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WO2009004929A1 - 撮像装置の製造方法、撮像装置及び光学素子 - Google Patents

撮像装置の製造方法、撮像装置及び光学素子 Download PDF

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Publication number
WO2009004929A1
WO2009004929A1 PCT/JP2008/061224 JP2008061224W WO2009004929A1 WO 2009004929 A1 WO2009004929 A1 WO 2009004929A1 JP 2008061224 W JP2008061224 W JP 2008061224W WO 2009004929 A1 WO2009004929 A1 WO 2009004929A1
Authority
WO
WIPO (PCT)
Prior art keywords
optical element
imaging device
substrate
electronic component
device manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/061224
Other languages
English (en)
French (fr)
Inventor
Daisuke Watanabe
Takeshi Kojima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Opto Inc
Original Assignee
Konica Minolta Opto Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Opto Inc filed Critical Konica Minolta Opto Inc
Priority to US12/664,774 priority Critical patent/US20100199491A1/en
Priority to JP2009521576A priority patent/JP5187306B2/ja
Priority to EP08777385A priority patent/EP2166395A1/en
Priority to CN200880020422A priority patent/CN101681010A/zh
Publication of WO2009004929A1 publication Critical patent/WO2009004929A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/04Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29DPRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D11/00Producing optical elements, e.g. lenses or prisms
    • B29D11/00009Production of simple or compound lenses
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29DPRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D11/00Producing optical elements, e.g. lenses or prisms
    • B29D11/0074Production of other optical elements not provided for in B29D11/00009- B29D11/0073
    • B29D11/00807Producing lenses combined with electronics, e.g. chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/804Containers or encapsulations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
  • Lens Barrels (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)

Abstract

 リフロー処理による光学素子の変形を防止した撮像装置の製造方法は、23°C、500Hzの測定条件下で50~50000mPasの粘度を有する熱硬化性樹脂材料を硬化して光学素子を成形する工程、前記光学素子を電子部品とともに基板上に載置する工程、及び、前記光学素子と、前記電子部品と、前記基板とをリフロー処理に供し、前記光学素子と前記電子部品とを前記基板に実装する工程を有するものである。
PCT/JP2008/061224 2007-07-03 2008-06-19 撮像装置の製造方法、撮像装置及び光学素子 Ceased WO2009004929A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US12/664,774 US20100199491A1 (en) 2007-07-03 2008-06-19 Manufacturing method of image pick-up device, image pick-up device and optical element
JP2009521576A JP5187306B2 (ja) 2007-07-03 2008-06-19 撮像装置の製造方法、撮像装置及び光学素子
EP08777385A EP2166395A1 (en) 2007-07-03 2008-06-19 Imaging device manufacturing method, imaging device and optical element
CN200880020422A CN101681010A (zh) 2007-07-03 2008-06-19 摄影装置的制造方法、摄影装置以及光学元件

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007175152 2007-07-03
JP2007-175152 2007-07-03

Publications (1)

Publication Number Publication Date
WO2009004929A1 true WO2009004929A1 (ja) 2009-01-08

Family

ID=40225980

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/061224 Ceased WO2009004929A1 (ja) 2007-07-03 2008-06-19 撮像装置の製造方法、撮像装置及び光学素子

Country Status (6)

Country Link
US (1) US20100199491A1 (ja)
EP (1) EP2166395A1 (ja)
JP (1) JP5187306B2 (ja)
KR (1) KR20100028555A (ja)
CN (1) CN101681010A (ja)
WO (1) WO2009004929A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101968563A (zh) * 2009-07-27 2011-02-09 昆山钜亮光电科技有限公司 回流焊级堆叠镜头组件
JP2012133237A (ja) * 2010-12-22 2012-07-12 Hitachi Chem Co Ltd 光導波路形成用樹脂組成物及びこれを用いた光導波路形成用樹脂フィルム、並びにこれらを用いた光導波路
JP2013524702A (ja) * 2010-04-01 2013-06-17 コンティ テミック マイクロエレクトロニック ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学モジュール及び支持板を持つ装置

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JP5998962B2 (ja) * 2013-01-31 2016-09-28 三菱電機株式会社 半導体光装置
KR20150107991A (ko) * 2014-03-14 2015-09-24 삼성전자주식회사 광학계 고정유닛 및 이를 구비하는 광학 설비
DE202016106444U1 (de) 2016-11-17 2018-02-21 Sick Ag Beleuchtungsvorrichtung zum Erzeugen eines Beleuchtungsmusters in einem Erfassungsbereich
EP3570103B1 (en) * 2018-05-17 2020-07-01 Axis AB Camera arrangement and method for aligning a sensor board and an optics unit
JP2021033170A (ja) * 2019-08-28 2021-03-01 セイコーエプソン株式会社 光学素子、光学素子の製造方法及び表示装置

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JPH11160503A (ja) * 1997-11-28 1999-06-18 Shin Etsu Polymer Co Ltd 光学用レンズの製造方法
JP2004004632A (ja) * 2002-03-28 2004-01-08 Teijin Chem Ltd 耐熱光学部品
JP2004117955A (ja) * 2002-09-27 2004-04-15 Nippon Telegr & Teleph Corp <Ntt> マイクロ樹脂レンズの製造方法

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JP3656640B2 (ja) * 2002-08-28 2005-06-08 セイコーエプソン株式会社 樹脂絶縁層の製造方法、電気光学装置用基板、電気光学装置の製造方法、及び電気光学装置
JP2004144987A (ja) * 2002-10-24 2004-05-20 Fuji Xerox Co Ltd 高分子光導波路の製造方法
WO2004066398A1 (ja) * 2003-01-20 2004-08-05 Sharp Kabushiki Kaisha 光センサフィルタ用の透明樹脂組成物、光センサおよびその製造方法
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TW200517437A (en) * 2003-10-16 2005-06-01 Nitto Denko Corp Epoxy resin composition for encapsulating optical semiconductor element and optical semiconductor device using the same
JP2005274664A (ja) * 2004-03-23 2005-10-06 Jsr Corp 光導波路形成用感光性樹脂組成物および光導波路
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JPH11160503A (ja) * 1997-11-28 1999-06-18 Shin Etsu Polymer Co Ltd 光学用レンズの製造方法
JP2004004632A (ja) * 2002-03-28 2004-01-08 Teijin Chem Ltd 耐熱光学部品
JP2004117955A (ja) * 2002-09-27 2004-04-15 Nippon Telegr & Teleph Corp <Ntt> マイクロ樹脂レンズの製造方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101968563A (zh) * 2009-07-27 2011-02-09 昆山钜亮光电科技有限公司 回流焊级堆叠镜头组件
JP2013524702A (ja) * 2010-04-01 2013-06-17 コンティ テミック マイクロエレクトロニック ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学モジュール及び支持板を持つ装置
US9025061B2 (en) 2010-04-01 2015-05-05 Conti Temic Microelectronic Gmbh Device having an optical module and a supporting plate
JP2012133237A (ja) * 2010-12-22 2012-07-12 Hitachi Chem Co Ltd 光導波路形成用樹脂組成物及びこれを用いた光導波路形成用樹脂フィルム、並びにこれらを用いた光導波路

Also Published As

Publication number Publication date
KR20100028555A (ko) 2010-03-12
US20100199491A1 (en) 2010-08-12
JP5187306B2 (ja) 2013-04-24
JPWO2009004929A1 (ja) 2010-08-26
EP2166395A1 (en) 2010-03-24
CN101681010A (zh) 2010-03-24

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