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WO2008081729A1 - レーザ走査共焦点顕微鏡 - Google Patents

レーザ走査共焦点顕微鏡 Download PDF

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Publication number
WO2008081729A1
WO2008081729A1 PCT/JP2007/074511 JP2007074511W WO2008081729A1 WO 2008081729 A1 WO2008081729 A1 WO 2008081729A1 JP 2007074511 W JP2007074511 W JP 2007074511W WO 2008081729 A1 WO2008081729 A1 WO 2008081729A1
Authority
WO
WIPO (PCT)
Prior art keywords
fluorescence
objective lens
chromatic aberration
magnification chromatic
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/074511
Other languages
English (en)
French (fr)
Inventor
Yuki Yoshida
Naoshi Aikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to EP07850946A priority Critical patent/EP2093600A4/en
Priority to JP2008552091A priority patent/JP5287252B2/ja
Publication of WO2008081729A1 publication Critical patent/WO2008081729A1/ja
Priority to US12/453,825 priority patent/US7903329B2/en
Anticipated expiration legal-status Critical
Priority to US12/929,506 priority patent/US8400709B2/en
Priority to US13/766,405 priority patent/US8786945B2/en
Priority to US14/244,159 priority patent/US9645373B2/en
Priority to US15/483,275 priority patent/US20170242229A1/en
Priority to US16/400,295 priority patent/US20190258040A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0081—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. enlarging, the entrance or exit pupil

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

　照射された試料７の検査面の照射点からは蛍光が発生し、対物レンズ６により集光されるが、対物レンズ６の倍率色収差のために、対物レンズ６を出た蛍光は、照射光とはずれた光路をたどり、ガルバノスキャナ５によりほぼ非走査光に変えられる。蛍光は、ダイクロイックミラー４を透過し、フィルタ８により余分な波長の光を除去されて、２次元的偏向手段である偏向手段９に入射する。偏向手段９は、コンピュータ１０によりガルバノスキャナ５に同期して駆動されており、対物レンズ６の倍率色収差に起因して発生した光軸のずれと傾きを補正する。光軸のずれと傾きを補正された蛍光は、集光レンズ１１により、ピンホール板１２のピンホール上に試料７の検査面の照射点の像を結像する。倍率色収差を有する対物レンズが使用される場合であっても、倍率色収差による周辺減光を光学系により補正可能なレーザ走査共焦点顕微鏡とすることができる。
PCT/JP2007/074511 2006-12-22 2007-12-20 レーザ走査共焦点顕微鏡 Ceased WO2008081729A1 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
EP07850946A EP2093600A4 (en) 2006-12-22 2007-12-20 CONFOCAL MICROSCOPE WITH LASER SCAN
JP2008552091A JP5287252B2 (ja) 2006-12-22 2007-12-20 レーザ走査共焦点顕微鏡
US12/453,825 US7903329B2 (en) 2006-12-22 2009-05-22 Laser scan confocal microscope
US12/929,506 US8400709B2 (en) 2006-12-22 2011-01-28 Laser scan confocal microscope
US13/766,405 US8786945B2 (en) 2006-12-22 2013-02-13 Laser scan confocal microscope
US14/244,159 US9645373B2 (en) 2006-12-22 2014-04-03 Laser scan confocal microscope
US15/483,275 US20170242229A1 (en) 2006-12-22 2017-04-10 Laser scan confocal microscope
US16/400,295 US20190258040A1 (en) 2006-12-22 2019-05-01 Laser scan confocal microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006345662 2006-12-22
JP2006-345662 2006-12-22

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/453,825 Continuation US7903329B2 (en) 2006-12-22 2009-05-22 Laser scan confocal microscope

Publications (1)

Publication Number Publication Date
WO2008081729A1 true WO2008081729A1 (ja) 2008-07-10

Family

ID=39588414

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/074511 Ceased WO2008081729A1 (ja) 2006-12-22 2007-12-20 レーザ走査共焦点顕微鏡

Country Status (4)

Country Link
US (6) US7903329B2 (ja)
EP (4) EP2093600A4 (ja)
JP (1) JP5287252B2 (ja)
WO (1) WO2008081729A1 (ja)

Cited By (5)

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JP2013105177A (ja) * 2011-11-11 2013-05-30 Leica Microsystems Cms Gmbh 試料における点状対象の三次元位置決め用の顕微鏡装置および方法
JP2013174704A (ja) * 2012-02-24 2013-09-05 Olympus Corp レーザ走査型共焦点顕微鏡、及び、レーザ走査型共焦点顕微鏡の光学系のアライメント調整方法
JPWO2015163261A1 (ja) * 2014-04-24 2017-04-13 オリンパス株式会社 顕微鏡および顕微鏡観察方法
CN110596059A (zh) * 2019-09-05 2019-12-20 北京世纪桑尼科技有限公司 光学超分辨显微成像系统
JP2020512599A (ja) * 2017-03-03 2020-04-23 アプトン バイオシステムズ インコーポレイテッド 加速度追跡による高速走査システム

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JP5287252B2 (ja) 2006-12-22 2013-09-11 株式会社ニコン レーザ走査共焦点顕微鏡
US9304308B2 (en) 2009-12-09 2016-04-05 Advanced Micro Devices, Inc. Laser scanning module including an optical isolator
KR101151790B1 (ko) 2010-03-08 2012-05-31 경북대학교 산학협력단 혈구를 이용한 공초점 현미경 미세 입자영상유속계
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CN102768498A (zh) * 2011-05-05 2012-11-07 中国科学院生物物理研究所 一种快速同步扫描控制装置
JP5991850B2 (ja) * 2012-05-11 2016-09-14 オリンパス株式会社 顕微鏡装置
JP6088496B2 (ja) * 2012-05-17 2017-03-01 シチズン時計株式会社 収差補正デバイス及びレーザー顕微鏡
US9423600B2 (en) 2012-08-16 2016-08-23 Citizen Holdings Co., Ltd. Aberration correction optical unit and laser microscope
CN104603667B (zh) * 2012-08-24 2017-12-08 超威半导体公司 包括光学隔离器的激光扫描模块
CN104181089A (zh) * 2013-05-22 2014-12-03 中国石油化工股份有限公司 用于扫描岩石面孔率的设备及方法
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EP3035104B1 (en) 2014-12-15 2019-02-20 Olympus Corporation Microscope system and setting value calculation method
US20180267284A1 (en) 2015-01-31 2018-09-20 Board Of Regents, The University Of Texas System High-speed laser scanning microscopy platform for high-throughput automated 3d imaging and functional volumetric imaging
JP2016158670A (ja) * 2015-02-26 2016-09-05 株式会社ニデック 眼科用レーザ手術装置および収差補償方法
JP6555811B2 (ja) 2015-07-16 2019-08-07 オリンパス株式会社 顕微鏡システム、特定方法、及び、プログラム
JP6552041B2 (ja) * 2015-07-16 2019-07-31 オリンパス株式会社 顕微鏡システム、屈折率算出方法、及び、プログラム
EP3538941B1 (en) 2016-11-10 2025-04-23 The Trustees of Columbia University in the City of New York Rapid high-resolution imaging methods for large samples

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013105177A (ja) * 2011-11-11 2013-05-30 Leica Microsystems Cms Gmbh 試料における点状対象の三次元位置決め用の顕微鏡装置および方法
JP2013174704A (ja) * 2012-02-24 2013-09-05 Olympus Corp レーザ走査型共焦点顕微鏡、及び、レーザ走査型共焦点顕微鏡の光学系のアライメント調整方法
JPWO2015163261A1 (ja) * 2014-04-24 2017-04-13 オリンパス株式会社 顕微鏡および顕微鏡観察方法
JP2020512599A (ja) * 2017-03-03 2020-04-23 アプトン バイオシステムズ インコーポレイテッド 加速度追跡による高速走査システム
JP7144457B2 (ja) 2017-03-03 2022-09-29 アプトン バイオシステムズ インコーポレイテッド 加速度追跡による高速走査システム
CN110596059A (zh) * 2019-09-05 2019-12-20 北京世纪桑尼科技有限公司 光学超分辨显微成像系统
CN110596059B (zh) * 2019-09-05 2024-05-28 北京世纪桑尼科技有限公司 光学超分辨显微成像系统

Also Published As

Publication number Publication date
EP2434327A1 (en) 2012-03-28
US20110141557A1 (en) 2011-06-16
EP2093600A4 (en) 2011-06-08
US20170242229A1 (en) 2017-08-24
US8786945B2 (en) 2014-07-22
EP2434326A1 (en) 2012-03-28
US8400709B2 (en) 2013-03-19
JP5287252B2 (ja) 2013-09-11
US20190258040A1 (en) 2019-08-22
US9645373B2 (en) 2017-05-09
EP2093600A1 (en) 2009-08-26
US20090231692A1 (en) 2009-09-17
EP2434325A1 (en) 2012-03-28
US7903329B2 (en) 2011-03-08
JPWO2008081729A1 (ja) 2010-04-30
US20130155500A1 (en) 2013-06-20
US20140211307A1 (en) 2014-07-31

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