WO2001013079A1 - Procede et appareil de separation de faisceaux de rayonnement electromagnetique - Google Patents
Procede et appareil de separation de faisceaux de rayonnement electromagnetique Download PDFInfo
- Publication number
- WO2001013079A1 WO2001013079A1 PCT/AU2000/000990 AU0000990W WO0113079A1 WO 2001013079 A1 WO2001013079 A1 WO 2001013079A1 AU 0000990 W AU0000990 W AU 0000990W WO 0113079 A1 WO0113079 A1 WO 0113079A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- polarization
- components
- prism
- component
- altering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6445—Measuring fluorescence polarisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/447—Polarisation spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/02—Polarimeters of separated-field type; Polarimeters of half-shadow type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0243—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows having a through-hole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a throughhole for a light collecting or light injecting optical fiber
Definitions
- the present invention relates to a method and apparatus for the spatial and polarization resolution of electromagnetic radiation, typically laser beams, for use in, for example, materials analysis.
- the present invention provides, therefore, a method for resolving overlapping emission spectra, involving: providing a plurality of polarized incident beams of electromagnetic radiation for irradiating a sample, each of said beams having a different polarization; irradiating said sample with said beams; receiving respective return, emission spectra from said sample; and resolving said emission spectra according to their respective polarizations.
- emission spectra is used herein to refer to electromagnetic radiation emitted by the sample, which through excitation of the sample, fluorescing by the sample, reflection from the sample or otherwise. Further, the emission spectra may comprise very narrow spectra that might generally be described as beams .
- the plurality of polarized incident beams may have a single beam path.
- the plurality of polarized incident beams may comprise a plurality of components of a beam.
- the plurality of polarized incident beams may be from a single source.
- the source may comprise a source of unpolarized beams or beam components combined with polarizing means.
- said source is a laser source and said plurality of components comprise different excitations of said laser source.
- said laser source is an argon laser.
- said plurality of components comprise the 488 nm and 514 nm excitations of argon.
- said incident beams have different wavelengths, for exciting respective different states in said sample.
- said method includes resolving said emission spectra by means of a polarizing beam splitter.
- said polarizing beam splitter includes a dichroic mirror.
- said plurality of incident beams comprises two orthogonally polarized incident beams.
- Preferably said method includes providing said different polarizations .
- said method includes polarizing or altering the polarization of at least one of said plurality of incident beams by means of polarizing means.
- said polarizing means includes a half wave plate.
- said sample comprises one or more labels for labelling a biological sample.
- the present invention also provides an apparatus for separating overlapping emission spectra, having: a source of a plurality of polarized incident beams of electromagnetic radiation for irradiating a sample, each of said beams having a different polarization; means for receiving receiving respective return, emission spectra from said sample; and means for resolving said emission spectra according to their respective polarizations.
- the plurality of polarized incident beams may comprise a plurality of components of a beam, more preferably from a single source.
- the source may comprise a plurality of light sources.
- said source is a laser source and said plurality of components comprise different excitations of said laser source.
- said laser source is an argon laser.
- said plurality of components comprise the 488 nm and 514 nm excitations of argon.
- said incident beams have different wavelengths, for exciting respective different states in said sample.
- said apparatus includes a polarizing beam splitter for resolving said emission spectra.
- said polarizing beam splitter includes a dichroic mirror.
- said plurality of incident beams comprises two orthogonally polarized incident beams.
- said apparatus includes polarizing means for polarizing or altering the polarization of at least one of said plurality of incident beams.
- said polarizing means includes a half wave plate.
- said sample comprises one or more labels for labelling a biological sample.
- the present invention further provides a method of spatially resolving a beam of electromagnetic radiation according to polarization, involving: passing said beam through a polarizing beam splitter to form first and second orthogonally polarized components; and altering the plane of polarization of at least said second component and translating the path of at least one of said components, so that said components are polarized in substantially the same plane, are substantially parallel and are spatially displaced.
- said altering the plane of polarization of at least said second component comprises changing at least said second component from s-polarization to a p-state.
- said polarizing beam splitter comprises a compound prism.
- said altering said plane of polarization of at least said second component includes internally reflecting said second component within a prism.
- said translating the path of at least one of said components includes internally reflecting said at least one of said components within a prism. More preferably said altering said plane of polarization of at least said second component and said translating the path of at least one of said components includes internally reflecting said second component within a prism.
- said passing said beam through a polarizing beam splitter, said altering the plane of polarization of at least said second component and said translating the path of at least one of said components is by means of a single prism that includes at least one twisted periscope.
- said altering the plane of polarization of at least said second component is by means of an achromatic half-wave plate that changes an input s- polarization to a p-state.
- said method includes directing said substantially parallel and spatially displaced components into a dispersing means.
- said dispersing means comprises at least one prism (and may comprise a train of prisms), and said method includes directing said substantially parallel and spatially displaced components against said at least one prism at substantially the Brewster angle.
- said dispersing means comprises one or more diffracting elements operating in transmission or reflecting mode.
- the present invention also provides a method of spectrographically resolving a beam of electromagnetic radiation, including the method of spatially resolving said beam of electromagnetic radiation according to polarization described above.
- the present invention also provides an apparatus for spatially resolving a beam of electromagnetic radiation according to polarization, involving: a polarizing beam splitter for forming first and second orthogonally polarized components of said beam; means for altering the plane of polarization of at least said second component; and means for translating the path of at least one of said components; wherein said components exit said apparatus polarized in substantially the same plane, substantially parallel and spatially displaced.
- said polarizing beam splitter comprises a compound prism.
- said means for altering said plane of polarization of at least said second component comprises a prism for internally reflecting said second component.
- said means for translating the path comprises a prism arranged to internally reflect said at least one of said components . More preferably said means for altering said plane of polarization and said means for translating the path comprise a single prism.
- said apparatus includes a prism including at least one twisted periscope, said prism constituting said polarizing beam splitter, said means for altering the plane of polarization of at least said second component and said means for translating the path.
- said means for altering the plane of polarization of at least said second component comprises a half wave plate.
- said apparatus includes a dispersing means for dispersing said substantially parallel and spatially displaced components.
- said dispersing means comprises at least one prism for receiving said substantially parallel and spatially displaced components at substantially the Brewster angle.
- the present invention still further provides a spectrograph, including the apparatus for spatially resolving said beam of electromagnetic radiation according to polarization as described above.
- the present invention still further provides a Raman spectrophotometer including the apparatus for spatially resolving said beam of electromagnetic radiation according to polarization as described above.
- the present invention still further provides a laser scanning confocal microscope (LSCM) including the apparatus for spatially resolving said beam of electromagnetic radiation according to polarization as described above.
- LSCM laser scanning confocal microscope
- the present invention still further provides a two photon scanning spot laser microscope including the apparatus for spatially resolving said beam of electromagnetic radiation according to polarization as described above.
- the present invention still further provides a volume holographic spectral dispersion system including the apparatus for spatially resolving said beam of electromagnetic radiation according to polarization as described above.
- Figure 1 is a schematic view of an apparatus for separating overlapping emission spectra in a double labeling experiment according to a first embodiment of the present invention
- Figure 2 is the transmission curve of the dichroic mirror of the apparatus of figure 1;
- Figure 3 is a schematic of a first polarizing beam splitter configuration for use with the apparatus of figure 1;
- Figure 4 is a schematic of a second polarizing beam splitter configuration for use with the apparatus of figure 1;
- Figure 5 is a schematic of a third polarizing beam splitter configuration for use with the apparatus of figure 1;
- Figure 6 is a schematic of a fourth polarizing beam splitter configuration for use with the apparatus of figure 1;
- Figure 7 is a schematic view of a polarizing spectrograph according to a second embodiment of the present invention.
- Figure 8 is a schematic view of a polarization insensitive version of the spectrograph of figure 6;
- Figure 9 is a schematic view of a polarizing spectrograph according to a third embodiment of the present invention.
- the apparatus 10 includes an Argon or Argon/Krypton laser 12 for generating a beam 14 of multiple laser lines (in this example comprising components of excitation energies 488 nm and 514 nm respectively) , filter set 16, polarizing means 18, double dichroic mirror 20, beam scanning system 22, microscope objective 24, polarizing beam splitter cube 26 and first and second photomultiplier tubes 28 and 30.
- laser lines 14 are isolated by means of filter set 16 and then orthogonally polarized by means of polarizing means 16 (described in further detail below) .
- the now polarized lines 32a,b are reflected by dichroic mirror 20, scanned by means of scanning system 22, then focussed by microscope objective 24 to a diffraction-limited spot 34 in a sample 36 that has been double-labelled (such as with Fluorescein and Rhodamine) .
- Fluorescence from that focus spot 34 is polarized as defined by the polarization of the excitation wavelengths, and - after returning through dichroic mirror 20 - is readily separated into two channels 38 and 40 by mean of using polarizing beam splitter cube 26. These channels may then be detected with photomultiplier tubes 28 and 30.
- Figure 2 illustrates the transmission curve 42 of the dichroic mirror 20.
- the notch band 44 and 46 correspond to the excitation wavelengths.
- fluorescence spectrum 48 will be partially reflected. It should be noted that the bandwidth of the notch band 44 and 46 is narrow, so that fluorescence energies can be maximally transmitted.
- the multi-line Argon ion laser 12 emits a TEMoo beam containing two vertically polarized components 52a,b of wavelengths 488 nm and 514 nm respectively.
- a long pass dichroic mirror 54 reflects the 488 nm component 52a, but passes the 514 nm component 52b to a half-wave plate 54, which rotates the polarization of the 514 nm component by 90°.
- the beam paths 52a,b are then recombined into one beam path 56 using two mirrors 58,60 and a long-pass dichroic mirror 62.
- the recombined beam 56 may then be employed as shown in figure 1, in any suitable apparatus (such a LSCM, a flow cytometer or a gene chip reader) .
- a TEMoo beam containing two vertically polarized components 52a,b of wavelength 488nm and 514nm respectively from a multi-line Argon ion laser 12 are separated by a dispersing prism 64.
- the two components 52a,b are then made parallel by a further prism 66.
- a half-wave plate 68 is placed in the path of the 514 nm component 52b, to rotate its polarization by 90°.
- the two components 52a,b are then recombined into one beam path 68 by mans of two prisms 70 and 72.
- FIG. 5 A further possible configuration is shown in figure 5.
- a multi-line Argon ion laser 12 emits a TEMoo beam containing vertically polarized components 52a,b of wavelengths 488 nm and 514 nm respectively.
- a dual- wavelength-plate 74 (at 45° to the beam 52a,b) rotates the polarization of the 514 nm component 52b by 90°, but the
- a further polarizing beam splitter configuration is shown in figure 6.
- the multi-line Argon ion laser 12 emits a
- TEMoo beam containing vertically polarized components 52a,b of excitation wavelengths 488 nm and 514 nm respectively, which are separated out by a dispersing prism 76. Both separated beam paths 52a,b are then made parallel by a second prism 78.
- a half-wave plate 80 (at 45°) rotates the polarization of the 488 nm component 52a by 90°, leading to orthogonally polarized beams 82a,b (488 nm component 82a polarized perpendicular to the plane of figure 6 as depicted, 514 nm component 82b in the plane of figure 6) .
- Two prisms 84,86 recombine the two components 82a,b into a single beam path 88, which is then directed to the sample measuring apparatus.
- induced fluorescence follows the same beam path 88, but in the opposite direction.
- a mirror 90 which reflects only the fluorescence, is positioned between prisms 78 and 82 and directs the returned fluorescence 92 towards two holographic (narrow band) notch filters 94,96. These notch filters 94,96 further exclude the excitation wavelengths.
- the returned fluorescence 92 after passing through filters 94,96, is sent to a polarizing beam splitter 98, which resolves the returned fluorescence 92 into orthogonally polarized components 100a,b, which are focussed by lenses 102,104 respectively onto respective photomultiplier tubes 106,108.
- FIG. 7 is a schematic view of a polarizing spectrograph 110 according to a second embodiment of the present invention.
- Spectrograph 110 includes a collimating lens 112, a broadband polarizing beam splitter 114, a twisted periscope 116 formed as or attached to the (side) s face of the beam splitter 114, a horizontal periscope 118 formed as or attached to the (front) p face of the beam splitter 114, and a dispersing prism 120
- a light beam 122 (delivered to the spectrograph 110 by, for example, a fibre or slit) is collimated by lens 122.
- the collimated beam 124 is available for pre-filtering before entering the polarizing beam splitter 114, where the collimated beam 124 is split into p component 126a (horizontal in this figure) and ⁇ component 126b (initially vertical in this figure) respectively, at vertical diagonal plane 115 of beam splitter 114.
- the twisted periscope 116 formed as or attached to the ⁇ face of the beam splitter 114, converts the polarization of the 8 component 126b to a p state and elevates that component, while horizontal periscope 118, formed as or attached to the (front) p face of beam splitter 114, translates the p component 126a laterally to be directly under component 126b as it leaves the twisted periscope 116.
- the combined action of the periscopes 116,118 results in two parallel but vertically displaced beams 126a, b of p polarization (126b above 126a in the figure) .
- the beams 126a, b can be focused by separate lenses 128,130 to suitable detectors (such as CCD or PMT detectors) 132a,b so as to form separate spectra for each polarization p and ⁇ which were present at the input .
- suitable detectors such as CCD or PMT detectors
- the two beams 126a, b can be re-combined to fall on the same photodetector 136 and thereby provide a polarization- insensitive spectrograph.
- spectrograph 140 has a single periscope 142 formed as or attached to the ⁇ face of a beam splitter 144.
- Spectrograph 140 also includes an achromatic half-wave plate 146 in the optical path after the periscope 142.
- a beam 148 enters the beam splitter 144 and is split into p and 8 components 150a,b respectively, at diagonal vertical plane 145.
- the p component 150a exits the beam splitter 144 through the p face of beam splitter 144 essentially undeflected.
- the 8 component 150b is reflected by periscope 142, which it exits with its polarization preserved, but parallel to and spatially displaced from p component 150a.
- s component 150b then traverses achromatic half-wave plate 146, which changes the s-polarization of component 150b to a p state, so that both components 150a, b are now in the same polarization state but spatially displaced. They then enter dispersive prism 152 as described above, are focussed by one or more lenses (lens 154 in the figure) and detected by detector or detectors 156.
- spectrographs 110 and 140 need use only a single dispersive means (prism, grating or otherwise), as the two exit beams are co-planar and parallel at the stage where they approach the face of the dispersive means, so that there is efficient use of the, for example, prism volume.
- An SF11 60° prism at minimum deviation is sufficiently close to the Brewster condition to give a power loss of only 0.6% for either input polarization from 488 nm to beyond one micron, or the limit imposed by the beam splitter.
- Geometry allows direct insertion of a prefilter to reject laser pump light in the collimated beam
- the spectrographs can be operated in a non-scanning multichannel mode.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU65494/00A AU6549400A (en) | 1999-08-18 | 2000-08-18 | Method and apparatus for the resolution of beams of electromagnetic radiation |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AUPQ2295 | 1999-08-18 | ||
| AUPQ2295A AUPQ229599A0 (en) | 1999-08-18 | 1999-08-18 | A low cost high throughput polarising spectrograph |
| AUPQ6280A AUPQ628000A0 (en) | 2000-03-17 | 2000-03-17 | Method for separating overlapping emission spectra in double labelling experiment |
| AUPQ6280 | 2000-03-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2001013079A1 true WO2001013079A1 (fr) | 2001-02-22 |
Family
ID=25646125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/AU2000/000990 Ceased WO2001013079A1 (fr) | 1999-08-18 | 2000-08-18 | Procede et appareil de separation de faisceaux de rayonnement electromagnetique |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2001013079A1 (fr) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6671046B2 (en) | 2001-05-22 | 2003-12-30 | Agilent Technologies, Inc. | Polarization converter |
| DE102005022880A1 (de) * | 2005-05-18 | 2006-11-30 | Olympus Soft Imaging Solutions Gmbh | Trennung spektral oder farblich überlagerter Bildbeiträge in einem Mehrfarbbild, insbesondere in transmissionsmikroskopischen Mehrfarbbildern |
| EP1870696A1 (fr) * | 2006-06-22 | 2007-12-26 | ASML Netherlands B.V. | Procédé et appareil pour caractérisation angulaire de lithographie spectroscopique résolue |
| CN104155279A (zh) * | 2013-05-13 | 2014-11-19 | 中国科学院大连化学物理研究所 | 一种线形共聚焦紫外拉曼光谱仪 |
| CN104181089A (zh) * | 2013-05-22 | 2014-12-03 | 中国石油化工股份有限公司 | 用于扫描岩石面孔率的设备及方法 |
| CN105467609A (zh) * | 2016-01-15 | 2016-04-06 | 南开大学 | 一种基于沃拉斯顿棱镜的空间角分复用全息术的参考光分束方法及其专用装置 |
| CN107991242A (zh) * | 2017-11-20 | 2018-05-04 | 西北工业大学 | 一种基于偏振分光棱镜的测量样品偏振态的方法与系统 |
| CN108051089A (zh) * | 2017-11-20 | 2018-05-18 | 西北工业大学 | 一种基于渥拉斯顿棱镜的测量样品偏振态的方法与系统 |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0239506A2 (fr) * | 1986-03-28 | 1987-09-30 | Zygo Corporation | Interféromètre avec miroir plan différentiel |
| GB2203854A (en) * | 1987-04-21 | 1988-10-26 | Gen Electric Plc | Polarising optical device for forming a hologram |
| WO1989005955A1 (fr) * | 1987-12-24 | 1989-06-29 | Renishaw Plc | Appareil optique destine a etre utilise avec des dispositifs de mesure interferometriques |
| EP0421628A2 (fr) * | 1989-10-05 | 1991-04-10 | Seiko Epson Corporation | Dispositif d'affichage LCD pour projection |
| WO1997029210A2 (fr) * | 1996-02-05 | 1997-08-14 | The Perkin-Elmer Corporation | Technique fluorometrique de detection de systemes homogenes d'hybridation par reaction en chaine de la polymerase |
| JPH09243920A (ja) * | 1996-03-05 | 1997-09-19 | Olympus Optical Co Ltd | 走査型光学顕微鏡 |
| JPH1123466A (ja) * | 1997-07-03 | 1999-01-29 | Jasco Corp | 円二色性蛍光励起スペクトル測定装置 |
| US5867291A (en) * | 1996-10-29 | 1999-02-02 | Chorum Technologies Inc. | Programmable wavelength router |
| DE19745607A1 (de) * | 1997-10-06 | 1999-04-15 | Forschungsverbund Berlin Ev | Anordnung zur Messung von optischen Parametern kristalliner Proben mittels optischer Reflexion |
| JPH11211654A (ja) * | 1998-01-27 | 1999-08-06 | Otsuka Denshi Kk | 偏光解析装置 |
| WO2000023785A2 (fr) * | 1998-10-20 | 2000-04-27 | Ljl Biosystems, Inc. | Perfectionnement portant sur des dosages par luminescence |
-
2000
- 2000-08-18 WO PCT/AU2000/000990 patent/WO2001013079A1/fr not_active Ceased
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0239506A2 (fr) * | 1986-03-28 | 1987-09-30 | Zygo Corporation | Interféromètre avec miroir plan différentiel |
| GB2203854A (en) * | 1987-04-21 | 1988-10-26 | Gen Electric Plc | Polarising optical device for forming a hologram |
| WO1989005955A1 (fr) * | 1987-12-24 | 1989-06-29 | Renishaw Plc | Appareil optique destine a etre utilise avec des dispositifs de mesure interferometriques |
| EP0421628A2 (fr) * | 1989-10-05 | 1991-04-10 | Seiko Epson Corporation | Dispositif d'affichage LCD pour projection |
| WO1997029210A2 (fr) * | 1996-02-05 | 1997-08-14 | The Perkin-Elmer Corporation | Technique fluorometrique de detection de systemes homogenes d'hybridation par reaction en chaine de la polymerase |
| JPH09243920A (ja) * | 1996-03-05 | 1997-09-19 | Olympus Optical Co Ltd | 走査型光学顕微鏡 |
| US5867291A (en) * | 1996-10-29 | 1999-02-02 | Chorum Technologies Inc. | Programmable wavelength router |
| JPH1123466A (ja) * | 1997-07-03 | 1999-01-29 | Jasco Corp | 円二色性蛍光励起スペクトル測定装置 |
| DE19745607A1 (de) * | 1997-10-06 | 1999-04-15 | Forschungsverbund Berlin Ev | Anordnung zur Messung von optischen Parametern kristalliner Proben mittels optischer Reflexion |
| JPH11211654A (ja) * | 1998-01-27 | 1999-08-06 | Otsuka Denshi Kk | 偏光解析装置 |
| WO2000023785A2 (fr) * | 1998-10-20 | 2000-04-27 | Ljl Biosystems, Inc. | Perfectionnement portant sur des dosages par luminescence |
Non-Patent Citations (3)
| Title |
|---|
| DATABASE WPI Derwent World Patents Index; Class P81, AN 1997-516874/48 * |
| DATABASE WPI Derwent World Patents Index; Class S02, AN 1999-497770/42 * |
| DATABASE WPI Derwent World Patents Index; Class S03, AN 1999-170187/15 * |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6671046B2 (en) | 2001-05-22 | 2003-12-30 | Agilent Technologies, Inc. | Polarization converter |
| DE102005022880A1 (de) * | 2005-05-18 | 2006-11-30 | Olympus Soft Imaging Solutions Gmbh | Trennung spektral oder farblich überlagerter Bildbeiträge in einem Mehrfarbbild, insbesondere in transmissionsmikroskopischen Mehrfarbbildern |
| DE102005022880B4 (de) * | 2005-05-18 | 2010-12-30 | Olympus Soft Imaging Solutions Gmbh | Trennung spektral oder farblich überlagerter Bildbeiträge in einem Mehrfarbbild, insbesondere in transmissionsmikroskopischen Mehrfarbbildern |
| EP1870696A1 (fr) * | 2006-06-22 | 2007-12-26 | ASML Netherlands B.V. | Procédé et appareil pour caractérisation angulaire de lithographie spectroscopique résolue |
| JP2008042177A (ja) * | 2006-06-22 | 2008-02-21 | Asml Netherlands Bv | 角度分解分光器リソグラフィの特徴付けの方法および装置 |
| US7692792B2 (en) | 2006-06-22 | 2010-04-06 | Asml Netherlands B.V. | Method and apparatus for angular-resolved spectroscopic lithography characterization |
| CN104155279A (zh) * | 2013-05-13 | 2014-11-19 | 中国科学院大连化学物理研究所 | 一种线形共聚焦紫外拉曼光谱仪 |
| CN104181089A (zh) * | 2013-05-22 | 2014-12-03 | 中国石油化工股份有限公司 | 用于扫描岩石面孔率的设备及方法 |
| CN105467609A (zh) * | 2016-01-15 | 2016-04-06 | 南开大学 | 一种基于沃拉斯顿棱镜的空间角分复用全息术的参考光分束方法及其专用装置 |
| CN105467609B (zh) * | 2016-01-15 | 2017-12-15 | 南开大学 | 一种基于沃拉斯顿棱镜的空间角分复用全息术的参考光分束方法及其专用装置 |
| CN107991242A (zh) * | 2017-11-20 | 2018-05-04 | 西北工业大学 | 一种基于偏振分光棱镜的测量样品偏振态的方法与系统 |
| CN108051089A (zh) * | 2017-11-20 | 2018-05-18 | 西北工业大学 | 一种基于渥拉斯顿棱镜的测量样品偏振态的方法与系统 |
| CN107991242B (zh) * | 2017-11-20 | 2021-01-15 | 西北工业大学 | 一种基于偏振分光棱镜的测量样品偏振态的方法与系统 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7701632B2 (en) | Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner | |
| US6665072B2 (en) | Instantaneous dual band fluorescence detection systems | |
| US8686363B1 (en) | Hyperspectral stimulated emission depletion microscopy and methods of use thereof | |
| US5943129A (en) | Fluorescence imaging system | |
| US7102746B2 (en) | Raman spectroscope | |
| US7872799B2 (en) | Device for controlling light radiation | |
| US6449039B1 (en) | Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses | |
| US4795256A (en) | Dual-wavelength spectrophotometry system | |
| CN111256821A (zh) | 双波长拉曼-荧光联合光谱仪 | |
| CN115015221B (zh) | 快速光谱扫描受激拉曼散射显微成像系统及其成像方法 | |
| EP2720026B1 (fr) | Microscope raman et procédé de spectrométrie raman | |
| US12411326B2 (en) | Super-resolution microscopic imaging method and apparatus based on common-path parallel fluorescence emission difference microscopy | |
| JP4270610B2 (ja) | 走査型光学顕微鏡 | |
| US20140158912A1 (en) | Ultra dark field microscope | |
| WO2001013079A1 (fr) | Procede et appareil de separation de faisceaux de rayonnement electromagnetique | |
| US20030030897A1 (en) | Laser microscope | |
| WO2008071240A1 (fr) | Duplicateur d'image optique | |
| US12480880B2 (en) | Microscopic raman spectroscopy device | |
| JP4481827B2 (ja) | 超並列多焦点配列におけるマルチパラメータ蛍光分析及びその使用 | |
| WO2008108846A1 (fr) | Imagerie raman indépendante de la polarisation au moyen d'un filtre accordable à cristaux liquides | |
| JP5861873B2 (ja) | 分光器及び顕微分光システム | |
| JP2004191251A (ja) | 蛍光分光分析装置 | |
| Frederix et al. | High sensitivity spectrograph for use in fluorescence microscopy | |
| JP2001116696A (ja) | 走査型光学装置 | |
| CN210571973U (zh) | 一种带有光镊的显微拉曼系统 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
| REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
| 122 | Ep: pct application non-entry in european phase | ||
| NENP | Non-entry into the national phase |
Ref country code: JP |