[go: up one dir, main page]

WO2009013987A1 - 洗浄防食用組成物および半導体素子または表示素子の製造方法 - Google Patents

洗浄防食用組成物および半導体素子または表示素子の製造方法 Download PDF

Info

Publication number
WO2009013987A1
WO2009013987A1 PCT/JP2008/062109 JP2008062109W WO2009013987A1 WO 2009013987 A1 WO2009013987 A1 WO 2009013987A1 JP 2008062109 W JP2008062109 W JP 2008062109W WO 2009013987 A1 WO2009013987 A1 WO 2009013987A1
Authority
WO
WIPO (PCT)
Prior art keywords
acid
composition
cleaning
rust prevention
semiconductor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/062109
Other languages
English (en)
French (fr)
Inventor
Kenji Shimada
Hiroshi Matsunaga
Kojiro Abe
Kenji Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Gas Chemical Co Inc
Original Assignee
Mitsubishi Gas Chemical Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Gas Chemical Co Inc filed Critical Mitsubishi Gas Chemical Co Inc
Priority to JP2009524437A priority Critical patent/JP5278319B2/ja
Priority to CN200880100170XA priority patent/CN101755324B/zh
Priority to US12/668,695 priority patent/US8802608B2/en
Publication of WO2009013987A1 publication Critical patent/WO2009013987A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G1/00Cleaning or pickling metallic material with solutions or molten salts
    • C23G1/02Cleaning or pickling metallic material with solutions or molten salts with acid solutions
    • C23G1/10Other heavy metals
    • C23G1/103Other heavy metals copper or alloys of copper
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/0005Other compounding ingredients characterised by their effect
    • C11D3/0073Anticorrosion compositions
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/26Organic compounds containing nitrogen
    • C11D3/28Heterocyclic compounds containing nitrogen in the ring
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/26Organic compounds containing nitrogen
    • C11D3/33Amino carboxylic acids
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02Inorganic compounds
    • C11D7/04Water-soluble compounds
    • C11D7/10Salts
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/265Carboxylic acids or salts thereof
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3245Aminoacids
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3263Amides or imides
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3281Heterocyclic compounds
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G1/00Cleaning or pickling metallic material with solutions or molten salts
    • C23G1/02Cleaning or pickling metallic material with solutions or molten salts with acid solutions
    • C23G1/04Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors
    • C23G1/06Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors organic inhibitors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/0206Cleaning during device manufacture during, before or after processing of insulating layers
    • H01L21/02063Cleaning during device manufacture during, before or after processing of insulating layers the processing being the formation of vias or contact holes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/02068Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Wood Science & Technology (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Emergency Medicine (AREA)
  • Health & Medical Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Detergent Compositions (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)

Abstract

 銅を含む金属配線を有する半導体素子などの製造工程に用いられ、防食剤成分が、ピラゾール、3,5-ジメチルピラゾールといったピラゾール誘導体、1,2,4-トリアゾールといったトリアゾール誘導体、イミノ二酢酸、エチレンジアミン二プロピオン酸塩酸塩といったアミノカルボン酸類、ジイソプロピルジスルフィド、ジエチルジスルフィドといったジスルフィド化合物のいずれかであり、洗浄剤成分が、フッ化アンモニウム、フッ化テトラメチルアンモニウム、酢酸アンモニウム、酢酸、グリオキシル酸、シュウ酸、アスコルビン酸、1,2-ジアミノプロパンおよびジメチルアセトアミドのいずれかである洗浄防食用組成物である。また、洗浄防食用組成物を用いた半導体素子などの製造方法である。
PCT/JP2008/062109 2007-07-26 2008-07-03 洗浄防食用組成物および半導体素子または表示素子の製造方法 Ceased WO2009013987A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009524437A JP5278319B2 (ja) 2007-07-26 2008-07-03 洗浄防食用組成物および半導体素子または表示素子の製造方法
CN200880100170XA CN101755324B (zh) 2007-07-26 2008-07-03 清洗和防腐用组合物及半导体元件或显示元件的制造方法
US12/668,695 US8802608B2 (en) 2007-07-26 2008-07-03 Composition for cleaning and rust prevention and process for producing semiconductor element or display element

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007194841 2007-07-26
JP2007-194841 2007-07-26

Publications (1)

Publication Number Publication Date
WO2009013987A1 true WO2009013987A1 (ja) 2009-01-29

Family

ID=40281245

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/062109 Ceased WO2009013987A1 (ja) 2007-07-26 2008-07-03 洗浄防食用組成物および半導体素子または表示素子の製造方法

Country Status (6)

Country Link
US (1) US8802608B2 (ja)
JP (1) JP5278319B2 (ja)
KR (1) KR20100044777A (ja)
CN (1) CN101755324B (ja)
TW (1) TWI458822B (ja)
WO (1) WO2009013987A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014129584A1 (ja) * 2013-02-21 2014-08-28 富士フイルム株式会社 酸化防止処理方法、これを用いた電子デバイスの製造方法、及びこれらに用いられる金属防食剤
EP2593964A4 (en) * 2010-07-16 2017-12-06 Entegris Inc. Aqueous cleaner for the removal of post-etch residues
WO2018174092A1 (ja) * 2017-03-22 2018-09-27 三菱ケミカル株式会社 半導体デバイス用基板の洗浄液、半導体デバイス用基板の洗浄方法、半導体デバイス用基板の製造方法及び半導体デバイス用基板
US10723721B2 (en) * 2017-07-24 2020-07-28 Interquim, S.A. Process for preparing and purifying the LFA-1 antagonist lifitegrast
CN113088410A (zh) * 2021-03-26 2021-07-09 广州皓悦新材料科技有限公司 一种酰胺类水平沉铜膨松剂及其制备方法
JP2022093306A (ja) * 2020-12-11 2022-06-23 東友ファインケム株式会社 高分子処理用工程液

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007063767A1 (ja) * 2005-12-01 2007-06-07 Mitsubishi Gas Chemical Company, Inc. 半導体素子又は表示素子用洗浄液および洗浄方法
WO2009013987A1 (ja) * 2007-07-26 2009-01-29 Mitsubishi Gas Chemical Company, Inc. 洗浄防食用組成物および半導体素子または表示素子の製造方法
JP2012058273A (ja) * 2010-09-03 2012-03-22 Kanto Chem Co Inc フォトレジスト残渣およびポリマー残渣除去液組成物
JP5723815B2 (ja) 2012-03-21 2015-05-27 富士フイルム株式会社 感活性光線性又は感放射線性組成物、及び、それを用いたレジスト膜、パターン形成方法、電子デバイスの製造方法、並びに電子デバイス
JP5856991B2 (ja) * 2012-05-21 2016-02-10 富士フイルム株式会社 化学増幅型レジスト組成物、ネガ型化学増幅型レジスト組成物、それを用いたレジスト膜、レジスト塗布マスクブランクス、フォトマスクの製造方法及びパターン形成方法、並びに、電子デバイスの製造方法
JP5997982B2 (ja) * 2012-08-31 2016-09-28 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、該組成物を用いたレジスト膜、パターン形成方法、及び電子デバイスの製造方法
KR101437357B1 (ko) * 2012-12-03 2014-09-05 주식회사 전영 스케일 및 산화막 제거용 조성물 및 이의 제조방법
US20160118264A1 (en) * 2013-05-02 2016-04-28 Fujifilm Corporation Etching method, etching solution used in same, etching solution kit, and method for manufacturing semiconductor substrate product
US20140349479A1 (en) * 2013-05-24 2014-11-27 Globalfoundries Inc. Method including a removal of a hardmask from a semiconductor structure and rinsing the semiconductor structure with an alkaline rinse solution
US9238588B2 (en) * 2013-08-02 2016-01-19 Ecolab USA, Inc. Organic disulfide based corrosion inhibitors
JP6313189B2 (ja) * 2014-11-04 2018-04-18 東芝メモリ株式会社 半導体装置の製造方法
WO2016191672A1 (en) 2015-05-28 2016-12-01 Ecolab Usa Inc. 2-substituted imidazole and benzimidazole corrosion inhibitors
CN107667094B (zh) 2015-05-28 2022-06-14 艺康美国股份有限公司 作为腐蚀抑制剂的水溶性吡唑衍生物
CN107614497B (zh) 2015-05-28 2021-08-03 艺康美国股份有限公司 腐蚀抑制剂
EP3314038B1 (en) 2015-05-28 2021-12-29 Ecolab Usa Inc. Purine-based corrosion inhibitors
WO2017024092A1 (en) 2015-08-05 2017-02-09 Ecolab Usa Inc. Metal-catalyzed oxidative coupling of thiols
US10894935B2 (en) 2015-12-04 2021-01-19 Samsung Electronics Co., Ltd. Composition for removing silicone resins and method of thinning substrate by using the same
CN107034028B (zh) * 2015-12-04 2021-05-25 三星电子株式会社 用于除去有机硅树脂的组合物、使用其薄化基材和制造半导体封装体的方法及使用其的系统
US11035044B2 (en) * 2017-01-23 2021-06-15 Versum Materials Us, Llc Etching solution for tungsten and GST films
US11242480B2 (en) 2017-08-03 2022-02-08 Championx Usa Inc. Thiol adducts for corrosion inhibition
CN111033697B (zh) * 2017-08-31 2023-10-10 富士胶片株式会社 处理液、试剂盒、基板的清洗方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005286058A (ja) * 2004-03-29 2005-10-13 Fujitsu Ltd 半導体装置
JP2006083376A (ja) * 2004-08-18 2006-03-30 Mitsubishi Gas Chem Co Inc 洗浄液および洗浄法。

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6325654A (ja) * 1986-07-18 1988-02-03 Fuji Photo Film Co Ltd カラ−写真現像液組成物及びハロゲン化銀カラ−写真感光材料の処理方法
DE69502796T2 (de) * 1994-10-20 1998-10-01 Fuji Photo Film Co Ltd Neuer Eisen-Komplex, Verfahren zu seiner Herstellung, photographische Verarbeitungslösung und photographisches Verarbeitungsverfahren unter Verwendung dieses Komplexes
US5885757A (en) * 1996-10-31 1999-03-23 Fuji Photo Film Co., Ltd. Aminopolycarboxylic acid chelating agent, heavy metal chelate compound thereof, photographic additive and processing method
JP4224652B2 (ja) * 1999-03-08 2009-02-18 三菱瓦斯化学株式会社 レジスト剥離液およびそれを用いたレジストの剥離方法
JP2000282096A (ja) 1999-03-31 2000-10-10 Asahi Kagaku Kogyo Co Ltd 金属の腐食防止剤、これを含む洗浄液組成物およびこれを用いる洗浄方法
JP2001022096A (ja) 1999-07-02 2001-01-26 Nippon Zeon Co Ltd ポジ型レジスト用剥離液
JP4078787B2 (ja) 2000-03-31 2008-04-23 Jsr株式会社 化学機械研磨用水系分散体
JP3402365B2 (ja) 2000-06-28 2003-05-06 日本電気株式会社 防食剤
JP4689855B2 (ja) 2001-03-23 2011-05-25 イーケーシー テクノロジー,インコーポレイティド 残渣剥離剤組成物およびその使用方法
KR100874173B1 (ko) 2001-03-27 2008-12-15 어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 반도체 기판 상의 무기 잔류물을 세정하기 위한 구리특이적 부식 억제제를 함유하는 수성 세정 조성물
JP2003035963A (ja) 2001-07-24 2003-02-07 Kanto Chem Co Inc フォトレジスト残渣除去液組成物
JP3787085B2 (ja) 2001-12-04 2006-06-21 関東化学株式会社 フォトレジスト残渣除去液組成物
SG129274A1 (en) 2003-02-19 2007-02-26 Mitsubishi Gas Chemical Co Cleaaning solution and cleaning process using the solution
TWI362415B (en) * 2003-10-27 2012-04-21 Wako Pure Chem Ind Ltd Novel detergent and method for cleaning
CA2544198C (en) * 2003-10-29 2011-07-26 Mallinckrodt Baker, Inc. Alkaline, post plasma etch/ash residue removers and photoresist stripping compositions containing metal-halide corrosion inhibitors
KR20050110470A (ko) 2004-05-19 2005-11-23 테크노세미켐 주식회사 반도체 기판용 세정액 조성물, 이를 이용한 반도체 기판세정방법 및 반도체 장치 제조 방법
JP4456424B2 (ja) * 2004-06-29 2010-04-28 関東化学株式会社 フォトレジスト残渣及びポリマー残渣除去組成物
EP1628336B1 (en) * 2004-08-18 2012-01-04 Mitsubishi Gas Chemical Company, Inc. Cleaning liquid and cleaning method
WO2006081406A1 (en) * 2005-01-27 2006-08-03 Advanced Technology Materials, Inc. Compositions for processing of semiconductor substrates
US20070099810A1 (en) * 2005-10-27 2007-05-03 Hiroshi Matsunaga Cleaning liquid and cleaning method
WO2007120259A2 (en) * 2005-11-08 2007-10-25 Advanced Technology Materials, Inc. Formulations for removing copper-containing post-etch residue from microelectronic devices
US20070179072A1 (en) * 2006-01-30 2007-08-02 Rao Madhukar B Cleaning formulations
US7947637B2 (en) * 2006-06-30 2011-05-24 Fujifilm Electronic Materials, U.S.A., Inc. Cleaning formulation for removing residues on surfaces
EP2108039A2 (en) * 2006-12-21 2009-10-14 Advanced Technology Materials, Inc. Liquid cleaner for the removal of post-etch residues
US7879783B2 (en) * 2007-01-11 2011-02-01 Air Products And Chemicals, Inc. Cleaning composition for semiconductor substrates
WO2009013987A1 (ja) * 2007-07-26 2009-01-29 Mitsubishi Gas Chemical Company, Inc. 洗浄防食用組成物および半導体素子または表示素子の製造方法
WO2009032460A1 (en) * 2007-08-02 2009-03-12 Advanced Technology Materials, Inc. Non-fluoride containing composition for the removal of residue from a microelectronic device
TW200936749A (en) * 2007-10-29 2009-09-01 Ekc Technology Inc Process of purification of amidoxime containing cleaning solutions and their use
TW200940705A (en) * 2007-10-29 2009-10-01 Ekc Technology Inc Copper CMP polishing pad cleaning composition comprising of amidoxime compounds
US20090130849A1 (en) * 2007-10-29 2009-05-21 Wai Mun Lee Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated method for use
WO2009058278A1 (en) * 2007-10-29 2009-05-07 Ekc Technology, Inc Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions
WO2009058275A1 (en) * 2007-10-29 2009-05-07 Ekc Technology, Inc. Methods of post chemical mechanical polishing and wafer cleaning using amidoxime compositions
EP2219882A4 (en) * 2007-11-16 2011-11-23 Ekc Technology Inc COMPOSITIONS FOR REMOVING METAL HARD MASK REST OF A SEMICONDUCTOR SUBSTRATE
US9202709B2 (en) * 2008-03-19 2015-12-01 Fujifilm Corporation Polishing liquid for metal and polishing method using the same
US20100105595A1 (en) * 2008-10-29 2010-04-29 Wai Mun Lee Composition comprising chelating agents containing amidoxime compounds

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005286058A (ja) * 2004-03-29 2005-10-13 Fujitsu Ltd 半導体装置
JP2006083376A (ja) * 2004-08-18 2006-03-30 Mitsubishi Gas Chem Co Inc 洗浄液および洗浄法。

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2593964A4 (en) * 2010-07-16 2017-12-06 Entegris Inc. Aqueous cleaner for the removal of post-etch residues
WO2014129584A1 (ja) * 2013-02-21 2014-08-28 富士フイルム株式会社 酸化防止処理方法、これを用いた電子デバイスの製造方法、及びこれらに用いられる金属防食剤
JP2014185332A (ja) * 2013-02-21 2014-10-02 Fujifilm Corp 酸化防止処理方法、これを用いた電子デバイスの製造方法、及びこれらに用いられる金属防食剤
WO2018174092A1 (ja) * 2017-03-22 2018-09-27 三菱ケミカル株式会社 半導体デバイス用基板の洗浄液、半導体デバイス用基板の洗浄方法、半導体デバイス用基板の製造方法及び半導体デバイス用基板
US10723721B2 (en) * 2017-07-24 2020-07-28 Interquim, S.A. Process for preparing and purifying the LFA-1 antagonist lifitegrast
US11286250B2 (en) 2017-07-24 2022-03-29 Interquim, S.A. Process for preparing and purifying a LFA-1 antagonist
JP2022093306A (ja) * 2020-12-11 2022-06-23 東友ファインケム株式会社 高分子処理用工程液
JP7346532B2 (ja) 2020-12-11 2023-09-19 東友ファインケム株式会社 高分子処理用工程液
CN113088410A (zh) * 2021-03-26 2021-07-09 广州皓悦新材料科技有限公司 一种酰胺类水平沉铜膨松剂及其制备方法

Also Published As

Publication number Publication date
KR20100044777A (ko) 2010-04-30
TW200916573A (en) 2009-04-16
CN101755324A (zh) 2010-06-23
CN101755324B (zh) 2011-10-12
TWI458822B (zh) 2014-11-01
US20100197136A1 (en) 2010-08-05
JPWO2009013987A1 (ja) 2010-09-30
US8802608B2 (en) 2014-08-12
JP5278319B2 (ja) 2013-09-04

Similar Documents

Publication Publication Date Title
WO2009013987A1 (ja) 洗浄防食用組成物および半導体素子または表示素子の製造方法
WO2007017416A3 (de) Fungizide mischungen enthaltend substituierte 1-methylpyrazol-4-ylcarbonsäureanilide
WO2009001829A1 (ja) 安定性が改良されたトリフェニルボロン化合物含有防汚塗料組成物、それに用いる防汚剤セット、およびトリフェニルボロン化合物の分解抑制・制御方法
WO2008027264A3 (en) Disinfectant systems and methods
WO2010065579A3 (en) Fungicidal heterocyclic compounds
WO2008013622A3 (en) Fungicidal azocyclic amides
WO2004098528A3 (en) Pyrazole-amine compounds useful as kinase inhibitors
EP2261218A3 (en) Process for preparing phenyl-, pyridinyl- or pyrimidinyl-substituted imidazoles
WO2008019320A3 (en) Biocidal compositions and methods
WO2009137538A3 (en) Fungicidal substituted azoles
PL374967A1 (en) Pyrazole compositions useful as inhibitors of gsk-3
MX2009006256A (es) Composiciones intensificadoras inhibidoras de corrosion y metodos relacionados.
WO2009016218A3 (en) Fungicide n-cycloalkyl-n-bicyclic-carboxamide derivatives
WO2006036538A3 (en) Organometallic precursor compounds
EA200501835A1 (ru) Применение карбонатов и бикарбонатов четвертичного аммония в качестве антикоррозионных агентов, способ ингибирования коррозии и антикоррозионные покрытия, в которых применяются эти агенты
PT2049480E (pt) Derivados de 2-arilindole como inibidores da mpges-i
WO2011010879A3 (ko) 액정표시장치용 어레이 기판의 제조방법
WO2008087182A3 (de) Fungizide mischungen aus 1-methylpyrazol-4-ylcarbonsäureaniliden und azolopyrimidinylaminen
EA200701162A1 (ru) Четвертичные аммониевые соли, как конверсионные покрытия или противокоррозионная добавка для красок
WO2011090692A3 (en) Pretreatment process for aluminum and high etch cleaner used therein
WO2006092536A3 (fr) Procede de preparation d'une solution sol-gel et utilisation de cette solution pour constituer un revetement pour proteger un substrat a surface metallique
WO2008090732A1 (ja) 医薬組成物
WO2005010000A3 (de) Arylkondensierte 3-arylpyridinverbindungen und ihre verwendung zur bekämpfung von schadpilzen
SI1532145T1 (sl) Pirazolni sestavki, koristni kot inhibitorji GSK-3
EP1939688A4 (en) COMPOSITION FOR THE FORMATION OF ANTIREFLECTIVE FILM, COMPRISING A PRODUCT OF THE REACTION BETWEEN AN ISOCYANURIC ACID COMPOUND AND A BENZOIC ACID COMPOUND

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200880100170.X

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08790853

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009524437

Country of ref document: JP

ENP Entry into the national phase

Ref document number: 20107000563

Country of ref document: KR

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 12668695

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08790853

Country of ref document: EP

Kind code of ref document: A1