WO2009116601A1 - Metallic material for connector and process for producing the metallic material for connector - Google Patents
Metallic material for connector and process for producing the metallic material for connector Download PDFInfo
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- WO2009116601A1 WO2009116601A1 PCT/JP2009/055358 JP2009055358W WO2009116601A1 WO 2009116601 A1 WO2009116601 A1 WO 2009116601A1 JP 2009055358 W JP2009055358 W JP 2009055358W WO 2009116601 A1 WO2009116601 A1 WO 2009116601A1
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- Prior art keywords
- tin
- copper
- layer
- plating layer
- thickness
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
- C25D5/50—After-treatment of electroplated surfaces by heat-treatment
- C25D5/505—After-treatment of electroplated surfaces by heat-treatment of electroplated tin coatings, e.g. by melting
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/627—Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
- C25D7/0614—Strips or foils
Definitions
- the present invention relates to a metal material for a connector and a manufacturing method thereof, and more particularly, to a metal material for a connector that achieves both low insertion force and connection reliability and a manufacturing method thereof.
- a plating material in which a plating layer such as tin (Sn) or tin alloy is provided on a base material of a conductor such as copper (Cu) or a copper alloy (hereinafter referred to as a base material as appropriate) is excellent in the base material. It is known as a high-performance conductor material having electrical conductivity and strength, and excellent electrical connectivity, corrosion resistance, and solderability of the plated layer, and is widely used for various terminals and connectors.
- the mating connector has become multipolar, so a great deal of force is required when inserting and removing the male terminal group and the female terminal group, especially in a narrow space such as in the engine room of an automobile. Since insertion / extraction work is difficult, reduction of the insertion / extraction force is strongly demanded.
- the fretting phenomenon is that the soft Sn plating layer on the surface of the terminal wears and oxidizes due to fine sliding that occurs between the contact surfaces of the terminal due to vibration, temperature change, etc., and becomes a wear powder having a large specific resistance. When this phenomenon occurs between terminals, a connection failure occurs. This phenomenon is more likely to occur as the contact pressure between the terminals is lower.
- a base copper plating layer is formed on a base material of copper or a copper alloy, a tin plating layer is further formed on the surface, and then a surface opposite to the sliding surface in the fitting portion of the terminal
- a copper tin alloy layer is formed at the interface between the tin plating layer and the underlying copper plating layer.
- a tab portion surface is formed by elastic contact between a flat tab portion surface of a fitting type male terminal and a protruding portion provided so as to sandwich the tab portion without a fitting portion of a fitting type female terminal.
- the plating thickness in the vicinity of the connection trace at the end of the insertion / removal trace is thicker than the part where the insertion / removal trace is formed.
- This fitting type male terminal has a plating layer that can ensure connection reliability in the contact part where the connection trace will be formed, and the plating layer of the part where the insertion / extraction trace of the front part is formed is thin, It is said that both the insertion force reduction effect and the connection reliability can be achieved.
- An object of the present invention is to provide a metal material for a connector that has both low insertion force and connection reliability, and a method for manufacturing the same.
- the following means are provided: (1) In a metal material for a connector using a strip or a square wire formed of copper or a copper alloy as a base material, a part of the surface of the metal material has copper tin in a stripe shape in the longitudinal direction of the metal material An alloy layer is formed, and a metal layer for a connector, wherein a tin layer or a tin alloy layer is formed on the remaining portion of the surface of the metal material, (2) In the connector metal material in which a strip or a square wire formed of copper or a copper alloy is used as a base material, and a tin layer or a tin alloy layer is formed on the surface of the base material, the tin layer or the tin alloy The thickness of the layer is changed in a stripe shape in the width direction of the metal material, and a copper tin alloy layer is formed at least in a lower layer of a region where the thickness of the tin layer or the tin alloy layer is thin.
- Metal materials for connectors (3) The metal material for a connector according to (1) or (2), wherein a copper layer or a copper alloy layer is formed below the tin layer or the tin alloy layer, (4) The connector metal material according to any one of (1) to (3), wherein a nickel layer or a nickel alloy layer is formed on the base material.
- a copper or copper alloy strip or square wire is used as a base material, a tin plating layer or a tin alloy plating layer is formed on the base material to obtain an intermediate material, and then striped in the longitudinal direction of the intermediate material
- a method for producing a metal material for a connector characterized by performing a reflow treatment in a shape, (6) The method for producing a metal material for a connector according to (5), wherein the reflow treatment is performed and the copper tin alloy is exposed to a part of the surface.
- the ratio (Sn thickness / Cu thickness) of the thickness of the plating layer (Sn thickness / Cu thickness) is 2 or more, and (14) the method for producing a connector metal material according to item (12), The method for producing a metal material for a connector according to any one of (5) to (13), wherein the method is performed by laser irradiation.
- the connector metal material according to item (2), (3) to (4) ⁇ provided directly or indirectly subordinate to item (2) ⁇ , and item (5) , (10) to (13), (14) ⁇ however, limited to those directly or indirectly dependent on (5), (10) ⁇ , are collectively referred to as a second embodiment of the present invention.
- the present invention is meant to include all of the first and second embodiments.
- the metal material for a connector of the present invention in which a tin or tin alloy plating layer and a copper tin alloy layer appear in the width direction of a strip material (including a plate material) or a square wire material (including a square bar material) is tin or a tin alloy. Compared to the case where only the plating layer is exposed, the friction coefficient can be reduced. Moreover, the metal material for a connector of the present invention in which a thick layer and a thin layer of tin or tin alloy plating appear in the width direction of the strip or the square wire can reduce the friction coefficient as compared with the case of only the thick layer. .
- this copper tin alloy layer part or this tin-plated thin layer part When used as a contact, it has a low coefficient of friction and excellent fretting resistance, and the other parts have excellent solderability and environmental resistance. A connector that is excellent and has both low insertion force and connection reliability can be formed.
- the method for manufacturing a metal material for a connector according to the present invention obtains an intermediate material obtained by plating a base material, and performs a reflow treatment in a striped shape in the longitudinal direction. It is possible to obtain a metal material for a connector that satisfies both reliability.
- FIG. 5 is an enlarged schematic cross-sectional view of a square wire of Comparative Example 1.
- FIG. 5 is an expansion schematic sectional drawing which expanded further the surface part of the square wire shown in FIG.
- FIG. 5 is an expansion schematic sectional drawing of the square wire of the comparative example 2. It is the expansion schematic sectional drawing which expanded further the surface part of the square wire shown in FIG.
- the metal material for a connector is a surface of a metal material for a connector having a strip or a square wire formed of copper or a copper alloy as a base material.
- a copper tin alloy layer is formed in a stripe shape in the longitudinal direction of the metal material, and a tin layer or a tin alloy layer is formed on the remaining portion of the surface of the metal material.
- the metal material for connectors according to another preferred embodiment of the present invention has a strip or a square wire formed of copper or a copper alloy as a base material, and tin is formed on the surface of the base material.
- the thickness of the tin layer or the tin alloy layer changes in a stripe shape in the width direction (short direction) of the metal material, and at least the tin
- the copper tin alloy layer is formed in the lower layer of the area
- the shape of the base material is preferably a strip material (including a plate material) or a square wire material (including a square bar material), and more preferably a square wire material.
- the square wire may have a cross-sectional shape that may be any of a square, a rectangle, and a regular hexagon, and may be a deformed wire.
- a square wire having a substantially square cross-sectional shape can be preferably used in the present invention.
- the present invention it is preferable to perform Cu undercoating on the square wire material and provide a Cu plating layer, but there may be no undercoating as long as a copper tin alloy can be formed by reflow described later.
- a Cu plating layer By providing the Cu plating layer, it is possible to easily form a Cu—Sn alloy layer with a reduced Cu concentration.
- the thickness of the Cu plating layer is preferably 0.01 to 3.0 ⁇ m. Furthermore, 0.05 to 1.0 ⁇ m is preferable.
- nickel (Ni) base plating having a barrier property for preventing metal diffusion from the lower layer may be applied between the base material and the copper base to provide a nickel plating layer.
- Nickel base plating is Ni-P, Ni-Sn, Co-P, Ni-Co, Ni-Co-P, Ni-Cu, Ni-Cr, Ni-Zn, Ni-Fe Ni alloy plating may be used.
- Ni and Ni alloys do not deteriorate even when the barrier function is in a high temperature environment.
- the thickness of the nickel plating layer is less than 0.02 ⁇ m, the barrier function is not sufficiently exhibited.
- the thickness exceeds 3.0 ⁇ m the plating strain increases and the nickel plating layer is easily peeled off from the base material. Therefore, 0.02 to 3.0 ⁇ m is preferable.
- the upper limit of the thickness of the nickel plating layer is preferably 1.5 ⁇ m, more preferably 1.0 ⁇ m, considering the terminal processability.
- the surface layer of the material is tin-plated or tin-alloy plated, but the tin-plated or tin-alloy plated is preferably matte rather than glossy because it increases the laser absorption rate.
- the thickness is preferably 0.3 ⁇ m or more in the metal material of the first embodiment, and 0 More preferably, it is 3 to 0.8 ⁇ m, and more preferably 0.3 to 0.6 ⁇ m.
- tin plating may be formed by electroless plating, but is preferably formed by electroplating.
- Sn alloy plating it is preferable to use Sn-based alloy plating such as Sn—Cu, Sn—Bi, Sn—Ag, Sn—Zn, Sn—In, Sn—Pb and Sn—Ag—Cu. it can.
- Sn-based alloy plating such as Sn—Cu, Sn—Bi, Sn—Ag, Sn—Zn, Sn—In, Sn—Pb and Sn—Ag—Cu.
- the surface Sn plating for example, a tin sulfate bath is used, the plating temperature is 30 ° C. or less, and the current density is 5 A / dm 2 .
- the conditions are not limited to this, and can be set as appropriate.
- the ratio of the thickness of the surface tin plating or tin alloy plating layer (Sn thickness) to the thickness of the base copper plating layer (Cu thickness) is preferably less than 2, and more preferably 1.0 or more and less than 2.0.
- the thickness of the surface tin plating or tin alloy plating layer (Sn thickness) with respect to the thickness of the base copper plating layer (Cu thickness) is preferably 2 or more, more preferably 2.0 to 3.0.
- the metal material for a connector of the present invention is subjected to striped reflow treatment in the longitudinal direction of a strip or a square wire having a tin plating or tin alloy plating layer formed on the outermost layer by the above plating.
- stripe form means what targets the continuous area
- the reflow process is not limited as long as it is narrower than the width of one surface of the strip or the square wire and can be limitedly reflowed.
- a process by laser irradiation can be suitably used.
- the treatment by laser irradiation is preferable in that the portion irradiated with the laser is reflowed in a limited manner.
- This treatment can be performed, for example, by heating in a stripe shape using a YAG laser irradiation device or a semiconductor laser irradiation device used in material processing.
- the reflow stripe is formed by this treatment, and the copper tin alloy is exposed on a part of the surface of the strip or the square wire.
- the ratio of the area occupied by the exposed copper-tin alloy on the surface of the material is preferably 20 to 80% when the material is a square wire.
- reflow stripes are formed by this treatment, and the thickness of the tin layer or tin alloy layer changes in a stripe shape in the width direction (short direction) of the metal material.
- the copper tin alloy layer is formed in the lower layer of the region where the thickness of at least the tin layer or tin alloy layer is thin.
- the above reflow processing may be performed on at least one surface, but when processed into the shape of a connector, the surface subjected to the reflow processing is changed to a sliding surface (connector to be connected). Contact surface).
- the number of reflow stripes is 1 or more, preferably 4 to 8. Further, the number of reflow stripes per surface of the strips and square wires used is preferably 1 to 2. However, the reflow stripe is usually not provided on the end face of the square material.
- the laser irradiation conditions are such that the CuSn alloy is exposed to the surface when the metal material of the first embodiment is manufactured.
- the metal material of the second embodiment is manufactured under laser irradiation conditions such that a thin Sn plating or Sn alloy plating layer remains on the surface, and the thinnest portion of the Sn plating or Sn alloy plating layer on the surface
- the thickness is preferably 0.1 to 0.3 ⁇ m.
- the laser output is preferably 1 W to 60 W.
- the beam diameter (spot diameter) of the laser is preferably smaller than the width of the strip used, the diameter of the wire, or one side, and larger than 1/5 of the width of the strip, the diameter of the wire, or one side. More preferably, the laser beam diameter is 1/5 to 4/5 in total with respect to the width of the strip or the diameter of the wire and one side.
- the depth reflowed by the laser irradiation is adjusted to be shallower than the total plating thickness applied to the material and deeper than the tin plating thickness when the base plating layer is provided.
- the laser irradiation may be performed while cooling the material from the side opposite to the laser irradiation side.
- the laser treatment may be performed in the air, but may be performed in a reducing atmosphere.
- the connector material of the present invention can be processed into various electrical and electronic connectors including, for example, fitting connectors for automobiles and contacts, by conventional methods. And if the copper tin alloy layer exposed on the surface is used for the contact position in the mated state, it has a low coefficient of friction and excellent fretting resistance, and the other parts are solderable and environmental resistant. A connector that is excellent and has both low insertion force and connection reliability can be formed.
- Example 1 After applying a copper base plating of 0.3 ⁇ m in thickness to a 7/3 brass square wire having a width of 0.64 mm (Furukawa Electric Co., Ltd., material is JIS standard C2600: the same applies below), the thickness is 0.3 ⁇ m. Tin plating was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center in the width direction of each material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG.
- FIG. 2 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 1 further enlarged.
- 1a is a base material
- 1b is a copper plating layer
- 2 is a tin plating layer
- 3 is a copper tin alloy layer.
- Example 2 After applying a copper base plating to the square wire of a 0.64 mm wide Corson alloy (Furukawa Electric Co., Ltd., trade name EFTEC-97: the same below) to a thickness of 0.5 ⁇ m, tin 0.6 ⁇ m in thickness Plating was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
- a YAG laser output 30 W, wavelength 1064 nm
- Example 3 A nickel base plating of 0.5 ⁇ m thickness and a copper base plating thickness of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 ⁇ m was performed. Thereafter, a YAG laser (output: 30 W, wavelength: 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG.
- FIG. 4 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper tin alloy layer of the rectangular wire shown in FIG. 3 in a further enlarged manner.
- the nickel plating layer 4 exists between the base material 1a and the copper plating layer 1b as shown in FIG.
- Example 4 A Corson alloy square wire having a width of 0.64 mm was nickel-plated with a thickness of 0.5 ⁇ m and copper with a thickness of 0.5 ⁇ m, and then tin-plated with a thickness of 0.6 ⁇ m. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
- Example 5 A nickel base plating of 0.3 ⁇ m thickness and a copper base plating thickness of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of 0.3 ⁇ m thickness was performed. Thereafter, a semiconductor laser (output 5 W, wavelength 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter is irradiated in the center of each material in the width direction of the material in the longitudinal direction of the material to obtain a square wire. It was. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
- Example 6 A Corson alloy square wire having a width of 0.64 mm was subjected to nickel base plating with a thickness of 0.3 ⁇ m and copper base plating with a thickness of 0.5 ⁇ m, and then tin plating with a thickness of 0.6 ⁇ m. Thereafter, a semiconductor laser (output 5 W, wavelength 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter is irradiated in the center of each material in the width direction of the material in the longitudinal direction of the material to obtain a square wire. It was. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
- Example 7 A nickel base plating of 0.5 ⁇ m thickness and a copper base plating thickness of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 ⁇ m was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) with a beam diameter of 0.10 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
- a semiconductor laser output: 5 W, wavelength: 915 nm
- Comparative Example 1 After applying a nickel base plating of 0.5 ⁇ m in thickness to a 7/3 brass square wire having a width of 0.64 mm and a copper base plating of 0.3 ⁇ m in thickness, tin plating with a thickness of 0.3 ⁇ m was performed.
- the square wire shown in the enlarged schematic sectional view of was obtained.
- 11 is a base material (brass square wire) and a base plating layer
- 12 is a tin plating layer.
- FIG. 6 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 5 further enlarged.
- 11a is a base material
- 11b is a copper plating layer
- 11c is a nickel plating layer
- 12 is a tin plating layer.
- Comparative Example 2 A nickel base plating of 0.5 ⁇ m thickness and a copper base plating thickness of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 ⁇ m was performed. Then, it heated above the melting
- 11 is a base material (brass square wire) and a base plating layer
- 13 is a copper tin alloy layer.
- FIG. 8 is an enlarged schematic cross-sectional view schematically showing a further enlarged surface portion of the rectangular wire shown in FIG.
- 11a is a base material
- 11c is a nickel plating layer
- 13 is a copper tin alloy layer.
- Example 8 After a copper base plating of 0.3 ⁇ m was applied to a 7/3 brass square wire having a width of 0.64 mm, tin plating of 0.8 ⁇ m was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got.
- 1 is a base material (brass square wire) and a copper plating layer
- 2 is a tin plating layer
- 3 is a copper tin alloy layer.
- FIG. 10 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 9 further enlarged.
- 1a is a base material
- 1b is a copper plating layer
- 2 is a tin plating layer
- 3 is a copper tin alloy layer.
- Example 9 After applying 0.5 ⁇ m of copper base plating to a square wire of a Corson alloy having a width of 0.64 mm, tin plating of 1.2 ⁇ m was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
- Example 10 A nickel base plating of 0.5 ⁇ m and a copper base plating of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 ⁇ m of tin plating. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got.
- 1 is a base material (brass square wire) and a copper plating layer
- 2 is a tin plating layer
- 3 is a copper tin alloy layer.
- FIG. 12 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 11 further enlarged.
- the nickel plating layer 4 exists between the base material 1a and the copper plating layer 1b as shown in FIG.
- Example 11 After applying a nickel base plating of 0.5 ⁇ m and a copper base plating of 0.5 ⁇ m to a Corson alloy square wire having a width of 0.64 mm, a tin plating of 1.2 ⁇ m was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
- Example 12 A nickel base plating of 0.3 ⁇ m and a copper base plating of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of 0.8 ⁇ m was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter was irradiated in the center of each surface width direction of the material in the longitudinal direction of the material to obtain a square wire. . A thin tin plating layer remained on the surface of the laser irradiated portion.
- Example 13 After applying a nickel base plating of 0.3 ⁇ m and a copper base plating of 0.5 ⁇ m to a Corson alloy square wire having a width of 0.64 mm, a tin plating of 1.2 ⁇ m was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter was irradiated in the center of each surface width direction of the material in the longitudinal direction of the material to obtain a square wire. . A thin tin plating layer remained on the surface of the laser irradiated portion.
- Example 14 A nickel base plating of 0.5 ⁇ m and a copper base plating of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 ⁇ m of tin plating. Thereafter, a semiconductor laser having a beam diameter of 0.10 mm (output 5 W, wavelength 915 nm) was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
- Comparative Example 3 A 7/3 brass square wire having a width of 0.64 mm was subjected to 0.5 ⁇ m of nickel base plating and 0.3 ⁇ m of copper base plating, and then tin plating of 0.8 ⁇ m to obtain a square wire.
- the square wire shown in the enlarged schematic sectional view of FIG. 13 was obtained.
- 11 is a base material (brass square wire) and a base plating layer
- 12 is a tin plating layer.
- FIG. 14 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 13 further enlarged.
- 11a is a base material
- 11b is a copper plating layer
- 11c is a nickel plating layer
- 13 is a tin plating layer.
- Comparative Example 4 A nickel base plating of 0.5 ⁇ m and a copper base plating of 0.3 ⁇ m were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 ⁇ m of tin plating. Then, it heated above the melting
- 11 is a base material (brass square wire) and a base plating layer
- 12 is a tin plating layer
- 13 is a copper tin alloy layer.
- a thin tin plating layer 22 covers the entire surface.
- FIG. 16 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 15 further enlarged.
- 11a is a base material
- 11c is a nickel plating layer
- 12 is a tin plating layer
- 13 is a copper tin alloy layer.
- the contact resistance was measured by the 4-terminal method, and the contact was measured by applying a 1N load using an Ag probe. A value of 2 m ⁇ or less was good, a value of 5 m ⁇ or less was acceptable, and a value exceeding that was unacceptable.
- Solder wettability Solder wettability was measured by the meniscograph method. The apparatus used was a Solder Checker SAT-5100 manufactured by Reska Co., Ltd. The solder used was Sn-3.0Ag-0.5Cu lead-free solder, and 25% rosin flux was used.
- the judgment criteria are good when 95% or more of the immersion area is wet, pass ⁇ when 90% or more of the immersion area is wet, and fail X when the immersion area is wet.
- (Dynamic friction coefficient) A Bowden tester was used to measure the dynamic friction coefficient. The slider was measured with a dimple simulating a female terminal. As the judgment criteria, ⁇ k ⁇ 0.25 was good ⁇ , ⁇ k ⁇ 0.3 was acceptable ⁇ , and more than that was unacceptable ⁇ .
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Abstract
Description
本発明は、コネクタ用金属材料およびその製造方法に関し、詳しくは、低挿入力性と接続信頼性を両立したコネクタ用金属材料およびその製造方法に関する。 The present invention relates to a metal material for a connector and a manufacturing method thereof, and more particularly, to a metal material for a connector that achieves both low insertion force and connection reliability and a manufacturing method thereof.
銅(Cu)、銅合金などの導電体の母材(以下、適宜、母材と記す。)上にスズ(Sn)、スズ合金などのめっき層を設けためっき材料は、母材の優れた導電性と強度、およびめっき層の優れた電気接続性と耐食性とはんだ付け性を備えた高性能導体材料として知られており、各種の端子やコネクタなどに広く用いられている。 A plating material in which a plating layer such as tin (Sn) or tin alloy is provided on a base material of a conductor such as copper (Cu) or a copper alloy (hereinafter referred to as a base material as appropriate) is excellent in the base material. It is known as a high-performance conductor material having electrical conductivity and strength, and excellent electrical connectivity, corrosion resistance, and solderability of the plated layer, and is widely used for various terminals and connectors.
ところで近年、電子制御化が進む中で嵌合型コネクタが多極化したため、オス端子群とメス端子群を挿抜する際に多大な力が必要になり、特に、自動車のエンジンルーム内などの狭い空間では挿抜作業が困難なため前記挿抜力の低減が強く求められている。 By the way, in recent years, with the progress of electronic control, the mating connector has become multipolar, so a great deal of force is required when inserting and removing the male terminal group and the female terminal group, especially in a narrow space such as in the engine room of an automobile. Since insertion / extraction work is difficult, reduction of the insertion / extraction force is strongly demanded.
前記挿抜力を低減する方法として、コネクタ端子表面のSnめっき層を薄くして端子間の接触圧力を弱める方法があるが、この方法はSnめっき層が軟質のため端子の接触面間にフレッティング現象が起きて端子間に導通不良が起きることがある。 As a method of reducing the insertion / extraction force, there is a method in which the Sn plating layer on the surface of the connector terminal is thinned to weaken the contact pressure between the terminals. This method is fretting between the contact surfaces of the terminals because the Sn plating layer is soft. A phenomenon may occur and poor conduction may occur between the terminals.
前記フレッティング現象とは、振動や温度変化などが原因で端子の接触面間に起きる微摺動により、端子表面の軟質のSnめっき層が摩耗し酸化して、比抵抗の大きい摩耗粉になる現象で、この現象が端子間に発生すると接続不良が起きる。そして、この現象は端子間の接触圧力が低いほど起き易い。 The fretting phenomenon is that the soft Sn plating layer on the surface of the terminal wears and oxidizes due to fine sliding that occurs between the contact surfaces of the terminal due to vibration, temperature change, etc., and becomes a wear powder having a large specific resistance. When this phenomenon occurs between terminals, a connection failure occurs. This phenomenon is more likely to occur as the contact pressure between the terminals is lower.
特許文献1には、銅または銅合金の母材に下地銅めっき層を形成し、さらにその表面にスズめっき層を形成し、その後、端子の嵌合部分における摺動面とは反対側の面にレーザ照射を行うことにより、摺動面におけるレーザのビームスポットに対応する部分が伝熱により加熱され、スズめっき層と下地銅めっき層との界面に銅スズ合金層が形成される嵌合型接続端子の製造方法が記載されている。
薄くスズめっき層を残存させるレーザ照射条件であれば、安定した接触抵抗を維持したまま端子の低挿入力化が可能で、かつ直接レーザ照射を行わないので、スズめっき層が溶融変化を起こさず、接触抵抗が悪化しないとされている。
In
If the laser irradiation conditions allow the tin plating layer to remain thin, the terminal insertion force can be reduced while maintaining a stable contact resistance, and direct laser irradiation is not performed, so the tin plating layer does not undergo melting changes. It is said that the contact resistance does not deteriorate.
特許文献2には嵌合型オス端子の平板形状のタブ部表面に、嵌合型メス端子の嵌合部ないにタブ部を挟み込むように設けられた凸部が弾性接触することによりタブ部表面に挿抜痕が形成される嵌合型オス端子のタブ部表面に施されるスズめっき層において、挿抜痕終端の接続痕近傍におけるめっき厚が少なくとも挿抜痕が形成される部分よりも厚く表面処理された嵌合型オス端子が記載されている。
この嵌合型オス端子は、接続痕が形成されることになる接点部には接続信頼性を確保できるめっき層があり、その前部分の挿抜痕が形成される部分のめっき層は薄いため、挿入力低減効果と接続信頼性を両立することができるとされている。
In
This fitting type male terminal has a plating layer that can ensure connection reliability in the contact part where the connection trace will be formed, and the plating layer of the part where the insertion / extraction trace of the front part is formed is thin, It is said that both the insertion force reduction effect and the connection reliability can be achieved.
しかしながら、上記の嵌合型接続端子でははんだ付けに使用する裏面から加熱することによりはんだ濡れ性が低下することや、挿入時に摺動が起こる部分の摩擦係数が高いことなどの点で、まだ低挿入力性と接続信頼性を十分に両立できるものではなかった。 However, in the above-mentioned fitting type connection terminal, it is still low due to the fact that the solder wettability is reduced by heating from the back side used for soldering, and the friction coefficient of the portion where sliding occurs during insertion is high. Insertion power and connection reliability were not fully compatible.
本発明は、低挿入力性と接続信頼性を両立したコネクタ用金属材料およびその製造方法を提供することを目的とする。 An object of the present invention is to provide a metal material for a connector that has both low insertion force and connection reliability, and a method for manufacturing the same.
本発明によれば、以下の手段が提供される:
(1)銅または銅合金により形成された条材または角線材を母材とするコネクタ用金属材料において、前記金属材料の表面の一部には、前記金属材料の長手方向にストライプ状に銅スズ合金層が形成され、前記金属材料の表面の残部にはスズ層またはスズ合金層が形成されていることを特徴とするコネクタ用金属材料、
(2)銅または銅合金により形成された条材または角線材を母材とし、この母材の表面にスズ層またはスズ合金層が形成されているコネクタ用金属材料において、前記スズ層またはスズ合金層の厚さが前記金属材料の幅方向にストライプ状に変化しており、少なくとも前記スズ層またはスズ合金層の厚さが薄い領域の下層に銅スズ合金層が形成されていることを特徴とするコネクタ用金属材料、
(3)前記スズ層またはスズ合金層の下層に、銅層または銅合金層が形成されていることを特徴とする(1)または(2)項記載のコネクタ用金属材料、
(4)前記母材上に、ニッケル層またはニッケル合金層が形成されていることを特徴とする(1)~(3)のいずれか1項に記載のコネクタ用金属材料、
(5)銅または銅合金の条材または角線材を母材とし、この母材上にスズめっき層またはスズ合金めっき層を形成して中間材料を得たのち、前記中間材料の長手方向にストライプ状のリフロー処理を行うことを特徴とするコネクタ用金属材料の製造方法、
(6)前記リフロー処理を行い、銅スズ合金を表面の一部に露出させることを特徴とする(5)項記載のコネクタ用金属材料の製造方法、
(7)前記リフロー処理前の前記スズめっき層またはスズ合金めっき層の厚さが0.3~0.8μmであることを特徴とする(6)項記載のコネクタ用金属材料の製造方法、
(8)前記母材と、前記スズめっき層またはスズ合金めっき層との間に、銅めっき層もしくは銅合金めっき層を設け、または、前記母材上に近い側から、ニッケルめっき層またはニッケル合金めっき層、銅めっき層または銅合金めっき層を設けて中間材料を得ることを特徴とする(6)項記載のコネクタ用金属材料の製造方法、
(9)前記リフロー処理前の前記スズめっき層またはスズ合金めっき層の厚さが0.3~0.8μmであり、かつ前記銅めっき層の厚さ(Cu厚)に対する前記スズめっきまたはスズ合金めっき層の厚さ(Sn厚)の比(Sn厚/Cu厚)が2未満であることを特徴とする(8)項記載のコネクタ用金属材料の製造方法、
(10)前記リフロー処理を行い、銅スズ合金層を形成して前記スズめっき層またはスズ合金めっき層の厚さを薄くすることを特徴とする(5)項記載のコネクタ用金属材料の製造方法、
(11)前記リフロー処理前の前記スズめっき層またはスズ合金めっき層の厚さが0.8~1.2μmであることを特徴とする(10)項記載のコネクタ用金属材料の製造方法、
(12)前記母材と、前記スズめっき層またはスズ合金めっき層との間に、銅めっき層または銅合金めっき層を設け、または、前記母材上に近い側から、ニッケルめっき層またはニッケル合金めっき層、銅めっき層または銅合金めっき層を設けて中間材料を得ることを特徴とする(10)項記載のコネクタ用金属材料の製造方法、
(13)前記リフロー処理前の前記スズめっき層またはスズ合金めっき層の厚さが0.8~1.2μmであり、かつ前記銅めっき層の厚さ(Cu厚)に対する前記スズめっきまたはスズ合金めっき層の厚さ(Sn厚)の比(Sn厚/Cu厚)が2以上であることを特徴とする(12)項記載のコネクタ用金属材料の製造方法、および
(14)前記リフロー処理がレーザ照射によることを特徴とする、(5)~(13)のいずれか1項に記載のコネクタ用金属材料の製造方法。
以下、前記(1)項、(3)~(4)項{但し、前記(1)項に直接又は間接に従属するものに限る}に記載のコネクタ用金属材料、及び前記(5)項、(6)~(9)項、(14)項{但しこれらの内、前記(5)、(6)項に直接又は間接に従属するものに限る}に記載のコネクタ用金属材料の製造方法を併せて、本発明の第1の実施態様という。
また、前記(2)項、(3)~(4)項{但し、前記(2)項に直接又は間接に従属するものに限る}項に記載のコネクタ用金属材料、及び前記(5)項、(10)~(13)項、(14)項{但しこれらの内、前記(5)、(10)項に直接又は間接に従属するものに限る}に記載のコネクタ用金属材料の製造方法を併せて、本発明の第2の実施態様という。
ここで、特に断らない限り、本発明とは、前記第1及び第2の実施態様の全てを包含する意味である。
According to the present invention, the following means are provided:
(1) In a metal material for a connector using a strip or a square wire formed of copper or a copper alloy as a base material, a part of the surface of the metal material has copper tin in a stripe shape in the longitudinal direction of the metal material An alloy layer is formed, and a metal layer for a connector, wherein a tin layer or a tin alloy layer is formed on the remaining portion of the surface of the metal material,
(2) In the connector metal material in which a strip or a square wire formed of copper or a copper alloy is used as a base material, and a tin layer or a tin alloy layer is formed on the surface of the base material, the tin layer or the tin alloy The thickness of the layer is changed in a stripe shape in the width direction of the metal material, and a copper tin alloy layer is formed at least in a lower layer of a region where the thickness of the tin layer or the tin alloy layer is thin. Metal materials for connectors,
(3) The metal material for a connector according to (1) or (2), wherein a copper layer or a copper alloy layer is formed below the tin layer or the tin alloy layer,
(4) The connector metal material according to any one of (1) to (3), wherein a nickel layer or a nickel alloy layer is formed on the base material.
(5) A copper or copper alloy strip or square wire is used as a base material, a tin plating layer or a tin alloy plating layer is formed on the base material to obtain an intermediate material, and then striped in the longitudinal direction of the intermediate material A method for producing a metal material for a connector, characterized by performing a reflow treatment in a shape,
(6) The method for producing a metal material for a connector according to (5), wherein the reflow treatment is performed and the copper tin alloy is exposed to a part of the surface.
(7) The method for producing a metal material for a connector according to (6), wherein the thickness of the tin plating layer or the tin alloy plating layer before the reflow treatment is 0.3 to 0.8 μm,
(8) A copper plating layer or a copper alloy plating layer is provided between the base material and the tin plating layer or the tin alloy plating layer, or a nickel plating layer or a nickel alloy from the side close to the base material A method for producing a metal material for a connector according to (6), wherein an intermediate material is obtained by providing a plating layer, a copper plating layer or a copper alloy plating layer;
(9) The tin plating layer or tin alloy plating layer before the reflow treatment has a thickness of 0.3 to 0.8 μm, and the tin plating or tin alloy with respect to the thickness of the copper plating layer (Cu thickness) The method for producing a metal material for a connector according to item (8), wherein the ratio (Sn thickness / Cu thickness) of the thickness (Sn thickness) of the plating layer is less than 2;
(10) The method for producing a metal material for a connector according to (5), wherein the reflow treatment is performed to form a copper tin alloy layer to reduce the thickness of the tin plating layer or the tin alloy plating layer. ,
(11) The method for producing a metal material for a connector according to (10), wherein a thickness of the tin plating layer or the tin alloy plating layer before the reflow treatment is 0.8 to 1.2 μm,
(12) A copper plating layer or a copper alloy plating layer is provided between the base material and the tin plating layer or the tin alloy plating layer, or a nickel plating layer or a nickel alloy from the side close to the base material The method for producing a metal material for a connector according to (10), wherein an intermediate material is obtained by providing a plating layer, a copper plating layer or a copper alloy plating layer;
(13) The tin plating or tin alloy has a thickness of 0.8 to 1.2 μm before the reflow treatment and the thickness of the copper plating layer (Cu thickness). The ratio (Sn thickness / Cu thickness) of the thickness of the plating layer (Sn thickness / Cu thickness) is 2 or more, and (14) the method for producing a connector metal material according to item (12), The method for producing a metal material for a connector according to any one of (5) to (13), wherein the method is performed by laser irradiation.
Hereinafter, the metal material for connectors according to the above item (1), (3) to (4) {provided directly or indirectly depending on the item (1)}, and the item (5), (6) to (9), (14) {however, the manufacturing method for a connector metal material according to (5), (6) directly or indirectly depending on the above}) Also referred to as the first embodiment of the present invention.
Also, the connector metal material according to item (2), (3) to (4) {provided directly or indirectly subordinate to item (2)}, and item (5) , (10) to (13), (14) {however, limited to those directly or indirectly dependent on (5), (10)}, Are collectively referred to as a second embodiment of the present invention.
Here, unless otherwise specified, the present invention is meant to include all of the first and second embodiments.
条材(板材を含む)または角線材(角棒材を含む)の幅方向に、スズまたはスズ合金めっきの層と銅スズ合金層が現れた本発明のコネクタ用金属材料は、スズまたはスズ合金めっきの層のみが露出した場合に比べ、摩擦係数を低減することができる。また、条材または角線材の幅方向に、スズまたはスズ合金めっきの厚い層と薄い層が現れた本発明のコネクタ用金属材料は、厚い層のみの場合と比べ摩擦係数を低減することができる。この銅スズ合金層の部分、または、このスズめっきの薄い層の部分を接点に使用すると、低摩擦係数で且つ耐フレッティングに優れており、それ以外の部分はハンダ付け性や耐環境性に優れており、低挿入力と接続信頼性を両立したコネクタを形成することができる。
また、本発明のコネクタ用金属材料の製造方法は、母材にめっきを施した中間材料を得て、その長手方向にストライプ状のリフロー処理を行うことから、きわめて生産性よく低挿入力と接続信頼性を両立したコネクタ用金属材料を得ることができる。
The metal material for a connector of the present invention in which a tin or tin alloy plating layer and a copper tin alloy layer appear in the width direction of a strip material (including a plate material) or a square wire material (including a square bar material) is tin or a tin alloy. Compared to the case where only the plating layer is exposed, the friction coefficient can be reduced. Moreover, the metal material for a connector of the present invention in which a thick layer and a thin layer of tin or tin alloy plating appear in the width direction of the strip or the square wire can reduce the friction coefficient as compared with the case of only the thick layer. . When this copper tin alloy layer part or this tin-plated thin layer part is used as a contact, it has a low coefficient of friction and excellent fretting resistance, and the other parts have excellent solderability and environmental resistance. A connector that is excellent and has both low insertion force and connection reliability can be formed.
In addition, the method for manufacturing a metal material for a connector according to the present invention obtains an intermediate material obtained by plating a base material, and performs a reflow treatment in a striped shape in the longitudinal direction. It is possible to obtain a metal material for a connector that satisfies both reliability.
本発明の上記及び他の特徴及び利点は、適宜添付の図面を参照して、下記の記載からより明らかになるであろう。 The above and other features and advantages of the present invention will become more apparent from the following description with reference to the accompanying drawings as appropriate.
1 母材および銅めっき層
1a 母材
1b 銅めっき層
2 スズめっき層
3 銅スズ合金層
4 ニッケルめっき層
11 母材及びニッケルめっき層
11a 母材
11b 銅めっき層
11c ニッケルめっき層
12 スズめっき層
13 銅スズ合金層
DESCRIPTION OF
本発明の好ましい一つの実施態様(前記「第1の実施態様」)のコネクタ用金属材料は、銅または銅合金により形成された条材または角線材を母材とするコネクタ用金属材料の表面の一部に、前記金属材料の長手方向にストライプ状に銅スズ合金層が形成され、前記金属材料の表面の残部にはスズ層またはスズ合金層が形成されているものである。 The metal material for a connector according to one preferred embodiment of the present invention (the “first embodiment”) is a surface of a metal material for a connector having a strip or a square wire formed of copper or a copper alloy as a base material. In part, a copper tin alloy layer is formed in a stripe shape in the longitudinal direction of the metal material, and a tin layer or a tin alloy layer is formed on the remaining portion of the surface of the metal material.
本発明の別の好ましい実施態様(前記「第2の実施態様」)のコネクタ用金属材料は、銅または銅合金により形成された条材または角線材を母材とし、この母材の表面にスズ層またはスズ合金層が形成されているコネクタ用金属材料において、前記スズ層またはスズ合金層の厚さが前記金属材料の幅方向(短手方向)にストライプ状に変化しており、少なくとも前記スズ層またはスズ合金層の厚さが薄い領域の下層に銅スズ合金層が形成されているものである。 The metal material for connectors according to another preferred embodiment of the present invention (the “second embodiment”) has a strip or a square wire formed of copper or a copper alloy as a base material, and tin is formed on the surface of the base material. In the connector metal material in which the layer or the tin alloy layer is formed, the thickness of the tin layer or the tin alloy layer changes in a stripe shape in the width direction (short direction) of the metal material, and at least the tin The copper tin alloy layer is formed in the lower layer of the area | region where the thickness of a layer or a tin alloy layer is thin.
本発明のコネクタ用金属材料の母材としては、銅または銅合金が用いられ、コネクタに要求される導電性、機械的強度および耐熱性を有する銅、リン青銅、黄銅、洋白、ベリリウム銅、コルソン合金などの銅合金が好ましい。
母材の形状としては、条材(板材を含む)または角線材(角棒材を含む)が好ましく、角線材であることがより好ましい。角線材では、その断面形状は、正方形、長方形、正六角形のいずれでも良く、異形線であっても良い。断面形状が略正方形の角線材は、本発明に好ましく用いることができる。
As a base material of the metal material for a connector of the present invention, copper or a copper alloy is used, and copper, phosphor bronze, brass, white, beryllium copper having electrical conductivity, mechanical strength and heat resistance required for the connector, Copper alloys such as Corson alloy are preferred.
The shape of the base material is preferably a strip material (including a plate material) or a square wire material (including a square bar material), and more preferably a square wire material. The square wire may have a cross-sectional shape that may be any of a square, a rectangle, and a regular hexagon, and may be a deformed wire. A square wire having a substantially square cross-sectional shape can be preferably used in the present invention.
本発明では、角線材料上にCu下地めっきを行い、Cuめっき層を設けることが好ましいが、後述するリフローによって銅スズ合金が形成できるような構成であれば下地なしでもよい。Cuめっき層を設けることにより、Cu濃度を減少させたCu-Sn合金層の形成を容易にすることができる。Cuめっき層の厚みは0.01~3.0μmが好ましい。さらには0.05~1.0μmが好ましい。 In the present invention, it is preferable to perform Cu undercoating on the square wire material and provide a Cu plating layer, but there may be no undercoating as long as a copper tin alloy can be formed by reflow described later. By providing the Cu plating layer, it is possible to easily form a Cu—Sn alloy layer with a reduced Cu concentration. The thickness of the Cu plating layer is preferably 0.01 to 3.0 μm. Furthermore, 0.05 to 1.0 μm is preferable.
また、耐熱性を向上させるために、下層からの金属拡散を防止するバリア性を持つニッケル(Ni)下地めっきを母材と銅下地の間に施し、ニッケルめっき層を設けてもよい。ニッケル下地めっきは、Ni-P系、Ni-Sn系、Co-P系、Ni-Co系、Ni-Co-P系、Ni-Cu系、Ni-Cr系、Ni-Zn系、Ni-Fe系などのNi合金めっきでもよい。NiおよびNi合金はバリア機能が高温環境下にあっても衰えない。
ニッケルめっき層の厚みは、0.02μm未満ではそのバリア機能が十分に発揮されなくなり、3.0μmを超えるとめっき歪みが大きくなって母材から剥離し易くなる。従って0.02~3.0μmが好ましい。ニッケルめっき層の厚みの上限は端子加工性を考慮すると1.5μm、さらには1.0μmが好ましい。
Further, in order to improve heat resistance, nickel (Ni) base plating having a barrier property for preventing metal diffusion from the lower layer may be applied between the base material and the copper base to provide a nickel plating layer. Nickel base plating is Ni-P, Ni-Sn, Co-P, Ni-Co, Ni-Co-P, Ni-Cu, Ni-Cr, Ni-Zn, Ni-Fe Ni alloy plating may be used. Ni and Ni alloys do not deteriorate even when the barrier function is in a high temperature environment.
When the thickness of the nickel plating layer is less than 0.02 μm, the barrier function is not sufficiently exhibited. When the thickness exceeds 3.0 μm, the plating strain increases and the nickel plating layer is easily peeled off from the base material. Therefore, 0.02 to 3.0 μm is preferable. The upper limit of the thickness of the nickel plating layer is preferably 1.5 μm, more preferably 1.0 μm, considering the terminal processability.
本発明においては、材料の表層はスズめっき、またはスズ合金めっきが施されるが、該スズめっきまたはスズ合金めっきは、光沢より無光沢のものが、レーザの吸収率を上げるので好ましい。
また、スズめっきまたはスズ合金めっき厚が薄すぎるとスズの耐熱性、耐環境性が発現しにくいため、厚さは、第1の実施態様の金属材料においては、0.3μm以上が好ましく、0.3~0.8μmがさらに好ましく、0.3~0.6μmがより好ましい。また、第2の実施態様の金属材料においては、0.3μm以上が好ましく、0.8~1.2μmがさらに好ましく、0.8~1.0μmがより好ましい。
本発明において、スズめっきは、無電解めっきで行って形成しても良いが、電気めっきで形成するのが望ましい。また、Sn合金めっきとしては、Sn-Cu、Sn-Bi、Sn-Ag、Sn-Zn、Sn-In、Sn-Pb、Sn-Ag-CuなどのSn主体の合金のめっきを好ましく用いることができる。
表層の電気Snめっきは、例えば硫酸スズ浴を用い、めっき温度30℃以下、電流密度5A/dm2行えばよい。ただし、条件はこの限りではなく適宜設定可能である。
In the present invention, the surface layer of the material is tin-plated or tin-alloy plated, but the tin-plated or tin-alloy plated is preferably matte rather than glossy because it increases the laser absorption rate.
Further, if the tin plating or tin alloy plating thickness is too thin, the heat resistance and environmental resistance of tin are difficult to be exhibited. Therefore, the thickness is preferably 0.3 μm or more in the metal material of the first embodiment, and 0 More preferably, it is 3 to 0.8 μm, and more preferably 0.3 to 0.6 μm. In the metal material of the second embodiment, 0.3 μm or more is preferable, 0.8 to 1.2 μm is more preferable, and 0.8 to 1.0 μm is more preferable.
In the present invention, tin plating may be formed by electroless plating, but is preferably formed by electroplating. As the Sn alloy plating, it is preferable to use Sn-based alloy plating such as Sn—Cu, Sn—Bi, Sn—Ag, Sn—Zn, Sn—In, Sn—Pb and Sn—Ag—Cu. it can.
For the surface Sn plating, for example, a tin sulfate bath is used, the plating temperature is 30 ° C. or less, and the current density is 5 A / dm 2 . However, the conditions are not limited to this, and can be set as appropriate.
第1の実施態様の金属材料の製造にあたって、下地銅めっきを施した場合、下地銅めっき層の厚さ(Cu厚)に対する表層スズめっきまたはスズ合金めっき層の厚さ(Sn厚)の比(Sn厚/Cu厚)が2未満であることが好ましく、1.0以上2.0未満であることがさらに好ましい。
また、第2の実施態様の金属材料の製造にあたって、下地銅めっきを施した場合、下地銅めっき層の厚さ(Cu厚)に対する表層スズめっきまたはスズ合金めっき層の厚さ(Sn厚)の比(Sn厚/Cu厚)が2以上であることが好ましく、2.0~3.0であることがさらに好ましい。
In the production of the metal material of the first embodiment, when the base copper plating is applied, the ratio of the thickness of the surface tin plating or tin alloy plating layer (Sn thickness) to the thickness of the base copper plating layer (Cu thickness) ( (Sn thickness / Cu thickness) is preferably less than 2, and more preferably 1.0 or more and less than 2.0.
Further, in the production of the metal material of the second embodiment, when the base copper plating is performed, the thickness of the surface tin plating or tin alloy plating layer (Sn thickness) with respect to the thickness of the base copper plating layer (Cu thickness) The ratio (Sn thickness / Cu thickness) is preferably 2 or more, more preferably 2.0 to 3.0.
本発明のコネクタ用金属材料は、上記のめっきで最外層にスズめっきまたはスズ合金めっき層が形成された条材または角線材の長手方向にストライプ状のリフロー処理を行う。なお、本発明において、ストライプ状とは、条材または角線材の一つの面において、その面の幅より細い連続した領域を対象とするものをいう。リフロー処理は、前記条材または角線材の一つの面の幅より細く限定的にリフローできる方法であれば、限定されるものでないが、例えば、レーザ照射による処理を好適に用いることができる。レーザ照射による処理を施すと、レーザ照射された箇所が限定的にリフローされる点で好ましい。この処理は、例えば、材料加工で使用されるYAGレーザ照射装置または半導体レーザ照射装置を用いて、ストライプ状に加熱することによって行うことができる。
第1の実施態様の金属材料の製造においては、この処理により、リフローストライプが形成され、条材または角線材の表面の一部に銅スズ合金が露出する。材料の表面における露出銅スズ合金の占める面積の割合は、材料が角線材の場合は20~80%が好ましい。
また、第2の実施態様の金属材料の製造においては、この処理によりリフローストライプが形成され、スズ層またはスズ合金層の厚さが金属材料の幅方向(短手方向)にストライプ状に変化し、少なくともスズ層またはスズ合金層の厚さが薄い領域の下層に銅スズ合金層が形成される。
The metal material for a connector of the present invention is subjected to striped reflow treatment in the longitudinal direction of a strip or a square wire having a tin plating or tin alloy plating layer formed on the outermost layer by the above plating. In addition, in this invention, stripe form means what targets the continuous area | region thinner than the width | variety of the surface in one surface of a strip or a square wire. The reflow process is not limited as long as it is narrower than the width of one surface of the strip or the square wire and can be limitedly reflowed. For example, a process by laser irradiation can be suitably used. The treatment by laser irradiation is preferable in that the portion irradiated with the laser is reflowed in a limited manner. This treatment can be performed, for example, by heating in a stripe shape using a YAG laser irradiation device or a semiconductor laser irradiation device used in material processing.
In the production of the metal material of the first embodiment, the reflow stripe is formed by this treatment, and the copper tin alloy is exposed on a part of the surface of the strip or the square wire. The ratio of the area occupied by the exposed copper-tin alloy on the surface of the material is preferably 20 to 80% when the material is a square wire.
In the production of the metal material of the second embodiment, reflow stripes are formed by this treatment, and the thickness of the tin layer or tin alloy layer changes in a stripe shape in the width direction (short direction) of the metal material. The copper tin alloy layer is formed in the lower layer of the region where the thickness of at least the tin layer or tin alloy layer is thin.
本発明において、例えば、角線の場合、上記のリフロー処理は少なくとも一つの面でも良いが、コネクタの形状に加工された際には、当該リフロー処理された面を摺動面(接続対象のコネクタとの接触面)とすることが好ましい。
リフローストライプ本数は1本以上であり、4~8本が好ましい。また、用いられる条材および角線材の1面当たりのリフローストライプ本数は1~2本が好ましい。ただし、角材料の端面には、通常、リフローストライプは設けない。
In the present invention, for example, in the case of a square line, the above reflow processing may be performed on at least one surface, but when processed into the shape of a connector, the surface subjected to the reflow processing is changed to a sliding surface (connector to be connected). Contact surface).
The number of reflow stripes is 1 or more, preferably 4 to 8. Further, the number of reflow stripes per surface of the strips and square wires used is preferably 1 to 2. However, the reflow stripe is usually not provided on the end face of the square material.
以下、レーザ照射を用いたリフロー処理について説明する。
レーザの照射条件は、第1の実施態様の金属材料の製造にあたっては、表面にまでCuSn合金が露出するような条件で行われる。また、第2の実施態様の金属材料の製造にあたっては、表面に薄くSnめっきまたはSn合金めっき層が残存するようなレーザ照射条件で行われ、表面のSnめっきまたはSn合金めっき層の最も薄い箇所の厚さは0.1~0.3μmであることが好ましい。本発明において、レーザ出力は1W~60Wが好ましい。
本発明において、レーザのビーム径(スポット径)は、用いられる条材の幅または線材の径や一辺より小さく、条材の幅または線材の径や一辺の1/5より大きいことが好ましい。レーザのビーム径は、条材の幅または線材の径や一辺に対して合計で1/5~4/5であることがさらに好ましい。
Hereinafter, reflow processing using laser irradiation will be described.
The laser irradiation conditions are such that the CuSn alloy is exposed to the surface when the metal material of the first embodiment is manufactured. In addition, the metal material of the second embodiment is manufactured under laser irradiation conditions such that a thin Sn plating or Sn alloy plating layer remains on the surface, and the thinnest portion of the Sn plating or Sn alloy plating layer on the surface The thickness is preferably 0.1 to 0.3 μm. In the present invention, the laser output is preferably 1 W to 60 W.
In the present invention, the beam diameter (spot diameter) of the laser is preferably smaller than the width of the strip used, the diameter of the wire, or one side, and larger than 1/5 of the width of the strip, the diameter of the wire, or one side. More preferably, the laser beam diameter is 1/5 to 4/5 in total with respect to the width of the strip or the diameter of the wire and one side.
上記のレーザ照射によってリフローされる深さは、下地めっき層を設けた場合、材料に施した全めっき厚よりも浅くスズめっき厚よりも深いように調整する。
また、リフローが過剰になることを防ぐため、レーザを照射する側と反対側から材料を冷却しながらレーザ照射してもよい。
レーザ処理は大気中で行ってもよいが、還元雰囲気下で行ってもよい。
The depth reflowed by the laser irradiation is adjusted to be shallower than the total plating thickness applied to the material and deeper than the tin plating thickness when the base plating layer is provided.
In order to prevent excessive reflow, the laser irradiation may be performed while cooling the material from the side opposite to the laser irradiation side.
The laser treatment may be performed in the air, but may be performed in a reducing atmosphere.
本発明のコネクタ材料は常法により、例えば自動車用の嵌合型コネクタ、接触子をはじめ、各種電気電子用コネクタに加工することができる。そして、表面に露出した銅スズ合金層の部分を嵌合状態での接点位置に使用すると、低摩擦係数で且つ耐フレッティングに優れており、それ以外の部分はハンダ付け性や耐環境性に優れており、低挿入力と接続信頼性を両立したコネクタを形成することができる。 The connector material of the present invention can be processed into various electrical and electronic connectors including, for example, fitting connectors for automobiles and contacts, by conventional methods. And if the copper tin alloy layer exposed on the surface is used for the contact position in the mated state, it has a low coefficient of friction and excellent fretting resistance, and the other parts are solderable and environmental resistant. A connector that is excellent and has both low insertion force and connection reliability can be formed.
以下に、本発明を実施例に基づいてさらに詳細に説明するが、本発明はこれに限定されるものではない。
なお、以下の実施例および比較例において、銅めっきは硫酸浴、ニッケルめっきはスルファミン酸浴、スズめっきは硫酸浴を用いて行った。
Hereinafter, the present invention will be described in more detail based on examples, but the present invention is not limited thereto.
In the following examples and comparative examples, copper plating was performed using a sulfuric acid bath, nickel plating was performed using a sulfamic acid bath, and tin plating was performed using a sulfuric acid bath.
実施例1
幅0.64mmの7/3黄銅角線(古河電気工業(株)製、材質はJIS規格C2600:以下同様)に銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、図1の拡大概略断面図に示す角線材を得た。図1中、1は母材(黄銅角線)および銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。レーザ照射された部分の表面には銅スズ合金層3が露出したものとなった。
図2は、図1に示す角線材の銅スズ合金層を含む表面部分をさらに拡大して模式的に示す拡大概略断面図である。図中1aは母材、1bは銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。
Example 1
After applying a copper base plating of 0.3 μm in thickness to a 7/3 brass square wire having a width of 0.64 mm (Furukawa Electric Co., Ltd., material is JIS standard C2600: the same applies below), the thickness is 0.3 μm. Tin plating was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center in the width direction of each material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG. 1, 1 is a base material (brass square wire) and a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer. The copper
FIG. 2 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 1 further enlarged. In the figure, 1a is a base material, 1b is a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer.
実施例2
幅0.64mmのコルソン合金(古河電気工業(株)製、商品名EFTEC-97:以下同様)の角線に銅の下地めっきを厚さ0.5μm施した後、厚さ0.6μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、角線材を得た。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
Example 2
After applying a copper base plating to the square wire of a 0.64 mm wide Corson alloy (Furukawa Electric Co., Ltd., trade name EFTEC-97: the same below) to a thickness of 0.5 μm, tin 0.6 μm in thickness Plating was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
実施例3
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを厚さ0.5μm、銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、図3の拡大概略断面図に示す角線材を得た。図3中、1は母材(黄銅角線)および銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
図4は、図3に示す角線材の銅スズ合金層を含む表面部分をさらに拡大して模式的に示す拡大概略断面図である。図3では記載を省略したが、図4に示されるように母材1aと銅めっき層1bとの間にニッケルめっき層4が存在する。
Example 3
A nickel base plating of 0.5 μm thickness and a copper base plating thickness of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 μm was performed. Thereafter, a YAG laser (output: 30 W, wavelength: 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG. 3, 1 is a base material (brass square wire) and a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
FIG. 4 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper tin alloy layer of the rectangular wire shown in FIG. 3 in a further enlarged manner. Although not shown in FIG. 3, the
実施例4
幅0.64mmのコルソン合金角線にニッケルの下地めっきを厚さ0.5μm、銅の下地めっきを厚さ0.5μm施した後、厚さ0.6μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、角線材を得た。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
Example 4
A Corson alloy square wire having a width of 0.64 mm was nickel-plated with a thickness of 0.5 μm and copper with a thickness of 0.5 μm, and then tin-plated with a thickness of 0.6 μm. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
実施例5
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを厚さ0.3μm、銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径が線径の1/3となるように調整した半導体レーザ(出力5W、波長915nm)を材料長手方向に照射して、角線材を得た。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
Example 5
A nickel base plating of 0.3 μm thickness and a copper base plating thickness of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of 0.3 μm thickness was performed. Thereafter, a semiconductor laser (output 5 W, wavelength 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter is irradiated in the center of each material in the width direction of the material in the longitudinal direction of the material to obtain a square wire. It was. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
実施例6
幅0.64mmのコルソン合金角線にニッケルの下地めっきを厚さ0.3μm、銅の下地めっきを厚さ0.5μm施した後、厚さ0.6μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径が線径の1/3となるように調整した半導体レーザ(出力5W、波長915nm)を材料長手方向に照射して、角線材を得た。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
Example 6
A Corson alloy square wire having a width of 0.64 mm was subjected to nickel base plating with a thickness of 0.3 μm and copper base plating with a thickness of 0.5 μm, and then tin plating with a thickness of 0.6 μm. Thereafter, a semiconductor laser (output 5 W, wavelength 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter is irradiated in the center of each material in the width direction of the material in the longitudinal direction of the material to obtain a square wire. It was. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
実施例7
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを厚さ0.5μm、銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.10mmの半導体レーザ(出力5W、波長915nm)を材料長手方向に照射してリフローし、角線材を得た。レーザ照射された部分の表面には銅スズ合金層が露出したものとなった。
Example 7
A nickel base plating of 0.5 μm thickness and a copper base plating thickness of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 μm was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) with a beam diameter of 0.10 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. The copper tin alloy layer was exposed on the surface of the laser irradiated portion.
比較例1
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを厚さ0.5μm、銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行い、図5の拡大概略断面図に示す角線材を得た。図5中、11は母材(黄銅角線)および下地めっき層、12はスズめっき層である。
図6は、図5に示す角線材の表面部分をさらに拡大して模式的に示す拡大概略断面図である。図中11aは母材、11bは銅めっき層、11cはニッケルめっき層、12はスズめっき層を示す。
Comparative Example 1
After applying a nickel base plating of 0.5 μm in thickness to a 7/3 brass square wire having a width of 0.64 mm and a copper base plating of 0.3 μm in thickness, tin plating with a thickness of 0.3 μm was performed. The square wire shown in the enlarged schematic sectional view of was obtained. In FIG. 5, 11 is a base material (brass square wire) and a base plating layer, and 12 is a tin plating layer.
FIG. 6 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 5 further enlarged. In the figure, 11a is a base material, 11b is a copper plating layer, 11c is a nickel plating layer, and 12 is a tin plating layer.
比較例2
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを厚さ0.5μm、銅の下地めっきを厚さ0.3μm施した後、厚さ0.3μmのスズめっきを行った。その後、バーナーによってSnの融点以上に加熱してリフローし、図7の拡大概略断面図に示す角線材を得た。図7中、11は母材(黄銅角線)および下地めっき層、13は銅スズ合金層である。
図8は、図7に示す角線材の表面部分をさらに拡大して模式的に示す拡大概略断面図である。図中11aは母材、11cはニッケルめっき層、13は銅スズ合金層を示す。
Comparative Example 2
A nickel base plating of 0.5 μm thickness and a copper base plating thickness of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of a thickness of 0.3 μm was performed. Then, it heated above the melting | fusing point of Sn with the burner and reflowed, and the square wire shown in the enlarged schematic sectional drawing of FIG. 7 was obtained. In FIG. 7, 11 is a base material (brass square wire) and a base plating layer, and 13 is a copper tin alloy layer.
FIG. 8 is an enlarged schematic cross-sectional view schematically showing a further enlarged surface portion of the rectangular wire shown in FIG. In the figure, 11a is a base material, 11c is a nickel plating layer, and 13 is a copper tin alloy layer.
実施例8
幅0.64mmの7/3黄銅角線に銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、図9の拡大概略断面図に示す角線材を得た。図9中、1は母材(黄銅角線)および銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。レーザ照射された部分のスズめっき層2が、他の箇所と比べ厚さが薄くなった状態で表面に残存し、その下方に銅スズ合金層3が形成された。
図10は、図9に示す角線材の銅スズ合金層を含む表面部分をさらに拡大して模式的に示す拡大概略断面図である。図10中1aは母材、1bは銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。
Example 8
After a copper base plating of 0.3 μm was applied to a 7/3 brass square wire having a width of 0.64 mm, tin plating of 0.8 μm was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG. 9, 1 is a base material (brass square wire) and a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer. The tin-plated
FIG. 10 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 9 further enlarged. In FIG. 10, 1a is a base material, 1b is a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer.
実施例9
幅0.64mmのコルソン合金の角線に銅の下地めっきを0.5μm施した後、1.2μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、角線材を得た。レーザ照射された部分の表面にはスズめっき層が薄く残存したものとなった。
Example 9
After applying 0.5 μm of copper base plating to a square wire of a Corson alloy having a width of 0.64 mm, tin plating of 1.2 μm was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
実施例10
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを0.5μm、銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、図11の拡大概略断面図に示す角線材を得た。図11中、1は母材(黄銅角線)および銅めっき層、2はスズめっき層、3は銅スズ合金層を示す。レーザ照射された部分のスズめっき層2が、他の箇所と比べ厚さが薄くなった状態で表面に残存し、その下方に銅スズ合金層3が形成された。
図12は、図11に示す角線材の銅スズ合金層を含む表面部分をさらに拡大して模式的に示す拡大概略断面図である。図11では記載を省略したが、図12に示されるように母材1aと銅めっき層1bとの間にニッケルめっき層4が存在する。
Example 10
A nickel base plating of 0.5 μm and a copper base plating of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 μm of tin plating. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm is irradiated in the longitudinal direction of the material at the center of each surface width direction of the material to reflow, and the rectangular wire shown in the enlarged schematic sectional view of FIG. Got. In FIG. 11, 1 is a base material (brass square wire) and a copper plating layer, 2 is a tin plating layer, and 3 is a copper tin alloy layer. The tin-plated
FIG. 12 is an enlarged schematic cross-sectional view schematically showing the surface portion including the copper-tin alloy layer of the rectangular wire shown in FIG. 11 further enlarged. Although not shown in FIG. 11, the
実施例11
幅0.64mmのコルソン合金角線にニッケルの下地めっきを0.5μm、銅の下地めっきを0.5μm施した後、1.2μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.2mmのYAGレーザ(出力30W、波長1064nm)を材料長手方向に照射してリフローし、角線材を得た。レーザ照射された部分の表面にはスズめっき層が薄く残存したものとなった。
Example 11
After applying a nickel base plating of 0.5 μm and a copper base plating of 0.5 μm to a Corson alloy square wire having a width of 0.64 mm, a tin plating of 1.2 μm was performed. Thereafter, a YAG laser (output 30 W, wavelength 1064 nm) having a beam diameter of 0.2 mm was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
実施例12
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを0.3μm、銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径が線径の1/3となるように調整した半導体レーザ(出力5W、波長915nm)を材料長手方向に照射して角線材を得た。レーザ照射された部分の表面にはスズめっき層が薄く残存したものとなった。
Example 12
A nickel base plating of 0.3 μm and a copper base plating of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, and then tin plating of 0.8 μm was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter was irradiated in the center of each surface width direction of the material in the longitudinal direction of the material to obtain a square wire. . A thin tin plating layer remained on the surface of the laser irradiated portion.
実施例13
幅0.64mmのコルソン合金角線にニッケルの下地めっきを0.3μm、銅の下地めっきを0.5μm施した後、1.2μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径が線径の1/3となるように調整した半導体レーザ(出力5W、波長915nm)を材料長手方向に照射して角線材を得た。レーザ照射された部分の表面にはスズめっき層が薄く残存したものとなった。
Example 13
After applying a nickel base plating of 0.3 μm and a copper base plating of 0.5 μm to a Corson alloy square wire having a width of 0.64 mm, a tin plating of 1.2 μm was performed. Thereafter, a semiconductor laser (output: 5 W, wavelength: 915 nm) adjusted so that the beam diameter is 1/3 of the wire diameter was irradiated in the center of each surface width direction of the material in the longitudinal direction of the material to obtain a square wire. . A thin tin plating layer remained on the surface of the laser irradiated portion.
実施例14
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを0.5μm、銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行った。その後、当該材料の各面幅方向中央部に、ビーム径0.10mmの半導体レーザ(出力5W、波長915nm)を材料長手方向に照射してリフローして、角線材を得た。レーザ照射された部分の表面にはスズめっき層が薄く残存したものとなった。
Example 14
A nickel base plating of 0.5 μm and a copper base plating of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 μm of tin plating. Thereafter, a semiconductor laser having a beam diameter of 0.10 mm (output 5 W, wavelength 915 nm) was irradiated in the longitudinal direction of the material at the center of each surface width direction of the material and reflowed to obtain a square wire. A thin tin plating layer remained on the surface of the laser irradiated portion.
比較例3
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを0.5μm、銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行って角線材を得た。図13の拡大概略断面図に示す角線材を得た。図13中、11は母材(黄銅角線)および下地めっき層、12はスズめっき層である。
図14は、図13に示す角線材の表面部分をさらに拡大して模式的に示す拡大概略断面図である。図中11aは母材、11bは銅めっき層、11cはニッケルめっき層、13はスズめっき層を示す。
Comparative Example 3
A 7/3 brass square wire having a width of 0.64 mm was subjected to 0.5 μm of nickel base plating and 0.3 μm of copper base plating, and then tin plating of 0.8 μm to obtain a square wire. The square wire shown in the enlarged schematic sectional view of FIG. 13 was obtained. In FIG. 13, 11 is a base material (brass square wire) and a base plating layer, and 12 is a tin plating layer.
FIG. 14 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 13 further enlarged. In the figure, 11a is a base material, 11b is a copper plating layer, 11c is a nickel plating layer, and 13 is a tin plating layer.
比較例4
幅0.64mmの7/3黄銅角線にニッケルの下地めっきを0.5μm、銅の下地めっきを0.3μm施した後、0.8μmのスズめっきを行った。その後、バーナーによってSnの融点以上に加熱してリフローして、図15の拡大概略断面図に示す角線材を得た。図15中、11は母材(黄銅角線)および下地めっき層、12はスズめっき層、13は銅スズ合金層である。薄いスズめっき層22が表面全体を被っている。
図16は、図15に示す角線材の表面部分をさらに拡大して模式的に示す拡大概略断面図である。図中11aは母材、11cはニッケルめっき層、12はスズめっき層、13は銅スズ合金層を示す。
Comparative Example 4
A nickel base plating of 0.5 μm and a copper base plating of 0.3 μm were applied to a 7/3 brass square wire having a width of 0.64 mm, followed by 0.8 μm of tin plating. Then, it heated above the melting | fusing point of Sn with the burner and reflowed, and the square wire shown in the enlarged schematic sectional drawing of FIG. 15 was obtained. In FIG. 15, 11 is a base material (brass square wire) and a base plating layer, 12 is a tin plating layer, and 13 is a copper tin alloy layer. A thin tin plating layer 22 covers the entire surface.
FIG. 16 is an enlarged schematic cross-sectional view schematically showing the surface portion of the rectangular wire shown in FIG. 15 further enlarged. In the figure, 11a is a base material, 11c is a nickel plating layer, 12 is a tin plating layer, and 13 is a copper tin alloy layer.
試験例
上記実施例1~14、比較例1~4の角線材の接触抵抗、はんだ濡れ性、動摩擦係数について、評価試験を行った。
(接触抵抗)
接触抵抗は、4端子法によって測定し、接触子にはAgプローブを用い1Nの荷重をかけて測定した。
2mΩ以内を良好◎、5mΩ以内が合格○、それ以上を不合格×とした。
(はんだ濡れ性)
はんだ濡れ性は、メニスコグラフ法によって測定を行った。
装置はレスカ(株)製ソルダーチェッカーSAT-5100を用いた。
はんだはSn-3.0Ag-0.5Cuの鉛フリーはんだを用いて、25%ロジンフラックスを使用した。
判定基準は、浸漬面積の95%以上が濡れている場合に良好◎、浸漬面積の90%以上濡れている場合に合格○、それ以下を不合格×とした。
(動摩擦係数)
動摩擦係数の測定には、バウデン試験器を用いた。
摺動子にはメス端子を模擬したディンプルを取り付けて測定した。
判定基準は、μk<0.25を良好◎、μk<0.3を合格○とし、それ以上を不合格×とした。
Test Example An evaluation test was performed on the contact resistance, solder wettability, and dynamic friction coefficient of the square wires of Examples 1 to 14 and Comparative Examples 1 to 4.
(Contact resistance)
The contact resistance was measured by the 4-terminal method, and the contact was measured by applying a 1N load using an Ag probe.
A value of 2 mΩ or less was good, a value of 5 mΩ or less was acceptable, and a value exceeding that was unacceptable.
(Solder wettability)
Solder wettability was measured by the meniscograph method.
The apparatus used was a Solder Checker SAT-5100 manufactured by Reska Co., Ltd.
The solder used was Sn-3.0Ag-0.5Cu lead-free solder, and 25% rosin flux was used.
The judgment criteria are good when 95% or more of the immersion area is wet, pass ○ when 90% or more of the immersion area is wet, and fail X when the immersion area is wet.
(Dynamic friction coefficient)
A Bowden tester was used to measure the dynamic friction coefficient.
The slider was measured with a dimple simulating a female terminal.
As the judgment criteria, μk <0.25 was good ◎, μk <0.3 was acceptable ○, and more than that was unacceptable ×.
表1~2に示されるように、比較例1~4では接触抵抗、はんだ濡れ性、動摩擦係数の少なくとも1つが不合格であったのに対し、実施例1~14では、いずれも接触抵抗、はんだ濡れ性、動摩擦係数の全てで合格基準を満たし、コネクタ用金属材料として好適なものであった。 As shown in Tables 1 and 2, in Comparative Examples 1 to 4, at least one of contact resistance, solder wettability, and dynamic friction coefficient was rejected, whereas in Examples 1 to 14, all were contact resistance, All of the solder wettability and the dynamic friction coefficient satisfied the acceptance criteria, and were suitable as a connector metal material.
本発明をその実施態様とともに説明したが、我々は特に指定しない限り我々の発明を説明のどの細部においても限定しようとするものではなく、添付の請求の範囲に示した発明の精神と範囲に反することなく幅広く解釈されるべきであると考える。 While this invention has been described in conjunction with its embodiments, we do not intend to limit our invention in any detail of the description unless otherwise specified and are contrary to the spirit and scope of the invention as set forth in the appended claims. I think it should be interpreted widely.
本願は、2008年3月19日に日本国で特許出願された特願2008-072545、及び2008年3月19日に日本国で特許出願された特願2008-072546に基づく優先権を主張するものであり、これらはいずれもここに参照してその内容を本明細書の記載の一部として取り込む。 This application claims priority based on Japanese Patent Application No. 2008-072545 filed in Japan on March 19, 2008, and Japanese Patent Application No. 2008-072546 filed on March 19, 2008 in Japan. All of which are hereby incorporated by reference as if fully set forth herein.
Claims (14)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009801095148A CN101978562B (en) | 2008-03-19 | 2009-03-18 | Metal material for connector and manufacturing method thereof |
| EP09723255A EP2273622A4 (en) | 2008-03-19 | 2009-03-18 | Metallic material for connector and process for producing the metallic material for connector |
| US12/884,268 US20110003167A1 (en) | 2008-03-19 | 2010-09-17 | Metallic material for a connector and method of producing the same |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-072545 | 2008-03-19 | ||
| JP2008072546A JP5415707B2 (en) | 2008-03-19 | 2008-03-19 | Metal material for connector and manufacturing method thereof |
| JP2008072545A JP5089451B2 (en) | 2008-03-19 | 2008-03-19 | Metal material for connector and manufacturing method thereof |
| JP2008-072546 | 2008-03-19 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/884,268 Continuation US20110003167A1 (en) | 2008-03-19 | 2010-09-17 | Metallic material for a connector and method of producing the same |
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| WO2009116601A1 true WO2009116601A1 (en) | 2009-09-24 |
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| PCT/JP2009/055358 Ceased WO2009116601A1 (en) | 2008-03-19 | 2009-03-18 | Metallic material for connector and process for producing the metallic material for connector |
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| Country | Link |
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| EP (1) | EP2273622A4 (en) |
| CN (1) | CN101978562B (en) |
| WO (1) | WO2009116601A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114424413A (en) * | 2019-09-19 | 2022-04-29 | 株式会社自动网络技术研究所 | Pin Terminals, Connectors, Harnesses with Connectors, and Control Units |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5692192B2 (en) * | 2012-09-21 | 2015-04-01 | 株式会社オートネットワーク技術研究所 | Method for manufacturing connector terminal and method for manufacturing connector terminal material |
| CN104513994A (en) * | 2013-09-29 | 2015-04-15 | 泰科电子(上海)有限公司 | Method for forming tin coating on conductive substrate, and electric contact terminal made through using method |
| DE102014017886A1 (en) * | 2014-12-04 | 2016-06-09 | Auto-Kabel Management Gmbh | Method for producing an electrical connection part |
| DE102015003284A1 (en) * | 2015-03-14 | 2016-09-15 | Diehl Metal Applications Gmbh | Method for producing a workpiece made of metal |
| DE102015004651B4 (en) * | 2015-04-15 | 2018-09-27 | Diehl Metal Applications Gmbh | Method for coating a component and use of the method |
| JP7211075B2 (en) * | 2018-12-27 | 2023-01-24 | 三菱マテリアル株式会社 | Anti-corrosion terminal material, terminal, and wire end structure |
| US11133614B2 (en) * | 2019-08-30 | 2021-09-28 | TE Connectivity Services Gmbh | Low insertion force contact and method of manufacture |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10134869A (en) * | 1996-10-30 | 1998-05-22 | Yazaki Corp | Terminal material and terminal |
| JPH11233228A (en) | 1998-02-12 | 1999-08-27 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminals |
| JP2000021546A (en) * | 1998-06-30 | 2000-01-21 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminal |
| JP2000021545A (en) * | 1998-06-30 | 2000-01-21 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminal |
| JP2003171790A (en) * | 2001-01-19 | 2003-06-20 | Furukawa Electric Co Ltd:The | Plating material, method of manufacturing the same, and electric / electronic parts using the same |
| JP2005353352A (en) | 2004-06-09 | 2005-12-22 | Auto Network Gijutsu Kenkyusho:Kk | Mating type male terminal and plating method thereof |
| JP2006161127A (en) * | 2004-12-09 | 2006-06-22 | Takamatsu Mekki:Kk | Electronic material suitable for fitting type connection terminal and method for manufacturing the same |
| JP2006172877A (en) * | 2004-12-15 | 2006-06-29 | Sumitomo Wiring Syst Ltd | Terminal fitting |
| JP2006196323A (en) * | 2005-01-14 | 2006-07-27 | Takamatsu Mekki:Kk | Connection terminal and its manufacturing method |
| JP2007258156A (en) * | 2006-02-27 | 2007-10-04 | Kobe Steel Ltd | Conductive material for connection component |
| JP2008072545A (en) | 2006-09-15 | 2008-03-27 | Audio Technica Corp | Microphone output connector |
| JP2008072546A (en) | 2006-09-15 | 2008-03-27 | Sharp Corp | Remote control signal receiving apparatus and video display apparatus including the apparatus |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5296649A (en) * | 1991-03-26 | 1994-03-22 | The Furukawa Electric Co., Ltd. | Solder-coated printed circuit board and method of manufacturing the same |
| JP3523556B2 (en) * | 2000-02-28 | 2004-04-26 | 古河電気工業株式会社 | Plating method |
| TW575688B (en) * | 2001-01-19 | 2004-02-11 | Furukawa Electric Co Ltd | Metal-plated material and method for preparation thereof, and electric and electronic parts using the same |
| DE10146274A1 (en) | 2001-09-19 | 2003-04-10 | Bosch Gmbh Robert | Metallic surface of a body, method for producing a structured metallic surface of a body and its use |
| JP4112426B2 (en) * | 2003-05-14 | 2008-07-02 | 三菱伸銅株式会社 | Method for manufacturing plating material |
| JP4646192B2 (en) * | 2004-06-02 | 2011-03-09 | 古河電気工業株式会社 | Copper alloy material for electrical and electronic equipment and method for producing the same |
| EP1788585B1 (en) * | 2004-09-10 | 2015-02-18 | Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) | Conductive material for connecting part and method for fabricating the conductive material |
-
2009
- 2009-03-18 EP EP09723255A patent/EP2273622A4/en not_active Withdrawn
- 2009-03-18 WO PCT/JP2009/055358 patent/WO2009116601A1/en not_active Ceased
- 2009-03-18 CN CN2009801095148A patent/CN101978562B/en not_active Expired - Fee Related
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10134869A (en) * | 1996-10-30 | 1998-05-22 | Yazaki Corp | Terminal material and terminal |
| JPH11233228A (en) | 1998-02-12 | 1999-08-27 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminals |
| JP2000021546A (en) * | 1998-06-30 | 2000-01-21 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminal |
| JP2000021545A (en) * | 1998-06-30 | 2000-01-21 | Harness Syst Tech Res Ltd | Manufacturing method of mating connection terminal |
| JP2003171790A (en) * | 2001-01-19 | 2003-06-20 | Furukawa Electric Co Ltd:The | Plating material, method of manufacturing the same, and electric / electronic parts using the same |
| JP2005353352A (en) | 2004-06-09 | 2005-12-22 | Auto Network Gijutsu Kenkyusho:Kk | Mating type male terminal and plating method thereof |
| JP2006161127A (en) * | 2004-12-09 | 2006-06-22 | Takamatsu Mekki:Kk | Electronic material suitable for fitting type connection terminal and method for manufacturing the same |
| JP2006172877A (en) * | 2004-12-15 | 2006-06-29 | Sumitomo Wiring Syst Ltd | Terminal fitting |
| JP2006196323A (en) * | 2005-01-14 | 2006-07-27 | Takamatsu Mekki:Kk | Connection terminal and its manufacturing method |
| JP2007258156A (en) * | 2006-02-27 | 2007-10-04 | Kobe Steel Ltd | Conductive material for connection component |
| JP2008072545A (en) | 2006-09-15 | 2008-03-27 | Audio Technica Corp | Microphone output connector |
| JP2008072546A (en) | 2006-09-15 | 2008-03-27 | Sharp Corp | Remote control signal receiving apparatus and video display apparatus including the apparatus |
Non-Patent Citations (1)
| Title |
|---|
| See also references of EP2273622A4 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114424413A (en) * | 2019-09-19 | 2022-04-29 | 株式会社自动网络技术研究所 | Pin Terminals, Connectors, Harnesses with Connectors, and Control Units |
| CN114424413B (en) * | 2019-09-19 | 2023-12-08 | 株式会社自动网络技术研究所 | Pin terminal, connector, wire harness with connector, and control unit |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2273622A1 (en) | 2011-01-12 |
| CN101978562A (en) | 2011-02-16 |
| CN101978562B (en) | 2013-04-03 |
| EP2273622A4 (en) | 2011-07-06 |
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