EP2791618A4 - Caractérisation de surface sans contact utilisant un éclairage modulé - Google Patents
Caractérisation de surface sans contact utilisant un éclairage moduléInfo
- Publication number
- EP2791618A4 EP2791618A4 EP11879165.6A EP11879165A EP2791618A4 EP 2791618 A4 EP2791618 A4 EP 2791618A4 EP 11879165 A EP11879165 A EP 11879165A EP 2791618 A4 EP2791618 A4 EP 2791618A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- contact surface
- modulated illumination
- surface characterization
- characterization
- modulated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2011/064417 WO2013105922A2 (fr) | 2011-12-12 | 2011-12-12 | Caractérisation de surface sans contact utilisant un éclairage modulé |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2791618A2 EP2791618A2 (fr) | 2014-10-22 |
| EP2791618A4 true EP2791618A4 (fr) | 2015-07-29 |
Family
ID=48782047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP11879165.6A Withdrawn EP2791618A4 (fr) | 2011-12-12 | 2011-12-12 | Caractérisation de surface sans contact utilisant un éclairage modulé |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP2791618A4 (fr) |
| JP (1) | JP2015505039A (fr) |
| WO (1) | WO2013105922A2 (fr) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014125037A1 (fr) | 2013-02-13 | 2014-08-21 | 3Shape A/S | Couleur d'enregistrement d'appareil de balayage à focalisation |
| DE102013218231A1 (de) * | 2013-09-11 | 2015-03-12 | Sirona Dental Systems Gmbh | Optisches System zur Erzeugung eines sich zeitlich ändernden Musters für ein Konfokalmikroskop |
| CN106796160B (zh) * | 2014-08-15 | 2021-01-12 | 齐戈股份有限公司 | 透镜和透镜模具的光学评价 |
| TWI702732B (zh) * | 2014-10-20 | 2020-08-21 | 加拿大商奧羅拉太陽能技術(加拿大)有限公司 | 量測資料對生產工具位置及處理批次或時間的映射 |
| DE102015209402A1 (de) * | 2015-05-22 | 2016-11-24 | Sirona Dental Systems Gmbh | Vorrichtung zur optischen 3D-Vermessung eines Objekts |
| KR101677585B1 (ko) * | 2015-05-27 | 2016-11-18 | 선문대학교 산학협력단 | 고속 초점위치 이동을 위해 다중파장 광원을 이용하는 3차원 형상 측정장치 |
| JP6627871B2 (ja) * | 2015-06-08 | 2020-01-08 | 株式会社ニコン | 構造化照明顕微鏡システム、方法及びプログラム |
| US10445894B2 (en) * | 2016-05-11 | 2019-10-15 | Mitutoyo Corporation | Non-contact 3D measuring system |
| JP7086330B2 (ja) * | 2017-10-06 | 2022-06-20 | アドバンスド スキャナーズ,インコーポレイテッド | 物体の三次元モデルを形成するための1つ又は複数の光度エッジの生成 |
| CN112804513B (zh) * | 2021-01-05 | 2023-02-17 | 暨南大学 | 一种光场相机及成像方法 |
| TW202509451A (zh) * | 2022-10-14 | 2025-03-01 | 美商賽博光學股份有限公司 | 同步調變、選通和積分三維感測器 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1471327A2 (fr) * | 2003-03-31 | 2004-10-27 | Mitutoyo Corporation | Procédé et appareil pour la mesure sans contact de surfaces trois dimensionelles |
| US20090103103A1 (en) * | 2007-10-18 | 2009-04-23 | Mht Optic Research Ag | Device for tomographic scanning objects |
| US20110287387A1 (en) * | 2009-04-16 | 2011-11-24 | Carestream Health, Inc. | System and method for detecting tooth cracks |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5837507U (ja) * | 1981-09-08 | 1983-03-11 | 株式会社リコー | 曲面度検査器 |
| DK0888522T3 (da) * | 1996-03-22 | 2001-08-27 | Univ Loughborough | Fremgangsmåde og apparatur til måling af formen af genstande |
| JP3616999B2 (ja) * | 2001-12-04 | 2005-02-02 | レーザーテック株式会社 | コンフォーカル顕微鏡 |
| JP2006276561A (ja) * | 2005-03-30 | 2006-10-12 | Hamamatsu Univ School Of Medicine | ファイバ共焦点顕微鏡における生体用対物レンズ |
| JP5018076B2 (ja) * | 2006-12-22 | 2012-09-05 | ソニー株式会社 | 光造形装置及び光造形方法 |
| WO2008151266A2 (fr) * | 2007-06-05 | 2008-12-11 | Zygo Corporation | Interférométrie pour déterminer des caractéristiques de la surface d'un objet à l'aide d'un éclairage spatialement cohérent |
| WO2009149178A1 (fr) * | 2008-06-05 | 2009-12-10 | Trustees Of Boston University | Système et procédé pour produire une image à section optique utilisant à la fois un éclairage structuré et un éclairage uniforme |
| US7978346B1 (en) * | 2009-02-18 | 2011-07-12 | University Of Central Florida Research Foundation, Inc. | Methods and systems for realizing high resolution three-dimensional optical imaging |
| WO2010145669A1 (fr) * | 2009-06-17 | 2010-12-23 | 3Shape A/S | Appareil d'exploration à focalisation |
| KR101080382B1 (ko) * | 2009-09-15 | 2011-11-04 | 광주과학기술원 | 공초점 레이저 주사 현미경 |
| JP4666272B1 (ja) * | 2009-10-19 | 2011-04-06 | 住友金属工業株式会社 | 板材の平坦度測定方法及びこれを用いた鋼板の製造方法 |
| EP2327956B1 (fr) * | 2009-11-20 | 2014-01-22 | Mitutoyo Corporation | Procédé et appareil pour déterminer la hauteur d'un nombre de positions spatiales sur un échantillon |
-
2011
- 2011-12-12 EP EP11879165.6A patent/EP2791618A4/fr not_active Withdrawn
- 2011-12-12 JP JP2014545870A patent/JP2015505039A/ja active Pending
- 2011-12-12 WO PCT/US2011/064417 patent/WO2013105922A2/fr not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1471327A2 (fr) * | 2003-03-31 | 2004-10-27 | Mitutoyo Corporation | Procédé et appareil pour la mesure sans contact de surfaces trois dimensionelles |
| US20090103103A1 (en) * | 2007-10-18 | 2009-04-23 | Mht Optic Research Ag | Device for tomographic scanning objects |
| US20110287387A1 (en) * | 2009-04-16 | 2011-11-24 | Carestream Health, Inc. | System and method for detecting tooth cracks |
Non-Patent Citations (2)
| Title |
|---|
| ISHIHARA M ET AL: "THREE-DIMENSIONAL SURFACE MEASUREMENT USING GRATING PROJECTION METHOD BY DETECTING PHASE AND CONTRAST", PROCEEDINGS OF SPIE, S P I E - INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, US, vol. 3740, 1 January 1999 (1999-01-01), pages 114 - 117, XP000913843, ISSN: 0277-786X, DOI: 10.1117/12.347778 * |
| KLAUS KÖRNER ET AL: "One-grating projection for absolute three-dimensional profiling", OPTICAL ENGINEERING, SOC. OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, BELLINGHAM, vol. 40, no. 8, 1 August 2001 (2001-08-01), pages 1653 - 1660, XP002505180, ISSN: 0091-3286, DOI: 10.1117/1.1385509 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013105922A2 (fr) | 2013-07-18 |
| EP2791618A2 (fr) | 2014-10-22 |
| JP2015505039A (ja) | 2015-02-16 |
| WO2013105922A3 (fr) | 2013-09-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20140616 |
|
| AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
| DAX | Request for extension of the european patent (deleted) | ||
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20150626 |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: G02B 27/22 20060101AFI20150622BHEP Ipc: G01B 11/25 20060101ALI20150622BHEP |
|
| 17Q | First examination report despatched |
Effective date: 20150717 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 20151128 |