon Corporation | Optical measuring apparatus for measuring physichemical properties |
| DE69418248T2 (de) * | 1993-06-03 | 1999-10-14 | Hamamatsu Photonics Kk | Optisches Laser-Abtastsystem mit Axikon |
| EP0902885A4 (en) * | 1996-05-16 | 2006-09-27 | Affymetrix Inc | SYSTEMS AND METHODS FOR DETECTION OF BRANDED PRODUCTS |
| US6169289B1 (en) * | 1998-01-27 | 2001-01-02 | Wisconsin Alumni Research Foundation | Signal enhancement for fluorescence microscopy |
| US6248988B1 (en) * | 1998-05-05 | 2001-06-19 | Kla-Tencor Corporation | Conventional and confocal multi-spot scanning optical microscope |
| AU749690B2 (en) * | 1998-08-21 | 2002-07-04 | Surromed, Inc. | Novel optical architectures for microvolume laser-scanning cytometers |
| US6563586B1 (en) * | 1999-02-01 | 2003-05-13 | Therma-Wave, Inc. | Wafer metrology apparatus and method |
| US6927389B2 (en) * | 2002-12-03 | 2005-08-09 | Agilent Technologies, Inc. | Bi-directional scanner control system |
| JP2004309702A (ja) * | 2003-04-04 | 2004-11-04 | Olympus Corp | 顕微鏡 |
| US7345814B2 (en) * | 2003-09-29 | 2008-03-18 | Olympus Corporation | Microscope system and microscope focus maintaining device for the same |
| US7369308B2 (en) * | 2004-02-09 | 2008-05-06 | Olympus Corporation | Total internal reflection fluorescence microscope |
| TW200538758A (en) | 2004-04-28 | 2005-12-01 | Olympus Corp | Laser-light-concentrating optical system |
| JP4910382B2 (ja) * | 2005-12-15 | 2012-04-04 | 株式会社ニコン | 顕微鏡 |
-
2008
- 2008-08-29 US US12/676,095 patent/US8629382B2/en active Active
- 2008-08-29 EP EP16153962.2A patent/EP3067729B1/en not_active Not-in-force
- 2008-08-29 WO PCT/JP2008/065585 patent/WO2009031477A1/ja not_active Ceased
- 2008-08-29 JP JP2009531214A patent/JP5621259B2/ja not_active Expired - Fee Related
- 2008-08-29 EP EP08829327.9A patent/EP2196836B1/en not_active Not-in-force
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10133117A (ja) * | 1996-10-31 | 1998-05-22 | Nikon Corp | 焦点検出装置を備えた顕微鏡 |
| JP2002328297A (ja) * | 2001-05-01 | 2002-11-15 | Olympus Optical Co Ltd | 焦点検出装置及びそれを備えた光学顕微鏡又は光学検査装置 |
| JP2004070276A (ja) * | 2002-06-14 | 2004-03-04 | Nikon Corp | オートフォーカス装置 |
| JP2005316070A (ja) * | 2004-04-28 | 2005-11-10 | Olympus Corp | レーザ集光光学系 |
| JP2008116900A (ja) * | 2006-10-11 | 2008-05-22 | Olympus Corp | 干渉対物レンズと、その干渉対物レンズを備える干渉顕微鏡装置 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2495592A4 (en) * | 2009-07-13 | 2018-04-18 | Nikon Corporation | Three-dimensional directional drift control device and microscope device |
| US10613311B2 (en) | 2009-07-13 | 2020-04-07 | Nikon Corporation | Three-dimensional drift control apparatus and microscope apparatus |
| EP2491452A4 (en) * | 2009-10-19 | 2015-03-11 | Ventana Med Syst Inc | IMAGING SYSTEM AND TECHNIQUES |
| US9575301B2 (en) | 2009-10-19 | 2017-02-21 | Ventana Medical Systems, Inc. | Device for a microscope stage |
| US10061107B2 (en) | 2009-10-19 | 2018-08-28 | Ventana Medical Systems, Inc. | Method and device for slide scanning |
| JP2013533513A (ja) * | 2010-07-28 | 2013-08-22 | ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー | 試料構造の顕微鏡像を取得する方法及び装置 |
| US9720221B2 (en) | 2010-07-28 | 2017-08-01 | Leica Microsystems Cms Gmbh | Device and method for acquiring a microscopic image of a sample structure |
| CN119270491A (zh) * | 2024-11-22 | 2025-01-07 | 南京波长光电科技股份有限公司 | 一种适用于荧光显微镜的快速自动对焦模组及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3067729A1 (en) | 2016-09-14 |
| EP2196836A1 (en) | 2010-06-16 |
| JP5621259B2 (ja) | 2014-11-12 |
| US8629382B2 (en) | 2014-01-14 |
| JPWO2009031477A1 (ja) | 2010-12-16 |
| US20110127406A1 (en) | 2011-06-02 |
| EP2196836B1 (en) | 2016-03-30 |
| EP3067729B1 (en) | 2020-09-23 |
| EP2196836A4 (en) | 2012-08-08 |
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