TWI667367B - 混合器及真空處理裝置 - Google Patents
混合器及真空處理裝置 Download PDFInfo
- Publication number
- TWI667367B TWI667367B TW105132444A TW105132444A TWI667367B TW I667367 B TWI667367 B TW I667367B TW 105132444 A TW105132444 A TW 105132444A TW 105132444 A TW105132444 A TW 105132444A TW I667367 B TWI667367 B TW I667367B
- Authority
- TW
- Taiwan
- Prior art keywords
- gas
- mixing container
- cylinder
- cylinder body
- tube
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45512—Premixing before introduction in the reaction chamber
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/10—Mixing gases with gases
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/10—Mixing gases with gases
- B01F23/19—Mixing systems, i.e. flow charts or diagrams; Arrangements, e.g. comprising controlling means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F35/00—Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
- B01F35/50—Mixing receptacles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Seeds, Soups, And Other Foods (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015-198275 | 2015-10-06 | ||
| JP2015198275 | 2015-10-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201726969A TW201726969A (zh) | 2017-08-01 |
| TWI667367B true TWI667367B (zh) | 2019-08-01 |
Family
ID=58487766
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105132444A TWI667367B (zh) | 2015-10-06 | 2016-10-06 | 混合器及真空處理裝置 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP6216483B2 (fr) |
| KR (1) | KR102159868B1 (fr) |
| CN (1) | CN108138321B (fr) |
| TW (1) | TWI667367B (fr) |
| WO (1) | WO2017061498A1 (fr) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5525780A (en) * | 1993-08-31 | 1996-06-11 | Texas Instruments Incorporated | Method and apparatus for uniform semiconductor material processing using induction heating with a chuck member |
| US7045060B1 (en) * | 2002-12-05 | 2006-05-16 | Inflowsion, L.L.C. | Apparatus and method for treating a liquid |
| CN1781586A (zh) * | 2004-11-30 | 2006-06-07 | 沈阳化工学院 | 单管多旋流体混合装置及其混合操作方法 |
| CN101537319A (zh) * | 2009-04-30 | 2009-09-23 | 赵纪仲 | 可调式射流混合装置及其混流调节方法 |
| JP2011056400A (ja) * | 2009-09-10 | 2011-03-24 | Jfe Engineering Corp | 流体混合方法及び流体混合装置 |
| WO2012134293A1 (fr) * | 2011-04-01 | 2012-10-04 | Heatmatrix Group B.V. | Dispositif et procédé de mélange de deux fluides |
| JP2013188938A (ja) * | 2012-03-13 | 2013-09-26 | National Institute Of Advanced Industrial Science & Technology | 二酸化炭素を混合して低粘性化させた溶融樹脂の高圧微粒化方法及び装置 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01129973A (ja) * | 1987-11-13 | 1989-05-23 | Hitachi Ltd | 反応処理装置 |
| JP2508717Y2 (ja) * | 1989-08-31 | 1996-08-28 | 株式会社島津製作所 | 成膜装置のガス導入用ミキシングチャンバ |
| JPH10150030A (ja) | 1996-11-19 | 1998-06-02 | Kokusai Electric Co Ltd | 成膜装置 |
| JP4570732B2 (ja) | 2000-05-25 | 2010-10-27 | 株式会社アルバック | ガス噴出装置及び真空処理装置 |
| JP2003226976A (ja) * | 2002-02-04 | 2003-08-15 | Tokura Kogyo Kk | ガスミキシング装置 |
| JP2008114097A (ja) * | 2005-02-22 | 2008-05-22 | Hoya Advanced Semiconductor Technologies Co Ltd | ガス混合器、成膜装置、及び薄膜製造方法 |
| JP4895167B2 (ja) * | 2006-01-31 | 2012-03-14 | 東京エレクトロン株式会社 | ガス供給装置,基板処理装置,ガス供給方法 |
| EP2045002A1 (fr) * | 2007-10-02 | 2009-04-08 | Ineos Europe Limited | Appareil de mélange |
| US9121096B2 (en) * | 2008-10-10 | 2015-09-01 | Alta Devices, Inc. | Concentric showerhead for vapor deposition |
| US9051900B2 (en) * | 2009-01-13 | 2015-06-09 | Avl Powertrain Engineering, Inc. | Ejector type EGR mixer |
| JP5478723B2 (ja) * | 2010-06-14 | 2014-04-23 | 株式会社アルバック | 成膜装置 |
| CN202497835U (zh) * | 2012-03-22 | 2012-10-24 | 淮南舜化机械制造有限公司 | 气体混合装置 |
| US10232324B2 (en) * | 2012-07-12 | 2019-03-19 | Applied Materials, Inc. | Gas mixing apparatus |
| CN203955054U (zh) * | 2014-06-24 | 2014-11-26 | 浙江深度能源技术有限公司 | Scr脱硝装置的双介质混合器 |
-
2016
- 2016-10-05 JP JP2017527376A patent/JP6216483B2/ja active Active
- 2016-10-05 KR KR1020187009489A patent/KR102159868B1/ko active Active
- 2016-10-05 CN CN201680058354.9A patent/CN108138321B/zh active Active
- 2016-10-05 WO PCT/JP2016/079681 patent/WO2017061498A1/fr not_active Ceased
- 2016-10-06 TW TW105132444A patent/TWI667367B/zh active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5525780A (en) * | 1993-08-31 | 1996-06-11 | Texas Instruments Incorporated | Method and apparatus for uniform semiconductor material processing using induction heating with a chuck member |
| US7045060B1 (en) * | 2002-12-05 | 2006-05-16 | Inflowsion, L.L.C. | Apparatus and method for treating a liquid |
| CN1781586A (zh) * | 2004-11-30 | 2006-06-07 | 沈阳化工学院 | 单管多旋流体混合装置及其混合操作方法 |
| CN101537319A (zh) * | 2009-04-30 | 2009-09-23 | 赵纪仲 | 可调式射流混合装置及其混流调节方法 |
| CN101537319B (zh) | 2009-04-30 | 2011-09-14 | 赵纪仲 | 可调式射流混合装置及其混流调节方法 |
| JP2011056400A (ja) * | 2009-09-10 | 2011-03-24 | Jfe Engineering Corp | 流体混合方法及び流体混合装置 |
| WO2012134293A1 (fr) * | 2011-04-01 | 2012-10-04 | Heatmatrix Group B.V. | Dispositif et procédé de mélange de deux fluides |
| JP2013188938A (ja) * | 2012-03-13 | 2013-09-26 | National Institute Of Advanced Industrial Science & Technology | 二酸化炭素を混合して低粘性化させた溶融樹脂の高圧微粒化方法及び装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108138321A (zh) | 2018-06-08 |
| TW201726969A (zh) | 2017-08-01 |
| JP6216483B2 (ja) | 2017-10-18 |
| CN108138321B (zh) | 2020-03-20 |
| KR102159868B1 (ko) | 2020-09-24 |
| JPWO2017061498A1 (ja) | 2017-10-19 |
| KR20180050367A (ko) | 2018-05-14 |
| WO2017061498A1 (fr) | 2017-04-13 |
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