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SU1464064A1 - Device for deforming specimens for microanalysis of their structure - Google Patents

Device for deforming specimens for microanalysis of their structure Download PDF

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Publication number
SU1464064A1
SU1464064A1 SU874258421A SU4258421A SU1464064A1 SU 1464064 A1 SU1464064 A1 SU 1464064A1 SU 874258421 A SU874258421 A SU 874258421A SU 4258421 A SU4258421 A SU 4258421A SU 1464064 A1 SU1464064 A1 SU 1464064A1
Authority
SU
USSR - Soviet Union
Prior art keywords
traverse
microanalysis
active
stops
spring
Prior art date
Application number
SU874258421A
Other languages
Russian (ru)
Inventor
Владимир Иванович Суворов
Николай Леонидович Соловьев
Original Assignee
Калининский политехнический институт
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Калининский политехнический институт filed Critical Калининский политехнический институт
Priority to SU874258421A priority Critical patent/SU1464064A1/en
Application granted granted Critical
Publication of SU1464064A1 publication Critical patent/SU1464064A1/en

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  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

Изобретение относитс  к испытательной технике, а именно к исследованию структуры материала образцов в процессе их нагружени . Целью изобретени   вл етс  повышение точности испытаний. Устройство состоит из основани  1, пассивного захвата 2, активного захвата Т2, тарированной пружины 9, установленной на центрирующих конусных опорах 10 . и 11, одна из которых св зана с активным захватом 12, и средства сжати  пружины. Образец деформируетс  . усилием сжати  или изгиба, пропорциональным измер емому перемещению сжа ти  пружины. 2 ил.The invention relates to a testing technique, in particular to the study of the structure of the material of the samples during their loading. The aim of the invention is to improve the accuracy of the tests. The device consists of a base 1, a passive grip 2, an active grip T2, a calibrated spring 9 mounted on the centering taper supports 10. and 11, one of which is associated with an active gripper 12, and means for compressing the spring. The sample is deformed. compression or bending force proportional to the measured displacement of the spring compression. 2 Il.

Description

фиг. гFIG. g

Claims (1)

Формула изобретенияClaim Устройство для деформирования образцов при проведении микроанализа их структуры, содержащее предназначенное для размещения на предметном столе микроскопа основание, установленные на нем пассивный и активный захваты и нагружатель, отличающееся тем, что, с целью повышения точности за счет нагружения образца контролируемым усилием сжатия или изгиба, нагружатель выполнен в виде двух соединенных между собой колоннами траверс, одна из которых жестко закреплена на основании, а другая имеет привод ее перемещения вдоль колонн, двух соосных конусных упоров, один из которых установлен на подвижной траверсе, и размещенной между конусными упорами цилиндрической тарированной пружины, устройство снабжено установленной на неподвижной траверсе направляющей втулкой, ось которой совпадает с осью конусных упоров, а активный захват размещен в полости втулки и соединен с вторым конусным упором.A device for deforming samples during microanalysis of their structure, containing a base designed for placement on a microscope stage, passive and active grippers and a loader installed on it, characterized in that, in order to increase accuracy by loading the sample with a controlled compression or bending force, the loader made in the form of two traverse connected by columns, one of which is rigidly fixed to the base, and the other has a drive for its movement along the columns, two coaxial The main stops, one of which is mounted on a movable traverse, and placed between the conical stops of the tared spring, the device is equipped with a guide sleeve mounted on the fixed traverse, the axis of which coincides with the axis of the conical stops, and the active grip is placed in the cavity of the sleeve and connected to the second conical stop . 1 Ή, 4Oh41 Ή, 4Oh4
SU874258421A 1987-06-08 1987-06-08 Device for deforming specimens for microanalysis of their structure SU1464064A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU874258421A SU1464064A1 (en) 1987-06-08 1987-06-08 Device for deforming specimens for microanalysis of their structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU874258421A SU1464064A1 (en) 1987-06-08 1987-06-08 Device for deforming specimens for microanalysis of their structure

Publications (1)

Publication Number Publication Date
SU1464064A1 true SU1464064A1 (en) 1989-03-07

Family

ID=21309471

Family Applications (1)

Application Number Title Priority Date Filing Date
SU874258421A SU1464064A1 (en) 1987-06-08 1987-06-08 Device for deforming specimens for microanalysis of their structure

Country Status (1)

Country Link
SU (1) SU1464064A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2189025C1 (en) * 2001-01-11 2002-09-10 Кондращенко Валерий Иванович Specimen strength tester

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Авторское свидетельство СССР 9 322686, кл. G 01 N 3/04, 1972. *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2189025C1 (en) * 2001-01-11 2002-09-10 Кондращенко Валерий Иванович Specimen strength tester

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