EP3549155A4 - PROCESS AND MANUFACTURING OF LOW-DIMENSIONAL MATERIALS WITH THE SUPPORT OF BOTH SELF-THERMALIZATION AND SELF-LOCALIZATION - Google Patents
PROCESS AND MANUFACTURING OF LOW-DIMENSIONAL MATERIALS WITH THE SUPPORT OF BOTH SELF-THERMALIZATION AND SELF-LOCALIZATION Download PDFInfo
- Publication number
- EP3549155A4 EP3549155A4 EP17899703.7A EP17899703A EP3549155A4 EP 3549155 A4 EP3549155 A4 EP 3549155A4 EP 17899703 A EP17899703 A EP 17899703A EP 3549155 A4 EP3549155 A4 EP 3549155A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- self
- thermalization
- localization
- manufacturing
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N99/00—Subject matter not provided for in other groups of this subclass
- H10N99/05—Devices based on quantum mechanical effects, e.g. quantum interference devices or metal single-electron transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/855—Thermoelectric active materials comprising inorganic compositions comprising compounds containing boron, carbon, oxygen or nitrogen
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/8556—Thermoelectric active materials comprising inorganic compositions comprising compounds containing germanium or silicon
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Silicon Compounds (AREA)
- Particle Accelerators (AREA)
- Recrystallisation Techniques (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Photovoltaic Devices (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762471815P | 2017-03-15 | 2017-03-15 | |
| US201762591848P | 2017-11-29 | 2017-11-29 | |
| PCT/US2017/064020 WO2018164746A2 (en) | 2016-11-29 | 2017-11-30 | Process and manufacture of low-dimensional materials supporting both self-thermalization and self-localization |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP3549155A2 EP3549155A2 (en) | 2019-10-09 |
| EP3549155A4 true EP3549155A4 (en) | 2020-09-30 |
Family
ID=68407930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP17899703.7A Pending EP3549155A4 (en) | 2017-03-15 | 2017-11-30 | PROCESS AND MANUFACTURING OF LOW-DIMENSIONAL MATERIALS WITH THE SUPPORT OF BOTH SELF-THERMALIZATION AND SELF-LOCALIZATION |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP3549155A4 (en) |
| JP (1) | JP7250340B2 (en) |
| KR (1) | KR102373619B1 (en) |
| CN (1) | CN110431652B (en) |
| CA (1) | CA3045318A1 (en) |
| IL (1) | IL266966B2 (en) |
| WO (1) | WO2018164746A2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11220747B2 (en) * | 2018-10-29 | 2022-01-11 | Applied Materials, Inc. | Complementary pattern station designs |
| CN111470577A (en) * | 2020-04-15 | 2020-07-31 | 苏州正奥水生态技术研究有限公司 | Sewage treatment photon carrier and preparation method and use method thereof |
| CN115903279B (en) * | 2022-10-12 | 2023-10-03 | 北京大学 | A method and application of spectral emissivity control based on isotope engineering |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6479919B1 (en) * | 2001-04-09 | 2002-11-12 | Terrence L. Aselage | Beta cell device using icosahedral boride compounds |
| US20150206940A1 (en) * | 2012-08-02 | 2015-07-23 | University-Industry Cooperation Group Of Kyung Hee University | Semiconductor device and method for producing same |
| US20160351286A1 (en) * | 2015-05-28 | 2016-12-01 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial carbon atoms |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3432539A (en) * | 1965-06-30 | 1969-03-11 | Du Pont | Icosahedral dodecahydrododecaborane derivatives and their preparation |
| US4818625A (en) * | 1985-06-24 | 1989-04-04 | Lockheed Missiles & Space Company, Inc. | Boron-silicon-hydrogen alloy films |
| US5872368A (en) * | 1995-11-30 | 1999-02-16 | The United States Of America As Represented By The Secretary Of The Navy | Method of controlling a super conductor |
| US6025611A (en) * | 1996-09-20 | 2000-02-15 | The Board Of Regents Of The University Of Nebraska | Boron-carbide and boron rich rhobohedral based transistors and tunnel diodes |
| JP2004123720A (en) * | 2002-09-11 | 2004-04-22 | Sony Corp | Molecular element, molecular organization, rectifying element, rectifying method, sensor element, switching element, circuit element, logic circuit element, arithmetic element and information processing element |
| KR100683401B1 (en) * | 2005-08-11 | 2007-02-15 | 동부일렉트로닉스 주식회사 | Semiconductor Device Using Epilayer and Manufacturing Method Thereof |
| US7795735B2 (en) * | 2007-03-21 | 2010-09-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Methods for forming single dies with multi-layer interconnect structures and structures formed therefrom |
| US7915643B2 (en) * | 2007-09-17 | 2011-03-29 | Transphorm Inc. | Enhancement mode gallium nitride power devices |
| US8779462B2 (en) * | 2008-05-19 | 2014-07-15 | Infineon Technologies Ag | High-ohmic semiconductor substrate and a method of manufacturing the same |
| WO2010144421A2 (en) * | 2009-06-10 | 2010-12-16 | Thinsilicon Corporation | Photovoltaic modules and methods of manufacturing photovoltaic modules having multiple semiconductor layer stacks |
| US8344337B2 (en) * | 2010-04-21 | 2013-01-01 | Axcelis Technologies, Inc. | Silaborane implantation processes |
| JP6544807B2 (en) * | 2014-06-03 | 2019-07-17 | 株式会社日本製鋼所 | Method of manufacturing semiconductor having gettering layer, method of manufacturing semiconductor device, and semiconductor device |
| US9972489B2 (en) * | 2015-05-28 | 2018-05-15 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial borane atoms |
-
2017
- 2017-11-30 EP EP17899703.7A patent/EP3549155A4/en active Pending
- 2017-11-30 JP JP2019548545A patent/JP7250340B2/en active Active
- 2017-11-30 KR KR1020197018946A patent/KR102373619B1/en active Active
- 2017-11-30 CN CN201780084888.3A patent/CN110431652B/en active Active
- 2017-11-30 WO PCT/US2017/064020 patent/WO2018164746A2/en not_active Ceased
- 2017-11-30 CA CA3045318A patent/CA3045318A1/en active Pending
- 2017-11-30 IL IL266966A patent/IL266966B2/en unknown
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6479919B1 (en) * | 2001-04-09 | 2002-11-12 | Terrence L. Aselage | Beta cell device using icosahedral boride compounds |
| US20150206940A1 (en) * | 2012-08-02 | 2015-07-23 | University-Industry Cooperation Group Of Kyung Hee University | Semiconductor device and method for producing same |
| US20160351286A1 (en) * | 2015-05-28 | 2016-12-01 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial carbon atoms |
Non-Patent Citations (7)
| Title |
|---|
| COREY MELNICK ET AL: "Phonovoltaic. I. Harvesting hot optical phonons in a nanoscale p - n junction", PHYSICAL REVIEW B, vol. 93, no. 9, 4 March 2016 (2016-03-04), XP055690570, ISSN: 2469-9950, DOI: 10.1103/PhysRevB.93.094302 * |
| JING LIU ET AL: "The local structure of transition metal doped semiconducting boron carbides", JOURNAL OF PHYSICS D: APPLIED PHYSICS, INSTITUTE OF PHYSICS PUBLISHING LTD, GB, vol. 43, no. 8, 3 March 2010 (2010-03-03), pages 85403, XP020171369, ISSN: 0022-3727 * |
| KUMAR VOBULAPURAM RAMESH ET AL: "Graphene Based On-Chip Interconnects and TSVs : Prospects and Challenges", IEEE NANOTECHNOLOGY MAGAZINE, IEEE, USA, vol. 8, no. 4, 1 December 2014 (2014-12-01), pages 14 - 20, XP011564671, ISSN: 1932-4510, [retrieved on 20141118], DOI: 10.1109/MNANO.2014.2355275 * |
| NAN LIU ET AL: "Large-Area, Transparent, and Flexible Infrared Photodetector Fabricated Using P-N Junctions Formed by N-Doping Chemical Vapor Deposition Grown Graphene", NANO LETTERS, vol. 14, no. 7, 9 July 2014 (2014-07-09), US, pages 3702 - 3708, XP055723189, ISSN: 1530-6984, DOI: 10.1021/nl500443j * |
| S. YU. RYBAKOV ET AL: "Oxygen Effect on the Stability of PECVD Boron-Carbon Films", JOURNAL DE PHYSIQUE IV, vol. 05, no. C5, 1 June 1995 (1995-06-01), FR, pages C5 - 921, XP055689624, ISSN: 1155-4339, DOI: 10.1051/jphyscol:19955109 * |
| SHIOYA HIROKI ET AL: "Gate tunable non-linear currents in bilayer graphene diodes", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 100, no. 3, 16 January 2012 (2012-01-16), pages 33113 - 33113, XP012156888, ISSN: 0003-6951, [retrieved on 20120118], DOI: 10.1063/1.3676441 * |
| YI ZHANG: "Epitaxial growth of icosahedral boron arsenide on silicon carbide substrates: Improved process conditions and electrical properties", DISSERTATION, 1 January 2011 (2011-01-01), XP055554015, ISBN: 978-1-267-14614-4, Retrieved from the Internet <URL:http://krex.k-state.edu/dspace/bitstream/handle/2097/13122/YiZhang2011.pdf?sequence=3&isAllowed=y> [retrieved on 20190208] * |
Also Published As
| Publication number | Publication date |
|---|---|
| CA3045318A1 (en) | 2018-09-13 |
| WO2018164746A2 (en) | 2018-09-13 |
| WO2018164746A3 (en) | 2018-12-06 |
| KR102373619B1 (en) | 2022-03-15 |
| IL266966A (en) | 2019-07-31 |
| IL266966B1 (en) | 2023-11-01 |
| CN110431652B (en) | 2023-12-29 |
| IL266966B2 (en) | 2024-03-01 |
| JP2020515057A (en) | 2020-05-21 |
| CN110431652A (en) | 2019-11-08 |
| KR20190126765A (en) | 2019-11-12 |
| EP3549155A2 (en) | 2019-10-09 |
| JP7250340B2 (en) | 2023-04-03 |
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Legal Events
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 17P | Request for examination filed |
Effective date: 20190626 |
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| AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
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| AX | Request for extension of the european patent |
Extension state: BA ME |
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| DAV | Request for validation of the european patent (deleted) | ||
| DAX | Request for extension of the european patent (deleted) | ||
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 29/861 20060101ALI20200508BHEP Ipc: H01L 21/033 20060101ALI20200508BHEP Ipc: H01L 31/0256 20060101ALI20200508BHEP Ipc: H01L 21/02 20060101AFI20200508BHEP Ipc: H01L 29/267 20060101ALI20200508BHEP Ipc: H01L 31/02 20060101ALI20200508BHEP Ipc: H01L 49/00 20060101ALI20200508BHEP Ipc: H01L 31/0264 20060101ALI20200508BHEP Ipc: H01L 31/04 20140101ALI20200508BHEP Ipc: H01L 35/22 20060101ALN20200508BHEP Ipc: H01L 31/036 20060101ALI20200508BHEP Ipc: H01L 31/0368 20060101ALI20200508BHEP |
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| A4 | Supplementary search report drawn up and despatched |
Effective date: 20200828 |
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| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 31/0256 20060101ALI20200824BHEP Ipc: H01L 21/02 20060101AFI20200824BHEP Ipc: H01L 49/00 20060101ALI20200824BHEP Ipc: H01L 31/0264 20060101ALI20200824BHEP Ipc: H01L 31/02 20060101ALI20200824BHEP Ipc: H01L 31/036 20060101ALI20200824BHEP Ipc: H01L 35/22 20060101ALN20200824BHEP Ipc: H01L 31/0368 20060101ALI20200824BHEP Ipc: H01L 31/04 20140101ALI20200824BHEP Ipc: H01L 29/267 20060101ALI20200824BHEP Ipc: H01L 29/861 20060101ALI20200824BHEP Ipc: H01L 21/033 20060101ALI20200824BHEP |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: EXAMINATION IS IN PROGRESS |
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| 17Q | First examination report despatched |
Effective date: 20220315 |