| Nondestructive imaging of atomically thin nanostructures buried in silicon G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki, SR Schofield, ... Science advances 3 (6), e1602586, 2017 | 86 | 2017 |
| Atomic-scale patterning of arsenic in silicon by scanning tunneling microscopy TJZ Stock, O Warschkow, PC Constantinou, J Li, S Fearn, E Crane, ... ACS nano 14 (3), 3316-3327, 2020 | 74 | 2020 |
| Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions G Gramse, A Kölker, T Škereň, TJZ Stock, G Aeppli, F Kienberger, ... Nature Electronics 3 (9), 531-538, 2020 | 43 | 2020 |
| Resistless EUV lithography: Photon-induced oxide patterning on silicon LT Tseng, P Karadan, D Kazazis, PC Constantinou, TJZ Stock, NJ Curson, ... Science Advances 9 (16), eadf5997, 2023 | 33 | 2023 |
| EUV-induced hydrogen desorption as a step towards large-scale silicon quantum device patterning P Constantinou, TJZ Stock, LT Tseng, D Kazazis, M Muntwiler, CAF Vaz, ... Nature Communications 15 (1), 694, 2024 | 28 | 2024 |
| High-energy photoemission final states beyond the free-electron approximation VN Strocov, LL Lev, F Alarab, P Constantinou, X Wang, T Schmitt, ... Nature Communications 14 (1), 4827, 2023 | 24 | 2023 |
| Roadmap on atomic-scale semiconductor devices SR Schofield, AJ Fisher, E Ginossar, JW Lyding, R Silver, F Fei, ... Nano Futures 9 (1), 012001, 2025 | 19 | 2025 |
| Copper phthalocyanine thin films on Cu (111): Sub-monolayer to multi-layer TJZ Stock, J Nogami Surface Science 637, 132-139, 2015 | 18 | 2015 |
| Tunneling electron induced chemisorption of copper phthalocyanine molecules on the Cu (111) surface T Stock, J Nogami Applied Physics Letters 104 (7), 2014 | 18 | 2014 |
| Benchmarking of X‐Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of Atoms MG Masteghin, T Gervais, SK Clowes, DC Cox, V Zelyk, A Pattammattel, ... Small methods 8 (10), 2301610, 2024 | 17 | 2024 |
| Spatially Resolved Dielectric Loss at the Interface M Cowie, TJZ Stock, PC Constantinou, NJ Curson, P Grütter Physical Review Letters 132 (25), 256202, 2024 | 16 | 2024 |
| Single‐atom control of arsenic incorporation in silicon for high‐yield artificial lattice fabrication TJZ Stock, O Warschkow, PC Constantinou, DR Bowler, SR Schofield, ... Advanced Materials 36 (24), 2312282, 2024 | 10 | 2024 |
| Hydrogen resist lithography and electron beam lithography for fabricating silicon targets for studying donor orbital states E Crane, A Köolker, TZ Stock, N Stavrias, K Saeedi, MAW Van Loon, ... Journal of Physics: Conference Series 1079 (1), 012010, 2018 | 10 | 2018 |
| Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon N D'Anna, D Ferreira Sanchez, G Matmon, J Bragg, PC Constantinou, ... Advanced Electronic Materials 9 (5), 2201212, 2023 | 9 | 2023 |
| Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface M Cowie, PC Constantinou, NJ Curson, TJZ Stock, P Grütter Proceedings of the National Academy of Sciences 121 (44), e2404456121, 2024 | 7 | 2024 |
| Momentum‐Space Imaging of Ultra‐Thin Electron Liquids in δ‐Doped Silicon P Constantinou, TJZ Stock, E Crane, A Kölker, M Van Loon, J Li, S Fearn, ... Advanced Science 10 (27), 2302101, 2023 | 6 | 2023 |
| Room temperature incorporation of arsenic atoms into the germanium (001) surface EVS Hofmann, TJZ Stock, O Warschkow, R Conybeare, NJ Curson, ... Angewandte Chemie 135 (7), e202213982, 2023 | 6 | 2023 |
| CuPc:C60 nanocomposite: A pathway to control organic microstructure and phase transformation TJZ Stock, T Ogundimu, JM Baribeau, ZH Lu, J Nogami physica status solidi (b) 252 (3), 545-552, 2015 | 6 | 2015 |
| Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopy J Bustamante, Y Miyahara, L Fairgrieve-Park, K Spruce, P See, N Curson, ... Review of Scientific Instruments 95 (8), 2024 | 5 | 2024 |
| Bismuth trichloride as a molecular precursor for silicon doping EAS Lundgren, R Conybeare, TJZ Stock, NJ Curson, O Warschkow, ... Applied Physics Letters 122 (15), 2023 | 4 | 2023 |