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TWI390065B - Sputtering device - Google Patents

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Publication number
TWI390065B
TWI390065B TW096101144A TW96101144A TWI390065B TW I390065 B TWI390065 B TW I390065B TW 096101144 A TW096101144 A TW 096101144A TW 96101144 A TW96101144 A TW 96101144A TW I390065 B TWI390065 B TW I390065B
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Taiwan
Prior art keywords
targets
power
sputtering apparatus
pair
bus bar
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TW096101144A
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Chinese (zh)
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TW200736406A (en
Inventor
Motoshi Kobayashi
Junya Kiyota
Yoshikuni Horishita
Hidenori Yoda
Shigemitsu Satou
Toshio Nakajima
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Ulvac Inc
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • C23C14/352Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3464Sputtering using more than one target
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3444Associated circuits

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Plasma Technology (AREA)

Description

濺鍍裝置Sputtering device

本發明係關於可於處理基板表面實施成膜之濺鍍裝置,尤其是,與使用交流電源之濺鍍裝置相關。The present invention relates to a sputtering apparatus that can perform film formation on a surface of a substrate to be processed, and more particularly, relates to a sputtering apparatus using an alternating current power source.

濺鍍法係對應成膜於處理基板表面之膜之組成,使電漿環境中之離子朝製成特定形狀之標靶進行加速衝擊,使標靶原子飛散而於處理基板表面形成薄膜。此時,對陰極之標靶,介由直流電源或交流電源等之濺鍍電源施加電壓,使陰極、及陽極或接地極之間產生輝光放電而形成電漿環境,然而,尤其是利用交流電源時,施加與蓄積於陰極表面之電荷為相反之相位電壓可以進行抵銷,故可得到安定之放電。The sputtering method corresponds to the composition of the film formed on the surface of the substrate, so that the ions in the plasma environment are accelerated to impact on the target of the specific shape, and the target atoms are scattered to form a film on the surface of the substrate. At this time, a voltage is applied to a target of the cathode via a sputtering power source such as a DC power source or an AC power source to generate a glow discharge between the cathode and the anode or the ground electrode to form a plasma environment. However, especially an AC power source is used. At the same time, the phase voltage opposite to the charge accumulated on the surface of the cathode can be offset, so that a stable discharge can be obtained.

基於上述理由,於真空腔室內配置1對標靶,介由交流電源對該1對標靶以特定頻率交互變換極性而施加電壓,將各標靶交互切換成陽極、陰極,陽極及陰極之間產生輝光放電而形成電漿環境,來實施各標靶之濺鍍係大家所熟知(例如,專利文獻1)。For the above reasons, a pair of targets are arranged in the vacuum chamber, and a voltage is applied to the pair of targets at a specific frequency by an alternating current power source to apply a voltage, and the targets are alternately switched between an anode and a cathode, and between the anode and the cathode. A sputtering process is performed to form a plasma environment, and sputtering of each target is known (for example, Patent Document 1).

[專利文獻1]國際公開WO2003/14410號公報(例如,參照申請專利範圍第1項)。[Patent Document 1] International Publication No. WO2003/14410 (for example, refer to the first item of the patent application scope).

上述之技術時,係使用內建著以對1對標靶輸出交流 電力(開啟電力)為目的之振盪部之交流電源。一般而言,例如介由絞合多數條導線之公知之交流電源纜線來連結該交流電源及各標靶。此時,利用流過交流電流時之表面效果,可使交流電源之頻率之上昇,而且,可減少導體之有效截面來增加交流電阻,而增加導體損耗,故容易導致從交流電源對1對標靶投入電力之損失,此外,受到雜訊之影響,也容易導致對1對標靶之投入電力之電力波形之紊亂。此種情形在濺鍍裝置本體之設置場所及交流電源之設置場所之距離愈長時,會愈顯著,結果,有無法以良好精度對1對標靶投入電力之問題。The above technology is built-in to exchange output for 1 pair of targets. The AC power supply of the oscillation unit for the purpose of power (turning on the power). In general, the AC power source and each target are connected, for example, via a known AC power cable that twists a plurality of wires. At this time, by using the surface effect when the alternating current flows, the frequency of the alternating current power source can be increased, and the effective cross section of the conductor can be reduced to increase the alternating current resistance, thereby increasing the conductor loss, so that it is easy to cause the pair to be aligned from the alternating current power source. The loss of the target input power, in addition to the influence of noise, is also likely to cause a disturbance in the power waveform of the input power to the pair of targets. In this case, the longer the distance between the installation place of the sputtering apparatus main body and the installation place of the AC power supply, the more remarkable the problem arises. As a result, there is a problem that electric power cannot be input to one pair of targets with good precision.

有鑑於上述情形,本發明之目的係在提供不受濺鍍裝置本體之設置場所及交流電源之設置場所之距離的影響,而可以良好精度實施電力投入之濺鍍裝置。In view of the above circumstances, an object of the present invention is to provide a sputtering apparatus which can perform electric power input with high precision without being affected by the distance between the installation place of the sputtering apparatus main body and the installation place of the AC power supply.

為了解決上述課題,本發明之濺鍍裝置之特徵係具備:配設於真空腔室內之1對標靶;及對該1對標靶以特定頻率交互變換極性來施加電壓之交流電源;且,該交流電源之構成上,區分成:可供應電力之電力供應部;及具有連結於來自該電力供應部之電力線之振盪用開關電路之振盪部;且,以匯流條連結該振盪部及各標靶。In order to solve the above problems, the sputtering device of the present invention is characterized in that: a pair of targets disposed in a vacuum chamber; and an alternating current power source that applies a voltage by alternately changing polarity with respect to the pair of targets at a specific frequency; The configuration of the AC power source is divided into: a power supply unit that can supply power; and an oscillation unit that has an oscillation switch circuit connected to the power line from the power supply unit; and the oscillation unit and the target are connected by a bus bar. target.

依據本發明,因為構成上係區分成電力供應部及振盪部,故可以只將輸出交流電力之振盪部以使其與1對標靶之距離保持於一定之較短距離之方式來配置。此外,因為利用匯流條連結該振盪部及各標靶,交流電流流過之部份之表面積較大,可以不受表面效果之影響而流過較大電流 。結果,與公知之利用交流電源纜線之物相比,不易造成投入電力之損失,此外,不易受到雜訊之影響,其次,交流電源可以良好精度對1對標靶實施電力投入。According to the present invention, since the configuration is divided into the power supply unit and the oscillation unit, it is possible to arrange only the oscillation unit that outputs the AC power so as to maintain the distance from the pair of targets at a predetermined short distance. In addition, since the oscillating portion and the respective targets are connected by the bus bar, the surface area of the portion through which the alternating current flows is large, and a large current can be flown without being affected by the surface effect. . As a result, it is less likely to cause a loss of input power than a known thing using an AC power cable, and is less susceptible to noise, and secondly, an AC power source can perform power input to a pair of targets with good accuracy.

此時,若為於前述匯流條之表面覆蓋Au或Ag之薄膜之物,投入交流電力時,只要交流電流流過之部份採用高導電率之材料,故可降低成本。In this case, when the surface of the bus bar is covered with a film of Au or Ag, and AC power is supplied, the material having a high conductivity can be used as long as the alternating current flows, so that the cost can be reduced.

此外,若前述匯流條可自如地伸縮,裝設該匯流條時,可以吸收振盪部及標靶間之間隔誤差,而使匯流條之裝設作業較為容易。Further, if the bus bar is freely expandable and contractible, when the bus bar is installed, the interval error between the oscillating portion and the target can be absorbed, and the bus bar can be easily mounted.

此外,因為使輸出交流電力之振盪部及各標靶之距離保持於一定之較短距離,只要將前述振盪部之框體裝設於真空腔室之外壁即可。Further, since the distance between the oscillating portion for outputting the alternating current power and each of the targets is kept at a predetermined short distance, the frame of the oscillating portion may be attached to the outer wall of the vacuum chamber.

此外,於前述真空腔室內,並設複數之1對標靶,而且,於每1對標靶配設著交流電源,並以於各標靶之前方分別形成磁通之方式,被設置在於各標靶之後方,配置有交互變換極性而設的複數之磁鐵所構成之磁鐵組合體時,因為交流電源可以良好精度分別對各1對標靶實施電力投入,故可對各標靶實施均等之濺鍍而得到良好之成膜。Further, a plurality of pairs of targets are disposed in the vacuum chamber, and an AC power source is disposed for each pair of targets, and magnetic fluxes are formed in front of the targets, respectively. When a magnet assembly composed of a plurality of magnets that are alternately converted in polarity is disposed after the target, since the AC power supply can directly input power to each pair of targets, it is possible to perform equalization on each target. Sputtering gives a good film formation.

此時,若以前述磁通相對於標靶平行移動自如之方式,配設著一體驅動各磁鐵組合體之驅動手段時,則可均等侵蝕各標靶為佳。In this case, when the magnetic flux is moved in parallel with the target, and the driving means for integrally driving each of the magnet assemblies is disposed, it is preferable to uniformly etch the respective targets.

如以上之說明所示,本發明之濺鍍裝置不易發生投入電力之損失及不易受到雜訊之影響,可以良好精度對標靶實施電力投入,此外,不需要高價之交流電源纜線,而具有可降低成本之效果。As described above, the sputtering apparatus of the present invention is less prone to loss of input power and is less susceptible to noise, and can perform power input to the target with good precision, and does not require an expensive AC power cable. Can reduce the cost effect.

參照第1圖,1係本發明之磁控管濺鍍裝置(以下,簡稱為「濺鍍裝置」)。為了如後面所述,施加與蓄積於標靶表面之電荷為相反之相位電壓來進行抵銷而得到安定之放電,故濺鍍裝置1係使用交流電源之線式之物。濺鍍裝置1具有介由旋轉泵、渦輪分子泵等之真空排氣手段(未圖示)而保持於特定真空度之真空腔室11。於真空腔室11之上部,配設著基板搬運手段。該基板搬運手段具有公知之構造,例如,具有用以載置處理基板S之載體2,間歇式地驅動驅動手段,依序將處理基板S搬運至與標靶相對之位置。Referring to Fig. 1, reference numeral 1 denotes a magnetron sputtering apparatus (hereinafter simply referred to as "sputtering apparatus") of the present invention. In order to obtain a stable discharge by applying a phase voltage opposite to the charge accumulated on the surface of the target as described later, the sputtering apparatus 1 uses a line type of an alternating current power source. The sputtering apparatus 1 has a vacuum chamber 11 held at a specific degree of vacuum via a vacuum exhausting means (not shown) such as a rotary pump or a turbo molecular pump. A substrate transfer means is disposed above the vacuum chamber 11. The substrate transfer means has a known structure. For example, it has a carrier 2 on which the process substrate S is placed, and drives the drive means intermittently, and sequentially transports the process substrate S to a position facing the target.

於真空腔室11,配設著氣體導入手段3。氣體導入手段3介由配設著質流控制器31之氣管32連通至氣體源33,以一定之流量將Ar等之濺鍍氣體及反應性濺鍍時所使用之O2 、H2 O、H2 、N2 等之反應氣體導入真空腔室11內。於真空腔室11之下側,配置著陰極C。A gas introduction means 3 is disposed in the vacuum chamber 11. The gas introduction means 3 communicates with the gas source 33 through the gas pipe 32 in which the mass flow controller 31 is disposed, and the O 2 and H 2 O used in the sputtering of Ar and the like and the reactive sputtering at a constant flow rate. The reaction gas of H 2 , N 2 or the like is introduced into the vacuum chamber 11 . On the lower side of the vacuum chamber 11, a cathode C is disposed.

陰極C具有相對配置於處理基板S之1對標靶41a、41b。各標靶41a、41b係利用Al、Ti、Mo及ITO等,以對應於在處理基板S上實施成膜之薄膜之組成而利用公知之方法來製作,形成大致長方體(從上面觀察時為長方形)。各標靶41a、41b介由銦或錫等之結合材接合於濺鍍中用以冷卻標靶41a、41b之支撐板42,並介由圖上未標示之絕緣材裝設於陰極C之框架,以懸浮狀態配置於真空腔室11內。The cathode C has a pair of targets 41a and 41b disposed opposite to the processing substrate S. Each of the targets 41a and 41b is formed by a known method using Al, Ti, Mo, ITO, or the like in accordance with the composition of the film formed on the processing substrate S to form a substantially rectangular parallelepiped (a rectangular shape when viewed from above) ). Each of the targets 41a, 41b is bonded to the support plate 42 for cooling the targets 41a, 41b via a bonding material such as indium or tin, and is mounted on the frame of the cathode C via an insulating material not shown. It is disposed in the vacuum chamber 11 in a suspended state.

此時,標靶41a、41b係並設於平行於未使用時之濺鍍面411之處理基板S之同一平面上,於各標靶41a、41b之相對側面412之間,未配設任何陽極或遮蔽等之構成部品。各標靶41a、41b之外形尺寸係以並設之各標靶41a、41b大於處理基板S之外形尺寸之方式來進行設定。At this time, the targets 41a and 41b are disposed on the same plane parallel to the processed substrate S of the unused sputtering surface 411, and no anode is disposed between the opposite sides 412 of the respective targets 41a and 41b. Or a component such as a shadow. The external dimensions of the respective targets 41a and 41b are set such that the respective targets 41a and 41b are larger than the size of the processing substrate S.

此外,陰極C具備位於各標靶41a、41b之後方之磁鐵組合體5。磁鐵組合體5具有與各標靶41a、41b為平行配設之支持板51。該支持板51係由小於各標靶41a、41b之橫寬,兩側沿著標靶41a、41b之縱向延伸之長方形狀之平板所構成,以用以擴大磁鐵之吸附力之磁性材料製成。於支持板51上,以可交互變更極性方式配設著之沿著標靶41a、41b之縱向之棒狀中央磁鐵52、及沿著支持板51之外緣配設之周邊磁鐵53。此時,以使換算成中央磁鐵52之同磁化時之體積等於例如換算成周邊磁鐵52之同磁化時之體積之和(周邊磁鐵:中心磁鐵:周邊磁鐵=1:2:1)之方式來進行設計。Further, the cathode C includes a magnet assembly 5 located behind each of the targets 41a and 41b. The magnet assembly 5 has a support plate 51 disposed in parallel with each of the targets 41a and 41b. The support plate 51 is formed of a rectangular plate which is smaller than the lateral width of each of the targets 41a and 41b and has two sides extending along the longitudinal direction of the targets 41a and 41b, and is made of a magnetic material for expanding the adsorption force of the magnet. . On the support plate 51, a rod-shaped central magnet 52 extending in the longitudinal direction of the targets 41a and 41b and a peripheral magnet 53 disposed along the outer edge of the support plate 51 are disposed in a mutually interchangeable polarity manner. In this case, the volume when the same magnetization is converted into the central magnet 52 is equal to, for example, the sum of the volumes converted to the same magnetization of the peripheral magnet 52 (peripheral magnet: center magnet: peripheral magnet = 1:2:1). Design.

藉此,於各標靶41a、41b之前方,分別形成相符之閉環之隧道狀之磁通,捕捉於標靶41a、41b之前方游離之電子及濺鍍所產生之二次電子,來提高各標靶41a、41b之前方之電子密度,而提高電漿密度。此外,以可對1對標靶41a、41b利用特定頻率(1~400KHz)以交互變換極性之方式施加電壓之方式來配設交流電源E。Thereby, a closed-loop tunnel-shaped magnetic flux is formed in front of each of the targets 41a and 41b, and electrons that are free in front of the targets 41a and 41b and secondary electrons generated by sputtering are captured to improve each. The electron density in front of the targets 41a, 41b increases the plasma density. Further, the AC power source E is disposed such that the voltage can be applied to the pair of targets 41a and 41b by a specific frequency (1 to 400 kHz) to alternately change the polarity.

然而,利用交流電源E對1對標靶41a、41b實施電力投入時,必須不會損失投入電力,此外,不易受到雜訊之影響,且能以良好精度投入設定之電力。本實施形態時,係將交流電源E之構成區分成:可供應電力之電力供應部6、及以特定頻率交互變換極性來對各標靶41a、41b輸出電壓之振盪部7,振盪部7之框體70裝設於真空腔室11之底壁,而且,如後面所述,利用具有特定長度尺寸之匯流條8連結振盪部7及各標靶41a、41b。此時,輸出電壓之波形為正弦波,然而,並未受限於此,亦可以為例如方形波。However, when the power is supplied to the pair of targets 41a and 41b by the AC power source E, it is necessary to not lose the input power, and it is less susceptible to noise, and the set power can be input with good precision. In the present embodiment, the configuration of the AC power source E is divided into a power supply unit 6 that can supply electric power, and an oscillation unit 7 that outputs a voltage to each of the targets 41a and 41b by alternately changing the polarity at a specific frequency, and the oscillation unit 7 The casing 70 is mounted on the bottom wall of the vacuum chamber 11, and the oscillating portion 7 and the targets 41a, 41b are connected by a bus bar 8 having a specific length as will be described later. At this time, the waveform of the output voltage is a sine wave, however, it is not limited thereto, and may be, for example, a square wave.

如第2圖所示,電力供應部6具有箱狀之框體60,框體60內則具有:用以控制其動作之第1 CPU電路61、及輸入商用交流電力(3相AC200V或400V)之輸入部62、以及對所輸入之交流電力進行整流並變換成直流電力之6個二極體63,具有用以介由直流電力線64a、64b將直流電力輸出至振盪部7之機能。As shown in Fig. 2, the power supply unit 6 has a box-shaped housing 60, and the housing 60 has a first CPU circuit 61 for controlling the operation thereof and input commercial AC power (3-phase AC 200V or 400V). The input unit 62 and the six diodes 63 that rectify the input AC power and convert them into DC power have a function of outputting DC power to the oscillation unit 7 via the DC power lines 64a and 64b.

此外,於直流電力線64a、64b之間,配設著開關切換電晶體65,可通信自如地連結於第1 CPU電路61,且配設著用以控制開關切換電晶體65之導通斷開之第1驅動器電路66a及第1 PMW控制電路66b。此時,具有電流檢測感測器及電壓檢測變壓器,並配設著用以檢測直流電力線64a、64b間之電流、電壓之檢測電路67a及AD變換電路67b,介由檢測電路67a及AD變換電路67b對CPU電路61進行輸入。Further, a switching transistor 65 is disposed between the DC power lines 64a and 64b, and is communicably connected to the first CPU circuit 61, and is provided with a switch for controlling the on/off of the switching transistor 65. 1 driver circuit 66a and first PMW control circuit 66b. In this case, a current detecting sensor and a voltage detecting transformer are provided, and a detecting circuit 67a and an AD converting circuit 67b for detecting current and voltage between the DC power lines 64a and 64b are provided, and the detecting circuit 67a and the AD converting circuit are provided. 67b inputs the CPU circuit 61.

另一方面,振盪部7具有箱狀之框體70,裝設於真空腔室11下側之外壁。於框體70內,配設著:通信自如地連結於第1 CPU電路61之第2 CPU電路71;用以構成配設於直流電力線64a、64b之間之振盪用開關電路72之4個第1至第4開關切換電晶體72a、72b、72c、72d;以及通信自如地連結於第2 CPU電路71之用以控制各開關切換電晶體72a、72b、72c、72d之導通斷開之第2驅動器電路73a及第2 PMW控制電路73b。On the other hand, the oscillating portion 7 has a box-shaped frame body 70 and is attached to the outer wall of the lower side of the vacuum chamber 11. In the housing 70, a second CPU circuit 71 that is communicably connected to the first CPU circuit 61 is provided, and four oscillation switching circuits 72 that are disposed between the DC power lines 64a and 64b are disposed. 1 to 4th switch switching transistors 72a, 72b, 72c, and 72d; and 2nd to be communicatively coupled to the second CPU circuit 71 for controlling the on/off of each of the switch switching transistors 72a, 72b, 72c, and 72d The driver circuit 73a and the second PMW control circuit 73b.

其次,利用第2驅動器電路73a及第2 PMW控制電路73b,以使例如第1及第4開關切換電晶體72a、72d、及第2及第3之開關切換電晶體72b、72c之導通斷開之時序反轉之方式控制各開關切換電晶體72a、72b、72c、72d之動作,介由來自振盪用開關電路72之交流電力線74a、74b輸出正弦波之交流電力。此時,配設著用以檢測振盪電壓及振盪電流之檢測電路75a及AD變換電路75b,介由檢測電路75a及AD變換電路75b對第2 CPU電路71進行輸入。Next, the second driver circuit 73a and the second PMW control circuit 73b are used to turn on and off, for example, the first and fourth switch switching transistors 72a and 72d and the second and third switching transistor 72b and 72c. The operation of the switching switching transistors 72a, 72b, 72c, and 72d is controlled by the timing inversion, and the AC power of the sine wave is outputted via the AC power lines 74a and 74b from the oscillation switching circuit 72. At this time, the detection circuit 75a and the AD conversion circuit 75b for detecting the oscillation voltage and the oscillation current are provided, and the second CPU circuit 71 is input via the detection circuit 75a and the AD conversion circuit 75b.

交流電力線74a、74b經由串聯或併聯或其組合之共振用LC電路連結於具有公知之構造之輸出變壓器76,來自輸出變壓器76之輸出端子76a、76b及1對標靶41a、41b之間利用匯流條8進行連結。此時,具有電流檢測感測器及電壓檢測變壓器,配設著用以檢測對1對標靶41a、41b之輸出電壓、輸出電流之檢測電路77a及AD變換電路77b,介由檢測電路77a及AD變換電路77b對第2 CPU電路71進行輸入。藉此,可濺鍍中可介由交流電源E以一定之頻率並交互變換極性地對1對標靶41a、41b施加一定之電壓。The AC power lines 74a, 74b are connected to the output transformer 76 having a known configuration via LC circuits of series or parallel or a combination thereof, and the output terminals 76a, 76b from the output transformer 76 and the pair of targets 41a, 41b are used for convergence. Article 8 is linked. In this case, the current detecting sensor and the voltage detecting transformer are provided with a detecting circuit 77a and an AD converting circuit 77b for detecting the output voltage and output current of the pair of targets 41a and 41b, and the detecting circuit 77a and The AD conversion circuit 77b inputs the second CPU circuit 71. Thereby, in the sputtering, a certain voltage can be applied to the pair of targets 41a and 41b via the AC power source E at a constant frequency and alternately changing the polarity.

此外,來自檢測電路77a之輸出係連結於用以檢測輸出電壓及輸出電流之輸出相位及頻率之檢測電路78a,介由可通信自如地連結於該檢測電路78a之輸出相位頻率控制電路78b,將輸出電壓及輸出電流之相位及頻率輸入至第2 CPU電路71。藉此,利用來自第2 CPU電路71之控制信號以第2驅動器電路73a來控制振盪用開關電路72之各開關切換電晶體72a、72b、72c、73d之導通斷開,而以輸出電壓及輸出電流之相位大致相同之方式進行控制。Further, the output from the detection circuit 77a is connected to the detection circuit 78a for detecting the output phase and frequency of the output voltage and the output current, and is connected to the output phase frequency control circuit 78b of the detection circuit 78a via a controllable connection. The phase and frequency of the output voltage and the output current are input to the second CPU circuit 71. Thereby, the second driver circuit 73a controls the on/off of each of the switch switching transistors 72a, 72b, 72c, and 73d of the oscillation switching circuit 72 by the control signal from the second CPU circuit 71 to output voltage and output. The phases of the currents are controlled in substantially the same manner.

如第3圖所示,匯流條8之構成上,於板狀之中央部81之兩側,分別介由由螺栓B及螺帽N所構成之連結手段裝設著裝設部81、82。中央部81及各裝設部82、83應由高導電率之相同材料所構成,例如,Cu、Au、Ag或鋁合金製。As shown in Fig. 3, in the configuration of the bus bar 8, the mounting portions 81 and 82 are attached to the two sides of the central portion 81 of the plate shape via the connecting means including the bolt B and the nut N, respectively. The central portion 81 and each of the mounting portions 82 and 83 should be made of the same material having a high electrical conductivity, for example, Cu, Au, Ag or an aluminum alloy.

此時,中央部81之表面積及板厚之設定,應考慮構成該中央部81之板材之材質及使用濺鍍裝置1實施成膜處理時對標靶41a、41b之投入電力、交流電力之頻率等(例如,中央部81之長度為約300mm、寬度為40mm時,其板厚設定成6mm)。另一方面,裝設部82、83之構成上,應考慮對配設於振盪部7之輸出變壓器76之輸出側之輸出端子76a、76b及各標靶41a、41b之裝設,以寬度大於中央部81之板材之板材將剖面形成彎曲成略呈Z字形狀,介由配設於其一端之裝設孔82a、83a分別利用螺栓等之連結手段(未圖示)固定於輸出端子76a、76b及各標靶41a、41b。In this case, the surface area and the thickness of the center portion 81 should be set in consideration of the material of the plate material constituting the center portion 81 and the frequency of inputting electric power and AC power to the targets 41a and 41b when the film forming process is performed by the sputtering apparatus 1. For example (for example, when the length of the central portion 81 is about 300 mm and the width is 40 mm, the thickness thereof is set to 6 mm). On the other hand, in the configuration of the mounting portions 82 and 83, it is conceivable to install the output terminals 76a and 76b and the respective targets 41a and 41b disposed on the output side of the output transformer 76 of the oscillating portion 7, and the width is larger than The plate material of the plate portion of the center portion 81 is bent into a substantially zigzag shape, and is fixed to the output terminal 76a by a connecting means (not shown) such as a bolt through a mounting hole 82a, 83a disposed at one end thereof. 76b and each of the targets 41a, 41b.

此外,於中央部81之兩端、及各裝設部82、83之另一端,分別形成2個貫通孔81a、82b、83b,使各貫通孔81a、82b、83b於上下方向成為一致並使中央部81之兩端與各裝設部82、83之一端相互重疊,將螺栓B之軸部插通於各貫通孔81a、82b、83b後,於其另一端,鎖緊螺帽N來進行相互連結。此時,一方之裝設部82之貫通孔82b為長孔,可對應輸出端子76a、76b及各標靶41a、41b之距離來調節匯流條8本身之長度,亦即,匯流條8可自如地伸縮。藉此,可吸收振盪部7及標靶41a、41b間之間隔誤差,而使匯流條8之裝設作業更為容易。Further, at the both ends of the center portion 81 and the other ends of the respective mounting portions 82 and 83, two through holes 81a, 82b, and 83b are formed, and the through holes 81a, 82b, and 83b are aligned in the vertical direction. Both ends of the central portion 81 overlap with one end of each of the mounting portions 82 and 83, and the shaft portion of the bolt B is inserted into each of the through holes 81a, 82b, and 83b, and the nut N is locked at the other end. Connected to each other. At this time, the through hole 82b of one of the mounting portions 82 is a long hole, and the length of the bus bar 8 itself can be adjusted corresponding to the distance between the output terminals 76a and 76b and the respective targets 41a and 41b, that is, the bus bar 8 can be freely Ground expansion and contraction. Thereby, the interval error between the oscillation portion 7 and the targets 41a and 41b can be absorbed, and the installation work of the bus bar 8 can be made easier.

將匯流條8裝設於輸出端子76a、76b及各標靶41a、41b之間時,因為貫通支持板51之中央部81會露出,故以陶瓷等之公知之絕緣材料9覆蓋該中央部81。When the bus bar 8 is mounted between the output terminals 76a and 76b and the respective targets 41a and 41b, since the central portion 81 of the through-supporting plate 51 is exposed, the central portion 81 is covered with a known insulating material 9 such as ceramics. .

藉此,交流電流流過之部份之表面積會較大,可不受表面效果之影響而流過大電流。結果,與利用公知之交流電源纜線時相比,不易造成投入電力之損失,而且,不易受到雜訊之影響,其次,交流電源E可以良好精度對1對標靶41a、41b進行電力投入。Thereby, the surface area through which the alternating current flows is large, and a large current can flow without being affected by the surface effect. As a result, compared with the case of using a known AC power cable, it is less likely to cause loss of input power, and it is less susceptible to noise, and secondly, the AC power source E can input power to the pair of targets 41a and 41b with good precision.

其次,利用基板搬運手段將處理基板S搬送至與1對標靶41a、41b相對之位置,介由氣體導入手段3導入特定濺鍍氣體。介由交流電源E對1對標靶41a、41b施加交流電壓,將各標靶41a、41b交互切換成陽極、陰極,於陽極及陰極之間產生輝光放電而形成電漿環境。藉此,電漿環境中之離子朝陰極一方之標靶41a、41b進行加速衝擊,使標靶原子飛散,而於處理基板S表面形成薄膜。Next, the processing substrate S is transported to a position facing the pair of targets 41a and 41b by the substrate transfer means, and the specific sputtering gas is introduced through the gas introduction means 3. An AC voltage is applied to the pair of targets 41a and 41b via the AC power source E, and the targets 41a and 41b are alternately switched to an anode and a cathode, and a glow discharge is generated between the anode and the cathode to form a plasma environment. Thereby, the ions in the plasma environment are acceleratedly impacted toward the targets 41a and 41b on the cathode side, and the target atoms are scattered, and a thin film is formed on the surface of the substrate S.

此時,於磁鐵組合體5,配設著圖上未標示之馬達等之驅動手段,利用該驅動手段,使其於沿著標靶41a、41b之水平方向之2個位置之間進行平行等速往返移動,以便在標靶41a、41b全面得到均等之侵蝕領域。At this time, in the magnet assembly 5, a driving means such as a motor (not shown) is disposed, and the driving means is used to perform paralleling between two positions along the horizontal direction of the targets 41a, 41b. The speed is moved back and forth to obtain an equal erosion field in the targets 41a, 41b.

本實施形態時,係針對於中央部81之兩側連結著2個裝設部82、83之匯流條8之構成進行說明,然而,並未受限於此,亦可以為一體製作。此外,係針對高導電率之材料製造時進行說明,然而,投入交流電力時,只要流過交流電流之部份採用Au或Ag等之高導電率材料即可,亦即,以Au或Ag之薄膜覆蓋匯流條8表面之構成,可以降低成本。In the present embodiment, the configuration in which the bus bars 8 of the two mounting portions 82 and 83 are connected to both sides of the center portion 81 will be described. However, the present invention is not limited thereto, and may be integrally formed. In addition, it is explained in the case of manufacturing a material having high conductivity. However, when AC power is supplied, a high conductivity material such as Au or Ag may be used as long as the part of the alternating current flows, that is, Au or Ag is used. The film covers the surface of the bus bar 8 to reduce the cost.

此外,本實施形態時,係針對於真空腔室11內配設1對標靶41a、41b來進行說明,然而,並未受限於此,如第4圖所示,於真空腔室11a內,並設複數之標靶41a~41f,並針對各相鄰之標靶41a~41f,指定具有同構造之交流電源E1~E3,介由各交流電源E1、E2、E3對複數之1對標靶41a~41f進行電力投入之濺鍍裝置之構成亦可應用本發明。此時,係利用不同交流電源E1~E3對各標靶41a~41f投入交流電力,因為交流電源E1~E3可以良好精度分別對各1對標靶41a~41f進行電力投入(可使各交流電源之投入電力大致成為一致),可以對各標靶41a~41f實施均等之濺鍍而得到良好之成膜。Further, in the present embodiment, a pair of targets 41a and 41b are disposed in the vacuum chamber 11, but the present invention is not limited thereto, and as shown in Fig. 4, in the vacuum chamber 11a. And the plurality of targets 41a to 41f are set, and the AC power sources E1 to E3 having the same structure are designated for the adjacent targets 41a to 41f, and the pair of the AC power sources E1, E2, and E3 are paired with each other. The present invention can also be applied to the configuration of the sputtering device in which the targets 41a to 41f are powered. At this time, AC power is supplied to each of the targets 41a to 41f by using different AC power sources E1 to E3, and the AC power sources E1 to E3 can respectively input power to each of the pair of targets 41a to 41f with good precision (the respective AC power sources can be used). The input power is substantially uniform. It is possible to perform uniform sputtering on each of the targets 41a to 41f to obtain a good film formation.

1...濺鍍裝置1. . . Sputtering device

11...真空腔室11. . . Vacuum chamber

41a、41b...標靶41a, 41b. . . Target

6...電力供應部6. . . Power supply department

7...振盪部7. . . Oscillation section

8...匯流條8. . . Bus bar

E...交流電源E. . . AC power

第1圖係本發明之濺鍍裝置之概略說明圖。Fig. 1 is a schematic explanatory view of a sputtering apparatus of the present invention.

第2圖係交流電源之構成說明圖。Fig. 2 is an explanatory diagram of the configuration of an AC power source.

第3圖係匯流條之構成說明之分解斜視圖。Fig. 3 is an exploded perspective view showing the constitution of the bus bar.

第4圖係本發明之濺鍍裝置之變形例之概略說明圖。Fig. 4 is a schematic explanatory view showing a modification of the sputtering apparatus of the present invention.

1...濺鍍裝置1. . . Sputtering device

2...載體2. . . Carrier

3...氣體導入手段3. . . Gas introduction means

5...磁鐵組合體5. . . Magnet assembly

6...電力供應部6. . . Power supply department

7...振盪部7. . . Oscillation section

8...匯流條8. . . Bus bar

11...真空腔室11. . . Vacuum chamber

31...質流控制器31. . . Mass flow controller

32...氣管32. . . trachea

33...氣體源33. . . Gas source

41a...標靶41a. . . Target

41b...標靶41b. . . Target

42...支撐板42. . . Support plate

51...支持板51. . . Support board

52...中央磁鐵52. . . Central magnet

53...周邊磁鐵53. . . Peripheral magnet

64a...直流電力線64a. . . DC power line

64b...直流電力線64b. . . DC power line

411...濺鍍面411. . . Sputtered surface

412...側面412. . . side

E...交流電源E. . . AC power

Claims (6)

一種濺鍍裝置,其特徵為具備:配設於真空腔室內之1對標靶;及對該1對標靶以特定頻率交互變換極性來施加電壓之交流電源;且,該交流電源之構成上,區分成:可供應電力之電力供應部;及具有連結於來自該電力供應部之電力線之振盪用開關電路之振盪部;且,以匯流條連結該振盪部及各標靶。 A sputtering apparatus characterized by comprising: a pair of targets disposed in a vacuum chamber; and an alternating current power source that alternately converts polarity to a pair of targets to apply a voltage at a specific frequency; and the composition of the alternating current power source And an electric power supply unit that can supply electric power; and an oscillation unit that has an oscillation switching circuit connected to the electric power line from the electric power supply unit; and the oscillation unit and each target are connected by a bus bar. 如申請專利範圍第1項所記載之濺鍍裝置,其中前述匯流條是以Au或Ag之薄膜覆蓋其表面。 The sputtering apparatus according to claim 1, wherein the bus bar covers the surface of the film of Au or Ag. 如申請專利範圍第1或2項所記載之濺鍍裝置,其中前述匯流條可自由地伸縮。 The sputtering apparatus according to claim 1 or 2, wherein the bus bar is freely expandable and contractible. 如申請專利範圍第1或2項之其中任一項所記載之濺鍍裝置,其中前述振盪部之框體裝設於真空腔室之外壁。 The sputtering apparatus according to any one of the preceding claims, wherein the frame of the oscillating portion is mounted on an outer wall of the vacuum chamber. 如申請專利範圍第1或2項之其中任一項所記載之濺鍍裝置,其中於前述真空腔室內,並設著複數之1對標靶,於每1對標靶,配設著交流電源,且,以在各標靶之前方分別形成磁通之方式,被設置在各標靶之後方,配置有由交互變換極性而設的複數之磁鐵所構成之磁鐵組合體。 The sputtering apparatus according to any one of claims 1 to 2, wherein a plurality of pairs of targets are provided in the vacuum chamber, and an AC power source is provided for each pair of targets. Further, a magnet assembly including a plurality of magnets provided by alternately changing the polarity is disposed behind each of the targets so that magnetic fluxes are formed in front of the respective targets. 如申請專利範圍第5項所記載之濺鍍裝置,其中設有一體驅動各磁鐵組合體之驅動手段,使前述磁通相對於標靶自由地平行移動。 The sputtering apparatus according to claim 5, wherein a driving means for integrally driving each of the magnet assemblies is provided, and the magnetic flux is freely moved in parallel with respect to the target.
TW096101144A 2006-01-11 2007-01-11 Sputtering device TWI390065B (en)

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