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WO2008114718A1 - マグネトロンスパッタ装置 - Google Patents

マグネトロンスパッタ装置 Download PDF

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Publication number
WO2008114718A1
WO2008114718A1 PCT/JP2008/054730 JP2008054730W WO2008114718A1 WO 2008114718 A1 WO2008114718 A1 WO 2008114718A1 JP 2008054730 W JP2008054730 W JP 2008054730W WO 2008114718 A1 WO2008114718 A1 WO 2008114718A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetron sputtering
sputtering apparatus
treated substrate
plasma
treated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/054730
Other languages
English (en)
French (fr)
Inventor
Tadahiro Ohmi
Tetsuya Goto
Takaaki Matsuoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tohoku University NUC
Tokyo Electron Ltd
Original Assignee
Tohoku University NUC
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tohoku University NUC, Tokyo Electron Ltd filed Critical Tohoku University NUC
Priority to US12/531,515 priority Critical patent/US9812302B2/en
Priority to DE112008000702T priority patent/DE112008000702T5/de
Priority to CN200880008619XA priority patent/CN101636521B/zh
Priority to JP2009505194A priority patent/JP4942005B2/ja
Priority to KR1020097020501A priority patent/KR101140195B1/ko
Publication of WO2008114718A1 publication Critical patent/WO2008114718A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
    • H01J37/3455—Movable magnets
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32458—Vessel
    • H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
    • H01J37/32495—Means for protecting the vessel against plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405—Magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405—Magnetron sputtering
    • H01J37/3408—Planar magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/3441—Dark space shields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
    • H01J37/3452—Magnet distribution
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

　本発明の課題は、回転磁石群によってターゲット表面の磁場パターンが時間と共に移動するように構成されたマグネトロンスパッタ装置において、プラズマ着火や消去の際に被処理基板の不良率が高くなる問題を解決し、被処理基板の不良率が従来よりも小さいマグネトロンスパッタ装置を提供することにある。 　本発明のマグネトロンスパッタ装置はターゲットに対して回転磁石群と反対側にスリットを備えたプラズマ遮蔽部材を設け、当該プラズマ遮蔽部材と被処理基板との間の距離を電子の平均自由工程よりも短くするか、或いは、シース幅よりも短くする。更に、スリット幅及び長さを制御することにより、被処理基板にプラズマが当らないようにする。これによって、被処理基板の不良率を小さくすることができる。 　 
PCT/JP2008/054730 2007-03-16 2008-03-14 マグネトロンスパッタ装置 Ceased WO2008114718A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US12/531,515 US9812302B2 (en) 2007-03-16 2008-03-14 Magnetron sputtering apparatus
DE112008000702T DE112008000702T5 (de) 2007-03-16 2008-03-14 Magnetron-Sputter-Vorrichtung
CN200880008619XA CN101636521B (zh) 2007-03-16 2008-03-14 磁控溅射装置
JP2009505194A JP4942005B2 (ja) 2007-03-16 2008-03-14 マグネトロンスパッタ装置
KR1020097020501A KR101140195B1 (ko) 2007-03-16 2008-03-14 마그네트론 스퍼터 장치

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007067940 2007-03-16
JP2007-067940 2007-03-16
JP2007-099778 2007-04-05
JP2007099778 2007-04-05

Publications (1)

Publication Number Publication Date
WO2008114718A1 true WO2008114718A1 (ja) 2008-09-25

Family

ID=39765826

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054730 Ceased WO2008114718A1 (ja) 2007-03-16 2008-03-14 マグネトロンスパッタ装置

Country Status (7)

Country Link
US (1) US9812302B2 (ja)
JP (1) JP4942005B2 (ja)
KR (1) KR101140195B1 (ja)
CN (1) CN101636521B (ja)
DE (1) DE112008000702T5 (ja)
TW (1) TWI410511B (ja)
WO (1) WO2008114718A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010122798A1 (ja) * 2009-04-24 2010-10-28 国立大学法人東北大学 水分発生用反応炉
WO2011007832A1 (ja) * 2009-07-17 2011-01-20 株式会社アルバック 成膜装置
JP2013064171A (ja) * 2011-09-15 2013-04-11 Ulvac Japan Ltd スパッタリング装置、成膜方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112008000912T5 (de) * 2007-04-06 2010-02-18 National University Corporation Tohoku University, Sendai Magnetronsputtervorrichtung
JP2010073456A (ja) * 2008-09-18 2010-04-02 Tohoku Univ マグネトロン
JP5599476B2 (ja) * 2010-12-28 2014-10-01 キヤノンアネルバ株式会社 スパッタリング装置
WO2012114941A1 (ja) * 2011-02-25 2012-08-30 東レ株式会社 プラズマ処理用マグネトロン電極
KR101275672B1 (ko) * 2011-03-15 2013-06-17 (주)울텍 스퍼터링 마그네트론
TW201327712A (zh) * 2011-11-01 2013-07-01 Intevac Inc 以電漿處理太陽能電池晶圓之系統架構
WO2015020487A1 (ko) * 2013-08-08 2015-02-12 고려대학교 산학협력단 타자 물질막 형성 장치 및 방법
JP6097195B2 (ja) 2013-10-10 2017-03-15 日東電工株式会社 スパッタ装置およびスパッタ装置のメンテナンス方法
DE102018112335A1 (de) 2018-05-23 2019-11-28 Hartmetall-Werkzeugfabrik Paul Horn Gmbh Magnetronsputtervorrichtung

Citations (5)

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JPH0790569A (ja) * 1993-09-20 1995-04-04 Canon Inc スパッタリング装置
JPH1072665A (ja) * 1996-07-10 1998-03-17 Applied Materials Inc プラズマ反応装置における電気的に浮遊したシールド
JP2001026869A (ja) * 1999-07-09 2001-01-30 Sharp Corp マグネトロンスパッタ装置
JP2001032067A (ja) * 1999-07-22 2001-02-06 Sanyo Shinku Kogyo Kk 成膜用磁石とそれを用いた成膜方法及びその装置
WO2007043476A1 (ja) * 2005-10-07 2007-04-19 Tohoku University マグネトロンスパッタ装置

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JPH0790569A (ja) * 1993-09-20 1995-04-04 Canon Inc スパッタリング装置
JPH1072665A (ja) * 1996-07-10 1998-03-17 Applied Materials Inc プラズマ反応装置における電気的に浮遊したシールド
JP2001026869A (ja) * 1999-07-09 2001-01-30 Sharp Corp マグネトロンスパッタ装置
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WO2007043476A1 (ja) * 2005-10-07 2007-04-19 Tohoku University マグネトロンスパッタ装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010122798A1 (ja) * 2009-04-24 2010-10-28 国立大学法人東北大学 水分発生用反応炉
WO2011007832A1 (ja) * 2009-07-17 2011-01-20 株式会社アルバック 成膜装置
CN102471875A (zh) * 2009-07-17 2012-05-23 株式会社爱发科 成膜装置
JP5427889B2 (ja) * 2009-07-17 2014-02-26 株式会社アルバック 成膜装置および成膜方法
KR101406341B1 (ko) * 2009-07-17 2014-06-27 가부시키가이샤 아루박 성막 장치
JP2013064171A (ja) * 2011-09-15 2013-04-11 Ulvac Japan Ltd スパッタリング装置、成膜方法

Also Published As

Publication number Publication date
DE112008000702T5 (de) 2010-03-11
KR20090116820A (ko) 2009-11-11
TWI410511B (zh) 2013-10-01
CN101636521B (zh) 2013-07-24
KR101140195B1 (ko) 2012-05-02
US9812302B2 (en) 2017-11-07
US20100101945A1 (en) 2010-04-29
JP4942005B2 (ja) 2012-05-30
JPWO2008114718A1 (ja) 2010-07-01
TW200902742A (en) 2009-01-16
CN101636521A (zh) 2010-01-27

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