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WO2003025537A1 - Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique - Google Patents

Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique Download PDF

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Publication number
WO2003025537A1
WO2003025537A1 PCT/JP2002/000284 JP0200284W WO03025537A1 WO 2003025537 A1 WO2003025537 A1 WO 2003025537A1 JP 0200284 W JP0200284 W JP 0200284W WO 03025537 A1 WO03025537 A1 WO 03025537A1
Authority
WO
WIPO (PCT)
Prior art keywords
optical system
system misalignment
estimating
polynomial
misalignment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2002/000284
Other languages
English (en)
Japanese (ja)
Inventor
Jiro Suzuki
Toshiyuki Ando
Hiroshi Suzuki
Syusou Wadaka
Yoshihito Hirano
Izumi Mikami
Tadashi Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001283674A external-priority patent/JP4140684B2/ja
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to EP02715783A priority Critical patent/EP1429132A1/fr
Priority to US10/415,936 priority patent/US7098433B2/en
Publication of WO2003025537A1 publication Critical patent/WO2003025537A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/16—Housings; Caps; Mountings; Supports, e.g. with counterweight
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/003—Alignment of optical elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Astronomy & Astrophysics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Abstract

L'invention concerne un dispositif d'estimation d'un mauvais alignement d'un système optique comprenant des moyens de réglage de la positon érigée/inversée (9) permettant de changer la position réglée d'un système optique à mesurer, des moyens de mesure du front d'ondes incohérent (10) permettant de mesurer le front d'ondes dans chaque position réglée sans mettre en oeuvre des moyens d'approximation polynomiale optiques (15), aux fins de développement de la valeur mesurée du front d'ondes déterminée par les moyens de mesure du front d'ondes incohérent (10) en un polynôme, des moyens d'établissement de moyenne (11) permettant d'établir la moyenne soit de la valeur mesurée par les moyens de mesure du front d'ondes incohérent (10), soit de la valeur déterminée par les moyens d'approximation polynomiale (15), ainsi que des moyens d'extraction de coefficient spécifique de polynôme (16) permettant d'extraire une valeur de coefficient spécifique du polynôme.
PCT/JP2002/000284 2001-09-18 2002-01-17 Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique Ceased WO2003025537A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP02715783A EP1429132A1 (fr) 2001-09-18 2002-01-17 Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique
US10/415,936 US7098433B2 (en) 2001-09-18 2002-01-17 Apparatus and method for estimating and adjusting deviations in an optical system based on wavefront aberrations ascribable to misalignment

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001-283674 2001-09-18
JP2001283674A JP4140684B2 (ja) 2000-11-28 2001-09-18 光学系ズレ推定装置、光学系ズレ調整装置、光学系ズレ推定方法、及び光学系ズレ調整方法

Publications (1)

Publication Number Publication Date
WO2003025537A1 true WO2003025537A1 (fr) 2003-03-27

Family

ID=19107128

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/000284 Ceased WO2003025537A1 (fr) 2001-09-18 2002-01-17 Dispositif et procede d'estimation, dispositif de reglage, et un procede de correction d'un mauvais alignement d'un systeme optique

Country Status (3)

Country Link
US (1) US7098433B2 (fr)
EP (1) EP1429132A1 (fr)
WO (1) WO2003025537A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1505364A3 (fr) * 2003-08-05 2006-07-26 Agilent Technologies, Inc. Procédé et dispositif pour la mesure interferometrique parallèle en utilisant un signal d'oscillateur local élargi
CN114185144A (zh) * 2021-12-08 2022-03-15 中国科学院国家天文台 一种基于小口径平面镜装调大口径光学系统的装调方法
CN114706222A (zh) * 2022-03-31 2022-07-05 青岛虚拟现实研究院有限公司 Vr设备镜头的光学装配方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003289474A (ja) * 2002-03-27 2003-10-10 Canon Inc 画像処理装置、撮像装置、画像処理方法、プログラム、及びコンピュータ読み取り可能な記憶媒体
DE10224363A1 (de) 2002-05-24 2003-12-04 Zeiss Carl Smt Ag Verfahren zur Bestimmung von Wellenfrontaberrationen
DE10327019A1 (de) * 2003-06-12 2004-12-30 Carl Zeiss Sms Gmbh Verfahren zur Bestimmung der Abbildungsgüte eines optischen Abbildungssystems
WO2005024488A1 (fr) * 2003-09-11 2005-03-17 Koninklijke Philips Electronics, N.V. Reglage de composants optiques dans des dispositifs optiques
JP4880513B2 (ja) * 2007-03-29 2012-02-22 富士フイルム株式会社 非球面レンズの面ずれ測定方法および装置
RU2381474C2 (ru) * 2008-04-17 2010-02-10 Физический институт им. П.Н. Лебедева Российской академии наук Способ калибровки оптической системы
DE102009043744A1 (de) 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren und Mikroskop zur dreidimensional auflösungsgesteigerten Mikroskopie
WO2020097744A1 (fr) * 2018-11-12 2020-05-22 Pontificia Universidad Católica De Chile Système d'auto-collimation pour télescope, télescope réflecteur newtonien, et procédé pour collimater un télescope
US11870491B2 (en) * 2021-01-20 2024-01-09 Fluke Corporation Method and apparatus for measurement of mode delay in optical fibers
CN116125658B (zh) * 2022-12-26 2024-10-18 中国科学院光电技术研究所 一种光学望远镜低时空频率波前像差刚体校正装置及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02312304A (ja) * 1989-05-26 1990-12-27 Mitsubishi Electric Corp 鏡面形状制御装置およびこれを有する人工衛星搭載用反射鏡
JPH05323213A (ja) * 1991-12-10 1993-12-07 Hughes Aircraft Co 簡単な適応性光学システム
JPH0886689A (ja) * 1994-09-16 1996-04-02 Mitsubishi Electric Corp 波面センサ
JPH09281315A (ja) * 1996-04-18 1997-10-31 Mitsubishi Electric Corp 反射鏡の鏡面形状制御装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3230536B2 (ja) 1992-04-17 2001-11-19 オリンパス光学工業株式会社 光学性能測定方法及び装置
JPH08166209A (ja) 1994-12-14 1996-06-25 Fuji Xerox Co Ltd 多面鏡評価装置
JP3290349B2 (ja) 1996-04-15 2002-06-10 三菱電機株式会社 波面変形測定装置及び波面変形測定方法
US6158694A (en) * 1998-10-13 2000-12-12 Raytheon Company Spacecraft inertial attitude and rate sensor control system

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02312304A (ja) * 1989-05-26 1990-12-27 Mitsubishi Electric Corp 鏡面形状制御装置およびこれを有する人工衛星搭載用反射鏡
JPH05323213A (ja) * 1991-12-10 1993-12-07 Hughes Aircraft Co 簡単な適応性光学システム
JPH0886689A (ja) * 1994-09-16 1996-04-02 Mitsubishi Electric Corp 波面センサ
JPH09281315A (ja) * 1996-04-18 1997-10-31 Mitsubishi Electric Corp 反射鏡の鏡面形状制御装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1505364A3 (fr) * 2003-08-05 2006-07-26 Agilent Technologies, Inc. Procédé et dispositif pour la mesure interferometrique parallèle en utilisant un signal d'oscillateur local élargi
CN114185144A (zh) * 2021-12-08 2022-03-15 中国科学院国家天文台 一种基于小口径平面镜装调大口径光学系统的装调方法
CN114185144B (zh) * 2021-12-08 2023-08-15 中国科学院国家天文台 一种基于小口径平面镜装调大口径光学系统的装调方法
CN114706222A (zh) * 2022-03-31 2022-07-05 青岛虚拟现实研究院有限公司 Vr设备镜头的光学装配方法
CN114706222B (zh) * 2022-03-31 2023-09-01 青岛虚拟现实研究院有限公司 Vr设备镜头的光学装配方法

Also Published As

Publication number Publication date
US7098433B2 (en) 2006-08-29
US20040027566A1 (en) 2004-02-12
EP1429132A1 (fr) 2004-06-16

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