FR3031748B1 - Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs - Google Patents
Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs Download PDFInfo
- Publication number
- FR3031748B1 FR3031748B1 FR1550463A FR1550463A FR3031748B1 FR 3031748 B1 FR3031748 B1 FR 3031748B1 FR 1550463 A FR1550463 A FR 1550463A FR 1550463 A FR1550463 A FR 1550463A FR 3031748 B1 FR3031748 B1 FR 3031748B1
- Authority
- FR
- France
- Prior art keywords
- ordinated
- reducing
- block copolymer
- assembly time
- copolymer films
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 229920001400 block copolymer Polymers 0.000 title 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C41/00—Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor
- B29C41/003—Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor characterised by the choice of material
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C41/00—Shaping by coating a mould, core or other substrate, i.e. by depositing material and stripping-off the shaped article; Apparatus therefor
- B29C41/34—Component parts, details or accessories; Auxiliary operations
- B29C41/46—Heating or cooling
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L53/00—Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2105/00—Condition, form or state of moulded material or of the material to be shaped
- B29K2105/0085—Copolymers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2011/00—Optical elements, e.g. lenses, prisms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2353/00—Characterised by the use of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Derivatives of such polymers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2453/00—Characterised by the use of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Derivatives of such polymers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Laminated Bodies (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Processes Of Treating Macromolecular Substances (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1550463A FR3031748B1 (fr) | 2015-01-21 | 2015-01-21 | Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs |
| TW105101875A TWI631170B (zh) | 2015-01-21 | 2016-01-21 | 減低嵌段共聚物的有序膜之組裝時間的方法 |
| JP2017537916A JP2018505275A (ja) | 2015-01-21 | 2016-01-21 | ブロックコポリマーの秩序膜の組織化時間を短縮するための方法 |
| SG11201705897YA SG11201705897YA (en) | 2015-01-21 | 2016-01-21 | Method for reducing the assembly time of ordered films made of block copolymer |
| EP16703593.0A EP3248064A1 (fr) | 2015-01-21 | 2016-01-21 | Procédé de réduction du temps d'assemblage des films ordonnes de copolymère a blocs |
| KR1020177023117A KR20170118743A (ko) | 2015-01-21 | 2016-01-21 | 블록 공중합체로 제조된 질서화된 필름의 어셈블리 시간을 감소시키는 방법 |
| PCT/FR2016/050116 WO2016116708A1 (fr) | 2015-01-21 | 2016-01-21 | Procédé de réduction du temps d'assemblage des films ordonnes de copolymère a blocs |
| US15/545,134 US20180015645A1 (en) | 2015-01-21 | 2016-01-21 | Process for Reducing the Assembly Time of Ordered Films of Block Copolymer |
| CN201680017300.8A CN107430330A (zh) | 2015-01-21 | 2016-01-21 | 用于减少由嵌段共聚物制成的有序膜的组装时间的方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1550463 | 2015-01-21 | ||
| FR1550463A FR3031748B1 (fr) | 2015-01-21 | 2015-01-21 | Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR3031748A1 FR3031748A1 (fr) | 2016-07-22 |
| FR3031748B1 true FR3031748B1 (fr) | 2018-09-28 |
Family
ID=53298499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR1550463A Expired - Fee Related FR3031748B1 (fr) | 2015-01-21 | 2015-01-21 | Procede de reduction du temps d'assemblage des films ordones de copolymere a blocs |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US20180015645A1 (fr) |
| EP (1) | EP3248064A1 (fr) |
| JP (1) | JP2018505275A (fr) |
| KR (1) | KR20170118743A (fr) |
| CN (1) | CN107430330A (fr) |
| FR (1) | FR3031748B1 (fr) |
| SG (1) | SG11201705897YA (fr) |
| TW (1) | TWI631170B (fr) |
| WO (1) | WO2016116708A1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12319810B2 (en) | 2019-01-17 | 2025-06-03 | Merck Patent Gmbh | Enhanced directed self-assembly in the presence of low Tg oligomers for pattern formation |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4127682B2 (ja) * | 1999-06-07 | 2008-07-30 | 株式会社東芝 | パターン形成方法 |
| JP3940546B2 (ja) * | 1999-06-07 | 2007-07-04 | 株式会社東芝 | パターン形成方法およびパターン形成材料 |
| US8133534B2 (en) * | 2004-11-22 | 2012-03-13 | Wisconsin Alumni Research Foundation | Methods and compositions for forming patterns with isolated or discrete features using block copolymer materials |
| FR2911609B1 (fr) * | 2007-01-19 | 2009-03-06 | Rhodia Recherches & Tech | Copolymere dibloc comprenant des unites derivant du styrene et des unites derivant d'acide acrylique |
| JP2008231233A (ja) * | 2007-03-20 | 2008-10-02 | Kyoto Univ | 高分子薄膜、パターン基板、磁気記録用パターン媒体及びこれらの製造方法 |
| KR20090083091A (ko) * | 2008-01-29 | 2009-08-03 | 삼성전자주식회사 | 블록 공중합체를 이용한 미세 패턴 형성 방법 |
| US8425982B2 (en) * | 2008-03-21 | 2013-04-23 | Micron Technology, Inc. | Methods of improving long range order in self-assembly of block copolymer films with ionic liquids |
| JP5281386B2 (ja) * | 2008-12-22 | 2013-09-04 | 株式会社日立製作所 | 高分子薄膜及びパターン媒体並びにこれらの製造方法 |
| US8821978B2 (en) * | 2009-12-18 | 2014-09-02 | International Business Machines Corporation | Methods of directed self-assembly and layered structures formed therefrom |
| FR2983773B1 (fr) | 2011-12-09 | 2014-10-24 | Arkema France | Procede de preparation de surfaces |
| US8513356B1 (en) * | 2012-02-10 | 2013-08-20 | Dow Global Technologies Llc | Diblock copolymer blend composition |
| JP5887244B2 (ja) * | 2012-09-28 | 2016-03-16 | 富士フイルム株式会社 | パターン形成用自己組織化組成物、それを用いたブロックコポリマーの自己組織化によるパターン形成方法、及び自己組織化パターン、並びに電子デバイスの製造方法 |
| US20140377965A1 (en) * | 2013-06-19 | 2014-12-25 | Globalfoundries Inc. | Directed self-assembly (dsa) formulations used to form dsa-based lithography films |
| FR3031749B1 (fr) * | 2015-01-21 | 2018-09-28 | Arkema France | Procede d'amelioration de l'uniformite de dimension critique de films ordonnes de copolymeres a blocs |
| FR3031751B1 (fr) * | 2015-01-21 | 2018-10-05 | Arkema France | Procede de reduction des defauts dans un film ordonne de copolymere a blocs |
| FR3031750B1 (fr) * | 2015-01-21 | 2018-09-28 | Arkema France | Procede d'obtention de films ordonnes epais et de periodes elevees comprenant un copolymere a blocs |
-
2015
- 2015-01-21 FR FR1550463A patent/FR3031748B1/fr not_active Expired - Fee Related
-
2016
- 2016-01-21 TW TW105101875A patent/TWI631170B/zh not_active IP Right Cessation
- 2016-01-21 WO PCT/FR2016/050116 patent/WO2016116708A1/fr not_active Ceased
- 2016-01-21 EP EP16703593.0A patent/EP3248064A1/fr not_active Withdrawn
- 2016-01-21 SG SG11201705897YA patent/SG11201705897YA/en unknown
- 2016-01-21 CN CN201680017300.8A patent/CN107430330A/zh active Pending
- 2016-01-21 US US15/545,134 patent/US20180015645A1/en not_active Abandoned
- 2016-01-21 KR KR1020177023117A patent/KR20170118743A/ko not_active Ceased
- 2016-01-21 JP JP2017537916A patent/JP2018505275A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12319810B2 (en) | 2019-01-17 | 2025-06-03 | Merck Patent Gmbh | Enhanced directed self-assembly in the presence of low Tg oligomers for pattern formation |
Also Published As
| Publication number | Publication date |
|---|---|
| US20180015645A1 (en) | 2018-01-18 |
| WO2016116708A1 (fr) | 2016-07-28 |
| JP2018505275A (ja) | 2018-02-22 |
| EP3248064A1 (fr) | 2017-11-29 |
| TW201641581A (zh) | 2016-12-01 |
| TWI631170B (zh) | 2018-08-01 |
| SG11201705897YA (en) | 2017-08-30 |
| FR3031748A1 (fr) | 2016-07-22 |
| CN107430330A (zh) | 2017-12-01 |
| KR20170118743A (ko) | 2017-10-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PLFP | Fee payment |
Year of fee payment: 2 |
|
| PLSC | Search report ready |
Effective date: 20160722 |
|
| PLFP | Fee payment |
Year of fee payment: 3 |
|
| PLFP | Fee payment |
Year of fee payment: 4 |
|
| PLFP | Fee payment |
Year of fee payment: 6 |
|
| ST | Notification of lapse |
Effective date: 20210905 |