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FI20031765A0 - Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi - Google Patents

Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi

Info

Publication number
FI20031765A0
FI20031765A0 FI20031765A FI20031765A FI20031765A0 FI 20031765 A0 FI20031765 A0 FI 20031765A0 FI 20031765 A FI20031765 A FI 20031765A FI 20031765 A FI20031765 A FI 20031765A FI 20031765 A0 FI20031765 A0 FI 20031765A0
Authority
FI
Finland
Prior art keywords
arrangement
electronic device
performing testing
testing
electronic
Prior art date
Application number
FI20031765A
Other languages
English (en)
Swedish (sv)
Other versions
FI117578B (fi
FI20031765L (fi
Inventor
Toomas Tiismaa
Original Assignee
Jot Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jot Automation Oy filed Critical Jot Automation Oy
Priority to FI20031765A priority Critical patent/FI117578B/fi
Publication of FI20031765A0 publication Critical patent/FI20031765A0/fi
Priority to PCT/FI2004/000731 priority patent/WO2005054877A1/en
Publication of FI20031765L publication Critical patent/FI20031765L/fi
Application granted granted Critical
Publication of FI117578B publication Critical patent/FI117578B/fi

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FI20031765A 2003-12-03 2003-12-03 Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi FI117578B (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20031765A FI117578B (fi) 2003-12-03 2003-12-03 Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi
PCT/FI2004/000731 WO2005054877A1 (en) 2003-12-03 2004-12-02 Method and arrangement for testing an electronic device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20031765A FI117578B (fi) 2003-12-03 2003-12-03 Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi
FI20031765 2003-12-03

Publications (3)

Publication Number Publication Date
FI20031765A0 true FI20031765A0 (fi) 2003-12-03
FI20031765L FI20031765L (fi) 2005-06-04
FI117578B FI117578B (fi) 2006-11-30

Family

ID=29763464

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20031765A FI117578B (fi) 2003-12-03 2003-12-03 Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi

Country Status (2)

Country Link
FI (1) FI117578B (fi)
WO (1) WO2005054877A1 (fi)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101341411B (zh) * 2005-12-20 2012-11-21 若特自动控制公司 测试适配器
FI122041B (fi) * 2008-09-18 2011-07-29 Jot Automation Oy Testiadapterikonfiguraatio
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
CN102331427A (zh) * 2011-08-30 2012-01-25 常州天合光能有限公司 太阳电池组件隐形裂纹测试方法
CN104067600B (zh) * 2012-02-01 2017-05-03 埃科亚特姆公司 用于回收电子设备的方法与装置
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
CA3081497C (en) 2014-10-02 2025-10-07 Ecoatm Llc Wireless-enabled kiosk for recycling consumer devices
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
EP3968255A1 (en) 2014-10-31 2022-03-16 ecoATM, LLC Systems and methods for recycling consumer electronic devices
CN109061237B (zh) * 2018-08-03 2022-05-17 中国航空工业集团公司雷华电子技术研究所 一种用于微波模块准确测试的自动装夹通用装置
US12322259B2 (en) 2018-12-19 2025-06-03 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
WO2020167846A1 (en) 2019-02-12 2020-08-20 Ecoatm, Llc Kiosk for evaluating and purchasing used electronic devices
CN211956539U (zh) 2019-02-18 2020-11-17 埃科亚特姆公司 用于评估电子设备状况的系统
CN115581122A (zh) 2019-12-18 2023-01-06 埃科亚特姆公司 用于贩售和/或购买移动电话和其他电子设备的系统和方法
US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
CN117121069A (zh) 2020-08-17 2023-11-24 埃科亚特姆公司 用于电子设备自助服务终端的连接器载体
WO2022047473A1 (en) 2020-08-25 2022-03-03 Ecoatm, Llc Evaluating and recycling electronic devices
CA3226383A1 (en) 2021-07-09 2023-01-12 Ecoatm, Llc Identifying electronic devices using temporally changing information

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6170329B1 (en) * 1999-06-14 2001-01-09 Agilent Technologies, Inc. Test fixture customization adapter enclosure
US6828773B2 (en) * 2002-03-21 2004-12-07 Agilent Technologies, Inc. Adapter method and apparatus for interfacing a tester with a device under test

Also Published As

Publication number Publication date
FI117578B (fi) 2006-11-30
FI20031765L (fi) 2005-06-04
WO2005054877A1 (en) 2005-06-16

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