[go: up one dir, main page]

FI20010036A0 - Measurement method and measuring device in the manufacturing process of a flat glass coating - Google Patents

Measurement method and measuring device in the manufacturing process of a flat glass coating

Info

Publication number
FI20010036A0
FI20010036A0 FI20010036A FI20010036A FI20010036A0 FI 20010036 A0 FI20010036 A0 FI 20010036A0 FI 20010036 A FI20010036 A FI 20010036A FI 20010036 A FI20010036 A FI 20010036A FI 20010036 A0 FI20010036 A0 FI 20010036A0
Authority
FI
Finland
Prior art keywords
measuring device
manufacturing process
measurement method
flat glass
glass coating
Prior art date
Application number
FI20010036A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI112648B (en
FI20010036L (en
Inventor
Juha Tikkanen
Jorma Keskinen
Markku Rajala
Original Assignee
Liekki Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Liekki Oy filed Critical Liekki Oy
Priority to FI20010036A priority Critical patent/FI112648B/en
Publication of FI20010036A0 publication Critical patent/FI20010036A0/en
Priority to PCT/FI2002/000012 priority patent/WO2002059050A1/en
Publication of FI20010036L publication Critical patent/FI20010036L/en
Application granted granted Critical
Publication of FI112648B publication Critical patent/FI112648B/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/13—Integrated optical circuits characterised by the manufacturing method
    • G02B6/132—Integrated optical circuits characterised by the manufacturing method by deposition of thin films
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00—Other methods of shaping glass
    • C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1415—Reactant delivery systems
    • C03B19/1423—Reactant deposition burners
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2207/00—Glass deposition burners
    • C03B2207/30—For glass precursor of non-standard type, e.g. solid SiH3F
    • C03B2207/34—Liquid, e.g. mist or aerosol
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2207/00—Glass deposition burners
    • C03B2207/46—Comprising performance enhancing means, e.g. electrostatic charge or built-in heater

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Surface Treatment Of Glass (AREA)
  • Coating Apparatus (AREA)
FI20010036A 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating FI112648B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating
PCT/FI2002/000012 WO2002059050A1 (en) 2001-01-09 2002-01-08 A method and a device for measurement in a process for manufacturing a planar glass coating

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20010036 2001-01-09
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating

Publications (3)

Publication Number Publication Date
FI20010036A0 true FI20010036A0 (en) 2001-01-09
FI20010036L FI20010036L (en) 2002-07-10
FI112648B FI112648B (en) 2003-12-31

Family

ID=8559921

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20010036A FI112648B (en) 2001-01-09 2001-01-09 Measurement method and measuring device in the manufacturing process of a flat glass surface coating

Country Status (2)

Country Link
FI (1) FI112648B (en)
WO (1) WO2002059050A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009030234A1 (en) * 2009-06-23 2010-12-30 J-Plasma Gmbh Process for the production of glass, in particular Glaspreform and Smoker for its production

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5844361A (en) * 1981-09-11 1983-03-15 Toshiba Corp Measuring device for electrostatic change on pulverulent body
ATE38897T1 (en) * 1984-02-10 1988-12-15 Praezisions Werkzeuge Ag METHOD OF MEASUREMENT OF PARTICLE DEPOSITION AMOUNT ON A METAL BODY TO BE POWDER-COATED, DEVICE FOR CARRYING OUT THE METHOD AND USE OF THE METHOD.
US5296255A (en) * 1992-02-14 1994-03-22 The Regents Of The University Of Michigan In-situ monitoring, and growth of thin films by means of selected area CVD

Also Published As

Publication number Publication date
WO2002059050A8 (en) 2003-10-30
WO2002059050A1 (en) 2002-08-01
FI112648B (en) 2003-12-31
FI20010036L (en) 2002-07-10

Similar Documents

Publication Publication Date Title
EP1416276A4 (en) BIOSENSORS AND METHOD OF MEASUREMENT
NO20024297D0 (en) Method and apparatus for measuring flow velocity in a wellbore using NMR and applications of the same
IL149395A0 (en) Optical component based temperature measurement in analyte detection devices
DE60234367D1 (en) DIELECTRICITY CONSTANT MEASUREMENT DEVICE AND DIELECTRICITY CONSTANT MEASUREMENT METHOD
GB2368963B (en) Liquid crystal display device array substrate and method of manufacturing the same
EP1422562A4 (en) Reticle and optical characteristic measuring method
DE50102002D1 (en) METHOD AND DEVICE FOR FINALIZING GLASS
EP1367654A4 (en) DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME
DE60106448D1 (en) ARTICLE WITH REFLECTIVE COATING AND RELATED PRODUCTION PROCESS
FI20030598L (en) Measuring device and method for measuring heart rate and method of manufacturing the measuring device
EP1619644A4 (en) MANNEQUIN AND METHOD OF MANUFACTURING THE SAME
DE50013119D1 (en) Device and method for introducing various transparent substrates into a high-precision measuring device
FI20000282A0 (en) Method and apparatus for measuring coating
AU2003206853A1 (en) Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations
DE602004020882D1 (en) DEVICE FOR DIFFERENTIAL SURFACE PLASMON RESONANCE MEASUREMENT AND MEASURING METHOD
EP1743873A4 (en) APPARATUS AND METHOD FOR MANUFACTURING GLASS PLATE
EE9900130A (en) Apparatus and method for measuring the thickness of the glass wall sidewall
EP1288174A4 (en) COATED GLASS OF THERMO-REFLECTOR COLORED FILM AND METHOD OF MANUFACTURING THE SAME
NO20033435D0 (en) Device and method for on-line monitoring of fluorinated material in the airspace of a vial
FI20021644L (en) Method and apparatus for determining the hysteresis of a process device in a process
FI20010036A0 (en) Measurement method and measuring device in the manufacturing process of a flat glass coating
DE60040960D1 (en) Method and device for measuring the thickness of transparent films
FI982171L (en) Method and device for measuring the amount of silicone coating on a moving substrate
DE60137618D1 (en) Roughness measuring method and apparatus
DE60220123D1 (en) SPEED MEASURING METHOD AND SPEED DETECTOR

Legal Events

Date Code Title Description
MA Patent expired