| Nondestructive imaging of atomically thin nanostructures buried in silicon G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki, SR Schofield, ... Science advances 3 (6), e1602586, 2017 | 86 | 2017 |
| Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy E Brinciotti, G Gramse, S Hommel, T Schweinboeck, A Altes, MA Fenner, ... Nanoscale 7 (35), 14715-14722, 2015 | 75 | 2015 |
| Quantitative sub-surface and non-contact imaging using scanning microwave microscopy G Gramse, E Brinciotti, A Lucibello, SB Patil, M Kasper, C Rankl, ... Nanotechnology 26 (13), 135701, 2015 | 58 | 2015 |
| Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy SS Tuca, G Badino, G Gramse, E Brinciotti, M Kasper, YJ Oh, R Zhu, ... Nanotechnology 27 (13), 135702, 2016 | 54 | 2016 |
| Scanning microwave microscopy applied to semiconducting GaAs structures A Buchter, J Hoffmann, A Delvallée, E Brinciotti, D Hapiuk, C Licitra, ... Review of Scientific Instruments 89 (2), 2018 | 29 | 2018 |
| Frequency analysis of dopant profiling and capacitance spectroscopy using scanning microwave microscopy E Brinciotti, G Campagnaro, G Badino, M Kasper, G Gramse, SS Tuca, ... IEEE Transactions on Nanotechnology 16 (1), 75-82, 2016 | 14 | 2016 |
| Transmission and reflection mode scanning microwave microscopy (SMM): Experiments, calibration, and simulations PF Medina, A Lucibello, G Gramse, E Brinciotti, M Kasper, AO Oladipo, ... 2015 European Microwave Conference (EuMC), 654-657, 2015 | 13 | 2015 |
| De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy L Michalas, E Brinciotti, A Lucibello, G Gramse, CH Joseph, F Kienberger, ... Microelectronic Engineering 159, 64-69, 2016 | 9 | 2016 |
| Calibrated nanoscale dopant profiling and capacitance of a high-voltage lateral mos transistor at 20 ghz using scanning microwave microscopy E Brinciotti, G Badino, M Knaipp, G Gramse, J Smoliner, F Kienberger IEEE Transactions on Nanotechnology 16 (2), 245-252, 2017 | 7 | 2017 |
| Scanning microwave microscopy for non-destructive characterization of SOI wafers L Michalas, I Ionica, E Brinciotti, L Pirro, F Kienberger, S Cristoloveanu, ... 2016 Joint International EUROSOI Workshop and International Conference on …, 2016 | 5 | 2016 |
| Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements L Michalas, A Lucibello, G Badino, CH Joseph, E Brinciotti, F Kienberger, ... 2015 European Microwave Conference (EuMC), 159-162, 2015 | 5 | 2015 |
| Single E-coli bacteria imaged at 20 GHz frequency using the scanning microwave microscope (SMM) SS Tuca, G Gramse, M Kasper, E Brinciotti, YJ Oh, GM Campagnaro, ... Microsc. Anal 29 (4), 912, 2015 | 5 | 2015 |
| Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration L Michalas, A Lucibello, CH Joseph, E Brinciotti, F Kienberger, E Proietti, ... EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and …, 2015 | 2 | 2015 |
| 2017 Index IEEE Transactions on Nanotechnology Vol. 16 A Abusleme, D Acharyya, S Acharyya, F Adamu-Lema, KN Afanasev, ... IEEE Transactions on Nanotechnology 16 (6), 1, 2017 | | 2017 |
| Characterization of transversal electrophoresis based microflow devices for water purification E Brinciotti Sapienza" University of Rome, 2012 | | 2012 |
| New nanoscale tools for measuring doping concentration and photo-conductivity for photovoltaic applications & photovoltaic simulation G Kada, D Glasse, E Brinciotti, G Gramse, SS Tuca, P Hinterdorfer, ... | | |
Andrea LucibelloNational Research Council - Institute of Microelectronics and Microsystems (CNR-IMM)Verified email at artov.imm.cnr.it
