SU1631759A1 - Method for determining self-filtration of x-ray radiator - Google Patents

Abstract

The invention relates to the field of X-ray technology and can be used to monitor the state of X-ray emitters by determining their own filtration. The purpose of the invention is to improve the accuracy and information content. To do this, at each fixed high voltage setting on the emitter, the effective radiation energy in the emitter beam is measured in a known manner. Then, the high voltage at the radiator is reduced until the measured value of the effective energy corresponds to the initial setting of the high voltage. Then a filter is inserted into the radiator beam and the effective radiation energy in the beam passing through the filter is measured. The thickness of the filter is changed until the effective radiation energy is equal to the value measured at the initial high voltage setting in the radiator beam. This filter thickness corresponds to the value of the intrinsic filtering of radiation at a given high voltage value. 1 silt, (L S

Description

The invention relates to X-ray technology and can be used to monitor the state of X-ray emitters by determining their own filtration.

The purpose of the invention is to improve the accuracy and information content.

The drawing shows the X-ray apparatus used to determine the intrinsic filtration of the X-ray emitter.

The X-ray unit contains an X-ray emitter 1 connected to high voltage sources 2 and filament current 3, unit 4 setting parameters for sources 2 and 3, high-voltage measuring divider 5, high voltage indicator 6, a stepped measuring filter 7 or a set of filters of various thickness inputted into the beam 8 of the radiator 1, and the effective energy meter 9, which includes two detectors 10 and 11 of the radiation located in the beam 8 with different spectral sensitivity, a divider 12 of their signals and an indicator 13, graduated th in kV.

About WITH

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To determine the intrinsic filtration of the X-ray emitter 1 in the X-ray apparatus, the following measurement procedure is carried out,

Using the settings of the unit 4 to set the parameters of the x-ray apparatus, in the absence of the measuring filter 7 in the beam 8, a high voltage is applied to the radiator 1, for example, 70 kV, which is controlled by the meter 6. At the same time, the indicator 13 of the effective energy meter 9, which is in this The case shows, for example, 76 kV. Then, the voltage applied to radiator 1 is reduced until indicator 13 indicates. A filter 7 is introduced into bundle 8, gradually increasing in thickness. In this case, the readings in kV on the indicator 13 will increase. The introduction of filters is stopped when the arrow on the indicator 13 shows 76 kV. After that, the X-ray unit is removed and the thickness of the filter 7 introduced into the beam 8 is measured. In this experiment, for example, its thickness is 2.36 mm aluminum, which is the equivalent value of the intrinsic filtration of the X-ray emitter 1 at 70 kV ..

  In order to obtain a curve for the dependence of the intrinsic filtration of the X-ray emitter 1 on the magnitude of the high voltage, this procedure is repeated for a selected series of high voltage settings.

The proposed method improves the accuracy of determining the value of its own

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filtering the radiator as a result of measurements of directly equivalent filter thickness; increases informativity as a result of the possibility of obtaining the dependence of one's own filtering on high voltage.

Formula of invention

A method for determining the intrinsic filtering of an x-ray emitter based on measuring the radiation output of the emitter at various voltages and filters introduced into the emitter beam, characterized in that, in order to increase the accuracy and informativity, at a fixed high voltage setting on the emitter, the effective energy is measured radiation in the beam, reduce the high voltage on the emitter until the value of the effective radiation energy reaches the value corresponding to the specified a high voltage setpoint, then a filter of such a thickness is inserted into the radiation beam, at which the value of the effective radiation energy in the beam passing through the filter becomes equal to the effective radiation energy measured at the specified fixed high voltage setting, and fixed setpoint. high voltage is judged by the thickness of the injected filter.

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Claims (1)

Claim A method for determining the intrinsic filtration of an x-ray emitter, based on measuring the radiation output of the emitter at various voltages and filters introduced into. the emitter beam, characterized in that, in order to improve accuracy and information content, at a fixed high voltage setting on the emitter, the effective radiation energy in the beam is measured, and the high voltage on the emitter is reduced to. until the value of the effective radiation energy reaches the value corresponding to the specified fixed set point 'of high voltage, then a filter of such thickness is introduced into the radiation beam at which the value of the effective radiation energy in the beam transmitted through the filter becomes equal to the effective radiation energy measured at the specified fixed the high voltage setting, and the value of the emitter’s own filtering, for a given fixed high voltage setting, is judged by the thickness of the introduced filter a.