TW200925640A - Radiation detector - Google Patents
Radiation detector Download PDFInfo
- Publication number
- TW200925640A TW200925640A TW097137538A TW97137538A TW200925640A TW 200925640 A TW200925640 A TW 200925640A TW 097137538 A TW097137538 A TW 097137538A TW 97137538 A TW97137538 A TW 97137538A TW 200925640 A TW200925640 A TW 200925640A
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- scintillator layer
- photodetector
- energy range
- scintillator
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title claims description 50
- 239000000853 adhesive Substances 0.000 claims description 31
- 230000001070 adhesive effect Effects 0.000 claims description 31
- 239000000758 substrate Substances 0.000 claims description 18
- 239000000203 mixture Substances 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 abstract 2
- 238000007689 inspection Methods 0.000 description 12
- 238000006243 chemical reaction Methods 0.000 description 9
- 230000000149 penetrating effect Effects 0.000 description 8
- 230000001066 destructive effect Effects 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- PBYZMCDFOULPGH-UHFFFAOYSA-N tungstate Chemical compound [O-][W]([O-])(=O)=O PBYZMCDFOULPGH-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007257961A JP5124227B2 (ja) | 2007-10-01 | 2007-10-01 | 放射線検出器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200925640A true TW200925640A (en) | 2009-06-16 |
Family
ID=40526086
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097137538A TW200925640A (en) | 2007-10-01 | 2008-09-30 | Radiation detector |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5124227B2 (fr) |
| TW (1) | TW200925640A (fr) |
| WO (1) | WO2009044658A1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101937095B (zh) * | 2009-06-30 | 2012-05-09 | 同方威视技术股份有限公司 | 双能x射线探测器及双能x射线探测器阵列装置 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5295915B2 (ja) | 2009-09-18 | 2013-09-18 | 浜松ホトニクス株式会社 | 放射線検出装置 |
| JP5457118B2 (ja) * | 2009-09-18 | 2014-04-02 | 浜松ホトニクス株式会社 | 放射線検出装置 |
| JP5467830B2 (ja) * | 2009-09-18 | 2014-04-09 | 浜松ホトニクス株式会社 | 放射線検出装置 |
| JP5894657B1 (ja) * | 2014-11-14 | 2016-03-30 | 株式会社イシダ | Ｘ線検査装置 |
| CN105806856B (zh) | 2014-12-30 | 2019-02-19 | 清华大学 | 双能射线成像方法和系统 |
| CN105651793B (zh) * | 2016-01-05 | 2019-04-02 | 合肥泰禾光电科技股份有限公司 | 一种克服物体厚度影响的x光检测方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60200189A (ja) * | 1984-03-23 | 1985-10-09 | Toshiba Corp | 放射線検出器 |
| JPS6293679A (ja) * | 1985-10-19 | 1987-04-30 | Fuji Photo Film Co Ltd | オ−トラジオグラフ記録方法およびその方法に用いられる蓄積性蛍光体シ−ト並びに蓄積性蛍光体シ−ト積層体 |
| US6031892A (en) * | 1989-12-05 | 2000-02-29 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
| JP3003738B2 (ja) * | 1992-08-28 | 2000-01-31 | セントラル硝子株式会社 | 樹脂板の接着方法 |
| JP3717530B2 (ja) * | 1993-07-14 | 2005-11-16 | 富士写真フイルム株式会社 | 放射線画像検出器 |
| JPH07120557A (ja) * | 1993-10-27 | 1995-05-12 | Fuji Photo Film Co Ltd | 放射線検出器 |
| JP3805031B2 (ja) * | 1995-10-20 | 2006-08-02 | キヤノン株式会社 | 光電変換装置 |
| JP3880094B2 (ja) * | 1996-02-22 | 2007-02-14 | キヤノン株式会社 | 放射線検出装置及びその製造方法 |
| JPH1184007A (ja) * | 1997-09-11 | 1999-03-26 | Matsushita Electric Ind Co Ltd | Ｘ線センサおよびｘ線検査装置 |
| JP3789646B2 (ja) * | 1998-06-19 | 2006-06-28 | 浜松ホトニクス株式会社 | 放射線イメージセンサ |
| JP2001011411A (ja) * | 1999-07-02 | 2001-01-16 | Toray Ind Inc | 接着剤用組成物 |
| JP4447752B2 (ja) * | 2000-08-03 | 2010-04-07 | 浜松ホトニクス株式会社 | 放射線検出器 |
| US6717150B2 (en) * | 2000-12-12 | 2004-04-06 | Ge Medical Systems Global Technology Company, Llc | Solid-state CT detector modules with improved scintillator/diode coupling |
| US7541264B2 (en) * | 2005-03-01 | 2009-06-02 | Dow Corning Corporation | Temporary wafer bonding method for semiconductor processing |
| JP2006278877A (ja) * | 2005-03-30 | 2006-10-12 | Canon Inc | 放射線撮像装置及びその製造方法 |
| JP2006346011A (ja) * | 2005-06-14 | 2006-12-28 | Canon Inc | 放射線撮像装置及びその制御方法 |
| JP2007084805A (ja) * | 2005-08-23 | 2007-04-05 | Sanyo Chem Ind Ltd | ホットメルト接着剤 |
| JP2007214191A (ja) * | 2006-02-07 | 2007-08-23 | Sumitomo Heavy Ind Ltd | 放射線検出器および放射線検査装置 |
-
2007
- 2007-10-01 JP JP2007257961A patent/JP5124227B2/ja active Active
-
2008
- 2008-09-24 WO PCT/JP2008/067197 patent/WO2009044658A1/fr not_active Ceased
- 2008-09-30 TW TW097137538A patent/TW200925640A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101937095B (zh) * | 2009-06-30 | 2012-05-09 | 同方威视技术股份有限公司 | 双能x射线探测器及双能x射线探测器阵列装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009044658A1 (fr) | 2009-04-09 |
| JP2009085845A (ja) | 2009-04-23 |
| JP5124227B2 (ja) | 2013-01-23 |
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