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WO2008152695A1 - 電子装置、電子装置の試験方法 - Google Patents

電子装置、電子装置の試験方法 Download PDF

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Publication number
WO2008152695A1
WO2008152695A1 PCT/JP2007/061816 JP2007061816W WO2008152695A1 WO 2008152695 A1 WO2008152695 A1 WO 2008152695A1 JP 2007061816 W JP2007061816 W JP 2007061816W WO 2008152695 A1 WO2008152695 A1 WO 2008152695A1
Authority
WO
WIPO (PCT)
Prior art keywords
electronic device
receiver
testing method
driver
amplitude
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/061816
Other languages
English (en)
French (fr)
Inventor
Teruaki Yagoshi
Hitoshi Yokemura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to KR1020097025955A priority Critical patent/KR101121823B1/ko
Priority to CN2007800533112A priority patent/CN101680923B/zh
Priority to JP2009519090A priority patent/JPWO2008152695A1/ja
Priority to PCT/JP2007/061816 priority patent/WO2008152695A1/ja
Publication of WO2008152695A1 publication Critical patent/WO2008152695A1/ja
Priority to US12/629,167 priority patent/US20100072977A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31716—Testing of input or output with loop-back

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

　信号を受信するレシーバ（３）と、信号を出力するドライバ（２）と、レシーバ（３）の入力端に接続される振幅検出器を有する振幅測定部（１０）およびレシーバ（３）の出力端に接続される位相検出器を有するジッタ測定部（２０）のうちの少なくとも一方を備え、ドライバ（２）の出力端（２ａ）とレシーバ（３）の入力端（３ａ）とを接続することによって、ドライバ出力の振幅およびジッタのうちの少なくとも一方の測定を行う。
PCT/JP2007/061816 2007-06-12 2007-06-12 電子装置、電子装置の試験方法 Ceased WO2008152695A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020097025955A KR101121823B1 (ko) 2007-06-12 2007-06-12 전자 장치, 전자 장치의 시험 방법, 및 시험 프로그램을 기록한 기록 매체
CN2007800533112A CN101680923B (zh) 2007-06-12 2007-06-12 电子装置、电子装置的测试方法
JP2009519090A JPWO2008152695A1 (ja) 2007-06-12 2007-06-12 電子装置、電子装置の試験方法
PCT/JP2007/061816 WO2008152695A1 (ja) 2007-06-12 2007-06-12 電子装置、電子装置の試験方法
US12/629,167 US20100072977A1 (en) 2007-06-12 2009-12-02 Electronic device and test method of electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/061816 WO2008152695A1 (ja) 2007-06-12 2007-06-12 電子装置、電子装置の試験方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/629,167 Continuation US20100072977A1 (en) 2007-06-12 2009-12-02 Electronic device and test method of electronic device

Publications (1)

Publication Number Publication Date
WO2008152695A1 true WO2008152695A1 (ja) 2008-12-18

Family

ID=40129313

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/061816 Ceased WO2008152695A1 (ja) 2007-06-12 2007-06-12 電子装置、電子装置の試験方法

Country Status (5)

Country Link
US (1) US20100072977A1 (ja)
JP (1) JPWO2008152695A1 (ja)
KR (1) KR101121823B1 (ja)
CN (1) CN101680923B (ja)
WO (1) WO2008152695A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012013678A (ja) * 2010-06-04 2012-01-19 Renesas Electronics Corp 通信試験回路及び電子機器、受信回路、送信回路、半導体集積回路、ウェハ

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012023211A1 (ja) * 2010-08-20 2012-02-23 富士通株式会社 半導体装置
US8385496B1 (en) * 2010-10-21 2013-02-26 Altera Corporation Apparatus and methods of receiver offset calibration
CN102223268B (zh) * 2011-06-17 2014-04-02 福建星网锐捷网络有限公司 网络设备硬件测试启动方法、装置及网络设备
CN116248542B (zh) * 2023-05-12 2023-08-08 芯耀辉科技有限公司 一种用于数字通信中抖动容限测试的装置、方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11274261A (ja) * 1997-11-26 1999-10-08 Hewlett Packard Co <Hp> 集積回路を試験するデバイスの構成要素の許容差を試験するシステム
JP2004260677A (ja) * 2003-02-27 2004-09-16 Renesas Technology Corp 通信装置

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US5471136A (en) * 1991-07-24 1995-11-28 Genrad Limited Test system for calculating the propagation delays in signal paths leading to a plurality of pins associated with a circuit
KR100213241B1 (ko) * 1997-06-23 1999-08-02 윤종용 데이터 입출력 회로 및 데이터 입출력 방법
JP3560465B2 (ja) * 1998-03-17 2004-09-02 富士通株式会社 双方向通信システム及び上り通信雑音レベル判定方法
US6253159B1 (en) * 1998-12-31 2001-06-26 Kimberly-Clark Worldwide, Inc. Process control using multiple detections
US6175939B1 (en) * 1999-03-30 2001-01-16 Credence Systems Corporation Integrated circuit testing device with dual purpose analog and digital channels
EP1187354B1 (en) * 1999-03-30 2005-11-23 Sanyo Electric Co., Ltd. Radio device and method of calibration of antenna directivity
US6738173B2 (en) * 2001-06-26 2004-05-18 Andrew Bonthron Limiting amplifier modulator driver
US6960931B2 (en) * 2002-10-30 2005-11-01 International Business Machines Corporation Low voltage differential signal driver circuit and method
US20040203483A1 (en) * 2002-11-07 2004-10-14 International Business Machines Corporation Interface transceiver power mangagement method and apparatus
JP4323873B2 (ja) * 2003-06-13 2009-09-02 富士通株式会社 入出力インタフェース回路
JP2005337740A (ja) * 2004-05-24 2005-12-08 Matsushita Electric Ind Co Ltd 高速インターフェース回路検査モジュール、高速インターフェース回路検査対象モジュールおよび高速インターフェース回路検査方法
US20070063741A1 (en) * 2005-09-22 2007-03-22 Tarango Tony M Testing of integrated circuit receivers
US7684944B2 (en) * 2006-10-17 2010-03-23 Advantest Corporation Calibration apparatus, calibration method, and testing apparatus
US7881608B2 (en) * 2007-05-10 2011-02-01 Avago Technologies Fiber Ip (Singapore) Pte. Ltd Methods and apparatuses for measuring jitter in a transceiver module

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11274261A (ja) * 1997-11-26 1999-10-08 Hewlett Packard Co <Hp> 集積回路を試験するデバイスの構成要素の許容差を試験するシステム
JP2004260677A (ja) * 2003-02-27 2004-09-16 Renesas Technology Corp 通信装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012013678A (ja) * 2010-06-04 2012-01-19 Renesas Electronics Corp 通信試験回路及び電子機器、受信回路、送信回路、半導体集積回路、ウェハ

Also Published As

Publication number Publication date
KR101121823B1 (ko) 2012-03-21
KR20100013322A (ko) 2010-02-09
US20100072977A1 (en) 2010-03-25
JPWO2008152695A1 (ja) 2010-08-26
CN101680923A (zh) 2010-03-24
CN101680923B (zh) 2012-11-21

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