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SG32591G - Testing apparatus - Google Patents

Testing apparatus

Info

Publication number
SG32591G
SG32591G SG325/91A SG32591A SG32591G SG 32591 G SG32591 G SG 32591G SG 325/91 A SG325/91 A SG 325/91A SG 32591 A SG32591 A SG 32591A SG 32591 G SG32591 G SG 32591G
Authority
SG
Singapore
Prior art keywords
testing apparatus
testing
Prior art date
Application number
SG325/91A
Original Assignee
Mars Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mars Inc filed Critical Mars Inc
Publication of SG32591G publication Critical patent/SG32591G/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
SG325/91A 1984-04-16 1991-05-02 Testing apparatus SG32591G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB848409794A GB8409794D0 (en) 1984-04-16 1984-04-16 Testing apparatus

Publications (1)

Publication Number Publication Date
SG32591G true SG32591G (en) 1991-06-21

Family

ID=10559700

Family Applications (1)

Application Number Title Priority Date Filing Date
SG325/91A SG32591G (en) 1984-04-16 1991-05-02 Testing apparatus

Country Status (4)

Country Link
JP (1) JPS6117074A (en)
KR (1) KR850007309A (en)
GB (1) GB8409794D0 (en)
SG (1) SG32591G (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100506287B1 (en) * 1998-02-11 2005-11-11 삼성전자주식회사 Short presence tester and method

Also Published As

Publication number Publication date
KR850007309A (en) 1985-12-02
GB8409794D0 (en) 1984-05-23
JPS6117074A (en) 1986-01-25

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