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WO2024051126A1 - Battery and preparation method for battery - Google Patents

Battery and preparation method for battery Download PDF

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Publication number
WO2024051126A1
WO2024051126A1 PCT/CN2023/080504 CN2023080504W WO2024051126A1 WO 2024051126 A1 WO2024051126 A1 WO 2024051126A1 CN 2023080504 W CN2023080504 W CN 2023080504W WO 2024051126 A1 WO2024051126 A1 WO 2024051126A1
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WIPO (PCT)
Prior art keywords
layer
battery
tunneling
doped silicon
tunnel
Prior art date
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Application number
PCT/CN2023/080504
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French (fr)
Chinese (zh)
Inventor
张满良
徐聪
付少剑
郁寅珑
张明明
王立富
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chuzhou Jietai New Energy Technology Co Ltd
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Chuzhou Jietai New Energy Technology Co Ltd
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Publication of WO2024051126A1 publication Critical patent/WO2024051126A1/en
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Ceased legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • H10F77/306Coatings for devices having potential barriers
    • H10F77/311Coatings for devices having potential barriers for photovoltaic cells
    • H10F77/315Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/129Passivating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/122Active materials comprising only Group IV materials
    • H10F77/1223Active materials comprising only Group IV materials characterised by the dopants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • H10F77/219Arrangements for electrodes of back-contact photovoltaic cells

Definitions

  • the present application belongs to the technical field of battery manufacturing, and specifically relates to a battery and a method for preparing the battery.
  • TOPCon is a solar cell technology based on the selective carrier principle of tunneling oxide layer passivation contact. Its cell structure is N-type silicon substrate battery, TOPCon technology aims to prepare an ultra-thin tunneling layer on the back of the battery and form a passivation contact structure, thereby effectively reducing surface recombination and metal contact recombination of the battery.
  • the tunneling layer on the back of the battery usually uses silicon oxide material.
  • the tunnel layer formed of silicon oxide material has a low light refractive index and a narrow transmission spectrum, resulting in low photoelectric conversion efficiency of the battery.
  • Embodiments of the present application provide a battery and a method for manufacturing the battery, which can solve the problem of low photoelectric conversion efficiency of the battery.
  • inventions of the present application provide a battery.
  • the battery includes: a battery base; an electrode; and a tunneling layer.
  • One side of the tunneling layer is connected to the back side of the battery base, and the tunneling layer is five Tantalum oxide material; doped silicon layer, the other side of the tunnel layer is connected to one side of the doped silicon layer.
  • embodiments of the present application provide a method for manufacturing a battery.
  • the method includes: arranging a tunneling layer on the back of the battery base so that one side of the tunnel layer is connected to the back of the battery base, wherein,
  • the tunneling layer is made of tantalum pentoxide material;
  • a doped silicon layer is provided on the other side of the tunneling layer, so that the tunneling layer and the doped silicon layer form a tunneling oxide layer passivation contact structure ;
  • the battery substrate is screen printed and sintered to form an electrode.
  • a battery preparation device which includes: a first A setting module for setting a tunneling layer on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, wherein the tunneling layer is made of tantalum pentoxide material; the second setting module , used to set a passivation layer on the other side of the tunnel layer, so that the tunnel layer and the passivation layer form a tunnel oxide layer passivation contact structure; a third setting module, used to set the passivation layer on the other side of the tunnel layer.
  • the battery substrate is screen printed and sintered to form the electrodes.
  • inventions of the present application provide an electronic device.
  • the electronic device includes a processor, a memory, and a program or instructions stored on the memory and executable on the processor.
  • the program or instructions are When executed by the processor, the steps of the method described in the second aspect are implemented.
  • embodiments of the present application provide a readable storage medium.
  • Programs or instructions are stored on the readable storage medium.
  • the steps of the method described in the second aspect are implemented. .
  • a battery provided by an embodiment of the present application includes a battery base; an electrode; a tunneling layer, one side of the tunneling layer is connected to the back of the battery base, and the tunneling layer is made of tantalum pentoxide material; a doped silicon layer, the tunneling layer The other side is connected to the side of the doped silicon layer.
  • the tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easily compatible with the semiconductor process. At the same time, the tantalum pentoxide material has High refractive index, band gap and affinity can generate extremely high electric fields to improve carrier transport.
  • the tantalum pentoxide material is used as a tunneling layer on the back of the battery substrate to form a passivating tunnel oxide layer with the doped silicon layer.
  • the chemical contact structure can effectively reduce the surface recombination and metal contact recombination of the battery, and can make the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.
  • Figure 1 is a schematic structural diagram of a battery provided by an embodiment of the present application.
  • Figure 2 is a schematic flow chart of a battery preparation method provided by an embodiment of the present application.
  • FIG. 3 is a schematic structural diagram of a battery preparation device provided by an embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of an electronic device provided by an embodiment of the present application.
  • first, second, etc. in the description and claims of this application are used to distinguish similar objects and are not used to describe a specific order or sequence. It is to be understood that the figures so used are interchangeable under appropriate circumstances so that the embodiments of the present application can be practiced in orders other than those illustrated or described herein, and that "first,” “second,” etc. are distinguished Objects are usually of one type, and the number of objects is not limited. For example, the first object can be one or multiple.
  • “and/or” in the description and claims indicates at least one of the connected objects, and the character “/" generally indicates that the related objects are in an "or” relationship.
  • FIG. 1 is a schematic structural diagram of a battery provided by an embodiment of the present invention.
  • the battery 100 includes: a battery base 110; an electrode 120; and a tunneling layer 130.
  • One side of the tunneling layer 130 is connected to the The back surface of the battery base 110 is connected, and the tunnel layer 130 is made of tantalum pentoxide material; the doped silicon layer 140 is connected, and the other side of the tunnel layer 130 is connected to one side of the doped silicon layer 140 .
  • the battery 100 in the embodiment of the present application may be a solar cell based on the Tunnel Oxide Passivated Contact (TOPCon) technology based on the selective carrier principle.
  • the battery base 110 of the battery 100 It can be an N-type silicon substrate.
  • the battery 100 is provided with an electrode 120 and a tunneling layer 130 is provided on the back of the battery 100. One side of the tunneling layer 130 is in contact with the battery.
  • the back side of the base body 110 is connected.
  • the tunnel layer 130 is made of tantalum pentoxide (Ta 2 O 5 ) material.
  • a doped silicon layer 140 is also provided on the back side of the battery base body 110. One side of the doped silicon layer 140 is connected to the tunnel layer.
  • the tunnel layer 130 provides passivation
  • the doped silicon layer 1440 provides a contact, and together form a passivation contact, so that the tunnel layer 130 and the doped silicon layer 140 can form a tunnel oxide passivation layer. contact structure.
  • the doped silicon layer 140 may be polysilicon doped with phosphorus material (N+-poly-Si).
  • a battery 100 provided by an embodiment of the present application includes a battery base 110; an electrode 120; a tunneling layer 130.
  • One side of the tunneling layer 130 is connected to the back side of the battery base 110; the tunneling layer 130 is made of tantalum pentoxide material; doped The other side of the mixed silicon layer 140 and the tunnel layer 130 is connected to one side of the doped silicon layer 130.
  • the tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easy to integrate with the semiconductor process. At the same time, the tantalum pentoxide material has high refractive index, band gap and affinity, and can generate extremely high electric fields to improve carrier transport.
  • the tantalum pentoxide material is used as the tunneling layer 130 and is placed on the back of the battery matrix 110
  • the tunnel oxide passivation contact structure formed with the doped silicon layer 140 can effectively reduce the surface recombination and metal contact recombination of the battery 100, making the tunnel oxide passivation contact structure have better passivation effect and photoelectricity.
  • the conversion efficiency can improve the photoelectric conversion efficiency in the battery 100 .
  • the battery 100 further includes: a silicon nitride passivation layer 150 , and the silicon nitride passivation layer 150 is connected to the other side of the doped silicon layer 140 .
  • a silicon nitride passivation layer 150 may also be provided on the back of the battery base 110 , wherein one side of the doped silicon layer 140 is connected to the tunneling layer 130 , and the other side of the doped silicon layer 140 is connected to the tunneling layer 130 .
  • One side may be connected to one side of the silicon nitride passivation layer 150 , where the silicon nitride passivation layer 150 is formed of silicon nitride (SiN x ) material.
  • the silicon nitride passivation layer 150 on the back surface of the battery base 110, a passivation effect can be provided for the battery 100, and the photoelectric conversion efficiency of the battery 100 can be improved.
  • the battery 100 further includes:
  • Emitter 160 the emitter 160 is located on the front of the battery base 110; an aluminum oxide passivation layer 170, one side of the aluminum oxide passivation layer 170 is connected to the front of the battery base 110; an anti-reflection film layer 180 , the anti-reflection film layer 180 is connected to the other side of the aluminum oxide passivation layer 170, so
  • the anti-reflection film layer 180 is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.
  • an emitter 160 is provided on the front side of the battery base 110.
  • the boron-doped emitter 160 can be obtained by performing boron diffusion on the front side of the battery base 110.
  • One side of the aluminum oxide passivation layer 170 is in contact with the emitter. 160 connection, the other side of the aluminum oxide passivation layer 170 is connected to the anti-reflection film layer 180.
  • the anti-reflection film layer 180 can be a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.
  • the silicon oxide material and the layer arrangement of the silicon oxide material in the anti-reflection film layer 180 can be set according to requirements and are not specifically limited here.
  • the battery 100 has the ability to generate electricity.
  • the aluminum oxide passivation layer 170 and the anti-reflection film 180 layer can improve the excellent passivation effect of the battery 100 and improve the battery performance.
  • the light refractive index of 100 improves the photoelectric conversion efficiency of the battery 100 .
  • the thickness of the tunneling layer 130 is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.
  • the thickness of the tunneling layer 130 on the back side of the battery base 110 can be between 1 nanometer and 3 nanometers. In this way, the tunneling layer 130 will not occupy too much space of the battery 110 and can passivate the tunnel oxide layer of the battery 110.
  • the chemical contact structure provides better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery 100 .
  • Figure 2 shows a schematic flow chart of a battery preparation method provided by an embodiment of the present invention.
  • the method can be executed by a battery preparation equipment.
  • the method includes the following steps:
  • Step 202 Set a tunneling layer on the back side of the battery substrate so that one side of the tunneling layer is in contact with the The back connection of the battery base.
  • the battery in the embodiment of the present application may be a solar cell based on Tunnel Oxide Passivated Contact (TOPCon) technology based on the selective carrier principle, and the battery matrix of the battery may be N
  • a tunnel layer can be set on the back of the battery substrate so that one side of the tunnel layer is connected to the back of the battery substrate.
  • the tunnel layer can be made of tantalum pentoxide (Ta 2 O 5 ) Material formation.
  • Step 204 Provide a doped silicon layer on the other side of the tunnel layer, so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure.
  • a doped silicon layer can be provided on the other side of the tunnel layer, so that the other side of the tunnel layer is connected to the doped silicon layer to form a passivation tunnel oxide layer. chemical contact structure.
  • Step 206 Screen-print the battery substrate and sinter it to form an electrode.
  • the battery base is screen printed and sintered to form an electrode to form a battery.
  • a tunneling layer is provided on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, where the tunneling layer is made of tantalum pentoxide material; in the tunneling A doped silicon layer is provided on the other side of the layer so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; the battery substrate is screen printed and sintered to form an electrode.
  • the tunnel layer of the obtained battery is composed of Tantalum pentoxide material is formed. Tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easily compatible with semiconductor processes.
  • tantalum pentoxide material has high refractive index, band The gap and affinity can generate an extremely high electric field to improve carrier transport.
  • the tantalum pentoxide material is used as a tunneling layer on the back of the battery substrate to form a tunneling oxide layer passivation contact structure with the doped silicon layer, which can This makes the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.
  • providing a tunneling layer on the back side of the battery substrate includes:
  • tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, it is produced through chemical vapor deposition.
  • the method is to provide the tunneling layer on the back side of the battery substrate, wherein the thickness of the tunneling layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.
  • a tantalum pentoxide layer (tunneling layer) can be prepared on the back of the battery substrate by chemical vapor deposition, using tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidant.
  • the thickness of the tunneling layer obtained is between 1-3 nanometers.
  • the tunneling layer is provided on the back side of the battery substrate by chemical vapor deposition, and the thickness of the tunneling layer is 1 Between nanometers and 3 nanometers, the tunneling layer will not take up too much space in the battery, and can passivate the contact structure of the tunnel oxide layer for the battery, with better passivation effect and photoelectric conversion efficiency, which can improve the photoelectric conversion in the battery. efficiency.
  • the method before arranging the tunneling layer on the back side of the battery substrate, the method further includes:
  • Boron diffusion is performed on the front side of the textured battery base to form an emitter; and etching is performed on the back side of the battery base.
  • boron needs to be diffused on the front of the battery base to form an emitter (PN junction), and then the back of the battery base is etched.
  • PN junction emitter
  • the back of the battery base is etched.
  • Boron diffusion forms a space charge area (emitter) on the battery substrate, making the battery capable of generating electricity. Since boron diffusion on the front of the battery substrate will form a conductive substance on the battery substrate, it is easy to short-circuit the battery. Therefore, Through the etching operation, additional conductive substances generated on the battery matrix can be removed to prevent battery short circuits.
  • providing a doped silicon layer on the other side of the tunnel layer includes:
  • a polysilicon layer is provided on the other side of the tunnel layer, wherein the polysilicon layer is deposited by low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition; the polysilicon layer is Phosphorus doping operation to obtain the doped silicon layer.
  • a doped silicon layer can be provided on the other side of the tunnel layer, where the doped silicon layer is located on the other side of the tunnel layer and is connected to the tunnel layer.
  • the tunnel layer After the tunnel layer is installed on the battery substrate, it can be Low A polysilicon layer is deposited on the back of the battery substrate by pressure chemical vapor deposition, plasma enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition, and then a phosphorus doping operation is performed on the polysilicon layer to obtain a doped silicon layer.
  • the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure.
  • the tunnel layer is made of tantalum pentoxide material.
  • the doped silicon layer is a polysilicon layer doped with phosphorus material, which can make the passivation contact structure of the tunnel oxide layer have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.
  • the method further includes:
  • the resulting borosilicate glass layer and phosphosilicate glass layer are removed using a wet process.
  • the wet process is used to remove the borosilicate glass layer and phosphosilicate glass layer produced on the battery substrate, which can prevent the photogenerated electrons collected by the emitter from diffusing along the borosilicate glass layer and phosphosilicate glass layer to avoid short circuit of the battery. The problem.
  • the method further includes:
  • a silicon nitride passivation layer is provided on one side of the doped silicon layer, where the doped silicon layer is located between the tunneling layer and the silicon nitride passivation layer; on the front side of the battery base
  • An aluminum oxide passivation layer is provided, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma-enhanced chemical vapor deposition; an anti-reflection film layer is provided on the front side of the battery substrate, and the oxidation layer is The aluminum passivation layer is located between the front surface of the battery substrate and the anti-reflective film layer, wherein the anti-reflective film layer is deposited by plasma enhanced chemical vapor deposition, and the anti-reflective mold layer is A stack of silicon nitride materials, silicon hydroxide materials and silicon oxide materials.
  • a silicon nitride passivation layer can be obtained by depositing silicon nitride on one side of the doped silicon layer.
  • a nitride layer can be obtained by depositing silicon nitride on one side of the doped silicon layer.
  • the silicon passivation layer can provide a passivation effect for the battery and improve the photoelectric conversion efficiency in the battery.
  • Aluminum oxide passivation can be obtained by depositing aluminum oxide on the front of the battery substrate through atomic layer deposition or plasma enhanced chemical vapor deposition.
  • the anti-reflection mold layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material, silicon nitride
  • the layer arrangement of the material, silicon hydroxide material and silicon oxide material in the anti-reflection film layer can be set according to requirements and is not specifically limited here.
  • the preparation method of the battery according to the embodiment of the present application is described in detail below through an example.
  • the method includes the following steps:
  • Step 1 Perform front-side boron diffusion on the textured battery matrix to form an emitter (PN junction).
  • Step 2 Etch the back of the battery substrate.
  • Step 3 Deposit a tantalum pentoxide tunneling layer on the back of the battery substrate.
  • the thickness of the tunneling layer is 1-3 nanometers.
  • the tunneling layer uses tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent. , prepared by chemical vapor deposition.
  • Step 4 Deposit a polysilicon layer on the back of the battery substrate through low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition, and perform a phosphorus doping operation on the polysilicon layer to obtain a doped silicon layer, so that The doped silicon layer and the tunneling layer constitute the TopCon structure.
  • Step 5 Use a wet process to remove the produced borosilicate glass layer and phosphosilicate glass layer.
  • Step 6 Deposit aluminum oxide on the front side of the battery substrate through atomic layer deposition or plasma-enhanced chemical vapor deposition to obtain an aluminum oxide passivation layer.
  • the thickness of the aluminum oxide passivation layer is between 2 and 11 nanometers.
  • Step 7 Deposit an anti-reflective film layer through plasma-enhanced chemical vapor deposition.
  • the anti-reflective film layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.
  • Step 8 Deposit silicon nitride on one side of the doped silicon layer to obtain a silicon nitride passivation layer.
  • Step 9 Screen-print the battery matrix and sinter it to form the electrodes.
  • the tunneling layer of the battery is made of tantalum pentoxide material.
  • the tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easy to interact with semiconductors.
  • the tantalum pentoxide material is compatible with the process.
  • the tantalum pentoxide material has high refractive index, band gap and affinity, and can generate an extremely high electric field to improve carrier transport.
  • the tantalum pentoxide material is set as a tunneling layer on the back of the battery matrix to
  • the tunnel oxide layer passivation contact structure formed with the doped silicon layer can make the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.
  • the execution subject may be a battery preparation device, or a control module in the battery preparation device for executing the battery preparation method.
  • a battery preparation device performing a battery preparation method is used as an example to illustrate the battery preparation device provided by the embodiments of the present application.
  • FIG. 3 is a schematic structural diagram of a battery preparation device according to an embodiment of the present invention.
  • the battery preparation device 300 includes: a first setting module 310 , a second setting module 320 , and a third setting module 330 .
  • the first setting module 310 is used to set a tunnel layer on the back of the battery base so that one side of the tunnel layer is connected to the back of the battery base, where the tunnel layer is made of tantalum pentoxide material;
  • the second setting module 320 is used to set a doped silicon layer on the other side of the tunnel layer, so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure;
  • the third setting module 330 for screen printing and sintering the battery matrix to form electrodes.
  • the first setting module 310 is used to use tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, and set all the settings on the back side of the battery substrate through chemical vapor deposition.
  • the tunneling layer wherein the thickness of the tunneling layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.
  • the first setting module 310 is also used to diffuse boron on the front of the texturized battery base to form an emitter; and to perform an etching operation on the back of the battery base.
  • the second setting module 320 is also used to set a polysilicon layer on the other side of the tunnel layer, wherein the polysilicon layer is formed by low-pressure chemical vapor deposition, plasma enhanced chemical vapor deposition, or Deposited by atmospheric pressure chemical vapor deposition; perform a phosphorus doping operation on the polysilicon layer to obtain the doped silicon layer.
  • the first setting module 310 is also used to remove the generated borosilicate glass layer and phosphosilicate glass layer using a wet process.
  • the first setting module 310 is also used to set a silicon nitride passivation layer on one side of the doped silicon layer, wherein the doped silicon layer is located between the tunnel layer and Between the silicon nitride passivation layers; an aluminum oxide passivation layer is provided on the front side of the battery substrate, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma enhanced chemical vapor deposition.
  • An anti-reflection film layer is provided on the front side of the battery base, and the aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, wherein the anti-reflection film layer is formed by plasma It is deposited by volume-enhanced chemical vapor deposition, and the anti-reflection pattern layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.
  • the battery preparation device in the embodiment of the present application may be a device electronic device, or may be a component in a terminal electronic device, such as an integrated circuit or a chip.
  • the electronic device may be a terminal or other devices other than the terminal.
  • the device may be a mobile electronic device or a non-mobile electronic device.
  • the mobile electronic device can be a mobile phone, a tablet computer, a notebook computer, a handheld computer, a vehicle-mounted electronic device, a mobile Internet device (Mobile Internet Device, MID), or an augmented reality (Augmented Reality, AR)/virtual reality (Virtual Reality, VR) equipment, robots, wearable devices, ultra-mobile personal computers (UMPC), netbooks or personal digital assistants (Personal Digital Assistant, PDA), etc.
  • Non-mobile electronic devices can also be servers, network-attached storage (Network Attached Storage, NAS), Personal Computer (Personal Computer, PC), Television (Television, TV), teller machine or self-service machine, etc., are not specifically limited in the embodiments of this application.
  • Network Attached Storage NAS
  • PC Personal Computer
  • TV Television
  • teller machine or self-service machine etc.
  • the battery preparation device in the embodiment of the present application may be a device with an operating system.
  • the operating system can be an Android operating system, an ios operating system, or other possible operating systems, which are not specifically limited in the embodiments of this application.
  • the battery preparation device provided by the embodiment of the present application can implement each process implemented by the method embodiment in Figure 3. To avoid repetition, the details will not be described here.
  • this embodiment of the present application further provides an electronic device 400, including a processor 401 and a memory 402.
  • the memory 402 stores programs or instructions that can be run on the processor 401.
  • the program or instructions are executed by the processor 401, the following is achieved: setting a tunneling layer on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, wherein the tunneling layer is tantalum pentoxide. Materials; disposing a doped silicon layer on the other side of the tunnel layer so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; performing screen printing on the battery substrate and sintered to form electrodes.
  • tantalum pentafluoride is used as the tantalum source
  • hydrogen is used as the reducing agent
  • oxygen is used as the oxidant
  • the tunneling layer is provided on the back side of the battery substrate through chemical vapor deposition, wherein the tunneling layer
  • the thickness of the through layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.
  • the method before arranging the tunneling layer on the back side of the battery substrate, the method further includes: performing boron diffusion on the front of the textured battery substrate to form an emitter; The back side is etched.
  • a polysilicon layer is provided on the other side of the tunnel layer, wherein the polysilicon layer is deposited by low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition, or atmospheric pressure chemical vapor deposition. ; Perform a phosphorus doping operation on the polysilicon layer to obtain the doped silicon layer.
  • the method further includes removing the generated borosilicate glass layer and phosphosilicate glass layer using a wet process.
  • the method further includes: arranging a silicon nitride passivation layer on one side of the doped silicon layer, wherein the doped silicon layer is located between the tunneling layer and the silicon nitride layer. between the passivation layers; an aluminum oxide passivation layer is provided on the front side of the battery substrate, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma enhanced chemical vapor deposition; in the An anti-reflection film layer is provided on the front side of the battery base, and the aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, wherein the anti-reflection film layer is a gas phase that enhances chemistry through plasma.
  • the anti-reflection pattern layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.
  • the electronic devices in the embodiments of the present application include: servers, terminals, or other devices other than terminals.
  • the above structure of the electronic device does not constitute a limitation on the electronic device.
  • the electronic device may include more or less components than shown in the figure, or a combination of certain components, or a different arrangement of components, such as an input unit, which may include a graphics processor. (Graphics Processing Unit, GPU) and microphone, the display unit can be configured with a display panel in the form of a liquid crystal display, an organic light-emitting diode, etc.
  • the user input unit includes at least one of a touch panel and other input devices. Touch panels are also called touch screens.
  • Other input devices may include but are not limited to physical keyboards, function keys (such as volume control keys, switch keys, etc.), trackballs, mice, and joysticks, which will not be described again here.
  • Memory can be used to store software programs as well as various data.
  • the memory may mainly include a first storage area for storing programs or instructions and a second storage area for storing data, wherein the first storage area may store an operating system, an application program or instructions required for at least one function (such as a sound playback function, an image play function, etc.) etc.
  • memory may include volatile memory or non-volatile memory, or memory may include both volatile and non-volatile memory.
  • the non-volatile memory can be read-only memory (Read-Only Memory, ROM), programmable read-only memory (Programmable ROM, PROM), erasable programmable read-only memory (Erasable PROM, EPROM), electrically removable memory.
  • Volatile memory can be random access memory (Random Access Memory, RAM), static random access memory (Static RAM, SRAM), dynamic random access memory (Dynamic RAM, DRAM), synchronous dynamic random access memory (Synchronous DRAM, SDRAM), double data rate synchronous dynamic random access memory (Double Data Rate SDRAM, DDRSDRAM), enhanced synchronous dynamic random access memory (Enhanced SDRAM, ESDRAM), synchronous link dynamic random access memory (Synch link DRAM) , SLDRAM) and direct memory bus random access memory (Direct Rambus RAM, DRRAM).
  • the processor may include one or more processing units; optionally, the processor integrates an application processor and a modem processor, where the application processor mainly handles operations involving the operating system, user interface, application programs, etc., and the modem processor
  • the modulation processor mainly processes wireless communication signals, such as baseband processors. It can be understood that the above modem processor may not be integrated into the processor.
  • Embodiments of the present application also provide a readable storage medium.
  • Programs or instructions are stored on the readable storage medium.
  • the program or instructions are executed by a processor, each process of the battery preparation method embodiment is implemented, and can achieve The same technical effects are not repeated here to avoid repetition.
  • the processor is the processor in the electronic device described in the above embodiment.
  • the readable storage media includes computer-readable storage media, such as ROM, RAM, magnetic disks or optical disks.
  • the methods of the above embodiments can be implemented by means of software plus the necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is better. implementation.
  • the technical solution of the present application can be embodied in the form of a computer software product that is essentially or contributes to the existing technology.
  • the computer software product is stored in a storage medium (such as ROM/RAM, disk , optical disk), including several instructions to cause a terminal (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in various embodiments of this application.

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Abstract

The present application belongs to the technical field of battery manufacturing. Disclosed are a battery and a preparation method for a battery, which are used for improving the photoelectric conversion efficiency of the battery. The battery comprises: a battery substrate; electrodes; a tunneling layer, one face of which is connected to a back face of the battery substrate, wherein the tunneling layer is made of a tantalum pentoxide material; and a doped-silicon layer, one face of which is connected to the other face of the tunneling layer.

Description

一种电池及电池的制备方法Battery and battery preparation method 技术领域Technical field

本申请属于电池制造技术领域,具体涉及一种电池及电池的制备方法。The present application belongs to the technical field of battery manufacturing, and specifically relates to a battery and a method for preparing the battery.

背景技术Background technique

随着光伏电池技术的不断发展,行业研究者一直在追寻更高的光电转换效率,TOPCon是一种基于选择性载流子原理的隧穿氧化层钝化接触的太阳能电池技术,其电池结构为N型硅衬底电池,TOPCon技术旨在电池背面制备一层超薄隧穿层,并构成一种钝化接触结构,从而有效降低电池的表面复合和金属接触复合。现有的电池制造中,电池背面的隧穿层通常采用氧化硅材料。With the continuous development of photovoltaic cell technology, industry researchers have been pursuing higher photoelectric conversion efficiency. TOPCon is a solar cell technology based on the selective carrier principle of tunneling oxide layer passivation contact. Its cell structure is N-type silicon substrate battery, TOPCon technology aims to prepare an ultra-thin tunneling layer on the back of the battery and form a passivation contact structure, thereby effectively reducing surface recombination and metal contact recombination of the battery. In existing battery manufacturing, the tunneling layer on the back of the battery usually uses silicon oxide material.

但是氧化硅材料形成的隧穿层膜层光折射率低,透射光谱较窄,使得电池的光电转换效率低下。However, the tunnel layer formed of silicon oxide material has a low light refractive index and a narrow transmission spectrum, resulting in low photoelectric conversion efficiency of the battery.

发明内容Contents of the invention

本申请实施例提供一种电池及电池的制备方法,能够解决电池光电转换效率低的问题。Embodiments of the present application provide a battery and a method for manufacturing the battery, which can solve the problem of low photoelectric conversion efficiency of the battery.

第一方面,本申请实施例提供了一种电池,该电池包括:电池基体;电极;隧穿层,所述隧穿层的一面与所述电池基体的背面连接,所述隧穿层为五氧化二钽材料;掺杂硅层,所述隧穿层的另一面与所述掺杂硅层的一面连接。In a first aspect, embodiments of the present application provide a battery. The battery includes: a battery base; an electrode; and a tunneling layer. One side of the tunneling layer is connected to the back side of the battery base, and the tunneling layer is five Tantalum oxide material; doped silicon layer, the other side of the tunnel layer is connected to one side of the doped silicon layer.

第二方面,本申请实施例提供了一种电池的制备方法,该方法包括:在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述电池基体的背面连接,其中,所述隧穿层为五氧化二钽材料;在所述隧穿层的另一面设置掺杂硅层,以使所述隧穿层和所述掺杂硅层形成隧穿氧化层钝化接触结构;对所述电池基体进行丝网印刷并烧结形成电极。In a second aspect, embodiments of the present application provide a method for manufacturing a battery. The method includes: arranging a tunneling layer on the back of the battery base so that one side of the tunnel layer is connected to the back of the battery base, wherein, The tunneling layer is made of tantalum pentoxide material; a doped silicon layer is provided on the other side of the tunneling layer, so that the tunneling layer and the doped silicon layer form a tunneling oxide layer passivation contact structure ; The battery substrate is screen printed and sintered to form an electrode.

第三方面,本申请实施例提供了一种电池的制备装置,该装置包括:第一 设置模块,用于在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述电池基体的背面连接,其中,所述隧穿层为五氧化二钽材料;第二设置模块,用于在所述隧穿层的另一面设置钝化层,以使所述隧穿层和所述钝化层形成隧穿氧化层钝化接触结构;第三设置模块,用于对所述电池基体进行丝网印刷并烧结形成电极。In a third aspect, embodiments of the present application provide a battery preparation device, which includes: a first A setting module for setting a tunneling layer on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, wherein the tunneling layer is made of tantalum pentoxide material; the second setting module , used to set a passivation layer on the other side of the tunnel layer, so that the tunnel layer and the passivation layer form a tunnel oxide layer passivation contact structure; a third setting module, used to set the passivation layer on the other side of the tunnel layer. The battery substrate is screen printed and sintered to form the electrodes.

第四方面,本申请实施例提供了一种电子设备,该电子设备包括处理器、存储器及存储在所述存储器上并可在所述处理器上运行的程序或指令,所述程序或指令被所述处理器执行时实现如第二方面所述的方法的步骤。In a fourth aspect, embodiments of the present application provide an electronic device. The electronic device includes a processor, a memory, and a program or instructions stored on the memory and executable on the processor. The program or instructions are When executed by the processor, the steps of the method described in the second aspect are implemented.

第五方面,本申请实施例提供了一种可读存储介质,所述可读存储介质上存储程序或指令,所述程序或指令被处理器执行时实现如第二方面所述的方法的步骤。In a fifth aspect, embodiments of the present application provide a readable storage medium. Programs or instructions are stored on the readable storage medium. When the programs or instructions are executed by a processor, the steps of the method described in the second aspect are implemented. .

本申请实施例提供的一种电池,包括电池基体;电极;隧穿层,隧穿层的一面与电池基体的背面连接,隧穿层为五氧化二钽材料;掺杂硅层,隧穿层的另一面与掺杂硅层的一面连接,五氧化二钽材料为高介电常数材料,具有很好的化学稳定性和热稳定性,易与半导体工艺相兼容,同时五氧化二钽材料具有高折射率、带隙和亲和性,能产生极高电场提高载流子的运输,将五氧化二钽材料作为隧穿层设置在电池基体的背面以和掺杂硅层构成隧穿氧化层钝化接触结构,能够有效降低电池的表面复合和金属接触复合,能够使得该隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池中的光电转换效率。A battery provided by an embodiment of the present application includes a battery base; an electrode; a tunneling layer, one side of the tunneling layer is connected to the back of the battery base, and the tunneling layer is made of tantalum pentoxide material; a doped silicon layer, the tunneling layer The other side is connected to the side of the doped silicon layer. The tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easily compatible with the semiconductor process. At the same time, the tantalum pentoxide material has High refractive index, band gap and affinity can generate extremely high electric fields to improve carrier transport. The tantalum pentoxide material is used as a tunneling layer on the back of the battery substrate to form a passivating tunnel oxide layer with the doped silicon layer. The chemical contact structure can effectively reduce the surface recombination and metal contact recombination of the battery, and can make the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.

附图说明Description of the drawings

图1是本申请实施例提供的一种电池的结构示意图;Figure 1 is a schematic structural diagram of a battery provided by an embodiment of the present application;

图2是本申请实施例提供的一种电池的制备方法的流程示意图;Figure 2 is a schematic flow chart of a battery preparation method provided by an embodiment of the present application;

图3是本申请实施例提供的一种电池的制备装置的结构示意图;Figure 3 is a schematic structural diagram of a battery preparation device provided by an embodiment of the present application;

图4是本申请实施例提供的一种电子设备的结构示意图。 FIG. 4 is a schematic structural diagram of an electronic device provided by an embodiment of the present application.

附图标记:
100-电池、110-电池基体、120-电极、130-隧穿层、140-掺杂硅层、150-氮
化硅钝化层、160-发射极、170-氧化铝钝化层、180-减反射膜层。
Reference signs:
100-battery, 110-battery matrix, 120-electrode, 130-tunneling layer, 140-doped silicon layer, 150-silicon nitride passivation layer, 160-emitter, 170-aluminum oxide passivation layer, 180- Anti-reflective coating.

具体实施方式Detailed ways

下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of this application.

本申请的说明书和权利要求书中的术语“第一”、“第二”等是用于区别类似的对象,而不用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换,以便本申请的实施例能够以除了在这里图示或描述的那些以外的顺序实施,且“第一”、“第二”等所区分的对象通常为一类,并不限定对象的个数,例如第一对象可以是一个,也可以是多个。此外,说明书以及权利要求中“和/或”表示所连接对象的至少其中之一,字符“/”,一般表示前后关联对象是一种“或”的关系。The terms "first", "second", etc. in the description and claims of this application are used to distinguish similar objects and are not used to describe a specific order or sequence. It is to be understood that the figures so used are interchangeable under appropriate circumstances so that the embodiments of the present application can be practiced in orders other than those illustrated or described herein, and that "first," "second," etc. are distinguished Objects are usually of one type, and the number of objects is not limited. For example, the first object can be one or multiple. In addition, "and/or" in the description and claims indicates at least one of the connected objects, and the character "/" generally indicates that the related objects are in an "or" relationship.

下面结合附图,通过具体的实施例及其应用场景对本申请实施例提供的一种电池和电池的制备方法进行详细地说明。A battery and a battery preparation method provided by embodiments of the present application will be described in detail below with reference to the accompanying drawings through specific embodiments and application scenarios.

图1为本发明实施例提供的一种电池的结构示意图,如图1所示,所述电池100包括:电池基体110;电极120;隧穿层130,所述隧穿层130的一面与所述电池基体110的背面连接,所述隧穿层130为五氧化二钽材料;掺杂硅层140,所述隧穿层130的另一面与所述掺杂硅层140的一面连接。Figure 1 is a schematic structural diagram of a battery provided by an embodiment of the present invention. As shown in Figure 1, the battery 100 includes: a battery base 110; an electrode 120; and a tunneling layer 130. One side of the tunneling layer 130 is connected to the The back surface of the battery base 110 is connected, and the tunnel layer 130 is made of tantalum pentoxide material; the doped silicon layer 140 is connected, and the other side of the tunnel layer 130 is connected to one side of the doped silicon layer 140 .

具体的,本申请实施例中的电池100可以是一种基于选择性载流子原理的遂川氧化层钝化接触(Tunnel Oxide Passivated Contact,TOPCon)技术的太阳能电池,该电池100的电池基体110可以为N型硅衬底基体,电池100中设置有电极120,电池100的背面设置有隧穿层130,该隧穿层130的一面与电池 基体110的背面连接,该隧穿层130为五氧化二钽(Ta2O5)材料,在电池基体110的背面还设置有掺杂硅层140,掺杂硅层140的一面与隧穿层130的另一面连接,隧穿层130提供钝化作用,掺杂硅层1440提供接触作用,共同形成钝化接触,以使隧穿层130和掺杂硅层140能够构成隧穿氧化层钝化接触结构。在本申请实施例中,掺杂硅层140可以为掺杂磷材料的多晶硅(N+-poly-Si)。Specifically, the battery 100 in the embodiment of the present application may be a solar cell based on the Tunnel Oxide Passivated Contact (TOPCon) technology based on the selective carrier principle. The battery base 110 of the battery 100 It can be an N-type silicon substrate. The battery 100 is provided with an electrode 120 and a tunneling layer 130 is provided on the back of the battery 100. One side of the tunneling layer 130 is in contact with the battery. The back side of the base body 110 is connected. The tunnel layer 130 is made of tantalum pentoxide (Ta 2 O 5 ) material. A doped silicon layer 140 is also provided on the back side of the battery base body 110. One side of the doped silicon layer 140 is connected to the tunnel layer. The other side of 130 is connected, the tunnel layer 130 provides passivation, and the doped silicon layer 1440 provides a contact, and together form a passivation contact, so that the tunnel layer 130 and the doped silicon layer 140 can form a tunnel oxide passivation layer. contact structure. In the embodiment of the present application, the doped silicon layer 140 may be polysilicon doped with phosphorus material (N+-poly-Si).

本申请实施例提供的一种电池100,包括电池基体110;电极120;隧穿层130,隧穿层130的一面与电池基体110的背面连接,隧穿层130为五氧化二钽材料;掺杂硅层140,隧穿层130的另一面与掺杂硅层130的一面连接,五氧化二钽材料为高介电常数材料,具有很好的化学稳定性和热稳定性,易与半导体工艺相兼容,同时五氧化二钽材料具有高折射率、带隙和亲和性,能产生极高电场提高载流子的运输,将五氧化二钽材料作为隧穿层130设置在电池基体110的背面以和掺杂硅层140构成隧穿氧化层钝化接触结构,能够有效降低电池100的表面复合和金属接触复合,能够使得该隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池100中的光电转换效率。A battery 100 provided by an embodiment of the present application includes a battery base 110; an electrode 120; a tunneling layer 130. One side of the tunneling layer 130 is connected to the back side of the battery base 110; the tunneling layer 130 is made of tantalum pentoxide material; doped The other side of the mixed silicon layer 140 and the tunnel layer 130 is connected to one side of the doped silicon layer 130. The tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easy to integrate with the semiconductor process. At the same time, the tantalum pentoxide material has high refractive index, band gap and affinity, and can generate extremely high electric fields to improve carrier transport. The tantalum pentoxide material is used as the tunneling layer 130 and is placed on the back of the battery matrix 110 The tunnel oxide passivation contact structure formed with the doped silicon layer 140 can effectively reduce the surface recombination and metal contact recombination of the battery 100, making the tunnel oxide passivation contact structure have better passivation effect and photoelectricity. The conversion efficiency can improve the photoelectric conversion efficiency in the battery 100 .

在一种实现方式中,所述电池100还包括:氮化硅钝化层150,所述氮化硅钝化层150与所述掺杂硅层140的另一面连接。In one implementation, the battery 100 further includes: a silicon nitride passivation layer 150 , and the silicon nitride passivation layer 150 is connected to the other side of the doped silicon layer 140 .

具体的,如图1所示,设置在电池基体110背面还可以设置有氮化硅钝化层150,其中,掺杂硅层140的一面与隧穿层130连接,掺杂硅层140的另一面可以与所述氮化硅钝化层150的一面连接,其中,氮化硅钝化层150由氮化硅(SiNx)材料形成。Specifically, as shown in FIG. 1 , a silicon nitride passivation layer 150 may also be provided on the back of the battery base 110 , wherein one side of the doped silicon layer 140 is connected to the tunneling layer 130 , and the other side of the doped silicon layer 140 is connected to the tunneling layer 130 . One side may be connected to one side of the silicon nitride passivation layer 150 , where the silicon nitride passivation layer 150 is formed of silicon nitride (SiN x ) material.

这样,通过在电池基体110的背面设置氮化硅钝化层150,能够为电池100提供钝化效果,能够提高电池100中的光电转换效率。In this way, by disposing the silicon nitride passivation layer 150 on the back surface of the battery base 110, a passivation effect can be provided for the battery 100, and the photoelectric conversion efficiency of the battery 100 can be improved.

在一种实现方式中,所述电池100还包括:In one implementation, the battery 100 further includes:

发射极160,所述发射极160位于所述电池基体110的正面;氧化铝钝化层170,所述氧化铝钝化层170的一面与所述电池基体110的正面连接;减反射膜层180,所述减反射膜层180与所述氧化铝钝化层170的另一面连接,所 述减反射膜层180为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层。Emitter 160, the emitter 160 is located on the front of the battery base 110; an aluminum oxide passivation layer 170, one side of the aluminum oxide passivation layer 170 is connected to the front of the battery base 110; an anti-reflection film layer 180 , the anti-reflection film layer 180 is connected to the other side of the aluminum oxide passivation layer 170, so The anti-reflection film layer 180 is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.

具体的,如图1所示,电池基体110的正面设置发射极160,可以通过对电池基体110的正面进行硼扩散得到掺杂硼的发射极160,氧化铝钝化层170的一面与发射极160连接,氧化铝钝化层170的另一面与减反射膜层180连接,减反射膜层180可以为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层,氮化硅材料、氢氧化硅材料和氧化硅材料在减反射膜层180中的层排列方式可以根据需求进行设定,在此不做具体限定。Specifically, as shown in Figure 1, an emitter 160 is provided on the front side of the battery base 110. The boron-doped emitter 160 can be obtained by performing boron diffusion on the front side of the battery base 110. One side of the aluminum oxide passivation layer 170 is in contact with the emitter. 160 connection, the other side of the aluminum oxide passivation layer 170 is connected to the anti-reflection film layer 180. The anti-reflection film layer 180 can be a stack of silicon nitride material, silicon hydroxide material and silicon oxide material. The silicon nitride material, hydrogen The silicon oxide material and the layer arrangement of the silicon oxide material in the anti-reflection film layer 180 can be set according to requirements and are not specifically limited here.

这样,通过在电池基体110的正面设置发射极160使得电池100具有发电电池的能力,设置氧化铝钝化层170和减反射膜180层,能够为电池100提高优异的钝化效果,能够提高电池100中的光折射率,提高电池100中的光电转换效率。In this way, by arranging the emitter 160 on the front side of the battery base 110, the battery 100 has the ability to generate electricity. The aluminum oxide passivation layer 170 and the anti-reflection film 180 layer can improve the excellent passivation effect of the battery 100 and improve the battery performance. The light refractive index of 100 improves the photoelectric conversion efficiency of the battery 100 .

在一种实现方式中,所述隧穿层130的厚度大于或者等于1纳米且小于或者等于3纳米。In one implementation, the thickness of the tunneling layer 130 is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.

具体的,电池基体110背面的隧穿层130的厚度可以在1纳米-3纳米之间,这样,隧穿层130不会过多占用电池110的空间,又可以为电池110隧穿氧化层钝化接触结构提供更好的钝化效果和光电转换效率,能够提高电池100中的光电转换效率。Specifically, the thickness of the tunneling layer 130 on the back side of the battery base 110 can be between 1 nanometer and 3 nanometers. In this way, the tunneling layer 130 will not occupy too much space of the battery 110 and can passivate the tunnel oxide layer of the battery 110. The chemical contact structure provides better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery 100 .

上面结合附图对本申请的实施例进行了描述,但是本申请并不局限于上述的具体实施方式,上述的具体实施方式仅仅是示意性的,而不是限制性的,本领域的普通技术人员在本申请的启示下,在不脱离本申请宗旨和权利要求所保护的范围情况下,还可做出很多形式,均属于本申请的保护之内,本申请要求的保护范围应当以其权利要求的内容为准,本申请中的实施例可以用于解释权利要求的内容。The embodiments of the present application have been described above in conjunction with the accompanying drawings. However, the present application is not limited to the above-mentioned specific implementations. The above-mentioned specific implementations are only illustrative and not restrictive. Those of ordinary skill in the art will Inspired by this application, without departing from the purpose of this application and the scope of protection of the claims, many forms can be made, all of which fall within the protection of this application. The scope of protection required by this application should be based on the scope of the claims. The content shall prevail, and the embodiments in this application may be used to interpret the content of the claims.

图2示出本发明的一个实施例提供的一种电池的制备方法的流程示意图,该方法可以由电池的制备设备执行,所述方法包括如下步骤:Figure 2 shows a schematic flow chart of a battery preparation method provided by an embodiment of the present invention. The method can be executed by a battery preparation equipment. The method includes the following steps:

步骤202:在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述 电池基体的背面连接。Step 202: Set a tunneling layer on the back side of the battery substrate so that one side of the tunneling layer is in contact with the The back connection of the battery base.

具体的,本申请实施例中的电池可以是一种基于选择性载流子原理的遂川氧化层钝化接触(Tunnel Oxide Passivated Contact,TOPCon)技术的太阳能电池,该电池的电池基体可以为N型硅衬底基体,在得到电池基体之后可以在电池基体的背面设置隧穿层,使得隧穿层的一面与电池基体的背面连接,其中,隧穿层可以由五氧化二钽(Ta2O5)材料形成。Specifically, the battery in the embodiment of the present application may be a solar cell based on Tunnel Oxide Passivated Contact (TOPCon) technology based on the selective carrier principle, and the battery matrix of the battery may be N After obtaining the battery substrate, a tunnel layer can be set on the back of the battery substrate so that one side of the tunnel layer is connected to the back of the battery substrate. The tunnel layer can be made of tantalum pentoxide (Ta 2 O 5 ) Material formation.

步骤204:在所述隧穿层的另一面设置掺杂硅层,以使所述隧穿层和所述掺杂硅层形成隧穿氧化层钝化接触结构。Step 204: Provide a doped silicon layer on the other side of the tunnel layer, so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure.

具体的,在电池基体的背面设置隧穿层之后,可以在隧穿层的另一面设置掺杂硅层,这样,使得隧穿层的另一面连接该掺杂硅层以构成隧穿氧化层钝化接触结构。Specifically, after the tunnel layer is provided on the back side of the battery base, a doped silicon layer can be provided on the other side of the tunnel layer, so that the other side of the tunnel layer is connected to the doped silicon layer to form a passivation tunnel oxide layer. chemical contact structure.

步骤206:对所述电池基体进行丝网印刷并烧结形成电极。Step 206: Screen-print the battery substrate and sinter it to form an electrode.

具体的,在电池基体的背面设置隧穿层和钝化层之后,对电池基体进行丝网印刷并烧结形成电极以构成电池。Specifically, after a tunneling layer and a passivation layer are provided on the back of the battery base, the battery base is screen printed and sintered to form an electrode to form a battery.

本发明实施例提供的电池的制备方法,通过在电池基体的背面设置隧穿层,使得隧穿层的一面与电池基体的背面连接,其中,隧穿层为五氧化二钽材料;在隧穿层的另一面设置掺杂硅层,以使隧穿层和掺杂硅层形成隧穿氧化层钝化接触结构;对电池基体进行丝网印刷并烧结形成电极,得到的电池的隧穿层由五氧化二钽材料形成,五氧化二钽材料为高介电常数材料,具有很好的化学稳定性和热稳定性,易与半导体工艺相兼容,同时五氧化二钽材料具有高折射率、带隙和亲和性,能产生极高电场提高载流子的运输,将五氧化二钽材料作为隧穿层设置在电池基体的背面以和掺杂硅层构成隧穿氧化层钝化接触结构,能够使得该隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池中的光电转换效率。In the battery preparation method provided by the embodiment of the present invention, a tunneling layer is provided on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, where the tunneling layer is made of tantalum pentoxide material; in the tunneling A doped silicon layer is provided on the other side of the layer so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; the battery substrate is screen printed and sintered to form an electrode. The tunnel layer of the obtained battery is composed of Tantalum pentoxide material is formed. Tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easily compatible with semiconductor processes. At the same time, tantalum pentoxide material has high refractive index, band The gap and affinity can generate an extremely high electric field to improve carrier transport. The tantalum pentoxide material is used as a tunneling layer on the back of the battery substrate to form a tunneling oxide layer passivation contact structure with the doped silicon layer, which can This makes the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.

在一种实现方式中,所述在电池基体的背面设置隧穿层,包括:In one implementation, providing a tunneling layer on the back side of the battery substrate includes:

以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的 方式在所述电池基体的背面设置所述隧穿层,其中,所述隧穿层的厚度大于或者等于1纳米且小于或者等于3纳米。Using tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, it is produced through chemical vapor deposition. The method is to provide the tunneling layer on the back side of the battery substrate, wherein the thickness of the tunneling layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.

具体的,可以通过化学气相沉积的方式,以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂在电池基体的背面制备五氧化二钽层(隧穿层),在电池基体的背面,得到的隧穿层的厚度在1-3纳米之间。Specifically, a tantalum pentoxide layer (tunneling layer) can be prepared on the back of the battery substrate by chemical vapor deposition, using tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidant. , the thickness of the tunneling layer obtained is between 1-3 nanometers.

这样,通过以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的方式在所述电池基体的背面设置所述隧穿层,并且,隧穿层的厚度在1纳米-3纳米之间,隧穿层不会过多占用电池的空间,又可以为电池隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池中的光电转换效率。In this way, by using tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, the tunneling layer is provided on the back side of the battery substrate by chemical vapor deposition, and the thickness of the tunneling layer is 1 Between nanometers and 3 nanometers, the tunneling layer will not take up too much space in the battery, and can passivate the contact structure of the tunnel oxide layer for the battery, with better passivation effect and photoelectric conversion efficiency, which can improve the photoelectric conversion in the battery. efficiency.

在一种实现方式中,在所述在电池基体的背面设置隧穿层之前,所述方法还包括:In one implementation, before arranging the tunneling layer on the back side of the battery substrate, the method further includes:

对制绒后的所述电池基体进行正面硼扩散,形成发射极;对所述电池基体的背面进行刻蚀操作。Boron diffusion is performed on the front side of the textured battery base to form an emitter; and etching is performed on the back side of the battery base.

具体的,在电池基体的背面设置隧穿层之前,需要对电池基体进行正面硼扩散,形成发射极(PN结),然后对电池基体的背面进行刻蚀操作,这样,通过对电池基体进行正面硼扩散,在电池基体上形成空间电荷区(发射极),使得该电池具备发电电池的能力,由于对电池基体正面进行硼扩散时会在电池基体上形成导电物质,容易使得电池短路,因此,通过刻蚀操作,能够去除电池基体上额外生成的导电物质,防止电池短路。Specifically, before setting the tunneling layer on the back of the battery base, boron needs to be diffused on the front of the battery base to form an emitter (PN junction), and then the back of the battery base is etched. In this way, by performing the front side of the battery base Boron diffusion forms a space charge area (emitter) on the battery substrate, making the battery capable of generating electricity. Since boron diffusion on the front of the battery substrate will form a conductive substance on the battery substrate, it is easy to short-circuit the battery. Therefore, Through the etching operation, additional conductive substances generated on the battery matrix can be removed to prevent battery short circuits.

在一种实现方式中,所述在所述隧穿层的另一面设置掺杂硅层,包括:In one implementation, providing a doped silicon layer on the other side of the tunnel layer includes:

在所述隧穿层的另一面设置多晶硅层,其中,所述多晶硅层为通过低压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式沉积得到;对所述多晶硅层进行磷掺杂操作,得到所述掺杂硅层。A polysilicon layer is provided on the other side of the tunnel layer, wherein the polysilicon layer is deposited by low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition; the polysilicon layer is Phosphorus doping operation to obtain the doped silicon layer.

具体的,可以在隧穿层的另一面设置掺杂硅层,其中,掺杂硅层位于隧穿层的另一面与该隧穿层连接,在电池基体上设置完成隧穿层之后,可以通过低 压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式等方式在电池基体的背面沉积得到多晶硅层,再对该多晶硅层进行磷掺杂操作,得到掺杂硅层,以使隧穿层和掺杂硅层形成隧穿氧化层钝化接触结构。Specifically, a doped silicon layer can be provided on the other side of the tunnel layer, where the doped silicon layer is located on the other side of the tunnel layer and is connected to the tunnel layer. After the tunnel layer is installed on the battery substrate, it can be Low A polysilicon layer is deposited on the back of the battery substrate by pressure chemical vapor deposition, plasma enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition, and then a phosphorus doping operation is performed on the polysilicon layer to obtain a doped silicon layer. The tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure.

这样,通过在电池基体的背面设置隧穿层、掺杂硅层以构成隧穿氧化层钝化接触结构,能够有效降低电池的表面复合和金属接触复合,并且隧穿层为五氧化二钽材料,掺杂硅层为掺杂磷材料的多晶硅层,能够使得隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池中的光电转换效率。In this way, by arranging a tunnel layer and a doped silicon layer on the back side of the battery base to form a tunnel oxide layer passivation contact structure, the surface recombination and metal contact recombination of the battery can be effectively reduced, and the tunnel layer is made of tantalum pentoxide material. , the doped silicon layer is a polysilicon layer doped with phosphorus material, which can make the passivation contact structure of the tunnel oxide layer have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.

在一种实现方式中,所述方法还包括:In one implementation, the method further includes:

利用湿法工艺去除产生的硼硅玻璃层和磷硅玻璃层。The resulting borosilicate glass layer and phosphosilicate glass layer are removed using a wet process.

具体的,利用湿法工艺去除电池基体上产生的硼硅玻璃层和磷硅玻璃层,能够防止发射极所收集到的光生电子会沿着硼硅玻璃层和磷硅玻璃层扩散,避免电池短路的问题。Specifically, the wet process is used to remove the borosilicate glass layer and phosphosilicate glass layer produced on the battery substrate, which can prevent the photogenerated electrons collected by the emitter from diffusing along the borosilicate glass layer and phosphosilicate glass layer to avoid short circuit of the battery. The problem.

在一种实现方式中,所述方法还包括:In one implementation, the method further includes:

在所述掺杂硅层的一面设置氮化硅钝化层,其中,所述掺杂硅层位于所述隧穿层和所述氮化硅钝化层之间;在所述电池基体的正面设置氧化铝钝化层,其中,所述氧化铝钝化层为通过原子层沉积或者等离子体增强化学的气相沉积的方式沉积得到;在所述电池基体的正面设置减反射膜层,所述氧化铝钝化层位于所述电池基体的正面和所述减反射膜层之间,其中,所述减反射膜层为通过等离子体增强化学的气相沉积的方式沉积得到,所述减反射模层为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层。A silicon nitride passivation layer is provided on one side of the doped silicon layer, where the doped silicon layer is located between the tunneling layer and the silicon nitride passivation layer; on the front side of the battery base An aluminum oxide passivation layer is provided, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma-enhanced chemical vapor deposition; an anti-reflection film layer is provided on the front side of the battery substrate, and the oxidation layer is The aluminum passivation layer is located between the front surface of the battery substrate and the anti-reflective film layer, wherein the anti-reflective film layer is deposited by plasma enhanced chemical vapor deposition, and the anti-reflective mold layer is A stack of silicon nitride materials, silicon hydroxide materials and silicon oxide materials.

具体的,在沉积得到掺杂硅层之后,可以通过在掺杂硅层的一面沉积氮化硅得到氮化硅钝化层,这样,通过在掺杂硅层的一面沉积氮化硅得到氮化硅钝化层,能够为电池提供钝化效果,能够提高电池中的光电转换效率,可以通过原子层沉积或者等离子体增强化学的气相沉积的方式在电池基体的正面沉积氧化铝得到氧化铝钝化层,通过等离子体增强化学的气相沉积的方式沉积得到 减反射膜层,氧化铝钝化层位于电池基体的正面和所述减反射膜层之间,减反射模层为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层,氮化硅材料、氢氧化硅材料和氧化硅材料在减反射膜层中的层排列方式可以根据需求进行设定,在此不做具体限定。这样,通过在电池基体的正面设置氧化铝钝化层和减反射膜层,能够为电池提高优异的钝化效果,能够提高电池中的光折射,提高电池中的光电转换效率。Specifically, after depositing the doped silicon layer, a silicon nitride passivation layer can be obtained by depositing silicon nitride on one side of the doped silicon layer. In this way, a nitride layer can be obtained by depositing silicon nitride on one side of the doped silicon layer. The silicon passivation layer can provide a passivation effect for the battery and improve the photoelectric conversion efficiency in the battery. Aluminum oxide passivation can be obtained by depositing aluminum oxide on the front of the battery substrate through atomic layer deposition or plasma enhanced chemical vapor deposition. layer, deposited by plasma-enhanced chemical vapor deposition Anti-reflection film layer, aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, the anti-reflection mold layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material, silicon nitride The layer arrangement of the material, silicon hydroxide material and silicon oxide material in the anti-reflection film layer can be set according to requirements and is not specifically limited here. In this way, by providing an aluminum oxide passivation layer and an anti-reflection film layer on the front side of the battery substrate, an excellent passivation effect can be improved for the battery, the light refraction in the battery can be improved, and the photoelectric conversion efficiency in the battery can be improved.

下面通过一个示例详细的说明本申请实施例的电池的制备方法,该方法包括如下步骤:The preparation method of the battery according to the embodiment of the present application is described in detail below through an example. The method includes the following steps:

步骤1:对制绒后的电池基体进行正面硼扩散,形成发射极(PN结)。Step 1: Perform front-side boron diffusion on the textured battery matrix to form an emitter (PN junction).

步骤2:对电池基体的背面进行刻蚀。Step 2: Etch the back of the battery substrate.

步骤3:在电池基体的背面沉积五氧化二钽隧穿层,隧穿层的厚度为1-3纳米,其中,隧穿层以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的方式制备得到。Step 3: Deposit a tantalum pentoxide tunneling layer on the back of the battery substrate. The thickness of the tunneling layer is 1-3 nanometers. The tunneling layer uses tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent. , prepared by chemical vapor deposition.

步骤4:通过低压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式在电池基体的背面沉积得到多晶硅层,对多晶硅层进行磷掺杂操作,得到掺杂硅层,使得掺杂硅层与隧穿层构成TopCon结构。Step 4: Deposit a polysilicon layer on the back of the battery substrate through low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition or atmospheric pressure chemical vapor deposition, and perform a phosphorus doping operation on the polysilicon layer to obtain a doped silicon layer, so that The doped silicon layer and the tunneling layer constitute the TopCon structure.

步骤5:利用湿法工艺去除产生的硼硅玻璃层和磷硅玻璃层。Step 5: Use a wet process to remove the produced borosilicate glass layer and phosphosilicate glass layer.

步骤6:通过原子层沉积或者等离子体增强化学的气相沉积的方式在电池基体的正面沉积氧化铝得到氧化铝钝化层,氧化铝钝化层的厚度在2-11纳米之间。Step 6: Deposit aluminum oxide on the front side of the battery substrate through atomic layer deposition or plasma-enhanced chemical vapor deposition to obtain an aluminum oxide passivation layer. The thickness of the aluminum oxide passivation layer is between 2 and 11 nanometers.

步骤7:通过等离子体增强化学的气相沉积的方式沉积得到减反射膜层,减反射膜层为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层。Step 7: Deposit an anti-reflective film layer through plasma-enhanced chemical vapor deposition. The anti-reflective film layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.

步骤8:在掺杂硅层的一面沉积氮化硅得到氮化硅钝化层。Step 8: Deposit silicon nitride on one side of the doped silicon layer to obtain a silicon nitride passivation layer.

步骤9:对电池基体进行丝网印刷并烧结形成电极。Step 9: Screen-print the battery matrix and sinter it to form the electrodes.

通过上述步骤1-9得到的电池,电池的隧穿层为五氧化二钽材料,五氧化二钽材料为高介电常数材料,具有很好的化学稳定性和热稳定性,易与半导体 工艺相兼容,同时五氧化二钽材料具有高折射率、带隙和亲和性,能产生极高电场提高载流子的运输,将五氧化二钽材料作为隧穿层设置在电池基体的背面以和掺杂硅层构成隧穿氧化层钝化接触结构,能够使得该隧穿氧化层钝化接触结构具有更好的钝化效果和光电转换效率,能够提高电池中的光电转换效率。In the battery obtained through the above steps 1-9, the tunneling layer of the battery is made of tantalum pentoxide material. The tantalum pentoxide material is a high dielectric constant material, has good chemical stability and thermal stability, and is easy to interact with semiconductors. The tantalum pentoxide material is compatible with the process. At the same time, the tantalum pentoxide material has high refractive index, band gap and affinity, and can generate an extremely high electric field to improve carrier transport. The tantalum pentoxide material is set as a tunneling layer on the back of the battery matrix to The tunnel oxide layer passivation contact structure formed with the doped silicon layer can make the tunnel oxide layer passivation contact structure have better passivation effect and photoelectric conversion efficiency, and can improve the photoelectric conversion efficiency in the battery.

需要说明的是,本申请实施例提供的电池的制备方法,执行主体可以为电池的制备装置,或者该电池的制备装置中的用于执行电池的制备方法的控制模块。本申请实施例中以电池的制备装置执行电池的制备方法为例,说明本申请实施例提供的电池的制备装置。It should be noted that, for the battery preparation method provided by the embodiments of the present application, the execution subject may be a battery preparation device, or a control module in the battery preparation device for executing the battery preparation method. In the embodiments of the present application, a battery preparation device performing a battery preparation method is used as an example to illustrate the battery preparation device provided by the embodiments of the present application.

图3是根据本发明实施例的电池的制备装置的结构示意图。如图3所示,电池的制备装置300包括:第一设置模块310、第二设置模块320和第三设置模块330。Figure 3 is a schematic structural diagram of a battery preparation device according to an embodiment of the present invention. As shown in FIG. 3 , the battery preparation device 300 includes: a first setting module 310 , a second setting module 320 , and a third setting module 330 .

第一设置模块310,用于在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述电池基体的背面连接,其中,所述隧穿层为五氧化二钽材料;第二设置模块320,用于在所述隧穿层的另一面设置掺杂硅层,以使所述隧穿层和所述掺杂硅层形成隧穿氧化层钝化接触结构;第三设置模块330,用于对所述电池基体进行丝网印刷并烧结形成电极。The first setting module 310 is used to set a tunnel layer on the back of the battery base so that one side of the tunnel layer is connected to the back of the battery base, where the tunnel layer is made of tantalum pentoxide material; The second setting module 320 is used to set a doped silicon layer on the other side of the tunnel layer, so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; the third setting module 330, for screen printing and sintering the battery matrix to form electrodes.

在一种实现方式中,所述第一设置模块310,用于以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的方式在所述电池基体的背面设置所述隧穿层,其中,所述隧穿层的厚度大于或者等于1纳米且小于或者等于3纳米。In one implementation, the first setting module 310 is used to use tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, and set all the settings on the back side of the battery substrate through chemical vapor deposition. The tunneling layer, wherein the thickness of the tunneling layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.

在一种实现方式中,所述第一设置模块310,还用于对制绒后的所述电池基体进行正面硼扩散,形成发射极;对所述电池基体的背面进行刻蚀操作。In one implementation, the first setting module 310 is also used to diffuse boron on the front of the texturized battery base to form an emitter; and to perform an etching operation on the back of the battery base.

在一种实现方式中,第二设置模块320,还用于在所述隧穿层的另一面设置多晶硅层,其中,所述多晶硅层为通过低压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式沉积得到;对所述多晶硅层进行磷掺杂操作,得到所述掺杂硅层。 In one implementation, the second setting module 320 is also used to set a polysilicon layer on the other side of the tunnel layer, wherein the polysilicon layer is formed by low-pressure chemical vapor deposition, plasma enhanced chemical vapor deposition, or Deposited by atmospheric pressure chemical vapor deposition; perform a phosphorus doping operation on the polysilicon layer to obtain the doped silicon layer.

在一种实现方式中,所述第一设置模块310,还用于利用湿法工艺去除产生的硼硅玻璃层和磷硅玻璃层。In one implementation, the first setting module 310 is also used to remove the generated borosilicate glass layer and phosphosilicate glass layer using a wet process.

在一种实现方式中,所述第一设置模块310,还用于在所述掺杂硅层的一面设置氮化硅钝化层,其中,所述掺杂硅层位于所述隧穿层和所述氮化硅钝化层之间;在所述电池基体的正面设置氧化铝钝化层,其中,所述氧化铝钝化层为通过原子层沉积或者等离子体增强化学的气相沉积的方式沉积得到;在所述电池基体的正面设置减反射膜层,所述氧化铝钝化层位于所述电池基体的正面和所述减反射膜层之间,其中,所述减反射膜层为通过等离子体增强化学的气相沉积的方式沉积得到,所述减反射模层为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层。In one implementation, the first setting module 310 is also used to set a silicon nitride passivation layer on one side of the doped silicon layer, wherein the doped silicon layer is located between the tunnel layer and Between the silicon nitride passivation layers; an aluminum oxide passivation layer is provided on the front side of the battery substrate, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma enhanced chemical vapor deposition. Obtain; An anti-reflection film layer is provided on the front side of the battery base, and the aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, wherein the anti-reflection film layer is formed by plasma It is deposited by volume-enhanced chemical vapor deposition, and the anti-reflection pattern layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.

本申请实施例中的电池的制备装置可以是装置电子设备,也可以是终端电子设备中的部件,例如集成电路、或芯片。该电子设备可以是终端,也可以为除终端之外的其他设备。装置可以是移动电子设备,也可以为非移动电子设备。示例性的,移动电子设备可以为手机、平板电脑、笔记本电脑、掌上电脑、车载电子设备、移动上网装置(Mobile Internet Device,MID)、增强现实(Augmented Reality,AR)/虚拟现实(Virtual Reality,VR)设备、机器人、可穿戴设备、超级移动个人计算机(Ultra-mobile Personal Computer,UMPC)、上网本或者个人数字助理(Personal Digital Assistant,PDA)等,非移动电子设备还可以为服务器、网络附属存储器(Network Attached Storage,NAS)、个人计算机(Personal Computer,PC)、电视机(Television,TV)、柜员机或者自助机等,本申请实施例不作具体限定。The battery preparation device in the embodiment of the present application may be a device electronic device, or may be a component in a terminal electronic device, such as an integrated circuit or a chip. The electronic device may be a terminal or other devices other than the terminal. The device may be a mobile electronic device or a non-mobile electronic device. For example, the mobile electronic device can be a mobile phone, a tablet computer, a notebook computer, a handheld computer, a vehicle-mounted electronic device, a mobile Internet device (Mobile Internet Device, MID), or an augmented reality (Augmented Reality, AR)/virtual reality (Virtual Reality, VR) equipment, robots, wearable devices, ultra-mobile personal computers (UMPC), netbooks or personal digital assistants (Personal Digital Assistant, PDA), etc. Non-mobile electronic devices can also be servers, network-attached storage (Network Attached Storage, NAS), Personal Computer (Personal Computer, PC), Television (Television, TV), teller machine or self-service machine, etc., are not specifically limited in the embodiments of this application.

本申请实施例中的电池的制备装置可以为具有操作系统的装置。该操作系统可以为安卓(Android)操作系统,可以为ios操作系统,还可以为其他可能的操作系统,本申请实施例不作具体限定。The battery preparation device in the embodiment of the present application may be a device with an operating system. The operating system can be an Android operating system, an ios operating system, or other possible operating systems, which are not specifically limited in the embodiments of this application.

本申请实施例提供的电池的制备装置能够实现图3的方法实施例实现的各个过程,为避免重复,这里不再赘述。 The battery preparation device provided by the embodiment of the present application can implement each process implemented by the method embodiment in Figure 3. To avoid repetition, the details will not be described here.

可选地,如图4所示,本申请实施例另提供一种电子设备400,包括处理器401和存储器402,存储器402上存储有可在所述处理器401上运行的程序或指令,该程序或指令被处理器401执行时实现:在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述电池基体的背面连接,其中,所述隧穿层为五氧化二钽材料;在所述隧穿层的另一面设置掺杂硅层,以使所述隧穿层和所述掺杂硅层形成隧穿氧化层钝化接触结构;对所述电池基体进行丝网印刷并烧结形成电极。Optionally, as shown in Figure 4, this embodiment of the present application further provides an electronic device 400, including a processor 401 and a memory 402. The memory 402 stores programs or instructions that can be run on the processor 401. When the program or instructions are executed by the processor 401, the following is achieved: setting a tunneling layer on the back of the battery base so that one side of the tunneling layer is connected to the back of the battery base, wherein the tunneling layer is tantalum pentoxide. Materials; disposing a doped silicon layer on the other side of the tunnel layer so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; performing screen printing on the battery substrate and sintered to form electrodes.

在一种实现方式中,以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的方式在所述电池基体的背面设置所述隧穿层,其中,所述隧穿层的厚度大于或者等于1纳米且小于或者等于3纳米。In one implementation, tantalum pentafluoride is used as the tantalum source, hydrogen is used as the reducing agent, and oxygen is used as the oxidant, and the tunneling layer is provided on the back side of the battery substrate through chemical vapor deposition, wherein the tunneling layer The thickness of the through layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers.

在一种实现方式中,在所述在电池基体的背面设置隧穿层之前,所述方法还包括:对制绒后的所述电池基体进行正面硼扩散,形成发射极;对所述电池基体的背面进行刻蚀操作。In one implementation, before arranging the tunneling layer on the back side of the battery substrate, the method further includes: performing boron diffusion on the front of the textured battery substrate to form an emitter; The back side is etched.

在一种实现方式中,在所述隧穿层的另一面设置多晶硅层,其中,所述多晶硅层为通过低压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式沉积得到;对所述多晶硅层进行磷掺杂操作,得到所述掺杂硅层。In one implementation, a polysilicon layer is provided on the other side of the tunnel layer, wherein the polysilicon layer is deposited by low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition, or atmospheric pressure chemical vapor deposition. ; Perform a phosphorus doping operation on the polysilicon layer to obtain the doped silicon layer.

在一种实现方式中,所述方法还包括:利用湿法工艺去除产生的硼硅玻璃层和磷硅玻璃层。In one implementation, the method further includes removing the generated borosilicate glass layer and phosphosilicate glass layer using a wet process.

在一种实现方式中,所述方法还包括:在所述掺杂硅层的一面设置氮化硅钝化层,其中,所述掺杂硅层位于所述隧穿层和所述氮化硅钝化层之间;在所述电池基体的正面设置氧化铝钝化层,其中,所述氧化铝钝化层为通过原子层沉积或者等离子体增强化学的气相沉积的方式沉积得到;在所述电池基体的正面设置减反射膜层,所述氧化铝钝化层位于所述电池基体的正面和所述减反射膜层之间,其中,所述减反射膜层为通过等离子体增强化学的气相沉积的方式沉积得到,所述减反射模层为氮化硅材料、氢氧化硅材料和氧化硅材料的叠层。 In one implementation, the method further includes: arranging a silicon nitride passivation layer on one side of the doped silicon layer, wherein the doped silicon layer is located between the tunneling layer and the silicon nitride layer. between the passivation layers; an aluminum oxide passivation layer is provided on the front side of the battery substrate, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma enhanced chemical vapor deposition; in the An anti-reflection film layer is provided on the front side of the battery base, and the aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, wherein the anti-reflection film layer is a gas phase that enhances chemistry through plasma. Deposited by deposition, the anti-reflection pattern layer is a stack of silicon nitride material, silicon hydroxide material and silicon oxide material.

具体执行步骤可以参见上述电池的制备方法实施例的各个步骤,且能达到相同的技术效果,为避免重复,这里不再赘述。For specific execution steps, please refer to each step of the above-mentioned battery preparation method embodiment, and can achieve the same technical effect. To avoid repetition, they will not be described again here.

需要说明的是,本申请实施例中的电子设备包括:服务器、终端或除终端之外的其他设备。It should be noted that the electronic devices in the embodiments of the present application include: servers, terminals, or other devices other than terminals.

以上电子设备结构并不构成对电子设备的限定,电子设备可以包括比图示更多或更少的部件,或者组合某些部件,或者不同的部件布置,例如,输入单元,可以包括图形处理器(Graphics Processing Unit,GPU)和麦克风,显示单元可以采用液晶显示器、有机发光二极管等形式来配置显示面板。用户输入单元包括触控面板以及其他输入设备中的至少一种。触控面板也称为触摸屏。其他输入设备可以包括但不限于物理键盘、功能键(比如音量控制按键、开关按键等)、轨迹球、鼠标、操作杆,在此不再赘述。The above structure of the electronic device does not constitute a limitation on the electronic device. The electronic device may include more or less components than shown in the figure, or a combination of certain components, or a different arrangement of components, such as an input unit, which may include a graphics processor. (Graphics Processing Unit, GPU) and microphone, the display unit can be configured with a display panel in the form of a liquid crystal display, an organic light-emitting diode, etc. The user input unit includes at least one of a touch panel and other input devices. Touch panels are also called touch screens. Other input devices may include but are not limited to physical keyboards, function keys (such as volume control keys, switch keys, etc.), trackballs, mice, and joysticks, which will not be described again here.

存储器可用于存储软件程序以及各种数据。存储器可主要包括存储程序或指令的第一存储区和存储数据的第二存储区,其中,第一存储区可存储操作系统、至少一个功能所需的应用程序或指令(比如声音播放功能、图像播放功能等)等。此外,存储器可以包括易失性存储器或非易失性存储器,或者,存储器可以包括易失性和非易失性存储器两者。其中,非易失性存储器可以是只读存储器(Read-Only Memory,ROM)、可编程只读存储器(Programmable ROM,PROM)、可擦除可编程只读存储器(Erasable PROM,EPROM)、电可擦除可编程只读存储器(Electrically EPROM,EEPROM)或闪存。易失性存储器可以是随机存取存储器(Random Access Memory,RAM),静态随机存取存储器(Static RAM,SRAM)、动态随机存取存储器(Dynamic RAM,DRAM)、同步动态随机存取存储器(Synchronous DRAM,SDRAM)、双倍数据速率同步动态随机存取存储器(Double Data Rate SDRAM,DDRSDRAM)、增强型同步动态随机存取存储器(Enhanced SDRAM,ESDRAM)、同步连接动态随机存取存储器(Synch link DRAM,SLDRAM)和直接内存总线随机存取存储器(Direct Rambus RAM,DRRAM)。 Memory can be used to store software programs as well as various data. The memory may mainly include a first storage area for storing programs or instructions and a second storage area for storing data, wherein the first storage area may store an operating system, an application program or instructions required for at least one function (such as a sound playback function, an image play function, etc.) etc. Furthermore, memory may include volatile memory or non-volatile memory, or memory may include both volatile and non-volatile memory. Among them, the non-volatile memory can be read-only memory (Read-Only Memory, ROM), programmable read-only memory (Programmable ROM, PROM), erasable programmable read-only memory (Erasable PROM, EPROM), electrically removable memory. Erase programmable read-only memory (Electrically EPROM, EEPROM) or flash memory. Volatile memory can be random access memory (Random Access Memory, RAM), static random access memory (Static RAM, SRAM), dynamic random access memory (Dynamic RAM, DRAM), synchronous dynamic random access memory (Synchronous DRAM, SDRAM), double data rate synchronous dynamic random access memory (Double Data Rate SDRAM, DDRSDRAM), enhanced synchronous dynamic random access memory (Enhanced SDRAM, ESDRAM), synchronous link dynamic random access memory (Synch link DRAM) , SLDRAM) and direct memory bus random access memory (Direct Rambus RAM, DRRAM).

处理器可包括一个或多个处理单元;可选的,处理器集成应用处理器和调制解调处理器,其中,应用处理器主要处理涉及操作系统、用户界面和应用程序等的操作,调制解调处理器主要处理无线通信信号,如基带处理器。可以理解的是,上述调制解调处理器也可以不集成到处理器中。The processor may include one or more processing units; optionally, the processor integrates an application processor and a modem processor, where the application processor mainly handles operations involving the operating system, user interface, application programs, etc., and the modem processor The modulation processor mainly processes wireless communication signals, such as baseband processors. It can be understood that the above modem processor may not be integrated into the processor.

本申请实施例还提供一种可读存储介质,所述可读存储介质上存储有程序或指令,该程序或指令被处理器执行时实现上述电池的制备方法实施例的各个过程,且能达到相同的技术效果,为避免重复,这里不再赘述。Embodiments of the present application also provide a readable storage medium. Programs or instructions are stored on the readable storage medium. When the program or instructions are executed by a processor, each process of the battery preparation method embodiment is implemented, and can achieve The same technical effects are not repeated here to avoid repetition.

其中,所述处理器为上述实施例中所述的电子设备中的处理器。所述可读存储介质,包括计算机可读存储介质,如ROM、RAM、磁碟或者光盘等。Wherein, the processor is the processor in the electronic device described in the above embodiment. The readable storage media includes computer-readable storage media, such as ROM, RAM, magnetic disks or optical disks.

需要说明的是,在本文中,术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、物品或者装置不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、物品或者装置所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括该要素的过程、方法、物品或者装置中还存在另外的相同要素。此外,需要指出的是,本申请实施方式中的方法和装置的范围不限按示出或讨论的顺序来执行功能,还可包括根据所涉及的功能按基本同时的方式或按相反的顺序来执行功能,例如,可以按不同于所描述的次序来执行所描述的方法,并且还可以添加、省去、或组合各种步骤。另外,参照某些示例所描述的特征可在其他示例中被组合。It should be noted that, in this document, the terms "comprising", "comprises" or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article or device that includes a series of elements not only includes those elements, It also includes other elements not expressly listed or inherent in the process, method, article or apparatus. Without further limitation, an element defined by the statement "comprises a..." does not exclude the presence of additional identical elements in a process, method, article or apparatus that includes that element. In addition, it should be pointed out that the scope of the methods and devices in the embodiments of the present application is not limited to performing functions in the order shown or discussed, but may also include performing functions in a substantially simultaneous manner or in reverse order according to the functions involved. Functions may be performed, for example, the methods described may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

通过以上的实施方式的描述,本领域的技术人员可以清楚地了解到上述实施例方法可借助软件加必需的通用硬件平台的方式来实现,当然也可以通过硬件,但很多情况下前者是更佳的实施方式。基于这样的理解,本申请的技术方案本质上或者说对现有技术做出贡献的部分可以以计算机软件产品的形式体现出来,该计算机软件产品存储在一个存储介质(如ROM/RAM、磁碟、光盘)中,包括若干指令用以使得一台终端(可以是手机,计算机,服务器,或者网络设备等)执行本申请各个实施例所述的方法。 Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus the necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is better. implementation. Based on this understanding, the technical solution of the present application can be embodied in the form of a computer software product that is essentially or contributes to the existing technology. The computer software product is stored in a storage medium (such as ROM/RAM, disk , optical disk), including several instructions to cause a terminal (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in various embodiments of this application.

上面结合附图对本申请的实施例进行了描述,但是本申请并不局限于上述的具体实施方式,上述的具体实施方式仅仅是示意性的,而不是限制性的,本领域的普通技术人员在本申请的启示下,在不脱离本申请宗旨和权利要求所保护的范围情况下,还可做出很多形式,均属于本申请的保护之内。 The embodiments of the present application have been described above in conjunction with the accompanying drawings. However, the present application is not limited to the above-mentioned specific implementations. The above-mentioned specific implementations are only illustrative and not restrictive. Those of ordinary skill in the art will Inspired by this application, many forms can be made without departing from the purpose of this application and the scope protected by the claims, all of which fall within the protection of this application.

Claims (10)

一种电池,其特征在于,包括:A battery, characterized by including: 电池基体;battery matrix; 电极;electrode; 隧穿层,所述隧穿层的一面与所述电池基体的背面连接,所述隧穿层为五氧化二钽材料;A tunneling layer, one side of which is connected to the back of the battery substrate, and the tunneling layer is made of tantalum pentoxide material; 掺杂硅层,所述隧穿层的另一面与所述掺杂硅层的一面连接。Doped silicon layer, the other side of the tunnel layer is connected to one side of the doped silicon layer. 根据权利要求1所述的电池,其特征在于,所述电池还包括:The battery according to claim 1, characterized in that the battery further includes: 氮化硅钝化层,所述氮化硅钝化层与所述掺杂硅层的另一面连接。A silicon nitride passivation layer is connected to the other side of the doped silicon layer. 根据权利要求1所述的电池,其特征在于,所述电池还包括:The battery according to claim 1, characterized in that the battery further includes: 发射极,所述发射极位于所述电池基体的正面;An emitter, the emitter is located on the front side of the battery base; 氧化铝钝化层,所述氧化铝钝化层的一面与所述发射极层连接;An aluminum oxide passivation layer, one side of the aluminum oxide passivation layer is connected to the emitter layer; 减反射膜层,所述减反射膜层与所述氧化铝钝化层的另一面连接,所述减反射膜层为氮化硅、氢氧化硅和氧化硅的叠层。Anti-reflection film layer, the anti-reflection film layer is connected to the other side of the aluminum oxide passivation layer, the anti-reflection film layer is a stack of silicon nitride, silicon hydroxide and silicon oxide. 根据权利要求1所述的电池,其特征在于,所述隧穿层的厚度大于或者等于1纳米且小于或者等于3纳米。The battery according to claim 1, wherein the thickness of the tunneling layer is greater than or equal to 1 nanometer and less than or equal to 3 nanometers. 一种电池的制备方法,其特征在于,包括:A method for preparing a battery, which is characterized by including: 在电池基体的背面设置隧穿层,使得所述隧穿层的一面与所述电池基体的背面连接,其中,所述隧穿层为五氧化二钽材料;A tunneling layer is provided on the back side of the battery base so that one side of the tunneling layer is connected to the back side of the battery base, wherein the tunneling layer is made of tantalum pentoxide material; 在所述隧穿层的另一面设置掺杂硅层,以使所述隧穿层和所述掺杂硅层形成隧穿氧化层钝化接触结构;A doped silicon layer is provided on the other side of the tunnel layer, so that the tunnel layer and the doped silicon layer form a tunnel oxide layer passivation contact structure; 对所述电池基体进行丝网印刷并烧结形成电极。The battery substrate is screen printed and sintered to form electrodes. 根据权利要求5所述的制备方法,其特征在于,所述在电池基体的背面设置隧穿层,包括:The preparation method according to claim 5, characterized in that said providing a tunneling layer on the back side of the battery substrate includes: 以五氟化钽为钽源、氢气为还原剂、氧气为氧化剂,通过化学气相沉积的方式在所述电池基体的背面设置所述隧穿层,其中,所述隧穿层的厚度大于或 者等于1纳米且小于或者等于3纳米。Using tantalum pentafluoride as the tantalum source, hydrogen as the reducing agent, and oxygen as the oxidizing agent, the tunneling layer is provided on the back side of the battery substrate by chemical vapor deposition, wherein the thickness of the tunneling layer is greater than or Which is equal to 1 nanometer and less than or equal to 3 nanometers. 根据权利要求6所述的制备方法,其特征在于,在所述在电池基体的背面设置隧穿层之前,所述方法还包括:The preparation method according to claim 6, characterized in that before arranging the tunneling layer on the back side of the battery substrate, the method further includes: 对制绒后的所述电池基体进行正面硼扩散,形成发射极;Perform front-side boron diffusion on the textured battery substrate to form an emitter; 对所述电池基体的背面进行刻蚀操作。An etching operation is performed on the back side of the battery substrate. 根据权利要求5所述的制备方法,其特征在于,所述在所述隧穿层的另一面设置掺杂硅层,包括:The preparation method according to claim 5, characterized in that said providing a doped silicon layer on the other side of the tunnel layer includes: 在所述隧穿层的另一面设置多晶硅层,其中,所述多晶硅层为通过低压化学气相沉积、等离子体增强化学的气相沉积或者常压化学气相沉积的方式沉积得到;A polysilicon layer is provided on the other side of the tunnel layer, wherein the polysilicon layer is deposited by low-pressure chemical vapor deposition, plasma-enhanced chemical vapor deposition, or atmospheric pressure chemical vapor deposition; 对所述多晶硅层进行磷掺杂操作,得到所述掺杂硅层。The polysilicon layer is subjected to a phosphorus doping operation to obtain the doped silicon layer. 根据权利要求5所述的制备方法,其特征在于,所述方法还包括:The preparation method according to claim 5, characterized in that the method further includes: 利用湿法工艺去除产生的硼硅玻璃层和磷硅玻璃层。The resulting borosilicate glass layer and phosphosilicate glass layer are removed using a wet process. 根据权利要求5所述的制备方法,其特征在于,所述方法还包括:The preparation method according to claim 5, characterized in that the method further includes: 在所述掺杂硅层的一面设置氮化硅钝化层,其中,所述掺杂硅层位于所述隧穿层和所述氮化硅钝化层之间;A silicon nitride passivation layer is provided on one side of the doped silicon layer, wherein the doped silicon layer is located between the tunneling layer and the silicon nitride passivation layer; 在所述电池基体的正面设置氧化铝钝化层,其中,所述氧化铝钝化层为通过原子层沉积或者等离子体增强化学的气相沉积的方式沉积得到,所述氧化铝的厚度;An aluminum oxide passivation layer is provided on the front side of the battery substrate, wherein the aluminum oxide passivation layer is deposited by atomic layer deposition or plasma enhanced chemical vapor deposition, and the thickness of the aluminum oxide; 在所述电池基体的正面设置减反射膜层,所述氧化铝钝化层位于所述电池基体的正面和所述减反射膜层之间,其中,所述减反射膜层为通过等离子体增强化学的气相沉积的方式沉积得到。 An anti-reflection film layer is provided on the front side of the battery base, and the aluminum oxide passivation layer is located between the front side of the battery base and the anti-reflection film layer, wherein the anti-reflection film layer is enhanced by plasma. Deposited by chemical vapor deposition.
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