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FR3031748B1 - Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs - Google Patents

Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs Download PDF

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Publication number
FR3031748B1
FR3031748B1 FR1550463A FR1550463A FR3031748B1 FR 3031748 B1 FR3031748 B1 FR 3031748B1 FR 1550463 A FR1550463 A FR 1550463A FR 1550463 A FR1550463 A FR 1550463A FR 3031748 B1 FR3031748 B1 FR 3031748B1
Authority
FR
France
Prior art keywords
ordinated
reducing
block copolymer
assembly time
copolymer films
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1550463A
Other languages
English (en)
Other versions
FR3031748A1 (fr
Inventor
Christophe Navarro
Xavier Chevalier
Celia Nicolet
Raber Inoubli
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Arkema France SA
Original Assignee
Arkema France SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR1550463A priority Critical patent/FR3031748B1/fr
Application filed by Arkema France SA filed Critical Arkema France SA
Priority to EP16703593.0A priority patent/EP3248064A1/fr
Priority to TW105101875A priority patent/TWI631170B/zh
Priority to JP2017537916A priority patent/JP2018505275A/ja
Priority to SG11201705897YA priority patent/SG11201705897YA/en
Priority to KR1020177023117A priority patent/KR20170118743A/ko
Priority to PCT/FR2016/050116 priority patent/WO2016116708A1/fr
Priority to US15/545,134 priority patent/US20180015645A1/en
Priority to CN201680017300.8A priority patent/CN107430330A/zh
Publication of FR3031748A1 publication Critical patent/FR3031748A1/fr
Application granted granted Critical
Publication of FR3031748B1 publication Critical patent/FR3031748B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C41/00Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor
    • B29C41/003Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor characterised by the choice of material
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C41/00Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor
    • B29C41/34Component parts, details or accessories; Auxiliary operations
    • B29C41/46Heating or cooling
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L53/00Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/50Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29KINDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2105/00Condition, form or state of moulded material or of the material to be shaped
    • B29K2105/0085Copolymers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29LINDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
    • B29L2011/00Optical elements, e.g. lenses, prisms
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2353/00Characterised by the use of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2453/00Characterised by the use of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Derivatives of such polymers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Laminated Bodies (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
  • Processes Of Treating Macromolecular Substances (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
FR1550463A 2015-01-21 2015-01-21 Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs Expired - Fee Related FR3031748B1 (fr)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FR1550463A FR3031748B1 (fr) 2015-01-21 2015-01-21 Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs
TW105101875A TWI631170B (zh) 2015-01-21 2016-01-21 減低嵌段共聚物的有序膜之組裝時間的方法
JP2017537916A JP2018505275A (ja) 2015-01-21 2016-01-21 ブロックコポリマーの秩序膜の組織化時間を短縮するための方法
SG11201705897YA SG11201705897YA (en) 2015-01-21 2016-01-21 Method for reducing the assembly time of ordered films made of block copolymer
EP16703593.0A EP3248064A1 (fr) 2015-01-21 2016-01-21 Procédé de réduction du temps d'assemblage des films ordonnes de copolymère a blocs
KR1020177023117A KR20170118743A (ko) 2015-01-21 2016-01-21 블록 공중합체로 제조된 질서화된 필름의 어셈블리 시간을 감소시키는 방법
PCT/FR2016/050116 WO2016116708A1 (fr) 2015-01-21 2016-01-21 Procédé de réduction du temps d'assemblage des films ordonnes de copolymère a blocs
US15/545,134 US20180015645A1 (en) 2015-01-21 2016-01-21 Process for Reducing the Assembly Time of Ordered Films of Block Copolymer
CN201680017300.8A CN107430330A (zh) 2015-01-21 2016-01-21 用于减少由嵌段共聚物制成的有序膜的组装时间的方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1550463 2015-01-21
FR1550463A FR3031748B1 (fr) 2015-01-21 2015-01-21 Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs

Publications (2)

Publication Number Publication Date
FR3031748A1 FR3031748A1 (fr) 2016-07-22
FR3031748B1 true FR3031748B1 (fr) 2018-09-28

Family

ID=53298499

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1550463A Expired - Fee Related FR3031748B1 (fr) 2015-01-21 2015-01-21 Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs

Country Status (9)

Country Link
US (1) US20180015645A1 (fr)
EP (1) EP3248064A1 (fr)
JP (1) JP2018505275A (fr)
KR (1) KR20170118743A (fr)
CN (1) CN107430330A (fr)
FR (1) FR3031748B1 (fr)
SG (1) SG11201705897YA (fr)
TW (1) TWI631170B (fr)
WO (1) WO2016116708A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12319810B2 (en) 2019-01-17 2025-06-03 Merck Patent Gmbh Enhanced directed self-assembly in the presence of low Tg oligomers for pattern formation

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4127682B2 (ja) * 1999-06-07 2008-07-30 株式会社東芝 パターン形成方法
JP3940546B2 (ja) * 1999-06-07 2007-07-04 株式会社東芝 パターン形成方法およびパターン形成材料
US8133534B2 (en) * 2004-11-22 2012-03-13 Wisconsin Alumni Research Foundation Methods and compositions for forming patterns with isolated or discrete features using block copolymer materials
FR2911609B1 (fr) * 2007-01-19 2009-03-06 Rhodia Recherches & Tech Copolymere dibloc comprenant des unites derivant du styrene et des unites derivant d'acide acrylique
JP2008231233A (ja) * 2007-03-20 2008-10-02 Kyoto Univ 高分子薄膜、パターン基板、磁気記録用パターン媒体及びこれらの製造方法
KR20090083091A (ko) * 2008-01-29 2009-08-03 삼성전자주식회사 블록 공중합체를 이용한 미세 패턴 형성 방법
US8425982B2 (en) * 2008-03-21 2013-04-23 Micron Technology, Inc. Methods of improving long range order in self-assembly of block copolymer films with ionic liquids
JP5281386B2 (ja) * 2008-12-22 2013-09-04 株式会社日立製作所 高分子薄膜及びパターン媒体並びにこれらの製造方法
US8821978B2 (en) * 2009-12-18 2014-09-02 International Business Machines Corporation Methods of directed self-assembly and layered structures formed therefrom
FR2983773B1 (fr) 2011-12-09 2014-10-24 Arkema France Procede de preparation de surfaces
US8513356B1 (en) * 2012-02-10 2013-08-20 Dow Global Technologies Llc Diblock copolymer blend composition
JP5887244B2 (ja) * 2012-09-28 2016-03-16 富士フイルム株式会社 パターン形成用自己組織化組成物、それを用いたブロックコポリマーの自己組織化によるパターン形成方法、及び自己組織化パターン、並びに電子デバイスの製造方法
US20140377965A1 (en) * 2013-06-19 2014-12-25 Globalfoundries Inc. Directed self-assembly (dsa) formulations used to form dsa-based lithography films
FR3031749B1 (fr) * 2015-01-21 2018-09-28 Arkema France Procede d'amelioration de l'uniformite de dimension critique de films ordonnes de copolymeres a blocs
FR3031751B1 (fr) * 2015-01-21 2018-10-05 Arkema France Procede de reduction des defauts dans un film ordonne de copolymere a blocs
FR3031750B1 (fr) * 2015-01-21 2018-09-28 Arkema France Procede d'obtention de films ordonnes epais et de periodes elevees comprenant un copolymere a blocs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12319810B2 (en) 2019-01-17 2025-06-03 Merck Patent Gmbh Enhanced directed self-assembly in the presence of low Tg oligomers for pattern formation

Also Published As

Publication number Publication date
US20180015645A1 (en) 2018-01-18
WO2016116708A1 (fr) 2016-07-28
JP2018505275A (ja) 2018-02-22
EP3248064A1 (fr) 2017-11-29
TW201641581A (zh) 2016-12-01
TWI631170B (zh) 2018-08-01
SG11201705897YA (en) 2017-08-30
FR3031748A1 (fr) 2016-07-22
CN107430330A (zh) 2017-12-01
KR20170118743A (ko) 2017-10-25

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