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WO2005116598A3 - Procede et appareil d'imagerie - Google Patents

Procede et appareil d'imagerie Download PDF

Info

Publication number
WO2005116598A3
WO2005116598A3 PCT/US2005/016314 US2005016314W WO2005116598A3 WO 2005116598 A3 WO2005116598 A3 WO 2005116598A3 US 2005016314 W US2005016314 W US 2005016314W WO 2005116598 A3 WO2005116598 A3 WO 2005116598A3
Authority
WO
WIPO (PCT)
Prior art keywords
reflection surface
imaging method
evanescent wave
control over
light reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2005/016314
Other languages
English (en)
Other versions
WO2005116598A2 (fr
Inventor
William Rassman
David Ralin
Robert A Lieberman
Lothar U Kempen
Herbert Shapiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maven Technologies LLC
Original Assignee
Maven Technologies LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maven Technologies LLC filed Critical Maven Technologies LLC
Priority to AU2005248770A priority Critical patent/AU2005248770B2/en
Priority to CN2005800241596A priority patent/CN101147049B/zh
Priority to JP2007527292A priority patent/JP2007538256A/ja
Priority to EP05746623A priority patent/EP1747432A4/fr
Publication of WO2005116598A2 publication Critical patent/WO2005116598A2/fr
Anticipated expiration legal-status Critical
Publication of WO2005116598A3 publication Critical patent/WO2005116598A3/fr
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • G01N2021/212—Arrangement with total internal reflection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/805—Optical property

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne un procédé et un appareil d'imagerie, y compris une source lumineuse émettant un faisceau lumineux polarisé, et un ensemble optique comportant une couche de commande et/ou une surface réfléchissant la lumière. La couche de commande permet avantageusement de commander les propriétés d'une onde évanescente générée afin d'optimiser une image d'une préparation de spécimen à l'intérieur de cette onde. La surface réfléchissant la lumière comporte des moyens de couplage permettant de coupler un récepteur/agent de capture facilitant avantageusement la commande souple des zones spécifiques du récepteur.
PCT/US2005/016314 2004-05-17 2005-05-10 Procede et appareil d'imagerie Ceased WO2005116598A2 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
AU2005248770A AU2005248770B2 (en) 2004-05-17 2005-05-10 Imaging method and apparatus
CN2005800241596A CN101147049B (zh) 2004-05-17 2005-05-10 成像方法和装置
JP2007527292A JP2007538256A (ja) 2004-05-17 2005-05-10 イメージング方法及び装置
EP05746623A EP1747432A4 (fr) 2004-05-17 2005-05-10 Procede et appareil d'imagerie

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/847,736 US7193711B2 (en) 2000-07-11 2004-05-17 Imaging method and apparatus
US10/847,736 2004-05-17

Publications (2)

Publication Number Publication Date
WO2005116598A2 WO2005116598A2 (fr) 2005-12-08
WO2005116598A3 true WO2005116598A3 (fr) 2007-04-19

Family

ID=35451499

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/016314 Ceased WO2005116598A2 (fr) 2004-05-17 2005-05-10 Procede et appareil d'imagerie

Country Status (7)

Country Link
US (1) US7193711B2 (fr)
EP (1) EP1747432A4 (fr)
JP (1) JP2007538256A (fr)
KR (1) KR20070012707A (fr)
CN (1) CN101147049B (fr)
AU (1) AU2005248770B2 (fr)
WO (1) WO2005116598A2 (fr)

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US7193711B2 (en) * 2000-07-11 2007-03-20 Maven Technologies, Llc Imaging method and apparatus
US7518724B2 (en) * 2000-07-11 2009-04-14 Maven Technologies Image acquisition, processing, and display
US6833920B2 (en) * 2000-07-11 2004-12-21 Maven Technologies Llc Apparatus and method for imaging
US20050265648A1 (en) * 2004-06-01 2005-12-01 Daniel Roitman Evanescent wave sensor containing nanostructures and methods of using the same
JP2007040974A (ja) * 2005-06-30 2007-02-15 Omron Corp 生体分子固定化基板、バイオチップ及びバイオセンサ
US20070081920A1 (en) * 2005-10-12 2007-04-12 Murphy R S Semi-disposable optoelectronic rapid diagnostic test system
US20070099180A1 (en) * 2005-10-31 2007-05-03 Robotti Karla M Evanescent wave sensor with attached ligand
JP2008102117A (ja) * 2006-09-21 2008-05-01 Fujifilm Corp 表面プラズモン増強蛍光センサおよび蛍光検出方法
US8004676B1 (en) * 2007-02-09 2011-08-23 The Research Foundation Of State University Of New York Method for detecting analytes using surface plasmon resonance
US7867783B2 (en) 2007-02-22 2011-01-11 Maven Technologies, Llc Apparatus and method for performing ligand binding assays on microarrays in multiwell plates
US7863037B1 (en) 2007-04-04 2011-01-04 Maven Technologies, Llc Ligand binding assays on microarrays in closed multiwell plates
US20090041633A1 (en) * 2007-05-14 2009-02-12 Dultz Shane C Apparatus and method for performing ligand binding assays on microarrays in multiwell plates
US7799558B1 (en) 2007-05-22 2010-09-21 Dultz Shane C Ligand binding assays on microarrays in closed multiwell plates
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US7981664B1 (en) 2008-05-22 2011-07-19 Maven Technologies, Llc Apparatus and method for performing ligand binding assays on microarrays in multiwell plates
US8039270B2 (en) * 2008-05-22 2011-10-18 Maven Technologies, Llc Apparatus and method for performing ligand binding assays on microarrays in multiwell plates
US9182406B2 (en) * 2008-08-04 2015-11-10 Biodesy, Inc. Nonlinear optical detection of molecules comprising an unnatural amino acid possessing a hyperpolarizability
KR101127210B1 (ko) 2009-10-12 2012-03-29 한국표준과학연구원 표면 플라즈몬 공명 결상 타원 계측기 및 표면 플라즈몬 공명 결상 타원 계측방법
US8355133B2 (en) * 2009-12-30 2013-01-15 Maven Technologies, Llc Biological testing with sawtooth-shaped prisms
US8477309B2 (en) * 2010-08-10 2013-07-02 Camtek Ltd. Method and system for inspecting beveled objects
GB2503604B (en) 2011-03-21 2020-04-22 Biodesy Llc Classification of kinase inhibitors using second harmonic optical techniques
CN103620387B (zh) * 2011-06-16 2017-02-15 3M创新有限公司 表面等离子体共振传感器元件和包括其的传感器
AP2016009037A0 (en) * 2013-04-21 2016-02-29 Mobileoct Ltd Polarized light imaging apparatus and methods thereof for separating light from a surface of a sample its deeper diffuse layers
US10314549B1 (en) 2013-07-16 2019-06-11 Alacrity Patient Services, Inc. Method and apparatus for monitoring development of medication induced febrile neutropenia
US12318228B2 (en) 2013-07-16 2025-06-03 Alacrity Patient Services, Inc. Method and apparatus for monitoring development of medication induced side effects
WO2015057219A2 (fr) 2013-10-16 2015-04-23 Halliburton Energy Services Inc. Dispositif de calcul optique indépendant de l'intensité
CN107075575B (zh) 2014-06-30 2021-12-03 蓝光治疗公司 用于生物实体中的构象的高通量分析的系统和方法
EP3237906B8 (fr) 2014-12-23 2020-10-28 Bluelight Therapeutics, Inc. Fixation de protéines à des interfaces destinées à être utilisées en détection optique non linéaire
JP2018516358A (ja) 2015-04-02 2018-06-21 バイオデシー， インコーポレイテッド 表面選択的非線形光学技法を使用してタンパク質構造を決定するための方法
CN105486665B (zh) * 2016-01-26 2018-07-31 深圳大学 一种spr检测方法
CN108344714B (zh) * 2018-01-16 2020-07-31 东南大学 基于有序多孔纳米结构薄膜干涉效应的生物检测仪及其进行生物分子检测的方法

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Also Published As

Publication number Publication date
CN101147049B (zh) 2011-03-09
KR20070012707A (ko) 2007-01-26
CN101147049A (zh) 2008-03-19
JP2007538256A (ja) 2007-12-27
AU2005248770A1 (en) 2005-12-08
EP1747432A4 (fr) 2010-06-02
AU2005248770B2 (en) 2010-04-01
EP1747432A2 (fr) 2007-01-31
US20050024642A1 (en) 2005-02-03
WO2005116598A2 (fr) 2005-12-08
US7193711B2 (en) 2007-03-20

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