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WO2017060946A1 - Substrat d'inspection - Google Patents

Substrat d'inspection Download PDF

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Publication number
WO2017060946A1
WO2017060946A1 PCT/JP2015/078153 JP2015078153W WO2017060946A1 WO 2017060946 A1 WO2017060946 A1 WO 2017060946A1 JP 2015078153 W JP2015078153 W JP 2015078153W WO 2017060946 A1 WO2017060946 A1 WO 2017060946A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
hole
inspection
inspected
plunger
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2015/078153
Other languages
English (en)
Japanese (ja)
Inventor
文明 名波
智昭 足立
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unitechno Inc
Original Assignee
Unitechno Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unitechno Inc filed Critical Unitechno Inc
Priority to PCT/JP2015/078153 priority Critical patent/WO2017060946A1/fr
Publication of WO2017060946A1 publication Critical patent/WO2017060946A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details

Definitions

  • the bush 26 may be configured to have a cylindrical portion 28 that is in close contact with the through hole 18 and a flange portion 30 that extends from the upper end of the cylindrical portion 28 so as to overlap the inspection wiring portion 16.
  • the large-diameter pedestal portion 22 and the small-diameter shaft portion 24 of the plunger 20 may have a columnar shape, a cylindrical shape, or a polygonal column shape, and the through hole 18 may be a round hole or a polygonal hole. From the viewpoint of ensuring a uniform clearance, when the large diameter pedestal portion 22 of the plunger 20 is cylindrical or cylindrical, the through hole 18 is preferably a round hole, and the large diameter pedestal portion 22 of the plunger 20 is preferred. When is a polygonal column shape, the through hole 18 is preferably a polygonal hole corresponding thereto.
  • the coil spring 40 as an elastic body has a required free length, is accommodated below the plunger 20 in the through hole 18, and the large-diameter pedestal portion 22 of the plunger 20 contacts the lower end surface of the bush 26.
  • the small diameter shaft portion 24 is projected to the upper surface portion of the substrate by being biased so as to come into contact.
  • the coil spring 40 can be formed of any cross-sectional shape and material (for example, a piano wire for spring, a stainless wire, or a plastic). Instead of the coil spring 40, rubber or the like can be used as an elastic body.
  • the through hole 18 and the coil spring 40 accommodated therein can also be lengthened by the thickness of the lower substrate portion 14, and the plunger 20
  • the urging force applied to the large-diameter pedestal portion 22 can be increased.
  • tip part of the small diameter shaft part 24 of the plunger 20 and the to-be-inspected terminal part 4 of the to-be-inspected device 2 can be strengthened, and the electrical resistance of a contact part can be made small stably.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

L'invention concerne un substrat d'inspection, dans lequel la longueur d'un chemin de conduction allant d'un dispositif à inspecter au substrat d'inspection peut être rendu plus court. Un substrat d'inspection (1) a un trou traversant (18) pénétrant dans une partie de substrat au niveau de la position d'une section de câblage d'inspection (16) correspondant à une partie de borne à inspecter (4) d'un dispositif à inspecter (2). Une douille conductrice (26) est située au niveau d'une partie supérieure à l'intérieur du trou traversant (18) et est connectée électriquement à la section de câblage d'inspection (16). Un piston conducteur (20) a un socle de grand diamètre (22) et un arbre de petit diamètre (24) qui sont intégrés l'un à l'autre, le socle de grand diamètre (22) est logé à l'intérieur du trou traversant (18), et l'arbre de petit diamètre (24) est logé de manière coulissante à l'intérieur d'un trou dans la douille (26) de telle sorte qu'une connexion électrique est maintenue. Un ressort hélicoïdal (40) logé à l'intérieur du trou traversant (18) pousse le socle de grand diamètre (22) du piston (20) pour venir en butée contre la face de bord de fond de la douille (26), l'arbre de petit diamètre (24) faisant saillie au niveau de la face supérieure de substrat. Un élément de fermeture (42) retient le ressort hélicoïdal (40) dans une forme comprimée à l'intérieur du trou traversant (18) pour fermer le fond du trou traversant (18).
PCT/JP2015/078153 2015-10-05 2015-10-05 Substrat d'inspection Ceased WO2017060946A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2015/078153 WO2017060946A1 (fr) 2015-10-05 2015-10-05 Substrat d'inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2015/078153 WO2017060946A1 (fr) 2015-10-05 2015-10-05 Substrat d'inspection

Publications (1)

Publication Number Publication Date
WO2017060946A1 true WO2017060946A1 (fr) 2017-04-13

Family

ID=58488112

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2015/078153 Ceased WO2017060946A1 (fr) 2015-10-05 2015-10-05 Substrat d'inspection

Country Status (1)

Country Link
WO (1) WO2017060946A1 (fr)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5799160U (fr) * 1980-12-10 1982-06-18
JPS6296578U (fr) * 1985-12-05 1987-06-19
JPH11174084A (ja) * 1997-12-11 1999-07-02 Mitsui Bussan Machinery Kk コンタクトプローブ
JP2000162270A (ja) * 1998-11-02 2000-06-16 Delaware Capital Formation Inc 試験用ソケット
JP2001013208A (ja) * 1999-06-30 2001-01-19 Mitsubishi Electric Corp 半導体テスト治工具
JP2002185098A (ja) * 2000-12-13 2002-06-28 Omron Corp 成形回路部品の接続構造
JP2002311050A (ja) * 2001-04-12 2002-10-23 Alps Electric Co Ltd 電子ユニットの測定装置
JP2004226397A (ja) * 2003-01-21 2004-08-12 Rino Kogyo Kk プリント基板の接触器，プリント基板，および，プリント基板の製造方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5799160U (fr) * 1980-12-10 1982-06-18
JPS6296578U (fr) * 1985-12-05 1987-06-19
JPH11174084A (ja) * 1997-12-11 1999-07-02 Mitsui Bussan Machinery Kk コンタクトプローブ
JP2000162270A (ja) * 1998-11-02 2000-06-16 Delaware Capital Formation Inc 試験用ソケット
JP2001013208A (ja) * 1999-06-30 2001-01-19 Mitsubishi Electric Corp 半導体テスト治工具
JP2002185098A (ja) * 2000-12-13 2002-06-28 Omron Corp 成形回路部品の接続構造
JP2002311050A (ja) * 2001-04-12 2002-10-23 Alps Electric Co Ltd 電子ユニットの測定装置
JP2004226397A (ja) * 2003-01-21 2004-08-12 Rino Kogyo Kk プリント基板の接触器，プリント基板，および，プリント基板の製造方法

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