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WO2008114700A1 - 測定装置、測定方法、試験装置、電子デバイス、および、プログラム - Google Patents

測定装置、測定方法、試験装置、電子デバイス、および、プログラム Download PDF

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Publication number
WO2008114700A1
WO2008114700A1 PCT/JP2008/054662 JP2008054662W WO2008114700A1 WO 2008114700 A1 WO2008114700 A1 WO 2008114700A1 JP 2008054662 W JP2008054662 W JP 2008054662W WO 2008114700 A1 WO2008114700 A1 WO 2008114700A1
Authority
WO
WIPO (PCT)
Prior art keywords
jitter
measuring
section
measurement signal
measuring apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/054662
Other languages
English (en)
French (fr)
Inventor
Takahiro Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to DE112008000680T priority Critical patent/DE112008000680T5/de
Priority to JP2009505181A priority patent/JPWO2008114700A1/ja
Publication of WO2008114700A1 publication Critical patent/WO2008114700A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0836—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of phase error, e.g. jitter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

　データ変換器において生じるジッタを測定する測定装置であって、略一定周期の測定信号を生成する測定信号生成部と、測定信号に、予め定められたジッタ周期の確定信号のジッタを印加して、データ変換器に入力するジッタ印加部と、データ変換器が出力するデジタル信号のジッタ系列を測定するジッタ測定部と、ジッタ印加部が印加したジッタのジッタ周期に応じて、ジッタ系列のデータを抽出する抽出部とを備える測定装置、および、当該測定装置を用いた試験装置等を提供する。
PCT/JP2008/054662 2007-03-13 2008-03-13 測定装置、測定方法、試験装置、電子デバイス、および、プログラム Ceased WO2008114700A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE112008000680T DE112008000680T5 (de) 2007-03-13 2008-03-13 Messgerät, Messverfahren, Prüfgerät, elektronische Vorrichtung und Aufzeichnungsmedium
JP2009505181A JPWO2008114700A1 (ja) 2007-03-13 2008-03-13 測定装置、測定方法、試験装置、電子デバイス、および、プログラム

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89445807P 2007-03-13 2007-03-13
US60/894,458 2007-03-13

Publications (1)

Publication Number Publication Date
WO2008114700A1 true WO2008114700A1 (ja) 2008-09-25

Family

ID=39765809

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054662 Ceased WO2008114700A1 (ja) 2007-03-13 2008-03-13 測定装置、測定方法、試験装置、電子デバイス、および、プログラム

Country Status (4)

Country Link
US (1) US20080247451A1 (ja)
JP (1) JPWO2008114700A1 (ja)
DE (1) DE112008000680T5 (ja)
WO (1) WO2008114700A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011182149A (ja) * 2010-03-01 2011-09-15 Ricoh Co Ltd 半導体集積回路、および半導体集積回路を備える情報処理装置

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US7638997B2 (en) * 2007-06-06 2009-12-29 Advantest Corporation Phase measurement apparatus
GB2467352B (en) * 2009-01-30 2014-03-19 Agilent Technologies Inc Jitter reduction device and method
US9128721B2 (en) 2012-12-11 2015-09-08 Apple Inc. Closed loop CPU performance control
US8878580B1 (en) * 2013-07-22 2014-11-04 Via Technologies, Inc. Apparatus and method for generating a clock signal with reduced jitter
US9832094B2 (en) * 2014-03-24 2017-11-28 Qualcomm Incorporated Multi-wire electrical parameter measurements via test patterns
CN103986466B (zh) * 2014-05-16 2017-01-18 华中科技大学 一种实时测量模数转换器孔径抖动的方法及其系统
WO2021223871A1 (en) * 2020-05-07 2021-11-11 Advantest Corporation A measurement unit configured to provide a measurement result value
US11095376B1 (en) * 2020-11-27 2021-08-17 Keysight Technologies, Inc. System and method for measuring residual phase noise of a frequency mixer
WO2022197739A1 (en) * 2021-03-16 2022-09-22 Tektronix, Inc. Noise-compensated jitter measurement instrument and methods
US11424841B1 (en) * 2021-07-24 2022-08-23 Keysight Technologies, Inc. System and method for measuring phase noise
CN118886393B (zh) * 2024-07-15 2025-07-01 南宁初芯集成电路设计有限公司 测试向量的生成方法及计算机可读存储介质

Citations (3)

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Publication number Priority date Publication date Assignee Title
JPH11312975A (ja) * 1998-04-30 1999-11-09 Advantest Corp Ａｄ変換器の評価装置
JP2002107392A (ja) * 2000-08-28 2002-04-10 Advantest Corp ジッタ測定装置、ジッタ測定方法、試験装置
JP2004320613A (ja) * 2003-04-18 2004-11-11 National Institute Of Information & Communication Technology アナログ／デジタル変換器の性能測定システム及び性能測定方法、並びに、デジタル／アナログ変換器の性能測定システム及び性能測定方法

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JPH0391340A (ja) * 1989-09-04 1991-04-16 Funai Denki Kenkyusho:Kk ディジタルデータ通信機器の定量的評価方法
US4994803A (en) * 1989-11-27 1991-02-19 Hewlett-Packard Company Random number dither circuit for digital-to-analog output signal linearity
JP3099979B2 (ja) * 1991-05-27 2000-10-16 日本電信電話株式会社 付加位相雑音測定方法および装置
JPH05211442A (ja) * 1992-01-30 1993-08-20 Yokogawa Hewlett Packard Ltd アナログ・ディジタル変換器の試験方法
US5402443A (en) * 1992-12-15 1995-03-28 National Semiconductor Corp. Device and method for measuring the jitter of a recovered clock signal
JP3590117B2 (ja) * 1995-01-23 2004-11-17 日本放送協会 テレビジョン映像信号のｓ／ｎ値検出方法および装置
JP2000221254A (ja) * 1999-02-01 2000-08-11 Leader Electronics Corp ジッタ付加の方法および装置
JP2002168895A (ja) * 2000-11-30 2002-06-14 Toyo Commun Equip Co Ltd アパーチャジッタ測定方法及び装置
WO2003073280A1 (en) * 2002-02-26 2003-09-04 Advantest Corporation Measuring apparatus and measuring method
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method
JP3863093B2 (ja) * 2002-11-21 2006-12-27 三星電子株式会社 Ａ／ｄ変換回路及びａ／ｄ変換制御方法並びにａ／ｄ変換プログラム
JP4289170B2 (ja) * 2004-02-10 2009-07-01 パナソニック株式会社 ノイズ量測定装置および映像受像機
CN101010594A (zh) * 2004-08-30 2007-08-01 松下电器产业株式会社 带有抖动测量功能的半导体集成电路
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11312975A (ja) * 1998-04-30 1999-11-09 Advantest Corp Ａｄ変換器の評価装置
JP2002107392A (ja) * 2000-08-28 2002-04-10 Advantest Corp ジッタ測定装置、ジッタ測定方法、試験装置
JP2004320613A (ja) * 2003-04-18 2004-11-11 National Institute Of Information & Communication Technology アナログ／デジタル変換器の性能測定システム及び性能測定方法、並びに、デジタル／アナログ変換器の性能測定システム及び性能測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011182149A (ja) * 2010-03-01 2011-09-15 Ricoh Co Ltd 半導体集積回路、および半導体集積回路を備える情報処理装置

Also Published As

Publication number Publication date
US20080247451A1 (en) 2008-10-09
DE112008000680T5 (de) 2010-01-14
JPWO2008114700A1 (ja) 2010-07-01

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