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GB0126232D0 - Calibration of an analogue probe - Google Patents

Calibration of an analogue probe

Info

Publication number
GB0126232D0
GB0126232D0 GBGB0126232.8A GB0126232A GB0126232D0 GB 0126232 D0 GB0126232 D0 GB 0126232D0 GB 0126232 A GB0126232 A GB 0126232A GB 0126232 D0 GB0126232 D0 GB 0126232D0
Authority
GB
United Kingdom
Prior art keywords
calibration
analogue probe
analogue
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0126232.8A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9924946&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=GB0126232(D0) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Renishaw PLC filed Critical Renishaw PLC
Priority to GBGB0126232.8A priority Critical patent/GB0126232D0/en
Publication of GB0126232D0 publication Critical patent/GB0126232D0/en
Priority to JP2003540600A priority patent/JP2005507495A/ja
Priority to EP02779650A priority patent/EP1440286B1/fr
Priority to PCT/GB2002/004936 priority patent/WO2003038375A1/fr
Priority to US10/493,143 priority patent/US7055367B2/en
Priority to CN02822063.3A priority patent/CN1278095C/zh
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GBGB0126232.8A 2001-11-01 2001-11-01 Calibration of an analogue probe Ceased GB0126232D0 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GBGB0126232.8A GB0126232D0 (en) 2001-11-01 2001-11-01 Calibration of an analogue probe
JP2003540600A JP2005507495A (ja) 2001-11-01 2002-11-01 プローブの較正方法
EP02779650A EP1440286B1 (fr) 2001-11-01 2002-11-01 Etalonnage d'une sonde
PCT/GB2002/004936 WO2003038375A1 (fr) 2001-11-01 2002-11-01 Etalonnage d'une sonde
US10/493,143 US7055367B2 (en) 2001-11-01 2002-11-01 Calibration of a probe
CN02822063.3A CN1278095C (zh) 2001-11-01 2002-11-01 探针的校准

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0126232.8A GB0126232D0 (en) 2001-11-01 2001-11-01 Calibration of an analogue probe

Publications (1)

Publication Number Publication Date
GB0126232D0 true GB0126232D0 (en) 2002-01-02

Family

ID=9924946

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB0126232.8A Ceased GB0126232D0 (en) 2001-11-01 2001-11-01 Calibration of an analogue probe

Country Status (6)

Country Link
US (1) US7055367B2 (fr)
EP (1) EP1440286B1 (fr)
JP (1) JP2005507495A (fr)
CN (1) CN1278095C (fr)
GB (1) GB0126232D0 (fr)
WO (1) WO2003038375A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108613651A (zh) * 2018-06-26 2018-10-02 重庆市计量质量检测研究院 三坐标测量机快速检测装置及方法
CN113804297A (zh) * 2021-08-27 2021-12-17 上海应用技术大学 一种用于多通道rgb颜色校准的协同方法及协同装置

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JP5276803B2 (ja) * 2007-06-11 2013-08-28 パナソニック株式会社 形状測定方法
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JP6735735B2 (ja) * 2014-09-02 2020-08-05 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ ワークピースを検査するための座標測定方法および同装置であって、理想的な形態から実質的に逸脱していないことが判っている基準形状を使用して測定補正値を生成するステップを含む、ワークピースを検査するための座標測定方法および同装置
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CN108613651A (zh) * 2018-06-26 2018-10-02 重庆市计量质量检测研究院 三坐标测量机快速检测装置及方法
CN113804297A (zh) * 2021-08-27 2021-12-17 上海应用技术大学 一种用于多通道rgb颜色校准的协同方法及协同装置
CN113804297B (zh) * 2021-08-27 2023-09-19 上海应用技术大学 一种用于多通道rgb颜色校准的协同方法及协同装置

Also Published As

Publication number Publication date
EP1440286A1 (fr) 2004-07-28
CN1582384A (zh) 2005-02-16
US20040244464A1 (en) 2004-12-09
US7055367B2 (en) 2006-06-06
JP2005507495A (ja) 2005-03-17
WO2003038375A1 (fr) 2003-05-08
EP1440286B1 (fr) 2013-02-27
CN1278095C (zh) 2006-10-04

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