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WO2009069189A1 - Insert, plateau et appareil d'essai de composant électronique - Google Patents

Insert, plateau et appareil d'essai de composant électronique Download PDF

Info

Publication number
WO2009069189A1
WO2009069189A1 PCT/JP2007/072788 JP2007072788W WO2009069189A1 WO 2009069189 A1 WO2009069189 A1 WO 2009069189A1 JP 2007072788 W JP2007072788 W JP 2007072788W WO 2009069189 A1 WO2009069189 A1 WO 2009069189A1
Authority
WO
WIPO (PCT)
Prior art keywords
insert
latch member
tray
electronic component
testing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/072788
Other languages
English (en)
Japanese (ja)
Inventor
Akihiro Osakabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to CN200780101506.XA priority Critical patent/CN101849190B/zh
Priority to KR1020107009174A priority patent/KR20100061570A/ko
Priority to JP2009543596A priority patent/JP5291632B2/ja
Priority to PCT/JP2007/072788 priority patent/WO2009069189A1/fr
Priority to TW097145340A priority patent/TWI385863B/zh
Publication of WO2009069189A1 publication Critical patent/WO2009069189A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

L'invention porte sur un insert (710) qui comporte un mécanisme de verrouillage (731) qui peut se déplacer entre une position fermée dans laquelle le mécanisme de verrouillage est amené à proximité de la surface supérieure d'un dispositif à CI placé dans l'insert et une position ouverte dans laquelle le mécanisme de verrouillage est éloigné de la surface supérieure du dispositif à CI stocké dans l'insert ; et sur un élément de support (733) qui maintient de manière rotative le mécanisme de verrouillage (731) vers un corps principal d'insert (720). Le mécanisme de verrouillage (731) tourne au moins en ayant l'élément de support (733) comme centre de rotation dans une vue en plan de l'insert (710).
PCT/JP2007/072788 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique Ceased WO2009069189A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN200780101506.XA CN101849190B (zh) 2007-11-26 2007-11-26 插入件、托盘及电子元件测试装置
KR1020107009174A KR20100061570A (ko) 2007-11-26 2007-11-26 인서트, 트레이 및 전자부품 시험장치
JP2009543596A JP5291632B2 (ja) 2007-11-26 2007-11-26 インサート、トレイ及び電子部品試験装置
PCT/JP2007/072788 WO2009069189A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique
TW097145340A TWI385863B (zh) 2007-11-26 2008-11-24 Embedded devices, trays and electronic parts test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072788 WO2009069189A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique

Publications (1)

Publication Number Publication Date
WO2009069189A1 true WO2009069189A1 (fr) 2009-06-04

Family

ID=40678107

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/072788 Ceased WO2009069189A1 (fr) 2007-11-26 2007-11-26 Insert, plateau et appareil d'essai de composant électronique

Country Status (5)

Country Link
JP (1) JP5291632B2 (fr)
KR (1) KR20100061570A (fr)
CN (1) CN101849190B (fr)
TW (1) TWI385863B (fr)
WO (1) WO2009069189A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018189390A (ja) * 2017-04-28 2018-11-29 株式会社アドバンテスト 電子部品試験装置用のキャリア
US11579187B1 (en) 2021-07-21 2023-02-14 Advantest Corporation Test carrier and electronic component testing apparatus
US11693026B2 (en) 2021-10-22 2023-07-04 Advantest Corporation Test carrier

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013044684A (ja) * 2011-08-25 2013-03-04 Seiko Epson Corp ハンドラー、及び部品検査装置
JP6040530B2 (ja) * 2012-01-17 2016-12-07 セイコーエプソン株式会社 ハンドラーおよび検査装置
JP5872391B2 (ja) * 2012-06-22 2016-03-01 株式会社アドバンテスト 電子部品試験装置
JP6809978B2 (ja) * 2017-04-28 2021-01-06 株式会社アドバンテスト 電子部品試験装置用のキャリア
JP2019120564A (ja) * 2017-12-28 2019-07-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
KR102760368B1 (ko) * 2018-12-11 2025-02-03 (주)테크윙 전자부품 테스트용 핸들러
KR102766884B1 (ko) * 2019-12-12 2025-02-14 (주)테크윙 전자부품의 테스트를 지원하는 핸들러용 테스트트레이
JP2023055016A (ja) * 2021-10-05 2023-04-17 株式会社アドバンテスト 電子部品試験装置、ソケット、及び、キャリア

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08213794A (ja) * 1994-10-11 1996-08-20 Advantest Corp Ｉｃキャリア
JPH11105969A (ja) * 1997-10-03 1999-04-20 Advantest Corp Ｉｃキャリア
WO2004095039A1 (fr) * 2003-04-23 2004-11-04 Advantest Corporation Piece a inserer destinee a un dispositif de manipulation de composants electroniques, plateau et dispositif de manipulation de composants electroniques

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4222442B2 (ja) * 1999-07-16 2009-02-12 株式会社アドバンテスト 電子部品試験装置用インサート
JP4279413B2 (ja) * 1999-07-16 2009-06-17 株式会社アドバンテスト 電子部品試験装置用インサート
DE10297654B4 (de) * 2002-03-06 2010-08-05 Advantest Corp. Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente
TWI238257B (en) * 2003-07-10 2005-08-21 Advantest Corp Insert kit and electronic device handling apparatus
CN1996769A (zh) * 2006-01-05 2007-07-11 深圳富泰宏精密工业有限公司 芯片卡固持结构

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08213794A (ja) * 1994-10-11 1996-08-20 Advantest Corp Ｉｃキャリア
JPH11105969A (ja) * 1997-10-03 1999-04-20 Advantest Corp Ｉｃキャリア
WO2004095039A1 (fr) * 2003-04-23 2004-11-04 Advantest Corporation Piece a inserer destinee a un dispositif de manipulation de composants electroniques, plateau et dispositif de manipulation de composants electroniques

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018189390A (ja) * 2017-04-28 2018-11-29 株式会社アドバンテスト 電子部品試験装置用のキャリア
US11579187B1 (en) 2021-07-21 2023-02-14 Advantest Corporation Test carrier and electronic component testing apparatus
US11693026B2 (en) 2021-10-22 2023-07-04 Advantest Corporation Test carrier

Also Published As

Publication number Publication date
KR20100061570A (ko) 2010-06-07
TWI385863B (zh) 2013-02-11
CN101849190A (zh) 2010-09-29
JP5291632B2 (ja) 2013-09-18
TW200941832A (en) 2009-10-01
CN101849190B (zh) 2013-05-15
JPWO2009069189A1 (ja) 2011-04-07

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