TWI366971B - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- TWI366971B TWI366971B TW097116342A TW97116342A TWI366971B TW I366971 B TWI366971 B TW I366971B TW 097116342 A TW097116342 A TW 097116342A TW 97116342 A TW97116342 A TW 97116342A TW I366971 B TWI366971 B TW I366971B
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated circuit
- semiconductor integrated
- semiconductor
- circuit
- integrated
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
- Dram (AREA)
- Electronic Switches (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020070114970A KR100907009B1 (ko) | 2007-11-12 | 2007-11-12 | 반도체 집적 회로 |
| KR1020070117092A KR100907010B1 (ko) | 2007-11-16 | 2007-11-16 | 반도체 집적 회로 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200922094A TW200922094A (en) | 2009-05-16 |
| TWI366971B true TWI366971B (en) | 2012-06-21 |
Family
ID=40623139
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097116342A TWI366971B (en) | 2007-11-12 | 2008-05-02 | Semiconductor integrated circuit |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8120416B2 (zh) |
| JP (2) | JP5175597B2 (zh) |
| TW (1) | TWI366971B (zh) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010153771A (ja) * | 2008-11-28 | 2010-07-08 | Ricoh Co Ltd | 情報処理装置及び画像形成装置 |
| JP2010176742A (ja) * | 2009-01-29 | 2010-08-12 | Elpida Memory Inc | 半導体装置及びデータ処理システム |
| KR101163220B1 (ko) * | 2010-08-27 | 2012-07-06 | 에스케이하이닉스 주식회사 | 반도체 집적회로 |
| JP2013110314A (ja) * | 2011-11-22 | 2013-06-06 | Elpida Memory Inc | 半導体装置 |
| CN103472404A (zh) * | 2012-06-06 | 2013-12-25 | 鸿富锦精密工业(深圳)有限公司 | 接地检测电路 |
| US9871506B2 (en) * | 2014-04-16 | 2018-01-16 | Qualcomm Incorporated | Switchable decoupling capacitors |
| KR20160005404A (ko) * | 2014-07-07 | 2016-01-15 | 에스케이하이닉스 주식회사 | 시스템 |
| US20160371216A1 (en) * | 2015-06-17 | 2016-12-22 | Intel Corporation | Capacitor interconnections and volume re-capture for voltage noise reduction |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0693497B2 (ja) * | 1986-07-30 | 1994-11-16 | 日本電気株式会社 | 相補型mis集積回路 |
| JPH02111064A (ja) * | 1988-10-20 | 1990-04-24 | Nec Corp | モノリシックicの静電破壊保護回路 |
| JPH02113623A (ja) * | 1988-10-21 | 1990-04-25 | Sharp Corp | 集積回路の静電気保護回路 |
| JPH046868A (ja) * | 1990-04-24 | 1992-01-10 | Fujitsu Ltd | 半導体集積回路 |
| JPH05343603A (ja) | 1992-06-09 | 1993-12-24 | Nec Corp | 半導体装置 |
| KR960000515B1 (ko) | 1992-07-31 | 1996-01-08 | 삼성전자주식회사 | 반도체 소자의 정전기 방지회로 |
| JP3173327B2 (ja) | 1995-06-16 | 2001-06-04 | 富士通株式会社 | 半導体装置 |
| JP3229809B2 (ja) * | 1995-08-31 | 2001-11-19 | 三洋電機株式会社 | 半導体装置 |
| JP3667855B2 (ja) * | 1996-01-25 | 2005-07-06 | 株式会社ルネサステクノロジ | 半導体装置 |
| KR100206604B1 (ko) | 1996-06-29 | 1999-07-01 | 김영환 | 반도체 메모리 장치 |
| JPH1023662A (ja) * | 1996-07-03 | 1998-01-23 | Mitsubishi Electric Corp | サージ保護回路 |
| JPH10135336A (ja) | 1996-10-25 | 1998-05-22 | Toshiba Corp | 半導体集積回路装置、半導体集積回路装置が発するノイズの低減方法、半導体集積回路装置の内部電源システム |
| JP3693204B2 (ja) * | 1996-12-06 | 2005-09-07 | 株式会社日立製作所 | 半導体集積回路装置 |
| JP3730003B2 (ja) * | 1997-02-18 | 2005-12-21 | 株式会社東芝 | 半導体装置 |
| EP0976190A1 (en) | 1997-04-16 | 2000-02-02 | The Board Of Trustees Of The Leland Stanford Junior University | Distributed esd protection device for high speed integrated circuits |
| JPH11103248A (ja) * | 1997-07-30 | 1999-04-13 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
| JPH11103428A (ja) * | 1997-09-29 | 1999-04-13 | Funai Electric Co Ltd | 映像装置 |
| US6597227B1 (en) * | 2000-01-21 | 2003-07-22 | Atheros Communications, Inc. | System for providing electrostatic discharge protection for high-speed integrated circuits |
| JP4204737B2 (ja) * | 2000-03-16 | 2009-01-07 | 株式会社ルネサステクノロジ | 集積回路装置 |
| KR20020002020A (ko) | 2000-06-29 | 2002-01-09 | 박종섭 | 전원부의 cdm 및 emi 필터 회로 |
| TW541791B (en) * | 2001-07-23 | 2003-07-11 | Via Tech Inc | Signal transmission device and method to reduce power bounce |
| KR100464411B1 (ko) | 2002-04-19 | 2005-01-03 | 삼성전자주식회사 | 분할된 디커플링 커패시터를 이용한 전원선 잡음 제거회로 및 이를 구비하는 반도체 장치 |
| US7076757B2 (en) * | 2003-02-27 | 2006-07-11 | Nec Electronics Corporation | Semiconductor integrated device and apparatus for designing the same |
| US6756834B1 (en) * | 2003-04-29 | 2004-06-29 | Pericom Semiconductor Corp. | Direct power-to-ground ESD protection with an electrostatic common-discharge line |
| KR100576449B1 (ko) | 2004-01-30 | 2006-05-08 | 주식회사 하이닉스반도체 | 내부전압 발생회로 |
| JP4652703B2 (ja) * | 2004-03-10 | 2011-03-16 | ルネサスエレクトロニクス株式会社 | 半導体回路装置及びマルチ・チップ・パッケージ |
| KR20060023201A (ko) | 2004-09-09 | 2006-03-14 | 삼성전자주식회사 | 반도체 장치의 멀티내부전압 발생회로 |
| KR100801033B1 (ko) * | 2005-11-03 | 2008-02-04 | 삼성전자주식회사 | 경계 스캔 회로를 이용하여 온 다이 터미네이션 회로를테스트할 수 있는 반도체 장치, 이를 구비한 테스트시스템, 및 테스트 방법 |
-
2008
- 2008-04-07 JP JP2008099703A patent/JP5175597B2/ja active Active
- 2008-05-02 TW TW097116342A patent/TWI366971B/zh active
- 2008-07-01 US US12/166,085 patent/US8120416B2/en active Active
-
2012
- 2012-12-05 JP JP2012266548A patent/JP2013066232A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US8120416B2 (en) | 2012-02-21 |
| TW200922094A (en) | 2009-05-16 |
| JP2009124672A (ja) | 2009-06-04 |
| US20090121786A1 (en) | 2009-05-14 |
| JP5175597B2 (ja) | 2013-04-03 |
| JP2013066232A (ja) | 2013-04-11 |
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