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EP0357695B1 - Appareil optique destine a etre utilise avec des dispositifs de mesure interferometriques - Google Patents

Appareil optique destine a etre utilise avec des dispositifs de mesure interferometriques Download PDF

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Publication number
EP0357695B1
EP0357695B1 EP89901124A EP89901124A EP0357695B1 EP 0357695 B1 EP0357695 B1 EP 0357695B1 EP 89901124 A EP89901124 A EP 89901124A EP 89901124 A EP89901124 A EP 89901124A EP 0357695 B1 EP0357695 B1 EP 0357695B1
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EP
European Patent Office
Prior art keywords
mirror
wave plate
polarising
splitting surface
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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EP89901124A
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German (de)
English (en)
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EP0357695A1 (fr
Inventor
Raymond John Chaney
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Renishaw PLC
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Renishaw PLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018—Multipass interferometers, e.g. double-pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Definitions

  • the present invention relates to optical apparatus for use with interferometric measuring devices.
  • the invention relates to optical apparatus for measuring deviations in the movement of a machine component during movement thereof along its main movement axis with an interferometric measuring device.
  • Deviations in the movement of a machine component along its main movement axis generally involve rotation of the component about one or more axes of the machine, usually referred to as the x,y and z axes, and are referred to as pitch, roll and yaw errors. There are also errors in straightness of the movement which involve lateral deviations of the machine component from the main movement axis.
  • roll is defined as rotation of the component about an axis parallel to the x axis
  • pitch is defined as rotation of the component about an axis parallel to the y axis
  • yaw is defined as rotation of the component about an axis parallel to the z axis.
  • a light beam should be interpreted to mean a beam having a wavelength in the range from infra-red, through visible to the ultraviolet part of the spectrum.
  • optical apparatus for measuring deviations in the movement of a machine component during movement thereof along its main movement axis comprises: an optical device and an elongate plane mirror, one of which is attached to the machine component, the other of which is mounted on a fixed part of the machine whereby relative movement is established therebetween during movement of the machine component, said mirror having a longitudinal axis which is arranged to be parallel to the main movement axis of the machine component so that its reflecting surface faces in a direction normal to the main movement axis of the machine component, means for generating at least one light beam directed towards the optical device, and wherein the optical device includes means for generating from said at least one light beam, a measuring beam and a reference beam, characterised in that the means for generating the measuring and reference beams, direct both the measuring beam and the reference beam towards the reflecting surface of the mirror along laterally displaced, parallel paths orthogonal to said reflecting surface, and means are provided for interferometrically combining the measurement and reference beams after reflection from the reflecting surface to determine directly the path difference between
  • the apparatus of the present invention enables a direct interferometric measurement of the deviation using only one interferometer, which simplifies the associated electronic circuitry.
  • the invention is particularly applicable to measurement of angular deviations such as roll or yaw of an object during its movement.
  • the movements of the various machine components are subject to errors in that the movable machine components can suffer deviations such as rolling, pitching and yawing movements about their main axes of movement.
  • the apparatus employed by the present invention enables inter alia, direct measurements of rolling movements to be obtained with high accuracy and with little complexity using a single interferometer.
  • This is achieved by using an optically straight mirror 6 mounted on a fixed part of the machine, e.g. the worktable, mounting an optical device 7 on the movable machine component being measured, directing two light beams B1 and B2 at the mirror 6 from the optical device 7, and receiving the return beams reflected from the mirror in the optical device, whereby any difference in the path length of the two beams due to rolling motion of the machine component can be determined interferometrically.
  • One of the beams, say B1 can be regarded as a measuring beam, while the other, B2 is the reference beam.
  • the light beams B1 and B2 are derived from a laser 9 mounted statically on, or adjacent to, the machine worktable, and which directs a single beam A towards the optical device 7.
  • a return beam C from the optical device 7 is received by a detector (not shown) adjacent the laser.
  • the optical device 7 comprises in combination, a polarising beam splitter and periscope unit 10, a polarising cube beam splitter unit 12, a retro-reflector unit 14 and a quarter wave plate 16.
  • the laser beam A is directed towards the unit 10 where at a first beam splitting surface 20 a first portion 22 of the beam is transmitted to the unit 12, and a second portion 24 is reflected at right angles towards an inclined reflecting surface 26. At the surface 26 beam portion 24 is reflected into unit 12 in a direction parallel to beam portion 22.
  • the transmitted beam portion 22 is next passed through a half-wave plate 30 (Fig. 4) to change its polarisation state to that of the reflected beam portion 24.
  • Beam portion 22 next passes to a second polarising beam splitting surface 28 in unit 12 where it is reflected towards the mirror 6 and through the quarter wave plate 16. At mirror 6 the beam portion 22 is reflected back and passes again through the quarter wave plate 16. Having passed twice through the quarter wave plate 16 the polarisation state of beam portion 22 is such that on arrival at the beam splitting surface 28 it is transmitted to the retro-reflector 14. Retro-reflector 14 returns the beam portion 22 to the mirror 6 on a parallel track through the beam splitting surface 28 and the quarter wave plate 16, and the mirror 6 reflects it back through the quarter wave plate 16 to the beam splitting surface 28. After its two further passages through the quarter wave plate 16 the beam portion 22 is reflected at the beam splitting surface 28 and is directed back towards the unit 10.
  • the beam portion 22 is passed once again through the half wave plate 30 to change its polarisation state so that it will be transmitted through the beam splitting surface 20 and will leave the optical device 7 as outgoing beam C on a path parallel to, but displaced from, the incoming laser beam A.
  • the reflected beam portion 24 on leaving the reflecting surface 26 follows a similar path to that of the transmitted beam portion 22 except that it does not pass through the half wave plate 30.
  • the paths of the beam portions 22 and 24 exactly parallel each other through unit 12 to the mirror 6, the arrangement being such that after leaving unit 12, the beam portion 24 is deflected by the two beam splitting surfaces 26,20 of the periscope to be combined with beam portion 22 so that the beam C leaving the optical device 7 is a composite beam.
  • the beam portions 22 and 24 of the composite beam B will be phase shifted and be capable of producing interference fringes which can be detected.
  • Beam portions 22 and 24 respectively form the beams B1 and B2 of the measuring and reference arms of the interferometer referred to above.
  • the composite beam C is directed into an appropriate fringe detection system (many types of which are available), which gives an ouput in dependence upon the fringe count as the machine moves. Since the fringe count is directly related to the amount of roll of the moving machine component, the machine readings can be corrected either in real time or stored and corrected later.
  • the optical device described above may be modified in a simple manner to enable yawing movements of the pillar to be measured. All that is required is to mount the combined beam splitter and periscope device 10 and the roof top reflector 14 in a position at right angles to that shown, so that the beams B1 and B2 instead of being vertically displaced, as shown in Fig. 1 to 4 become horizontally displaced. Then it can be seen that rotation of the optical device about the z axis will cause a variation in path length of beam B1 compared to beam B2, and this can be detected by creating interference fringes from the combined return beam in known manner.
  • the retro-reflector illustrated in the optical device of Figs. 1 to 4 is a roof top prism, it will be understood that it could be replaced by a pair of corner cube reflectors at a known distance apart. This will further reduce or eliminate any errors in the roll or yaw movements if the beam A impinges on the optical device in a direction which is not parallel to the direction of the axis of motion x-x.
  • FIG. 5 A less expensive optical device which also performs in accordance with the invention is shown in Figs. 5 and 6.
  • the polarising beam splitter unit 12 and the retro-reflector unit 14 of the embodiment of Figs. 2 to 4 are replaced by a single plane mirror. This also allows for the quarter-wave plate 16 to be eliminated.
  • the result is that the returning composite beam C is co-incident with the incoming laser beam A and may interfere with the operation of the laser. Lateral displacement of the incoming and return beams in achieved with a second beam splitting and periscope unit, in order to separate the return beam for use in the detectors.
  • the incoming laser beam A passes through a non-polarising beam splitter and periscope unit 40 and the transmitted beam portion 42 passes to the polarising beam splitter and periscope unit 10.
  • the reflected beam portion 42a passes out of the apparatus and is lost.
  • the transmitted beam portion 42 is split at the surface 20, a further transmitted beam portion 43 passing to the plane mirror 44 by means of which it is deflected towards the mirror 6 which in turn reflects it back along its path to the surface 20.
  • the reflected beam portion 46 is deflected by the periscope along a parallel path to a second plane mirror 48 (or to a second portion 48 of the same plane mirror 44) and is deflected to mirror 6 and back again through the periscope to surface 20 where it re-combines with the transmitted portion 43 of the beam to form combined beam C.
  • the combined beam C travels back towards the laser and is split by the beam splitter and periscope unit 40 to provide a deflected beam portion 50 which is directed into a detector system to generate and count any interference fringes caused by rolling movements of the optical device in the same manner as described above with respect to the embodiment shown in Figs. 2 to 4.
  • the beam portions 42 and 46 in this embodiment therefore form the beams B1 and B2 of the measuring and reference arms of the interferometer.
  • the retro-reflector 14 is shown as a roof-top prism but it may be replaced by a pair of corner cube reflectors in known manner.
  • the unit 40 need not be part of the optical device but may be positioned within or close to the laser.
  • FIG. 7 Another modification of the embodiment shown in Fig. 4 is shown in Fig. 7.
  • the second reflecting surface 26 of the periscope is deleted and replaced by a polarising beam splitting surface equivalent to surface 28 and arranged to reflect the beam towards the mirror 6 at points P1 and, after reflection from retro reflector 14, at P2 as shown.
  • Such an arrangment would however be sensitive to any inaccuracies along the length of the mirror since the two beams B1 and B2 will now impinge on the mirror at two different points along its length.
  • the advantage of this arrangement however is that the reference and measuring beams pass through the same amount of glass and the arrangement is more symmetrical.
  • FIG. 8 there is shown another modified version of the optical device of Figs. 2 to 4 capable of measuring the straightness of the movemnt of the vertical machine column 2 along the direction x-x.
  • the optical device is made up of a polarising beam-splitting cube 60 and two retro-reflectors 62 and 64 on adjacent sides of the cube 60.
  • a quarter wave plate 66 is placed between the cube 60 and the straight mirror 6 on the opposite of the cube from the reflector 62.
  • an incoming laser beam A is split at a beam splitting surface 68 of the cube, the reflected part of the beam 70 being directed towards the mirror 6, and after passing through the quarter wave plate 66 is reflected from the mirror 6 and passes once again through the quarter wave plate 66 to the beam splitting surface 68.
  • the polarisation state of the beam is such that it is now transmitted at the beam splitting surface 68 and is reflected back via the retro-reflector 62 to the mirror 6 as beam 70A passing through the beam splitting surface 68 and the quarter wave plate on the way.
  • the beam 70A passes a second time through the quarter wave plate 66 so that its polarisation state is now such that it is reflected at the beam splitting surface 68 and leaves the optical device as part of the outgoing beam C.
  • the beams 70,70A form the beam B1 of the measuring arm of an interferometer and, since the mirror is straight any lateral movement of the device while moving in the direction x-x will cause a change in the path length of the beams 70,70A.
  • the portion 72 of the incoming beam A which is transmitted through the beam splitting surface 68 is reflected around the retro-reflector 64. This portion 72 of beam A forms the beam B2 of the reference arm of the interferometer, and is combined with the measuring beam B1 at the beam splitting surface 68 to form a composite outgoing beam C.
  • the total length of the beams 70 and 70A will change and there will be interference of the measuring beam and reference beam parts of the composite beam C which can be detected in the detector and measured.
  • Fig. 9 there is shown a beam path diagram for an optical device which will measure yawing movements of the vertical machine column 2 as it moves along the direction x-x using the same laser and mirror positions as shown in Fig. 1.
  • This optical component includes a polarising beam splitter 80 together with a retro-reflector 82, a quarter wave plate 84, a polarising beam splitter 86 and retro-reflector 88.
  • an incoming laser beam A is split at a polarising beam splitting surface 90 of the beam splitter 80 into reflected and transmitted components 92 and 94 respectively.
  • the reflected component 92 travels through the quarter wave plate 84 to the mirror 6 and back to the beam splitting surface where its polarisation state enables it to be transmitted to the retro-reflector which returns it on a laterally spaced parallel path back to the mirror and to the beam splitter. Due to its two further passages through the quarter wave plate 84 it is finally reflected at the beam splitting surface 90 and leaves the device as a returning beam C.
  • the transmitted component 94 passes through a half wave plate 96 to a second polarising beam splitting surface 98 where, in parallel with the reflected component 92 it is reflected through the quarter wave plate 84 to the mirror, back to the retro-reflector where it is laterally displaced, back to the mirror 6 and back along its incoming path to be re-combined at the beam splitting surface 90 with the reflected component 92 to form a composite returning beam C.
  • pitching movements of the vertical column can be measured and, the pitching, rolling, yawing and straightness deviations of the carriage 3 when moving along its axis z-z, and of the cross member 4 when moving along its axis y-y can also be measured interferometrically.
  • the apparatus of the present invention can also be used to measure parallelism of two slideways of a machine, for example the slideways on which the vertical columns 2,2a of Fig. 1 move in the direction x-x.
  • the mirror 6 may be placed in a fixed position parallel to the slideways.
  • the optical device is mounted first on one of the vertical columns to measure straightness of the movement of the column by any of the methods described above. Then the optical device is transferred to the other vertical column and the process repeated to determine the straightness of the second slideway. By comparing the readings from both operations it is possible to determine the parallelism i.e. the relative straightness between the two slideways.
  • FIG. 10 This is diagrammatrically illustrated in Fig. 10, which shows the mirror 6 positioned on the fixed machine structure and the optical device carried by column 2 as shown in Fig. 1 for making the measurement of the straightness of the movement of the column 2 along its main movement axis x-x.
  • the position of the laser 9 and detector are as described with reference to Fig. 1 and the optical device 7 is as described with reference to Fig. 8.
  • the straightness of the movement of column 2a along its track is measured by setting up the laser 9 and optical device 7 as shown in dotted lines. From the measurements taken the mean straightness of the movement of each column can be determined and thus the degree to which the two tracks are non-parallel can also be determined.
  • the errors in the readings of the machine scales can be determined and the errors in the position of the probe as read from the scales of the machine due to the above described deviations in movement can be corrected.
  • the quarter wave plates disclosed may be dispensed with if the retro-reflectors are chosen with appropriate refractive indices to achieve total internal reflection of the light beams which will alter their polarisation states in known manner.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

Le système d'interféromètre à laser décrit permet de mesurer n'importe quel écart de mouvement d'un composant de machine qui se déplace le long d'un axe de mouvement principal. Ledite système peut mesurer le roulis, le tangage, le mouvement de lacet, la rectilinéarité et le parallélisme de deux pistes au moyen d'un seul faisceau laser. La figure 1 représente un agencement servant à mesurer le roulis d'une colonne de machine verticale (2) pendant le mouvement de la colonne le long de l'axe des x d'une machine. Un miroir droit (6) est placé sur la base d'appui de la machine avec son axe longitudinal aligné sur l'axe des x et sa surface réfléchissante perpendiculaire à l'axe des x. Un composant optique comportant un diviseur optique de faisceau de polarisation est monté de façon à se déplacer avec la colonne de la machine et produit à partir d'un faisceau laser (A) un faisceau de mesure (B) et un faisceau de référence (B2), qui sont tous les deux dirigés sur le miroir mais latéralement séparés dans le sens de l'axe des z. Les faisceaux réfléchis depuis le miroir sont recombinés dans le dispositif optique, de façon à former un faisceau de retour (C) dirigé vers un détecteur adjacent au laser (9). Toute variation de la longueur relative des faisceaux (B1) et (B2) donne une mesure du roulis. On peut mesurer le mouvement de lacet en produisant des faisceaux (B1) et (B2) séparés latéralement dans le sens du mouvement, c'est-à-dire le long de l'axe des x. On mesure la rectilinéarité en utilisant un bras de référence de longueur fixe dans le dispositif optique. On mesure le parallélisme en effectuant des mesures de rectilinéarité des deux colonnes (2) et (2a). On peut mesurer le tangage en produisant quatre faisceaux.

Claims (14)

  1. Appareil optique pour mesurer les écarts dans le déplacement d'un élément de machine pendant son déplacement le long de son axe de déplacement principal, comprenant:
       un dispositif optique (7) et un miroir plan allongé (6), dont l'un est fixé à l'élément de machine (2), dont l'autre est monté sur une partie fixe (1) de la machine, un déplacement relatif étant établi entre eux pendant le déplacement de l'élément de machine,
       ledit miroir (6) ayant un axe longitudinal qui est disposé pour être parallèle à l'axe de déplacement principal (x) de l'élément de machine (2) de telle sorte que sa surface réfléchissante soit orientée dans une direction normale à l'axe de déplacement principal de l'élément de machine,
       un moyen (9) de production d'au moins un faisceau lumineux (A) dirigé vers le dispositif optique (7),
       et dans lequel le dispositif optique (7) comprend des moyens (10, 12, 14, 16) pour produire à partir dudit dispositif au moins un faisceau lumineux (A), un faisceau de mesure (B1) et un faisceau de référence (B2),
       caractérisé en ce que les moyens (10, 12, 14, 16) de production des faisceaux de mesure et de référence dirigent le faisceau de mesure (B1) et le faisceau de référence (B2) vers la surface réfléchissante du miroir (6) le long de chemins parallèles, déplacés latéralement, orthogonaux à ladite surface réfléchissante, et que des moyens sont prévus pour combiner interférométriquement les faisceaux de mesure et de référence après leur réflexion sur la surface réfléchissante pour déterminer directement la différence de chemins entre les deux faisceaux.
  2. Appareil optique selon revendication 1 caractérisé en ce que le faisceau de référence (B2) est déplacé latéralement par rapport au faisceau de mesure (B1) dans la direction de l'axe de déplacement principal.
  3. Appareil optique selon revendication 1 caractérisé en ce que le faisceau de référence (B2) est déplacé latéralement par rapport au faisceau de mesure (B1) dans une direction perpendiculaire à la direction de l'axe de déplacement principal.
  4. Appareil optique selon revendication 1 caractérisé en ce que les moyens (10, 12, 14, 16) de direction du faisceau de mesure (B1) et du faisceau de référence (B2) vers le miroir le long de chemins parallèles espacés latéralement, orthogonaux à sa surface réfléchissante, comprennent:
       un premier diviseur de faisceau polarisant (20) pour produire un faisceau réfléchi (24) constituant le faisceau de mesure (B1), et un faisceau transmis (22) orthogonal à celui-ci, constituant le faisceau de référence (B2),
       un périscope (26) pour dévier l'un desdits faisceaux sur un chemin parallèle à l'autre mais déplacé latéralement par rapport à lui, et
       une surface réfléchissante inclinée (28) dans le chemin de chacun des faisceaux (22, 24) pour les dévier vers le miroir (6).
  5. Appareil optique selon revendication 4 caractérisé en ce que la surface réfléchissante inclinée (28) comprend une deuxième surface de division de faisceau polarisante.
  6. Appareil optique selon revendication 1 caractérisé en ce que des moyens rétro-réfléchissants (14) sont prévus pour produire, dans chacun des faisceaux de mesure (B1) et de référence (B2), deux portions de faisceau parallèles séparées latéralement l'une de l'autre.
  7. Appareil optique selon revendication 5 caractérisé en ce que des plaques d'ondes sont prévues dans les chemins des faisceaux de mesure (B1) et de référence (B2) afin de changer leur état de polarisation pour permettre la transmission à travers la deuxième surface de division de faisceau (28) et la réflexion sur ladite surface.
  8. Appareil optique selon revendication 7 caractérisé en ce que:
    i) le faisceau transmis depuis le premier diviseur de faisceau de polarisation (20) passe, dans l'ordre, à une plaque demi-onde (30), à la deuxième surface de division de faisceau de polarisation (28), à une plaque quart d'onde (16), au miroir (6), à ladite plaque quart d'onde (16), à la deuxième surface de division de faisceau polarisante (28), au moyen de rétro-réflexion (14), à la deuxième surface de division de faisceau polarisante (28), à ladite plaque quart d'onde (16), au miroir (6), à ladite plaque quart d'onde (16), à la deuxième surface de division de faisceau (28), à la plaque demi-onde (30) et à la première surface de division de faisceau (20),
    ii) le faisceau réfléchi (24) par le premier diviseur de faisceau polarisant (20) passe, dans l'ordre, au périscope (26), à la deuxième surface de division de faisceau polarisante (28), à ladite plaque quart d'onde (16), au miroir (6), à ladite plaque quart d'onde (16), à la deuxième surface de division de faisceau (28), au moyen rétro-réflecteur (14), à la deuxième surface de division de faisceau polarisante (28), à ladite plaque quart d'onde (16), au miroir (6), à ladite plaque quart d'onde (16), à la deuxième surface de division de faisceau (28) et au périscope (26), et dans lequel:
    iii) le faisceau réfléchi (24) et le faisceau transmis (22) sont recombinés à la première surface de division de faisceau (20) pour former un faisceau de retour (C) devant être reçu par un détecteur.
  9. Appareil optique selon revendication 4 caractérisé en ce que la surface réfléchissante inclinée est un miroir plan (44).
  10. Appareil optique selon revendication 9 caractérisé en ce qu'un deuxième ensemble diviseur de faisceau et périscope (40) est prévu dans le chemin du faisceau de retour combiné pour assurer la séparation latérale par rapport au faisceau laser d'entrée.
  11. Appareil optique selon revendication 10 caractérisé en ce que:
    i) le faisceau transmis (43) par le premier diviseur de faisceau polarisant (20) passe dans l'ordre à une plaque demi-onde, à un miroir plan (44), au miroir droit (6), audit miroir plan (44), à la plaque demi-onde et au premier diviseur de faisceau polarisant (20),
    ii) le faisceau réfléchi (46) venant du premier diviseur de faisceau polarisant (20) passe, dans l'ordre, au périscope (10), à un miroir plan (48), au miroir droit (6), audit miroir plan (48), au périscope (10) et à la première surface de division de faisceau (20), et dans lequel:
    iii) le faisceau réfléchi et le faisceau transmis sont recombinés à la première surface de division de faisceau (20) pour former un faisceau de retour (50) qui est dévié par le deuxième ensemble diviseur de faisceau et périscope (40) vers un détecteur.
  12. Appareil optique selon revendication 2 caractérisé en ce que le moyen de direction du faisceau de référence vers le miroir (6) le long d'un premier chemin parallèle au premier chemin du faisceau de mesure comprend:
       un premier diviseur de faisceau polarisant (80) ayant une surface de division de faisceau (90) pour produire un faisceau réfléchi (92) constituant le faisceau de mesure, et un faisceau transmis (94) orthogonal à celui-ci constituant le faisceau de référence,
       un deuxième diviseur de faisceau polarisant (86) ayant une surface de division de faisceau (98) pour produire à partir du faisceau transmis (94) un faisceau réfléchi dirigé vers le miroir (6).
  13. Appareil optique selon revendication 12 caractérisé en ce qu'un rétro-réflecteur (82, 88) est prévu dans le chemin de chacun des faisceaux de mesure et de référence après réflexion par le miroir (16) pour produire une séparation latérale entre le faisceau laser entrant (A) et le faisceau combiné sortant (C).
  14. Appareil optique selon revendication 13 caractérisé en ce que:
    i) le faisceau transmis (94) depuis le premier diviseur de faisceau polarisant (80) passe, dans l'ordre, à une plaque demi-onde (96), à une deuxième surface de division de faisceau polarisante (98), à une plaque quart d'onde (84), au miroir droit (6), à ladite plaque quart d'onde (84), à la deuxième surface de division de faisceau polarisante (98), au rétro-réflecteur (88), à la deuxième surface de division de faisceau polarisante (98), à ladite plaque quart d'onde (84), au miroir droit (6), à la deuxième surface de division de faisceau de polarisation (98), à la plaque demi-onde (96), et au premier diviseur de faisceau polarisant (80),
    ii) le faisceau réfléchi (92) par le premier diviseur de faisceau polarisant (80) passe, dans l'ordre, à une plaque quart d'onde (84), au miroir droit (6), à la plaque quart d'onde (84), à la première surface de division de faisceau polarisante (90), au rétro-réflecteur (82), à la première surface de division de faisceau polarisante (90), à la plaque quart d'onde (84), au miroir droit (6), à la plaque quart d'onde (84) et à la première surface de division de faisceau polarisante (90), et dans lequel
    iii) le faisceau réfléchi (92) et le faisceau transmis (94) sont recombinés au premier diviseur de faisceau polarisant (80) pour former un faisceau de retour (C) devant être reçu par un détecteur.
EP89901124A 1987-12-24 1989-07-05 Appareil optique destine a etre utilise avec des dispositifs de mesure interferometriques Expired - Lifetime EP0357695B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8730169 1987-12-24
GB878730169A GB8730169D0 (en) 1987-12-24 1987-12-24 Optical apparatus for use with interferometric measuring devices

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EP0357695A1 EP0357695A1 (fr) 1990-03-14
EP0357695B1 true EP0357695B1 (fr) 1994-03-30

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US (1) US5056921A (fr)
EP (1) EP0357695B1 (fr)
JP (1) JP2579226B2 (fr)
DE (1) DE3888831T2 (fr)
GB (1) GB8730169D0 (fr)
WO (1) WO1989005955A1 (fr)

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EP1031868B1 (fr) * 1999-02-26 2003-05-14 Dr. Johannes Heidenhain GmbH Séparateur parallêle de faisceaux compensés avec deux plaques et interféromètre
US7800758B1 (en) 1999-07-23 2010-09-21 Faro Laser Trackers, Llc Laser-based coordinate measuring device and laser-based method for measuring coordinates
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WO2020139096A1 (fr) * 2018-12-24 2020-07-02 Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Образования Балтийский Государственный Технический Университет "Военмех" Им. Д.Ф.Устинова (Бгту "Военмех") Système interférentiel de mesure de longueur absolue
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Also Published As

Publication number Publication date
US5056921A (en) 1991-10-15
DE3888831T2 (de) 1994-07-14
DE3888831D1 (de) 1994-05-05
JPH02502755A (ja) 1990-08-30
EP0357695A1 (fr) 1990-03-14
GB8730169D0 (en) 1988-02-03
JP2579226B2 (ja) 1997-02-05
WO1989005955A1 (fr) 1989-06-29

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