US3746869A - Method of photometrically plotting light scattering objects - Google Patents
Method of photometrically plotting light scattering objects Download PDFInfo
- Publication number
- US3746869A US3746869A US00184416A US3746869DA US3746869A US 3746869 A US3746869 A US 3746869A US 00184416 A US00184416 A US 00184416A US 3746869D A US3746869D A US 3746869DA US 3746869 A US3746869 A US 3746869A
- Authority
- US
- United States
- Prior art keywords
- light
- support
- photometrically
- detector
- plotting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000000149 argon plasma sintering Methods 0.000 title claims abstract description 23
- 239000000126 substance Substances 0.000 claims abstract description 31
- 230000005855 radiation Effects 0.000 claims description 33
- 238000005259 measurement Methods 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 10
- 239000000203 mixture Substances 0.000 claims description 9
- 238000011156 evaluation Methods 0.000 claims description 7
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 230000035945 sensitivity Effects 0.000 claims description 6
- 238000000926 separation method Methods 0.000 claims description 6
- 239000000654 additive Substances 0.000 claims description 3
- 230000000996 additive effect Effects 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims description 2
- 238000005375 photometry Methods 0.000 claims description 2
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 239000011358 absorbing material Substances 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 description 11
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- 238000010521 absorption reaction Methods 0.000 description 5
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- 238000011835 investigation Methods 0.000 description 2
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- 230000031700 light absorption Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
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- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000009365 direct transmission Effects 0.000 description 1
- 238000010828 elution Methods 0.000 description 1
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- 238000004809 thin layer chromatography Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/90—Plate chromatography, e.g. thin layer or paper chromatography
- G01N30/95—Detectors specially adapted therefor; Signal analysis
Definitions
- Thin layer-chromatography is a modern analytical method of separating mixtures of organic and inorganic substances.
- the solution of the substance mixture which is to separate is applied as a spot or as a band at a specific position on the separating layer.
- the plate is placed in a chamber containing a suitable fluid medium. in the ensuing development, the fluid medium travels across the separating layer, as by capillary. forces, thereby separating the substance mixture.
- the different substances of the mixture are found at different positions of the separating layer, at which point it is necessary to evaluate the developed thin layer-chromatogram qualitatively and quantitatively.
- the light-absorption measurement technique is generally applicable in the case of objects which cause no, or only a small amount of, light scattering, in which case a transmission measurement is made.
- a transmission measurement is made.
- it is necessary prior to a transmission measurement to make the object transparent by means of a liquid of a suitable index refraction. Due to the resulting elution effects, such a method of plotting thin layer-chromatograms is hardly recommendable.
- the chromatogram is scanned by a monochromatic light beam in the direction of separation, and the intensity of the diffusely reflected measuring radiation is measured with a photoelectric detector and recorder, for instance as a function of position, by a suitable recorder. lf lightabsorbing substance spots are found on the separating layer, the reflected radiation will be attenuated in those wavelength ranges in which absorption bands would occur for transmission measurements of corresponding solutions. The intensity of the diffusely reflected measuring radiation is therefore indicative of the absorption caused by the substance.
- the absorption-position curve obtained by the scanning can be evaluated quantitatively by means of the Kubelka-Munk-function.
- the effect being measured is always degraded by a superimposed lightscattering function, which varies as a function of position on the separating layer; in the specific case of small substance volumes, this superimposed function becomes very detrimentally noticeable and deteriorates the limit of detection.
- This position-dependent function is unspecific relative to the light-scattering substance and may result in a highly irregular base line of the curve being evaluated, making it difficult if not impossible in some cases to decide definitely whether one is observing an effect to be measured or an interference effect.
- the method according to the invention is characterized by making simultaneous measurements of the diffusely reflected and of the transmitted radiation, for each plotted position of the object, the two signals thus obtained being means of a recorder.
- the novel method has the advantage that the making of the measurement inherently and automatically eliminates scattering effects related to position of the separating layer and unspecific to the substance of the light scattering, while, at the same time the actual measuring signal specific to the substance is amplified.
- the device for carrying out the novel method is advantageously designed so that the measuring radiation impinges vertically on the surface of the object being plotted, that a first photoelectric detector is arranged above this surface and a second one below the object, and that both detectors are connected with an arrangement for adding the signals.
- This arrangement is preferably in connection with a recorder recording the resultant absorption-position curve.
- FIGS. 1 to 6 of the accompanying drawings in which:
- FIG. 1 is an absorption-position curve of a thin layerchromatogram, recorded by measuring the reflected radiation as well as the associated base line;
- FIG. 2 is the absorption position curve of the same thin layer-chromatogram, recorded by measuring the transmitted radiation as well as the associated base line; of the invention, together with the associated base line; for carrying out the method of the invention;
- FIG. is a schematic diagram showing one embodiment of a first device, in which photometer balls are provided for the integral detection of the radiation;
- FIGS. 6 and 7 are schematic perspective diagrams showing further detection devices, in which fiberoptical equipment is provided for the supply of the measuring light as well as for the detection of the reflected and the transmitted radiation.
- reference numeral 1 designates an absorption-position curve obtained by recording reflected radiation, in the plotting of a thin layer-chromatogram. As can be seen, the effect being measured has superimposed thereon a light-scattering function depending upon local position on the separating layer.
- the base line associated with curve 1 is referenced 2, and the desired data is represented by the difference between photometric curves, suggested by the crosshatched area.
- the base line is seen to be irregular, and the sufficiently accurate determination of the hatched area is very difficult when plotting.
- a device as schematically illustrated in FIG. 4 may be used to determine the absorption-position curve.
- Light from a source 3 is monochromatized in the monochromator 4 and, via a reflecting mirror 5, impinges upon a thin layer-chromatogram plate referenced 6. Measuring light impinges upon the separating layer of the chromatogram 6 at an angle of 0 to the surface normal.
- Diffusely reflected radiation is measured by means of a photoelectric detector 7 while a detector 8 simultaneously measures transmitted radiation.
- the signal generated by the detector 7 is amplified by means 9 and is then supplied to an adding stage 1 1. In like manner, the latter also receives the signal output of detector 8 after amplification at means 10.
- the two amplifiers 9 10 are preferably independently variable, as suggested by manually adjustable elements 9' 10', so that the amplitudes of signals unspecific to the substance can be caused to assume the same level.
- the additive signal provided by means 11 is supplied to a suitable recorder l2.
- the arrow symbol 13 will be understood to suggest means for traversing the chromatogram plate 6 and the described optical system with respect to each other, and the synchronizing connection 13' to the recorder 12 assures proper correlation of the summation signal with traverse position.
- the absorption-position curve recorded by the recorder 12 is illustrated at 14 in FIG. 3.
- the base line associated with this curve is also illustrated in FIG. 3 and is referenced 14'.
- the desired data is the difference between curves 14 14', but since the base line curve 14' is so nearly flat, the curve 14 alone can be relied upon to yield the desired data.
- the base line 14' has now been flattened to such extent that variations due to irregularities of the separating layer are only in the order of magnitude of electronic instability of the whole system (i.e. system noise).
- evaluation of curve I4 is relatively simple and can be carried out with great accuracy.
- the method of the invention will be seen to extend the limit of detection, inasmuch as deflections of the curve 14 (insofar as they are taken into consideration for an evaluation) are attributable only to effects specific to the substance.
- a photometer ball 15 is arranged above the chromatogram plate 6; photometer ball 15 has an opening 16 for passage of the measuring radiation 17 therethrough. Radiation diffusely reflected by the separating layer of the plate 6 is detected by photoelectric means 18, in accordance with the various reflections within the photometer ball 15, as suggested by,dashed lines. Below plate 6, another photometer ball 19 including a photoelectric detector 20 is arranged to respond to transmitted light, the radiation passing through the separating layer of the chromatogram plate 6 reaching the detector 20 after several reflections within the photometer ball 19, again as suggested by dashed lines. In the embodiment illustrated in FlG. 5, a substantially integral detection of both the reflected and the transmitted radiation is achieved, thereby further enhancing the 'accuracy of measurement, as compared with the photocell arrangement in FIG. 4.
- reference numeral 6 again designates a chromatogram plate.
- the measuring radiation 17 is directed via a bundle of glass fibres 21 to the local area or position of the plate 6 being plotted.
- the bundle 21 is divided at this position, and the partial bundle 21 directes the diffusely reflected light to a photocell 22.
- another bundle of glass fibers 23 is arranged to receive the transmitted radiation, dirdcting the same to a second photoeldctric detector 24.
- the method of photometrically evaluating lightabsorbing zones resulting upon the separation of mixtures of substances in thin layers of light-dispersing material which comprises irradiating light upon one localized area of the material, performing a traverse of said area over one such zone, simultaneously photometrically and additively measuring diffusely reflected light and transmitted light at said area in the course of the traverse, and recording the additive value as a function of traverse position.
- the method of photometrically plotting light scattered by a light-scattering object which comprises irradiating light upon one surface of the object, simultaneously photometrically measuring diffusely reflected light and transmitted light for a given location on the object, and adding the simultaneously measured values; the given location being one of a succession involved in a transverse of the object, the added values being plotted as a function of traverse position, and the baseline amplitudes of the two measuring signals being caused to assume the same level, prior to adding the simultaneously measured values.
- Apparatus for photometrically plotting light scattered by a light scattering object comprising a transpardnt support for the object, means for lightirradiating a limited surface area of the object normal to the support; photoelectric-detector means comprising a first detector on one side of the support for responding to diffusely reflected light from said area of the object, and a second detector on the other side of the support for responding simultaneously to directly transmitted light at said local area; means adding the outputs of said detectors, means for transversing said detector means and said support with respect to each other, and recorder means synchronized with traverse displacement and responsive to the added outputs of said detectors.
- detectors are photometer balls disposed above and below said support, in vertically aligned relation, each photometer ball including a photoelectric cell.
- said detector means includes fiber-optical means disposed on said one side of said support for conducting reflected light to said first detector.
- said detector means includes fiber-optical means disposed on said other side of said support for conducting transmitted light to said second detector.
- Apparatus for photometrically plotting light scattered by a lightscattering object comprising a transparent support for the object, means for lightirradiating the object normal to the support, and detection means comprising fiber-optical means having a first fiber-optical bundle with ends adjacent one side of the support for responding to diffusely reflected light from a local area of the object, said fiber-optical means having a second fiber-optical bundle with ends adjacent the other side. of the support for responding to directly transmitted light at said local area; and means including photoelectric means responsive to the sum of the light components transmitted by said first and second bundles.
- Apparatus according to claim 14 in which said light-irradiating means includes a further fiber-optical bundle with ends on said one side of said support and terminating normal thereto at said local area.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2047952A DE2047952C3 (de) | 1970-09-30 | 1970-09-30 | Verfahren zur photometrischen Auswertung der sich bei der Auftrennung von Substanz gemischen in dünnen Schichten aus licht streuendem Material ergebenden Zonen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US3746869A true US3746869A (en) | 1973-07-17 |
Family
ID=5783734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US00184416A Expired - Lifetime US3746869A (en) | 1970-09-30 | 1971-09-28 | Method of photometrically plotting light scattering objects |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3746869A (de) |
| DE (1) | DE2047952C3 (de) |
| GB (1) | GB1328734A (de) |
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3994587A (en) * | 1974-08-21 | 1976-11-30 | Shimadzu Seisakusho Ltd. | Densitometer |
| US4012144A (en) * | 1975-08-07 | 1977-03-15 | Varian Associates | Spectrosorptance measuring system and method |
| FR2360072A1 (fr) * | 1976-07-30 | 1978-02-24 | Industrial Nucleonics Corp | Procede et appareil de mesure d'une propriete d'un materiau, notamment sa teneur en humidite |
| US4120582A (en) * | 1976-10-27 | 1978-10-17 | Donnelly Mirrors, Inc. | Light reflectivity and transmission testing apparatus and method |
| FR2409507A1 (fr) * | 1977-11-17 | 1979-06-15 | Lommel Hermann | Procede de determination quantitative d'elements troubles provenant en particulier de reactions d'immunite |
| US4171909A (en) * | 1977-03-25 | 1979-10-23 | Miles Laboratories, Inc. | Apparatus for measuring light intensities |
| FR2524162A1 (fr) * | 1982-03-23 | 1983-09-30 | Canon Kk | Appareil et procede de controle de negatifs et dispositif de cadrage de masques |
| JPS59206747A (ja) * | 1983-03-21 | 1984-11-22 | ドナルド・ダブリユ−・バイヤ−ズ | 被覆検知と表面評価のための方法及び装置 |
| US4492462A (en) * | 1980-02-16 | 1985-01-08 | Wilhelm Pross | Photometric method for determining courses of reactions |
| US4752696A (en) * | 1986-05-19 | 1988-06-21 | Fuji Photo Film Co., Ltd. | Method of inspecting floppy disk casing |
| US4810872A (en) * | 1986-07-26 | 1989-03-07 | Hitachi, Ltd. | Optical property measuring device |
| US4937637A (en) * | 1989-02-10 | 1990-06-26 | Kollmorgen Corporation | Dual reading head transmission/reflection densitometer |
| WO1992000514A1 (en) * | 1990-06-29 | 1992-01-09 | Tma Technologies, Inc. | Modular scatterometer with interchangeable scanning heads |
| US5717216A (en) * | 1996-10-16 | 1998-02-10 | Reynolds Metals Company | Thickness gauging using ultraviolet light absorption |
| US6485687B1 (en) | 1998-03-14 | 2002-11-26 | Bernd Spangenberg | Thin-layer chromatography apparatus |
| US8970830B2 (en) | 2011-06-09 | 2015-03-03 | Carl Zeiss Microscopy Gmbh | Measuring method and device for determining transmission and/or reflection properties |
| US20160377535A1 (en) * | 2015-06-23 | 2016-12-29 | Empire Technology Development Llc | Real-time monitoring of material composition for quality control |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2757196C3 (de) * | 1977-12-22 | 1981-11-26 | Vladimir Dr.-Ing. 5100 Aachen Blazek | Photometrische Anordnung |
| US4199260A (en) * | 1978-08-21 | 1980-04-22 | Technicon Instruments Corporation | Apparatus and method for determining the concentration in a sample |
| DE3213533A1 (de) * | 1982-04-10 | 1983-10-20 | Bruker Analytische Meßtechnik GmbH, 7512 Rheinstetten | Infrarot-spektrometer |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2632855A (en) * | 1947-10-07 | 1953-03-24 | Westinghouse Electric Corp | Photoelectric speed control |
| US2718597A (en) * | 1951-11-01 | 1955-09-20 | Exxon Research Engineering Co | Infrared analysis apparatus |
| US2834247A (en) * | 1955-01-26 | 1958-05-13 | Beckman Instruments Inc | Optical density analyzing apparatus |
| US2930898A (en) * | 1956-09-11 | 1960-03-29 | W D Engineering Co Ltd | Cathode ray tube apparatus for the inspection of articles |
| US3320428A (en) * | 1963-05-06 | 1967-05-16 | British Petroleum Co | Photosensitive apparatus for detecting solid particles suspended in liquid |
| US3504978A (en) * | 1965-02-04 | 1970-04-07 | Shimadzu Corp | Plural beam spectrophotometer with a diffusion plate between each cell and detector |
| US3504983A (en) * | 1966-05-31 | 1970-04-07 | Nasa | Ellipsoidal mirror reflectometer including means for averaging the radiation reflected from the sample |
| US3566083A (en) * | 1967-10-16 | 1971-02-23 | Measurement Research Center In | Sensor for punches and marks |
| US3567328A (en) * | 1966-06-02 | 1971-03-02 | Vernon T Riley | Specimen transport mount for spectrophotometer |
| US3618061A (en) * | 1969-04-30 | 1971-11-02 | Eaton Yale & Towne | Monitoring apparatus for monitoring the density of a material carried by a fluid and the flow of the fluid |
-
1970
- 1970-09-30 DE DE2047952A patent/DE2047952C3/de not_active Expired
-
1971
- 1971-09-20 GB GB4370071A patent/GB1328734A/en not_active Expired
- 1971-09-28 US US00184416A patent/US3746869A/en not_active Expired - Lifetime
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2632855A (en) * | 1947-10-07 | 1953-03-24 | Westinghouse Electric Corp | Photoelectric speed control |
| US2718597A (en) * | 1951-11-01 | 1955-09-20 | Exxon Research Engineering Co | Infrared analysis apparatus |
| US2834247A (en) * | 1955-01-26 | 1958-05-13 | Beckman Instruments Inc | Optical density analyzing apparatus |
| US2930898A (en) * | 1956-09-11 | 1960-03-29 | W D Engineering Co Ltd | Cathode ray tube apparatus for the inspection of articles |
| US3320428A (en) * | 1963-05-06 | 1967-05-16 | British Petroleum Co | Photosensitive apparatus for detecting solid particles suspended in liquid |
| US3504978A (en) * | 1965-02-04 | 1970-04-07 | Shimadzu Corp | Plural beam spectrophotometer with a diffusion plate between each cell and detector |
| US3504983A (en) * | 1966-05-31 | 1970-04-07 | Nasa | Ellipsoidal mirror reflectometer including means for averaging the radiation reflected from the sample |
| US3567328A (en) * | 1966-06-02 | 1971-03-02 | Vernon T Riley | Specimen transport mount for spectrophotometer |
| US3566083A (en) * | 1967-10-16 | 1971-02-23 | Measurement Research Center In | Sensor for punches and marks |
| US3618061A (en) * | 1969-04-30 | 1971-11-02 | Eaton Yale & Towne | Monitoring apparatus for monitoring the density of a material carried by a fluid and the flow of the fluid |
Cited By (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3994587A (en) * | 1974-08-21 | 1976-11-30 | Shimadzu Seisakusho Ltd. | Densitometer |
| US4012144A (en) * | 1975-08-07 | 1977-03-15 | Varian Associates | Spectrosorptance measuring system and method |
| FR2360072A1 (fr) * | 1976-07-30 | 1978-02-24 | Industrial Nucleonics Corp | Procede et appareil de mesure d'une propriete d'un materiau, notamment sa teneur en humidite |
| US4120582A (en) * | 1976-10-27 | 1978-10-17 | Donnelly Mirrors, Inc. | Light reflectivity and transmission testing apparatus and method |
| US4171909A (en) * | 1977-03-25 | 1979-10-23 | Miles Laboratories, Inc. | Apparatus for measuring light intensities |
| FR2409507A1 (fr) * | 1977-11-17 | 1979-06-15 | Lommel Hermann | Procede de determination quantitative d'elements troubles provenant en particulier de reactions d'immunite |
| US4492462A (en) * | 1980-02-16 | 1985-01-08 | Wilhelm Pross | Photometric method for determining courses of reactions |
| US4669885A (en) * | 1982-03-23 | 1987-06-02 | Canon Kabushiki Kaisha | Apparatus for inspecting negatives |
| FR2524162A1 (fr) * | 1982-03-23 | 1983-09-30 | Canon Kk | Appareil et procede de controle de negatifs et dispositif de cadrage de masques |
| JPS59206747A (ja) * | 1983-03-21 | 1984-11-22 | ドナルド・ダブリユ−・バイヤ−ズ | 被覆検知と表面評価のための方法及び装置 |
| EP0119630A3 (de) * | 1983-03-21 | 1985-11-27 | Donald W. Byers | Verfahren und Einrichtung zur Feststellung einer Deckschicht und Abschätzung einer Oberfläche |
| US4752696A (en) * | 1986-05-19 | 1988-06-21 | Fuji Photo Film Co., Ltd. | Method of inspecting floppy disk casing |
| US4810872A (en) * | 1986-07-26 | 1989-03-07 | Hitachi, Ltd. | Optical property measuring device |
| US4937637A (en) * | 1989-02-10 | 1990-06-26 | Kollmorgen Corporation | Dual reading head transmission/reflection densitometer |
| WO1992000514A1 (en) * | 1990-06-29 | 1992-01-09 | Tma Technologies, Inc. | Modular scatterometer with interchangeable scanning heads |
| US5196906A (en) * | 1990-06-29 | 1993-03-23 | Tma Technologies, Inc. | Modular scatterometer with interchangeable scanning heads |
| US5717216A (en) * | 1996-10-16 | 1998-02-10 | Reynolds Metals Company | Thickness gauging using ultraviolet light absorption |
| US6485687B1 (en) | 1998-03-14 | 2002-11-26 | Bernd Spangenberg | Thin-layer chromatography apparatus |
| US8970830B2 (en) | 2011-06-09 | 2015-03-03 | Carl Zeiss Microscopy Gmbh | Measuring method and device for determining transmission and/or reflection properties |
| US20160377535A1 (en) * | 2015-06-23 | 2016-12-29 | Empire Technology Development Llc | Real-time monitoring of material composition for quality control |
| US10197496B2 (en) * | 2015-06-23 | 2019-02-05 | Empire Technology Development Llc | Real-time monitoring of material composition for quality control |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2047952B2 (de) | 1973-03-22 |
| DE2047952C3 (de) | 1973-10-18 |
| DE2047952A1 (de) | 1972-04-06 |
| GB1328734A (en) | 1973-08-30 |
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