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WO2019181110A1 - Solid-state imaging element, imaging device, and control method for solid-state imaging element - Google Patents

Solid-state imaging element, imaging device, and control method for solid-state imaging element Download PDF

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Publication number
WO2019181110A1
WO2019181110A1 PCT/JP2018/046093 JP2018046093W WO2019181110A1 WO 2019181110 A1 WO2019181110 A1 WO 2019181110A1 JP 2018046093 W JP2018046093 W JP 2018046093W WO 2019181110 A1 WO2019181110 A1 WO 2019181110A1
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Prior art keywords
signal
pixel
ramp
solid
state imaging
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French (fr)
Japanese (ja)
Inventor
隆 細江
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Sony Semiconductor Solutions Corp
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Sony Semiconductor Solutions Corp
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Definitions

  • the present technology relates to a solid-state imaging device, an imaging apparatus, and a control method for the solid-state imaging device.
  • the present invention relates to a solid-state imaging device, an imaging apparatus, and a control method for the solid-state imaging device that convert an analog signal into a digital signal for each column.
  • an ADC Analog-to-Digital Converter
  • a solid-state imaging device has been proposed in which an ADC performs AD (Analog-to-Digital) conversion of the reset level and signal level of an analog pixel signal a plurality of times for each pixel, and a subsequent circuit adds and averages them (for example, see Patent Document 1.)
  • AD Analog-to-Digital
  • Patent Document 1 a single slope type ADC provided with a comparator and a counter is used.
  • the comparator compares the ramp signal having the slope with the pixel signal, and the counter counts the count value over a period until the comparison result is inverted. Since sampling and AD conversion are executed every cycle of the ramp signal, the frequency of the ramp signal matches the sampling frequency.
  • the reading speed can be maintained, but in particular, it is necessary to make the slope of the ramp signal steep in order to perform AD conversion on a high-intensity signal, and the resolution of AD conversion decreases, The image quality may be degraded.
  • the above-described conventional technique has a problem that it is difficult to improve the image quality while maintaining the reading speed.
  • the present technology has been developed in view of such a situation, and an object of the present technology is to improve image quality while maintaining a reading speed in a solid-state imaging device provided with an analog-digital converter.
  • the present technology has been made to solve the above-described problems, and a first aspect thereof includes a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to a signal level of a pixel signal, and the ramp signal.
  • a solid-state imaging device including a comparator that compares the pixel signal with the pixel signal and outputs a comparison result, and a counter that counts a count value over a period until the comparison result is inverted, and a control method thereof is there. As a result, the ramp signal having a frequency corresponding to the signal level of the pixel signal is compared with the pixel signal.
  • the ramp signal supply unit may supply the ramp signal having a lower frequency as the signal level is lower.
  • the lower the signal level of the pixel signal, the lower the frequency of the ramp signal and the pixel signal are compared.
  • the ramp signal supply unit detects whether or not the signal level is higher than a predetermined threshold and outputs a detection result, and the frequency differs based on the detection result.
  • a selector that selects any one of a plurality of ramp signals and supplies the selected ramp signal to the comparator may be provided. This brings about the effect that one of the plurality of ramp signals is selected based on whether the signal level of the pixel signal is higher than a predetermined threshold value.
  • the predetermined threshold value is one
  • the selector selects one of two ramp signals having different frequencies
  • the detector includes one of the two ramp signals.
  • a latch circuit that holds the comparison result as a hold value when a specific timing corresponding to the predetermined threshold value has passed within a lower frequency cycle, and generates the detection result based on the hold value and And a logic gate that outputs to the selector.
  • the detection result is generated by the latch circuit and the logic gate.
  • the predetermined threshold includes two different thresholds, the selector selects one of three ramp signals having different frequencies, and the detector includes the plurality of ramp signals.
  • a first latch circuit that holds the comparison result when a first timing corresponding to one of the two threshold values has elapsed within a cycle of the ramp signal having the lowest frequency as a first hold value;
  • a second latch circuit that holds the comparison result when the second timing corresponding to the other of the two threshold values has elapsed within a cycle as a second hold value; and the first and second hold values
  • a logic gate that generates the detection result based on the output and outputs the detection result to the selector.
  • the detection result is generated by the first and second latch circuits and the logic gate.
  • the detector can detect whether the signal level is higher than the predetermined threshold based on the count value. This brings about the effect
  • the detector may compare the bias voltage indicating the predetermined threshold with the pixel signal and output the comparison result as the detection result. As a result, the detection result is generated by comparison with the bias voltage.
  • a division circuit that divides the count value by a larger divisor as the frequency of the selected ramp signal is higher may be further provided. This brings about the effect
  • the first aspect further includes a setting unit that sets a maximum value of the number of samplings for each pixel based on a statistic of the level of the light-shielded pixel signal from each of the plurality of light-shielded pixels that are shielded from light.
  • the pixel signal may include an effective pixel signal from each of a plurality of effective pixels that are not shielded from light and the light-shielded pixel signal. This brings about the effect that the maximum value of the number of times of sampling for each pixel is set based on the level statistics of the light-shielded pixel signal.
  • a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to a signal level of a pixel signal, and a comparison that compares the ramp signal with the pixel signal and outputs a comparison result.
  • An imaging apparatus comprising: a counter; a counter that counts a count value over a period until the comparison result is inverted; and a recording unit that records image data generated from the count value.
  • FIG. 6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is high in the first embodiment of the present technology.
  • 7 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is low in the first embodiment of the present technology.
  • 6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is high and the number of sampling times is a maximum of 4 times according to the first embodiment of the present technology.
  • 6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is low and the number of sampling times is a maximum of 4 times in the first embodiment of the present technology.
  • 6 is a flowchart illustrating an example of the operation of the solid-state imaging element according to the first embodiment of the present technology. It is a block diagram showing an example of 1 composition of a solid-state image sensing device in a 2nd embodiment of this art. It is a block diagram which shows one structural example of the sampling frequency setting part in the 2nd Embodiment of this technique. It is a figure showing an example of setting of the number of times of sampling in a 2nd embodiment of this art.
  • 12 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is the highest in the third embodiment of the present technology.
  • 14 is a timing chart illustrating an example of an operation of a solid-state imaging device when a signal level is an intermediate value according to the third embodiment of the present technology.
  • 14 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is the lowest in the third embodiment of the present technology.
  • First Embodiment Example of supplying a ramp signal having a frequency corresponding to a signal level
  • Second Embodiment Example in which the maximum number of samplings is set based on the statistic of the light-shielded pixel signal and a ramp signal having a frequency corresponding to the level is supplied
  • Third Embodiment Example of supplying one of three ramp signals having different frequencies according to the signal level
  • Fourth Embodiment Example in which a count value is monitored and a ramp signal having a frequency according to the signal level is supplied
  • Fifth Embodiment Example of supplying a ramp signal having a frequency corresponding to a signal level based on a comparison result with a bias voltage
  • FIG. 1 is a block diagram illustrating a configuration example of the imaging apparatus 100 according to the first embodiment of the present technology.
  • the imaging apparatus 100 captures image data and includes an imaging lens 110, a solid-state imaging device 200, a recording unit 120, and an imaging control unit 130.
  • an imaging device 100 for example, a smartphone, a digital camera, a personal computer, an in-vehicle camera, and an IoT (Internet of Things) camera are assumed.
  • the imaging lens 110 collects incident light and guides it to the solid-state imaging device 200.
  • the solid-state imaging device 200 captures image data according to the control of the imaging control unit 130.
  • the solid-state imaging device 200 supplies captured image data to the recording unit 120 via a signal line 209.
  • the recording unit 120 records image data.
  • the imaging control unit 130 controls the solid-state imaging device 200 to capture image data.
  • the imaging control unit 130 supplies a control signal including the vertical synchronization signal VSYNC to the solid-state imaging device 200 via the signal line 139.
  • the vertical synchronization signal VSYNC is a periodic signal having a constant frequency (30 Hz or the like) indicating the imaging timing of image data.
  • the imaging apparatus 100 may further include an interface, and may transmit image data to the outside through the interface, or may further include a display unit and display the image data on the display unit.
  • FIG. 2 is a block diagram illustrating a configuration example of the solid-state imaging device 200 according to the first embodiment of the present technology.
  • the solid-state imaging device 200 includes a vertical scanning circuit 210, a pixel array unit 220, and a DAC (Digital to Analog Converter) 230.
  • the solid-state imaging device 200 includes a read current control unit 240, a timing control circuit 250, a column signal processing unit 300, and a horizontal scanning circuit 260.
  • a plurality of pixels 221 are arranged in a two-dimensional grid.
  • a set of pixels 221 arranged in the horizontal direction is referred to as “row”, and a set of pixels 221 arranged in the direction perpendicular to the row is referred to as “column”.
  • the vertical scanning circuit 210 drives the rows in order under the control of the timing control circuit 250 and outputs an analog pixel signal to each of the pixels 221 in the row.
  • the DAC 230 generates a plurality of ramp signals having different frequencies by performing DA (Digital-to-Analog) conversion on the digital signal from the timing control circuit 250.
  • the ramp signal is a sawtooth waveform periodic signal, and sampling of the pixel signal and AD conversion are executed each time the period of the ramp signal elapses.
  • the read current control unit 240 supplies the pixel 221 with an operation current for reading a pixel signal.
  • the timing control circuit 250 controls the operation timing of the vertical scanning circuit 210, the DAC 230, the column signal processing unit 300, and the horizontal scanning circuit 260 in synchronization with the vertical synchronization signal VSYNC.
  • the column signal processing unit 300 performs various signal processing including AD conversion processing on the pixel signal for each column.
  • the column signal processing unit 300 outputs the image data after the signal processing to the recording unit 120.
  • the horizontal scanning circuit 260 sequentially outputs pixel signals for each column after AD conversion.
  • FIG. 3 is a block diagram illustrating a configuration example of the column signal processing unit 300 according to the first embodiment of the present technology.
  • the column signal processing unit 300 includes an AD converter 310 and a memory 350 for each column. When the number of columns is M (M is an integer), M AD converters 310 and M memories 350 are provided.
  • the column signal processing unit 300 includes a sense amplifier 360, a digital operation unit 370, and an interface unit 380.
  • the AD converter 310 converts an analog signal into a digital signal.
  • An analog pixel signal Vin from the corresponding column is input to the AD converter 310, and the AD converter 310 converts the pixel signal Vin into digital pixel data Dout. Then, the AD converter 310 holds the pixel data Dout in the corresponding memory 350.
  • Memory 350 holds pixel data Dout.
  • the memory 350 outputs the held pixel data Dout to the sense amplifier 360 according to the control of the horizontal scanning circuit 260.
  • the sense amplifier 360 amplifies the pixel data Dout and supplies it to the digital operation unit 370.
  • the digital operation unit 370 performs predetermined signal processing on the pixel data Dout.
  • the digital operation unit 370 supplies the processed pixel data to the interface unit 380.
  • the digital calculation unit 370 performs HDR (High Dynamic Range) composition processing and image plane phase difference detection processing as necessary.
  • the former HDR synthesizing process is a process for synthesizing a plurality of pixel data having different exposure times to expand the dynamic range.
  • the latter image plane phase difference detection processing is processing for obtaining a phase difference by obtaining a phase difference between two images based on pixel data from a plurality of phase difference pixels.
  • a phase difference pixel for detecting the phase difference and other normal pixels are arranged in the pixel array unit 220. Then, the ramp signal is switched according to the luminance for each of the phase difference pixel and the normal pixel.
  • the interface unit 380 supplies image data including pixel data to the recording unit 120.
  • FIG. 4 is a block diagram illustrating a configuration example of the timing control circuit 250 and the AD converter 310 according to the first embodiment of the present technology.
  • the timing control circuit 250 includes a timing generator 251 and a clock generator 252.
  • the AD converter 310 includes a selector 311, a comparator 312, a counter 313, a division circuit 314, and a detector 320.
  • the timing generator 251 generates the trigger signal TRG for each AD conversion within the period of the vertical synchronization signal VSYNC and supplies it to the detector 320. For example, when the number of rows is M and AD conversion of the reset level and the signal level is performed for each row, the trigger signal TRG is generated M ⁇ 2 times for each period of the vertical synchronization signal VSYNC.
  • the clock generator 252 generates a predetermined clock signal CLK having a frequency higher than that of the vertical synchronization signal VSYNC and supplies it to the counter 313 over the AD conversion period.
  • the clock signal CLK is generated by multiplying the vertical synchronization signal VSYNC.
  • Ramp signals RMPH and RMPL from the DAC 230 are input to the selector 311.
  • the ramp signal RMPH is a signal having a higher frequency than the ramp signal RMPL.
  • the selector 311 selects one of the ramp signals RMPH and RMPL based on the detection result DET from the detector 320 and supplies the selected signal to the comparator 312 as the ramp signal RMPS.
  • the comparator 312 compares the ramp signal RMPS with the pixel signal Vin.
  • the comparator 312 supplies the comparison result CMP_OUT to the counter 313 and the detector 320.
  • the counter 313 counts the count value in synchronization with the clock signal CLK over a period until the comparison result CMP_OUT is inverted.
  • the counter 313 supplies the count value CNT to the division circuit 314.
  • the division circuit 314 divides the count value CNT according to the enable signal CAL_EN from the detector 320.
  • the enable signal CAL_EN is a signal for instructing whether or not to perform division. For example, “1” is set when division is performed, and “0” is set when division is not performed.
  • the division circuit 314 divides the signal level count value CNT by a larger divisor as the frequency of the selected ramp signal is higher, performs CDS processing, and supplies the pixel data Dout to the memory 350. .
  • the division circuit 314 performs CDS processing without dividing the signal level count value CNT and supplies the pixel data Dout to the memory 350.
  • the detector 320 detects whether or not the level of the pixel signal Vin is higher than a predetermined threshold value.
  • a predetermined threshold value when the pixel 221 generally converts light into electrons by photoelectric conversion, the level of the pixel signal Vin decreases as the luminance increases. For this reason, when the level of the pixel signal Vin is equal to or lower than the threshold, the luminance of the light received by the pixel 221 corresponding to the pixel signal is equal to or higher than the predetermined luminance corresponding to the threshold. On the other hand, when the level of the pixel signal Vin is higher than the threshold value, the luminance of the light received by the pixel 221 corresponding to the pixel signal is lower than the predetermined luminance.
  • the detector 320 generates a detection result DET indicating whether the signal level of the pixel signal Vin is higher than a predetermined threshold (in other words, whether the luminance is lower than the predetermined luminance) and supplies the detection result DET to the selector 311.
  • the detector 320 also supplies the same signal as the detection result DET to the division circuit 314 as the enable signal CAL_EN.
  • the selector 311 selects the ramp signal RMPL having a low frequency when the detection result DET indicates that the luminance is equal to or higher than the predetermined luminance, and selects the ramp signal RMPH when the detection result DET indicates that the luminance is lower than the predetermined luminance. To do.
  • the operation of the detector 320 and the selector 311 supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal Vin.
  • the circuit including the detector 320 and the selector 311 is an example of a ramp signal supply unit described in the claims.
  • the frequency of the ramp signal RMPS is the same as the sampling frequency.
  • the higher the frequency of the ramp signal (sampling frequency) the greater the number of samplings per pixel, so that random noise can be reduced by averaging each sampled signal.
  • the lower the luminance the worse the SNR (Signal-Noise (Ratio) (because noise appears to be large), so the high-frequency ramp signal RMPH is suitable for AD conversion for the pixel signal Vin of a pixel with low luminance.
  • the lower the frequency of the ramp signal (sampling frequency), the smaller the number of samplings per pixel, so the effect of reducing random noise becomes smaller.
  • the amplitude increases as the sampling frequency is lowered, the AD conversion can be performed without overflow of the counter 313 even if the luminance is high.
  • the low-frequency ramp signal RMPL is suitable for AD conversion for the pixel signal Vin of a pixel with high luminance.
  • the selector 311 selects the low-frequency lamp signal RMPL suitable for high luminance when the luminance of the pixel is equal to or higher than the predetermined luminance, and selects the high-frequency lamp suitable for low luminance when the luminance is lower than the predetermined luminance.
  • the signal RMPH is selected.
  • the division circuit 314 is arrange
  • the division circuit 314 can also be arranged in a circuit subsequent to the AD converter 310 (such as a digital arithmetic unit 370).
  • the image quality can be improved by increasing the number of times of sampling for each pixel without changing the sampling frequency. However, this is not preferable because the reading speed decreases instead of improving the image quality.
  • the slope of the ramp signal is made steeper in the case of high luminance than in the case of low luminance, the amplitude can be increased without changing the reading speed, and AD conversion can be performed without overflowing the high luminance signal level. .
  • this is not preferable because the resolution of AD conversion is lowered.
  • FIG. 5 is a circuit diagram illustrating a configuration example of the detector 320 according to the first embodiment of the present technology.
  • the detector 320 includes a latch circuit 321 and an inverter 322.
  • the latch circuit 321 holds the comparison result CMP_OUT at the timing indicated by the trigger signal TRG from the timing generator 251.
  • the latch circuit 321 supplies the hold value to the inverter 322.
  • the latch circuit 32 for example, a gated D latch is used.
  • the comparison result CMP_OUT is input to the data input terminal D of the latch circuit 321, and the trigger signal TRG is input to the enable terminal E.
  • the output terminal Q is connected to the inverter 322.
  • the inverter 322 inverts the hold value of the latch circuit 321 and supplies it to the selector 311 as the detection result DET. Further, the inverter 322 supplies the inverted value to the division circuit 314 as the enable signal CAL_EN.
  • the inverter 322 is an example of a logic gate described in the claims.
  • FIG. 6 is a diagram illustrating an example of the operation of the latch circuit 321 according to the first embodiment of the present technology.
  • the enable terminal E is at a low level, the previous held value Qprev is output.
  • the hold value When the data input terminal D is at a low level and the enable terminal E is at a high level, the hold value is reset and a logical value of “0” is output. When the data input terminal D and the enable terminal E are at the high level, the hold value is set and the logic value “1” is output.
  • FIG. 7 is a diagram illustrating an example of the operation of the selector 311 according to the first embodiment of the present technology.
  • the selector 311 selects the low-frequency ramp signal RMPL corresponding to high luminance.
  • the selector 311 selects the high-frequency ramp signal RMPH corresponding to low luminance.
  • FIG. 8 is a diagram illustrating an example of the operation of the divider circuit 314 according to the first embodiment of the present technology.
  • the division circuit 314 performs CDS processing without dividing the count value CNT of the signal level and outputs the pixel data Dout when the enable signal CAL_EN is at a low level, that is, when the pixel has high luminance.
  • the enable signal CAL_EN is at a high level, that is, when the pixel has a low luminance
  • the division circuit 314 divides the count value CNT of the signal level by the number of samplings for each pixel, performs CDS processing, and outputs the pixel data Dout. Output.
  • FIG. 9 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is high according to the first embodiment of the present technology.
  • the vertical scanning circuit 210 exposes the first row at timings T2 to T4, and drives the rows at timings T4 to T5. At the timings T4 to T5, the pixel signals in the first row are read out.
  • the vertical scanning circuit 210 exposes the second row at timings T3 to T5, and drives the rows at timings T5 to T6. At the timings T5 to T6, the pixel signals in the second row are read out.
  • the third and subsequent rows are sequentially exposed and read out. In this way, the data is sequentially read out line by line by a so-called rolling shutter system.
  • the selector 311 selects, for example, the high-frequency ramp signal RMPH for low luminance and outputs it as the ramp signal RMPS.
  • the ramp signal RMPS (RMPH) decreases at a constant speed during the period from the timing T11 to T13, returns to the original level, and decreases again during the period from the timing T14 to T16. Further, the ramp signal RMPS decreases at a constant speed within the period of timing T17 to T20, returns to the original level, and decreases again during the period of timing T21 to T23.
  • the frequency of the high-frequency ramp signal RMPH is (Mult_num ⁇ 2) / (t ⁇ ) where t is the readout time of one row, N is the number of rows, and Max_num is the maximum number of sampling times of the reset level and signal level. N) Hertz.
  • the low-frequency ramp signal RMPL has the same reset level sampling frequency as the ramp signal RMPH, and the signal level sampling frequency is less than the ramp signal RMPH.
  • the vertical scanning circuit 210 initializes the pixels 221 in the row immediately before the end of the exposure of the row. At the end of exposure, the vertical scanning circuit 210 transfers charges within the pixel.
  • the pixel signal Vin at the time of initialization corresponds to the aforementioned reset level
  • the pixel signal Vin at the time of charge transfer corresponds to the signal level.
  • the alternate long and short dash line in the figure indicates the fluctuation of the pixel signal Vin.
  • the reset level is output, and the signal level is output immediately after the timing T16. When the luminance of the pixel is low, a relatively high signal level is output.
  • the comparator 312 compares the reset level with the high-frequency ramp signal RMPS and outputs a comparison result CMP_OUT. This comparison result CMP_OUT is inverted at each of timings T12, 15, 19 and 22, for example.
  • the timing control circuit 250 internally generates an enable signal CMP_EN in order to generate the trigger signal TRG.
  • the enable signal CMP_EN is at a high level over a period from timing T17 to T20, which is a first sampling period of the signal level, for example.
  • the timing control circuit 250 generates and outputs a trigger signal TRG at the timing T20 when the enable signal CMP_EN falls. This timing corresponds to a specific timing within the cycle of the low-frequency ramp signal RMPL.
  • the detector 320 latches the comparison result CMP_OUT when the trigger signal TRG is output.
  • the comparison result CMP_OUT is inverted at that time. For this reason, the low level is latched at timing T20, and a high level detection result DET obtained by inverting it is output.
  • the ramp signal is switched to a high frequency at timing T20.
  • the counter 313 counts the count value CNT in synchronization with the clock signal CLK at timings T11 to T12 until the comparison result CMP_OUT is inverted. Thereby, the first AD conversion with respect to the reset level is performed. Next, the count value CNT is similarly counted at timings T14 to T15 until the comparison result CMP_OUT is inverted. Thereby, the second AD conversion for the reset level is performed. Similarly, at timings T17 to T19 and timings T21 to T22, the first and second AD conversions for the signal level are performed.
  • the division circuit 314 divides each count value CNT of the reset level and the signal level by “2”.
  • the division circuit 314 performs CDS processing for obtaining a difference between the reset level after division and the signal level, and outputs the processed data as pixel data Dout.
  • the signal level is higher than the threshold corresponding to the timing of the trigger signal TRG (that is, the luminance is low)
  • a high-frequency ramp signal is selected.
  • the number of AD conversions for each pixel is increased, and random noise can be reduced by averaging each count value CNT.
  • the SN ratio can be improved by reducing the random noise, and the image quality can be improved.
  • FIG. 10 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is low according to the first embodiment of the present technology.
  • the selector 311 first selects the high-frequency ramp signal RMPH for low luminance and outputs it as the ramp signal RMPS.
  • the timing control circuit 250 outputs the trigger signal TRG at a specific timing T18 within the cycle of the low-frequency ramp signal RMPL.
  • the detector 320 latches the comparison result CMP_OUT when the trigger signal TRG is output.
  • the comparison result CMP_OUT is not inverted at the time of the trigger signal TRG and is at the high level. Therefore, the high level is latched at timing T18, and the low level detection result DET obtained by inverting the high level is output.
  • the ramp signal Since the detection result DET is at the low level, the ramp signal remains the low-frequency ramp signal RMPL at the timing T19.
  • the waveform of the selected ramp signal RMPS in the figure is the same as that of the low frequency ramp signal RMPL. As illustrated in the figure, the ramp signal RMPL is maintained constant at timings T18 to T19 at which frequency switching is determined. This is because it takes some time to complete the frequency switching by the selector 311.
  • the counter 313 counts the count value CNT at timings T11 to T12 and T14 to T15 until the comparison result CMP_OUT is inverted. Thereby, AD conversion for the reset level is performed twice. Similarly, the count value CNT is counted at timings T17 to T20. Thereby, AD conversion with respect to a signal level is performed only once.
  • the division circuit 314 performs CDS processing without dividing the signal level count value CNT, and outputs the result as pixel data Dout. On the other hand, the reset level count value CNT is divided by “2”.
  • the low-frequency ramp signal is selected.
  • the amplitude of the ramp signal can be increased and AD conversion can be performed without overflow in the case of high luminance. Therefore, the image quality can be improved.
  • the number of times of sampling for each pixel is reduced, in the case of high luminance, since the random noise is relatively small, the SN ratio is not deteriorated.
  • the division circuit 314 does not divide when a low-frequency ramp signal is selected, but division can also be performed at this time. For example, consider a case where AD conversion is performed twice for each pixel when the luminance is high, and AD conversion is performed four times for each pixel when the luminance is low. In this case, the division circuit 314 may divide by “2” when the luminance is high and divide by “4” when the luminance is low. Thus, the number of AD conversions for each pixel corresponding to the frequency of the ramp signal is set as the divisor.
  • the AD converter 310 adaptively switches the ramp signal according to the luminance of the pixel, so that the image quality of the image data can be improved while maintaining the reading speed. .
  • FIG. 11 is a timing chart showing an example of the operation of the solid-state imaging device when the signal level is high and the number of sampling times is a maximum of 4 times in the first embodiment of the present technology.
  • FIG. 12 is a timing chart showing an example of the operation of the solid-state imaging device when the signal level in the first embodiment of the present technology is low and the number of samplings is a maximum of four times.
  • the maximum number of times of sampling for each pixel is two, but the number of times of sampling is not limited to two.
  • the number of samplings per pixel can be set to a maximum of four times.
  • FIG. 13 is a flowchart illustrating an example of the operation of the solid-state imaging device 200 according to the first embodiment of the present technology. This operation is started, for example, when a predetermined application for capturing image data is executed.
  • the vertical scanning circuit 210 selects and drives a row (step S901).
  • the detector 320 in the AD converter 310 monitors the comparison result CMP_OUT and determines whether or not the luminance of the pixel is higher than a predetermined luminance (step S902).
  • step S902 Yes
  • the selector 311 selects a low-frequency ramp signal for high luminance, and the AD converter 310 performs AD conversion for the signal level once for each pixel (step S903).
  • the selector 311 selects a high-frequency ramp signal for low luminance, and the AD converter 310 performs AD conversion on the signal level for each pixel. This is performed twice (step S904). Then, the AD converter 310 divides the count value of the signal level (step S905).
  • step S906 determines whether all rows have been selected (step S906). When all the rows have not been selected (Step S906: No), the vertical scanning circuit 210 repeatedly executes Step S901 and the subsequent steps. On the other hand, when all the rows have been selected (step S906: Yes), the operation for capturing image data is terminated. When a plurality of pieces of image data are continuously captured, the processes in steps S901 to S906 are repeatedly executed in synchronization with the vertical synchronization signal VSYNC.
  • the selector 311 selects and supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal.
  • the AD conversion can be performed a number of times according to the luminance of the pixel. For example, as the luminance of the pixel is lower, the number of AD conversions can be increased to reduce random noise. Thereby, it is possible to improve the image quality while maintaining the reading speed.
  • the maximum value of the number of sampling (ie, AD conversion) for each pixel is fixed to 2 or the like.
  • the solid-state imaging device 200 according to the second embodiment is different from the first embodiment in that the maximum value of the number of times of sampling is changed based on a pixel signal of an OPB (OPtical Black) pixel.
  • OPB optical Black
  • FIG. 14 is a block diagram illustrating a configuration example of the solid-state imaging device 200 according to the second embodiment of the present technology.
  • the solid-state imaging device 200 of the second embodiment is different from the first embodiment in that it further includes a sampling number setting unit 270.
  • the pixel array unit 220 is different from the first embodiment in that a plurality of OPB pixels 222 and a plurality of normal pixels 223 are arranged in a two-dimensional lattice pattern.
  • the OPB pixel 222 is a pixel that is shielded from light, and the normal pixel 223 is a pixel that is not shielded from light.
  • the pixel signal from the OPB pixel 222 is referred to as a “light-shielded pixel signal”, and the pixel signal from the normal pixel 223 is referred to as a “normal pixel signal”.
  • the OPB pixel 222 is an example of a light-shielding pixel described in the claims.
  • the sampling number setting unit 270 sets the maximum number of sampling times for each pixel based on the light-shielded pixel signal from the OPB pixel 222.
  • the sampling number setting unit 270 supplies the set value to the timing control circuit 250.
  • the timing control circuit 250 supplies the DAC 230 with a ramp signal RMPH having a frequency corresponding to the set value of the number of samplings.
  • the sampling number setting unit 270 is an example of a setting unit described in the claims.
  • FIG. 15 is a block diagram illustrating a configuration example of the sampling number setting unit 270 according to the second embodiment of the present technology.
  • the sampling number setting unit 270 includes an OPB variance calculation unit 271, an OPB average calculation unit 272, a weighting factor acquisition unit 273, a sampling number determination unit 274, a threshold calculation unit 275, an upper limit number acquisition unit 276, and a register 277.
  • the OPB average calculator 272 calculates an average Pix_ave of the light-shielded pixel signal PIX_OPB of each of the plurality of OPB pixels 222. This average Pix_ave is calculated by the following equation, for example.
  • the OPB average calculation unit 272 supplies the calculation result to the OPB variance calculation unit 271 and the weight coefficient acquisition unit 273. In the above equation, N is the number of OPB pixels 222.
  • the OPB variance calculation unit 271 calculates the variance Pix_dev of each light-shielded pixel signal PIX_OPB of the plurality of OPB pixels 222. This variance Pix_dev is calculated by the following equation, for example.
  • the OPB variance calculation unit 271 supplies the weighting coefficient acquisition unit 273.
  • the register 277 holds various set values required for the calculation of the number of samplings.
  • the register 277 holds an average maximum threshold Th_ave_max, an average minimum threshold Th_ave_min, a variance maximum threshold Th_dev_max, and a variance minimum threshold Th_dev_min.
  • the average maximum threshold Th_ave_max is a maximum value of the threshold compared with the average Pix_ave.
  • the average minimum threshold Th_ave_min is a minimum value of the threshold compared with the average Pix_ave.
  • the variance maximum threshold Th_dev_max is the maximum value of the threshold compared with the variance Pix_dev.
  • the minimum variance threshold Th_dev_min is a minimum threshold value to be compared with the variance Pix_dev.
  • a value proportional to the gain Pix_gain for the pixel signal is set as the threshold value to be compared with the average or variance. For this reason, the maximum threshold is set when the gain is maximum, and the minimum threshold is set when the gain is minimum.
  • the register 277 holds a sampling number upper limit value Multi_max_num for AD conversion of the pixel signal for each quantization bit number.
  • a sampling number upper limit value Multi_max_num for AD conversion of the pixel signal for each quantization bit number.
  • the sampling number upper limit Mult_max_12 when the number of quantization bits is 12 bits and the sampling number upper limit Mult_max_10 when the number of quantization bits is 10 bits are held.
  • a larger upper limit value is set as the number of quantization bits is larger.
  • the upper limit number acquisition unit 276 reads the sampling number upper limit value Multi_max_num corresponding to the quantization bit number Multi_bit_num specified by the imaging control unit 130 from the register 277.
  • the upper limit number acquisition unit 276 supplies the read sampling number upper limit value Multi_max_num to the sampling number determination unit 274.
  • the threshold value calculation unit 275 calculates a threshold value corresponding to the gain Pix_gain specified by the imaging control unit 130. For example, the threshold value calculation unit 275 reads the average maximum threshold value Th_ave_max and the average minimum threshold value Th_ave_min from the register 277, and calculates the average threshold value Th_ave corresponding to the gain Pix_gain by linear interpolation. Further, the threshold calculation unit 275 reads the maximum variance threshold Th_dev_max and the minimum variance threshold Th_dev_min from the register 277, and calculates the variance threshold Th_dev corresponding to the gain Pix_gain by linear interpolation. Then, the threshold calculation unit 275 supplies the calculated average threshold Th_ave and variance threshold Th_dev to the weight coefficient acquisition unit 273.
  • the weighting coefficient acquisition unit 273 obtains the weighting coefficient Mult_wegiht based on the average Pix_ave and the variance Pix_dev, and the average threshold Th_ave and the variance threshold Th_dev.
  • the weight coefficient acquisition unit 273 determines whether or not the following expression is established. Pix_ave> Th_ave Equation 1 Pix_dev> Th_dev Equation 2
  • the weighting factor acquisition unit 273 sets “1” to the weighting factor Multi_weigh.
  • the weighting factor acquisition unit 273 sets “2” to the weighting factor Multi_weight. Then, the weight coefficient acquisition unit 273 supplies the obtained weight coefficient Multi_weight to the sampling number determination unit 274.
  • the sampling number determination unit 274 determines the sampling number Mult_num based on the sampling number upper limit value Multi_max_num and the weighting coefficient Mult_weight. For example, the sampling number determination unit 274 determines whether or not the following expression holds. (Mult_weight) 2 > Mult_max_num Expression 3
  • the sampling count determination unit 274 sets the sampling count upper limit value Multi_max_num as the sampling count Multit_num. On the other hand, when Expression 3 is not satisfied, the sampling number determination unit 274 sets the square of the weighting coefficient Multi_weight as the sampling number Multi_num. The sampling number determination unit 274 supplies the obtained sampling number Mult_num to the timing control circuit 250 as the maximum value of the sampling number.
  • the timing control circuit 250 causes the DAC 230 to generate a ramp signal having a frequency corresponding to the sampling count Mult_num as a ramp signal RMPH having a higher frequency.
  • FIG. 16 is a diagram illustrating a setting example of the number of times of sampling in the second embodiment of the present technology. For example, when the sampling count upper limit value Multi_max_num is “4” and the weighting factor Multi_weight is “0”, “1” is set as the sampling count Mult_num. In addition, when the sampling number upper limit value Multi_max_num is “4” and the weighting factor Multi_weight is “1”, “2” is set as the sampling number Multi_num.
  • the solid-state imaging device 200 changes the maximum value of the number of times of sampling based on the statistic of the light-shielded pixel signal, so that the noise level estimated from the OPB pixel is used. Sampling can be performed by the number of times.
  • the selector 311 switches the frequency of the ramp signal in two steps depending on whether the signal level of the pixel signal is higher than the threshold value.
  • the switched frequency may be too high or too low, and the image quality may not be sufficiently improved by the two-stage switching.
  • the solid-state imaging device 200 of the third embodiment is different from the first embodiment in that the selector 311 switches the frequency of the ramp signal in three stages.
  • FIG. 17 is a block diagram illustrating a configuration example of the detector 320 according to the third embodiment of the present technology.
  • the detector 320 of the third embodiment differs from that of the first embodiment in that it further includes an AND (logical product) gate 323, a latch circuit 324, and an inverter 325.
  • the timing generator 251 according to the third embodiment generates trigger signals TRG1 and TRG2 that specify different timings. Then, the timing generator 251 supplies the trigger signal TRG1 to the latch circuit 321 and supplies the trigger signal TRG2 to the AND gate 323.
  • the AND gate 323 generates a logical product signal of the trigger signal TRG2 and the comparison result CMP_OUT and supplies it to the enable terminal E of the latch circuit 324.
  • the latch circuit 324 holds the comparison result CMP_OUT at the timing indicated by the signal from the AND gate 323.
  • the latch circuit 324 supplies the hold value to the inverter 325.
  • a gated D latch is used as the latch circuit 324. In the case of the gated D latch, the comparison result CMP_OUT is input to the data input terminal of the latch circuit 324, and the output terminal Q is connected to the inverter 325.
  • the inverter 325 inverts the value held in the latch circuit 324 and supplies the result to the selector 311 as the detection result DET2. Further, the inverter 322 of the third embodiment outputs the detection result DET1 to the selector 311. These inverted values are also supplied to the dividing circuit 314 as enable signals CAL_EN1 and CAL_EN2. Note that the inverters 322 and 325 are examples of logic gates recited in the claims.
  • FIG. 18 is a diagram illustrating an example of the operation of the selector 311 according to the third embodiment of the present technology.
  • the selector 311 further receives a ramp signal RMPM having a frequency intermediate between the ramp signals RMPH and RMPL.
  • the selector 311 selects the low-frequency ramp signal RMPL when the detection result DET2 is output.
  • the selector 311 selects the high-frequency ramp signal RMPH.
  • the selector 311 selects the ramp signal RMPM whose frequency is an intermediate frequency between the ramp signals RMPH and RMPL when the detection result DET1 is output.
  • the selector 311 switches the frequency of the ramp signal in three steps according to the luminance of the pixel.
  • FIG. 19 is a diagram illustrating an example of the operation of the divider circuit 314 according to the first embodiment of the present technology.
  • the division circuit 314 performs the CDS process without dividing the count value CNT of the signal level and outputs the pixel data Dout when both of the enable signals CAL_EN1 and CAL_EN2 are at the low level, that is, when the pixel has high luminance.
  • the division circuit 314 divides the count value CNT of the signal level by the number of samplings (for example, 4 times) for each pixel, CDS processing is performed to output pixel data Dout.
  • the division circuit 314 divides the signal level count value CNT by a predetermined number of samplings (such as twice) less than in the case of high luminance, performs CDS processing, and outputs pixel data Dout.
  • FIG. 20 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is the highest in the third embodiment of the present technology.
  • the timing control circuit 250 internally generates enable signals CMP_EN1 and CMP_EN2 in order to generate trigger signals TRG1 and TRG2. Then, the timing control circuit 250 generates the trigger signal TRG1 at the timing T15 when the enable signal CMP_EN1 falls. Further, the timing control circuit 250 generates the trigger signal TRG2 at the timing T16 when the enable signal CMP_EN2 falls.
  • These trigger signals TRG1 and TRG2 are timings within the cycle of the ramp signal RMPL having the lowest frequency, and these signals exhibit different threshold values. That is, two different thresholds are used for the signal level. Hereinafter, the higher one of the two thresholds related to the signal level is ThH, and the lower one is ThL.
  • the detector 320 latches the comparison result CMP_OUT when the trigger signals TRG1 and TRG2 are output.
  • the comparison result CMP_OUT is inverted at both time points of the trigger signals TRG1 and TRG2, and is at the low level. For this reason, the low level is latched at timing T15, and a high level detection result DET1 obtained by inverting the low level is output. Also at the timing T16, the low level is latched, and the high level detection result DET2 obtained by inverting the low level is output.
  • the ramp signal is switched to a low frequency at timings T15 and T16.
  • the waveform of the selected ramp signal RMPS in the figure is the same as that of the low frequency ramp signal RMPL. Based on this ramp signal, four AD conversions are performed on the signal level for each pixel, for example, for each pixel.
  • FIG. 21 is a timing chart illustrating an example of the operation of the solid-state imaging device 200 having the intermediate signal level according to the third embodiment of the present technology.
  • the signal level is an intermediate value higher than the threshold value ThL and lower than or equal to the threshold value ThH.
  • the low level detection result DET1 is output at timing T15
  • the high level detection result DET2 is output at timing T16. Since the detection result DET1 is at a low level, the ramp signal RMPM having an intermediate frequency is selected at timing T15. At timing T16, since the detection result DET2 is at the high level, the selection of the ramp signal RMPM is maintained. Based on this ramp signal, AD conversion is performed twice for each pixel, for example, for each pixel with respect to the signal level.
  • FIG. 22 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is the lowest in the third embodiment of the present technology.
  • a low level detection result DET2 is output at timing T15 and timing T16. Since the detection result DET1 is at a low level, the ramp signal RMPM having an intermediate frequency is selected at timing T15. At timing T16, since the detection result DET2 is at a low level, the ramp signal RMPL having the lowest frequency is selected. Based on this ramp signal, one AD conversion is performed on the signal level for each pixel, for example, for each pixel.
  • the selector 311 switches the frequency of the ramp signal in three steps based on the comparison result with two threshold values, but switches the frequency in four steps or more based on the comparison result with three or more threshold values. You can also. In this case, similarly, the lower the signal level of the pixel signal (that is, the higher the luminance), the lower the frequency of the ramp signal is selected.
  • the maximum value of the number of samplings can be set based on the statistic of the light-shielded pixel signal.
  • the selector 311 switches the frequency of the ramp signal in three steps based on the comparison result between the pixel signal and the two threshold values, so that the selector 311 switches the frequency of the ramp signal in two steps.
  • the frequency can be finely controlled. Thereby, the image quality of image data can be further improved.
  • the comparison result CMP_OUT is monitored by the detector 320 to detect whether or not the level of the pixel signal is higher than the threshold value, but the count value CNT is used instead of the comparison result CMP_OUT. It can also be monitored.
  • the detector of the fourth embodiment is different from that of the first embodiment in that it detects whether the signal level of the pixel signal is higher than a threshold value based on the count value CNT.
  • FIG. 23 is a block diagram illustrating a configuration example of the AD converter 310 according to the fourth embodiment of the present technology.
  • the AD converter 310 of the fourth embodiment is different from that of the first embodiment in that a detector 330 is provided instead of the detector 320.
  • the counter 313 of the fourth embodiment adds the count value CNT to the division circuit 314 and further outputs it to the detector 330.
  • the detector 330 compares the digital value when the analog threshold value is AD-converted with the count value CNT. Then, the detector 330 generates a detection result DET and an enable signal CAL_EN based on the comparison result.
  • the number of samplings can be set based on the statistic of the light-shielded pixel signal as in the second embodiment. Further, the frequency can be switched in three stages as in the third embodiment.
  • the detector 330 uses the comparison result CMP_OUT to detect whether the signal level of the pixel signal is higher than the threshold value based on the count value CNT.
  • the detection result DET can be generated without the need.
  • the detector 320 generates the detection result DET from the comparison result CMP_OUT using the latch circuit 321 and the inverter 322.
  • the detection result DET is generated without using the latch circuit 321 or the like. You can also The detector of the fifth embodiment is different from the first embodiment in that the detection result DET is generated by a comparator instead of the latch circuit 321.
  • FIG. 24 is a block diagram illustrating a configuration example of the AD converter 310 according to the fourth embodiment of the present technology.
  • the AD converter 310 according to the fourth embodiment differs from the first embodiment in that a detector 340 is provided instead of the detector 320.
  • a detector 340 is provided with a comparator 341.
  • the comparator 341 compares the bias voltage Vbias indicating the threshold value with the pixel signal Vin.
  • the comparator 341 outputs the comparison result as a detection result DET and an enable signal CAL_EN.
  • the maximum number of samplings can be set based on the statistic of the light-shielded pixel signal as in the second embodiment. Further, the frequency can be switched in three stages as in the third embodiment.
  • the detector 340 compares the bias voltage indicating the threshold with the pixel signal to generate the detection result DET.
  • the detection result DET can be generated without using it.
  • the technology according to the present disclosure can be applied to various products.
  • the technology according to the present disclosure is realized as a device that is mounted on any type of mobile body such as an automobile, an electric vehicle, a hybrid electric vehicle, a motorcycle, a bicycle, personal mobility, an airplane, a drone, a ship, and a robot. May be.
  • FIG. 25 is a block diagram illustrating a schematic configuration example of a vehicle control system that is an example of a mobile control system to which the technology according to the present disclosure can be applied.
  • the vehicle control system 12000 includes a plurality of electronic control units connected via a communication network 12001.
  • the vehicle control system 12000 includes a drive system control unit 12010, a body system control unit 12020, an outside information detection unit 12030, an in-vehicle information detection unit 12040, and an integrated control unit 12050.
  • a microcomputer 12051, a sound image output unit 12052, and an in-vehicle network I / F (interface) 12053 are illustrated as a functional configuration of the integrated control unit 12050.
  • the drive system control unit 12010 controls the operation of the device related to the drive system of the vehicle according to various programs.
  • the drive system control unit 12010 includes a driving force generator for generating a driving force of a vehicle such as an internal combustion engine or a driving motor, a driving force transmission mechanism for transmitting the driving force to wheels, and a steering angle of the vehicle. It functions as a control device such as a steering mechanism that adjusts and a braking device that generates a braking force of the vehicle.
  • the body system control unit 12020 controls the operation of various devices mounted on the vehicle body according to various programs.
  • the body system control unit 12020 functions as a keyless entry system, a smart key system, a power window device, or a control device for various lamps such as a headlamp, a back lamp, a brake lamp, a blinker, or a fog lamp.
  • the body control unit 12020 can be input with radio waves transmitted from a portable device that substitutes for a key or signals from various switches.
  • the body system control unit 12020 receives input of these radio waves or signals, and controls a door lock device, a power window device, a lamp, and the like of the vehicle.
  • the vehicle outside information detection unit 12030 detects information outside the vehicle on which the vehicle control system 12000 is mounted.
  • the imaging unit 12031 is connected to the vehicle exterior information detection unit 12030.
  • the vehicle exterior information detection unit 12030 causes the imaging unit 12031 to capture an image outside the vehicle and receives the captured image.
  • the vehicle outside information detection unit 12030 may perform an object detection process or a distance detection process such as a person, a car, an obstacle, a sign, or a character on a road surface based on the received image.
  • the imaging unit 12031 is an optical sensor that receives light and outputs an electrical signal corresponding to the amount of received light.
  • the imaging unit 12031 can output an electrical signal as an image, or can output it as distance measurement information. Further, the light received by the imaging unit 12031 may be visible light or invisible light such as infrared rays.
  • the vehicle interior information detection unit 12040 detects vehicle interior information.
  • a driver state detection unit 12041 that detects a driver's state is connected to the in-vehicle information detection unit 12040.
  • the driver state detection unit 12041 includes, for example, a camera that images the driver, and the vehicle interior information detection unit 12040 determines the degree of fatigue or concentration of the driver based on the detection information input from the driver state detection unit 12041. It may be calculated or it may be determined whether the driver is asleep.
  • the microcomputer 12051 calculates a control target value of the driving force generator, the steering mechanism, or the braking device based on the information inside / outside the vehicle acquired by the vehicle outside information detection unit 12030 or the vehicle interior information detection unit 12040, and the drive system control unit A control command can be output to 12010.
  • the microcomputer 12051 realizes ADAS (Advanced Driver Assistance System) functions including vehicle collision avoidance or impact mitigation, tracking based on inter-vehicle distance, vehicle speed maintenance traveling, vehicle collision warning, or vehicle lane departure warning. It is possible to perform cooperative control for the purpose.
  • ADAS Advanced Driver Assistance System
  • the microcomputer 12051 controls the driving force generator, the steering mechanism, the braking device, and the like based on the information around the vehicle acquired by the vehicle exterior information detection unit 12030 or the vehicle interior information detection unit 12040. It is possible to perform cooperative control for the purpose of automatic driving that autonomously travels without depending on the operation.
  • the microcomputer 12051 can output a control command to the body system control unit 12020 based on information outside the vehicle acquired by the vehicle outside information detection unit 12030.
  • the microcomputer 12051 controls the headlamp according to the position of the preceding vehicle or the oncoming vehicle detected by the outside information detection unit 12030, and performs cooperative control for the purpose of anti-glare, such as switching from a high beam to a low beam. It can be carried out.
  • the sound image output unit 12052 transmits an output signal of at least one of sound and image to an output device capable of visually or audibly notifying information to a vehicle occupant or the outside of the vehicle.
  • an audio speaker 12061, a display unit 12062, and an instrument panel 12063 are illustrated as output devices.
  • the display unit 12062 may include at least one of an on-board display and a head-up display, for example.
  • FIG. 26 is a diagram illustrating an example of an installation position of the imaging unit 12031.
  • the imaging unit 12031 includes imaging units 12101, 12102, 12103, 12104, and 12105.
  • the imaging units 12101, 12102, 12103, 12104, and 12105 are provided, for example, at positions such as a front nose, a side mirror, a rear bumper, a back door, and an upper part of a windshield in the vehicle interior of the vehicle 12100.
  • the imaging unit 12101 provided in the front nose and the imaging unit 12105 provided in the upper part of the windshield in the vehicle interior mainly acquire an image in front of the vehicle 12100.
  • the imaging units 12102 and 12103 provided in the side mirror mainly acquire an image of the side of the vehicle 12100.
  • the imaging unit 12104 provided in the rear bumper or the back door mainly acquires an image behind the vehicle 12100.
  • the imaging unit 12105 provided on the upper part of the windshield in the passenger compartment is mainly used for detecting a preceding vehicle or a pedestrian, an obstacle, a traffic light, a traffic sign, a lane, or the like.
  • FIG. 27 shows an example of the shooting range of the imaging units 12101 to 12104.
  • the imaging range 12111 indicates the imaging range of the imaging unit 12101 provided in the front nose
  • the imaging ranges 12112 and 12113 indicate the imaging ranges of the imaging units 12102 and 12103 provided in the side mirrors, respectively
  • the imaging range 12114 The imaging range of the imaging part 12104 provided in the rear bumper or the back door is shown. For example, by superimposing the image data captured by the imaging units 12101 to 12104, an overhead image when the vehicle 12100 is viewed from above is obtained.
  • At least one of the imaging units 12101 to 12104 may have a function of acquiring distance information.
  • at least one of the imaging units 12101 to 12104 may be a stereo camera including a plurality of imaging elements, or may be an imaging element having pixels for phase difference detection.
  • the microcomputer 12051 based on the distance information obtained from the imaging units 12101 to 12104, the distance to each three-dimensional object in the imaging range 12111 to 12114 and the temporal change in this distance (relative speed with respect to the vehicle 12100).
  • a predetermined speed for example, 0 km / h or more
  • the microcomputer 12051 can set an inter-vehicle distance to be secured in advance before the preceding vehicle, and can perform automatic brake control (including follow-up stop control), automatic acceleration control (including follow-up start control), and the like.
  • automatic brake control including follow-up stop control
  • automatic acceleration control including follow-up start control
  • cooperative control for the purpose of autonomous driving or the like autonomously traveling without depending on the operation of the driver can be performed.
  • the microcomputer 12051 converts the three-dimensional object data related to the three-dimensional object to other three-dimensional objects such as a two-wheeled vehicle, a normal vehicle, a large vehicle, a pedestrian, and a utility pole based on the distance information obtained from the imaging units 12101 to 12104. It can be classified and extracted and used for automatic avoidance of obstacles.
  • the microcomputer 12051 identifies obstacles around the vehicle 12100 as obstacles that are visible to the driver of the vehicle 12100 and obstacles that are difficult to see.
  • the microcomputer 12051 determines the collision risk indicating the risk of collision with each obstacle, and when the collision risk is equal to or higher than the set value and there is a possibility of collision, the microcomputer 12051 is connected via the audio speaker 12061 or the display unit 12062. By outputting an alarm to the driver and performing forced deceleration or avoidance steering via the drive system control unit 12010, driving assistance for collision avoidance can be performed.
  • At least one of the imaging units 12101 to 12104 may be an infrared camera that detects infrared rays.
  • the microcomputer 12051 can recognize a pedestrian by determining whether a pedestrian is present in the captured images of the imaging units 12101 to 12104. Such pedestrian recognition is, for example, whether or not the user is a pedestrian by performing a pattern matching process on a sequence of feature points indicating the outline of an object and a procedure for extracting feature points in the captured images of the imaging units 12101 to 12104 as infrared cameras. It is carried out by the procedure for determining.
  • the audio image output unit 12052 When the microcomputer 12051 determines that there is a pedestrian in the captured images of the imaging units 12101 to 12104 and recognizes the pedestrian, the audio image output unit 12052 has a rectangular contour line for emphasizing the recognized pedestrian.
  • the display unit 12062 is controlled so as to be superimposed and displayed.
  • voice image output part 12052 may control the display part 12062 so that the icon etc. which show a pedestrian may be displayed on a desired position.
  • the technology according to the present disclosure can be applied to the imaging unit 12031 among the configurations described above.
  • the imaging device 100 in FIG. 1 can be applied to the imaging unit 12031.
  • the processing procedure described in the above embodiment may be regarded as a method having a series of these procedures, and a program for causing a computer to execute these series of procedures or a recording medium storing the program. You may catch it.
  • a recording medium for example, a CD (Compact Disc), an MD (MiniDisc), a DVD (Digital Versatile Disc), a memory card, a Blu-ray disc (Blu-ray (registered trademark) Disc), or the like can be used.
  • this technique can also take the following structures.
  • a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal;
  • a comparator that compares the ramp signal with the pixel signal and outputs a comparison result;
  • a solid-state imaging device comprising: a counter that counts a count value over a period until the comparison result is inverted.
  • the ramp signal supply unit includes: A detector that detects whether the signal level is higher than a predetermined threshold and outputs a detection result;
  • the predetermined threshold value is one, The selector selects one of two ramp signals having different frequencies,
  • the detector is A latch circuit that holds the comparison result as a hold value when a specific timing corresponding to the predetermined threshold has elapsed within a cycle of the lower frequency of the two ramp signals;
  • the solid-state imaging device further comprising: a logic gate that generates the detection result based on the held value and outputs the detection result to the selector.
  • the predetermined threshold includes two different thresholds; The selector selects one of three ramp signals having different frequencies, The detector is A first holding value is stored as the first holding value when the first timing corresponding to one of the two threshold values has passed within the cycle of the ramp signal having the lowest frequency among the plurality of ramp signals.
  • the solid-state imaging device according to (3) further comprising: a logic gate that generates the detection result based on the first and second holding values and outputs the detection result to the selector.
  • a logic gate that generates the detection result based on the first and second holding values and outputs the detection result to the selector.
  • the solid-state imaging device according to any one of (1) to (7), further including a division circuit that divides the count value by a larger divisor as the frequency of the selected ramp signal is higher. (9) further includes a setting unit that sets a maximum value of the number of sampling times for each pixel based on a statistic of the level of the light-shielded pixel signal from each of the plurality of light-shielded pixels that are shielded; The solid-state imaging device according to any one of (1) to (8), wherein the pixel signal includes an effective pixel signal from each of a plurality of effective pixels that are not shielded from light and the light-shielded pixel signal.
  • a ramp signal supply unit that supplies a ramp signal having a frequency according to the signal level of the pixel signal; A comparator that compares the ramp signal with the pixel signal and outputs a comparison result; A counter that counts a count value over a period until the comparison result is inverted;
  • An imaging apparatus comprising: a recording unit that records image data generated from the count value.
  • (11) a ramp signal supply procedure for supplying a ramp signal having a frequency corresponding to the signal level of the pixel signal; A comparison procedure for comparing the ramp signal and the pixel signal and outputting a comparison result; And a counting procedure for counting a count value over a period until the comparison result is inverted.
  • Imaging device 110 Imaging lens 120 Recording part 130 Imaging control part 200 Solid-state image sensor 210 Vertical scanning circuit 220 Pixel array part 221 Pixel 222 OPB pixel 223 Normal pixel 230 DAC 240 read current control unit 250 timing control circuit 251 timing generator 252 clock generator 260 horizontal scanning circuit 270 sampling number setting unit 271 OPB dispersion calculation unit 272 OPB average calculation unit 273 weight coefficient acquisition unit 274 sampling number determination unit 275 threshold calculation unit 276 upper limit Count acquisition unit 277 Register 300
  • Column signal processing unit 310 AD converter 311 selector 312, 341 comparator 313 counter 314 division circuit 320, 330, 340 detector 321, 324 latch circuit 322, 325 inverter 323 AND (logical product) gate 350 Memory 360 Sense amplifier 370 Digital operation unit 380 Interface unit 12031 Imaging unit

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Abstract

The present invention improves image quality while maintaining a readout speed in a solid-state imaging element provided with an analog/digital converter. This solid-state imaging element is provided with a lamp signal supply unit, a comparator, and a counter. In this solid state imaging element, the lamp signal supply unit supplies a lamp signal of a frequency corresponding to the signal level of a pixel signal. The comparator compares the lamp signal and the pixel signal, and outputs a comparison result. The counter counts a count value over a period until the comparison result is inverted.

Description

固体撮像素子、撮像装置、および、固体撮像素子の制御方法Solid-state imaging device, imaging apparatus, and control method for solid-state imaging device

 本技術は、固体撮像素子、撮像装置、および、固体撮像素子の制御方法に関する。詳しくは、カラムごとにアナログ信号をデジタル信号に変換する固体撮像素子、撮像装置、および、固体撮像素子の制御方法に関する。 The present technology relates to a solid-state imaging device, an imaging apparatus, and a control method for the solid-state imaging device. Specifically, the present invention relates to a solid-state imaging device, an imaging apparatus, and a control method for the solid-state imaging device that convert an analog signal into a digital signal for each column.

 従来より、アナログ信号をデジタル信号にAD変換するADC(Analog to Digital Converter)が固体撮像装置などにおいて用いられている。例えば、ADCが、アナログの画素信号のリセットレベルおよび信号レベルを画素毎に複数回ずつAD(Analog to Digital)変換し、後段の回路が、それらを加算平均する固体撮像装置が提案されている(例えば、特許文献1参照。)。また、この固体撮像装置では、コンパレータおよびカウンタを設けたシングルスロープ型ADCが用いられている。このシングルスロープ型ADCでは、傾きを持つランプ信号と画素信号とをコンパレータが比較し、その比較結果が反転するまでの期間に亘ってカウンタが計数値の計数を行う。そして、ランプ信号の周期毎にサンプリングおよびAD変換が実行されるため、ランプ信号の周波数は、サンプリング周波数に一致する。 Conventionally, an ADC (Analog-to-Digital Converter) that performs AD conversion of an analog signal into a digital signal has been used in a solid-state imaging device or the like. For example, a solid-state imaging device has been proposed in which an ADC performs AD (Analog-to-Digital) conversion of the reset level and signal level of an analog pixel signal a plurality of times for each pixel, and a subsequent circuit adds and averages them ( For example, see Patent Document 1.) In this solid-state imaging device, a single slope type ADC provided with a comparator and a counter is used. In this single slope ADC, the comparator compares the ramp signal having the slope with the pixel signal, and the counter counts the count value over a period until the comparison result is inverted. Since sampling and AD conversion are executed every cycle of the ramp signal, the frequency of the ramp signal matches the sampling frequency.

特開2009-296423号公報JP 2009-296423 A

 上述の従来技術では、画素毎のAD変換回数を多くするほど、加算平均によりランダムノイズを低減し、SN(Signal to Noise)比を改善して画質を向上させることができる。しかしながら、この従来技術では、読出し速度を変えずに画質を向上させることが困難である。ランプ信号の周波数(すなわち、サンプリング周波数)を変えずに画素毎のAD変換回数を多くすると、SN比が改善する代わりに、読出し速度が遅くなってしまう。一方、サンプリング周波数を高くすると、読出し速度を維持することができるものの、特に高輝度の信号をAD変換するためにランプ信号の傾きを急峻にする必要があり、AD変換の分解能が低くなって、画質が低下するおそれがある。このように、上述の従来技術では、読出し速度を維持しつつ、画質を向上させることが困難であるという問題がある。 In the above-described prior art, as the number of AD conversions per pixel is increased, random noise can be reduced by averaging, and the SN (Signal-to-Noise) ratio can be improved to improve the image quality. However, with this prior art, it is difficult to improve the image quality without changing the reading speed. If the number of AD conversions for each pixel is increased without changing the frequency of the ramp signal (that is, the sampling frequency), the S / N ratio is improved, but the reading speed is reduced. On the other hand, when the sampling frequency is increased, the reading speed can be maintained, but in particular, it is necessary to make the slope of the ramp signal steep in order to perform AD conversion on a high-intensity signal, and the resolution of AD conversion decreases, The image quality may be degraded. As described above, the above-described conventional technique has a problem that it is difficult to improve the image quality while maintaining the reading speed.

 本技術はこのような状況に鑑みて生み出されたものであり、アナログデジタル変換器を設けた固体撮像素子において、読出し速度を維持しつつ、画質を向上させることを目的とする。 The present technology has been developed in view of such a situation, and an object of the present technology is to improve image quality while maintaining a reading speed in a solid-state imaging device provided with an analog-digital converter.

 本技術は、上述の問題点を解消するためになされたものであり、その第1の側面は、画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、上記ランプ信号と上記画素信号とを比較して比較結果を出力する比較器と、上記比較結果が反転するまでの期間に亘って計数値を計数するカウンタとを具備する固体撮像素子、および、その制御方法である。これにより、画素信号の信号レベルに応じた周波数のランプ信号と画素信号とが比較されるという作用をもたらす。 The present technology has been made to solve the above-described problems, and a first aspect thereof includes a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to a signal level of a pixel signal, and the ramp signal. A solid-state imaging device including a comparator that compares the pixel signal with the pixel signal and outputs a comparison result, and a counter that counts a count value over a period until the comparison result is inverted, and a control method thereof is there. As a result, the ramp signal having a frequency corresponding to the signal level of the pixel signal is compared with the pixel signal.

 また、この第1の側面において、上記ランプ信号供給部は、上記信号レベルが低いほど周波数の低い上記ランプ信号を供給してもよい。これにより、画素信号の信号レベルが低いほど周波数の低いランプ信号と画素信号とが比較されるという作用をもたらす。 Further, in the first aspect, the ramp signal supply unit may supply the ramp signal having a lower frequency as the signal level is lower. As a result, the lower the signal level of the pixel signal, the lower the frequency of the ramp signal and the pixel signal are compared.

 また、この第1の側面において、上記ランプ信号供給部は、上記信号レベルが所定の閾値より高いか否かを検出して検出結果を出力する検出器と、上記検出結果に基づいて周波数の異なる複数のランプ信号のいずれかを選択して上記比較器に供給するセレクタとを備えてもよい。これにより、画素信号の信号レベルが所定の閾値より高いか否かに基づいて複数のランプ信号のいずれかが選択されるという作用をもたらす。 In the first aspect, the ramp signal supply unit detects whether or not the signal level is higher than a predetermined threshold and outputs a detection result, and the frequency differs based on the detection result. A selector that selects any one of a plurality of ramp signals and supplies the selected ramp signal to the comparator may be provided. This brings about the effect that one of the plurality of ramp signals is selected based on whether the signal level of the pixel signal is higher than a predetermined threshold value.

 また、この第1の側面において、上記所定の閾値は、1つであり、上記セレクタは、周波数の異なる2つのランプ信号のいずれかを選択し、上記検出器は、上記2つのランプ信号のうち周波数の低い方の周期内において上記所定の閾値に対応する特定のタイミングを経過したときの上記比較結果を保持値として保持するラッチ回路と、上記保持値に基づいて上記検出結果を生成して上記セレクタに出力する論理ゲートとを備えてもよい。これにより、ラッチ回路および論理ゲートにより検出結果が生成されるという作用をもたらす。 In the first aspect, the predetermined threshold value is one, the selector selects one of two ramp signals having different frequencies, and the detector includes one of the two ramp signals. A latch circuit that holds the comparison result as a hold value when a specific timing corresponding to the predetermined threshold value has passed within a lower frequency cycle, and generates the detection result based on the hold value and And a logic gate that outputs to the selector. Thus, the detection result is generated by the latch circuit and the logic gate.

 また、この第1の側面において、上記所定の閾値は、異なる2つの閾値を含み、上記セレクタは、周波数の異なる3つのランプ信号のいずれかを選択し、上記検出器は、上記複数のランプ信号のうち周波数の最も低いランプ信号の周期内において上記2つの閾値の一方に対応する第1のタイミングを経過したときの上記比較結果を第1の保持値として保持する第1のラッチ回路と、上記周期内において上記2つの閾値の他方に対応する第2のタイミングを経過したときの上記比較結果を第2の保持値として保持する第2のラッチ回路と、上記第1および第2の保持値に基づいて上記検出結果を生成して上記セレクタに出力する論理ゲートとを備えてもよい。これにより、第1および第2のラッチ回路と論理ゲートとにより検出結果が生成されるという作用をもたらす。 In the first aspect, the predetermined threshold includes two different thresholds, the selector selects one of three ramp signals having different frequencies, and the detector includes the plurality of ramp signals. A first latch circuit that holds the comparison result when a first timing corresponding to one of the two threshold values has elapsed within a cycle of the ramp signal having the lowest frequency as a first hold value; A second latch circuit that holds the comparison result when the second timing corresponding to the other of the two threshold values has elapsed within a cycle as a second hold value; and the first and second hold values And a logic gate that generates the detection result based on the output and outputs the detection result to the selector. Thus, the detection result is generated by the first and second latch circuits and the logic gate.

 また、この第1の側面において、上記検出器は、上記計数値に基づいて上記信号レベルが上記所定の閾値より高いか否かを検出することもできる。これにより、計数値に基づいて検出結果が生成されるという作用をもたらす。 In this first aspect, the detector can detect whether the signal level is higher than the predetermined threshold based on the count value. This brings about the effect | action that a detection result is produced | generated based on a count value.

 また、この第1の側面において、上記検出器は、上記所定の閾値を示すバイアス電圧と上記画素信号とを比較して当該比較結果を上記検出結果として出力することもできる。これにより、バイアス電圧との比較によって検出結果が生成されるという作用をもたらす。 In this first aspect, the detector may compare the bias voltage indicating the predetermined threshold with the pixel signal and output the comparison result as the detection result. As a result, the detection result is generated by comparison with the bias voltage.

 また、この第1の側面において、上記選択されたランプ信号の周波数が高いほど大きな除数により上記計数値を除算する除算回路をさらに具備してもよい。これにより、計数値が平均化されるという作用をもたらす。 Further, in the first aspect, a division circuit that divides the count value by a larger divisor as the frequency of the selected ramp signal is higher may be further provided. This brings about the effect | action that a count value is averaged.

 また、この第1の側面において、遮光された複数の遮光画素のそれぞれからの遮光画素信号のレベルの統計量に基づいて画素毎のサンプリング回数の最大値を設定する設定部をさらに具備し、上記画素信号は、遮光されていない複数の有効画素のそれぞれからの有効画素信号と上記遮光画素信号とを含むものであってもよい。これにより、遮光画素信号のレベルの統計量に基づいて画素毎のサンプリング回数の最大値が設定されるという作用をもたらす。 The first aspect further includes a setting unit that sets a maximum value of the number of samplings for each pixel based on a statistic of the level of the light-shielded pixel signal from each of the plurality of light-shielded pixels that are shielded from light. The pixel signal may include an effective pixel signal from each of a plurality of effective pixels that are not shielded from light and the light-shielded pixel signal. This brings about the effect that the maximum value of the number of times of sampling for each pixel is set based on the level statistics of the light-shielded pixel signal.

 また、本技術の第2の側面は、画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、上記ランプ信号と上記画素信号とを比較して比較結果を出力する比較器と、上記比較結果が反転するまでの期間に亘って計数値を計数するカウンタと、上記計数値から生成された画像データを記録する記録部とを具備する撮像装置である。これにより、画素信号の信号レベルに応じた周波数のランプ信号と画素信号との比較結果が反転するまでの計数値から生成された画像データが記録されるという作用をもたらす。 In addition, according to a second aspect of the present technology, a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to a signal level of a pixel signal, and a comparison that compares the ramp signal with the pixel signal and outputs a comparison result. An imaging apparatus comprising: a counter; a counter that counts a count value over a period until the comparison result is inverted; and a recording unit that records image data generated from the count value. This brings about the effect that the image data generated from the count value until the comparison result between the ramp signal having the frequency corresponding to the signal level of the pixel signal and the pixel signal is inverted is recorded.

 本技術によれば、読出し速度を維持しつつ、画質を向上させることができるという優れた効果を奏し得る。なお、ここに記載された効果は必ずしも限定されるものではなく、本開示中に記載されたいずれかの効果であってもよい。 According to the present technology, it is possible to achieve an excellent effect that the image quality can be improved while maintaining the reading speed. Note that the effects described here are not necessarily limited, and may be any of the effects described in the present disclosure.

本技術の第1の実施の形態における撮像装置の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of an imaging device in a 1st embodiment of this art. 本技術の第1の実施の形態における固体撮像素子の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of a solid imaging device in a 1st embodiment of this art. 本技術の第1の実施の形態におけるカラム信号処理部の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of a column signal processing part in a 1st embodiment of this art. 本技術の第1の実施の形態におけるタイミング制御回路およびAD変換器の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of a timing control circuit and an AD converter in a 1st embodiment of this art. 本技術の第1の実施の形態における検出器の一構成例を示す回路図である。It is a circuit diagram showing an example of 1 composition of a detector in a 1st embodiment of this art. 本技術の第1の実施の形態におけるラッチ回路の動作の一例を示す図である。It is a figure showing an example of operation of a latch circuit in a 1st embodiment of this art. 本技術の第1の実施の形態におけるセレクタの動作の一例を示す図である。It is a figure showing an example of operation of a selector in a 1st embodiment of this art. 本技術の第1の実施の形態における除算回路の動作の一例を示す図である。It is a figure showing an example of operation of a division circuit in a 1st embodiment of this art. 本技術の第1の実施の形態における信号レベルが高い場合の固体撮像素子の動作の一例を示すタイミングチャートである。6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is high in the first embodiment of the present technology. 本技術の第1の実施の形態における信号レベルが低い場合の固体撮像素子の動作の一例を示すタイミングチャートである。7 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is low in the first embodiment of the present technology. 本技術の第1の実施の形態における信号レベルが高く、サンプリング回数が最大4回のときの固体撮像素子の動作の一例を示すタイミングチャートである。6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is high and the number of sampling times is a maximum of 4 times according to the first embodiment of the present technology. 本技術の第1の実施の形態における信号レベルが低く、サンプリング回数が最大4回のときの固体撮像素子の動作の一例を示すタイミングチャートである。6 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is low and the number of sampling times is a maximum of 4 times in the first embodiment of the present technology. 本技術の第1の実施の形態における固体撮像素子の動作の一例を示すフローチャートである。6 is a flowchart illustrating an example of the operation of the solid-state imaging element according to the first embodiment of the present technology. 本技術の第2の実施の形態における固体撮像素子の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of a solid-state image sensing device in a 2nd embodiment of this art. 本技術の第2の実施の形態におけるサンプリング回数設定部の一構成例を示すブロック図である。It is a block diagram which shows one structural example of the sampling frequency setting part in the 2nd Embodiment of this technique. 本技術の第2の実施の形態におけるサンプリング回数の設定例を示す図である。It is a figure showing an example of setting of the number of times of sampling in a 2nd embodiment of this art. 本技術の第3の実施の形態における検出器の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of a detector in a 3rd embodiment of this art. 本技術の第3の実施の形態におけるセレクタの動作の一例を示す図である。It is a figure showing an example of operation of a selector in a 3rd embodiment of this art. 本技術の第3の実施の形態における除算回路の動作の一例を示す図である。It is a figure showing an example of operation of a division circuit in a 3rd embodiment of this art. 本技術の第3の実施の形態における信号レベルが最も高い場合の固体撮像素子の動作の一例を示すタイミングチャートである。12 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is the highest in the third embodiment of the present technology. 本技術の第3の実施の形態における信号レベルが中間値の場合の固体撮像素子の動作の一例を示すタイミングチャートである。14 is a timing chart illustrating an example of an operation of a solid-state imaging device when a signal level is an intermediate value according to the third embodiment of the present technology. 本技術の第3の実施の形態における信号レベルが最も低い場合の固体撮像素子の動作の一例を示すタイミングチャートである。14 is a timing chart illustrating an example of the operation of the solid-state imaging device when the signal level is the lowest in the third embodiment of the present technology. 本技術の第4の実施の形態におけるAD変換器の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of an AD converter in a 4th embodiment of this art. 本技術の第5の実施の形態におけるAD変換器の一構成例を示すブロック図である。It is a block diagram showing an example of 1 composition of an AD converter in a 5th embodiment of this art. 車両制御システムの概略的な構成例を示すブロック図である。It is a block diagram which shows the schematic structural example of a vehicle control system. 撮像部の設置位置の一例を示す説明図である。It is explanatory drawing which shows an example of the installation position of an imaging part.

 以下、本技術を実施するための形態(以下、実施の形態と称する)について説明する。説明は以下の順序により行う。
 1.第1の実施の形態(信号レベルに応じた周波数のランプ信号を供給する例)
 2.第2の実施の形態(遮光画素信号の統計量に基づいてサンプリング回数の最大値を設定し、レベルに応じた周波数のランプ信号を供給する例)
 3.第3の実施の形態(信号レベルに応じて、周波数の異なる3つのランプ信号のいずれかを供給する例)
 4.第4の実施の形態(計数値を監視し、信号レベルに応じた周波数のランプ信号を供給する例)
 5.第5の実施の形態(バイアス電圧との比較結果に基づいて、信号レベルに応じた周波数のランプ信号を供給する例)
 6.移動体への応用例
Hereinafter, modes for carrying out the present technology (hereinafter referred to as embodiments) will be described. The description will be made in the following order.
1. First Embodiment (Example of supplying a ramp signal having a frequency corresponding to a signal level)
2. Second Embodiment (Example in which the maximum number of samplings is set based on the statistic of the light-shielded pixel signal and a ramp signal having a frequency corresponding to the level is supplied)
3. Third Embodiment (Example of supplying one of three ramp signals having different frequencies according to the signal level)
4). Fourth Embodiment (Example in which a count value is monitored and a ramp signal having a frequency according to the signal level is supplied)
5). Fifth Embodiment (Example of supplying a ramp signal having a frequency corresponding to a signal level based on a comparison result with a bias voltage)
6). Application examples for moving objects

 <1.第1の実施の形態>
 [撮像装置の構成例]
 図1は、本技術の第1の実施の形態における撮像装置100の一構成例を示すブロック図である。この撮像装置100は、画像データを撮像するものであり、撮像レンズ110、固体撮像素子200、記録部120および撮像制御部130を備える。撮像装置100としては、例えば、スマートフォン、デジタルカメラ、パーソナルコンピュータ、車載カメラやIoT(Internet of Things)カメラが想定される。
<1. First Embodiment>
[Configuration example of imaging device]
FIG. 1 is a block diagram illustrating a configuration example of the imaging apparatus 100 according to the first embodiment of the present technology. The imaging apparatus 100 captures image data and includes an imaging lens 110, a solid-state imaging device 200, a recording unit 120, and an imaging control unit 130. As the imaging device 100, for example, a smartphone, a digital camera, a personal computer, an in-vehicle camera, and an IoT (Internet of Things) camera are assumed.

 撮像レンズ110は、入射光を集光して固体撮像素子200に導くものである。固体撮像素子200は、撮像制御部130の制御に従って画像データを撮像するものである。この固体撮像素子200は、撮像した画像データを記録部120に信号線209を介して供給する。記録部120は、画像データを記録するものである。 The imaging lens 110 collects incident light and guides it to the solid-state imaging device 200. The solid-state imaging device 200 captures image data according to the control of the imaging control unit 130. The solid-state imaging device 200 supplies captured image data to the recording unit 120 via a signal line 209. The recording unit 120 records image data.

 撮像制御部130は、固体撮像素子200を制御して画像データを撮像させるものである。この撮像制御部130は、例えば、垂直同期信号VSYNCを含む制御信号を固体撮像素子200に信号線139を介して供給する。この垂直同期信号VSYNCは、画像データの撮像タイミングを示す、一定の周波数(30ヘルツなど)の周期信号である。 The imaging control unit 130 controls the solid-state imaging device 200 to capture image data. For example, the imaging control unit 130 supplies a control signal including the vertical synchronization signal VSYNC to the solid-state imaging device 200 via the signal line 139. The vertical synchronization signal VSYNC is a periodic signal having a constant frequency (30 Hz or the like) indicating the imaging timing of image data.

 なお、撮像装置100は、インターフェースをさらに備え、そのインターフェースにより画像データを外部に送信してもよいし、表示部をさらに備え、表示部に画像データを表示してもよい。 Note that the imaging apparatus 100 may further include an interface, and may transmit image data to the outside through the interface, or may further include a display unit and display the image data on the display unit.

 [固体撮像素子の構成例]
 図2は、本技術の第1の実施の形態における固体撮像素子200の一構成例を示すブロック図である。この固体撮像素子200は、垂直走査回路210、画素アレイ部220およびDAC(Digital to Analog Converter)230を備える。また、固体撮像素子200は、読出し電流制御部240、タイミング制御回路250、カラム信号処理部300および水平走査回路260を備える。
[Configuration example of solid-state image sensor]
FIG. 2 is a block diagram illustrating a configuration example of the solid-state imaging device 200 according to the first embodiment of the present technology. The solid-state imaging device 200 includes a vertical scanning circuit 210, a pixel array unit 220, and a DAC (Digital to Analog Converter) 230. The solid-state imaging device 200 includes a read current control unit 240, a timing control circuit 250, a column signal processing unit 300, and a horizontal scanning circuit 260.

 画素アレイ部220には、複数の画素221が二次元格子状に配列される。以下、水平方向に配列された画素221の集合を「行」と称し、行に垂直な方向に配列された画素221の集合を「列」と称する。 In the pixel array unit 220, a plurality of pixels 221 are arranged in a two-dimensional grid. Hereinafter, a set of pixels 221 arranged in the horizontal direction is referred to as “row”, and a set of pixels 221 arranged in the direction perpendicular to the row is referred to as “column”.

 垂直走査回路210は、タイミング制御回路250の制御に従って、行を順に駆動し、その行内の画素221のそれぞれにアナログの画素信号を出力させるものである。 The vertical scanning circuit 210 drives the rows in order under the control of the timing control circuit 250 and outputs an analog pixel signal to each of the pixels 221 in the row.

 DAC230は、タイミング制御回路250からのデジタル信号に対するDA(Digital to Analog)変換により、周波数の異なる複数のランプ信号を生成するものである。ここで、ランプ信号は、のこぎり波状の周期信号であり、このランプ信号の周期が経過するたびに画素信号のサンプリングとAD変換とが実行される。 The DAC 230 generates a plurality of ramp signals having different frequencies by performing DA (Digital-to-Analog) conversion on the digital signal from the timing control circuit 250. Here, the ramp signal is a sawtooth waveform periodic signal, and sampling of the pixel signal and AD conversion are executed each time the period of the ramp signal elapses.

 読出し電流制御部240は、画素221に画素信号の読出用の動作電流を供給するものである。 The read current control unit 240 supplies the pixel 221 with an operation current for reading a pixel signal.

 タイミング制御回路250は、垂直同期信号VSYNCに同期して、垂直走査回路210、DAC230、カラム信号処理部300および水平走査回路260の動作タイミングを制御するものである。 The timing control circuit 250 controls the operation timing of the vertical scanning circuit 210, the DAC 230, the column signal processing unit 300, and the horizontal scanning circuit 260 in synchronization with the vertical synchronization signal VSYNC.

 カラム信号処理部300は、列ごとに、画素信号に対して、AD変換処理を含む様々な信号処理を実行するものである。このカラム信号処理部300は、信号処理後の画像データを記録部120に出力する。水平走査回路260は、AD変換後の列ごとの画素信号を順に出力させるものである。 The column signal processing unit 300 performs various signal processing including AD conversion processing on the pixel signal for each column. The column signal processing unit 300 outputs the image data after the signal processing to the recording unit 120. The horizontal scanning circuit 260 sequentially outputs pixel signals for each column after AD conversion.

 [カラム信号処理部の構成例]
 図3は、本技術の第1の実施の形態におけるカラム信号処理部300の一構成例を示すブロック図である。このカラム信号処理部300は、列ごとに、AD変換器310およびメモリ350を備える。列数をM(Mは整数)とすると、AD変換器310およびメモリ350はM個ずつ設けられる。また、カラム信号処理部300は、センスアンプ360、デジタル演算部370およびインターフェース部380を備える。
[Configuration example of column signal processor]
FIG. 3 is a block diagram illustrating a configuration example of the column signal processing unit 300 according to the first embodiment of the present technology. The column signal processing unit 300 includes an AD converter 310 and a memory 350 for each column. When the number of columns is M (M is an integer), M AD converters 310 and M memories 350 are provided. The column signal processing unit 300 includes a sense amplifier 360, a digital operation unit 370, and an interface unit 380.

 AD変換器310は、アナログ信号をデジタル信号に変換するものである。AD変換器310には、対応する列からのアナログの画素信号Vinが入力され、AD変換器310は、その画素信号Vinをデジタルの画素データDoutに変換する。そして、AD変換器310は、画素データDoutを対応するメモリ350に保持させる。 The AD converter 310 converts an analog signal into a digital signal. An analog pixel signal Vin from the corresponding column is input to the AD converter 310, and the AD converter 310 converts the pixel signal Vin into digital pixel data Dout. Then, the AD converter 310 holds the pixel data Dout in the corresponding memory 350.

 メモリ350は、画素データDoutを保持するものである。このメモリ350は、水平走査回路260の制御に従って、保持した画素データDoutをセンスアンプ360に出力する。 Memory 350 holds pixel data Dout. The memory 350 outputs the held pixel data Dout to the sense amplifier 360 according to the control of the horizontal scanning circuit 260.

 センスアンプ360は、画素データDoutを増幅してデジタル演算部370に供給するものである。 The sense amplifier 360 amplifies the pixel data Dout and supplies it to the digital operation unit 370.

 デジタル演算部370は、画素データDoutに対して所定の信号処理を実行するものである。このデジタル演算部370は、処理後の画素データをインターフェース部380に供給する。 The digital operation unit 370 performs predetermined signal processing on the pixel data Dout. The digital operation unit 370 supplies the processed pixel data to the interface unit 380.

 デジタル演算部370は、HDR(High Dynamic Range)合成処理や像面位相差検出処理を必要に応じて行う。前者のHDR合成処理は、露光時間の異なる複数の画素データを合成してダイナミックレンジを拡大する処理である。後者の像面位相差検出処理は、複数の位相差画素からの画素データに基づいて、2つの像の位相差を求め、焦点を検出する処理である。像面位相差検出処理を行う場合、位相差を検出するための位相差画素と、それ以外の通常画素とが画素アレイ部220内に配置される。そして、位相差画素および通常画素のそれぞれについて、輝度に応じてランプ信号が切り替えられる。 The digital calculation unit 370 performs HDR (High Dynamic Range) composition processing and image plane phase difference detection processing as necessary. The former HDR synthesizing process is a process for synthesizing a plurality of pixel data having different exposure times to expand the dynamic range. The latter image plane phase difference detection processing is processing for obtaining a phase difference by obtaining a phase difference between two images based on pixel data from a plurality of phase difference pixels. When performing the image plane phase difference detection process, a phase difference pixel for detecting the phase difference and other normal pixels are arranged in the pixel array unit 220. Then, the ramp signal is switched according to the luminance for each of the phase difference pixel and the normal pixel.

 インターフェース部380は、画素データからなる画像データを記録部120に供給するものである。 The interface unit 380 supplies image data including pixel data to the recording unit 120.

 図4は、本技術の第1の実施の形態におけるタイミング制御回路250およびAD変換器310の一構成例を示すブロック図である。タイミング制御回路250は、タイミングジェネレータ251およびクロックジェネレータ252を備える。また、AD変換器310は、セレクタ311、比較器312、カウンタ313、除算回路314および検出器320を備える。 FIG. 4 is a block diagram illustrating a configuration example of the timing control circuit 250 and the AD converter 310 according to the first embodiment of the present technology. The timing control circuit 250 includes a timing generator 251 and a clock generator 252. The AD converter 310 includes a selector 311, a comparator 312, a counter 313, a division circuit 314, and a detector 320.

 タイミングジェネレータ251は、垂直同期信号VSYNCの周期内において、トリガ信号TRGをAD変換のたびに生成して検出器320に供給するものである。例えば、行数がMで、行ごとにリセットレベルおよび信号レベルのそれぞれのAD変換を行う場合、垂直同期信号VSYNCの周期毎に、M×2回、トリガ信号TRGが生成される。 The timing generator 251 generates the trigger signal TRG for each AD conversion within the period of the vertical synchronization signal VSYNC and supplies it to the detector 320. For example, when the number of rows is M and AD conversion of the reset level and the signal level is performed for each row, the trigger signal TRG is generated M × 2 times for each period of the vertical synchronization signal VSYNC.

 クロックジェネレータ252は、垂直同期信号VSYNCより周波数の高い所定のクロック信号CLKを生成し、AD変換の期間に亘ってカウンタ313に供給するものである。例えば、垂直同期信号VSYNCの逓倍によりクロック信号CLKが生成される。 The clock generator 252 generates a predetermined clock signal CLK having a frequency higher than that of the vertical synchronization signal VSYNC and supplies it to the counter 313 over the AD conversion period. For example, the clock signal CLK is generated by multiplying the vertical synchronization signal VSYNC.

 セレクタ311には、DAC230からのランプ信号RMPHおよびRMPLが入力される。ここで、ランプ信号RMPHは、ランプ信号RMPLよりも周波数が高い信号である。セレクタ311は、検出器320からの検出結果DETに基づいてランプ信号RMPHおよびRMPLのいずれかを選択し、選択した信号をランプ信号RMPSとして比較器312に供給する。 Ramp signals RMPH and RMPL from the DAC 230 are input to the selector 311. Here, the ramp signal RMPH is a signal having a higher frequency than the ramp signal RMPL. The selector 311 selects one of the ramp signals RMPH and RMPL based on the detection result DET from the detector 320 and supplies the selected signal to the comparator 312 as the ramp signal RMPS.

 比較器312は、ランプ信号RMPSと画素信号Vinとを比較するものである。この比較器312は、比較結果CMP_OUTをカウンタ313および検出器320に供給する。 The comparator 312 compares the ramp signal RMPS with the pixel signal Vin. The comparator 312 supplies the comparison result CMP_OUT to the counter 313 and the detector 320.

 カウンタ313は、比較結果CMP_OUTが反転するまでの期間に亘ってクロック信号CLKに同期して計数値を計数するものである。このカウンタ313は、計数値CNTを除算回路314に供給する。 The counter 313 counts the count value in synchronization with the clock signal CLK over a period until the comparison result CMP_OUT is inverted. The counter 313 supplies the count value CNT to the division circuit 314.

 除算回路314は、検出器320からのイネーブル信号CAL_ENに従って計数値CNTを除算するものである。イネーブル信号CAL_ENは、除算を行うか否かを指示する信号であり、例えば、除算を行う場合に「1」が設定され、除算を行わない場合に「0」が設定される。除算回路314は、除算が指示された場合に、選択されたランプ信号の周波数が高いほど大きな除数により信号レベルの計数値CNTを除算し、CDS処理を行って画素データDoutをメモリ350に供給する。一方、除算が指示されていない場合に除算回路314は、信号レベルの計数値CNTを除算せずにCDS処理を行って画素データDoutをメモリ350に供給する。 The division circuit 314 divides the count value CNT according to the enable signal CAL_EN from the detector 320. The enable signal CAL_EN is a signal for instructing whether or not to perform division. For example, “1” is set when division is performed, and “0” is set when division is not performed. When division is instructed, the division circuit 314 divides the signal level count value CNT by a larger divisor as the frequency of the selected ramp signal is higher, performs CDS processing, and supplies the pixel data Dout to the memory 350. . On the other hand, when division is not instructed, the division circuit 314 performs CDS processing without dividing the signal level count value CNT and supplies the pixel data Dout to the memory 350.

 検出器320は、画素信号Vinのレベルが所定の閾値より高いか否かを検出するものである。ここで、一般に画素221が光電変換により光を電子に変換する場合、輝度が高いほど画素信号Vinのレベルが低くなる。このため、画素信号Vinのレベルが閾値以下の場合、その画素信号に対応する画素221が受光した光の輝度は、閾値に対応する所定輝度以上であることを示す。一方、画素信号Vinのレベルが閾値より高い場合、その画素信号に対応する画素221が受光した光の輝度は、所定輝度より低いことを示す。 The detector 320 detects whether or not the level of the pixel signal Vin is higher than a predetermined threshold value. Here, when the pixel 221 generally converts light into electrons by photoelectric conversion, the level of the pixel signal Vin decreases as the luminance increases. For this reason, when the level of the pixel signal Vin is equal to or lower than the threshold, the luminance of the light received by the pixel 221 corresponding to the pixel signal is equal to or higher than the predetermined luminance corresponding to the threshold. On the other hand, when the level of the pixel signal Vin is higher than the threshold value, the luminance of the light received by the pixel 221 corresponding to the pixel signal is lower than the predetermined luminance.

 検出器320は、画素信号Vinの信号レベルが所定の閾値より高いか否か(言い換えれば、輝度が所定輝度より低いか否か)を示す検出結果DETを生成してセレクタ311に供給する。また、検出器320は、検出結果DETと同じ信号をイネーブル信号CAL_ENとして除算回路314にも供給する。 The detector 320 generates a detection result DET indicating whether the signal level of the pixel signal Vin is higher than a predetermined threshold (in other words, whether the luminance is lower than the predetermined luminance) and supplies the detection result DET to the selector 311. The detector 320 also supplies the same signal as the detection result DET to the division circuit 314 as the enable signal CAL_EN.

 そして、セレクタ311は、輝度が所定輝度以上であることを検出結果DETが示す場合に周波数の低いランプ信号RMPLを選択し、所定輝度より低いことを検出結果DETが示す場合にランプ信号RMPHを選択する。検出器320およびセレクタ311の動作により、画素信号Vinの信号レベルに応じた周波数のランプ信号が供給される。なお、検出器320およびセレクタ311からなる回路は、特許請求の範囲に記載のランプ信号供給部の一例である。 The selector 311 selects the ramp signal RMPL having a low frequency when the detection result DET indicates that the luminance is equal to or higher than the predetermined luminance, and selects the ramp signal RMPH when the detection result DET indicates that the luminance is lower than the predetermined luminance. To do. The operation of the detector 320 and the selector 311 supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal Vin. The circuit including the detector 320 and the selector 311 is an example of a ramp signal supply unit described in the claims.

 ランプ信号RMPSが振幅するたびに、画素信号VinのサンプリングとAD変換とが行われる。このため、ランプ信号RMPSの周波数は、サンプリング周波数と同じになる。ここで、ランプ信号の周波数(サンプリング周波数)が高いほど、画素ごとのサンプリング回数が多くなるため、サンプリングした各信号の平均化によりランダムノイズを軽減することができる。一般に、輝度が低いほど、SNR(Signal-Noise Ratio)が悪くなるため(ノイズが大きく見えるため)、高周波数のランプ信号RMPHは、輝度が低い画素の画素信号Vinに対するAD変換に適している。 Each time the ramp signal RMPS is amplified, sampling of the pixel signal Vin and AD conversion are performed. For this reason, the frequency of the ramp signal RMPS is the same as the sampling frequency. Here, the higher the frequency of the ramp signal (sampling frequency), the greater the number of samplings per pixel, so that random noise can be reduced by averaging each sampled signal. In general, the lower the luminance, the worse the SNR (Signal-Noise (Ratio) (because noise appears to be large), so the high-frequency ramp signal RMPH is suitable for AD conversion for the pixel signal Vin of a pixel with low luminance.

 一方、ランプ信号の周波数(サンプリング周波数)が低いほど、画素ごとのサンプリング回数が少なくなるため、ランダムノイズの低減効果が小さくなる。その代り、サンプリング周波数を低くするほど、振幅が大きくなるため、輝度が高くてもカウンタ313がオーバーフローせずにAD変換することができる。このため、低周波数のランプ信号RMPLは、輝度が高い画素の画素信号Vinに対するAD変換に適している。 On the other hand, the lower the frequency of the ramp signal (sampling frequency), the smaller the number of samplings per pixel, so the effect of reducing random noise becomes smaller. Instead, since the amplitude increases as the sampling frequency is lowered, the AD conversion can be performed without overflow of the counter 313 even if the luminance is high. For this reason, the low-frequency ramp signal RMPL is suitable for AD conversion for the pixel signal Vin of a pixel with high luminance.

 上述したようにセレクタ311は、画素の輝度が所定輝度以上の場合に、高輝度に適した低周波数のランプ信号RMPLを選択し、所定輝度より低い場合に、低輝度に適した高周波数のランプ信号RMPHを選択する。このように輝度に適したランプ信号を選択することにより、読出し速度を変えずに画質を向上させることができる。また、HDR合成処理を行う場合、特に、露光時間の短い、低輝度の画素信号のSN比の向上により、合成した画像データの画質を向上させることができる。また、像面位相差検出処理を行う場合、特に、通常画素よりも感度の悪い位相差画素のSN比の向上により、焦点検出精度を向上させることができる。 As described above, the selector 311 selects the low-frequency lamp signal RMPL suitable for high luminance when the luminance of the pixel is equal to or higher than the predetermined luminance, and selects the high-frequency lamp suitable for low luminance when the luminance is lower than the predetermined luminance. The signal RMPH is selected. By selecting the ramp signal suitable for the luminance in this way, the image quality can be improved without changing the readout speed. In addition, when performing HDR combining processing, the image quality of the combined image data can be improved particularly by improving the SN ratio of a low-brightness pixel signal with a short exposure time. Further, when performing the image plane phase difference detection process, it is possible to improve the focus detection accuracy, particularly by improving the SN ratio of the phase difference pixel having lower sensitivity than the normal pixel.

 なお、除算回路314をAD変換器310内に配置しているが、この構成に限定されない。除算回路314をAD変換器310の後段の回路(デジタル演算部370など)に配置することもできる。 In addition, although the division circuit 314 is arrange | positioned in the AD converter 310, it is not limited to this structure. The division circuit 314 can also be arranged in a circuit subsequent to the AD converter 310 (such as a digital arithmetic unit 370).

 なお、サンプリング周波数を変えずに、画素毎のサンプリング回数を多くすることによっても画質を向上させることができる。しかし、この場合には、画質向上の代わりに読出し速度が低下してしまうため、好ましくない。 Note that the image quality can be improved by increasing the number of times of sampling for each pixel without changing the sampling frequency. However, this is not preferable because the reading speed decreases instead of improving the image quality.

 また、高輝度の場合にランプ信号の傾きを低輝度の場合よりも急峻にすれば、読出し速度を変えずに振幅を大きくして高輝度の信号レベルをオーバーフローせずにAD変換することができる。しかし、この場合には、AD変換の分解能が低下してしまうため、好ましくない。 Also, if the slope of the ramp signal is made steeper in the case of high luminance than in the case of low luminance, the amplitude can be increased without changing the reading speed, and AD conversion can be performed without overflowing the high luminance signal level. . However, this is not preferable because the resolution of AD conversion is lowered.

 [検出器の構成例]
 図5は、本技術の第1の実施の形態における検出器320の一構成例を示す回路図である。この検出器320は、ラッチ回路321およびインバータ322を備える。
[Example of detector configuration]
FIG. 5 is a circuit diagram illustrating a configuration example of the detector 320 according to the first embodiment of the present technology. The detector 320 includes a latch circuit 321 and an inverter 322.

 ラッチ回路321は、タイミングジェネレータ251からのトリガ信号TRGの示すタイミングにおいて、比較結果CMP_OUTを保持するものである。このラッチ回路321は、保持値をインバータ322に供給する。ラッチ回路321としては、例えば、ゲーティドDラッチが用いられる。ゲーティドDラッチの場合、ラッチ回路321のデータ入力端子Dには、比較結果CMP_OUTが入力され、イネーブル端子Eには、トリガ信号TRGが入力される。出力端子Qは、インバータ322に接続される。 The latch circuit 321 holds the comparison result CMP_OUT at the timing indicated by the trigger signal TRG from the timing generator 251. The latch circuit 321 supplies the hold value to the inverter 322. As the latch circuit 321, for example, a gated D latch is used. In the case of the gated D latch, the comparison result CMP_OUT is input to the data input terminal D of the latch circuit 321, and the trigger signal TRG is input to the enable terminal E. The output terminal Q is connected to the inverter 322.

 インバータ322は、ラッチ回路321の保持値を反転して、検出結果DETとしてセレクタ311に供給するものである。また、インバータ322は、その反転値をイネーブル信号CAL_ENとして除算回路314にも供給する。なお、インバータ322は、特許請求の範囲に記載の論理ゲートの一例である。 The inverter 322 inverts the hold value of the latch circuit 321 and supplies it to the selector 311 as the detection result DET. Further, the inverter 322 supplies the inverted value to the division circuit 314 as the enable signal CAL_EN. The inverter 322 is an example of a logic gate described in the claims.

 [固体撮像素子の動作例]
 図6は、本技術の第1の実施の形態におけるラッチ回路321の動作の一例を示す図である。イネーブル端子Eがローレベルである場合には、前の保持値Qprevが出力される。
[Operation example of solid-state image sensor]
FIG. 6 is a diagram illustrating an example of the operation of the latch circuit 321 according to the first embodiment of the present technology. When the enable terminal E is at a low level, the previous held value Qprev is output.

 また、データ入力端子Dがローレベルで、イネーブル端子Eがハイレベルである場合には、保持値がリセットされ、「0」の論理値が出力される。データ入力端子Dおよびイネーブル端子Eがハイレベルである場合には、保持値がセットされ、「1」の論理値が出力される。 When the data input terminal D is at a low level and the enable terminal E is at a high level, the hold value is reset and a logical value of “0” is output. When the data input terminal D and the enable terminal E are at the high level, the hold value is set and the logic value “1” is output.

 図7は、本技術の第1の実施の形態におけるセレクタ311の動作の一例を示す図である。検出結果DETがローレベル、すなわち画素が高輝度である場合にセレクタ311は、高輝度に対応する、低周波数のランプ信号RMPLを選択する。一方、検出結果DETがハイレベル、すなわち、画素が低輝度である場合にセレクタ311は、低輝度に対応する、高周波数のランプ信号RMPHを選択する。 FIG. 7 is a diagram illustrating an example of the operation of the selector 311 according to the first embodiment of the present technology. When the detection result DET is at a low level, that is, when the pixel has high luminance, the selector 311 selects the low-frequency ramp signal RMPL corresponding to high luminance. On the other hand, when the detection result DET is at a high level, that is, when the pixel has low luminance, the selector 311 selects the high-frequency ramp signal RMPH corresponding to low luminance.

 図8は、本技術の第1の実施の形態における除算回路314の動作の一例を示す図である。この除算回路314は、イネーブル信号CAL_ENがローレベル、すなわち画素が高輝度である場合に信号レベルの計数値CNTを除算せずにCDS処理を行って画素データDoutを出力する。一方、イネーブル信号CAL_ENがハイレベル、すなわち、画素が低輝度である場合に除算回路314は、信号レベルの計数値CNTを、画素毎のサンプリング回数により除算し、CDS処理を行って画素データDoutを出力する。 FIG. 8 is a diagram illustrating an example of the operation of the divider circuit 314 according to the first embodiment of the present technology. The division circuit 314 performs CDS processing without dividing the count value CNT of the signal level and outputs the pixel data Dout when the enable signal CAL_EN is at a low level, that is, when the pixel has high luminance. On the other hand, when the enable signal CAL_EN is at a high level, that is, when the pixel has a low luminance, the division circuit 314 divides the count value CNT of the signal level by the number of samplings for each pixel, performs CDS processing, and outputs the pixel data Dout. Output.

 図9は、本技術の第1の実施の形態における信号レベルが高い場合の固体撮像素子200の動作の一例を示すタイミングチャートである。 FIG. 9 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is high according to the first embodiment of the present technology.

 垂直走査回路210は、タイミングT2乃至T4において、1行目を露光し、タイミングT4乃至T5において、その行を駆動する。このタイミングT4乃至T5において1行目の画素信号が読み出される。また、垂直走査回路210は、タイミングT3乃至T5において、2行目を露光し、タイミングT5乃至T6において、その行を駆動する。このタイミングT5乃至T6において2行目の画素信号が読み出される。3行目以降も同様に、行が順に露光され、読み出される。このように、いわゆるローリングシャッター方式により一行ずつ順に読み出される。 The vertical scanning circuit 210 exposes the first row at timings T2 to T4, and drives the rows at timings T4 to T5. At the timings T4 to T5, the pixel signals in the first row are read out. The vertical scanning circuit 210 exposes the second row at timings T3 to T5, and drives the rows at timings T5 to T6. At the timings T5 to T6, the pixel signals in the second row are read out. Similarly, the third and subsequent rows are sequentially exposed and read out. In this way, the data is sequentially read out line by line by a so-called rolling shutter system.

 セレクタ311は、初期状態において、例えば、低輝度用の高周波数のランプ信号RMPHを選択し、ランプ信号RMPSとして出力する。このランプ信号RMPS(RMPH)は、タイミングT11乃至T13の期間内に一定の速度で減少して元のレベルに戻り、タイミングT14乃至T16の期間に再度減少する。また、ランプ信号RMPSは、タイミングT17乃至T20の期間内に一定の速度で減少して元のレベルに戻り、タイミングT21乃至T23の期間に再度減少する。 In the initial state, the selector 311 selects, for example, the high-frequency ramp signal RMPH for low luminance and outputs it as the ramp signal RMPS. The ramp signal RMPS (RMPH) decreases at a constant speed during the period from the timing T11 to T13, returns to the original level, and decreases again during the period from the timing T14 to T16. Further, the ramp signal RMPS decreases at a constant speed within the period of timing T17 to T20, returns to the original level, and decreases again during the period of timing T21 to T23.

 高周波数のランプ信号RMPHの周波数は、1行の読出し時間をt、行数をNとし、リセットレベルおよび信号レベルのそれぞれのサンプリング回数の最大をMult_numとすると、(Mult_num×2)/(t×N)ヘルツとなる。一方、低周波数のランプ信号RMPLは、リセットレベルのサンプリング回数はランプ信号RMPHと同じで、信号レベルのサンプリング回数はランプ信号RMPHより少ない。 The frequency of the high-frequency ramp signal RMPH is (Mult_num × 2) / (t ×) where t is the readout time of one row, N is the number of rows, and Max_num is the maximum number of sampling times of the reset level and signal level. N) Hertz. On the other hand, the low-frequency ramp signal RMPL has the same reset level sampling frequency as the ramp signal RMPH, and the signal level sampling frequency is less than the ramp signal RMPH.

 垂直走査回路210は、行の露光終了の直前に、その行内の画素221を初期化する。そして、露光終了時に垂直走査回路210は、画素内で電荷を転送させる。初期化の際の画素信号Vinは、前述のリセットレベルに該当し、電荷転送時の画素信号Vinは信号レベルに該当する。同図における一点鎖線は、画素信号Vinの変動を示す。タイミングT4乃至T5の読出し期間のうちタイミングT16までの期間において、リセットレベルが出力され、タイミングT16の直後に信号レベルが出力される。画素の輝度が低い場合には、比較的高い信号レベルが出力される。 The vertical scanning circuit 210 initializes the pixels 221 in the row immediately before the end of the exposure of the row. At the end of exposure, the vertical scanning circuit 210 transfers charges within the pixel. The pixel signal Vin at the time of initialization corresponds to the aforementioned reset level, and the pixel signal Vin at the time of charge transfer corresponds to the signal level. The alternate long and short dash line in the figure indicates the fluctuation of the pixel signal Vin. In the period from the timing T4 to the timing T5 to the timing T16, the reset level is output, and the signal level is output immediately after the timing T16. When the luminance of the pixel is low, a relatively high signal level is output.

 比較器312は、リセットレベルと、高周波数のランプ信号RMPSとを比較し、比較結果CMP_OUTを出力する。この比較結果CMP_OUTは、例えば、タイミングT12、15、19および22のそれぞれにおいて反転する。 The comparator 312 compares the reset level with the high-frequency ramp signal RMPS and outputs a comparison result CMP_OUT. This comparison result CMP_OUT is inverted at each of timings T12, 15, 19 and 22, for example.

 タイミング制御回路250は、トリガ信号TRGを生成するために、イネーブル信号CMP_ENを内部生成する。イネーブル信号CMP_ENは、例えば、信号レベルの最初のサンプリングの期間であるタイミングT17からT20までの期間に亘ってハイレベルとなる。 The timing control circuit 250 internally generates an enable signal CMP_EN in order to generate the trigger signal TRG. The enable signal CMP_EN is at a high level over a period from timing T17 to T20, which is a first sampling period of the signal level, for example.

 タイミング制御回路250は、イネーブル信号CMP_ENが立ち下がるタイミングT20において、トリガ信号TRGを生成して出力する。このタイミングは、低周波数のランプ信号RMPLの周期内の特定のタイミングに該当する。 The timing control circuit 250 generates and outputs a trigger signal TRG at the timing T20 when the enable signal CMP_EN falls. This timing corresponds to a specific timing within the cycle of the low-frequency ramp signal RMPL.

 検出器320は、トリガ信号TRGが出力されたときの比較結果CMP_OUTをラッチする。トリガ信号TRG出力時のランプ信号のレベル(閾値)よりも信号レベルが高い場合には、その時点で比較結果CMP_OUTが反転している。このため、タイミングT20においてローレベルがラッチされ、それを反転したハイレベルの検出結果DETが出力される。 The detector 320 latches the comparison result CMP_OUT when the trigger signal TRG is output. When the signal level is higher than the level (threshold value) of the ramp signal when the trigger signal TRG is output, the comparison result CMP_OUT is inverted at that time. For this reason, the low level is latched at timing T20, and a high level detection result DET obtained by inverting it is output.

 検出結果DETがハイレベルであるため、タイミングT20において、ランプ信号は切り替えられ、高周波数になる。 Since the detection result DET is at a high level, the ramp signal is switched to a high frequency at timing T20.

 また、カウンタ313は、比較結果CMP_OUTが反転するまでのタイミングT11乃至T12においてクロック信号CLKに同期して計数値CNTを計数する。これにより、リセットレベルに対する1回目のAD変換が行われる。次に比較結果CMP_OUTが反転するまでのタイミングT14乃至T15においても同様に計数値CNTが計数される。これにより、リセットレベルに対する2回目のAD変換が行われる。同様に、タイミングT17乃至T19と、タイミングT21乃至T22とにおいても、信号レベルに対する1回目および2回目のAD変換が行われる。 Further, the counter 313 counts the count value CNT in synchronization with the clock signal CLK at timings T11 to T12 until the comparison result CMP_OUT is inverted. Thereby, the first AD conversion with respect to the reset level is performed. Next, the count value CNT is similarly counted at timings T14 to T15 until the comparison result CMP_OUT is inverted. Thereby, the second AD conversion for the reset level is performed. Similarly, at timings T17 to T19 and timings T21 to T22, the first and second AD conversions for the signal level are performed.

 リセットレベルおよび信号レベルのそれぞれについてAD変換が2回ずつ行われたため、除算回路314は、リセットレベルおよび信号レベルのそれぞれの計数値CNTを「2」により除算する。 Since AD conversion is performed twice for each of the reset level and the signal level, the division circuit 314 divides each count value CNT of the reset level and the signal level by “2”.

 そして、除算回路314は、、除算後のリセットレベルと信号レベルとの差分を求めるCDS処理を実行し、処理後のデータを画素データDoutとして出力する。 Then, the division circuit 314 performs CDS processing for obtaining a difference between the reset level after division and the signal level, and outputs the processed data as pixel data Dout.

 上述したように、信号レベルが、トリガ信号TRGのタイミングに対応する閾値よりも高い(すなわち、輝度が低い)場合には、高周波数のランプ信号が選択される。これにより、画素毎のAD変換の回数を多くし、それぞれの計数値CNTの平均化により、ランダムノイズを低減することができる。上述したように、低輝度の場合には、ランダムノイズが大きくなるため、ランダムノイズの低減によりSN比が向上し、画質を向上させることができる。 As described above, when the signal level is higher than the threshold corresponding to the timing of the trigger signal TRG (that is, the luminance is low), a high-frequency ramp signal is selected. Thereby, the number of AD conversions for each pixel is increased, and random noise can be reduced by averaging each count value CNT. As described above, since the random noise increases in the case of low luminance, the SN ratio can be improved by reducing the random noise, and the image quality can be improved.

 図10は、本技術の第1の実施の形態における信号レベルが低い場合の固体撮像素子200の動作の一例を示すタイミングチャートである。 FIG. 10 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is low according to the first embodiment of the present technology.

 セレクタ311は、最初に、低輝度用の高周波数のランプ信号RMPHを選択し、ランプ信号RMPSとして出力する。 The selector 311 first selects the high-frequency ramp signal RMPH for low luminance and outputs it as the ramp signal RMPS.

 タイミング制御回路250は、低周波数のランプ信号RMPLの周期内の特定のタイミングT18においてトリガ信号TRGを出力する。 The timing control circuit 250 outputs the trigger signal TRG at a specific timing T18 within the cycle of the low-frequency ramp signal RMPL.

 検出器320は、トリガ信号TRGが出力されたときの比較結果CMP_OUTをラッチする。信号レベルが閾値以下の場合には、トリガ信号TRGの時点で比較結果CMP_OUTが反転しておらず、ハイレベルである。このため、タイミングT18においてハイレベルがラッチされ、それを反転したローレベルの検出結果DETが出力される。 The detector 320 latches the comparison result CMP_OUT when the trigger signal TRG is output. When the signal level is equal to or lower than the threshold value, the comparison result CMP_OUT is not inverted at the time of the trigger signal TRG and is at the high level. Therefore, the high level is latched at timing T18, and the low level detection result DET obtained by inverting the high level is output.

 検出結果DETがローレベルであるため、タイミングT19において、ランプ信号は低周波数のランプ信号RMPLのままである。同図の選択されたランプ信号RMPSの波形は、低周波数のランプ信号RMPLと同一となる。同図に例示するように、ランプ信号RMPLは、周波数の切替えが判断されるタイミングT18乃至T19において、一定に維持される。これは、セレクタ311による周波数の切替え完了までに若干の時間を要するためである。 Since the detection result DET is at the low level, the ramp signal remains the low-frequency ramp signal RMPL at the timing T19. The waveform of the selected ramp signal RMPS in the figure is the same as that of the low frequency ramp signal RMPL. As illustrated in the figure, the ramp signal RMPL is maintained constant at timings T18 to T19 at which frequency switching is determined. This is because it takes some time to complete the frequency switching by the selector 311.

 カウンタ313は、比較結果CMP_OUTが反転するまでのタイミングT11乃至T12と、T14乃至T15とにおいて計数値CNTを計数する。これにより、リセットレベルに対するAD変換が2回行われる。また、タイミングT17乃至T20においても同様に計数値CNTが計数される。これにより、信号レベルに対するAD変換が1回のみ行われる。 The counter 313 counts the count value CNT at timings T11 to T12 and T14 to T15 until the comparison result CMP_OUT is inverted. Thereby, AD conversion for the reset level is performed twice. Similarly, the count value CNT is counted at timings T17 to T20. Thereby, AD conversion with respect to a signal level is performed only once.

 除算回路314は、信号レベルの計数値CNTを除算せず、CDS処理を行って画素データDoutとして出力する。一方、リセットレベルの計数値CNTは「2」により除算される。 The division circuit 314 performs CDS processing without dividing the signal level count value CNT, and outputs the result as pixel data Dout. On the other hand, the reset level count value CNT is divided by “2”.

 上述したように、信号レベルが閾値以下(すなわち、輝度が高い)場合には、低周波数のランプ信号が選択される。これにより、ランプ信号の振幅を大きくして、高輝度の場合にオーバーフローせずにAD変換することができる。したがって、画質を向上させることができる。なお、画素毎のサンプリング回数が少なくなるものの、高輝度の場合には、ランダムノイズが比較的小さいため、SN比は悪化しない。 As described above, when the signal level is equal to or lower than the threshold (that is, the luminance is high), the low-frequency ramp signal is selected. As a result, the amplitude of the ramp signal can be increased and AD conversion can be performed without overflow in the case of high luminance. Therefore, the image quality can be improved. Although the number of times of sampling for each pixel is reduced, in the case of high luminance, since the random noise is relatively small, the SN ratio is not deteriorated.

 なお、低周波数のランプ信号が選択された場合に除算回路314が除算しない構成としているが、このときに除算を行うこともできる。例えば、高輝度の場合に画素毎に2回AD変換し、低輝度の場合に画素毎に4回AD変換する場合を考える。この場合に除算回路314は、高輝度の場合に「2」により除算し、低輝度の場合に「4」により除算すればよい。このように、ランプ信号の周波数に応じた画素毎のAD変換回数が、除数に設定される。 Note that the division circuit 314 does not divide when a low-frequency ramp signal is selected, but division can also be performed at this time. For example, consider a case where AD conversion is performed twice for each pixel when the luminance is high, and AD conversion is performed four times for each pixel when the luminance is low. In this case, the division circuit 314 may divide by “2” when the luminance is high and divide by “4” when the luminance is low. Thus, the number of AD conversions for each pixel corresponding to the frequency of the ramp signal is set as the divisor.

 図9および図10に例示したように、AD変換器310が、画素の輝度に応じて適応的にランプ信号を切り替えることにより、読出し速度を維持しつつ、画像データの画質を向上させることができる。 As illustrated in FIGS. 9 and 10, the AD converter 310 adaptively switches the ramp signal according to the luminance of the pixel, so that the image quality of the image data can be improved while maintaining the reading speed. .

 図11は、本技術の第1の実施の形態における信号レベルが高く、サンプリング回数が最大4回のときの固体撮像素子の動作の一例を示すタイミングチャートである。 FIG. 11 is a timing chart showing an example of the operation of the solid-state imaging device when the signal level is high and the number of sampling times is a maximum of 4 times in the first embodiment of the present technology.

 図12は、本技術の第1の実施の形態における信号レベルが低く、サンプリング回数が最大4回のときの固体撮像素子の動作の一例を示すタイミングチャートである。 FIG. 12 is a timing chart showing an example of the operation of the solid-state imaging device when the signal level in the first embodiment of the present technology is low and the number of samplings is a maximum of four times.

 図9および図10では、画素毎のサンプリング回数を最大で2回としていたが、サンプリング回数は2回に限定されない。例えば、図11および図12に例示するように、画素毎のサンプリング回数を最大で4回とすることもできる。 9 and 10, the maximum number of times of sampling for each pixel is two, but the number of times of sampling is not limited to two. For example, as illustrated in FIG. 11 and FIG. 12, the number of samplings per pixel can be set to a maximum of four times.

 図13は、本技術の第1の実施の形態における固体撮像素子200の動作の一例を示すフローチャートである。この動作は、例えば、画像データを撮像するための所定のアプリケーションが実行されたときに開始される。 FIG. 13 is a flowchart illustrating an example of the operation of the solid-state imaging device 200 according to the first embodiment of the present technology. This operation is started, for example, when a predetermined application for capturing image data is executed.

 垂直走査回路210は、行を選択して駆動する(ステップS901)。AD変換器310内の検出器320は、比較結果CMP_OUTを監視して、画素の輝度が所定輝度以上の高輝度であるか否かを判断する(ステップS902)。 The vertical scanning circuit 210 selects and drives a row (step S901). The detector 320 in the AD converter 310 monitors the comparison result CMP_OUT and determines whether or not the luminance of the pixel is higher than a predetermined luminance (step S902).

 高輝度の場合に(ステップS902:Yes)、セレクタ311は、高輝度用の低周波数のランプ信号を選択し、AD変換器310は、画素毎に信号レベルに対するAD変換を1回行う(ステップS903)。一方、所定輝度より低い低輝度の場合に(ステップS902:No)、セレクタ311は、低輝度用の高周波数のランプ信号を選択し、AD変換器310は、画素毎に信号レベルに対するAD変換を2回行う(ステップS904)。そして、AD変換器310は、信号レベルの計数値を除算する(ステップS905)。 In the case of high luminance (step S902: Yes), the selector 311 selects a low-frequency ramp signal for high luminance, and the AD converter 310 performs AD conversion for the signal level once for each pixel (step S903). ). On the other hand, when the luminance is lower than the predetermined luminance (step S902: No), the selector 311 selects a high-frequency ramp signal for low luminance, and the AD converter 310 performs AD conversion on the signal level for each pixel. This is performed twice (step S904). Then, the AD converter 310 divides the count value of the signal level (step S905).

 ステップS903またはS905の後に、垂直走査回路210は、全行を選択したか否かを判断する(ステップS906)。全行を選択していない場合に(ステップS906:No)、垂直走査回路210は、ステップS901以降を繰り返し実行する。一方、全行を選択した場合に(ステップS906:Yes)、画像データの撮像のための動作を終了する。複数枚の画像データを連続して撮像する場合には、ステップS901乃至S906の処理が、垂直同期信号VSYNCに同期して繰り返し実行される。 After step S903 or S905, the vertical scanning circuit 210 determines whether all rows have been selected (step S906). When all the rows have not been selected (Step S906: No), the vertical scanning circuit 210 repeatedly executes Step S901 and the subsequent steps. On the other hand, when all the rows have been selected (step S906: Yes), the operation for capturing image data is terminated. When a plurality of pieces of image data are continuously captured, the processes in steps S901 to S906 are repeatedly executed in synchronization with the vertical synchronization signal VSYNC.

 このように、本技術の第1の実施の形態によれば、セレクタ311が、画素信号の信号レベルに応じた周波数のランプ信号を選択して供給するため、AD変換器310は、画素毎に、その画素の輝度に応じた回数のAD変換を行うことができる。例えば、画素の輝度が低いほど、AD変換の回数を多くしてランダムノイズを低減することができる。これにより、読出し速度を維持しつつ、画質を向上させることができる。 As described above, according to the first embodiment of the present technology, the selector 311 selects and supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal. The AD conversion can be performed a number of times according to the luminance of the pixel. For example, as the luminance of the pixel is lower, the number of AD conversions can be increased to reduce random noise. Thereby, it is possible to improve the image quality while maintaining the reading speed.

 <2.第2の実施の形態>
 上述の第1の実施の形態では、画素毎のサンプリング(すなわち、AD変換)回数の最大値を2回などに固定していたが、ノイズレベルが想定より大きな場合には、設定したサンプリング回数では不足し、SN比が悪化するおそれがある。この第2の実施の形態の固体撮像素子200は、OPB(OPtical Black)画素の画素信号に基づいてサンプリング回数の最大値を変更する点において第1の実施の形態と異なる。
<2. Second Embodiment>
In the first embodiment described above, the maximum value of the number of sampling (ie, AD conversion) for each pixel is fixed to 2 or the like. However, when the noise level is higher than expected, There is a risk that the S / N ratio will deteriorate. The solid-state imaging device 200 according to the second embodiment is different from the first embodiment in that the maximum value of the number of times of sampling is changed based on a pixel signal of an OPB (OPtical Black) pixel.

 図14は、本技術の第2の実施の形態における固体撮像素子200の一構成例を示すブロック図である。この第2の実施の形態の固体撮像素子200は、サンプリング回数設定部270をさらに備える点において第1の実施の形態と異なる。また、画素アレイ部220に、複数のOPB画素222と複数の通常画素223とが二次元格子状配置される点において第1の実施の形態と異なる。 FIG. 14 is a block diagram illustrating a configuration example of the solid-state imaging device 200 according to the second embodiment of the present technology. The solid-state imaging device 200 of the second embodiment is different from the first embodiment in that it further includes a sampling number setting unit 270. Further, the pixel array unit 220 is different from the first embodiment in that a plurality of OPB pixels 222 and a plurality of normal pixels 223 are arranged in a two-dimensional lattice pattern.

 OPB画素222は、遮光された画素であり、通常画素223は遮光されてない画素である。以下、OPB画素222からの画素信号を「遮光画素信号」と称し、通常画素223からの画素信号を「通常画素信号」と称する。なお、OPB画素222は、特許請求の範囲に記載の遮光画素の一例である。 The OPB pixel 222 is a pixel that is shielded from light, and the normal pixel 223 is a pixel that is not shielded from light. Hereinafter, the pixel signal from the OPB pixel 222 is referred to as a “light-shielded pixel signal”, and the pixel signal from the normal pixel 223 is referred to as a “normal pixel signal”. The OPB pixel 222 is an example of a light-shielding pixel described in the claims.

 サンプリング回数設定部270は、OPB画素222からの遮光画素信号に基づいて画素毎のサンプリング回数の最大値を設定するものである。このサンプリング回数設定部270は、設定した値をタイミング制御回路250に供給する。タイミング制御回路250は、サンプリング回数の設定値に対応する周波数のランプ信号RMPHをDAC230に供給させる。なお、サンプリング回数設定部270は、特許請求の範囲に記載の設定部の一例である。 The sampling number setting unit 270 sets the maximum number of sampling times for each pixel based on the light-shielded pixel signal from the OPB pixel 222. The sampling number setting unit 270 supplies the set value to the timing control circuit 250. The timing control circuit 250 supplies the DAC 230 with a ramp signal RMPH having a frequency corresponding to the set value of the number of samplings. The sampling number setting unit 270 is an example of a setting unit described in the claims.

 図15は、本技術の第2の実施の形態におけるサンプリング回数設定部270の一構成例を示すブロック図である。このサンプリング回数設定部270は、OPB分散演算部271、OPB平均演算部272、重み係数取得部273、サンプリング回数決定部274、閾値演算部275、上限回数取得部276およびレジスタ277を備える。 FIG. 15 is a block diagram illustrating a configuration example of the sampling number setting unit 270 according to the second embodiment of the present technology. The sampling number setting unit 270 includes an OPB variance calculation unit 271, an OPB average calculation unit 272, a weighting factor acquisition unit 273, a sampling number determination unit 274, a threshold calculation unit 275, an upper limit number acquisition unit 276, and a register 277.

 OPB平均演算部272は、複数のOPB画素222のそれぞれの遮光画素信号PIX_OPBの平均Pix_aveを演算するものである。この平均Pix_aveは、例えば、次の式により演算される。OPB平均演算部272は、演算結果をOPB分散演算部271および重み係数取得部273に供給する。

Figure JPOXMLDOC01-appb-M000001
上式において、Nは、OPB画素222の画素数である。 The OPB average calculator 272 calculates an average Pix_ave of the light-shielded pixel signal PIX_OPB of each of the plurality of OPB pixels 222. This average Pix_ave is calculated by the following equation, for example. The OPB average calculation unit 272 supplies the calculation result to the OPB variance calculation unit 271 and the weight coefficient acquisition unit 273.
Figure JPOXMLDOC01-appb-M000001
In the above equation, N is the number of OPB pixels 222.

 OPB分散演算部271は、複数のOPB画素222のそれぞれの遮光画素信号PIX_OPBの分散Pix_devを演算するものである。この分散Pix_devは、例えば、次の式により演算される。OPB分散演算部271は、重み係数取得部273に供給する。

Figure JPOXMLDOC01-appb-M000002
The OPB variance calculation unit 271 calculates the variance Pix_dev of each light-shielded pixel signal PIX_OPB of the plurality of OPB pixels 222. This variance Pix_dev is calculated by the following equation, for example. The OPB variance calculation unit 271 supplies the weighting coefficient acquisition unit 273.
Figure JPOXMLDOC01-appb-M000002

 レジスタ277は、サンプリング回数の演算に要する各種の設定値を保持するものである。例えば、レジスタ277には、平均最大閾値Th_ave_max、平均最小閾値Th_ave_min、分散最大閾値Th_dev_max、および、分散最小閾値Th_dev_minが保持される。ここで、平均最大閾値Th_ave_maxは、平均Pix_aveと比較する閾値の最大値である。平均最小閾値Th_ave_minは、平均Pix_aveと比較する閾値の最小値である。分散最大閾値Th_dev_maxは、分散Pix_devと比較する閾値の最大値である。分散最小閾値Th_dev_minは、分散Pix_devと比較する閾値の最小値である。平均や分散と比較する閾値には、画素信号に対するゲインPix_gainに比例した値が設定される。このため、ゲインが最大の場合に最大の閾値が設定され、ゲインが最小の場合に最小の閾値が設定される。 The register 277 holds various set values required for the calculation of the number of samplings. For example, the register 277 holds an average maximum threshold Th_ave_max, an average minimum threshold Th_ave_min, a variance maximum threshold Th_dev_max, and a variance minimum threshold Th_dev_min. Here, the average maximum threshold Th_ave_max is a maximum value of the threshold compared with the average Pix_ave. The average minimum threshold Th_ave_min is a minimum value of the threshold compared with the average Pix_ave. The variance maximum threshold Th_dev_max is the maximum value of the threshold compared with the variance Pix_dev. The minimum variance threshold Th_dev_min is a minimum threshold value to be compared with the variance Pix_dev. A value proportional to the gain Pix_gain for the pixel signal is set as the threshold value to be compared with the average or variance. For this reason, the maximum threshold is set when the gain is maximum, and the minimum threshold is set when the gain is minimum.

 また、レジスタ277には、画素信号をAD変換する際のサンプリング回数上限値Mult_max_numが量子化ビット数ごとに保持される。例えば、量子化ビット数が12ビットの場合のサンプリング回数上限値Mult_max_12と、量子化ビット数が10ビットの場合のサンプリング回数上限値Mult_max_10とが保持される。例えば、量子化ビット数が大きいほど、大きな上限値が設定される。 Also, the register 277 holds a sampling number upper limit value Multi_max_num for AD conversion of the pixel signal for each quantization bit number. For example, the sampling number upper limit Mult_max_12 when the number of quantization bits is 12 bits and the sampling number upper limit Mult_max_10 when the number of quantization bits is 10 bits are held. For example, a larger upper limit value is set as the number of quantization bits is larger.

 上限回数取得部276は、撮像制御部130により指定された量子化ビット数Mult_bit_numに対応するサンプリング回数上限値Mult_max_numをレジスタ277から読み出すものである。この上限回数取得部276は、読み出したサンプリング回数上限値Mult_max_numをサンプリング回数決定部274に供給する。 The upper limit number acquisition unit 276 reads the sampling number upper limit value Multi_max_num corresponding to the quantization bit number Multi_bit_num specified by the imaging control unit 130 from the register 277. The upper limit number acquisition unit 276 supplies the read sampling number upper limit value Multi_max_num to the sampling number determination unit 274.

 閾値演算部275は、撮像制御部130により指定されたゲインPix_gainに応じた閾値を演算するものである。例えば、閾値演算部275は、レジスタ277から平均最大閾値Th_ave_maxおよび平均最小閾値Th_ave_minを読み出し、線形補間により、ゲインPix_gainに対応する平均閾値Th_aveを演算する。また、閾値演算部275は、レジスタ277から分散最大閾値Th_dev_max、および、分散最小閾値Th_dev_minを読み出し、線形補間により、ゲインPix_gainに対応する分散閾値Th_devを演算する。そして、閾値演算部275は、演算した平均閾値Th_aveおよび分散閾値Th_devを重み係数取得部273に供給する。 The threshold value calculation unit 275 calculates a threshold value corresponding to the gain Pix_gain specified by the imaging control unit 130. For example, the threshold value calculation unit 275 reads the average maximum threshold value Th_ave_max and the average minimum threshold value Th_ave_min from the register 277, and calculates the average threshold value Th_ave corresponding to the gain Pix_gain by linear interpolation. Further, the threshold calculation unit 275 reads the maximum variance threshold Th_dev_max and the minimum variance threshold Th_dev_min from the register 277, and calculates the variance threshold Th_dev corresponding to the gain Pix_gain by linear interpolation. Then, the threshold calculation unit 275 supplies the calculated average threshold Th_ave and variance threshold Th_dev to the weight coefficient acquisition unit 273.

 重み係数取得部273は、平均Pix_aveおよび分散Pix_devと、平均閾値Th_aveおよび分散閾値Th_devとに基づいて重み係数Mult_wegihtを求めるものである。 The weighting coefficient acquisition unit 273 obtains the weighting coefficient Mult_wegiht based on the average Pix_ave and the variance Pix_dev, and the average threshold Th_ave and the variance threshold Th_dev.

 例えば、重み係数取得部273は、次の式が成立するか否かを判断する。
  Pix_ave>Th_ave             ・・・式1
  Pix_dev>Th_dev             ・・・式2
For example, the weight coefficient acquisition unit 273 determines whether or not the following expression is established.
Pix_ave> Th_ave Equation 1
Pix_dev> Th_dev Equation 2

 式1および式2の一方のみが成立する場合に重み係数取得部273は、重み係数Mult_wegihtに「1」を設定する。一方、式1および式2の両方が成立する場合に重み係数取得部273は、重み係数Mult_weightに「2」を設定する。そして、重み係数取得部273は、求めた重み係数Mult_weightをサンプリング回数決定部274に供給する。 When only one of Equation 1 and Equation 2 holds, the weighting factor acquisition unit 273 sets “1” to the weighting factor Multi_weigh. On the other hand, when both Expression 1 and Expression 2 hold, the weighting factor acquisition unit 273 sets “2” to the weighting factor Multi_weight. Then, the weight coefficient acquisition unit 273 supplies the obtained weight coefficient Multi_weight to the sampling number determination unit 274.

 サンプリング回数決定部274は、サンプリング回数上限値Mult_max_numと重み係数Mult_weightとに基づいて、サンプリング回数Mult_numを決定するものである。このサンプリング回数決定部274は、例えば、次の式が成立するか否かを判断する。
  (Mult_weight)>Mult_max_num ・・・式3
The sampling number determination unit 274 determines the sampling number Mult_num based on the sampling number upper limit value Multi_max_num and the weighting coefficient Mult_weight. For example, the sampling number determination unit 274 determines whether or not the following expression holds.
(Mult_weight) 2 > Mult_max_num Expression 3

 式3が成立する場合にサンプリング回数決定部274は、サンプリング回数上限値Mult_max_numを、サンプリング回数Mult_numとする。一方、式3が成立しない場合にサンプリング回数決定部274は、重み係数Mult_weightの二乗をサンプリング回数Mult_numとする。サンプリング回数決定部274は、求めたサンプリング回数Mult_numを、サンプリング回数の最大値としてタイミング制御回路250に供給する。タイミング制御回路250は、そのサンプリング回数Mult_numに応じた周波数のランプ信号を、周波数の高い方のランプ信号RMPHとしてDAC230に生成させる。 When Expression 3 is satisfied, the sampling count determination unit 274 sets the sampling count upper limit value Multi_max_num as the sampling count Multit_num. On the other hand, when Expression 3 is not satisfied, the sampling number determination unit 274 sets the square of the weighting coefficient Multi_weight as the sampling number Multi_num. The sampling number determination unit 274 supplies the obtained sampling number Mult_num to the timing control circuit 250 as the maximum value of the sampling number. The timing control circuit 250 causes the DAC 230 to generate a ramp signal having a frequency corresponding to the sampling count Mult_num as a ramp signal RMPH having a higher frequency.

 図16は、本技術の第2の実施の形態におけるサンプリング回数の設定例を示す図である。例えば、サンプリング回数上限値Mult_max_numが「4」、重み係数Mult_weightが「0」の場合、サンプリング回数Mult_numとして「1」が設定される。また、サンプリング回数上限値Mult_max_numが「4」、重み係数Mult_weightが「1」の場合、サンプリング回数Mult_numとして「2」が設定される。 FIG. 16 is a diagram illustrating a setting example of the number of times of sampling in the second embodiment of the present technology. For example, when the sampling count upper limit value Multi_max_num is “4” and the weighting factor Multi_weight is “0”, “1” is set as the sampling count Mult_num. In addition, when the sampling number upper limit value Multi_max_num is “4” and the weighting factor Multi_weight is “1”, “2” is set as the sampling number Multi_num.

 このように、本技術の第2の実施の形態では、固体撮像素子200が遮光画素信号の統計量に基づいてサンプリング回数の最大値を変更するため、OPB画素から推定されるノイズレベルに応じた回数でサンプリングを行うことができる。 As described above, in the second embodiment of the present technology, the solid-state imaging device 200 changes the maximum value of the number of times of sampling based on the statistic of the light-shielded pixel signal, so that the noise level estimated from the OPB pixel is used. Sampling can be performed by the number of times.

 <3.第3の実施の形態>
 上述の第1の実施の形態では、画素信号の信号レベルが、閾値より高いか否かによりセレクタ311がランプ信号の周波数を2段階で切り替えていた。しかしながら、画素毎の信号レベルの変動の大きな画像データなどにおいては、切り替えた周波数が高すぎる場合や低すぎる場合があり、2段階の切り替えでは画質が十分に向上しないおそれがある。この第3の実施の形態の固体撮像素子200は、セレクタ311がランプ信号の周波数を3段階で切り替える点において第1の実施の形態と異なる。
<3. Third Embodiment>
In the first embodiment described above, the selector 311 switches the frequency of the ramp signal in two steps depending on whether the signal level of the pixel signal is higher than the threshold value. However, in image data having a large signal level fluctuation for each pixel, the switched frequency may be too high or too low, and the image quality may not be sufficiently improved by the two-stage switching. The solid-state imaging device 200 of the third embodiment is different from the first embodiment in that the selector 311 switches the frequency of the ramp signal in three stages.

 図17は、本技術の第3の実施の形態における検出器320の一構成例を示すブロック図である。この第3の実施の形態の検出器320は、AND(論理積)ゲート323、ラッチ回路324およびインバータ325をさらに備える点において第1の実施の形態と異なる。 FIG. 17 is a block diagram illustrating a configuration example of the detector 320 according to the third embodiment of the present technology. The detector 320 of the third embodiment differs from that of the first embodiment in that it further includes an AND (logical product) gate 323, a latch circuit 324, and an inverter 325.

 第3の実施の形態のタイミングジェネレータ251は、異なるタイミングを指定するトリガ信号TRG1およびTRG2を生成する。そして、タイミングジェネレータ251は、トリガ信号TRG1をラッチ回路321に供給し、トリガ信号TRG2をANDゲート323に供給する。 The timing generator 251 according to the third embodiment generates trigger signals TRG1 and TRG2 that specify different timings. Then, the timing generator 251 supplies the trigger signal TRG1 to the latch circuit 321 and supplies the trigger signal TRG2 to the AND gate 323.

 ANDゲート323は、トリガ信号TRG2と比較結果CMP_OUTとの論理積の信号を生成し、ラッチ回路324のイネーブル端子Eに供給するものである。 The AND gate 323 generates a logical product signal of the trigger signal TRG2 and the comparison result CMP_OUT and supplies it to the enable terminal E of the latch circuit 324.

 ラッチ回路324は、ANDゲート323からの信号の示すタイミングにおいて、比較結果CMP_OUTを保持するものである。このラッチ回路324は、保持値をインバータ325に供給する。ラッチ回路324としては、例えば、ゲーティドDラッチが用いられる。ゲーティドDラッチの場合、ラッチ回路324のデータ入力端子には、比較結果CMP_OUTが入力され、出力端子Qは、インバータ325に接続される。 The latch circuit 324 holds the comparison result CMP_OUT at the timing indicated by the signal from the AND gate 323. The latch circuit 324 supplies the hold value to the inverter 325. As the latch circuit 324, for example, a gated D latch is used. In the case of the gated D latch, the comparison result CMP_OUT is input to the data input terminal of the latch circuit 324, and the output terminal Q is connected to the inverter 325.

 インバータ325は、ラッチ回路324の保持値を反転して、検出結果DET2としてセレクタ311に供給するものである。また、第3の実施の形態のインバータ322は、検出結果DET1をセレクタ311に出力する。これらの反転値は、イネーブル信号CAL_EN1およびCAL_EN2として除算回路314にも供給される。なお、インバータ322および325は、特許請求の範囲に記載の論理ゲートの一例である。 The inverter 325 inverts the value held in the latch circuit 324 and supplies the result to the selector 311 as the detection result DET2. Further, the inverter 322 of the third embodiment outputs the detection result DET1 to the selector 311. These inverted values are also supplied to the dividing circuit 314 as enable signals CAL_EN1 and CAL_EN2. Note that the inverters 322 and 325 are examples of logic gates recited in the claims.

 図18は、本技術の第3の実施の形態におけるセレクタ311の動作の一例を示す図である。セレクタ311には、ランプ信号RMPHおよびRMPLの中間の周波数のランプ信号RMPMがさらに入力される。 FIG. 18 is a diagram illustrating an example of the operation of the selector 311 according to the third embodiment of the present technology. The selector 311 further receives a ramp signal RMPM having a frequency intermediate between the ramp signals RMPH and RMPL.

 検出結果DET1およびDET2の両方がローレベル、すなわち画素が高輝度である場合にセレクタ311は、検出結果DET2の出力時において低周波数のランプ信号RMPLを選択する。一方、検出結果DET1およびDET2の両方がハイレベル、すなわち、画素が低輝度である場合にセレクタ311は、高周波数のランプ信号RMPHを選択する。 When both the detection results DET1 and DET2 are at a low level, that is, when the pixel has high brightness, the selector 311 selects the low-frequency ramp signal RMPL when the detection result DET2 is output. On the other hand, when both the detection results DET1 and DET2 are at a high level, that is, when the pixel has low luminance, the selector 311 selects the high-frequency ramp signal RMPH.

 また、検出結果DET1がローレベルで、検出結果DET2がハイレベルである場合、画素の輝度が、トリガ信号TRG1に対応する輝度とトリガ信号TRG2に対応する輝度との中間の輝度であることを示す。この場合にセレクタ311は、検出結果DET1の出力時において、周波数が、ランプ信号RMPHおよびRMPLの中間の周波数であるランプ信号RMPMを選択する。 Further, when the detection result DET1 is at a low level and the detection result DET2 is at a high level, it indicates that the luminance of the pixel is intermediate between the luminance corresponding to the trigger signal TRG1 and the luminance corresponding to the trigger signal TRG2. . In this case, the selector 311 selects the ramp signal RMPM whose frequency is an intermediate frequency between the ramp signals RMPH and RMPL when the detection result DET1 is output.

 このように、第3の実施の形態のセレクタ311は、画素の輝度に応じてランプ信号の周波数を3段階で切り替える。 As described above, the selector 311 according to the third embodiment switches the frequency of the ramp signal in three steps according to the luminance of the pixel.

 図19は、本技術の第1の実施の形態における除算回路314の動作の一例を示す図である。この除算回路314は、イネーブル信号CAL_EN1およびCAL_EN2の両方がローレベル、すなわち画素が高輝度である場合に信号レベルの計数値CNTを除算せずにCDS処理を行って画素データDoutを出力する。一方、イネーブル信号CAL_EN1およびCAL_EN2の両方がハイレベル、すなわち、画素が低輝度である場合に除算回路314は、信号レベルの計数値CNTを、画素毎のサンプリング回数(4回など)により除算し、CDS処理を行って画素データDoutを出力する。 FIG. 19 is a diagram illustrating an example of the operation of the divider circuit 314 according to the first embodiment of the present technology. The division circuit 314 performs the CDS process without dividing the count value CNT of the signal level and outputs the pixel data Dout when both of the enable signals CAL_EN1 and CAL_EN2 are at the low level, that is, when the pixel has high luminance. On the other hand, when both the enable signals CAL_EN1 and CAL_EN2 are at a high level, that is, when the pixel has a low luminance, the division circuit 314 divides the count value CNT of the signal level by the number of samplings (for example, 4 times) for each pixel, CDS processing is performed to output pixel data Dout.

 また、イネーブル信号CAL_EN1およびCAL_EN2の一方がハイレベルで他方がローレベルの場合は、画素の輝度が中間の輝度であることを示す。この場合に除算回路314は、高輝度の場合より少ない所定のサンプリング回数(2回など)により信号レベルの計数値CNTを除算し、CDS処理を行って画素データDoutを出力する。 Also, when one of the enable signals CAL_EN1 and CAL_EN2 is at a high level and the other is at a low level, it indicates that the luminance of the pixel is an intermediate luminance. In this case, the division circuit 314 divides the signal level count value CNT by a predetermined number of samplings (such as twice) less than in the case of high luminance, performs CDS processing, and outputs pixel data Dout.

 図20は、本技術の第3の実施の形態における信号レベルが最も高い場合の固体撮像素子200の動作の一例を示すタイミングチャートである。 FIG. 20 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is the highest in the third embodiment of the present technology.

 タイミング制御回路250は、トリガ信号TRG1およびTRG2を生成するために、イネーブル信号CMP_EN1およびCMP_EN2を内部生成する。そして、タイミング制御回路250は、イネーブル信号CMP_EN1が立ち下がるタイミングT15においてトリガ信号TRG1を生成する。また、タイミング制御回路250は、イネーブル信号CMP_EN2が立ち下がるタイミングT16においてトリガ信号TRG2を生成する。これらのトリガ信号TRG1およびTRG2は、最も周波数の低いランプ信号RMPLの周期内のタイミングであり、それらの信号は、互いに異なる閾値を示す。すなわち、信号レベルについて、異なる2つの閾値が用いられる。以下、信号レベルに関する2つの閾値のうち高い方をThHとし、低い方をThLとする。 The timing control circuit 250 internally generates enable signals CMP_EN1 and CMP_EN2 in order to generate trigger signals TRG1 and TRG2. Then, the timing control circuit 250 generates the trigger signal TRG1 at the timing T15 when the enable signal CMP_EN1 falls. Further, the timing control circuit 250 generates the trigger signal TRG2 at the timing T16 when the enable signal CMP_EN2 falls. These trigger signals TRG1 and TRG2 are timings within the cycle of the ramp signal RMPL having the lowest frequency, and these signals exhibit different threshold values. That is, two different thresholds are used for the signal level. Hereinafter, the higher one of the two thresholds related to the signal level is ThH, and the lower one is ThL.

 検出器320は、トリガ信号TRG1およびTRG2のそれぞれが出力されたときの比較結果CMP_OUTをラッチする。信号レベルが低い方の閾値ThL以下の場合には、トリガ信号TRG1およびTRG2の両方の時点で比較結果CMP_OUTが反転しており、ローレベルである。このため、タイミングT15においてローレベルがラッチされ、それを反転したハイレベルの検出結果DET1が出力される。タイミングT16においても、ローレベルがラッチされ、それを反転したハイレベルの検出結果DET2が出力される。 The detector 320 latches the comparison result CMP_OUT when the trigger signals TRG1 and TRG2 are output. When the signal level is equal to or lower than the lower threshold ThL, the comparison result CMP_OUT is inverted at both time points of the trigger signals TRG1 and TRG2, and is at the low level. For this reason, the low level is latched at timing T15, and a high level detection result DET1 obtained by inverting the low level is output. Also at the timing T16, the low level is latched, and the high level detection result DET2 obtained by inverting the low level is output.

 検出結果DET1およびDET2の両方がハイレベルであるため、タイミングT15およびT16において、ランプ信号は低周波数に切り替えられる。同図の選択されたランプ信号RMPSの波形は、低周波数のランプ信号RMPLと同一となる。このランプ信号に基づいて、画素毎に、例えば画素毎に信号レベルに対して4回のAD変換が実行される。 Since both detection results DET1 and DET2 are at a high level, the ramp signal is switched to a low frequency at timings T15 and T16. The waveform of the selected ramp signal RMPS in the figure is the same as that of the low frequency ramp signal RMPL. Based on this ramp signal, four AD conversions are performed on the signal level for each pixel, for example, for each pixel.

 図21は、本技術の第3の実施の形態における信号レベルが中間値の固体撮像素子200の動作の一例を示すタイミングチャートである。 FIG. 21 is a timing chart illustrating an example of the operation of the solid-state imaging device 200 having the intermediate signal level according to the third embodiment of the present technology.

 信号レベルは、閾値ThLより高く、閾値ThH以下の中間値であったものとする。この場合には、タイミングT15においてローレベルの検出結果DET1が出力され、タイミングT16においてハイレベルの検出結果DET2が出力される。検出結果DET1がローレベルであるため、タイミングT15において、中間の周波数のランプ信号RMPMが選択される。そして、タイミングT16においては、検出結果DET2がハイレベルであるため、ランプ信号RMPMの選択が維持される。このランプ信号に基づいて、画素毎に、例えば画素毎に信号レベルに対して2回のAD変換が実行される。 Suppose that the signal level is an intermediate value higher than the threshold value ThL and lower than or equal to the threshold value ThH. In this case, the low level detection result DET1 is output at timing T15, and the high level detection result DET2 is output at timing T16. Since the detection result DET1 is at a low level, the ramp signal RMPM having an intermediate frequency is selected at timing T15. At timing T16, since the detection result DET2 is at the high level, the selection of the ramp signal RMPM is maintained. Based on this ramp signal, AD conversion is performed twice for each pixel, for example, for each pixel with respect to the signal level.

 図22は、本技術の第3の実施の形態における信号レベルが最も低い場合の固体撮像素子200の動作の一例を示すタイミングチャートである。 FIG. 22 is a timing chart showing an example of the operation of the solid-state imaging device 200 when the signal level is the lowest in the third embodiment of the present technology.

 信号レベルは、閾値ThHより高いものとする。この場合には、タイミングT15およびタイミングT16においてローレベルの検出結果DET2が出力される。検出結果DET1がローレベルであるため、タイミングT15において、中間の周波数のランプ信号RMPMが選択される。そして、タイミングT16において、検出結果DET2がローレベルであるため、最も周波数の低いランプ信号RMPLが選択される。このランプ信号に基づいて、画素毎に、例えば画素毎に信号レベルに対して1回のAD変換が実行される。 Suppose the signal level is higher than the threshold ThH. In this case, a low level detection result DET2 is output at timing T15 and timing T16. Since the detection result DET1 is at a low level, the ramp signal RMPM having an intermediate frequency is selected at timing T15. At timing T16, since the detection result DET2 is at a low level, the ramp signal RMPL having the lowest frequency is selected. Based on this ramp signal, one AD conversion is performed on the signal level for each pixel, for example, for each pixel.

 なお、セレクタ311は、2つの閾値との比較結果に基づいてランプ信号の周波数を3段階で切り替えているが、3つ以上の閾値との比較結果に基づいて、周波数を4段階以上で切り替えることもできる。この場合においても、同様に、画素信号の信号レベルが低い(すなわち、輝度が高い)ほど、周波数の低いランプ信号が選択される。 Note that the selector 311 switches the frequency of the ramp signal in three steps based on the comparison result with two threshold values, but switches the frequency in four steps or more based on the comparison result with three or more threshold values. You can also. In this case, similarly, the lower the signal level of the pixel signal (that is, the higher the luminance), the lower the frequency of the ramp signal is selected.

 また、第3の実施の形態において、第2の実施の形態のように、遮光画素信号の統計量に基づいてサンプリング回数の最大値を設定することもできる。 In the third embodiment, as in the second embodiment, the maximum value of the number of samplings can be set based on the statistic of the light-shielded pixel signal.

 このように、本技術の第3の実施の形態では、画素信号と2つの閾値との比較結果に基づいて、セレクタ311がランプ信号の周波数を3段階で切り替えるため、2段階で切り替える場合よりも細かく周波数を制御することができる。これにより、画像データの画質をさらに向上させることができる。 As described above, in the third embodiment of the present technology, the selector 311 switches the frequency of the ramp signal in three steps based on the comparison result between the pixel signal and the two threshold values, so that the selector 311 switches the frequency of the ramp signal in two steps. The frequency can be finely controlled. Thereby, the image quality of image data can be further improved.

 <4.第4の実施の形態>
 上述の第1の実施の形態では、比較結果CMP_OUTを検出器320が監視して、画素信号のレベルが閾値より高いか否かを検出していたが、比較結果CMP_OUTの代わりに計数値CNTを監視することもできる。この第4の実施の形態の検出器は、計数値CNTに基づいて画素信号の信号レベルが閾値より高いか否かを検出する点において第1の実施の形態と異なる。
<4. Fourth Embodiment>
In the first embodiment described above, the comparison result CMP_OUT is monitored by the detector 320 to detect whether or not the level of the pixel signal is higher than the threshold value, but the count value CNT is used instead of the comparison result CMP_OUT. It can also be monitored. The detector of the fourth embodiment is different from that of the first embodiment in that it detects whether the signal level of the pixel signal is higher than a threshold value based on the count value CNT.

 図23は、本技術の第4の実施の形態におけるAD変換器310の一構成例を示すブロック図である。この第4の実施の形態のAD変換器310は、検出器320の代わりに検出器330を備える点において第1の実施の形態と異なる。また、第4の実施の形態のカウンタ313は、計数値CNTを除算回路314に加えて検出器330にさらに出力する。 FIG. 23 is a block diagram illustrating a configuration example of the AD converter 310 according to the fourth embodiment of the present technology. The AD converter 310 of the fourth embodiment is different from that of the first embodiment in that a detector 330 is provided instead of the detector 320. In addition, the counter 313 of the fourth embodiment adds the count value CNT to the division circuit 314 and further outputs it to the detector 330.

 検出器330は、アナログの閾値をAD変換した際のデジタル値と、計数値CNTとを比較する。そして、検出器330は、その比較結果に基づいて検出結果DETおよびイネーブル信号CAL_ENを生成する。 The detector 330 compares the digital value when the analog threshold value is AD-converted with the count value CNT. Then, the detector 330 generates a detection result DET and an enable signal CAL_EN based on the comparison result.

 なお、第4の実施の形態において、第2の実施の形態のように、遮光画素信号の統計量に基づいてサンプリング回数を設定することもできる。また、第3の実施の形態のように周波数を3段階で切り替えることもできる。 In the fourth embodiment, the number of samplings can be set based on the statistic of the light-shielded pixel signal as in the second embodiment. Further, the frequency can be switched in three stages as in the third embodiment.

 このように、本技術の第4の実施の形態によれば、検出器330が、計数値CNTに基づいて画素信号の信号レベルが閾値より高いか否かを検出するため、比較結果CMP_OUTを用いずに検出結果DETを生成することができる。 As described above, according to the fourth embodiment of the present technology, the detector 330 uses the comparison result CMP_OUT to detect whether the signal level of the pixel signal is higher than the threshold value based on the count value CNT. The detection result DET can be generated without the need.

 <5.第5の実施の形態>
 上述の第1の実施の形態では、比較結果CMP_OUTを検出器320がラッチ回路321およびインバータ322を用いて検出結果DETを生成していたが、ラッチ回路321等を用いずに検出結果DETを生成することもできる。この第5の実施の形態の検出器は、ラッチ回路321の代わりに比較器により検出結果DETを生成する点において第1の実施の形態と異なる。
<5. Fifth embodiment>
In the first embodiment described above, the detector 320 generates the detection result DET from the comparison result CMP_OUT using the latch circuit 321 and the inverter 322. However, the detection result DET is generated without using the latch circuit 321 or the like. You can also The detector of the fifth embodiment is different from the first embodiment in that the detection result DET is generated by a comparator instead of the latch circuit 321.

 図24は、本技術の第4の実施の形態におけるAD変換器310の一構成例を示すブロック図である。この第4の実施の形態のAD変換器310は、検出器320の代わりに検出器340を備える点において第1の実施の形態と異なる。 FIG. 24 is a block diagram illustrating a configuration example of the AD converter 310 according to the fourth embodiment of the present technology. The AD converter 310 according to the fourth embodiment differs from the first embodiment in that a detector 340 is provided instead of the detector 320.

 検出器340には、比較器341が配置される。比較器341は、閾値を示すバイアス電圧Vbiasと画素信号Vinとを比較するものである。この比較器341は、比較結果を検出結果DETおよびイネーブル信号CAL_ENとして出力する。 A detector 340 is provided with a comparator 341. The comparator 341 compares the bias voltage Vbias indicating the threshold value with the pixel signal Vin. The comparator 341 outputs the comparison result as a detection result DET and an enable signal CAL_EN.

 なお、第4の実施の形態において、第2の実施の形態のように、遮光画素信号の統計量に基づいてサンプリング回数の最大値を設定することもできる。また、第3の実施の形態のように周波数を3段階で切り替えることもできる。 In the fourth embodiment, the maximum number of samplings can be set based on the statistic of the light-shielded pixel signal as in the second embodiment. Further, the frequency can be switched in three stages as in the third embodiment.

 このように、本技術の第4の実施の形態によれば、検出器340が、閾値を示すバイアス電圧と画素信号とを比較して検出結果DETを生成するため、ラッチ回路321およびインバータ322を用いずに検出結果DETを生成することができる。 As described above, according to the fourth embodiment of the present technology, the detector 340 compares the bias voltage indicating the threshold with the pixel signal to generate the detection result DET. The detection result DET can be generated without using it.

 <6.移動体への応用例>
 本開示に係る技術(本技術)は、様々な製品へ応用することができる。例えば、本開示に係る技術は、自動車、電気自動車、ハイブリッド電気自動車、自動二輪車、自転車、パーソナルモビリティ、飛行機、ドローン、船舶、ロボット等のいずれかの種類の移動体に搭載される装置として実現されてもよい。
<6. Application example to mobile objects>
The technology according to the present disclosure (present technology) can be applied to various products. For example, the technology according to the present disclosure is realized as a device that is mounted on any type of mobile body such as an automobile, an electric vehicle, a hybrid electric vehicle, a motorcycle, a bicycle, personal mobility, an airplane, a drone, a ship, and a robot. May be.

 図25は、本開示に係る技術が適用され得る移動体制御システムの一例である車両制御システムの概略的な構成例を示すブロック図である。 FIG. 25 is a block diagram illustrating a schematic configuration example of a vehicle control system that is an example of a mobile control system to which the technology according to the present disclosure can be applied.

 車両制御システム12000は、通信ネットワーク12001を介して接続された複数の電子制御ユニットを備える。図26に示した例では、車両制御システム12000は、駆動系制御ユニット12010、ボディ系制御ユニット12020、車外情報検出ユニット12030、車内情報検出ユニット12040、及び統合制御ユニット12050を備える。また、統合制御ユニット12050の機能構成として、マイクロコンピュータ12051、音声画像出力部12052、及び車載ネットワークI/F(interface)12053が図示されている。 The vehicle control system 12000 includes a plurality of electronic control units connected via a communication network 12001. In the example shown in FIG. 26, the vehicle control system 12000 includes a drive system control unit 12010, a body system control unit 12020, an outside information detection unit 12030, an in-vehicle information detection unit 12040, and an integrated control unit 12050. Further, as a functional configuration of the integrated control unit 12050, a microcomputer 12051, a sound image output unit 12052, and an in-vehicle network I / F (interface) 12053 are illustrated.

 駆動系制御ユニット12010は、各種プログラムにしたがって車両の駆動系に関連する装置の動作を制御する。例えば、駆動系制御ユニット12010は、内燃機関又は駆動用モータ等の車両の駆動力を発生させるための駆動力発生装置、駆動力を車輪に伝達するための駆動力伝達機構、車両の舵角を調節するステアリング機構、及び、車両の制動力を発生させる制動装置等の制御装置として機能する。 The drive system control unit 12010 controls the operation of the device related to the drive system of the vehicle according to various programs. For example, the drive system control unit 12010 includes a driving force generator for generating a driving force of a vehicle such as an internal combustion engine or a driving motor, a driving force transmission mechanism for transmitting the driving force to wheels, and a steering angle of the vehicle. It functions as a control device such as a steering mechanism that adjusts and a braking device that generates a braking force of the vehicle.

 ボディ系制御ユニット12020は、各種プログラムにしたがって車体に装備された各種装置の動作を制御する。例えば、ボディ系制御ユニット12020は、キーレスエントリシステム、スマートキーシステム、パワーウィンドウ装置、あるいは、ヘッドランプ、バックランプ、ブレーキランプ、ウィンカー又はフォグランプ等の各種ランプの制御装置として機能する。この場合、ボディ系制御ユニット12020には、鍵を代替する携帯機から発信される電波又は各種スイッチの信号が入力され得る。ボディ系制御ユニット12020は、これらの電波又は信号の入力を受け付け、車両のドアロック装置、パワーウィンドウ装置、ランプ等を制御する。 The body system control unit 12020 controls the operation of various devices mounted on the vehicle body according to various programs. For example, the body system control unit 12020 functions as a keyless entry system, a smart key system, a power window device, or a control device for various lamps such as a headlamp, a back lamp, a brake lamp, a blinker, or a fog lamp. In this case, the body control unit 12020 can be input with radio waves transmitted from a portable device that substitutes for a key or signals from various switches. The body system control unit 12020 receives input of these radio waves or signals, and controls a door lock device, a power window device, a lamp, and the like of the vehicle.

 車外情報検出ユニット12030は、車両制御システム12000を搭載した車両の外部の情報を検出する。例えば、車外情報検出ユニット12030には、撮像部12031が接続される。車外情報検出ユニット12030は、撮像部12031に車外の画像を撮像させるとともに、撮像された画像を受信する。車外情報検出ユニット12030は、受信した画像に基づいて、人、車、障害物、標識又は路面上の文字等の物体検出処理又は距離検出処理を行ってもよい。 The vehicle outside information detection unit 12030 detects information outside the vehicle on which the vehicle control system 12000 is mounted. For example, the imaging unit 12031 is connected to the vehicle exterior information detection unit 12030. The vehicle exterior information detection unit 12030 causes the imaging unit 12031 to capture an image outside the vehicle and receives the captured image. The vehicle outside information detection unit 12030 may perform an object detection process or a distance detection process such as a person, a car, an obstacle, a sign, or a character on a road surface based on the received image.

 撮像部12031は、光を受光し、その光の受光量に応じた電気信号を出力する光センサである。撮像部12031は、電気信号を画像として出力することもできるし、測距の情報として出力することもできる。また、撮像部12031が受光する光は、可視光であっても良いし、赤外線等の非可視光であっても良い。 The imaging unit 12031 is an optical sensor that receives light and outputs an electrical signal corresponding to the amount of received light. The imaging unit 12031 can output an electrical signal as an image, or can output it as distance measurement information. Further, the light received by the imaging unit 12031 may be visible light or invisible light such as infrared rays.

 車内情報検出ユニット12040は、車内の情報を検出する。車内情報検出ユニット12040には、例えば、運転者の状態を検出する運転者状態検出部12041が接続される。運転者状態検出部12041は、例えば運転者を撮像するカメラを含み、車内情報検出ユニット12040は、運転者状態検出部12041から入力される検出情報に基づいて、運転者の疲労度合い又は集中度合いを算出してもよいし、運転者が居眠りをしていないかを判別してもよい。 The vehicle interior information detection unit 12040 detects vehicle interior information. For example, a driver state detection unit 12041 that detects a driver's state is connected to the in-vehicle information detection unit 12040. The driver state detection unit 12041 includes, for example, a camera that images the driver, and the vehicle interior information detection unit 12040 determines the degree of fatigue or concentration of the driver based on the detection information input from the driver state detection unit 12041. It may be calculated or it may be determined whether the driver is asleep.

 マイクロコンピュータ12051は、車外情報検出ユニット12030又は車内情報検出ユニット12040で取得される車内外の情報に基づいて、駆動力発生装置、ステアリング機構又は制動装置の制御目標値を演算し、駆動系制御ユニット12010に対して制御指令を出力することができる。例えば、マイクロコンピュータ12051は、車両の衝突回避あるいは衝撃緩和、車間距離に基づく追従走行、車速維持走行、車両の衝突警告、又は車両のレーン逸脱警告等を含むADAS(Advanced Driver Assistance System)の機能実現を目的とした協調制御を行うことができる。 The microcomputer 12051 calculates a control target value of the driving force generator, the steering mechanism, or the braking device based on the information inside / outside the vehicle acquired by the vehicle outside information detection unit 12030 or the vehicle interior information detection unit 12040, and the drive system control unit A control command can be output to 12010. For example, the microcomputer 12051 realizes ADAS (Advanced Driver Assistance System) functions including vehicle collision avoidance or impact mitigation, tracking based on inter-vehicle distance, vehicle speed maintenance traveling, vehicle collision warning, or vehicle lane departure warning. It is possible to perform cooperative control for the purpose.

 また、マイクロコンピュータ12051は、車外情報検出ユニット12030又は車内情報検出ユニット12040で取得される車両の周囲の情報に基づいて駆動力発生装置、ステアリング機構又は制動装置等を制御することにより、運転者の操作に拠らずに自律的に走行する自動運転等を目的とした協調制御を行うことができる。 Further, the microcomputer 12051 controls the driving force generator, the steering mechanism, the braking device, and the like based on the information around the vehicle acquired by the vehicle exterior information detection unit 12030 or the vehicle interior information detection unit 12040. It is possible to perform cooperative control for the purpose of automatic driving that autonomously travels without depending on the operation.

 また、マイクロコンピュータ12051は、車外情報検出ユニット12030で取得される車外の情報に基づいて、ボディ系制御ユニット12020に対して制御指令を出力することができる。例えば、マイクロコンピュータ12051は、車外情報検出ユニット12030で検知した先行車又は対向車の位置に応じてヘッドランプを制御し、ハイビームをロービームに切り替える等の防眩を図ることを目的とした協調制御を行うことができる。 Further, the microcomputer 12051 can output a control command to the body system control unit 12020 based on information outside the vehicle acquired by the vehicle outside information detection unit 12030. For example, the microcomputer 12051 controls the headlamp according to the position of the preceding vehicle or the oncoming vehicle detected by the outside information detection unit 12030, and performs cooperative control for the purpose of anti-glare, such as switching from a high beam to a low beam. It can be carried out.

 音声画像出力部12052は、車両の搭乗者又は車外に対して、視覚的又は聴覚的に情報を通知することが可能な出力装置へ音声及び画像のうちの少なくとも一方の出力信号を送信する。図25の例では、出力装置として、オーディオスピーカ12061、表示部12062及びインストルメントパネル12063が例示されている。表示部12062は、例えば、オンボードディスプレイ及びヘッドアップディスプレイの少なくとも一つを含んでいてもよい。 The sound image output unit 12052 transmits an output signal of at least one of sound and image to an output device capable of visually or audibly notifying information to a vehicle occupant or the outside of the vehicle. In the example of FIG. 25, an audio speaker 12061, a display unit 12062, and an instrument panel 12063 are illustrated as output devices. The display unit 12062 may include at least one of an on-board display and a head-up display, for example.

 図26は、撮像部12031の設置位置の例を示す図である。 FIG. 26 is a diagram illustrating an example of an installation position of the imaging unit 12031.

 図26では、撮像部12031として、撮像部12101,12102,12103,12104,12105を有する。 26, the imaging unit 12031 includes imaging units 12101, 12102, 12103, 12104, and 12105.

 撮像部12101,12102,12103,12104,12105は、例えば、車両12100のフロントノーズ、サイドミラー、リアバンパ、バックドア及び車室内のフロントガラスの上部等の位置に設けられる。フロントノーズに備えられる撮像部12101及び車室内のフロントガラスの上部に備えられる撮像部12105は、主として車両12100の前方の画像を取得する。サイドミラーに備えられる撮像部12102,12103は、主として車両12100の側方の画像を取得する。リアバンパ又はバックドアに備えられる撮像部12104は、主として車両12100の後方の画像を取得する。車室内のフロントガラスの上部に備えられる撮像部12105は、主として先行車両又は、歩行者、障害物、信号機、交通標識又は車線等の検出に用いられる。 The imaging units 12101, 12102, 12103, 12104, and 12105 are provided, for example, at positions such as a front nose, a side mirror, a rear bumper, a back door, and an upper part of a windshield in the vehicle interior of the vehicle 12100. The imaging unit 12101 provided in the front nose and the imaging unit 12105 provided in the upper part of the windshield in the vehicle interior mainly acquire an image in front of the vehicle 12100. The imaging units 12102 and 12103 provided in the side mirror mainly acquire an image of the side of the vehicle 12100. The imaging unit 12104 provided in the rear bumper or the back door mainly acquires an image behind the vehicle 12100. The imaging unit 12105 provided on the upper part of the windshield in the passenger compartment is mainly used for detecting a preceding vehicle or a pedestrian, an obstacle, a traffic light, a traffic sign, a lane, or the like.

 なお、図27には、撮像部12101ないし12104の撮影範囲の一例が示されている。撮像範囲12111は、フロントノーズに設けられた撮像部12101の撮像範囲を示し、撮像範囲12112,12113は、それぞれサイドミラーに設けられた撮像部12102,12103の撮像範囲を示し、撮像範囲12114は、リアバンパ又はバックドアに設けられた撮像部12104の撮像範囲を示す。例えば、撮像部12101ないし12104で撮像された画像データが重ね合わせられることにより、車両12100を上方から見た俯瞰画像が得られる。 FIG. 27 shows an example of the shooting range of the imaging units 12101 to 12104. The imaging range 12111 indicates the imaging range of the imaging unit 12101 provided in the front nose, the imaging ranges 12112 and 12113 indicate the imaging ranges of the imaging units 12102 and 12103 provided in the side mirrors, respectively, and the imaging range 12114 The imaging range of the imaging part 12104 provided in the rear bumper or the back door is shown. For example, by superimposing the image data captured by the imaging units 12101 to 12104, an overhead image when the vehicle 12100 is viewed from above is obtained.

 撮像部12101ないし12104の少なくとも1つは、距離情報を取得する機能を有していてもよい。例えば、撮像部12101ないし12104の少なくとも1つは、複数の撮像素子からなるステレオカメラであってもよいし、位相差検出用の画素を有する撮像素子であってもよい。 At least one of the imaging units 12101 to 12104 may have a function of acquiring distance information. For example, at least one of the imaging units 12101 to 12104 may be a stereo camera including a plurality of imaging elements, or may be an imaging element having pixels for phase difference detection.

 例えば、マイクロコンピュータ12051は、撮像部12101ないし12104から得られた距離情報を基に、撮像範囲12111ないし12114内における各立体物までの距離と、この距離の時間的変化(車両12100に対する相対速度)を求めることにより、特に車両12100の進行路上にある最も近い立体物で、車両12100と略同じ方向に所定の速度(例えば、0km/h以上)で走行する立体物を先行車として抽出することができる。さらに、マイクロコンピュータ12051は、先行車の手前に予め確保すべき車間距離を設定し、自動ブレーキ制御(追従停止制御も含む)や自動加速制御(追従発進制御も含む)等を行うことができる。このように運転者の操作に拠らずに自律的に走行する自動運転等を目的とした協調制御を行うことができる。 For example, the microcomputer 12051, based on the distance information obtained from the imaging units 12101 to 12104, the distance to each three-dimensional object in the imaging range 12111 to 12114 and the temporal change in this distance (relative speed with respect to the vehicle 12100). In particular, it is possible to extract, as a preceding vehicle, a three-dimensional object that travels at a predetermined speed (for example, 0 km / h or more) in the same direction as the vehicle 12100, particularly the closest three-dimensional object on the traveling path of the vehicle 12100. it can. Further, the microcomputer 12051 can set an inter-vehicle distance to be secured in advance before the preceding vehicle, and can perform automatic brake control (including follow-up stop control), automatic acceleration control (including follow-up start control), and the like. Thus, cooperative control for the purpose of autonomous driving or the like autonomously traveling without depending on the operation of the driver can be performed.

 例えば、マイクロコンピュータ12051は、撮像部12101ないし12104から得られた距離情報を元に、立体物に関する立体物データを、2輪車、普通車両、大型車両、歩行者、電柱等その他の立体物に分類して抽出し、障害物の自動回避に用いることができる。例えば、マイクロコンピュータ12051は、車両12100の周辺の障害物を、車両12100のドライバが視認可能な障害物と視認困難な障害物とに識別する。そして、マイクロコンピュータ12051は、各障害物との衝突の危険度を示す衝突リスクを判断し、衝突リスクが設定値以上で衝突可能性がある状況であるときには、オーディオスピーカ12061や表示部12062を介してドライバに警報を出力することや、駆動系制御ユニット12010を介して強制減速や回避操舵を行うことで、衝突回避のための運転支援を行うことができる。 For example, the microcomputer 12051 converts the three-dimensional object data related to the three-dimensional object to other three-dimensional objects such as a two-wheeled vehicle, a normal vehicle, a large vehicle, a pedestrian, and a utility pole based on the distance information obtained from the imaging units 12101 to 12104. It can be classified and extracted and used for automatic avoidance of obstacles. For example, the microcomputer 12051 identifies obstacles around the vehicle 12100 as obstacles that are visible to the driver of the vehicle 12100 and obstacles that are difficult to see. The microcomputer 12051 determines the collision risk indicating the risk of collision with each obstacle, and when the collision risk is equal to or higher than the set value and there is a possibility of collision, the microcomputer 12051 is connected via the audio speaker 12061 or the display unit 12062. By outputting an alarm to the driver and performing forced deceleration or avoidance steering via the drive system control unit 12010, driving assistance for collision avoidance can be performed.

 撮像部12101ないし12104の少なくとも1つは、赤外線を検出する赤外線カメラであってもよい。例えば、マイクロコンピュータ12051は、撮像部12101ないし12104の撮像画像中に歩行者が存在するか否かを判定することで歩行者を認識することができる。かかる歩行者の認識は、例えば赤外線カメラとしての撮像部12101ないし12104の撮像画像における特徴点を抽出する手順と、物体の輪郭を示す一連の特徴点にパターンマッチング処理を行って歩行者か否かを判別する手順によって行われる。マイクロコンピュータ12051が、撮像部12101ないし12104の撮像画像中に歩行者が存在すると判定し、歩行者を認識すると、音声画像出力部12052は、当該認識された歩行者に強調のための方形輪郭線を重畳表示するように、表示部12062を制御する。また、音声画像出力部12052は、歩行者を示すアイコン等を所望の位置に表示するように表示部12062を制御してもよい。 At least one of the imaging units 12101 to 12104 may be an infrared camera that detects infrared rays. For example, the microcomputer 12051 can recognize a pedestrian by determining whether a pedestrian is present in the captured images of the imaging units 12101 to 12104. Such pedestrian recognition is, for example, whether or not the user is a pedestrian by performing a pattern matching process on a sequence of feature points indicating the outline of an object and a procedure for extracting feature points in the captured images of the imaging units 12101 to 12104 as infrared cameras. It is carried out by the procedure for determining. When the microcomputer 12051 determines that there is a pedestrian in the captured images of the imaging units 12101 to 12104 and recognizes the pedestrian, the audio image output unit 12052 has a rectangular contour line for emphasizing the recognized pedestrian. The display unit 12062 is controlled so as to be superimposed and displayed. Moreover, the audio | voice image output part 12052 may control the display part 12062 so that the icon etc. which show a pedestrian may be displayed on a desired position.

 以上、本開示に係る技術が適用され得る車両制御システムの一例について説明した。本開示に係る技術は、以上説明した構成のうち、撮像部12031に適用され得る。具体的には、例えば、図1の撮像装置100は、撮像部12031に適用することができる。撮像部12031に本開示に係る技術を適用することにより、より見やすい撮影画像を得ることができるため、ドライバの疲労を軽減することが可能になる。 Heretofore, an example of a vehicle control system to which the technology according to the present disclosure can be applied has been described. The technology according to the present disclosure can be applied to the imaging unit 12031 among the configurations described above. Specifically, for example, the imaging device 100 in FIG. 1 can be applied to the imaging unit 12031. By applying the technique according to the present disclosure to the imaging unit 12031, it is possible to obtain a captured image that is easier to see, and thus it is possible to reduce driver fatigue.

 なお、上述の実施の形態は本技術を具現化するための一例を示したものであり、実施の形態における事項と、特許請求の範囲における発明特定事項とはそれぞれ対応関係を有する。同様に、特許請求の範囲における発明特定事項と、これと同一名称を付した本技術の実施の形態における事項とはそれぞれ対応関係を有する。ただし、本技術は実施の形態に限定されるものではなく、その要旨を逸脱しない範囲において実施の形態に種々の変形を施すことにより具現化することができる。 The above-described embodiment shows an example for embodying the present technology, and the matters in the embodiment and the invention-specific matters in the claims have a corresponding relationship. Similarly, the invention specific matter in the claims and the matter in the embodiment of the present technology having the same name as this have a corresponding relationship. However, the present technology is not limited to the embodiment, and can be embodied by making various modifications to the embodiment without departing from the gist thereof.

 また、上述の実施の形態において説明した処理手順は、これら一連の手順を有する方法として捉えてもよく、また、これら一連の手順をコンピュータに実行させるためのプログラム乃至そのプログラムを記憶する記録媒体として捉えてもよい。この記録媒体として、例えば、CD(Compact Disc)、MD(MiniDisc)、DVD(Digital Versatile Disc)、メモリカード、ブルーレイディスク(Blu-ray(登録商標)Disc)等を用いることができる。 Further, the processing procedure described in the above embodiment may be regarded as a method having a series of these procedures, and a program for causing a computer to execute these series of procedures or a recording medium storing the program. You may catch it. As this recording medium, for example, a CD (Compact Disc), an MD (MiniDisc), a DVD (Digital Versatile Disc), a memory card, a Blu-ray disc (Blu-ray (registered trademark) Disc), or the like can be used.

 なお、本明細書に記載された効果はあくまで例示であって、限定されるものではなく、また、他の効果があってもよい。 It should be noted that the effects described in this specification are merely examples, and are not limited, and other effects may be obtained.

 なお、本技術は以下のような構成もとることができる。
(1)画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較器と、
 前記比較結果が反転するまでの期間に亘って計数値を計数するカウンタと
を具備する固体撮像素子。
(2)前記ランプ信号供給部は、前記信号レベルが低いほど周波数の低い前記ランプ信号を供給する
前記(1)記載の固体撮像素子。
(3)前記ランプ信号供給部は、
 前記信号レベルが所定の閾値より高いか否かを検出して検出結果を出力する検出器と、
 前記検出結果に基づいて周波数の異なる複数のランプ信号のいずれかを選択して前記比較器に供給するセレクタと
を備える
前記(1)または(2)記載の固体撮像素子。
(4)前記所定の閾値は、1つであり、
 前記セレクタは、周波数の異なる2つのランプ信号のいずれかを選択し、
 前記検出器は、
 前記2つのランプ信号のうち周波数の低い方の周期内において前記所定の閾値に対応する特定のタイミングを経過したときの前記比較結果を保持値として保持するラッチ回路と、
 前記保持値に基づいて前記検出結果を生成して前記セレクタに出力する論理ゲートと
を備える
前記(3)記載の固体撮像素子。
(5)前記所定の閾値は、異なる2つの閾値を含み、
 前記セレクタは、周波数の異なる3つのランプ信号のいずれかを選択し、
 前記検出器は、
 前記複数のランプ信号のうち周波数の最も低いランプ信号の周期内において前記2つの閾値の一方に対応する第1のタイミングを経過したときの前記比較結果を第1の保持値として保持する第1のラッチ回路と、
 前記周期内において前記2つの閾値の他方に対応する第2のタイミングを経過したときの前記比較結果を第2の保持値として保持する第2のラッチ回路と、
 前記第1および第2の保持値に基づいて前記検出結果を生成して前記セレクタに出力する論理ゲートと
を備える
前記(3)記載の固体撮像素子。
(6)前記検出器は、前記計数値に基づいて前記信号レベルが前記所定の閾値より高いか否かを検出する
前記(3)から(5)のいずれかに記載の固体撮像素子。
(7)前記検出器は、前記所定の閾値を示すバイアス電圧と前記画素信号とを比較して当該比較結果を前記検出結果として出力する
前記(3)から(6)のいずれかに記載の固体撮像素子。
(8)前記選択されたランプ信号の周波数が高いほど大きな除数により前記計数値を除算する除算回路をさらに具備する
前記(1)から(7)のいずれかに記載の固体撮像素子。
(9)遮光された複数の遮光画素のそれぞれからの遮光画素信号のレベルの統計量に基づいて画素毎のサンプリング回数の最大値を設定する設定部をさらに具備し、
 前記画素信号は、遮光されていない複数の有効画素のそれぞれからの有効画素信号と前記遮光画素信号とを含む
前記(1)から(8)のいずれかに記載の固体撮像素子。
(10)画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較器と、
 前記比較結果が反転するまでの期間に亘って計数値を計数するカウンタと、
 前記計数値から生成された画像データを記録する記録部と
を具備する撮像装置。
(11)画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給手順と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較手順と、
 前記比較結果が反転するまでの期間に亘って計数値を計数する計数手順と
を具備する固体撮像素子の制御方法。 
In addition, this technique can also take the following structures.
(1) a ramp signal supply unit that supplies a ramp signal having a frequency corresponding to the signal level of the pixel signal;
A comparator that compares the ramp signal with the pixel signal and outputs a comparison result;
A solid-state imaging device comprising: a counter that counts a count value over a period until the comparison result is inverted.
(2) The solid-state imaging device according to (1), wherein the ramp signal supply unit supplies the ramp signal having a lower frequency as the signal level is lower.
(3) The ramp signal supply unit includes:
A detector that detects whether the signal level is higher than a predetermined threshold and outputs a detection result;
The solid-state imaging device according to (1) or (2), further comprising: a selector that selects any one of a plurality of ramp signals having different frequencies based on the detection result and supplies the selected ramp signal to the comparator.
(4) The predetermined threshold value is one,
The selector selects one of two ramp signals having different frequencies,
The detector is
A latch circuit that holds the comparison result as a hold value when a specific timing corresponding to the predetermined threshold has elapsed within a cycle of the lower frequency of the two ramp signals;
The solid-state imaging device according to (3), further comprising: a logic gate that generates the detection result based on the held value and outputs the detection result to the selector.
(5) The predetermined threshold includes two different thresholds;
The selector selects one of three ramp signals having different frequencies,
The detector is
A first holding value is stored as the first holding value when the first timing corresponding to one of the two threshold values has passed within the cycle of the ramp signal having the lowest frequency among the plurality of ramp signals. A latch circuit;
A second latch circuit that holds the comparison result as a second holding value when a second timing corresponding to the other of the two thresholds has elapsed in the cycle;
The solid-state imaging device according to (3), further comprising: a logic gate that generates the detection result based on the first and second holding values and outputs the detection result to the selector.
(6) The solid-state imaging device according to any one of (3) to (5), wherein the detector detects whether the signal level is higher than the predetermined threshold based on the count value.
(7) The solid detector according to any one of (3) to (6), wherein the detector compares a bias voltage indicating the predetermined threshold with the pixel signal and outputs the comparison result as the detection result. Image sensor.
(8) The solid-state imaging device according to any one of (1) to (7), further including a division circuit that divides the count value by a larger divisor as the frequency of the selected ramp signal is higher.
(9) further includes a setting unit that sets a maximum value of the number of sampling times for each pixel based on a statistic of the level of the light-shielded pixel signal from each of the plurality of light-shielded pixels that are shielded;
The solid-state imaging device according to any one of (1) to (8), wherein the pixel signal includes an effective pixel signal from each of a plurality of effective pixels that are not shielded from light and the light-shielded pixel signal.
(10) a ramp signal supply unit that supplies a ramp signal having a frequency according to the signal level of the pixel signal;
A comparator that compares the ramp signal with the pixel signal and outputs a comparison result;
A counter that counts a count value over a period until the comparison result is inverted;
An imaging apparatus comprising: a recording unit that records image data generated from the count value.
(11) a ramp signal supply procedure for supplying a ramp signal having a frequency corresponding to the signal level of the pixel signal;
A comparison procedure for comparing the ramp signal and the pixel signal and outputting a comparison result;
And a counting procedure for counting a count value over a period until the comparison result is inverted.

 100 撮像装置
 110 撮像レンズ
 120 記録部
 130 撮像制御部
 200 固体撮像素子
 210 垂直走査回路
 220 画素アレイ部
 221 画素
 222 OPB画素
 223 通常画素
 230 DAC
 240 読出し電流制御部
 250 タイミング制御回路
 251 タイミングジェネレータ
 252 クロックジェネレータ
 260 水平走査回路
 270 サンプリング回数設定部
 271 OPB分散演算部
 272 OPB平均演算部
 273 重み係数取得部
 274 サンプリング回数決定部
 275 閾値演算部
 276 上限回数取得部
 277 レジスタ
 300 カラム信号処理部
 310 AD変換器
 311 セレクタ
 312、341 比較器
 313 カウンタ
 314 除算回路
 320、330、340 検出器
 321、324 ラッチ回路
 322、325 インバータ
 323 AND(論理積)ゲート
 350 メモリ
 360 センスアンプ
 370 デジタル演算部
 380 インターフェース部
 12031 撮像部
DESCRIPTION OF SYMBOLS 100 Imaging device 110 Imaging lens 120 Recording part 130 Imaging control part 200 Solid-state image sensor 210 Vertical scanning circuit 220 Pixel array part 221 Pixel 222 OPB pixel 223 Normal pixel 230 DAC
240 read current control unit 250 timing control circuit 251 timing generator 252 clock generator 260 horizontal scanning circuit 270 sampling number setting unit 271 OPB dispersion calculation unit 272 OPB average calculation unit 273 weight coefficient acquisition unit 274 sampling number determination unit 275 threshold calculation unit 276 upper limit Count acquisition unit 277 Register 300 Column signal processing unit 310 AD converter 311 selector 312, 341 comparator 313 counter 314 division circuit 320, 330, 340 detector 321, 324 latch circuit 322, 325 inverter 323 AND (logical product) gate 350 Memory 360 Sense amplifier 370 Digital operation unit 380 Interface unit 12031 Imaging unit

Claims (11)

 画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較器と、
 前記比較結果が反転するまでの期間に亘って計数値を計数するカウンタと
を具備する固体撮像素子。
A ramp signal supply unit that supplies a ramp signal having a frequency according to the signal level of the pixel signal;
A comparator that compares the ramp signal with the pixel signal and outputs a comparison result;
A solid-state imaging device comprising: a counter that counts a count value over a period until the comparison result is inverted.
 前記ランプ信号供給部は、前記信号レベルが低いほど周波数の低い前記ランプ信号を供給する
請求項1記載の固体撮像素子。
The solid-state imaging device according to claim 1, wherein the ramp signal supply unit supplies the ramp signal having a lower frequency as the signal level is lower.
 前記ランプ信号供給部は、
 前記信号レベルが所定の閾値より高いか否かを検出して検出結果を出力する検出器と、
 前記検出結果に基づいて周波数の異なる複数のランプ信号のいずれかを選択して前記比較器に供給するセレクタと
を備える
請求項1記載の固体撮像素子。
The ramp signal supply unit includes:
A detector that detects whether the signal level is higher than a predetermined threshold and outputs a detection result;
The solid-state imaging device according to claim 1, further comprising: a selector that selects one of a plurality of ramp signals having different frequencies based on the detection result and supplies the selected ramp signal to the comparator.
 前記所定の閾値は、1つであり、
 前記セレクタは、周波数の異なる2つのランプ信号のいずれかを選択し、
 前記検出器は、
 前記2つのランプ信号のうち周波数の低い方の周期内において前記所定の閾値に対応する特定のタイミングを経過したときの前記比較結果を保持値として保持するラッチ回路と、
 前記保持値に基づいて前記検出結果を生成して前記セレクタに出力する論理ゲートと
を備える
請求項3記載の固体撮像素子。
The predetermined threshold is one,
The selector selects one of two ramp signals having different frequencies,
The detector is
A latch circuit that holds the comparison result as a hold value when a specific timing corresponding to the predetermined threshold has elapsed within a cycle of the lower frequency of the two ramp signals;
The solid-state imaging device according to claim 3, further comprising: a logic gate that generates the detection result based on the hold value and outputs the detection result to the selector.
 前記所定の閾値は、異なる2つの閾値を含み、
 前記セレクタは、周波数の異なる3つのランプ信号のいずれかを選択し、
 前記検出器は、
 前記複数のランプ信号のうち周波数の最も低いランプ信号の周期内において前記2つの閾値の一方に対応する第1のタイミングを経過したときの前記比較結果を第1の保持値として保持する第1のラッチ回路と、
 前記周期内において前記2つの閾値の他方に対応する第2のタイミングを経過したときの前記比較結果を第2の保持値として保持する第2のラッチ回路と、
 前記第1および第2の保持値に基づいて前記検出結果を生成して前記セレクタに出力する論理ゲートと
を備える
請求項3記載の固体撮像素子。
The predetermined threshold includes two different thresholds;
The selector selects one of three ramp signals having different frequencies,
The detector is
A first holding value is stored as the first holding value when the first timing corresponding to one of the two threshold values has passed within the cycle of the ramp signal having the lowest frequency among the plurality of ramp signals. A latch circuit;
A second latch circuit that holds the comparison result as a second holding value when a second timing corresponding to the other of the two thresholds has elapsed in the cycle;
The solid-state imaging device according to claim 3, further comprising: a logic gate that generates the detection result based on the first and second holding values and outputs the detection result to the selector.
 前記検出器は、前記計数値に基づいて前記信号レベルが前記所定の閾値より高いか否かを検出する
請求項3記載の固体撮像素子。
The solid-state imaging device according to claim 3, wherein the detector detects whether the signal level is higher than the predetermined threshold based on the count value.
 前記検出器は、前記所定の閾値を示すバイアス電圧と前記画素信号とを比較して当該比較結果を前記検出結果として出力する
請求項3記載の固体撮像素子。
The solid-state imaging device according to claim 3, wherein the detector compares a bias voltage indicating the predetermined threshold with the pixel signal, and outputs the comparison result as the detection result.
 前記選択されたランプ信号の周波数が高いほど大きな除数により前記計数値を除算する除算回路をさらに具備する
請求項1記載の固体撮像素子。
The solid-state imaging device according to claim 1, further comprising a division circuit that divides the count value by a larger divisor as the frequency of the selected ramp signal is higher.
 遮光された複数の遮光画素のそれぞれからの遮光画素信号のレベルの統計量に基づいて画素毎のサンプリング回数の最大値を設定する設定部をさらに具備し、
 前記画素信号は、遮光されていない複数の有効画素のそれぞれからの有効画素信号と前記遮光画素信号とを含む
請求項1記載の固体撮像素子。
Further comprising a setting unit for setting a maximum value of the number of times of sampling for each pixel based on a statistic of the level of the light-shielded pixel signal from each of the plurality of light-shielded pixels that are shielded from light
The solid-state imaging device according to claim 1, wherein the pixel signal includes an effective pixel signal from each of a plurality of effective pixels that are not shielded from light and the light-shielded pixel signal.
 画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給部と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較器と、
 前記比較結果が反転するまでの期間に亘って計数値を計数するカウンタと、
 前記計数値から生成された画像データを記録する記録部と
を具備する撮像装置。
A ramp signal supply unit that supplies a ramp signal having a frequency according to the signal level of the pixel signal;
A comparator that compares the ramp signal with the pixel signal and outputs a comparison result;
A counter that counts a count value over a period until the comparison result is inverted;
An imaging apparatus comprising: a recording unit that records image data generated from the count value.
 画素信号の信号レベルに応じた周波数のランプ信号を供給するランプ信号供給手順と、
 前記ランプ信号と前記画素信号とを比較して比較結果を出力する比較手順と、
 前記比較結果が反転するまでの期間に亘って計数値を計数する計数手順と
を具備する固体撮像素子の制御方法。
A ramp signal supply procedure for supplying a ramp signal having a frequency corresponding to the signal level of the pixel signal;
A comparison procedure for comparing the ramp signal and the pixel signal and outputting a comparison result;
And a counting procedure for counting a count value over a period until the comparison result is inverted.
PCT/JP2018/046093 2018-03-19 2018-12-14 Solid-state imaging element, imaging device, and control method for solid-state imaging element Ceased WO2019181110A1 (en)

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