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TWI368742B - Electroconductive contactor holder and electroconductive contactor unit - Google Patents

Electroconductive contactor holder and electroconductive contactor unit

Info

Publication number
TWI368742B
TWI368742B TW097122997A TW97122997A TWI368742B TW I368742 B TWI368742 B TW I368742B TW 097122997 A TW097122997 A TW 097122997A TW 97122997 A TW97122997 A TW 97122997A TW I368742 B TWI368742 B TW I368742B
Authority
TW
Taiwan
Prior art keywords
electroconductive contactor
holder
electroconductive
unit
contactor
Prior art date
Application number
TW097122997A
Other languages
English (en)
Chinese (zh)
Other versions
TW200902985A (en
Inventor
Hiroshi Nakayama
Kohei Hironaka
Mitsuhiro Kondo
Osamu Ito
Takashi Sudo
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200902985A publication Critical patent/TW200902985A/zh
Application granted granted Critical
Publication of TWI368742B publication Critical patent/TWI368742B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
TW097122997A 2007-06-22 2008-06-20 Electroconductive contactor holder and electroconductive contactor unit TWI368742B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007165396 2007-06-22

Publications (2)

Publication Number Publication Date
TW200902985A TW200902985A (en) 2009-01-16
TWI368742B true TWI368742B (en) 2012-07-21

Family

ID=40185550

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097122997A TWI368742B (en) 2007-06-22 2008-06-20 Electroconductive contactor holder and electroconductive contactor unit

Country Status (3)

Country Link
JP (1) JP5193200B2 (ja)
TW (1) TWI368742B (ja)
WO (1) WO2009001731A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9645172B2 (en) 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
TWI596342B (zh) * 2014-03-25 2017-08-21 Advantest Corp Device Holder, Internal Unit, External Unit and Tray
TWI646335B (zh) * 2018-05-10 2019-01-01 中華精測科技股份有限公司 導位板及其製造方法和具有該導位板之探針頭

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5742235B2 (ja) * 2011-01-18 2015-07-01 富士通株式会社 接続部品
JP5725543B2 (ja) * 2011-02-17 2015-05-27 上野精機株式会社 電子部品測定装置
KR101762836B1 (ko) * 2015-09-10 2017-07-28 리노공업주식회사 프로브 소켓
KR101882209B1 (ko) 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
KR101906575B1 (ko) * 2016-11-29 2018-10-11 리노공업주식회사 카메라모듈 검사장치
KR101975836B1 (ko) * 2017-08-11 2019-08-28 리노공업주식회사 검사장치
JP7125408B2 (ja) * 2017-09-08 2022-08-24 株式会社エンプラス 電気接続用ソケット
JP2023174031A (ja) * 2022-05-27 2023-12-07 株式会社ヨコオ 検査装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002328149A (ja) * 2001-04-27 2002-11-15 Sony Corp Ｉｃソケット
JP2005049163A (ja) * 2003-07-31 2005-02-24 Yokowo Co Ltd 高周波・高速用デバイスの検査治具および検査用プローブ
JP2005127794A (ja) * 2003-10-22 2005-05-19 Murata Mfg Co Ltd 電子部品の測定治具及び電子部品の測定方法
JP4689196B2 (ja) * 2003-11-05 2011-05-25 日本発條株式会社 導電性接触子ホルダ、導電性接触子ユニット
JP2005337904A (ja) * 2004-05-27 2005-12-08 New Japan Radio Co Ltd 半導体装置特性測定用治具および半導体装置特性測定方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI596342B (zh) * 2014-03-25 2017-08-21 Advantest Corp Device Holder, Internal Unit, External Unit and Tray
US9645172B2 (en) 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
TWI646335B (zh) * 2018-05-10 2019-01-01 中華精測科技股份有限公司 導位板及其製造方法和具有該導位板之探針頭

Also Published As

Publication number Publication date
JP5193200B2 (ja) 2013-05-08
TW200902985A (en) 2009-01-16
JPWO2009001731A1 (ja) 2010-08-26
WO2009001731A1 (ja) 2008-12-31

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees