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WO2022000997A1 - Rare earth element-doped silicon carbide powder - Google Patents

Rare earth element-doped silicon carbide powder Download PDF

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Publication number
WO2022000997A1
WO2022000997A1 PCT/CN2020/134379 CN2020134379W WO2022000997A1 WO 2022000997 A1 WO2022000997 A1 WO 2022000997A1 CN 2020134379 W CN2020134379 W CN 2020134379W WO 2022000997 A1 WO2022000997 A1 WO 2022000997A1
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WIPO (PCT)
Prior art keywords
rare earth
silicon carbide
earth element
carbide powder
doped
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Ceased
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PCT/CN2020/134379
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French (fr)
Chinese (zh)
Inventor
靳婉琪
布勒琴科·耶夫亨
王超
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SICC CO Ltd
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SICC CO Ltd
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Priority claimed from CN202010615817.5A external-priority patent/CN111892055B/en
Priority claimed from CN202010613663.6A external-priority patent/CN111908472B/en
Application filed by SICC CO Ltd filed Critical SICC CO Ltd
Publication of WO2022000997A1 publication Critical patent/WO2022000997A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/90Carbides
    • C01B32/914Carbides of single elements
    • C01B32/956Silicon carbide
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/06Metal silicides
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/36Carbides

Definitions

  • the present application relates to a silicon carbide powder doped with rare earth elements, which belongs to the technical field of semiconductor materials.
  • Silicon carbide As a third-generation semiconductor material, is widely used in power electronics, optoelectronic devices and other fields because of its excellent properties such as large band gap, high saturation electron mobility, strong breakdown field, and high thermal conductivity. . High-quality crystals are the cornerstone of the development of semiconductor and information industries, and their preparation level restricts the preparation and performance of downstream devices.
  • the physical vapor transport (PVT) method is the main method for growing silicon carbide crystals.
  • the equipment used for growing silicon carbide crystals by the physical vapor transport method is simple, and the process is easy to control.
  • defects such as dislocations and polytypes will be generated.
  • additives are often added in the crystal growth process.
  • Patent US20090053125A1 discloses that adding Ce silicide or carbide during the growth of 4H-SiC single crystal can suppress the generation of polytype defects.
  • CeSi 2 or CeC 2 is placed in a small graphite crucible, dispersed and buried in the SiC powder source, sublimated into the gas phase during the crystal growth process, and finally doped into the silicon carbide lattice, thereby promoting the growth of 4H-SiC and inhibit the production of other polytypes.
  • the silicide or carbide of cerium is placed in a small graphite crucible and then buried in the powder source. The compound of cerium cannot be evenly distributed in the powder, which will inevitably lead to the whole crystal growth process.
  • the inhomogeneous distribution in time and space is also unfavorable for the inhibition of crystal form.
  • the dopant is simply mixed with silicon carbide powder, the dopant does not enter the powder, even if it is uniformly distributed in space, because the melting point and sublimation speed of cerium silicide or carbide and silicon carbide exist. Differences, in the entire crystal growth process, there will still be uneven distribution of time.
  • the introduction of small graphite crucibles is equivalent to the introduction of new variables to the crystal growth system. For the high-purity silicon carbide single crystal growth process, the variables that need to control the purity increase, the process becomes more complicated, and the inhibition effect on polytypes during the growth process of silicon carbide crystals is not ideal.
  • the present application provides a silicon carbide powder doped with rare earth elements.
  • the silicide of rare earth elements is doped in the silicon carbide crystal phase.
  • the rare earth elements will be gradually released with the sublimation of the silicon carbide powder, realizing the uniform doping of rare earth elements in time and space, thus effectively suppressing the generation of polytypes.
  • a rare earth element-doped silicon carbide powder comprising a silicon carbide crystal phase and a rare earth element silicide, the rare earth element silicide doped in the silicon carbide crystalline phase.
  • the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.001-5wt%; preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.005-2.5 wt %; preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.02-0.2 wt %.
  • the lower limit of the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is selected from 0.03wt%, 0.04wt%, 0.05wt%, 0.06wt%, 0.07wt%, 0.08wt%, 0.09wt% %, 0.1t%, 0.11wt%, 0.12wt%, 0.13wt%, 0.14wt%, 0.15wt%, 0.16wt%, 0.17wt%, 0.18wt% or 0.19wt%
  • the silicide of the rare earth element is
  • the upper limit of the doping concentration in the silicon carbide crystal phase is selected from 0.03wt%, 0.04wt%, 0.05wt%, 0.06wt%, 0.07wt%, 0.08wt%, 0.09wt%, 0.1t%, 0.11wt%, 0.12 wt %, 0.13 wt %, 0.14 wt %, 0.15 wt %, 0.16 wt %
  • the rare earth element is selected from at least one of lanthanides, scandium and yttrium; preferably, the rare earth element is selected from at least one of cerium, lanthanum, praseodymium, neodymium, scandium and yttrium.
  • the purity of the rare earth element-doped silicon carbide powder is not less than 99.99%; preferably, the purity of the rare earth element-doped silicon carbide powder is not less than 99.999%.
  • the silicide of the rare earth element is obtained by the following preparation method: the rare earth element-containing substance is reacted with high-purity silicon powder at a high temperature.
  • the purity of the rare earth element-containing substance is not less than 99.99%, and the rare earth element-containing substance is a solid powder with a particle size of not more than 100 ⁇ m.
  • the rare earth element-containing substance is an oxide of a rare earth element.
  • the molar ratio of the rare earth element in the rare earth element-containing substance to the high-purity silicon powder is 1:2 to 4, and preferably, the molar ratio of the doped rare-earth element to the high-purity silicon powder is 1:2 ⁇ 3.
  • silicides of rare earth elements are prepared by selecting oxides of rare earth elements.
  • commercially available silicides and carbides of rare earth elements commercially available The silicides and carbides of rare earth elements have high prices and low purity), which greatly reduces production costs and improves product purity.
  • the conditions of the high-temperature reaction are: the rare earth element-containing substance and the high-purity silicon powder are reacted under vacuum conditions at a temperature of 1400-1800° C. for 1-5 hours; preferably, the conditions of the high-temperature reaction are: Rare earth element substances and high-purity silicon powder are reacted for 2-4 hours at a pressure not higher than 10 -2 Pa and a temperature of 1500-1600°C.
  • the silicon carbide powder doped with rare earth elements is agglomerated particles, the particle size of the agglomerated particles is not greater than 2 mm, the particle size of the single crystal grains in the agglomerated particles is not greater than 500 ⁇ m, and the rare earth element doped particles are not larger than 500 ⁇ m.
  • the bulk density of the silicon carbide powder is 0.7-1.1 g/cm 3 .
  • the preparation method of the rare earth element-doped silicon carbide powder comprising the steps of: silicide of rare earth element, high-purity silicon carbide
  • the powder and high-purity carbon powder are obtained by reacting at least 5 hours at a temperature of 1100-1600 °C under vacuum conditions.
  • the silicide of rare earth element, high-purity silicon powder and high-purity carbon powder are reacted under high temperature and vacuum.
  • the high-purity carbon powder and high-purity carbon powder react to form silicon carbide, and then the silicide of rare earth element is doped
  • the hetero-packaging is carried out in the silicon carbide crystal phase, so that the rare earth element and the silicon carbide crystal phase are uniformly doped, that is, the rare earth element is doped in the raw material synthesis stage of the silicon carbide powder.
  • the rare earth elements in the silicon carbide powder will be gradually released along with the sublimation of the powder during the growth process, so as to achieve uniform doping in time and space and ensure crystal growth.
  • the process can effectively suppress polytypes from beginning to end.
  • the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the silicide of the rare earth element is 100:0.001-5.
  • the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the silicide of the rare earth element is 100:0.005-2.5, and the molar ratio of the high-purity carbon powder and the high-purity silicon powder is 1 ⁇ 2.5. 1.5:1.
  • the particle size of the high-purity silicon powder and the high-purity carbon powder is not greater than 100 ⁇ m; the purity of the high-purity carbon powder and the high-purity silicon powder is not less than 99.9%.
  • the preparation method includes the following steps: 1.
  • the rare earth element-doped silicide, high-purity silicon powder and high-purity carbon powder are reacted for 5-15 hours at a pressure not higher than 10 -2 Pa and a temperature of 1200-1400° C. , to obtain ⁇ -type silicon carbide powder doped with rare earth elements.
  • the preparation method further includes the following steps: (2) at the temperature of step (1), filling a protective gas, raising the temperature to 2000-2500 °C, and reacting for at least 10 hours to obtain ⁇ -type silicon carbide powder doped with rare earth elements;
  • the conditions of the synthesis reaction further include the following steps: 2 at the temperature of step 1, charging a protective gas to a pressure of 500-1000 mbar, raising the temperature to 2200-2400 °C, and reacting for 10-40 h to obtain the doping Rare earth element ⁇ -type silicon carbide powder;
  • the protective gas is a mixed gas of inert gas and hydrogen, and the volume fraction of hydrogen in the mixed gas is 2-3%. Hydrogen is mainly used to inhibit the carbonization of silicon carbide powder, so that the atmosphere in the crucible is evenly distributed.
  • the rare earth element doped silicon carbide powder according to any one of the above or the rare earth element doped silicon carbide powder prepared by the preparation method according to any one of the above are also provided.
  • Applications in the preparation of high-quality silicon carbide crystals Since the rare earth element doped silicon carbide powder or the rare earth element doped silicon carbide powder prepared by the preparation method is uniformly doped and has high purity, it is used as a raw material for silicon carbide crystals. During growth, the obtained silicon carbide crystal not only has high purity, but also has few defects, and the quality of the crystal is high.
  • Silicon carbide powder doped with rare earth elements in the present application the silicide of rare earth elements is doped in the silicon carbide crystal phase, so that the rare earth elements are uniformly doped in the silicon carbide powder.
  • the sublimation of silicon carbide powder is gradually released, and the uniform doping of rare earth elements in time and space is realized, thereby effectively suppressing the generation of polytype defects in the crystal.
  • the preparation method of the present application is simple, the conditions are easy to control, and the prepared silicon carbide powder doped with rare earth elements is not only uniformly doped with rare earth elements, but also has high purity.
  • the rare earth element in the silicon carbide powder doped with rare earth elements of the present application is uniformly doped with high purity. higher.
  • This embodiment provides a rare earth element doped silicon carbide powder, the rare earth element doped silicon carbide powder includes a silicon carbide crystal phase and a rare earth element silicide, and the rare earth element silicide is doped in in the crystalline phase of silicon carbide.
  • the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.001-5 wt %; preferably, the doping concentration of the silicide of the rare earth element is 0.005-2.5 wt %. More preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.02-0.2 wt %.
  • the rare earth element is selected from at least one of lanthanides, scandium and yttrium; preferably, the rare earth element is selected from at least one of cerium, lanthanum, praseodymium, neodymium, scandium and yttrium. More preferably, the rare earth element is cerium.
  • the purity of the rare earth element doped silicon carbide powder is not less than 99.99%; preferably, the purity of the rare earth element doped silicon carbide powder is not less than 99.999%.
  • the silicon carbide powder doped with rare earth elements is agglomerated particles, the particle size of the agglomerated particles is not more than 2 mm, and the particle size of the single crystal grains in the agglomerated particles is not more than 500 ⁇ m.
  • the bulk density of the agglomerated particles is 0.7-1.1 g/cm 3 , and the bulk density after compaction is 1.1-2.0 g/cm 3 .
  • the present embodiment provides a method for preparing the above-mentioned rare-earth element-doped silicon carbide powder, which includes the following steps:
  • the rare earth element-containing material is uniformly mixed with the high-purity silicon powder, wherein the rare earth element-containing material is selected from powdered cerium (Ce) and other lanthanides (lanthanum La, praseodymium Pr, neodymium Nd, etc.) or At least one of the oxides of yttrium Y and scandium Sc; the oxide of the rare earth element is a solid powder with a particle size of not more than 100 ⁇ m, and the purity is not less than 99.99%; the doped rare earth element and high-purity silicon powder
  • the molar ratio of the doped rare earth element to the high-purity silicon powder is 1:1.5-2.5; preferably, the molar ratio of the doped rare earth element to the high-purity silicon powder is 1:1.8-2.2;
  • step (1) The mixture in step (1) is heated to 1400-1800° C. under vacuum conditions for 1-5 hours. At this temperature, the high-purity silicon powder can react with the oxides of the above rare earth elements to obtain doped rare earth elements.
  • the silicide preferably, the reaction temperature is 1500 ⁇ 1600°C, the pressure is not higher than 10 -2 Pa, and the reaction time is 2 ⁇ 4h;
  • step (2) Evenly mix the rare earth element-doped silicide, high-purity silicon powder and high-purity carbon powder in step (2), the sum of the mass of the high-purity carbon powder and high-purity silicon powder is the same as that of the rare-earth element-doped silicide.
  • the mass ratio of the silicide is 100:0.001-5; preferably, the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the mass ratio of the silicide doped with rare earth elements is 100:0.005-2.5;
  • the above mixture is at a reaction temperature of 1100-1600°C, a pressure not higher than 10 -2 Pa, and a reaction time of 5-15h, wherein the molar ratio of the high-purity carbon powder and the high-purity silicon powder is 1-1.5:1, Obtaining ⁇ -type silicon carbide powder doped with rare earth elements;
  • step 1 2 temperature, charged with shielding gas, raising the temperature to 2000 ⁇ 2500 °C, the pressure was 500 ⁇ 1000mbar, the reaction time is 10 ⁇ 40h; protective gas is an inert gas into a mixed gas of H 2 and the volume fraction of mixed gas of H 2 2 to 3 percent, the inert gas is selected from argon and / or helium, to obtain rare-earth doped ⁇ -type silicon carbide powder.
  • the silicon carbide powder doped with rare earth elements is prepared according to the above method, and the difference from the above preparation method is shown in Table 1.
  • the purity of high-purity carbon powder, high-purity silicon powder and oxides of rare earth elements is greater than 99.99%
  • the filled protective gas is a mixed gas of argon gas and hydrogen gas.
  • the silicon carbide powder 1#, silicon carbide powder 2#, silicon carbide powder 3#, silicon carbide powder 4#, comparative silicon carbide powder D1#, comparative silicon carbide powder D2# and comparative silicon carbide powder D3# prepared above were used. Characterize. And the silicon carbide crystal is grown by using the above silicon carbide powder, and the polytype of the grown crystal is detected. The detection results are shown in Table 2.
  • the rare earth element-doped silicon carbide powder prepared in the present application is a pale yellow-white agglomerated particle, the rare earth element in the powder is more uniformly doped, and the purity is high, and the total impurity content does not exceed 10ppm, The purity is not less than 99.999%.
  • the rare earth element-doped silicon carbide powder of the present application is more uniform in doping, with low impurity content and high purity.
  • silicon carbide powder 1'#, silicon carbide powder 2'# and silicon carbide powder 3'#, silicon carbide powder 1'#, silicon carbide powder 2'# and carbide powder of cerium doped silicon carbide powder The mass ratio of silicon powder 3'# medium and high-purity carbon silicon powder to cerium silicide is 100:0.004. Silicon carbide powder 1#, silicon carbide powder 2#, and silicon carbide powder 3# are respectively used for the growth of silicon carbide crystals.
  • sample silicon carbide powder 1'# at a distance of 80mm from the crucible mouth sample silicon carbide powder 2'# at a distance of 90mm from the crucible mouth, and sample silicon carbide powder 3'# at a distance of 100mm from the crucible mouth.
  • Comparative silicon carbide powder D1'#, comparative silicon carbide powder D2'#, and comparative silicon carbide powder D3'# are respectively after mechanical mixing of silicon carbide powder and cerium silicide (the sum of the mass of The mass ratio of cerium silicide is 100:0.004) for the growth of silicon carbide crystals.
  • the comparison silicon carbide powder D1'# is sampled at a distance of 80mm from the crucible mouth in the growth crucible, and the comparison silicon carbide powder D2'# is 90mm away from the crucible mouth. Sampling, the comparative silicon carbide powder D3'# is sampled at a distance of 100mm from the crucible mouth.
  • the comparative silicon carbide powder R1#, the comparative silicon carbide powder R2#, and the comparative silicon carbide powder R3# are respectively placed cerium silicide in a small graphite crucible (the sum of the mass of the high-purity silicon carbide powder and the mass ratio of the cerium silicide in the small crucible is 100:0.004), buried in the silicon carbide powder for the growth of silicon carbide crystals, the comparative silicon carbide powder R1# was sampled in the same crystal growth crucible at a distance of 80 mm from the crucible mouth, and the comparative silicon carbide powder was sampled at a distance of 90 mm from the crucible mouth. R2# is sampled, and the silicon carbide powder R3# is sampled at a distance of 100mm from the crucible mouth.
  • Silicon carbide powder 1'#, silicon carbide powder 2'#, silicon carbide powder 3'#, comparative silicon carbide powder D1'#, comparative silicon carbide powder D2'#, comparative silicon carbide powder D3'#, comparative carbonization powder using GDMS The concentration of cerium (Ce) in the samples of silicon powder R1#, comparative silicon carbide powder R2#, and comparative silicon carbide powder R3# was detected, and the polytype area of the crystal rod grown from the silicon carbide powder raw material was detected. The results as shown in Table 3.
  • the Ce concentration in the raw material before the crystallization reaction is approximately equal to the Ce concentration in the raw material (because cerium silicide is not completely uniformly mixed in the raw material, and the height of the raw material is different, resulting in different Ce concentration results. ); while the cerium silicide was embedded in the silicon carbide powder with a small crucible, no Ce could be detected in the comparative silicon carbide powder R1# ⁇ R3#. The crystal growth is carried out for 20 hours.
  • the cerium silicide of the present application is doped into the silicon carbide crystal phase, the cerium is released evenly and slowly; the method of directly mixing the cerium silicide and the silicon carbide raw materials is due to the low melting point of the cerium silicide and volatilizes quickly.
  • the Ce concentration in the small crucible decreases rapidly; the cerium silicide buried in the small crucible gradually diffuses into the silicon carbide raw material, but the concentration is low, and the farther away from the small crucible, the harder it is to detect.
  • the cerium silicide of the present application is doped into the silicon carbide crystal phase, the residual cerium dopant in the raw material can still be detected after the reaction is completed.
  • the cerium silicide volatilizes quickly in the early stage, and the reaction There is little residue left in the raw material.
  • the cerium silicide in the small crucible diffuses out, and the closer it is to the small crucible, the higher the concentration.
  • the cerium silicide in the raw material of the present application is uniformly volatilized, and the crystal rod has no polymorphism; the cerium silicide and the silicon carbide powder are directly mixed, a large amount of cerium silicide volatilizes in the early stage, and the cerium silicide is insufficient in the later stage, and polytypes are easily generated in the later stage; the cerium silicide is buried In the crucible, the lack of cerium silicide in the early stage is easy to produce polytypes.

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Abstract

A rare earth element-doped silicon carbide powder, comprising a silicon carbide crystal phase and a rare earth element silicide, wherein the rare earth element silicide is doped in the silicon carbide crystal phase. The doping concentration of the rare earth element silicide in the silicon carbide crystal phase is 0.001-5 wt%. In the rare earth element-doped silicon carbide powder, the rare earth element silicide is doped in the silicon carbide crystal phase, so that the rare earth element is uniformly doped in the silicon carbide powder, and during crystal growth, the rare earth element is gradually released along with the sublimation of the silicon carbide powder, thus achieving the uniform doping of the rare earth element in terms of both time and space, and thereby effectively inhibiting the generation of polymorphic defects in the crystal; in addition, the rare earth element silicide is obtained by selecting and using an oxide of the rare earth element with a relatively high purity, so that the production cost of the rare earth element-doped silicon carbide powder is greatly reduced, and the product purity is improved.

Description

一种掺杂稀土元素的碳化硅粉料A kind of silicon carbide powder doped with rare earth elements 技术领域technical field

本申请涉及一种掺杂稀土元素的碳化硅粉料,属于半导体材料的技术领域。The present application relates to a silicon carbide powder doped with rare earth elements, which belongs to the technical field of semiconductor materials.

背景技术Background technique

碳化硅(SiC)作为第三代半导体材料,因其具有禁带宽度大、饱和电子迁移率高、击穿场强大、热导率高等优异性质,而被广泛应用于电力电子、光电子器件等领域。高质量晶体是半导体和信息产业发展的基石,它的制备水平制约了下游器件的制备与性能。Silicon carbide (SiC), as a third-generation semiconductor material, is widely used in power electronics, optoelectronic devices and other fields because of its excellent properties such as large band gap, high saturation electron mobility, strong breakdown field, and high thermal conductivity. . High-quality crystals are the cornerstone of the development of semiconductor and information industries, and their preparation level restricts the preparation and performance of downstream devices.

目前,物理气相传输(PVT)法是生长碳化硅晶体的主要方法,物理气相传输法生长碳化硅晶体所用的设备简单,并且工艺容易控制。但是PVT法生长碳化硅晶体的过程中,会产生位错、多型等缺陷。现有技术中为抑制碳化硅晶体生长中多型的产生,在晶体生长工艺中往往会添加助剂。At present, the physical vapor transport (PVT) method is the main method for growing silicon carbide crystals. The equipment used for growing silicon carbide crystals by the physical vapor transport method is simple, and the process is easy to control. However, in the process of growing silicon carbide crystals by PVT method, defects such as dislocations and polytypes will be generated. In the prior art, in order to suppress the generation of polytypes in the growth of silicon carbide crystals, additives are often added in the crystal growth process.

专利US20090053125A1公开了在4H-SiC单晶生长过程中添加Ce的硅化物或碳化物,可以抑制多型缺陷的产生。该专利中,CeSi 2或CeC 2被置于小石墨坩埚内分散埋入SiC粉源中,在晶体生长过程中升华进入气相,最终掺杂进入碳化硅晶格间,从而促进4H-SiC的生长并抑制其它多型的产生。从工艺角度:将铈的硅化物或碳化物置于小石墨坩埚中再埋入粉源中,铈的化合物无法均匀分布在粉料中,必然导致整个长晶工艺中,气相组分里的铈在时间和空间上分布的不均匀性,对晶型的抑制也不利。同理,单纯地将掺杂剂与碳化硅粉搅拌混合,掺杂剂未进入粉料中,即便空间上达到均匀分布,由于铈的硅化物或碳化物的熔点、升华速度等与碳化硅存在差异,在整个长晶工艺中,时间上依然会存在不均匀分布的现象。小石墨坩埚的引入相当于对长晶体系引入了新变量。对于高纯碳化硅单晶生长工艺,需要控制纯度的变量增加,工艺变得更 复杂,对碳化硅晶体的生长过程中对多型的抑制效果不理想。 Patent US20090053125A1 discloses that adding Ce silicide or carbide during the growth of 4H-SiC single crystal can suppress the generation of polytype defects. In this patent, CeSi 2 or CeC 2 is placed in a small graphite crucible, dispersed and buried in the SiC powder source, sublimated into the gas phase during the crystal growth process, and finally doped into the silicon carbide lattice, thereby promoting the growth of 4H-SiC and inhibit the production of other polytypes. From the process point of view: the silicide or carbide of cerium is placed in a small graphite crucible and then buried in the powder source. The compound of cerium cannot be evenly distributed in the powder, which will inevitably lead to the whole crystal growth process. The inhomogeneous distribution in time and space is also unfavorable for the inhibition of crystal form. In the same way, if the dopant is simply mixed with silicon carbide powder, the dopant does not enter the powder, even if it is uniformly distributed in space, because the melting point and sublimation speed of cerium silicide or carbide and silicon carbide exist. Differences, in the entire crystal growth process, there will still be uneven distribution of time. The introduction of small graphite crucibles is equivalent to the introduction of new variables to the crystal growth system. For the high-purity silicon carbide single crystal growth process, the variables that need to control the purity increase, the process becomes more complicated, and the inhibition effect on polytypes during the growth process of silicon carbide crystals is not ideal.

发明内容SUMMARY OF THE INVENTION

为了解决上述问题,本申请提供了一种掺杂稀土元素的碳化硅粉料,该掺杂稀土元素的碳化硅粉料中稀土元素的硅化物掺杂在碳化硅晶相中,在长晶时稀土元素会随着碳化硅粉的升华被逐步释放,实现稀土元素在时间和空间上的均匀掺杂,从而有效抑制了多型的产生。In order to solve the above problems, the present application provides a silicon carbide powder doped with rare earth elements. In the silicon carbide powder doped with rare earth elements, the silicide of rare earth elements is doped in the silicon carbide crystal phase. The rare earth elements will be gradually released with the sublimation of the silicon carbide powder, realizing the uniform doping of rare earth elements in time and space, thus effectively suppressing the generation of polytypes.

根据本申请的一个方面,提供了一种掺杂稀土元素的碳化硅粉料,所述掺杂稀土元素的碳化硅粉料包括碳化硅晶相和稀土元素的硅化物,所述稀土元素的硅化物掺杂在碳化硅晶相中。According to one aspect of the present application, there is provided a rare earth element-doped silicon carbide powder, the rare earth element-doped silicon carbide powder comprising a silicon carbide crystal phase and a rare earth element silicide, the rare earth element silicide doped in the silicon carbide crystalline phase.

进一步地,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.001~5wt%;优选地,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.005~2.5wt%;优选地,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.02~0.2wt%。进一步地,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度的下限选自0.03wt%、0.04wt%、0.05wt%、0.06wt%、0.07wt%、0.08wt%、0.09wt%、0.1t%、0.11wt%、0.12wt%、0.13wt%、0.14wt%、0.15wt%、0.16wt%、0.17wt%、0.18wt%或0.19wt%,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度的上限选自0.03wt%、0.04wt%、0.05wt%、0.06wt%、0.07wt%、0.08wt%、0.09wt%、0.1t%、0.11wt%、0.12wt%、0.13wt%、0.14wt%、0.15wt%、0.16wt%、0.17wt%、0.18wt%或0.19wt%。Further, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.001-5wt%; preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.005-2.5 wt %; preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.02-0.2 wt %. Further, the lower limit of the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is selected from 0.03wt%, 0.04wt%, 0.05wt%, 0.06wt%, 0.07wt%, 0.08wt%, 0.09wt% %, 0.1t%, 0.11wt%, 0.12wt%, 0.13wt%, 0.14wt%, 0.15wt%, 0.16wt%, 0.17wt%, 0.18wt% or 0.19wt%, the silicide of the rare earth element is The upper limit of the doping concentration in the silicon carbide crystal phase is selected from 0.03wt%, 0.04wt%, 0.05wt%, 0.06wt%, 0.07wt%, 0.08wt%, 0.09wt%, 0.1t%, 0.11wt%, 0.12 wt %, 0.13 wt %, 0.14 wt %, 0.15 wt %, 0.16 wt %, 0.17 wt %, 0.18 wt %, or 0.19 wt %.

进一步地,所述稀土元素选自镧系元素、钪和钇中的至少一种;优选地,所述稀土元素选自铈、镧、镨、钕、钪和钇中的至少一种。Further, the rare earth element is selected from at least one of lanthanides, scandium and yttrium; preferably, the rare earth element is selected from at least one of cerium, lanthanum, praseodymium, neodymium, scandium and yttrium.

进一步地,所述掺杂稀土元素的碳化硅粉料的纯度不低于99.99%;优选地,所述掺杂稀土元素的碳化硅粉料的纯度不低于99.999%。Further, the purity of the rare earth element-doped silicon carbide powder is not less than 99.99%; preferably, the purity of the rare earth element-doped silicon carbide powder is not less than 99.999%.

进一步地,所述稀土元素的硅化物通过以下制备方法获得:将含稀土元素物质与高纯硅粉进行高温反应,即得。Further, the silicide of the rare earth element is obtained by the following preparation method: the rare earth element-containing substance is reacted with high-purity silicon powder at a high temperature.

进一步地,所述含稀土元素物质的纯度不低于99.99%,所述含稀土元素 物质为粒径不大于100μm的固体粉末。优选地,所述含稀土元素物质为稀土元素的氧化物。优选地,所述含稀土元素物质中的稀土元素与高纯硅粉的摩尔比为1:2~4,优选地,所述掺杂的稀土元素与高纯硅粉的摩尔比为1:2~3。Further, the purity of the rare earth element-containing substance is not less than 99.99%, and the rare earth element-containing substance is a solid powder with a particle size of not more than 100 μm. Preferably, the rare earth element-containing substance is an oxide of a rare earth element. Preferably, the molar ratio of the rare earth element in the rare earth element-containing substance to the high-purity silicon powder is 1:2 to 4, and preferably, the molar ratio of the doped rare-earth element to the high-purity silicon powder is 1:2 ~3.

本申请掺杂稀土元素的碳化硅粉料中,通过选用稀土元素的氧化物制得稀土元素的硅化物,相比较,现有技术中使用市售的稀土元素的硅化物和碳化物(市售的稀土元素的硅化物和碳化物价格高、纯度低),极大地降低了生产成本同时提高了产品纯度。In the silicon carbide powder doped with rare earth elements of the present application, silicides of rare earth elements are prepared by selecting oxides of rare earth elements. In comparison, commercially available silicides and carbides of rare earth elements (commercially available The silicides and carbides of rare earth elements have high prices and low purity), which greatly reduces production costs and improves product purity.

进一步地,所述高温反应的条件为:将含稀土元素物质与高纯硅粉在真空条件下,温度1400~1800℃,反应1~5h;优选地,所述高温反应的条件为:将含稀土元素物质与高纯硅粉在压力不高于10 -2Pa,温度1500~1600℃,反应2~4h。 Further, the conditions of the high-temperature reaction are: the rare earth element-containing substance and the high-purity silicon powder are reacted under vacuum conditions at a temperature of 1400-1800° C. for 1-5 hours; preferably, the conditions of the high-temperature reaction are: Rare earth element substances and high-purity silicon powder are reacted for 2-4 hours at a pressure not higher than 10 -2 Pa and a temperature of 1500-1600°C.

进一步地,所述掺杂稀土元素的碳化硅粉料为团聚颗粒,所述团聚颗粒的粒径不大于2mm,所述团聚颗粒中单晶粒的粒径不大于500μm,所述掺杂稀土元素的碳化硅粉料的堆积密度为0.7~1.1g/cm 3Further, the silicon carbide powder doped with rare earth elements is agglomerated particles, the particle size of the agglomerated particles is not greater than 2 mm, the particle size of the single crystal grains in the agglomerated particles is not greater than 500 μm, and the rare earth element doped particles are not larger than 500 μm. The bulk density of the silicon carbide powder is 0.7-1.1 g/cm 3 .

根据本申请的另一个方面,还提供了上述任一项所述的掺杂稀土元素的碳化硅粉料的制备方法,所述制备方法包括下述步骤:将稀土元素的硅化物、高纯硅粉和高纯碳粉在真空条件下,温度1100~1600℃,反应至少5h,即得。According to another aspect of the present application, there is also provided the preparation method of the rare earth element-doped silicon carbide powder according to any one of the above, the preparation method comprising the steps of: silicide of rare earth element, high-purity silicon carbide The powder and high-purity carbon powder are obtained by reacting at least 5 hours at a temperature of 1100-1600 °C under vacuum conditions.

本申请制备方法中,将稀土元素的硅化物、高纯硅粉和高纯碳粉在高温真空下反应,首先高纯碳粉与高纯碳粉反应生成碳化硅,然后稀土元素的硅化物掺杂包裹进碳化硅晶相中,使得稀土元素与碳化硅晶相均匀掺杂,即在碳化硅粉的原料合成阶段就进行稀土元素的掺杂。利用该掺杂稀土元素的碳化硅粉料生长晶体时,生长过程中碳化硅粉中的稀土元素会随着粉料的升华被逐步释放,从而实现时间和空间上的均匀掺杂,保证长晶工艺从始至终能对多型有效抑制。In the preparation method of the present application, the silicide of rare earth element, high-purity silicon powder and high-purity carbon powder are reacted under high temperature and vacuum. First, the high-purity carbon powder and high-purity carbon powder react to form silicon carbide, and then the silicide of rare earth element is doped The hetero-packaging is carried out in the silicon carbide crystal phase, so that the rare earth element and the silicon carbide crystal phase are uniformly doped, that is, the rare earth element is doped in the raw material synthesis stage of the silicon carbide powder. When using the rare earth element-doped silicon carbide powder to grow crystals, the rare earth elements in the silicon carbide powder will be gradually released along with the sublimation of the powder during the growth process, so as to achieve uniform doping in time and space and ensure crystal growth. The process can effectively suppress polytypes from beginning to end.

进一步地,所述高纯碳粉和高纯硅粉的质量总和与稀土元素的硅化物的质量比为100:0.001~5。优选地,所述高纯碳粉和高纯硅粉的质量总和与稀土元 素的硅化物的质量比为100:0.005~2.5,所述高纯碳粉和高纯硅粉的摩尔比为1~1.5:1。优选地,所述高纯硅粉和高纯碳粉的粒径不大于100μm;所述高纯碳粉和高纯硅粉的纯度不低于99.9%。Further, the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the silicide of the rare earth element is 100:0.001-5. Preferably, the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the silicide of the rare earth element is 100:0.005-2.5, and the molar ratio of the high-purity carbon powder and the high-purity silicon powder is 1~2.5. 1.5:1. Preferably, the particle size of the high-purity silicon powder and the high-purity carbon powder is not greater than 100 μm; the purity of the high-purity carbon powder and the high-purity silicon powder is not less than 99.9%.

进一步地,所述制备方法包括以下步骤:①将掺杂稀土元素的硅化物、高纯硅粉和高纯碳粉在压力不高于10 -2Pa,温度1200~1400℃,反应5~15h,得到掺杂稀土元素的β型碳化硅粉。 Further, the preparation method includes the following steps: 1. The rare earth element-doped silicide, high-purity silicon powder and high-purity carbon powder are reacted for 5-15 hours at a pressure not higher than 10 -2 Pa and a temperature of 1200-1400° C. , to obtain β-type silicon carbide powder doped with rare earth elements.

进一步地,所述制备方法还包括以下步骤:②在步骤①的温度下,充入保护气体,升高温度至2000~2500℃,反应至少10h,得到掺杂稀土元素的α型碳化硅粉;优选地,所述合成反应的条件还包括以下步骤:②在步骤①的温度下,充入保护气体至压力为500~1000mbar,升高温度至2200~2400℃,反应10~40h,得到掺杂稀土元素的α型碳化硅粉;优选地,所述保护气体为惰性气体和氢气的混合气体,所述混合气体中,氢气的体积分数为2~3%。氢气主要用于抑制碳化硅粉料碳化,使坩埚内气氛均匀分布。Further, the preparation method further includes the following steps: (2) at the temperature of step (1), filling a protective gas, raising the temperature to 2000-2500 °C, and reacting for at least 10 hours to obtain α-type silicon carbide powder doped with rare earth elements; Preferably, the conditions of the synthesis reaction further include the following steps: ② at the temperature of step ①, charging a protective gas to a pressure of 500-1000 mbar, raising the temperature to 2200-2400 °C, and reacting for 10-40 h to obtain the doping Rare earth element α-type silicon carbide powder; preferably, the protective gas is a mixed gas of inert gas and hydrogen, and the volume fraction of hydrogen in the mixed gas is 2-3%. Hydrogen is mainly used to inhibit the carbonization of silicon carbide powder, so that the atmosphere in the crucible is evenly distributed.

根据本申请的另一个方面,还提供了上述任一项所述的掺杂稀土元素的碳化硅粉料或上述任一项所述的制备方法制得的掺杂稀土元素的碳化硅粉料在制备高质量碳化硅晶体中的应用。由于所述掺杂稀土元素的碳化硅粉料或所述制备方法制得的掺杂稀土元素的碳化硅粉料中稀土元素掺杂均匀,且纯度较高,将其作为原料用于碳化硅晶体生长时,得到的碳化硅晶体不仅纯度高,且缺陷少,晶体的质量较高。According to another aspect of the present application, there is also provided the rare earth element doped silicon carbide powder according to any one of the above or the rare earth element doped silicon carbide powder prepared by the preparation method according to any one of the above. Applications in the preparation of high-quality silicon carbide crystals. Since the rare earth element doped silicon carbide powder or the rare earth element doped silicon carbide powder prepared by the preparation method is uniformly doped and has high purity, it is used as a raw material for silicon carbide crystals. During growth, the obtained silicon carbide crystal not only has high purity, but also has few defects, and the quality of the crystal is high.

本申请的有益效果包括但不限于:The beneficial effects of this application include but are not limited to:

(1)本申请中掺杂稀土元素的碳化硅粉料,稀土元素的硅化物掺杂在碳化硅晶相中,使得稀土元素在碳化硅粉中均匀掺杂,长晶时,稀土元素会随着碳化硅粉的升华被逐步释放,实现稀土元素在时间和空间上的均匀掺杂,从而有效抑制了晶体中多型缺陷的产生。(1) Silicon carbide powder doped with rare earth elements in the present application, the silicide of rare earth elements is doped in the silicon carbide crystal phase, so that the rare earth elements are uniformly doped in the silicon carbide powder. The sublimation of silicon carbide powder is gradually released, and the uniform doping of rare earth elements in time and space is realized, thereby effectively suppressing the generation of polytype defects in the crystal.

(2)本申请中掺杂稀土元素的碳化硅粉料,选用纯度较高的稀土元素的氧化物获得稀土元素的硅化物,再将稀土元素的硅化物掺杂进碳化硅晶相中, 该掺杂的稀土元素原料的纯度高、成本低,极大地降低了掺杂稀土元素的碳化硅粉料的生产成本,且同时提高了产品纯度。(2) Silicon carbide powder doped with rare earth elements in the present application, select oxides of rare earth elements with higher purity to obtain silicides of rare earth elements, and then dope the silicides of rare earth elements into the silicon carbide crystal phase, the The doped rare earth element raw material has high purity and low cost, greatly reduces the production cost of the rare earth element doped silicon carbide powder, and at the same time improves the product purity.

(3)本申请的制备方法简单,条件易控制,制得的掺杂稀土元素的碳化硅粉料不仅稀土元素掺杂均匀,且纯度较高。(3) The preparation method of the present application is simple, the conditions are easy to control, and the prepared silicon carbide powder doped with rare earth elements is not only uniformly doped with rare earth elements, but also has high purity.

(4)本申请掺杂稀土元素的碳化硅粉料中稀土元素掺杂均匀,且纯度较高,将其作为原料生长碳化硅晶体时,得到的碳化硅晶体纯度高、缺陷少,晶体的质量较高。(4) The rare earth element in the silicon carbide powder doped with rare earth elements of the present application is uniformly doped with high purity. higher.

具体实施方式detailed description

下面结合实施例详述本申请,但本申请并不局限于这些实施例。The present application will be described in detail below with reference to the examples, but the present application is not limited to these examples.

如无特别说明,本申请的实施例中的涉及的原料等均通过商业途径购买。Unless otherwise specified, the raw materials and the like involved in the examples of the present application are all purchased through commercial channels.

实施例1Example 1

本实施例提供了一种掺杂稀土元素的碳化硅粉料,所述掺杂稀土元素的碳化硅粉料包含碳化硅晶相和稀土元素的硅化物,所述稀土元素的硅化物掺杂在碳化硅晶相中。This embodiment provides a rare earth element doped silicon carbide powder, the rare earth element doped silicon carbide powder includes a silicon carbide crystal phase and a rare earth element silicide, and the rare earth element silicide is doped in in the crystalline phase of silicon carbide.

所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.001~5wt%;优选地,所述稀土元素的硅化物的掺杂浓度为0.005~2.5wt%。更优选地,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.02~0.2wt%。The doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.001-5 wt %; preferably, the doping concentration of the silicide of the rare earth element is 0.005-2.5 wt %. More preferably, the doping concentration of the silicide of the rare earth element in the silicon carbide crystal phase is 0.02-0.2 wt %.

所述稀土元素选自镧系元素、钪和钇中的至少一种;优选地,所述稀土元素选自铈、镧、镨、钕、钪和钇中的至少一种。更优选地,所述稀土元素为铈。The rare earth element is selected from at least one of lanthanides, scandium and yttrium; preferably, the rare earth element is selected from at least one of cerium, lanthanum, praseodymium, neodymium, scandium and yttrium. More preferably, the rare earth element is cerium.

所述掺杂稀土元素的碳化硅粉料的纯度不低于99.99%;优选地,所述掺杂稀土元素的碳化硅粉料的纯度不低于99.999%。所述掺杂稀土元素的碳化硅粉料为团聚颗粒,团聚颗粒的粒径不大于2mm,团聚颗粒中单晶粒的粒径不大于500μm。团聚颗粒的堆积密度在0.7~1.1g/cm 3,压实后堆积密度在1.1~2.0g/cm 3The purity of the rare earth element doped silicon carbide powder is not less than 99.99%; preferably, the purity of the rare earth element doped silicon carbide powder is not less than 99.999%. The silicon carbide powder doped with rare earth elements is agglomerated particles, the particle size of the agglomerated particles is not more than 2 mm, and the particle size of the single crystal grains in the agglomerated particles is not more than 500 μm. The bulk density of the agglomerated particles is 0.7-1.1 g/cm 3 , and the bulk density after compaction is 1.1-2.0 g/cm 3 .

实施例2Example 2

本实施例提供了上述掺杂稀土元素的碳化硅粉料的制备方法,包括下述步骤:The present embodiment provides a method for preparing the above-mentioned rare-earth element-doped silicon carbide powder, which includes the following steps:

(1)将含稀土元素物质与高纯硅粉均匀混合,其中,所述含稀土元素物质选自粉末状的铈(Ce)和其它镧系元素(镧La、镨Pr、钕Nd等)或钇Y、钪Sc的氧化物中的至少一种;所述稀土元素的氧化物为粒径不大于100μm的固体粉末,纯度不低于99.99%;所述掺杂的稀土元素与高纯硅粉的摩尔比为1:1.5~2.5;优选地,所述掺杂的稀土元素与高纯硅粉的摩尔比为1:1.8~2.2;(1) The rare earth element-containing material is uniformly mixed with the high-purity silicon powder, wherein the rare earth element-containing material is selected from powdered cerium (Ce) and other lanthanides (lanthanum La, praseodymium Pr, neodymium Nd, etc.) or At least one of the oxides of yttrium Y and scandium Sc; the oxide of the rare earth element is a solid powder with a particle size of not more than 100 μm, and the purity is not less than 99.99%; the doped rare earth element and high-purity silicon powder The molar ratio of the doped rare earth element to the high-purity silicon powder is 1:1.5-2.5; preferably, the molar ratio of the doped rare earth element to the high-purity silicon powder is 1:1.8-2.2;

(2)将步骤(1)的混合物在真空条件下在加热至1400~1800℃,进行反应1~5h,该温度下高纯硅粉可与上述稀土元素的氧化物反应,得到掺杂稀土元素的硅化物;优选地,反应温度为1500~1600℃,压力不高于10 -2Pa,反应时间2~4h; (2) The mixture in step (1) is heated to 1400-1800° C. under vacuum conditions for 1-5 hours. At this temperature, the high-purity silicon powder can react with the oxides of the above rare earth elements to obtain doped rare earth elements. The silicide; preferably, the reaction temperature is 1500~1600℃, the pressure is not higher than 10 -2 Pa, and the reaction time is 2~4h;

(3)①将步骤(2)的掺杂稀土元素的硅化物、高纯硅粉和高纯碳粉均匀混合,所述高纯碳粉和高纯硅粉的质量总和与掺杂稀土元素的硅化物的质量比为100:0.001~5;优选地,所述高纯碳粉和高纯硅粉的质量总和与掺杂稀土元素的硅化物的质量比为100:0.005~2.5;(3) ① Evenly mix the rare earth element-doped silicide, high-purity silicon powder and high-purity carbon powder in step (2), the sum of the mass of the high-purity carbon powder and high-purity silicon powder is the same as that of the rare-earth element-doped silicide. The mass ratio of the silicide is 100:0.001-5; preferably, the mass ratio of the sum of the mass of the high-purity carbon powder and the high-purity silicon powder to the mass ratio of the silicide doped with rare earth elements is 100:0.005-2.5;

将上述的混合物在反应温度1100~1600℃,压力不高于10 -2Pa,反应时间5~15h,其中,所述高纯碳粉和高纯硅粉的摩尔比为1~1.5:1,得到掺杂稀土元素的β型碳化硅粉; The above mixture is at a reaction temperature of 1100-1600°C, a pressure not higher than 10 -2 Pa, and a reaction time of 5-15h, wherein the molar ratio of the high-purity carbon powder and the high-purity silicon powder is 1-1.5:1, Obtaining β-type silicon carbide powder doped with rare earth elements;

②在步骤①的温度下,充入保护气体,升高温度至2000~2500℃,控制压力为500~1000mbar,反应时间为10~40h;通入的保护气体为惰性气体与H 2的混合气体,所述混合气体中H 2的体积分数为2~3%,惰性气体选自氩气和/或氦气,得到掺杂稀土元素的α型碳化硅粉。 In the step ① ② temperature, charged with shielding gas, raising the temperature to 2000 ~ 2500 ℃, the pressure was 500 ~ 1000mbar, the reaction time is 10 ~ 40h; protective gas is an inert gas into a mixed gas of H 2 and the volume fraction of mixed gas of H 2 2 to 3 percent, the inert gas is selected from argon and / or helium, to obtain rare-earth doped α-type silicon carbide powder.

按照上述方法制备掺杂稀土元素的碳化硅粉料,与上述备方法的不同之处如表1所示,分别制得碳化硅粉1#、碳化硅粉2#、碳化硅粉3#、碳化硅粉4#、对比碳化硅粉D1#、对比碳化硅粉D2#、对比碳化硅粉D3#。其中,高纯碳粉、高纯硅粉和稀土元素的氧化物的纯度大于99.99%,充入的保护气体为氩气与 氢气的混合气体。The silicon carbide powder doped with rare earth elements is prepared according to the above method, and the difference from the above preparation method is shown in Table 1. Silicon powder 4#, contrast silicon carbide powder D1#, contrast silicon carbide powder D2#, contrast silicon carbide powder D3#. Among them, the purity of high-purity carbon powder, high-purity silicon powder and oxides of rare earth elements is greater than 99.99%, and the filled protective gas is a mixed gas of argon gas and hydrogen gas.

表1Table 1

Figure PCTCN2020134379-appb-000001
Figure PCTCN2020134379-appb-000001

Figure PCTCN2020134379-appb-000002
Figure PCTCN2020134379-appb-000002

将上述制得的碳化硅粉1#、碳化硅粉2#、碳化硅粉3#、碳化硅粉4#、对比碳化硅粉D1#、对比碳化硅粉D2#和对比碳化硅粉D3#产品进行表征。并利用上述碳化硅粉生长碳化硅晶体,并对生长晶体的多型进行检测,检测结果如表2所示。The silicon carbide powder 1#, silicon carbide powder 2#, silicon carbide powder 3#, silicon carbide powder 4#, comparative silicon carbide powder D1#, comparative silicon carbide powder D2# and comparative silicon carbide powder D3# prepared above were used. Characterize. And the silicon carbide crystal is grown by using the above silicon carbide powder, and the polytype of the grown crystal is detected. The detection results are shown in Table 2.

表2Table 2

Figure PCTCN2020134379-appb-000003
Figure PCTCN2020134379-appb-000003

Figure PCTCN2020134379-appb-000004
Figure PCTCN2020134379-appb-000004

由表2的结果可知,本申请制得的掺杂稀土元素的碳化硅粉料为浅黄白色团聚颗粒,该粉料中稀土元素掺杂较均匀,且纯度较高,总杂质含量不超过10ppm,纯度不低于99.999%。相较于对比碳化硅粉D1#~D3#,本申请的掺杂稀土元素的碳化硅粉料的掺杂较均匀,杂质含量低,纯度较高。It can be seen from the results in Table 2 that the rare earth element-doped silicon carbide powder prepared in the present application is a pale yellow-white agglomerated particle, the rare earth element in the powder is more uniformly doped, and the purity is high, and the total impurity content does not exceed 10ppm, The purity is not less than 99.999%. Compared with the comparative silicon carbide powders D1# to D3#, the rare earth element-doped silicon carbide powder of the present application is more uniform in doping, with low impurity content and high purity.

使用本申请提供的方法合成铈掺杂碳化硅粉的碳化硅粉1'#、碳化硅粉2'#和碳化硅粉3'#,碳化硅粉1'#、碳化硅粉2'#和碳化硅粉3'#中高纯碳硅粉的质量总和与硅化铈的质量比为100:0.004,分别将碳化硅粉1#、碳化硅粉2#、碳化硅粉3#用于碳化硅晶体生长,在长晶坩埚内距坩埚口80mm处对碳化硅粉1'#取样,距坩埚口90mm处对碳化硅粉2'#取样,距坩埚口100mm处对碳化硅粉3'#取样。Use the method provided in this application to synthesize silicon carbide powder 1'#, silicon carbide powder 2'# and silicon carbide powder 3'#, silicon carbide powder 1'#, silicon carbide powder 2'# and carbide powder of cerium doped silicon carbide powder The mass ratio of silicon powder 3'# medium and high-purity carbon silicon powder to cerium silicide is 100:0.004. Silicon carbide powder 1#, silicon carbide powder 2#, and silicon carbide powder 3# are respectively used for the growth of silicon carbide crystals. In the crystal growth crucible, sample silicon carbide powder 1'# at a distance of 80mm from the crucible mouth, sample silicon carbide powder 2'# at a distance of 90mm from the crucible mouth, and sample silicon carbide powder 3'# at a distance of 100mm from the crucible mouth.

对比碳化硅粉D1'#、对比碳化硅粉D2'#、对比碳化硅粉D3'#分别为将碳化硅粉料与硅化铈机械混合后(高纯碳硅粉的质量总和与掺杂稀土元素的硅化铈质量比为100:0.004)用于碳化硅晶体生长,在长晶坩埚内距坩埚口80mm处对对比碳化硅粉D1'#取样,距坩埚口90mm处对对比碳化硅粉D2'#取样,距坩埚口100mm处对对比碳化硅粉D3'#取样。Comparative silicon carbide powder D1'#, comparative silicon carbide powder D2'#, and comparative silicon carbide powder D3'# are respectively after mechanical mixing of silicon carbide powder and cerium silicide (the sum of the mass of The mass ratio of cerium silicide is 100:0.004) for the growth of silicon carbide crystals. The comparison silicon carbide powder D1'# is sampled at a distance of 80mm from the crucible mouth in the growth crucible, and the comparison silicon carbide powder D2'# is 90mm away from the crucible mouth. Sampling, the comparative silicon carbide powder D3'# is sampled at a distance of 100mm from the crucible mouth.

对比碳化硅粉R1#、对比碳化硅粉R2#、对比碳化硅粉R3#分别为将硅化铈置于石墨小坩埚内(高纯碳硅粉的质量总和与小坩埚中硅化铈的质量比为100:0.004),埋入碳化硅粉料中,用于碳化硅晶体生长,在同一长晶坩埚内距坩埚口80mm处对对比碳化硅粉R1#取样,距坩埚口90mm处对对比碳化硅粉R2#取样,距坩埚口100mm处对比碳化硅粉R3#取样。The comparative silicon carbide powder R1#, the comparative silicon carbide powder R2#, and the comparative silicon carbide powder R3# are respectively placed cerium silicide in a small graphite crucible (the sum of the mass of the high-purity silicon carbide powder and the mass ratio of the cerium silicide in the small crucible is 100:0.004), buried in the silicon carbide powder for the growth of silicon carbide crystals, the comparative silicon carbide powder R1# was sampled in the same crystal growth crucible at a distance of 80 mm from the crucible mouth, and the comparative silicon carbide powder was sampled at a distance of 90 mm from the crucible mouth. R2# is sampled, and the silicon carbide powder R3# is sampled at a distance of 100mm from the crucible mouth.

利用GDMS对碳化硅粉1'#、碳化硅粉2'#、碳化硅粉3'#、对比碳化硅粉D1'#、对比碳化硅粉D2'#、对比碳化硅粉D3'#、对比碳化硅粉R1#、对比碳化硅粉R2#、对比碳化硅粉R3#样品中的铈(Ce)的浓度进行检测,并对所述碳化硅粉原料生长出的晶棒多型面积进行检测,结果如表3所示。Silicon carbide powder 1'#, silicon carbide powder 2'#, silicon carbide powder 3'#, comparative silicon carbide powder D1'#, comparative silicon carbide powder D2'#, comparative silicon carbide powder D3'#, comparative carbonization powder using GDMS The concentration of cerium (Ce) in the samples of silicon powder R1#, comparative silicon carbide powder R2#, and comparative silicon carbide powder R3# was detected, and the polytype area of the crystal rod grown from the silicon carbide powder raw material was detected. The results as shown in Table 3.

表3table 3

Figure PCTCN2020134379-appb-000005
Figure PCTCN2020134379-appb-000005

由表3的结果可知,长晶反应前原料里的Ce浓度,与原料里Ce的浓度大致相等(由于硅化铈不是完全均匀混合在原料中,且原料的取料高度不同,导致Ce浓度结果不同);而用小坩埚把硅化铈埋入碳化硅粉料中的,对比碳化硅粉R1#~R3#中检测不到Ce。长晶进行20h,由于本申请的硅化铈掺杂进碳化硅晶相中,铈释放均匀而缓慢;将硅化铈和碳化硅原料直接混合的方法由于硅化铈熔点低,很快挥发,所以原料里的Ce浓度下降快;埋在小坩埚里的硅化铈则逐渐扩散进入碳化硅原料里,但是浓度低,并且离小坩埚越远越难检测到。长晶结束时,由于本申请的硅化铈掺杂进碳化硅晶相中,反应完成后仍能检测到原料里残余的铈掺杂剂,而直接混合的方法,硅化铈由于前期挥发快,反应后原料里很少有残留。小坩埚里的硅化铈则扩散出来,离小坩埚越近浓度越高。 综上,本申请的原料中硅化铈均匀挥发,晶棒无多型;硅化铈与碳化硅粉料直接混合,前期大量硅化铈挥发,后期硅化铈不足,后期容易产生多型;硅化铈埋入坩埚中,前期硅化铈不足容易产生多型。As can be seen from the results in Table 3, the Ce concentration in the raw material before the crystallization reaction is approximately equal to the Ce concentration in the raw material (because cerium silicide is not completely uniformly mixed in the raw material, and the height of the raw material is different, resulting in different Ce concentration results. ); while the cerium silicide was embedded in the silicon carbide powder with a small crucible, no Ce could be detected in the comparative silicon carbide powder R1#~R3#. The crystal growth is carried out for 20 hours. Since the cerium silicide of the present application is doped into the silicon carbide crystal phase, the cerium is released evenly and slowly; the method of directly mixing the cerium silicide and the silicon carbide raw materials is due to the low melting point of the cerium silicide and volatilizes quickly. The Ce concentration in the small crucible decreases rapidly; the cerium silicide buried in the small crucible gradually diffuses into the silicon carbide raw material, but the concentration is low, and the farther away from the small crucible, the harder it is to detect. At the end of the crystal growth, since the cerium silicide of the present application is doped into the silicon carbide crystal phase, the residual cerium dopant in the raw material can still be detected after the reaction is completed. In the direct mixing method, the cerium silicide volatilizes quickly in the early stage, and the reaction There is little residue left in the raw material. The cerium silicide in the small crucible diffuses out, and the closer it is to the small crucible, the higher the concentration. In summary, the cerium silicide in the raw material of the present application is uniformly volatilized, and the crystal rod has no polymorphism; the cerium silicide and the silicon carbide powder are directly mixed, a large amount of cerium silicide volatilizes in the early stage, and the cerium silicide is insufficient in the later stage, and polytypes are easily generated in the later stage; the cerium silicide is buried In the crucible, the lack of cerium silicide in the early stage is easy to produce polytypes.

以上所述,仅为本申请的实施例而已,本申请的保护范围并不受这些具体实施例的限制,而是由本申请的权利要求书来确定。对于本领域技术人员来说,本申请可以有各种更改和变化。凡在本申请的技术思想和原理之内所作的任何修改、等同替换、改进等,均应包含在本申请的保护范围之内。The above are only the embodiments of the present application, and the protection scope of the present application is not limited by these specific embodiments, but is determined by the claims of the present application. Various modifications and variations of this application are possible for those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the technical ideas and principles of the present application shall be included within the protection scope of the present application.

Claims (13)

一种掺杂稀土元素的碳化硅粉料,其特征在于,所述掺杂稀土元素的碳化硅粉料包含碳化硅晶相和稀土元素的硅化物,所述稀土元素的硅化物掺杂在碳化硅晶相中。A rare earth element doped silicon carbide powder, characterized in that the rare earth element doped silicon carbide powder comprises a silicon carbide crystal phase and a rare earth element silicide, and the rare earth element silicide is doped in the carbide in the silicon phase. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.001~5wt%。The rare earth element-doped silicon carbide powder according to claim 1, wherein the doping concentration of the rare earth element silicide in the silicon carbide crystal phase is 0.001-5wt%. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述稀土元素的硅化物在碳化硅晶相中的掺杂浓度为0.005~2.5wt%。The silicon carbide powder doped with rare earth elements according to claim 1, wherein the doping concentration of the silicide of rare earth elements in the silicon carbide crystal phase is 0.005-2.5 wt%. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述稀土元素选自镧系元素、钪和钇中的至少一种。The rare earth element-doped silicon carbide powder according to claim 1, wherein the rare earth element is selected from at least one of lanthanides, scandium and yttrium. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述稀土元素选自铈、镧、镨、钕、钪和钇中的至少一种。The rare earth element-doped silicon carbide powder according to claim 1, wherein the rare earth element is selected from at least one of cerium, lanthanum, praseodymium, neodymium, scandium and yttrium. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述掺杂稀土元素的碳化硅粉料的纯度不低于99.99%。The rare earth element-doped silicon carbide powder according to claim 1, wherein the purity of the rare earth element-doped silicon carbide powder is not less than 99.99%. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述掺杂稀土元素的碳化硅粉料的纯度不低于99.999%。The rare earth element-doped silicon carbide powder according to claim 1, wherein the purity of the rare earth element-doped silicon carbide powder is not less than 99.999%. 根据权利要求1所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述稀土元素的硅化物通过以下制备方法获得:将含稀土元素物质与高纯硅粉进行高温反应,即得。The rare-earth element-doped silicon carbide powder according to claim 1, wherein the rare-earth element silicide is obtained by the following preparation method: performing a high-temperature reaction between a rare-earth element-containing substance and high-purity silicon powder to obtain . 根据权利要求8所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述含稀土元素物质的纯度不低于99.99%,所述含稀土元素物质为粒径不大于100μm的固体粉末。The rare earth element-doped silicon carbide powder according to claim 8, wherein the purity of the rare earth element-containing material is not less than 99.99%, and the rare earth element-containing material is a solid powder with a particle size of not more than 100 μm . 根据权利要求8所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述含稀土元素物质为稀土元素的氧化物。The rare earth element-doped silicon carbide powder according to claim 8, wherein the rare earth element-containing substance is an oxide of a rare earth element. 根据权利要求8所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述含稀土元素物质中的稀土元素与高纯硅粉的摩尔比为1:2~4。The rare earth element-doped silicon carbide powder according to claim 8, wherein the molar ratio of the rare earth element in the rare earth element-containing substance to the high-purity silicon powder is 1:2-4. 根据权利要求8所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述高温反应的条件为:将含稀土元素物质与高纯硅粉在真空条件下,温度1400~1800℃,反应1~5h。The silicon carbide powder doped with rare earth elements according to claim 8, characterized in that, the conditions for the high temperature reaction are as follows: the rare earth element-containing material and the high-purity silicon powder are subjected to vacuum conditions at a temperature of 1400-1800° C. The reaction is carried out for 1 to 5 hours. 根据权利要求8所述的掺杂稀土元素的碳化硅粉料,其特征在于,所述高温反应的条件为:将含稀土元素物质与高纯硅粉在压力不高于10 -2Pa,温度1500~1600℃,反应2~4h。 The rare earth element-doped silicon carbide powder according to claim 8, wherein the conditions for the high temperature reaction are: the rare earth element-containing material and the high-purity silicon powder are subjected to a pressure not higher than 10 -2 Pa, a temperature of 1500~1600℃, reaction 2~4h.
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Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3953579A (en) * 1974-07-02 1976-04-27 Cabot Corporation Methods of making reactive metal silicide
CN1769181A (en) * 2004-11-03 2006-05-10 中国科学院半导体研究所 Single-phase gadolinium silicon compound and preparation method
CN101357763A (en) * 2007-07-31 2009-02-04 沈阳大学 Preparation method of high-purity ultrafine SiC powder
CN103467101A (en) * 2012-06-08 2013-12-25 赵钧永 Rare earth green silicon carbide, application thereof and rare earth green silicon carbide abrasive grinding tool
US20170057879A1 (en) * 2015-08-28 2017-03-02 Rolls-Royce High Temperature Composites, Inc. Ceramic Matrix Composite Including Silicon Carbide Fibers In a Ceramic Matrix Comprising a Max Phase Compound
CN109722712A (en) * 2019-03-12 2019-05-07 广州南砂晶圆半导体技术有限公司 A kind of method of the Uniform Doped of SiC single crystal metal impurities
CN110377613A (en) * 2019-07-23 2019-10-25 昆明理工大学 Method that is a kind of while preparing high-purity silicide and eutectic silica-base material
CN111270304A (en) * 2020-03-27 2020-06-12 江苏超芯星半导体有限公司 Method for preparing 4H silicon carbide single crystal
CN111892055A (en) * 2020-06-30 2020-11-06 山东天岳先进材料科技有限公司 Silicon carbide powder doped with rare earth elements and preparation method thereof
CN111908472A (en) * 2020-06-30 2020-11-10 山东天岳先进材料科技有限公司 Silicon carbide powder doped with rare earth elements and preparation method and application thereof

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3953579A (en) * 1974-07-02 1976-04-27 Cabot Corporation Methods of making reactive metal silicide
CN1769181A (en) * 2004-11-03 2006-05-10 中国科学院半导体研究所 Single-phase gadolinium silicon compound and preparation method
CN101357763A (en) * 2007-07-31 2009-02-04 沈阳大学 Preparation method of high-purity ultrafine SiC powder
CN103467101A (en) * 2012-06-08 2013-12-25 赵钧永 Rare earth green silicon carbide, application thereof and rare earth green silicon carbide abrasive grinding tool
US20170057879A1 (en) * 2015-08-28 2017-03-02 Rolls-Royce High Temperature Composites, Inc. Ceramic Matrix Composite Including Silicon Carbide Fibers In a Ceramic Matrix Comprising a Max Phase Compound
CN109722712A (en) * 2019-03-12 2019-05-07 广州南砂晶圆半导体技术有限公司 A kind of method of the Uniform Doped of SiC single crystal metal impurities
CN110377613A (en) * 2019-07-23 2019-10-25 昆明理工大学 Method that is a kind of while preparing high-purity silicide and eutectic silica-base material
CN111270304A (en) * 2020-03-27 2020-06-12 江苏超芯星半导体有限公司 Method for preparing 4H silicon carbide single crystal
CN111892055A (en) * 2020-06-30 2020-11-06 山东天岳先进材料科技有限公司 Silicon carbide powder doped with rare earth elements and preparation method thereof
CN111908472A (en) * 2020-06-30 2020-11-10 山东天岳先进材料科技有限公司 Silicon carbide powder doped with rare earth elements and preparation method and application thereof

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