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FI20010036L - Measurement method and equipment in the manufacturing process of flat glass coating - Google Patents

Measurement method and equipment in the manufacturing process of flat glass coating Download PDF

Info

Publication number
FI20010036L
FI20010036L FI20010036A FI20010036A FI20010036L FI 20010036 L FI20010036 L FI 20010036L FI 20010036 A FI20010036 A FI 20010036A FI 20010036 A FI20010036 A FI 20010036A FI 20010036 L FI20010036 L FI 20010036L
Authority
FI
Finland
Prior art keywords
equipment
manufacturing process
measurement method
flat glass
glass coating
Prior art date
Application number
FI20010036A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20010036A0 (en
FI112648B (en
Inventor
Juha Tikkanen
Jorma Keskinen
Markku Rajala
Original Assignee
Liekki Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Liekki Oy filed Critical Liekki Oy
Priority to FI20010036A priority Critical patent/FI112648B/en
Publication of FI20010036A0 publication Critical patent/FI20010036A0/en
Priority to PCT/FI2002/000012 priority patent/WO2002059050A1/en
Publication of FI20010036L publication Critical patent/FI20010036L/en
Application granted granted Critical
Publication of FI112648B publication Critical patent/FI112648B/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/13—Integrated optical circuits characterised by the manufacturing method
    • G02B6/132—Integrated optical circuits characterised by the manufacturing method by deposition of thin films
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00—Other methods of shaping glass
    • C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1415—Reactant delivery systems
    • C03B19/1423—Reactant deposition burners
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2207/00—Glass deposition burners
    • C03B2207/30—For glass precursor of non-standard type, e.g. solid SiH3F
    • C03B2207/34—Liquid, e.g. mist or aerosol
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2207/00—Glass deposition burners
    • C03B2207/46—Comprising performance enhancing means, e.g. electrostatic charge or built-in heater

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Surface Treatment Of Glass (AREA)
  • Coating Apparatus (AREA)
FI20010036A 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating FI112648B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating
PCT/FI2002/000012 WO2002059050A1 (en) 2001-01-09 2002-01-08 A method and a device for measurement in a process for manufacturing a planar glass coating

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20010036 2001-01-09
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating

Publications (3)

Publication Number Publication Date
FI20010036A0 FI20010036A0 (en) 2001-01-09
FI20010036L true FI20010036L (en) 2002-07-10
FI112648B FI112648B (en) 2003-12-31

Family

ID=8559921

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating

Country Status (2)

Country Link
FI (1) FI112648B (en)
WO (1) WO2002059050A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009030234A1 (en) * 2009-06-23 2010-12-30 J-Plasma Gmbh Process for the production of glass, in particular Glaspreform and Smoker for its production

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5844361A (en) * 1981-09-11 1983-03-15 Toshiba Corp Measuring device for electrostatic change on pulverulent body
EP0157003B1 (en) * 1984-02-10 1988-11-23 Präzisions-Werkzeuge AG Method of measuring the quantity of particle coating on a metallic body to be coated with said particle coating, device for carrying out the method, and its application
US5296255A (en) * 1992-02-14 1994-03-22 The Regents Of The University Of Michigan In-situ monitoring, and growth of thin films by means of selected area CVD

Also Published As

Publication number Publication date
WO2002059050A8 (en) 2003-10-30
FI20010036A0 (en) 2001-01-09
WO2002059050A1 (en) 2002-08-01
FI112648B (en) 2003-12-31

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Legal Events

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MA Patent expired