KR101762836B1 - 프로브 소켓 - Google Patents
프로브 소켓 Download PDFInfo
- Publication number
- KR101762836B1 KR101762836B1 KR1020150128114A KR20150128114A KR101762836B1 KR 101762836 B1 KR101762836 B1 KR 101762836B1 KR 1020150128114 A KR1020150128114 A KR 1020150128114A KR 20150128114 A KR20150128114 A KR 20150128114A KR 101762836 B1 KR101762836 B1 KR 101762836B1
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- KR
- South Korea
- Prior art keywords
- noise
- probe
- signal
- fixing member
- probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0835—Testing shielding, e.g. for efficiency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
Description
도 3은 도 1의 노이즈 차폐본체의 분해사시도,
도 4는 도 1의 노이즈 차폐본체의 사시도, 및
도 5는 본 발명의 실시예에 따른 프로브소켓의 부분 절개사시도,
도 6은 본 발명의 제2실시예에 따른 노이즈 차폐본체의 사시도, 및
도 7은 본 발명의 제3실시예에 따른 노이즈 차폐본체의 분해사시도이다.
100: 노이즈 차폐본체
110: 상부 차폐본체
120: 하부 차폐본체
130: 지지부재
142: 신호용 프로브
144: 접지용 프로브
150: 상부 노이즈 차단벽
160: 하부 노이즈 차단벽
200: 상부 고정부재
300: 하부 고정부재
Claims (5)
- 복수의 신호용 프로브들을 포함하는 프로브 소켓에 있어서,
상기 복수의 신호용 프로브들을 양단부가 상면 및 하면으로부터 노출되도록 서로 평행하게 수용하며, 상기 상면 및 상기 하면으로부터 돌출하여 상기 복수의 신호용 프로브들의 노출 단부들 사이를 모두 차단하는 상부 및 하부 노이즈 차단벽을 가진 도전성의 노이즈 차폐본체와;
상기 노이즈 차폐본체를 수용하며, 상기 복수의 신호용 프로브들이 상기 노이즈 차폐본체에 접촉하지 않도록 상기 노출 양단부를 지지하는 상부 및 하부 고정부재를 포함하며,
상기 상부 고정부재 및 상기 하부 고정부재 중 적어도 하나는 상기 노이즈 차폐본체를 수용하는 차폐본체 수용부를 포함하며,
상기 상부 고정부재 및 상기 하부 고정부재는 상기 복수의 신호용 프로브들의 상측을 고정지지하는 복수의 신호용 프로브 상부고정홀과 상기 복수의 신호용 프로브들의 하측을 고정지지하는 복수의 신호용 프로브 하부고정홀을 각각 포함하며,
상기 상부 고정부재 및 상기 하부 고정부재는 상기 복수의 신호용 프로브 상부고정홀 사이 및 상기 복수의 신호용 프로브 하부고정홀 사이에 상기 상부 및 하부 노이즈 차단벽이 통과하는 상부 및 하부 차단벽 수용홈부를 각각 포함하며,
상기 상부 및 하부 노이즈 차단벽과 상기 상부 및 하부 차단벽 수용홈부의 결합에 의해 상기 노이즈 차폐본체와 상기 상부 및 하부 고정부재를 정렬하는 하는 것을 특징으로 하는 프로브 소켓. - 삭제
- 제 1항에 있어서,
상기 노이즈 차폐본체는 황동블록을 포함하는 것을 특징으로 하는 프로브 소켓.
- 삭제
- 제 1항에 있어서,
복수의 접지용 프로브를 더 포함하며,
상기 상부 및 하부 노이즈 차단벽은 상기 복수의 접지용 프로브 중 적어도 하나를 수용하는 것을 특징으로 하는 프로브 소켓.
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150128114A KR101762836B1 (ko) | 2015-09-10 | 2015-09-10 | 프로브 소켓 |
| JP2018512287A JP6568650B2 (ja) | 2015-09-10 | 2016-09-08 | プローブソケット |
| PCT/KR2016/010077 WO2017043879A1 (ko) | 2015-09-10 | 2016-09-08 | 프로브 소켓 |
| CN201680052420.1A CN108139429B (zh) | 2015-09-10 | 2016-09-08 | 探针插座 |
| MYPI2018700938A MY187011A (en) | 2015-09-10 | 2016-09-08 | Probe socket |
| TW105129226A TWI626450B (zh) | 2015-09-10 | 2016-09-09 | 探針插座 |
| US15/916,479 US10884047B2 (en) | 2015-09-10 | 2018-03-09 | Probe socket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150128114A KR101762836B1 (ko) | 2015-09-10 | 2015-09-10 | 프로브 소켓 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20170030783A KR20170030783A (ko) | 2017-03-20 |
| KR101762836B1 true KR101762836B1 (ko) | 2017-07-28 |
Family
ID=58240862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150128114A Active KR101762836B1 (ko) | 2015-09-10 | 2015-09-10 | 프로브 소켓 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10884047B2 (ko) |
| JP (1) | JP6568650B2 (ko) |
| KR (1) | KR101762836B1 (ko) |
| CN (1) | CN108139429B (ko) |
| MY (1) | MY187011A (ko) |
| TW (1) | TWI626450B (ko) |
| WO (1) | WO2017043879A1 (ko) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10274515B1 (en) * | 2015-08-07 | 2019-04-30 | Johnstech International Corporation | Waveguide integrated testing |
| KR101975836B1 (ko) * | 2017-08-11 | 2019-08-28 | 리노공업주식회사 | 검사장치 |
| KR102015788B1 (ko) * | 2017-11-30 | 2019-08-29 | 리노공업주식회사 | 검사장치 |
| KR102044753B1 (ko) | 2018-05-25 | 2019-11-15 | 리노공업주식회사 | 검사장치 |
| TWI673499B (zh) * | 2018-09-10 | 2019-10-01 | 范劉文玲 | 積體電路插座 |
| JP2020134216A (ja) * | 2019-02-15 | 2020-08-31 | 株式会社サンケイエンジニアリング | 検査治具 |
| JP7206140B2 (ja) * | 2019-03-22 | 2023-01-17 | 株式会社ヨコオ | 検査装置 |
| CN111182778A (zh) * | 2019-12-31 | 2020-05-19 | 上海航天科工电器研究院有限公司 | 一种全屏蔽差分接触模块及其制备方法 |
| JP2021128055A (ja) * | 2020-02-13 | 2021-09-02 | オムロン株式会社 | 検査ソケット |
| JP2021135214A (ja) * | 2020-02-28 | 2021-09-13 | 三菱電機エンジニアリング株式会社 | 通電コンタクトユニット、及び試験システム |
| KR102295761B1 (ko) | 2020-06-01 | 2021-09-01 | 리노공업주식회사 | 검사소켓 |
| KR102373067B1 (ko) * | 2020-06-30 | 2022-03-14 | 리노공업주식회사 | 검사소켓 및 그의 제조방법 |
| CN111900578A (zh) * | 2020-08-20 | 2020-11-06 | 苏州华兴源创科技股份有限公司 | 一种信号传输组件 |
| KR102489319B1 (ko) * | 2020-10-28 | 2023-01-18 | 주식회사 아이에스시 | 전기 접속용 커넥터 |
| KR102714431B1 (ko) * | 2022-02-17 | 2024-10-11 | 리노공업주식회사 | 검사장치 |
| KR102529636B1 (ko) * | 2023-01-10 | 2023-05-12 | 하이콘 주식회사 | 반도체 소자 테스트용 소켓장치 |
| KR102653117B1 (ko) * | 2023-07-20 | 2024-04-02 | 주식회사 비이링크 | 전자 소자의 회로 검사용 러버 소켓 장치 |
| CN120657500A (zh) * | 2024-03-07 | 2025-09-16 | 芯卓科技(浙江)有限公司 | 插座总成 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5193200B2 (ja) * | 2007-06-22 | 2013-05-08 | 日本発條株式会社 | 導電性接触子ホルダおよび導電性接触子ユニット |
| KR101534778B1 (ko) * | 2014-01-24 | 2015-07-09 | 리노공업주식회사 | 검사장치 |
| KR101552552B1 (ko) | 2014-08-22 | 2015-09-14 | 리노공업주식회사 | 테스트 소켓 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4603023A (en) * | 1983-12-01 | 1986-07-29 | International Business Machines Corporation | Method of making a hybrid dielectric probe interposer |
| JP4535828B2 (ja) * | 2004-09-30 | 2010-09-01 | 株式会社ヨコオ | 検査ユニットの製法 |
| JP4438601B2 (ja) * | 2004-10-28 | 2010-03-24 | 株式会社ヨコオ | 検査ユニットの製法 |
| WO2006062911A1 (en) * | 2004-12-08 | 2006-06-15 | K & S Interconnect, Inc. | Test socket and method for making |
| JP2008070146A (ja) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | 検査用ソケット |
| CN101803127B (zh) * | 2007-09-11 | 2012-12-12 | 爱德万测试株式会社 | 连接器、导电部件、其制造方法、功能板,以及测试装置 |
| JP4921344B2 (ja) * | 2007-12-26 | 2012-04-25 | 株式会社ヨコオ | 検査ソケット |
| KR20100037431A (ko) * | 2008-10-01 | 2010-04-09 | (주)리뉴젠 | 고주파수용 반도체 테스트 소켓 |
| JP2010175371A (ja) * | 2009-01-29 | 2010-08-12 | Yokowo Co Ltd | 検査ソケット |
| JP5960383B2 (ja) * | 2010-06-01 | 2016-08-02 | スリーエム イノベイティブ プロパティズ カンパニー | 接触子ホルダ |
| JP5788767B2 (ja) * | 2011-11-07 | 2015-10-07 | 株式会社日本マイクロニクス | プローブブロックとそれを備えるプローブカード並びにプローブ装置 |
| KR101357535B1 (ko) * | 2012-06-25 | 2014-02-05 | 주식회사 유니세트 | 인터포저 소켓 |
-
2015
- 2015-09-10 KR KR1020150128114A patent/KR101762836B1/ko active Active
-
2016
- 2016-09-08 WO PCT/KR2016/010077 patent/WO2017043879A1/ko not_active Ceased
- 2016-09-08 JP JP2018512287A patent/JP6568650B2/ja active Active
- 2016-09-08 MY MYPI2018700938A patent/MY187011A/en unknown
- 2016-09-08 CN CN201680052420.1A patent/CN108139429B/zh active Active
- 2016-09-09 TW TW105129226A patent/TWI626450B/zh active
-
2018
- 2018-03-09 US US15/916,479 patent/US10884047B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5193200B2 (ja) * | 2007-06-22 | 2013-05-08 | 日本発條株式会社 | 導電性接触子ホルダおよび導電性接触子ユニット |
| KR101534778B1 (ko) * | 2014-01-24 | 2015-07-09 | 리노공업주식회사 | 검사장치 |
| KR101552552B1 (ko) | 2014-08-22 | 2015-09-14 | 리노공업주식회사 | 테스트 소켓 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108139429B (zh) | 2020-09-08 |
| CN108139429A (zh) | 2018-06-08 |
| US20180196096A1 (en) | 2018-07-12 |
| TW201734465A (zh) | 2017-10-01 |
| WO2017043879A1 (ko) | 2017-03-16 |
| TWI626450B (zh) | 2018-06-11 |
| KR20170030783A (ko) | 2017-03-20 |
| JP6568650B2 (ja) | 2019-08-28 |
| US10884047B2 (en) | 2021-01-05 |
| MY187011A (en) | 2021-08-26 |
| JP2018529951A (ja) | 2018-10-11 |
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