WO1997008356A3 - Depot en phase gazeuse par procede chimique organometallique modifie de couches minces des groupes iii a v - Google Patents
Depot en phase gazeuse par procede chimique organometallique modifie de couches minces des groupes iii a v Download PDFInfo
- Publication number
- WO1997008356A3 WO1997008356A3 PCT/US1996/013188 US9613188W WO9708356A3 WO 1997008356 A3 WO1997008356 A3 WO 1997008356A3 US 9613188 W US9613188 W US 9613188W WO 9708356 A3 WO9708356 A3 WO 9708356A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- reactor
- films
- susceptor
- modified
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C23C16/303—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation by radiant heating of the substrate
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
- H10H20/01335—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
Abstract
On décrit une machine améliorée (10) permettant la croissance de cristaux de nitrures métalliques en couches minces, dans des conditions de dépôt en phase gazeuse par procédé chimique organométallique, et comportant un réacteur (11) transparent à infrarouge, en quartz ou en un autre matériau pouvant résister à des pressions de 1 à 10000 torrs environ et à une température de 0 à 1500 °C environ. Ce réacteur comprend un orifice d'entrée (12) pour au moins un composé organométallique volatil, un orifice d'entrée (12) pour un gaz azoté, un orifice de sortie (13), ainsi qu'une zone de réaction (17) destinée à la croissance d'une couche de nitrure métallique du groupe III sur un substrat (20) maintenu par un suscepteur. Une source de rayonnement infrarouge (18) est disposée juste à l'extérieur du réacteur (11) afin d'émettre un rayonnement sur la surface (22) de croissance du substrat (20), et une source de chaleur rayonnante (21) est destinée à chauffer le suscepteur (14). Cette machine (10) produit des couches aux propriétés utiles en procurant une meilleure maîtrise de la formation des couches minces de nitrures, et elle permet une mécanisation donnant lieu à une production en masse de ces couches, ce qui est moins coûteux. Ces couches s'utilisent comme des semiconducteurs comprenant des dispositifs DEL.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US51652795A | 1995-08-18 | 1995-08-18 | |
| US08/516,527 | 1995-08-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO1997008356A2 WO1997008356A2 (fr) | 1997-03-06 |
| WO1997008356A3 true WO1997008356A3 (fr) | 1997-04-24 |
Family
ID=24055979
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US1996/013188 Ceased WO1997008356A2 (fr) | 1995-08-18 | 1996-08-16 | Depot en phase gazeuse par procede chimique organometallique modifie de couches minces des groupes iii a v |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO1997008356A2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9196800B2 (en) | 1996-06-26 | 2015-11-24 | Osram Gmbh | Light-radiating semiconductor component with a luminescence conversion element |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW405272B (en) * | 1997-06-25 | 2000-09-11 | Sony Corp | Method and apparatus for growth of a nitride III-V compound semiconductor |
| DE19855637A1 (de) | 1998-12-02 | 2000-06-15 | Aixtron Ag | Verfahren und System zur Halbleiterkristallherstellung mit Temperaturverwaltung |
| EP1113485A3 (fr) | 1999-12-27 | 2005-08-31 | Matsushita Electric Industrial Co., Ltd. | Procédé de fabrication d'un dispositif semiconducteur |
| US6841406B2 (en) * | 2001-11-06 | 2005-01-11 | Edward Brittain Stokes | Methods and apparatus for a semiconductor device |
| AU2003217530A1 (en) * | 2002-04-01 | 2003-10-13 | Ans Inc | Apparatus and method for depositing organic matter of vapor phase |
| DE10325629A1 (de) * | 2003-03-21 | 2004-10-07 | Forschungszentrum Jülich GmbH | Verfahren zur Abscheidung von Verbindungen auf einem Substrat mittels metallorganischer Gasphasendeposition |
| KR101354140B1 (ko) * | 2008-02-27 | 2014-01-22 | 소이텍 | Cvd 반응기 내에서 가스 전구체들의 열화 |
| US8221853B2 (en) * | 2008-09-03 | 2012-07-17 | The Regents Of The University Of California | Microwave plasma CVD of NANO structured tin/carbon composites |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4545327A (en) * | 1982-08-27 | 1985-10-08 | Anicon, Inc. | Chemical vapor deposition apparatus |
| US4558660A (en) * | 1982-03-16 | 1985-12-17 | Handotai Kenkyu Shinkokai | Semiconductor fabricating apparatus |
| DE4006449A1 (de) * | 1989-03-01 | 1990-09-13 | Toyoda Gosei Kk | Substrat zum wachsenlassen eines galliumnitridverbindung-halbleiterbauelements und lichtemitterdiode |
| US5044943A (en) * | 1990-08-16 | 1991-09-03 | Applied Materials, Inc. | Spoked susceptor support for enhanced thermal uniformity of susceptor in semiconductor wafer processing apparatus |
| JPH04187597A (ja) * | 1990-11-22 | 1992-07-06 | Matsushita Electric Ind Co Ltd | 窒化ガリウム薄膜の製造方法 |
| US5179677A (en) * | 1990-08-16 | 1993-01-12 | Applied Materials, Inc. | Apparatus and method for substrate heating utilizing various infrared means to achieve uniform intensity |
-
1996
- 1996-08-16 WO PCT/US1996/013188 patent/WO1997008356A2/fr not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4558660A (en) * | 1982-03-16 | 1985-12-17 | Handotai Kenkyu Shinkokai | Semiconductor fabricating apparatus |
| US4545327A (en) * | 1982-08-27 | 1985-10-08 | Anicon, Inc. | Chemical vapor deposition apparatus |
| DE4006449A1 (de) * | 1989-03-01 | 1990-09-13 | Toyoda Gosei Kk | Substrat zum wachsenlassen eines galliumnitridverbindung-halbleiterbauelements und lichtemitterdiode |
| US5044943A (en) * | 1990-08-16 | 1991-09-03 | Applied Materials, Inc. | Spoked susceptor support for enhanced thermal uniformity of susceptor in semiconductor wafer processing apparatus |
| US5179677A (en) * | 1990-08-16 | 1993-01-12 | Applied Materials, Inc. | Apparatus and method for substrate heating utilizing various infrared means to achieve uniform intensity |
| JPH04187597A (ja) * | 1990-11-22 | 1992-07-06 | Matsushita Electric Ind Co Ltd | 窒化ガリウム薄膜の製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9196800B2 (en) | 1996-06-26 | 2015-11-24 | Osram Gmbh | Light-radiating semiconductor component with a luminescence conversion element |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1997008356A2 (fr) | 1997-03-06 |
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| 122 | Ep: pct application non-entry in european phase |